Relevant bibliographies by topics / Scanning white light

Contents

  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers

Academic literature on the topic 'Scanning white light'

Author: Grafiati
Published: 4 June 2021
Last updated: 1 February 2022

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Journal articles on the topic "Scanning white light"

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Olszak, Artur. "Lateral scanning white-light interferometer." Applied Optics 39, no. 22 (August 1, 2000): 3906. http://dx.doi.org/10.1364/ao.39.003906.

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Pavliček, Pavel, and Erik Mikeska. "White-light interferometer without mechanical scanning." Optics and Lasers in Engineering 124 (January 2020): 105800. http://dx.doi.org/10.1016/j.optlaseng.2019.105800.

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Sysoev, E. V. "White-light interferometer with partial correlogram scanning." Optoelectronics, Instrumentation and Data Processing 43, no. 1 (February 2007): 83–89. http://dx.doi.org/10.3103/s8756699007010128.

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Munteanu, Florin. "Self-calibrating lateral scanning white-light interferometer." Applied Optics 49, no. 12 (April 15, 2010): 2371. http://dx.doi.org/10.1364/ao.49.002371.

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Hell, S., S. Witting, M. Schickfus, R. W. Wijnaendts Resandt, S. Hunklinger, E. Smolka, and M. Neiger. "A confocal beam scanning white-light microscope." Journal of Microscopy 163, no. 2 (August 1991): 179–87. http://dx.doi.org/10.1111/j.1365-2818.1991.tb03170.x.

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Tereschenko, Stanislav, Peter Lehmann, Lisa Zellmer, and Angelika Brueckner-Foit. "Passive vibration compensation in scanning white-light interferometry." Applied Optics 55, no. 23 (August 2, 2016): 6172. http://dx.doi.org/10.1364/ao.55.006172.

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Kassamakov, Ivan, Kalle Hanhijärvi, Imad Abbadi, Juha Aaltonen, Hanne Ludvigsen, and Edward Hæggström. "Scanning white-light interferometry with a supercontinuum source." Optics Letters 34, no. 10 (May 14, 2009): 1582. http://dx.doi.org/10.1364/ol.34.001582.

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Vallance, R. Ryan, Chris J. Morgan, Shelby M. Shreve, and Eric R. Marsh. "Micro-tool characterization using scanning white light interferometry." Journal of Micromechanics and Microengineering 14, no. 8 (June 18, 2004): 1234–43. http://dx.doi.org/10.1088/0960-1317/14/8/017.

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Behrends, Gert, Dirk Stöbener, and Andreas Fischer. "Lateral scanning white-light interferometry on rotating objects." Surface Topography: Metrology and Properties 8, no. 3 (July 21, 2020): 035006. http://dx.doi.org/10.1088/2051-672x/aba484.

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Wang, Zhen, and Yi Jiang. "Wavenumber scanning-based Fourier transform white-light interferometry." Applied Optics 51, no. 22 (July 30, 2012): 5512. http://dx.doi.org/10.1364/ao.51.005512.

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Dissertations / Theses on the topic "Scanning white light"

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Pedrazzani, Janet Renee. "High-Temperature Displacement Sensor Using a White-Light Scanning Fiber Michelson Interferometer." Thesis, Virginia Tech, 1996. http://hdl.handle.net/10919/30795.

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As specialized materials are developed for various applications, it becomes desirable to test them under adverse conditions, such as at elevated temperatures and in harsh environments. It is increasingly important that sensors be developed to meet the growing needs of research and industry. The ability of sapphire to withstand elevated temperatures and many chemically harsh environments has long been recognized. However, currently available sapphire fiber possesses poor optical quality and is not available with a cladding. It has found use in a variety of temperature sensors, but the investigation of sapphire-based strain and displacement sensors has been limited.

The primary development of a white-light Michelson interferometer that utilizes a sapphire fiber sensing head is presented in this thesis. Development includes efforts to combat the poor optical quality of the sapphire fiber, minimize polarization mode fading, and preferentially excite the fundamental mode of the sapphire fiber. This thesis demonstrates the feasibility of fabricating a Michelson white-light interferometer capable of measuring displacements in environments ranging from room temperature to 800 degrees Celsius. The sensor developed in this work is capable of measuring displacements exceeding 6.4 millimeters at room temperature, and exceeding 1 millimeter at 800 degrees Celsius.

This thesis also presents the application of this sensor to the alignment of a sapphire-fiber based Fabry-Perot sensor. This technique allows the Fabry-Perot sensor to be aligned so that usable fringes are always obtained. Alignment of the sapphire-fiber based Fabry-Perot sensors has been considered prohibitively difficult.
Master of Science

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Zhao, Zijun. "Investigation of white light confocal sensing methods for the scanning of early sound recordings." Thesis, University of Southampton, 2010. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.536328.

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Gianto, Gianto. "Multi-dimensional Teager-Kaiser signal processing for improved characterization using white light interferometry." Thesis, Strasbourg, 2018. http://www.theses.fr/2018STRAD026/document.

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L'utilisation de franges d'interférence en lumière blanche comme une sonde optique en microscopie interférométrique est d'une importance croissante dans la caractérisation des matériaux, la métrologie de surface et de l'imagerie médicale. L'Interférométrie en lumière blanche est une technique basée sur la détection de l'enveloppe de franges d'interférence. Il a été démontré antérieurement, la capacité des approches 2D à rivaliser avec certaines méthodes classiques utilisées dans le domaine de l'interférométrie, en termes de robustesse et de temps de calcul. En outre, alors que la plupart des méthodes tiennent compte seulement des données 1 D, il semblerait avantageux de prendre en compte le voisinage spatial utilisant des approches multidimensionnelles (2D/3D), y compris le paramètre de temps afin d'améliorer les mesures. Le but de ce projet de thèse est de développer de nouvelles approches n-D qui sont appropriées pour une meilleure caractérisation des surfaces plus complexes et des couches transparentes
The use of white light interference fringes as an optical probe in microscopy is of growing importance in materials characterization, surface metrology and medical imaging. Coherence Scanning Interferometry (CSI, also known as White Light Scanning Interferometry, WSLI) is well known for surface roughness and topology measurement [1]. Full-Field Optical Coherence Tomography (FF-OCT) is the version used for the tomographic analysis of complex transparent layers. Both techniques generally make use of some sort of fringe scanning along the optical axis and the acquisition of a stack of xyz images. Image processing is then used to identify the fringe envelopes along z at each pixel in order to measure the positions of either a single surface or of multiple scattering objects within a layer.In CSI, the measurement of surface shape generally requires peak or phase extraction of the mono dimensional fringe signal. Most of the methods are based on an AM-FM signal model, which represents the variation in light intensity measured along the optical axis of an interference microscope [2]. We have demonstrated earlier [3, 4] the ability of 2D approaches to compete with some classical methods used in the field of interferometry, in terms of robustness and computing time. In addition, whereas most methods only take into account the 1D data, it would seem advantageous to take into account the spatial neighborhood using multidimensional approaches (2D, 3D, 4D), including the time parameter in order to improve the measurements.The purpose of this PhD project is to develop new n-D approaches that are suitable for improved characterization of more complex surfaces and transparent layers. In addition, we will enrich the field of study by means of heterogeneous image processing from multiple sensor sources (heterogeneous data fusion). Applications considered will be in the fields of materials metrology, biomaterials and medical imaging
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Olszak, Artur G., and Chase Salsbury. "Spectrally controlled interferometry for measurements of flat and spherical optics." SPIE-INT SOC OPTICAL ENGINEERING, 2017. http://hdl.handle.net/10150/627191.

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Conventional interferometry is widely used to measure spherical and flat surfaces with nanometer level precision but is plagued by back reflections. We describe a new method of isolating the measurement surface by controlling spectral properties of the source (Spectrally Controlled Interferometry - SCI). Using spectral modulation of the interferometer's source enables formation of localized fringes where the optical path difference is non-zero. As a consequence it becomes possible to form white-light like fringes in common path interferometers, such as the Fizeau. The proposed setup does not require mechanical phase shifting, resulting in simpler instruments and the ability to upgrade existing interferometers. Furthermore, it allows absolute measurement of distance, including radius of curvature of lenses in a single setup with possibility of improving the throughput and removing some modes of failure.
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Klempner, Adam R. "Development of a modular interferometric microscopy system for characterization of MEMS." Link to electronic thesis, 2007. http://www.wpi.edu/Pubs/ETD/Available/etd-010407-173332/.

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Thesis (M.S.)--Worcester Polytechnic Institute.
Keywords: vacuum; shape and deformation measurement; MEMS; vibrometry; scanning white light; Interferometry; thermal; vibration. Includes bibliographical references (136-139 leaves ).
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Oliveira, Rafael Figueiredo de. "Evaluation of Proposed Natural Corrosion Inhibitors for X-52 Carbon Steel in Ethanol Media." University of Akron / OhioLINK, 2015. http://rave.ohiolink.edu/etdc/view?acc_num=akron1448385629.

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Chen, Yu-Kuan, and 陳育寬. "Low Cost Vertical-scanning System for White Light Interferometer." Thesis, 2008. http://ndltd.ncl.edu.tw/handle/53185226826356429796.

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碩士
中原大學
機械工程研究所
96
PZT is generally used in the scanning system of white light interferometer, but it takes time to reach the exact position as it uses precise movement feedback control. During vertical scanning the CCD camera needs to wait for PZT to be steady and capture the image. This phenomenon limits the Frame per second (FPS) of CCD and makes the time of metrology too long. The aim of this research is to develop a high speed and low cost vertical scanning system for white light interferometer. To reduce the cost of the system, stepping motor controlled by microcontroller used in the developed design for vertical movement. Another microcontroller is used to pick up the signal from the driver circuit of stepping motor and trigger the CCD camera to capture the image. This increase the FPS of CCD camera as the motor can run continually. The resolution and total scan distance of system are determined to be 20nm and 20mm respectively. The developed design can reduce the cost by 33% and increases the CCD camera sampling rate to 1000 FPS.
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Yeh, Yi-Lin, and 葉易霖. "Research on the Vertical Scanning of White-Light Interferometry." Thesis, 2004. http://ndltd.ncl.edu.tw/handle/27921651596661531187.

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碩士
國立臺灣大學
機械工程學研究所
92
This study aims to establish the 3D profile measurement techniques of white-light interferometry with large vertical and horizontal measuring ranges. The purpose includes a complete investigation of the SIS-1000 (SNU Precision Company) surface profilometer for its operation principles and component specifications. The core of the research is to develop an effective methodology for large-range and long-depth 3D profile measurement with nano-scale resolution and accuracy. The measuring method includes vertical scanning and image merging method (Geomagic Studio) by using SIOS laser interferometer for the purpose of precision positioning. The proposed “enhanced vertical scanning method” combines traditional vertical scanning with image merging method. Along with the outcome of experiments, this achieves the perfect ability for 3D reconstruction techniques.
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Chang, Ting-Chuan, and 張庭銓. "Research on White Light 3D Scanning Techniques with Engineering Applications." Thesis, 2010. http://ndltd.ncl.edu.tw/handle/52035435801292325998.

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碩士
國立臺灣大學
機械工程學研究所
99
With the progress of computer vision and computing technology, non-contact 3D scanning measurement system has greatly been improved. In industrial practice, it gradually replaces contact-typed 3D measuring system. Many automobile and cell phone plants have already applied to three-dimensional shape measurement, which serves the purpose of quality control. This thesis attempts to develop a set of white light 3D non-contact measurement system, which has the high measuring efficiency and practical accuracy. This system projected cosine-curve structured light onto the object surface by a projector, the image of which is then taken by the digital single-lens reflex camera. Phase-Shifting Principle and Triangulation method are applied to find the wrapped phase in every single pixel, and the phase unwrapping technique is then used to compute the continuous phase distribution. Finally the 3D profiles of the object can be obtained from the phase-to-height relationship together with coordinate transformation. Certain studies were devised with a series of experiments to optimally apply ATOS, a commercially popular system, in terms of its accuracy, reliability, and efficient operation. However, it was found in practice when applying the white light measuring that some cases were seen to face big barriers. In dealing with this problem two auxiliary fixtures were developed in this thesis. The first one is a multi-functional clamping apparatus, targeted to handle the measurement thin-walled objects. The other one is a titanium gas-spray system, which can overcome the problem of measuring the object with too high or too low reflectivity. Cases study was also performed to validate the usefulness of the white light measurement system.
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Lin, Yi-Hsuan, and 林宜萱. "Innovative 3-D Surface Profilometer Using White Light Lateral Scanning Interferometry." Thesis, 2009. http://ndltd.ncl.edu.tw/handle/6675nt.

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碩士
國立臺北科技大學
機電整合研究所
97
An in-situ 3-D surface profilometer for reconstructing micro surface profiles with a long depth measuring range and a nano-scale resolution was developed using innovative white light lateral scanning interferometry (LSI). Current measuring field of view (FOV) of conventional white light interferometers is currently limited by microscopic views of the existing interferometric objectives, such as Michelson, Mirau or Linnik design. Moreover, vertical scanning operation required for acquiring volumetric interferometric data is extremerely time consuming and makes white light vertical scanning interferometry (VSI) infeasible for in-situ automatic optical inspection (AOI) on micro 3-D structures. The traditional LSI methods were mainly developed by tilting the whole optical axis with respect to the scanning direction of a sample’s surface underlying inspection, in which it has one inherent difficulty in effective collision avoidance between the optical objective and the object’s surface. To resolve this, a new white light LSI method was developed here by controlling the tilting angle of the reference mirror in the interferometric objective. With the proposed optical configuration, the surface is inspected at a tilting angle with respect to the maximum coherence plane of the interferometric system along its lateral scanning direction when the objective lies perpendicularly with the tested surface. In addition, a calibration method was developed to establish an accurate mathematical mapping model between the object depth and the lateral axis. To evaluate the feasibility of the methodology, a calibrated step height was measured for evaluating the accuracy and repeatability. Some industrial samples, such as photon spacers and other microstructures fabricated by -nano imprinting processes, were measured to verify the actual performance on real components. It was found that the measurement repeatability was controlled less than 60 nm within one standard deviation for a maximum measurable depth of 27.21 μm.
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Books on the topic "Scanning white light"

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Araújo, Ana Cláudia Vaz de. Síntese de nanopartículas de óxido de ferro e nanocompósitos com polianilina. Brazil Publishing, 2021. http://dx.doi.org/10.31012/978-65-5861-120-2.

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In this work magnetic Fe3O4 nanoparticles were synthesized through the precipitation method from an aqueous ferrous sulfate solution under ultrasound. A 23 factorial design in duplicate was carried out to determine the best synthesis conditions and to obtain the smallest crystallite sizes. Selected conditions were ultrasound frequency of 593 kHz for 40 min in 1.0 mol L-1 NaOH medium. Average crystallite sizes were of the order of 25 nm. The phase obtained was identified by X-ray diffractometry (XRD) as magnetite. Scanning electron microscopy (SEM) showed polydisperse particles with dimensions around 57 nm, while transmission electron microscopy (TEM) revealed average particle diameters around 29 nm, in the same order of magnitude of the crystallite size determined with Scherrer’s equation. These magnetic nanoparticles were used to obtain nanocomposites with polyaniline (PAni). The material was prepared under exposure to ultraviolet light (UV) or under heating, from dispersions of the nanoparticles in an acidic solution of aniline. Unlike other synthetic routes reported elsewhere, this new route does not utilize any additional oxidizing agent. XRD analysis showed the appearance of a second crystalline phase in all the PAni-Fe3O4 composites, which was indexed as goethite. Furthermore, the crystallite size decreases nearly 50 % with the increase in the synthesis time. This size decrease suggests that the nanoparticles are consumed during the synthesis. Thermogravimetric analysis showed that the amount of polyaniline increases with synthesis time. The nanocomposite electric conductivity was around 10-5 S cm-1, nearly one order of magnitude higher than for pure magnetite. Conductivity varied with the amount of PAni in the system, suggesting that the electric properties of the nanocomposites can be tuned according to their composition. Under an external magnetic field the nanocomposites showed hysteresis behavior at room temperature, characteristic of ferromagnetic materials. Saturation magnetization (MS) for pure magnetite was ~ 74 emu g-1. For the PAni-Fe3O4 nanocomposites, MS ranged from ~ 2 to 70 emu g-1, depending on the synthesis conditions. This suggests that composition can also be used to control the magnetic properties of the material.
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Book chapters on the topic "Scanning white light"

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Ramakrishnan, Vivek, and Ramesh Krishnamurthi. "Novel Scanning Scheme for White Light Photoelasticity." In Advancement of Optical Methods in Experimental Mechanics, Volume 3, 301–6. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-41600-7_38.

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Heikkinen, Ville Vili, Anton Nolvi, Tor Paulin, Jeremias Seppä, Ivan Kassamakov, Antti Lassila, and Edward Hæggström. "Traceable Quasi-dynamic Stroboscopic Scanning White Light Interferometry." In Fringe 2013, 491–96. Berlin, Heidelberg: Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-36359-7_86.

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Dai, Rong, Tie Bang Xie, and Su Ping Chang. "A Scanning White-Light Interferometric Profilometer for Smooth and Rough Surface." In Optics Design and Precision Manufacturing Technologies, 364–70. Stafa: Trans Tech Publications Ltd., 2007. http://dx.doi.org/10.4028/0-87849-458-8.364.

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Jeon, Yong-Tae, Hyun Lee, and Jae Sung Choi. "Development of 3D Surface Shape Analysis System Using White Light Scanning Interference." In Advances in Computer Science and Ubiquitous Computing, 108–13. Singapore: Springer Singapore, 2017. http://dx.doi.org/10.1007/978-981-10-7605-3_18.

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Bahr, Sönke, Marc-André Otto, Tomas Domaschke, and Thorsten Schüppstuhl. "Continuous Digitalization of Rotationally Symmetrical Components With a Lateral Scanning White Light Interferometer." In Tagungsband des 2. Kongresses Montage Handhabung Industrieroboter, 135–43. Berlin, Heidelberg: Springer Berlin Heidelberg, 2017. http://dx.doi.org/10.1007/978-3-662-54441-9_14.

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Keat, Wee, Xiang Li, and Yeng Chai. "Phosphor-Based White Light Emitting Diode (LED) for Vertical Scanning Interferometry (VSI)." In Interferometry - Research and Applications in Science and Technology. InTech, 2012. http://dx.doi.org/10.5772/34946.

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Oras, Ester, Ivar Leimus, and Lauri Joosu. "A Viking Age Gold Hoard from Essu, Estonia." In Silver, Butter, Cloth, 145–68. Oxford University Press, 2018. http://dx.doi.org/10.1093/oso/9780198827986.003.0009.

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This chapter presents in full the small gold hoard from Essu, north-east Estonia, on the Vikings’ Austrvegr (eastern route). The hoard was found in a peat bog in the nineteenth century, and comprised six gold pendants dating to around the last quarter of the ninth century. This chapter provides a detailed analysis of the six pendants—one Arabic dinar-pendant and five pendants decorated with filigree and granulation—discussing their decoration and cultural parallels. Results from recent Scanning Electron Microscopy-Energy Dispersive X-Ray Spectroscopy (SEM-EDS) analysis cast new light on the pendants’ production, alloy content, and use-wear. It is suggested that the filigree pendants were manufactured within Scandinavia and originally formed part of an elaborate female necklace, while the dinar-pendant reached Estonia via the Nordic countries. Overall, the hoard illustrates the prominence of gold within the Viking Age display economy. The chapter concludes by discussing the significance of the hoard from a gender perspective, relating it to a wider group of Viking Age ritual deposits of gold female jewellery sets (so-called ‘themed deposits’).
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Han, Chang Dae. "Rheology of Miscible Polymer Blends." In Rheology and Processing of Polymeric Materials: Volume 1: Polymer Rheology. Oxford University Press, 2007. http://dx.doi.org/10.1093/oso/9780195187823.003.0013.

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Broadly classified, there are three types of polymer blends, namely, (1) miscible polymer blends, (2) immiscible polymer blends, and (3) partially miscible polymer blends. There are many different experimental methods that can be used to investigate the miscibility of polymer blends, such as differential scanning calorimetry (DSC), dynamic mechanical thermal analysis (DMTA), dielectric measurement, cloud point measurement, microscopy, light scattering, small-angle X-ray scattering, small-angle neutron scattering, fluorescence technique, and nuclear magnetic resonance (NMR) spectroscopy. Each of these experimental methods can only probe the homogeneity (or heterogeneity) in a polymer blend at a certain scale range. Thus, the determination of the miscibility in polymer blends depends on the resolution limit of the experimental method(s) employed. For instance, DSC and DMTA have frequently been used to determine the miscibility in polymer blends by determining glass transition temperature Tg. When a single Tg value is observed in a polymer blend, the blend can be considered miscible. However, there is a general consensus among researchers that such an experimental criterion, while very useful, cannot guarantee that a polymer blend is miscible on a segmental level. Therefore, a serious question may be raised as to whether a polymer pair can be regarded as being miscible on the segmental level (say, less than approximately 5 nm). It has been reported that DMTA can resolve the size of domains (or separated phases) on the order of 5–10 nm (Molnar and Eisenberg 1992) and DSC is not as sensitive as DMTA for determining the Tg of a polymer blend (Stoelting et al. 1970). In the use of DSC to investigate the miscibility of polymer blends, one often encounters the situation where a very broad (say, 40–60 ◦C) single glass transition appears for certain blend compositions, such as polystyrene/poly(α-methyl styrene) (PS/PαMS) blends (Kim et al. 1998; Lin and Roe 1988; Saeki 1983) and polystyrene/poly(vinyl methyl ether) (PS/PVME) blends (Kim et al. 1998; Schneider and Wirbser 1990; Schneider et al. 1990). Under such circumstances, it is not clear how an unambiguous, single value of Tg can be read off from a DSC thermogram.
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Conference papers on the topic "Scanning white light"

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Chen, Jin-Liang, Chi-Hong Tung, Ching-Fen Kao, and Calvin C. Chang. "Auto-scanning white-light interferometer." In Optical Engineering + Applications, edited by Angela Duparré, Bhanwar Singh, and Zu-Han Gu. SPIE, 2007. http://dx.doi.org/10.1117/12.733625.

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Tao, Chunkan, Weiyi Wang, Yijun Zhang, Yujing Wu, and Yunsheng Qian. "Application of white-light phase-shifting in white-light scanning interferometry." In Applications of Digital Image Processing XL, edited by Andrew G. Tescher. SPIE, 2017. http://dx.doi.org/10.1117/12.2272858.

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Olszak, Artur G. "Improved fast white-light scanning profilometer." In International Symposium on Optical Science and Technology, edited by Malgorzata Kujawinska, Ryszard J. Pryputniewicz, and Mitsuo Takeda. SPIE, 2000. http://dx.doi.org/10.1117/12.498419.

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Munteanu, Florin. "Self-calibrating lateral scanning white-light interferometer." In SPIE Optical Engineering + Applications, edited by Catherine E. Towers, Joanna Schmit, and Katherine Creath. SPIE, 2010. http://dx.doi.org/10.1117/12.860866.

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Kim, Tae Hyeon, Byoung Chang Kim, Sun Hyuck Kim, Tae Jin Park, Dong Hyun Go, Moon Seong Choi, Chang Kyu Kim, and Hyung Suk Lee. "Stitching Method using White Light Scanning Interferometry." In The 3rd World Congress on Recent Advances in Nanotechnology. Avestia Publishing, 2018. http://dx.doi.org/10.11159/icnnfc18.129.

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Ryczkowski, Piotr, Goëry Genty, Anton Nolvi, Ivan Kassamakov, and Edward Hæggström. "Frequency-doubled Supercontinuum for Scanning White-light Interferometry." In CLEO: Science and Innovations. Washington, D.C.: OSA, 2012. http://dx.doi.org/10.1364/cleo_si.2012.cf1b.6.

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Mansfield, Daniel. "Thin film extraction from scanning white light interferometry." In Optifab 2007. SPIE, 2007. http://dx.doi.org/10.1117/12.736523.

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Guo, Tong, Chun-guang Hu, Jin-ping Chen, Xing Fu, and Xiao-tang Hu. "Scanning white-light interferometry for microstructures geometrical characterization." In Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic technology, and Artificial Intelligence, edited by Jiancheng Fang and Zhongyu Wang. SPIE, 2006. http://dx.doi.org/10.1117/12.717253.

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Kim, ByoungChang, TaeHyun Kim, SunHyuck Kim, ChangKyu Kim, and HyungSuk Lee. "White Light Scanning Interferometry for Nano Surface Metrology." In The 2nd World Congress on Recent Advances in Nanotechnology. Avestia Publishing, 2017. http://dx.doi.org/10.11159/icnei17.102.

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Kim, ByoungChang, SeHeon Kim, YongKwan Kwon, YunWoo Lee, HoSoon Yang, and HyugGyo Rhee. "A curvature sensor using white-light scanning interferometry." In SPIE Optics + Photonics. SPIE, 2006. http://dx.doi.org/10.1117/12.675925.

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