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Journal articles on the topic 'Secondary ion mass spectrometer'

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Published: 25 May 2024

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1

Todd, Peter J., and T. Gregory Schaaff. "A secondary ion microprobe ion trap mass spectrometer." Journal of the American Society for Mass Spectrometry 13, no. 9 (September 2002): 1099–107. http://dx.doi.org/10.1016/s1044-0305(02)00434-8.

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2

Olthoff, J. K., I. A. Lys, and R. J. Cotter. "A pulsed time-of-flight mass spectrometer for liquid secondary ion mass spectrometry." Rapid Communications in Mass Spectrometry 2, no. 9 (September 1988): 171–75. http://dx.doi.org/10.1002/rcm.1290020902.

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3

Baturin, V. A., S. A. Eremin, and S. A. Pustovoĭtov. "Secondary ion mass spectrometer based on a high-dose ion implanter." Technical Physics 52, no. 6 (June 2007): 770–75. http://dx.doi.org/10.1134/s1063784207060163.

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4

Jiang, Jichun, Lei Hua, Yuanyuan Xie, Yixue Cao, Yuxuan Wen, Ping Chen, and Haiyang Li. "High Mass Resolution Multireflection Time-of-Flight Secondary Ion Mass Spectrometer." Journal of the American Society for Mass Spectrometry 32, no. 5 (April 20, 2021): 1196–204. http://dx.doi.org/10.1021/jasms.1c00016.

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5

Hull, Robert, Derren Dunn, and Alan Kubis. "Nanoscale Tomographic Imaging using Focused Ion Beam Sputtering, Secondary Electron Imaging and Secondary Ion Mass Spectrometry." Microscopy and Microanalysis 7, S2 (August 2001): 934–35. http://dx.doi.org/10.1017/s1431927600030749.

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As the importance of nano-scaled structures in both science and engineering increases, techniques for reconstructing three-dimensional structural, crystallographic and chemical relationships become increasingly important. in this paper we described a technique which uses focused ion beam (FIB) sputtering to expose successive layers of a 3D sample, coupled with secondary electron imaging and secondary ion mass spectrometry of each sputtered surface. Computer interpolation of these different slice images then enables reconstruction of the 3D structure and chemistry of the sample. These techniques are applicable to almost any inorganic material, at a spatial resolution of tens of nanometers, and fields of view up to (tens of μm).The FIB instrument used in this study is an FEI 200 with a minimum ion probe diameter < 10 nm, an ion current density ∼ 10 A/cm2, a maximum ion current of 11 nA, and a standard Ga+ ion energy of 30 keV. Our instrument is equipped with a continuous dynode electron multiplies (CDEM) for secondary electron imaging and a quadrupole mass spectrometer for secondary ion mass spectroscopy (SIMS) / element specific mapping. Gallium ions of this energy will ablate any material, with sputter yields typically of order ten, corresponding to a material removal rate of order 1 μm3nA−1s−1.

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6

ISHIKAWA, Shuji, and Yuko TAKEGUCHI. "Secondary Ion Mass Spectrometry." Journal of the Japan Society of Colour Material 86, no. 10 (2013): 386–91. http://dx.doi.org/10.4011/shikizai.86.386.

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7

FUJITA, Koichi. "Secondary Ion Mass Spectrometry." Journal of the Japan Society of Colour Material 79, no. 2 (2006): 81–85. http://dx.doi.org/10.4011/shikizai1937.79.81.

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8

Williams, Peter. "Secondary Ion Mass Spectrometry." Annual Review of Materials Science 15, no. 1 (August 1985): 517–48. http://dx.doi.org/10.1146/annurev.ms.15.080185.002505.

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9

Griffiths, Jennifer. "Secondary Ion Mass Spectrometry." Analytical Chemistry 80, no. 19 (October 2008): 7194–97. http://dx.doi.org/10.1021/ac801528u.

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10

Zalm, PC. "Secondary ion mass spectrometry." Vacuum 45, no. 6-7 (June 1994): 753–72. http://dx.doi.org/10.1016/0042-207x(94)90113-9.

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11

Torrisi, Lorenzo, Giuseppe Costa, Giovanni Ceccio, Antonino Cannavò, Nancy Restuccia, and Mariapompea Cutroneo. "Magnetic and electric deflector spectrometers for ion emission analysis from laser generated plasma." EPJ Web of Conferences 167 (2018): 03011. http://dx.doi.org/10.1051/epjconf/201816703011.

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The pulsed laser-generated plasma in vacuum and at low and high intensities can be characterized using different physical diagnostics. The charge particles emission can be characterized using magnetic, electric and magnet-electrical spectrometers. Such on-line techniques are often based on time-of-flight (TOF) measurements. A 90° electric deflection system is employed as ion energy analyzer (IEA) acting as a filter of the mass-to-charge ratio of emitted ions towards a secondary electron multiplier. It determines the ion energy and charge state distributions. The measure of the ion and electron currents as a function of the mass-to-charge ratio can be also determined by a magnetic deflector spectrometer, using a magnetic field of the order of 0.35 T, orthogonal to the ion incident direction, and an array of little ion collectors (IC) at different angles. A Thomson parabola spectrometer, employing gaf-chromix as detector, permits to be employed for ion mass, energy and charge state recognition. Mass quadrupole spectrometry, based on radiofrequency electric field oscillations, can be employed to characterize the plasma ion emission. Measurements performed on plasma produced by different lasers, irradiation conditions and targets are presented and discussed. Complementary measurements, based on mass and optical spectroscopy, semiconductor detectors, fast CCD camera and Langmuir probes are also employed for the full plasma characterization. Simulation programs, such as SRIM, SREM, and COMSOL are employed for the charge particle recognition.

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12

Tang, X., R. Beavis, W. Ens, F. Lafortune, B. Schueler, and K. G. Standing. "A secondary ion time-of-flight mass spectrometer with an ion mirror." International Journal of Mass Spectrometry and Ion Processes 85, no. 1 (July 1988): 43–67. http://dx.doi.org/10.1016/0168-1176(88)83004-0.

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13

Schueler, Bruno, and Robert W. Odom. "Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (August 12, 1990): 308–9. http://dx.doi.org/10.1017/s0424820100135149.

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Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

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14

Warmenhoven, J., J. Demarche, V. Palitsin, K. J. Kirkby, and R. P. Webb. "Modeling Transport of Secondary Ion Fragments into a Mass Spectrometer." Physics Procedia 66 (2015): 352–60. http://dx.doi.org/10.1016/j.phpro.2015.05.044.

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15

Konarski, Piotr, Krzysztof Kaczorek, Michał Ćwil, and Jerzy Marks. "Quadrupole-based glow discharge mass spectrometer: Design and results compared to secondary ion mass spectrometry analyses." Vacuum 81, no. 10 (June 2007): 1323–27. http://dx.doi.org/10.1016/j.vacuum.2007.01.038.

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16

Lin, Y. P., and Y. C. Ling. "Surface Study of Polymers by Static Secondary Ion Mass Spectrometry Using a Magnetic-Sector Mass Spectrometer." Journal of the Chinese Chemical Society 40, no. 3 (June 1993): 229–40. http://dx.doi.org/10.1002/jccs.199300035.

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17

Grasserbauer, M. "Quantitative secondary ion mass spectrometry." Journal of Research of the National Bureau of Standards 93, no. 3 (May 1988): 510. http://dx.doi.org/10.6028/jres.093.140.

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18

Odom, Robert W. "Secondary Ion Mass Spectrometry Imaging." Applied Spectroscopy Reviews 29, no. 1 (February 1994): 67–116. http://dx.doi.org/10.1080/05704929408000898.

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19

Morrison, G. H. "Editorial. Secondary Ion Mass Spectrometry." Analytical Chemistry 58, no. 1 (January 1986): 1. http://dx.doi.org/10.1021/ac00292a600.

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20

Kudo, Masahiro, and Susumu Nagayama. "Secondary Ion Mass Spectrometry (SIMS)." Zairyo-to-Kankyo 42, no. 5 (1993): 312–21. http://dx.doi.org/10.3323/jcorr1991.42.312.

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21

TSUNOYAMA, Kouzou. "Quantitative Secondary Ion Mass Spectrometry." Hyomen Kagaku 7, no. 3 (1986): 237–42. http://dx.doi.org/10.1380/jsssj.7.237.

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22

Olthoff, James K., and Robert J. Cotter. "Liquid secondary ion mass spectrometry." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 26, no. 4 (June 1987): 566–70. http://dx.doi.org/10.1016/0168-583x(87)90544-1.

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23

Slodzian, Georges, Ting-Di Wu, Noémie Bardin, Jean Duprat, Cécile Engrand, and Jean-Luc Guerquin-Kern. "Simultaneous Hydrogen and Heavier Element Isotopic Ratio Images with a Scanning Submicron Ion Probe and Mass Resolved Polyatomic Ions." Microscopy and Microanalysis 20, no. 2 (February 19, 2014): 577–81. http://dx.doi.org/10.1017/s1431927613014074.

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AbstractIn situ microanalysis of solid samples is often performed using secondary ion mass spectrometry (SIMS) with a submicron ion probe. The destructive nature of the method makes it mandatory to prevent information loss by using instruments combining efficient collection of secondary ions and a mass spectrometer with parallel detection capabilities. The NanoSIMS meets those requirements with a magnetic spectrometer but its mass selectivity has to be improved for accessing opportunities expected from polyatomic secondary ions. We show here that it is possible to perform D/H ratio measurement images using 12CD−/12CH−, 16OD−/16OH−, or 12C2D−/12C2H− ratios. These polyatomic species allow simultaneous recording of D/H ratios and isotopic compositions of heavier elements like 15N/14N (via 12C15N−/12C14N−) and they provide a powerful tool to select the phase of interest (e.g., mineral versus organics). We present high mass resolution spectra and an example of isotopic imaging where D/H ratios were obtained via the 12C2D−/12C2H− ratio with 12C2D− free from neighboring mass interferences. Using an advanced mass resolution protocol, a “conventional” mass resolving power of 25,000 can be achieved. Those results open many perspectives for isotopic imaging at a fine scale in biology, material science, geochemistry, and cosmochemistry.

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24

Daly, Steven, Frédéric Rosu, and Valérie Gabelica. "Mass-resolved electronic circular dichroism ion spectroscopy." Science 368, no. 6498 (June 25, 2020): 1465–68. http://dx.doi.org/10.1126/science.abb1822.

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DNA and proteins are chiral: Their three-dimensional structures cannot be superimposed with their mirror images. Circular dichroism spectroscopy is widely used to characterize chiral compounds, but data interpretation is difficult in the case of mixtures. We recorded the electronic circular dichroism spectra of DNA helices separated in a mass spectrometer. We studied guanine-rich strands having various secondary structures, electrosprayed them as negative ions, irradiated them with an ultraviolet nanosecond optical parametric oscillator laser, and measured the difference in electron photodetachment efficiency between left and right circularly polarized light. The reconstructed circular dichroism ion spectra resembled those of their solution-phase counterparts, thereby allowing us to assign the DNA helical topology. The ability to measure circular dichroism directly on biomolecular ions expands the capabilities of mass spectrometry for structural analysis.

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25

Zinkiewicz, J. M., M. Sowa, R. Baranowski, L. Glusiec, and K. Kiszczak. "A new thermal emission cesium primary ion source for secondary ion mass spectrometer." Review of Scientific Instruments 63, no. 4 (April 1992): 2414–16. http://dx.doi.org/10.1063/1.1142947.

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26

Cole, Richard B., Stephen Boue, and A. Kamel Harrata. "Implementation of liquid secondary ion mass spectrometry on quadrupole mass spectrometers." Analytica Chimica Acta 267, no. 1 (September 1992): 121–29. http://dx.doi.org/10.1016/0003-2670(92)85013-v.

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27

NIHEI, YOSHIMASA, HITOMI SATOH, BUNBUNOSHIN TOMIYASU, and MASANORI OWARI. "SUBMICRON SECONDARY ION MASS SPECTROMETER FOR THREE-DIMENSIONAL ANALYSIS OF MICROSTRUCTURE." Analytical Sciences 7, Supple (1991): 527–32. http://dx.doi.org/10.2116/analsci.7.supple_527.

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28

Healy, R. M., J. Sciare, L. Poulain, M. Crippa, A. Wiedensohler, A. S. H. Prévôt, U. Baltensperger, et al. "Quantitative determination of carbonaceous particle mixing state in Paris using single particle mass spectrometer and aerosol mass spectrometer measurements." Atmospheric Chemistry and Physics Discussions 13, no. 4 (April 19, 2013): 10345–93. http://dx.doi.org/10.5194/acpd-13-10345-2013.

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Abstract. Single particle mixing state information can be a powerful tool for assessing the relative impact of local and regional sources of ambient particulate matter in urban environments. However, quantitative mixing state data are challenging to obtain using single particle mass spectrometers. In this study, the quantitative chemical composition of carbonaceous single particles has been estimated using an aerosol time-of-flight mass spectrometer (ATOFMS) as part of the MEGAPOLI 2010 winter campaign in Paris, France. Relative peak areas of marker ions for elemental carbon (EC), organic aerosol (OA), ammonium, nitrate, sulphate and potassium were compared with concurrent measurements from an Aerodyne high resolution time-of-flight aerosol mass spectrometer (HR-ToF-AMS), a thermal/optical OCEC analyser and a particle into liquid sampler coupled with ion chromatography (PILS-IC). ATOFMS-derived mass concentrations reproduced the variability of these species well (R2 = 0.67–0.78), and ten discrete mixing states for carbonaceous particles were identified and quantified. Potassium content was used to identify particles associated with biomass combustion. The chemical mixing state of HR-ToF-AMS organic aerosol factors, resolved using positive matrix factorization, was also investigated through comparison with the ATOFMS dataset. The results indicate that hydrocarbon-like OA (HOA) detected in Paris is associated with two EC-rich mixing states which differ in their relative sulphate content, while fresh biomass burning OA (BBOA) is associated with two mixing states which differ significantly in their OA/EC ratios. Aged biomass burning OA (OOA2-BBOA) was found to be significantly internally mixed with nitrate, while secondary, oxidized OA (OOA) was associated with five particle mixing states, each exhibiting different relative secondary inorganic ion content. Externally mixed secondary organic aerosol was not observed. These findings demonstrate the heterogeneity of primary and secondary organic aerosol mixing states in Paris. Examination of the temporal behaviour and chemical composition of the ATOFMS classes also enabled estimation of the relative contribution of transported emissions of each chemical species and total particle mass in the size range investigated. Only 22% of the total ATOFMS-derived particle mass was apportioned to fresh, local emissions, with 78% apportioned to regional/continental scale emissions.

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29

Healy, R. M., J. Sciare, L. Poulain, M. Crippa, A. Wiedensohler, A. S. H. Prévôt, U. Baltensperger, et al. "Quantitative determination of carbonaceous particle mixing state in Paris using single-particle mass spectrometer and aerosol mass spectrometer measurements." Atmospheric Chemistry and Physics 13, no. 18 (September 26, 2013): 9479–96. http://dx.doi.org/10.5194/acp-13-9479-2013.

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Abstract. Single-particle mixing state information can be a powerful tool for assessing the relative impact of local and regional sources of ambient particulate matter in urban environments. However, quantitative mixing state data are challenging to obtain using single-particle mass spectrometers. In this study, the quantitative chemical composition of carbonaceous single particles has been determined using an aerosol time-of-flight mass spectrometer (ATOFMS) as part of the MEGAPOLI 2010 winter campaign in Paris, France. Relative peak areas of marker ions for elemental carbon (EC), organic aerosol (OA), ammonium, nitrate, sulfate and potassium were compared with concurrent measurements from an Aerodyne high-resolution time-of-flight aerosol mass spectrometer (HR-ToF-AMS), a thermal–optical OCEC analyser and a particle into liquid sampler coupled with ion chromatography (PILS-IC). ATOFMS-derived estimated mass concentrations reproduced the variability of these species well (R2 = 0.67–0.78), and 10 discrete mixing states for carbonaceous particles were identified and quantified. The chemical mixing state of HR-ToF-AMS organic aerosol factors, resolved using positive matrix factorisation, was also investigated through comparison with the ATOFMS dataset. The results indicate that hydrocarbon-like OA (HOA) detected in Paris is associated with two EC-rich mixing states which differ in their relative sulfate content, while fresh biomass burning OA (BBOA) is associated with two mixing states which differ significantly in their OA / EC ratios. Aged biomass burning OA (OOA2-BBOA) was found to be significantly internally mixed with nitrate, while secondary, oxidised OA (OOA) was associated with five particle mixing states, each exhibiting different relative secondary inorganic ion content. Externally mixed secondary organic aerosol was not observed. These findings demonstrate the range of primary and secondary organic aerosol mixing states in Paris. Examination of the temporal behaviour and chemical composition of the ATOFMS classes also enabled estimation of the relative contribution of transported emissions of each chemical species and total particle mass in the size range investigated. Only 22% of the total ATOFMS-derived particle mass was apportioned to fresh, local emissions, with 78% apportioned to regional/continental-scale emissions.

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30

Slodzian, Georges, Bernard Daigne, and Francois Girard. "Transmission optimization of a microprobe instrument using a magnetic mass spectrometer." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1546–47. http://dx.doi.org/10.1017/s0424820100132364.

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Secondary ion emission from a solid target bombarded with primary ions in the range of several keV energy is a well known phenomenon which has been extensively used for determining elemental and isotopic compositions of solid samples and characterizing surface layers. Taking advantage of the fact that secondary ion emission is a rather localized process and has relatively high ionization yields, it is possible to build analytical ion microscopes with resolutions better than l00nm and fairly good sensitivity. The ionization useful yield (inverse of the average number of target atoms which must be sputtered to produce a well identified ion) depends upon the ionization probability and the overall transmission of the instrument (ratio of the number of ions forming a line in the mass spectrometer to the number of ions produced when a given number of atoms have been sputtered). It should be emphasized that the useful yield controls the ultimate performances of the instrument and that transmission considerations are essential when the spectrometer must work at high mass resolutions to separate different ionic species having the same number of mass units.

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31

CHOI, Myoung Choul. "Development of Ar Cluster-Ion Beam and Time-of-Flight Secondary-Ion Mass Spectrometer." Physics and High Technology 28, no. 6 (June 28, 2019): 8–12. http://dx.doi.org/10.3938/phit.28.023.

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32

Stanley, M. S., and K. L. Busch. "Primary Beam and Ion Extraction Optics Optimization for An Organic Secondary Ion Mass Spectrometer." Instrumentation Science & Technology 18, no. 3-4 (January 1989): 243–64. http://dx.doi.org/10.1080/10739148908543710.

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33

von Criegern, Rolf, and Heinz Zeininger. "SIMS Microarea Depth Profiling of Microelectronic Device Structures." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (August 12, 1990): 310–11. http://dx.doi.org/10.1017/s0424820100135150.

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In recent years, considerable progress has been made in SIMS (secondary ion mass spectrometry) with respect to its ability to measure dopant depth profiles in μm2-sized areas of microelectronic devices. This progress is mainly due to the fact that for the first time two of the main requirements associated with this application are fulfilled within one instrument (the Cameca IMS 4F):. the availability of a sub-μm ion beam of a species ensuring high secondary ion yields of the dopants (in this case: negative secondary ions emitted upon cesium bombardment)and . a mass spectrometer system with high transmission (from sample to detector; in this case: about 27%).The lateral resolution (smallest spot size of the cesium beam) which we obtain with our instrument is about 0.3 μm so that indeed areas as small as 1 μm2 can be defined on a sample. The detection limit for a dopant in an analytical volume of 1 μm × 1 μm × 10 nm (10 nm = sputter depth per data point in the profile) is then determined by the secondary ion yield and the instrument transmission.

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34

Katz, W., and J. G. Newman. "Fundamentals of Secondary Ion Mass Spectrometry." MRS Bulletin 12, no. 6 (September 1987): 40–47. http://dx.doi.org/10.1557/s088376940006721x.

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AbstractThis article presents an overview of our current understanding of the fundamental factors underlying Secondary Ion Mass Spectrometry (SIMS). Included is a discussion of the sputtering process and possible mechanisms which produce ejected ions. Presently available instrumentation for SIMS analysis is discussed and some examples of SIMS analysis are also given.

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35

Yurimoto, Hisayoshi, and Shigeho Sueno. "Secondary ion mass spectrometry for insulators." Nihon Kessho Gakkaishi 29, no. 4 (1987): 259–69. http://dx.doi.org/10.5940/jcrsj.29.259.

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36

Benninghoven, A., A. M. Huber, and H. W. Werner. "Secondary ion mass spectrometry (SIMS VI)." Analytica Chimica Acta 215 (1988): 366. http://dx.doi.org/10.1016/s0003-2670(00)85312-x.

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37

Handley, Judith. "Product Review: Secondary Ion Mass Spectrometry." Analytical Chemistry 74, no. 11 (June 2002): 335 A—341 A. http://dx.doi.org/10.1021/ac022041e.

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38

Andersen, Hans Henrik. "Secondary ion mass spectrometry SIMS V." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 31, no. 4 (June 1988): 597–98. http://dx.doi.org/10.1016/0168-583x(88)90462-4.

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39

Roberts, AlanD. "Secondary ion mass spectrometry (SIMS VII)." Analytica Chimica Acta 242 (1991): 301–2. http://dx.doi.org/10.1016/0003-2670(91)87086-m.

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40

Sykes, D. E. "Secondary ion mass spectrometry - SIMS VIII." Spectrochimica Acta Part A: Molecular Spectroscopy 49, no. 10 (September 1993): 1555–56. http://dx.doi.org/10.1016/0584-8539(93)80061-e.

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41

Vainiotalo, Pirjo. "Secondary ion mass spectrometry SIMS IX." Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy 51, no. 9 (August 1995): 1533. http://dx.doi.org/10.1016/0584-8539(95)90161-2.

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42

Ling, Yong-Chien. "Microanalysis Using Secondary Ion Mass Spectrometry." Journal of the Chinese Chemical Society 41, no. 3 (June 1994): 329–33. http://dx.doi.org/10.1002/jccs.199400045.

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43

Levi-Setti, R., J. M. Chabala, R. Espinosa, and M. M. Le Beau. "Advances in imaging SIMS studies of stained and BrdU-labelled human metaphase chromosomes." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 932–33. http://dx.doi.org/10.1017/s0424820100141032.

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We have shown previously that isotope-labelled nucleotides in human metaphase chromosomes can be detected and mapped by imaging secondary ion mass spectrometry (SIMS), using the University of Chicago high resolution scanning ion microprobe (UC SIM). These early studies, conducted with BrdU- and 14C-thymidine-labelled chromosomes via detection of the Br and 28CN- (14C14N-> labelcarrying signals, provided some evidence for the condensation of the label into banding patterns along the chromatids (SIMS bands) reminiscent of the well known Q- and G-bands obtained by conventional staining methods for optical microscopy. The potential of this technique has been greatly enhanced by the recent upgrade of the UC SIM, now coupled to a high performance magnetic sector mass spectrometer in lieu of the previous RF quadrupole mass filter. The high transmission of the new spectrometer improves the SIMS analytical sensitivity of the microprobe better than a hundredfold, overcoming most of the previous imaging limitations resulting from low count statistics.

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44

Kawaguchi, S., M. Kudo, Masaki Tanemura, Lei Miao, Sakae Tanemura, Y. Gotoh, M. Liao, and S. Shinkai. "Angle Dependent Sputtering and Dimer Formation from Vanadium Nitride Target by Ar⁺ Ion Bombardment." Advanced Materials Research 11-12 (February 2006): 607–10. http://dx.doi.org/10.4028/www.scientific.net/amr.11-12.607.

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A compact angle-resolved secondary ion mass spectrometer (AR-SIMS) with a special geometrical configuration, composing of a differentially pumped micro-beam ion-gun, a tiltable sample stage and a time-of-flight (TOF) mass spectrometer was applied to measure angular distribution (AD) of secondary ions ejected from VN by oblique 3 keV Ar+ sputtering at room temperature. AD of V+ was almost identical with that of N+, strongly suggesting that Gibbsian segregation did not take place during sputtering. Since the angular dependence of VN+/V+ and V2 +/V+ intensity ratios was independent of that of N+ and V+ intensities, VN+ and V2 + dimer ions were generated via the “as such” direct emission process.

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45

Peng, Bijie, Mingyue He, Sheng He, Mei Yang, and Yujia Shi. "New Olivine Reference Materials for Secondary Ion Mass Spectrometry Oxygen Isotope Measurements." Crystals 13, no. 7 (June 21, 2023): 987. http://dx.doi.org/10.3390/cryst13070987.

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To accurately analyze the oxygen isotope of olivine using secondary ion mass spectrometry (SIMS), appropriate standard materials are required to calibrate for matrix effects caused by chemical composition differences between the samples and the standard materials. In this study, we investigated the homogeneity of oxygen isotopes in two natural olivine minerals using a secondary ion mass spectrometer to evaluate their potential as standard materials. The two minerals, JAY03-3 and JAY02-4, with forsterite contents of 99.3% and 99.6%, respectively, were evaluated for homogeneity in oxygen isotope composition. The recommended oxygen isotope values were characterized using CO2 laser fluorination, and the homogeneity was tested with in situ SIMS oxygen isotope measurements. Our results show that the δ18O value determined via CO2 laser fluorination for JAY03-3 is 16.37 ± 0.22‰ (2 s) and for JAY02-4 is 18.29 ± 0.28‰ (2 s). The precision of SIMS oxygen isotope measurements is 0.57‰ (2 s) for JAY03-3 and 0.70‰ (2 s) for JAY02-4. These two minerals have the potential to be used as standard materials for calibrating the oxygen isotope value of end-member forsterite during in situ analysis of SIMS oxygen isotope.

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Song, Tinglu, Meishuai Zou, Defeng Lu, Hanyuan Chen, Benpeng Wang, Shuo Wang, and Fan Xu. "Probing Surface Information of Alloy by Time of Flight-Secondary Ion Mass Spectrometer." Crystals 11, no. 12 (November 26, 2021): 1465. http://dx.doi.org/10.3390/cryst11121465.

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In recent years, time of flight-secondary ion mass spectrometer (ToF-SIMS) has been widely employed to acquire surface information of materials. Here, we investigated the alloy surface by combining the mass spectra and 2D mapping images of ToF-SIMS. We found by surprise that these two results seem to be inconsistent with each other. Therefore, other surface characteristic tools such as SEM-EDS were further used to provide additional supports. The results indicated that such differences may originate from the variance of secondary ion yields, which might be affected by crystal orientation.

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Kita, Noriko T., Peter E. Sobol, James R. Kern, Neal E. Lord, and John W. Valley. "UV-light microscope: improvements in optical imaging for a secondary ion mass spectrometer." Journal of Analytical Atomic Spectrometry 30, no. 5 (2015): 1207–13. http://dx.doi.org/10.1039/c4ja00349g.

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In situ analysis by secondary ion mass spectrometer (SIMS) and other in situ techniques requires accurate aiming of the sample surface at μm scale. Modification of the reflected-light microscope system of an IMS 1280 SIMS to use ultraviolet light illumination improved the optical resolution from 3.5 μm to 1.3 μm.

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Zhao, L., and C. Yang. "CHEMICAL COMPOSITION OF AEROSOLS IN THE WEST COAST OF TAIWAN STRAIT, CHINA." ISPRS - International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences XLII-3/W9 (October 25, 2019): 233–37. http://dx.doi.org/10.5194/isprs-archives-xlii-3-w9-233-2019.

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Abstract. The chemical composition of aerosols was investigated using regular environmental air quality observation, a single particle aerosol mass spectrometer (SPAMS 0515) and an ambient ion monitor (URG 9000D) in Xiamen in 2018. The results showed that the annual average mass concentrations of PM2.5 was 22 μm/m3, and concentrations of water-soluble inorganic ions was 9.94 μm/m3 which accounted for 45.2% of PM2.5. SO42−, NO3− and NH4+ were main components of secondary reactions which contributed more than 77 percent of water-soluble inorganic ion concentration. As a coastal city, Cl− and Na+ contributed 13.9 percent of water-soluble inorganic ion concentration. Based on single particle aerosol mass spectrometer analysing, mobile sources emission was the most important sources of particle matter which contributed over 30%.

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Inglebert, R. L., B. Klossa, J. C. Lorin, and R. Thomas. "Proposed in situ secondary ion mass spectrometry on Mars." Planetary and Space Science 43, no. 1-2 (January 1995): 129–37. http://dx.doi.org/10.1016/0032-0633(95)93404-2.

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Kiss, András, Donald F. Smith, Julia H. Jungmann, and Ron M. A. Heeren. "Cluster secondary ion mass spectrometry microscope mode mass spectrometry imaging." Rapid Communications in Mass Spectrometry 27, no. 24 (October 31, 2013): 2745–50. http://dx.doi.org/10.1002/rcm.6719.

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