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Journal articles on the topic 'STM'

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Published: 4 June 2021
Last updated: 7 July 2024

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1

Anders, M., M. Mück, and C. Heiden. "SEM/STM combination for STM tip guidance." Ultramicroscopy 25, no. 2 (January 1988): 123–28. http://dx.doi.org/10.1016/0304-3991(88)90219-7.

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2

Makovicka, C., G. Gärtner, A. Hardt, W. Hermann, and D. U. Wiechert. "Impregnated cathode surface investigations by SFM/STM and SEM/EDX." Applied Surface Science 111 (February 1997): 70–75. http://dx.doi.org/10.1016/s0169-4332(96)00725-8.

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3

ICHINOKAWA, Takeo. "Combination of STM with SEM." Journal of the Japan Society for Precision Engineering 53, no. 12 (1987): 1835–40. http://dx.doi.org/10.2493/jjspe.53.1835.

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4

Marti, Othmar, Matthias Amrein, and David P. Allison. "STM and SFM in Biology." Physics Today 47, no. 7 (July 1994): 64. http://dx.doi.org/10.1063/1.2808574.

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5

Allen, Terence D. "STM and SFM in biology." Trends in Cell Biology 4, no. 5 (May 1994): 187. http://dx.doi.org/10.1016/0962-8924(94)90206-2.

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6

Cox, Guy. "STM and SFM in biology." Micron 25, no. 5 (January 1994): 493. http://dx.doi.org/10.1016/0968-4328(94)90046-9.

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7

Ermakov, A. V., and E. L. Garfunkel. "A novel AFM/STM/SEM system." Review of Scientific Instruments 65, no. 9 (September 1994): 2853–54. http://dx.doi.org/10.1063/1.1144627.

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8

Venables, John A., David J. Smith, and John M. Cowley. "HREM, STEM, REM, SEM — And STM." Surface Science Letters 181, no. 1-2 (March 1987): A93. http://dx.doi.org/10.1016/0167-2584(87)90731-6.

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9

Venables, John A., David J. Smith, and John M. Cowley. "HREM, STEM, REM, SEM — and STM." Surface Science 181, no. 1-2 (March 1987): 235–49. http://dx.doi.org/10.1016/0039-6028(87)90164-6.

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10

Golubok, Alexander O., and Vladimir A. Timofeev. "STM combined with SEM without SEM capability limitations." Ultramicroscopy 42-44 (July 1992): 1558–63. http://dx.doi.org/10.1016/0304-3991(92)90483-z.

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11

ASENJO, A., J. GÓMEZ‐HERRERO, and A. M. BARÓ. "STM/SEM correlative study of facetted gold." Journal of Microscopy 188, no. 3 (December 1997): 243–48. http://dx.doi.org/10.1046/j.1365-2818.1997.2590823.x.

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12

Troyon, M., H. N. Lei, and A. Bourhettar. "Integration of an STM in an SEM." Ultramicroscopy 42-44 (July 1992): 1564–68. http://dx.doi.org/10.1016/0304-3991(92)90484-2.

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13

Nakamoto, K., and K. Uozumi. "A compact STM compatible with conventional SEM." Ultramicroscopy 42-44 (July 1992): 1569–73. http://dx.doi.org/10.1016/0304-3991(92)90485-3.

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14

Cotard, Sylvain, Audrey Queudet, Jean-Luc Béchennec, Sébastien Faucou, and Yvon Trinquet. "STM-HRT." ACM Transactions on Embedded Computing Systems 14, no. 4 (December 8, 2015): 1–25. http://dx.doi.org/10.1145/2786979.

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15

WREN, B. "STM and." Trends in Microbiology 6, no. 2 (February 1998): 51. http://dx.doi.org/10.1016/s0966-842x(97)83153-8.

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16

HIDA, Akira, Yutaka MERA, and Koji MAEDA. "STM-Nanospectroscopy." Hyomen Kagaku 23, no. 4 (2002): 224–32. http://dx.doi.org/10.1380/jsssj.23.224.

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17

MERA, Yutaka, Nobuyasu NARUSE, and Koji MAEDA. "Photo-assisted STM and STM Fourier Transform Nanospectroscopy." Hyomen Kagaku 32, no. 12 (2011): 779–84. http://dx.doi.org/10.1380/jsssj.32.779.

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18

Gómez-Rodríguez, J. M., A. M. Baró, and V. P. Parkhutik. "Morphology of porous silicon studied by STM/SEM." Applied Surface Science 44, no. 3 (May 1990): 185–92. http://dx.doi.org/10.1016/0169-4332(90)90049-6.

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19

Eng, L. M., H. Fuchs, K. D. Jandt, and J. Petermann. "Investigating poly(1-butene) films by SFM/STM." Ultramicroscopy 42-44 (July 1992): 989–97. http://dx.doi.org/10.1016/0304-3991(92)90391-v.

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20

Liu, Hui, and Weijie Zhao. "Philip Carpenter: STM, an association connecting global STM publishers." Chinese Science Bulletin 67, no. 3 (January 1, 2022): 249–51. http://dx.doi.org/10.1360/tb-2022-0088.

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21

HASEGAWA, YUKIO. "Scanning Tunneling Microscopy(STM). SXM. STM Studies on Interfaces." Nihon Kessho Gakkaishi 35, no. 2 (1993): 168–70. http://dx.doi.org/10.5940/jcrsj.35.168.

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22

UEHARA, YOICHI. "Scanning Tunneling Microscopy(STM). SXM. Light Emission from STM." Nihon Kessho Gakkaishi 35, no. 2 (1993): 177–79. http://dx.doi.org/10.5940/jcrsj.35.177.

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23

HOSAKA, Sumio. "High Speed and High Precision STM Combined with SEM." Journal of the Japan Society for Precision Engineering 58, no. 9 (1992): 1490–95. http://dx.doi.org/10.2493/jjspe.58.1490.

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24

Gómez-Rodríguez, J. M., and Baró A.M. "The use of Scanning Tunneling Microscopy in combination with Scanning Electron Microscopy in the fabrication and imaging of microstructures." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 4 (August 1990): 752–53. http://dx.doi.org/10.1017/s0424820100176897.

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In the last few years, Scanning Tunneling Microscopy (STM), has proven to be a powerful and versatile technique to investigate the topographic and electronic structure of metals and semiconductors with an unprecedent vertical (0.01 nm) and lateral (0.2 nm) resolution. In this paper we are interested in the use of STM to study surfaces having microfabricated structures in the nanometer range, particularly those produced by the STM tip itself.In order to study these samples we have used an STM integrated into a commercial Scanning Electron Microscope (SEM). This allows to address two problems which limit the operation of STM: (i) the limited STM scanning range (1-10 μm) which makes difficult the localization of microstructures on the sample; (ii) the undetermined size and shape of the STM probing tip.Our STM/SEM combination has been described in detail earlier. In short, it consists of an STM placed on the sample stage of a commercial SEM allowing the simultaneous operation of both microscopes.
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25

Wells, Oliver C., and Mark E. Welland. "Experiments with a scanning tunneling microscope (STM) mounted in a scanning electron microscope (SEM)." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 636–39. http://dx.doi.org/10.1017/s0424820100144620.

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Scanning tunneling microscopes (STM) exist in two versions. In both of these, a pointed metal tip is scanned in close proximity to the specimen surface by means of three piezos. The distance of the tip from the sample is controlled by a feedback system to give a constant tunneling current between the tip and the sample. In the low-end STM, the system has a mechanical stability and a noise level to give a vertical resolution of between 0.1 nm and 1.0 nm. The atomic resolution STM can show individual atoms on the surface of the specimen.A low-end STM has been put into the specimen chamber of a scanning electron microscope (SEM). The first objective was to investigate technological problems such as surface profiling. The second objective was for exploratory studies. This second objective has already been achieved by showing that the STM can be used to study trapping sites in SiO2.
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26

TSUDA, Nobuhiro, Hirofumi YAMADA, Fumihiko ISHIDA, Masayuki MIYASHITA, and Masataka YAMAGUCHI. "Wide range STM." Journal of the Japan Society for Precision Engineering 55, no. 1 (1989): 146–51. http://dx.doi.org/10.2493/jjspe.55.146.

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27

ITOZAKI, Hideo, and Yuji MIYATO. "STM-SQUID Microscope." Journal of the Vacuum Society of Japan 57, no. 10 (2014): 377–81. http://dx.doi.org/10.3131/jvsj2.57.377.

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28

Kinoshita, June. "Sons of STM." Scientific American 259, no. 1 (July 1988): 33–35. http://dx.doi.org/10.1038/scientificamerican0788-33.

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29

Grenier, Gerry. "STM X-REF." Serials Librarian 36, no. 1-2 (March 1999): 175–85. http://dx.doi.org/10.1300/j123v36n01_21.

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30

Allison, D. P., J. R. Thompson, K. B. Jacobson, R. J. Warmack, and T. L. Ferrell. "STM of macromolecules." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 3 (August 12, 1990): 110–11. http://dx.doi.org/10.1017/s0424820100158091.

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Beginning in 1982 when the first images were reported, the development of the scanning tunneling microscope (STM) has revolutionized microscopy in the 1980’s. Although the primary applications are for research on metal and semiconductor surfaces, success in imaging a number of biological samples, mounted on a variety of conductive surfaces, have established STM as a valuable emerging technology in biological research.In 1987 we began our biological STM studies using tobacco mosaic virus (TMV), an easily identifiable rod shaped virus, to test the feasibility of using STM on naked biological samples. We deposited TMV by spraying an aqueous solution of the virus onto evaporated or sputter-coated palladium-gold (Pd/Au) films supported on flat mica surfaces. Although TMV could be clearly identified, its observed width was typically 70-100 nm instead of the known diameter of the virus, 18 nm. On evaporated Pd/Au substrates, tip traces revealed structures elevated above the substrate surface suggesting that the virus became coated with Pd/Au allowing normal conduction to occur. On sputter-coated substrates tip traces revealed depressed substructures.
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31

JACOBY, MITCH. "STM ELUCIDATES MECHANISM." Chemical & Engineering News 79, no. 43 (October 22, 2001): 11. http://dx.doi.org/10.1021/cen-v079n043.p011.

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32

Barniol, N., E. Farrés, F. Martin, J. Suñé, I. Placencia, and X. Aymerich. "Simple STM theory." Vacuum 41, no. 1-3 (January 1990): 379–81. http://dx.doi.org/10.1016/0042-207x(90)90364-5.

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33

Valdés, J., J. J. Kohanoff, E. E. Lobbe, R. López Bancalari, M. E. Porfiri, and R. García Cantú. "Battery-operated STM." Journal of Microscopy 152, no. 3 (December 1988): 675–79. http://dx.doi.org/10.1111/j.1365-2818.1988.tb01437.x.

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34

Camelio, Cos. "STM Committee Update." International Nonwovens Journal os-12, no. 1 (March 2003): 1558925003os—12. http://dx.doi.org/10.1177/1558925003os-1200101.

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35

Watkinson, Anthony. "Reprinted from STM Membership Matters – February 2017 © 2017 STM." Information Services & Use 37, no. 3 (November 7, 2017): 257–58. http://dx.doi.org/10.3233/isu-170851.

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36

Long, J. A., and M. K. Barton. "The development of apical embryonic pattern in Arabidopsis." Development 125, no. 16 (August 15, 1998): 3027–35. http://dx.doi.org/10.1242/dev.125.16.3027.

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The apical portion of the Arabidopsis globular stage embryo gives rise to the cotyledons and the shoot apical meristem (SAM). The SHOOT MERISTEMLESS (STM) gene is required for SAM formation during embryogenesis and for SAM function throughout the lifetime of the plant. To more precisely define the development of molecular pattern in the apical portion of the embryo, and the role of the STM gene in the development of this pattern, we have examined AINTEGUMENTA (ANT), UNUSUAL FLORAL ORGANS (UFO) and CLAVATA1 (CLV1) expression in wild-type and stm mutant embryos. The transcripts of these genes mark subdomains within the apical portion of the embryo. Our results indicate that: (1) the molecular organization characteristic of the vegetative SAM is not present in the globular embryo but instead develops gradually during embryogenesis; (2) radial pattern exists in the apical portion of the embryo prior to and independent of STM with STM expression itself responding to radial information; (3) the embryonic SAM consists of central and peripheral subdomains that express different combinations of molecular markers and differ in their ultimate fates; and (4) STM activity is required for UFO expression, STM is required for maintenance but not onset of CLV1 expression and the pattern of ANT expression is independent of STM.
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37

Murphy, S., S. F. Ceballos, G. Mariotto, N. Berdunov, K. Jordan, I. V. Shvets, and Y. M. Mukovskii. "Atomic scale spin-dependent STM on magnetite using antiferromagnetic STM tips." Microscopy Research and Technique 66, no. 2-3 (February 2005): 85–92. http://dx.doi.org/10.1002/jemt.20148.

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38

Ferri, Giovanni, and Angelo Leogrande. "Stakeholder Management, Cooperatives, and Selfish-Individualism." Journal for Markets and Ethics 9, no. 2 (December 1, 2021): 61–75. http://dx.doi.org/10.2478/jome-2021-0005.

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Abstract We analyze stakeholder management (STM) relative to cooperation and individualism within the fourth industrial revolution (FIR). STM is a recent corporate governance tool boosting cooperation and allowing representativeness of individualistic behaviors even in dialectical environments. Though forerunning it, cooperatives massively use STM now, while the FIR demands cooperation also at non-cooperative enterprises. We reach two main conclusions. Deeper orientation towards STM helps solve the shareholder management (SHM) crisis. Moreover, exemplifying the benefits of STM towards social and environmental goals, cooperatives can inspire also other companies aiming to reduce the negative externalities of SHM and profit from cooperation within the FIR.
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39

Joachim, C., B. Rousset, C. Schonenberger, A. Kerrien, E. Druet, and J. Chevalier. "Characterization of a titanium nanoscopic wire by STM and SFM." Nanotechnology 2, no. 2 (April 1, 1991): 96–102. http://dx.doi.org/10.1088/0957-4484/2/2/003.

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40

Lisowski, W., A. H. J. van den Berg, G. A. M. Kip, and L. J. Hanekamp. "Characterization of tungsten tips for STM by SEM/AES/XPS." Fresenius' Journal of Analytical Chemistry 341, no. 3-4 (March 1991): 196–99. http://dx.doi.org/10.1007/bf00321548.

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41

Gómez, M. M., L. Vázquez, R. C. Salvarezza, J. M. Vara, and A. J. Arvia. "STM-SEM and impedance characterization of columnar structured gold electrodes." Journal of Electroanalytical Chemistry and Interfacial Electrochemistry 317, no. 1-2 (November 1991): 125–37. http://dx.doi.org/10.1016/0022-0728(91)85008-d.

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42

Gómez-Rodríguez, J. M., L. Vázquez, A. Bartolomé, A. M. Baró, P. Grambow, and D. Heitmann. "Topographic imaging of GaAs-microstructured samples by STM and SEM." Ultramicroscopy 30, no. 3 (July 1989): 355–58. http://dx.doi.org/10.1016/0304-3991(89)90065-x.

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43

Eng, L. M., H. Fuchs, S. Buchholz, and J. P. Rabe. "Ordering of didodecylbenzene on graphite: a combined SFM/STM study." Ultramicroscopy 42-44 (July 1992): 1059–66. http://dx.doi.org/10.1016/0304-3991(92)90402-6.

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44

Iwatsuki, M., S. Kitamura, and A. Mogami. "Development of the UHV-STM." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 322–23. http://dx.doi.org/10.1017/s0424820100180367.

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Since Binnig, Rohrer and associates observed real-space topographic images of Si(111)-7×7 and invented the scanning tunneling microscope (STM),1) the STM has been accepted as a powerful surface science instrument.Recently, many application areas for the STM have been opened up, such as atomic force microscopy (AFM), magnetic force microscopy (MFM) and others. So, the STM technology holds a great promise for the future.The great advantages of the STM are its high spatial resolution in the lateral and vertical directions on the atomic scale. However, the STM has difficulty in identifying atomic images in a desired area because it uses piezoelectric (PZT) elements as a scanner.On the other hand, the demand to observe specimens under UHV condition has grown, along with the advent of the STM technology. The requirment of UHV-STM is especially very high in to study of surface construction of semiconductors and superconducting materials on the atomic scale. In order to improve the STM image quality by keeping the specimen and tip surfaces clean, we have built a new UHV-STM (JSTM-4000XV) system which is provided with other surface analysis capability.
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45

Kajimura, Koji. "STM as a Micromachine." Journal of Robotics and Mechatronics 3, no. 1 (February 20, 1991): 12–17. http://dx.doi.org/10.20965/jrm.1991.p0012.

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A scanning tunneling microscope (STM) is a kind of micromachine, from an instrumentational and functional point of view. In this paper, the present and future status of key technologies of STM instrumentation and miniaturization are discussed after presenting the principle of STM operation. Application of STM functions to nanometer-scale fabrication and ultimate modification of surfaces on an atomic or molecular scale will pave the way for future electron devices and the synthesis of new materials.
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46

Zanin, D. A., L. G. De Pietro, Q. Peter, A. Kostanyan, H. Cabrera, A. Vindigni, Th Bähler, D. Pescia, and U. Ramsperger. "Thirty per cent contrast in secondary-electron imaging by scanning field-emission microscopy." Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences 472, no. 2195 (November 2016): 20160475. http://dx.doi.org/10.1098/rspa.2016.0475.

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We perform scanning tunnelling microscopy (STM) in a regime where primary electrons are field-emitted from the tip and excite secondary electrons out of the target—the scanning field-emission microscopy regime (SFM). In the SFM mode, a secondary-electron contrast as high as 30% is observed when imaging a monoatomic step between a clean W(110)- and an Fe-covered W(110)-terrace. This is a figure of contrast comparable to STM. The apparent width of the monoatomic step attains the 1 nm mark, i.e. it is only marginally worse than the corresponding width observed in STM. The origin of the unexpected strong contrast in SFM is the material dependence of the secondary-electron yield and not the dependence of the transported current on the tip–target distance, typical of STM: accordingly, we expect that a technology combining STM and SFM will highlight complementary aspects of a surface while simultaneously making electrons, selected with nanometre spatial precision, available to a macroscopic environment for further processing.
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47

OKAYAMA, Shigeo, Masanori KOMURO, and Makoto OKANO. "STM applications for microelectronics." Journal of the Japan Society for Precision Engineering 53, no. 12 (1987): 1826–30. http://dx.doi.org/10.2493/jjspe.53.1826.

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48

MIZUTANI, WATARU. "Fine positioners for STM." Journal of the Japan Society for Precision Engineering 53, no. 5 (1987): 695–97. http://dx.doi.org/10.2493/jjspe.53.695.

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49

Shuai, Yan. "STM Publishing in China." Editorial Office News 8, no. 12 (December 1, 2015): 13–16. http://dx.doi.org/10.18243/eon/2015.8.12.3.

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50

Iwatsuki, Masashi. "Surface Analysis by STM." HYBRIDS 7, no. 5 (1991): 22–28. http://dx.doi.org/10.5104/jiep1985.7.5_22.

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