Books on the topic 'Specral linewidth'
Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles
Consult the top 26 books for your research on the topic 'Specral linewidth.'
Next to every source in the list of references, there is an 'Add to bibliography' button. Press on it, and we will generate automatically the bibliographic reference to the chosen work in the citation style you need: APA, MLA, Harvard, Chicago, Vancouver, etc.
You can also download the full text of the academic publication as pdf and read online its abstract whenever available in the metadata.
Browse books on a wide variety of disciplines and organise your bibliography correctly.
Potzick, James E. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.
Find full textPotzick, James E. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.
Find full textPotzick, James E. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.
Find full textPotzick, James E. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.
Find full textPotzick, James E. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.
Find full textVezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
Find full textVezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
Find full textVezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
Find full textVezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
Find full textVezzetti, Carol F. Antireflecting-Chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, Md: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.
Find full textVezzetti, Carol F. Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems. Gaithersburg, Md: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.
Find full textVezzetti, Carol F. Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems. Gaithersburg, Md: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.
Find full textVezzetti, Carol F. Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems. Gaithersburg, Md: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.
Find full textVezzetti, Carol F. Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.
Find full textVezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems: Standard reference materials. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.
Find full textVezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems: Standard reference materials. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.
Find full textNational Institute of Standards and Technology (U.S.), ed. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.
Find full textNational Institute of Standards and Technology (U.S.), ed. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.
Find full textAntireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.
Find full textNational Institute of Standards and Technology (U.S.), ed. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.
Find full textN, Varner Ruth, Potzick James E, and National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems: Standard reference materials. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.
Find full textN, Varner Ruth, Potzick James E, and National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems: Standard reference materials. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.
Find full textN, Varner Ruth, Potzick James E, and National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems: Standard reference materials. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.
Find full textN, Varner Ruth, Potzick James E, and National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems: Standard reference materials. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.
Find full textN, Varner Ruth, Potzick James E, and National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems: Standard reference materials. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.
Find full textN, Varner Ruth, Potzick James E, and National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems: Standard reference materials. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.
Find full text