Books on the topic 'Semiconductors – Impurity distribution'

Impurities in semiconductors: Solubility, migration, and interactions. Boca Raton: CRC Press, 2004.

International Conference on Shallow Impurities in Semiconductors (5th 1992 Kobe, Japan). Shallow impurities in semiconductors: Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors : physics and control of impurities, Kobe, Japan, 5 to 8 August 1992. Edited by Taguchi Tsunemasa. Brookfield, Vt: Trans Tech Publications, 1993.

International Conference on Shallow Impurities in Semiconductors (5th 1992 Kobe, Japan). Shallow impurities in semiconductors: Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors : "Physics and Control of Impurities", International Conference Center, Kobe, Japan, 5 to 8 August 1992. Edited by Taguchi Tsunemasa. Aedernabbsdorf, Switzerland: Trans Tech Publications, 1993.

Berman, Lev Solomonovich. Purity control of semiconductors by the method of capacitance transient spectroscopy. St. Petersburg: "Electronic Integral Systems", 1995.

Dreyhsig, Jörg. The multiplet problem of 3d transition metal impurities in semiconductors: General aspects and the specific properties of semiconductors doped with cobalt. Berlin: W & T Verlag, 1994.

Orton, J. W. The electrical characterization of semiconductors: Measurement of minority carrier properties. London: Academic Press, 1990.

S, Ashok, ed. Defect and impurity engineered semiconductors II: Symposium held April 13-17, 1998, San Francisco, California, U.S.A. Warrendale, Pa: Materials Research Society, 1998.

Optical absorption of impurities and defects in semiconducting crystals: Hydrogen-like centres. Heidelberg: Springer, 2010.

Fistul, Victor I. Impurities in Semiconductors: Solubility, Migration and Interactions. CRC, 2004.

Fistul, Victor I. Impurities in Semiconductors: Solubility, Migration and Interactions. Taylor & Francis Group, 2004.

Fistul, Victor I. Impurities in Semiconductors: Solubility, Migration and Interactions. Taylor & Francis Group, 2004.

Fistul, Victor I. Impurities in Semiconductors: Solubility, Migration and Interactions. Taylor & Francis Group, 2004.

Fistul, Victor I. Impurities in Semiconductors: Solubility, Migration and Interactions. Taylor & Francis Group, 2004.

Fistul, Victor I. Impurities in Semiconductors: Solubility, Migration and Interactions. Taylor & Francis Group, 2004.

Impurities Confined in Quantum Structures (Springer Series in Materials Science). Springer, 2004.

Ashok, S., K. Sumino, J. Chevallier, B. L. Sopori, and W. Götz. Defect and Impurity Engineered Semiconductors II: Volume 510. Cambridge University Press, 2014.

Gordon, Davies, and International Conference on Shallow Impurities in Semiconductors (4th : 1990 : King's College (University of London)), eds. Shallow impurities in semiconductors: Proceedings of the Fourth International Conference on Shallow Impurities in Semiconductors, King's College London, 31 July to 2 August 1990. Zürich, Switzerland: Trans Tech Publications, 1991.

Shallow Impurities in Semiconductors, Proceedings of the 3rd INT Conference on Shallow Impurities in Semiconductors held at Linkoping, Sweden, 10-12 August ... (Institute of Physics Conference Series). Taylor & Francis, 1989.

S, Ashok, ed. Defect and impurity engineered semiconductors and devices: Symposium held April 17-21, 1995, San Francisco, California, U.S.A. Pittsburgh, Pa: Materials Research Society, 1995.

Ashok, S. Defect and Impurity Engineered Semiconductors and Devices: Symposium Held April 17-21, 1995, San Francisco, California, U.S.A (Symp. B. : Symposium Held ... 1995, San Francisco, California, U.S.a). Materials Research Society, 1995.

Shallow impurities in semiconductors 1988: Proceedings of the third international conference held in Linköping, Sweden, 10-12 August 1988. Bristol, England: Institute of Physics, 1989.

J, Wolford Donald, Bernholc Jerzy, Haller Eugene E, and Materials Research Society, eds. Impurities, defects, and diffusion in semiconductors: Bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A. Pittsburgh, Pa: Materials Research Society, 1990.

Wolford, Donald J., and Jerzy Bernholc. Impurities, Defects and Diffusion in Semiconductors: Bulk and Layered Structures (Materials Research Society Symposium Proceedings). Materials Research Society, 1990.

Aminzadeh, Mehran G. Recombination and generation lifetime characterization of p/p⁺ epitaxial silicon wafers. 1988.

Orton, J. W., and P. Blood. The Electrical Characterization of Semiconductors: Measurement of Minority Carrier Properties (Techniques of Physics). Academic Press, 1992.

Shallow Impurities in Semiconductors V: Proceedings of the 5th International Conference on Shallow Impurities in Semiconductors, Held in Kobe, Japan (Materials Science Forum,). Trans Tech Publications, 1993.