Relevant bibliographies by topics / Selected Area Electron Diffraction (SAED) Patterns

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Academic literature on the topic 'Selected Area Electron Diffraction (SAED) Patterns'

Author: Grafiati
Published: 7 September 2023

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Journal articles on the topic "Selected Area Electron Diffraction (SAED) Patterns"

1

Liu, Delu. "Features of the ISO-25498: Method of Selected Area Electron Diffraction Analysis in Transmission Electron Microscopy." Microscopy and Microanalysis 19, S5 (August 2013): 207–9. http://dx.doi.org/10.1017/s1431927613012671.

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AbstractInternational standard ISO-25498 specifies the method of selected area electron diffraction (SAED) analysis in TEM. It is applicable to the acquisition of SAED patterns, indexing the patterns and calibration of diffraction constant. Several features of this standard are introduced. As an example of the applications, phosphide with nanometer scale in a low-carbon steel produced by compact strip production process was analyzed by SAED and EDX. The phosphide precipitates in the steel are identified as MxP, where x is 2–3 and M is Fe, Ti, Cr, or Ni. It possesses a hexagonal lattice with lattice parameter a = 0.609 nm and c = 0.351 nm.
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Slouf, Miroslav, Radim Skoupy, Ewa Pavlova, and Vladislav Krzyzanek. "Powder Nano-Beam Diffraction in Scanning Electron Microscope: Fast and Simple Method for Analysis of Nanoparticle Crystal Structure." Nanomaterials 11, no. 4 (April 9, 2021): 962. http://dx.doi.org/10.3390/nano11040962.

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We introduce a novel scanning electron microscopy (SEM) method which yields powder electron diffraction patterns. The only requirement is that the SEM microscope must be equipped with a pixelated detector of transmitted electrons. The pixelated detectors for SEM have been commercialized recently. They can be used routinely to collect a high number of electron diffraction patterns from individual nanocrystals and/or locations (this is called four-dimensional scanning transmission electron microscopy (4D-STEM), as we obtain two-dimensional (2D) information for each pixel of the 2D scanning array). Nevertheless, the individual 4D-STEM diffractograms are difficult to analyze due to the random orientation of nanocrystalline material. In our method, all individual diffractograms (showing randomly oriented diffraction spots from a few nanocrystals) are combined into one composite diffraction pattern (showing diffraction rings typical of polycrystalline/powder materials). The final powder diffraction pattern can be analyzed by means of standard programs for TEM/SAED (Selected-Area Electron Diffraction). We called our new method 4D-STEM/PNBD (Powder NanoBeam Diffraction) and applied it to three different systems: Au nano-islands (well diffracting nanocrystals with size ~20 nm), small TbF3 nanocrystals (size < 5 nm), and large NaYF4 nanocrystals (size > 100 nm). In all three cases, the STEM/PNBD results were comparable to those obtained from TEM/SAED. Therefore, the 4D-STEM/PNBD method enables fast and simple analysis of nanocrystalline materials, which opens quite new possibilities in the field of SEM.
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Macicek, Josef. "Phase Microidentification from Selected Area Electron Diffraction (SAED) and Energy Dispersive Spectroscopy (EDS) Data." Advances in X-ray Analysis 35, A (1991): 687–91. http://dx.doi.org/10.1154/s0376030800009423.

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AbstractTwo-dimensional geometry information contained in SAED spot patterns augmented with EDS elemental data is employed in a computerized phase identification of microcrystalline particles. The initial chemistry screening of a laboratory managed database using the 'bitmap' concept is followed by a geometry search/match treating of the spot patterns as planar sections through the reciprocal lattice of a candidate phase. The identification is selective, fast, and yields to a complete automatization,
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Nakamura, Junya, Kenji Matsuda, Yoshio Nakamura, Tatsuo Sato, and Susumu Ikeno. "HRTEM Observation of Rod-Shape Precipitates in Al-Mg-Si-Ag Alloy Aged at 523 K." Materials Science Forum 561-565 (October 2007): 243–46. http://dx.doi.org/10.4028/www.scientific.net/msf.561-565.243.

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The purpose of this study is to identify the crystal structure of metastable phase in Ag added Al-Mg-Si alloy to compare the formation of β’-phases in Al-Mg-Si alloys without Ag, using images of high resolution transmission electron microscope (HRTEM), selected area electron diffraction (SAED) patterns and an energy dispersive X-ray spectroscopy (EDS). The result of SAED patterns and HRTEM images have been simulated and compared with images then SAED patterns obtained from actual precipitates. SAED patterns and HRTEM images obtained from metastable phase in the Ag added Al-Mg-Si alloy showed similar to those of β’-phase in Al-Mg-Si alloy without Ag and the lattice spacings changed because of the effect of Ag.
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Slouf, Miroslav, Radim Skoupy, Ewa Pavlova, and Vladislav Krzyzanek. "High Resolution Powder Electron Diffraction in Scanning Electron Microscopy." Materials 14, no. 24 (December 9, 2021): 7550. http://dx.doi.org/10.3390/ma14247550.

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A modern scanning electron microscope equipped with a pixelated detector of transmitted electrons can record a four-dimensional (4D) dataset containing a two-dimensional (2D) array of 2D nanobeam electron diffraction patterns; this is known as a four-dimensional scanning transmission electron microscopy (4D-STEM). In this work, we introduce a new version of our method called 4D-STEM/PNBD (powder nanobeam diffraction), which yields high-resolution powder diffractograms, whose quality is fully comparable to standard TEM/SAED (selected-area electron diffraction) patterns. Our method converts a complex 4D-STEM dataset measured on a nanocrystalline material to a single 2D powder electron diffractogram, which is easy to process with standard software. The original version of 4D-STEM/PNBD method, which suffered from low resolution, was improved in three important areas: (i) an optimized data collection protocol enables the experimental determination of the point spread function (PSF) of the primary electron beam, (ii) an improved data processing combines an entropy-based filtering of the whole dataset with a PSF-deconvolution of the individual 2D diffractograms and (iii) completely re-written software automates all calculations and requires just a minimal user input. The new method was applied to Au, TbF3 and TiO2 nanocrystals and the resolution of the 4D-STEM/PNBD diffractograms was even slightly better than that of TEM/SAED.
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Odlyzko, Michael L., and K. Andre Mkhoyan. "Identifying Hexagonal Boron Nitride Monolayers by Transmission Electron Microscopy." Microscopy and Microanalysis 18, no. 3 (April 12, 2012): 558–67. http://dx.doi.org/10.1017/s143192761200013x.

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AbstractMultislice simulations in the transmission electron microscope (TEM) were used to examine changes in annular-dark-field scanning TEM (ADF-STEM) images, conventional bright-field TEM (BF-CTEM) images, and selected-area electron diffraction (SAED) patterns as atomically thin hexagonal boron nitride (h-BN) samples are tilted up to 500 mrad off of the [0001] zone axis. For monolayer h-BN the contrast of ADF-STEM images and SAED patterns does not change with tilt in this range, while the contrast of BF-CTEM images does change; h-BN multilayer contrast varies strongly with tilt for ADF-STEM imaging, BF-CTEM imaging, and SAED. These results indicate that tilt series analysis in ADF-STEM image mode or SAED mode should permit identification of h-BN monolayers from raw TEM data as well as from quantitative post-processing.
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Van Buskirk, Peter C., Robin Gardiner, Peter S. Kirlin, and Steven Nutt. "Reduced-pressure MOCVD of highly crystalline BaTiO3 thin films." Journal of Materials Research 7, no. 3 (March 1992): 542–45. http://dx.doi.org/10.1557/jmr.1992.0542.

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Epitaxial BaTi3 films have been grown on NdGaO3 [100] substrates by reduced pressure MOCVD for the first time. The substrate temperature was 1000 °C and the total pressure was 4 Torr. Electron and x-ray diffraction measurements indicate highly textured, single phase films on the NdGaO3 substrate which are predominantly [100], with [110] also present. TEM and selected area electron diffraction (SAED) indicate two specific orientational relationships between the [110] and the [001] diffraction patterns.
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Li, Qingyun, Lingyu Liu, Zihua Wang, and Xuezhong Wang. "Continuous Hydrothermal Flow Synthesis and Characterization of ZrO2 Nanoparticles Doped with CeO2 in Supercritical Water." Nanomaterials 12, no. 4 (February 17, 2022): 668. http://dx.doi.org/10.3390/nano12040668.

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A confined jet mixing reactor operated in continuous hydrothermal flow synthesis was investigated for the synthesis of CeO2-ZrO2 (CZ) nanoparticles. The obtained ultrafine powders were characterized using scanning electron microscopy–energy dispersive spectrometry (SEM-EDS), inductively coupled plasma–atomic emission spectroscopy (ICP-AES), Fourier transform infrared spectroscopy (FTIR), Raman spectroscopy, X-ray diffraction analysis (XRD), transmission electron microscopy (TEM) coupled with selected area electron diffraction (SAED), a BET (Brunauer-Emmett-Teller)-specific surface area test and pore analysis, oxygen storage capacity (OSC) test, and a H2 temperature programmed reduction (H2-TPR) test. The XRD results show that all samples were composed of high-purity cubic CZ nanoparticles. High resolution transmission electron microscope (HR-TEM) analysis showed that CZ nanoparticles with uniform size and shape distributions were obtained in this investigation. The d-spacing values, determined based on the TEM-selected area electron diffraction (SAED) patterns, were in good agreements with the reference data. BET results showed that the prepared CZ samples had large specific surface areas. Pore volume and size distribution were obtained by pore analysis. Oxygen pulse adsorption technology was used to test the oxygen storage capacity of the sample. The redox capacity of the CZ material was determined by a H2 temperature-programmed reduction test.
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Lábár, János L. "Electron Diffraction Based Analysis of Phase Fractions and Texture in Nanocrystalline Thin Films, Part I: Principles." Microscopy and Microanalysis 14, no. 4 (July 4, 2008): 287–95. http://dx.doi.org/10.1017/s1431927608080380.

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A method for phase analysis, similar to the Rietveld method in X-ray diffraction, was not developed for electron diffraction (ED) in the transmission electron microscope (TEM), mainly due to the dynamic nature of ED. Nowadays, TEM laboratories encounter many thin samples with grain size in the 1–30 nm range, not too far from the kinematic ED conditions. This article describes a method that performs (semi)quantitative phase analysis for nanocrystalline samples from selected area electron diffraction (SAED) patterns. Fractions of the different nanocrystalline components are determined from rotationally symmetric ring patters. Both randomly oriented nanopowders and textured nanopowders, observed from the direction of the texture axis produce such SAED patterns. The textured fraction is determined as a separate component by fitting the spectral components, calculated for the previously identified phases with a priori known structures, to the measured distribution. The Blackman correction is applied to the set of kinematic diffraction lines to take into account dynamic effects for medium grain size. Parameters of the peak shapes and the other experimental parameters are refined by exploring the parameter space with the help of the Downhill-SIMPLEX. Part I presents the principles, while future publication of Parts II and III will elaborate on current implementation and will demonstrate its usage by examples, respectively.
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KANG, YOUNG SOO, and DONG RI ZHANG. "SYNTHESIS AND CHARACTERIZATION OF TITANIUM DIOXIDE DOPED WITH Sc3+ IONS." International Journal of Nanoscience 05, no. 02n03 (April 2006): 351–57. http://dx.doi.org/10.1142/s0219581x06004462.

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Nanoparticles of titanium dioxide ( TiO 2) doped with 5 at.% Sc 3+ ions were synthesized using the sol–gel method and calcined at 500°C to obtain better anatase phase. The crystal structures of the doped TiO 2 nanoparticles were characterized by X-ray powder diffraction (XRD), Raman, UV-vis, FT-IR spectroscopy, high resolution transmission electron microscopy (HRTEM) and selected-area electron diffraction (SAED). XRD patterns and Raman spectra of TiO 2 + 5 at.% Sc -500°C show the anatase phase and the average particle size of the sample calculated from XRD patterns was determined as 5.9 nm. Well-resolved rings of SAED of TiO 2 doped with Sc 3+ ions are easily indexed to those from XRD pattern. HRTEM shows the well-defined lattice fringes and the lattice spacing measured from HRTEM is 0.33 nm, which is in well agreement with the distance between the (101) planes in anatase TiO 2. Energy-dispersive X-ray (EDX) spectrum of the doped TiO 2 confirms the presence of Sc element in the TiO 2 matrix.
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Book chapters on the topic "Selected Area Electron Diffraction (SAED) Patterns"

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Steeds, John W., and J. P. Morniroli. "Chapter 2. SELECTED AREA ELECTRON DIFFRACTION (SAED) and CONVERGENT BEAM ELECTRON DIFFRACTION (CBED)." In Minerals and Reactions at the Atomic Scale, edited by Peter R. Buseck, 37–84. Berlin, Boston: De Gruyter, 1992. http://dx.doi.org/10.1515/9781501509735-006.

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Russ, J. C., T. Taguchi, P. M. Peters, E. Chatfield, J. C. Russ, and W. D. Stewart. "Automatic Computer Measurement of Selected Area Electron Diffraction Patterns from Asbestos Minerals." In Advances in X-Ray Analysis, 593–600. Boston, MA: Springer US, 1989. http://dx.doi.org/10.1007/978-1-4757-9110-5_73.

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Krishnan, Kannan M. "Diffraction of Electrons and Neutrons." In Principles of Materials Characterization and Metrology, 481–551. Oxford University Press, 2021. http://dx.doi.org/10.1093/oso/9780198830252.003.0008.

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Electron scattering, significantly stronger than that for X-rays, is sensitive to surfaces and small volumes of materials. Low-energy electron diffraction (LEED) provides information on surface reconstruction and the arrangement of adsorbed atoms. Reflection high energy electron diffraction (RHEED) probes surface crystallography, and monitors, in situ, mechanisms of thin film growth. Transmission electron diffraction reveals a planar cross-section of the reciprocal lattice, where intensities are products of the structure and lattice amplitude factors determined by the overall shape of the specimen. The amplitude of any diffracted beam at the exit surface oscillates with thickness (fringes) and the excitation error (bend contours). Selected area diffraction produce spot or ring patterns, where low-index zone-axis orientations reflect the symmetry of the crystal, and double-diffraction shows positive intensities even for reflections forbidden by extinction rules. Kikuchi lines appear as pairs of dark and bright lines, and help in tilting the specimen. A focused probe produces convergent beam electron diffraction (CBED), useful for symmetry analysis at nanoscale resolution. Neutrons interact with the nucleus and the magnetic moment of the atom via the spin of the neutron; the latter finds particular use in studies of magnetic order. The atomic scattering factor for neutrons shows negligible angular dependence.
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Conference papers on the topic "Selected Area Electron Diffraction (SAED) Patterns"

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Wang, Yafei, Songyan Hu, Guangxu Cheng, Zaoxiao Zhang, and Jianxiao Zhang. "Influence of Quenching-Tempering on the Carbide Precipitation of 2.25Cr-1Mo-0.25V Steel Used in Reactor Pressure Vessels." In ASME 2019 Pressure Vessels & Piping Conference. American Society of Mechanical Engineers, 2019. http://dx.doi.org/10.1115/pvp2019-93054.

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Abstract The carbide precipitation of 2.25Cr-1Mo-0.25V steel is studied during the head-fabrication heat treatment process using gold replica technique, scanning electron microscopy (SEM), transmission electron microscopy (TEM) and selected area electron diffraction (SAED). Shapes, structures and sizes of carbides before and after heat treatment are analyzed. The dissolution of strip-shaped carbides and the precipitation of granular carbides are confirmed. Amorphous films at the boundaries of carbides are observed by high-resolution transmission electron microscope (HRTEM), which is formed due to the electron irradiation under TEM.
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