Books on the topic 'Semiconductor failure analysis'

Richards, B. P. The role of microscopy in semiconductor failure analysis. Oxford: Oxford University Press, 1992.

Microelectronics failure analysis: Desk reference. 6th ed. Materials Park, Ohio: ASM International, 2011.

Integrated circuit failure analysis: A guide to preparation techniques. Chichester: Wiley, 1998.

Chim, Wai Kin. Semiconductor device and failue analysis: Using photon emission microscopy. Chichester, [England]: Wiley, 2000.

Semiconductor device and failue analysis: Using photon emission microscopy. Chichester, [England]: Wiley, 2000.

Wagner, Lawrence C. Failure Analysis of Integrated Circuits: Tools and Techniques. Boston, MA: Springer US, 1999.

International, Symposium for Testing and Failure Analysis (23rd 1997 Santa Clara Calif ). ISTFA '97: Proceedings of the 23rd International Symposium for Testing and Failure Analysis, 27-31 October 1997, Santa Clara Convention Center, Santa Clara, California. Materials Park, Ohio: ASM International, 1997.

Chim, Wai Kin. Semiconductor Device and Failure Analysis : Using Photon Emission Microscopy. Wiley, 2000.

Louhibi, M. E. H. Degradation failure mode of transistors: The use of lognormal and exponential distributions in the reliability analysis of semiconductor devices. Bradford, 1985.

Electronic Device Failure Analysis Society., ed. Microelectronic failure analysis: Desk reference. Materials Park, Ohio: ASM International, 2001.

Electronic Device Failure Analysis Society Desk Reference Committee., ed. Microelectronics failure analysis: Desk reference. 5th ed. Materials Park, Ohio: ASM International, 2004.

W, Lee Thomas, and Pabbisetty Seshu V, eds. Microelectronic failure analysis: Desk reference. 3rd ed. Materials Park, OH: ASM International, 1997.

Beck, Friedrich. Integrated Circuit Failure Analysis: A Guide to Preparation Techniques. Wiley & Sons, Incorporated, John, 2000.

(Editor), Richard J. Ross, Christian Boit (Editor), and Donald Staab (Editor), eds. Microelectronic Failure Analysis: Desk Reference (#09105G). 4th ed. ASM International, 1999.

C, Wagner Lawrence, ed. Failure analysis of integrated circuits: Tools and techniques. Boston, Mass: Kluwer Academic Publishers, 1999.

Microelectronic failure analysis: Desk reference : 2002 supplement. Materials Park, OH: ASM International, 2002.

Veendrick, Harry. Bits on Chips. Springer, 2019.

Veendrick, Harry. Bits on Chips. Springer, 2018.

Bits on Chips. The Netherlands: www.bitsonchips.com, 2011.

Wagner, Lawrence C. Failure Analysis of Integrated Circuits: Tools and Techniques (The International Series in Engineering and Computer Science). Springer, 1999.

Kostas, Amberiadis, European Optical Society, Society of Photo-optical Instrumentation Engineers., European Commission. Directorate-General XII, Science, Research, and Development., Scottish Enterprise, Sira Technology Centre (U.K.), and Institution of Electrical Engineers, eds. In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing: 19-21 May, 1999, Edinburgh, Scotland. Bellingham, Wash., USA: SPIE, 1999.

Gudrun, Kissinger, Weiland Larg H, Society of Photo-optical Instrumentation Engineers., Scottish Enterprise, European Optical Society, and Institution of Electrical Engineers, eds. In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II: 31 May-1 June 2001, Edinburgh, UK. Bellingham, Washington: SPIE, 2001.