Academic literature on the topic 'Stencil mask'
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Journal articles on the topic "Stencil mask"
Lee, Yong‐Won, Keun‐Soo Kim, and Katsuaki Suganuma. "The behaviour of solder pastes in stencil printing with electropolishing process." Soldering & Surface Mount Technology 25, no. 3 (June 21, 2013): 164–74. http://dx.doi.org/10.1108/ssmt-12-2012-0027.
Full textShibata, T., K. Suguro, K. Sugihara, T. Nishihashi, J. Fujiyama, and Y. Sakurada. "Stencil mask ion implantation technology." IEEE Transactions on Semiconductor Manufacturing 15, no. 2 (May 2002): 183–88. http://dx.doi.org/10.1109/66.999589.
Full textDeshmukh, Mandar M., D. C. Ralph, M. Thomas, and J. Silcox. "Nanofabrication using a stencil mask." Applied Physics Letters 75, no. 11 (September 13, 1999): 1631–33. http://dx.doi.org/10.1063/1.124777.
Full textTakenaka, H., H. Yamashita, Y. Tomo, Y. Kojima, M. Watanabe, T. Iwasaki, and M. Yamabe. "Dynamic analysis of a stencil mask." Microelectronic Engineering 61-62 (July 2002): 227–32. http://dx.doi.org/10.1016/s0167-9317(02)00543-9.
Full textSATO, Keiichi, Kazuhiro YOSHIDA, and Joon-wan KIM. "Development of magnetic material stencil mask." Proceedings of Yamanashi District Conference 2017 (2017): 205. http://dx.doi.org/10.1299/jsmeyamanashi.2017.205.
Full textNishihashi, T., K. Kashimoto, J. Fujiyama, Y. Sakurada, T. Shibata, K. Suguro, K. Sugihara, et al. "Ion-graphy implanter with stencil mask." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 20, no. 3 (2002): 914. http://dx.doi.org/10.1116/1.1475982.
Full textYamashita, Hiroshi, Kunio Takeuchi, and Hideki Masaoka. "Mask split algorithm for stencil mask in electron projection lithography." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 19, no. 6 (2001): 2478. http://dx.doi.org/10.1116/1.1412897.
Full textReu, P., R. Engelstad, E. Lovell, C. Magg, and M. Lercel. "Modeling mask fabrication and pattern transfer distortions for EPL stencil masks." Microelectronic Engineering 57-58 (September 2001): 467–73. http://dx.doi.org/10.1016/s0167-9317(01)00470-1.
Full textSprague, M., W. Semke, R. Engelstad, E. Lovell, A. Chalupka, H. Löschner, and G. Stengl. "Stencil mask distortion control using nonsymmetric perforation rings." Microelectronic Engineering 41-42 (March 1998): 225–28. http://dx.doi.org/10.1016/s0167-9317(98)00051-3.
Full textButschke, J., A. Ehrmann, B. Höfflinger, M. Irmscher, R. Käsmaier, F. Letzkus, H. Löschner, et al. "SOI wafer flow process for stencil mask fabrication." Microelectronic Engineering 46, no. 1-4 (May 1999): 473–76. http://dx.doi.org/10.1016/s0167-9317(99)00043-x.
Full textDissertations / Theses on the topic "Stencil mask"
Bobuľa, Matej. "Neeuklidovské vykreslování ve VR." Master's thesis, Vysoké učení technické v Brně. Fakulta informačních technologií, 2021. http://www.nusl.cz/ntk/nusl-445563.
Full textBertin, Hervé. "Etude de matrices de filtres Fabry Pérot accordables en technologie MOEMS intégré 3D : Application à l’imagerie multispectrale." Thesis, Paris 11, 2013. http://www.theses.fr/2013PA112132/document.
Full textMultispectral imaging is used to improve target detection and identification in monitoring applications. It consists in analyzing images of the same scene simultaneously recorded in several spectral bands owing to a filtering. This thesis investigates the possibility to realize, an array of four 3D integrated Fabry-Perot (FP) filters that are tunable in the visible-near infrared range by electrostatic actuation. The fixed mirrors of the FP filters are ZnS/YF₃ multilayers deposited on a borosilicate wafer, and the movable mirrors are PECVD SiNH/SiOH multilayer membranes clamped in a very compact movable structure micromachined in a Si wafer. A 3rd glass wafer is used for filters packaging. Optical performances of the FP filters have been optimized by taking into account the asymmetry and the reflection phase shift of the mirrors and the mobile structure has been modeled by finite elements analysis notably to minimize its deformation during actuation. The critical steps of the movable mirrors fabrication process in Si or SOI technology have been developed : i) the fabrication and the release by DRIE and XeF₂ etching of 8 or 12 layers membranes with a residual stress tunable by annealing and a reflectance close to 50% in broad wavelength range (570-900nm), ii) the control with temporary patterns of the simultaneous deep etching of patterns with different widths and depths, and iv) various patterning techniques on highly structured surfaces based on shadow masks (with mechanical alignment) or laminated photosensitive dry films. These results open the way towards the full realization of an array of 3D integrated FP filters
Ahnlén, Fredrik. "Automatic Detection of Low Passability Terrain Features in the Scandinavian Mountains." Thesis, KTH, Geodesi och satellitpositionering, 2019. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-254709.
Full textDe senaste åren har mycket fokus lagts på att ersätta tidskrävande manuella karterings- och klassificeringsmetodermed automatiserade lösningar med minimal mänsklig inverkan. Det är numeramöjligt att digitalt klassificera marktäcket och terrängföremål över stora områden, snabbt och medhög noggrannhet. Detta med hjälp av enbart fjärranalys, vilket medför en betydligt mer hållbarprocess och slutprodukt. Trots det finns det fortfarande terrängföremål som inte har en etableradmetod för noggrann automatisk kartering.Den skandinaviska fjällkedjan består till stor del av svårpasserade terrängföremål som sankmarker,videsnår och stenig mark. Alla som tar sig fram i terrängen obanat skulle ha nytta av attkunna undvika dessa områden men de är i nuläget inte karterade med önskvärd noggrannhet.Målet med denna analys var att utforma en metod för att klassificera och kartera dessa terrängföremåli Skanderna, med hög noggrannhet och minimal mänsklig inverkan med hjälp avfjärranalys. Valet av testområde för analysen är en större dal och bergssida sydost om Abisko inorra Sverige som innehåller tydliga exemplar av alla berörda terrängföremål. Metoden baseradespå att träna en Fuzzy Logic classifier med manuellt utvald träningsdata och deskriptorer,valda för att bäst separera klasserna utifrån deras karaktärsdrag. Inledningsvis valdes en uppsättningav kandidatdeskriptorer som sedan filtrerades till den slutgiltiga uppsättningen med hjälp avett Fisher score filter. Ett Fuzzy Inference System byggdes och tränades med träningsdata fråndeskriptorerna vilket slutligen användes för att klassificera hela testområdet pixelvis. Det klassificeraderesultatet klustrades därefter med hjälp av ett majoritetsfilter. Resultatet validerades genomvisuell inspektion, jämförelse med befintliga kartprodukter och genom confusion matriser, vilkaberäknades både för träningsdata och valideringsdata samt för det klustrade och icke-klustraderesultatet.Resultatet visade att de svårpasserade terrängföremålen sankmark, videsnår och stenig markkan karteras med hög noggrannhet med hjälp denna metod och att resultaten generellt är tydligtbättre än nuvarande kartprodukter. Däremot kan metoden finjusteras på flera plan för att optimeras.Bland annat genom att implementera deskriptorer för markvattenrörelser och användandeav LiDAR med högre spatial upplösning, samt med ett mer fulltäckande och spritt val av klasser.
To, Nelson. "The Study of Metal Diffusion on Si(001) using a Nanostencil Shadow Mask." Thesis, 2011. http://hdl.handle.net/1807/29634.
Full textZoltán, Rácz. "Piezoflexure-enabled nanofabrication using translated stencil masks." 2007. http://etd.nd.edu/ETD-db/theses/available/etd-04202007-200219/.
Full textThesis directed by Alan C. Seabaugh for the Department of Electrical Engineering. "April 2007." Includes bibliographical references (leaves 145-154).
Books on the topic "Stencil mask"
Roth, Ed. Stencil 101: Make your mark with 25 reusable stencils and step-by-step instructions. San Francisco: Chronicle Books, 2008.
Find full textRoth, Ed. Stencil 101: Make your mark with 25 reusable stencils and step-by-step instructions. San Francisco: Chronicle Books, 2008.
Find full textRoth, Ed. Stencil 101: Make your mark with 25 reusable stencils and step-by-step instructions. San Francisco: Chronicle Books, 2008.
Find full textStencils and masks. London: Macdonald / Orbis, 1988.
Find full textMark Stencil Maths Attainment. Nfer Nelson, 1994.
Find full textMartin, Judy. Using Stencils and Masks. F & W Publications, 1988.
Find full textNoble, Marty. Fun with Native American Masks Stencils. Dover Publications, 2003.
Find full textVedrenne, Penny. Scary Halloween Masks: A Book of Stencils. Lulu.com, 2007.
Find full textConference papers on the topic "Stencil mask"
Ehrmann, Albrecht, Sabine Huber, Rainer Kaesmaier, Andreas B. Oelmann, Thomas Struck, Reinhard Springer, Joerg Butschke, et al. "Stencil mask technology for ion beam lithography." In 18th Annual BACUS Symposium on Photomask Technology and Management, edited by Brian J. Grenon and Frank E. Abboud. SPIE, 1998. http://dx.doi.org/10.1117/12.332827.
Full textEhrmann, Albrecht, Annika Elsner, Roman Liebe, Thomas Struck, Joerg Butschke, Florian Letzkus, Mathias Irmscher, Reinhard Springer, Ernst Haugeneder, and Hans Loeschner. "Stencil mask key parameter measurement and control." In Microlithography 2000, edited by Elizabeth A. Dobisz. SPIE, 2000. http://dx.doi.org/10.1117/12.390074.
Full textTakenaka, Hiroshi, Hiroshi Yamashita, Kaoru Koike, and Masaki Yamabe. "Subfield distortion of an EPL stencil mask." In Microlithography 2003, edited by Roxann L. Engelstad. SPIE, 2003. http://dx.doi.org/10.1117/12.484980.
Full textHaugeneder, Ernst, A. Chalupka, T. Lammer, Hans Loeschner, Frank-Michael Kamm, Thomas Struck, Albrecht Ehrmann, et al. "Measures to achieve 20nm IPL stencil mask distortion." In 18th European Mask Conference on Mask Technology for Integrated Circuits and Micro-Components. SPIE, 2002. http://dx.doi.org/10.1117/12.479353.
Full textSugimura, Hiroshi, Tsukasa Yamazaki, Takashi Susa, Yoshiyuki Negishi, Takashi Yoshii, Hideyuki Eguchi, and Akira Tamura. "Stencil pattern accuracy of EPL masks." In Photomask and Next Generation Lithography Mask Technology XII, edited by Masanori Komuro. SPIE, 2005. http://dx.doi.org/10.1117/12.617279.
Full textKurihara, Kenji, H. Iriguchi, A. Motoyoshi, T. Tabata, S. Takahashi, K. Iwamoto, Ikuo Okada, Hideo Yoshihara, and Hitoshi Noguchi. "Stencil masks for electron-beam projection lithography." In Photomask and Next Generation Lithography Mask Technology VIII, edited by Hiroichi Kawahira. SPIE, 2001. http://dx.doi.org/10.1117/12.438383.
Full textTakenaka, Hiroshi, Hiroshi Yamashita, Kimitoshi Takahashi, Yoichi Tomo, Manabu Watanabe, Teruo Iwasaki, J. Yamamoto, and Masaki Yamabe. "Dynamic image placement accuracy of a stencil mask." In SPIE's 27th Annual International Symposium on Microlithography, edited by Roxann L. Engelstad. SPIE, 2002. http://dx.doi.org/10.1117/12.472269.
Full textMaruyama, Satoru, Nakahiro Harada, Jiro Yamamoto, and Naoyuki Nakamura. "Stencil mask defect inspection system and advanced application." In Photomask and Next Generation Lithography Mask Technology XI, edited by Hiroyoshi Tanabe. SPIE, 2004. http://dx.doi.org/10.1117/12.557819.
Full textEhrmann, Albrecht, Thomas Struck, Ernst Haugeneder, Hans Loeschner, Joerg Butschke, Florian Letzkus, Mathias Irmscher, and Reinhard Springer. "IPL stencil mask distortions: experimental and theoretical analysis." In Microlithography 2000, edited by Elizabeth A. Dobisz. SPIE, 2000. http://dx.doi.org/10.1117/12.390075.
Full textFujita, Hiroshi, Tadahiko Takigawa, Mikio Ishikawa, Yu-ki Aritsuka, Satoshi Yusa, Morihisa Hoga, and Hisatake Sano. "200-mm EPL stencil mask fabrication and metrology." In Photomask Technology, edited by Kurt R. Kimmel and Wolfgang Staud. SPIE, 2003. http://dx.doi.org/10.1117/12.518034.
Full textReports on the topic "Stencil mask"
Shade, Paul A., Michael D. Uchic, Sang-Lan Kim, and Robert Wheeler. Stencil Mask Methodology for the Parallelized Production of Microscale Mechanical Test Samples (Preprint). Fort Belvoir, VA: Defense Technical Information Center, August 2012. http://dx.doi.org/10.21236/ada566048.
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