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Journal articles on the topic 'Scanning tunneling microscopy'

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Published: 4 June 2021

Last updated: 26 July 2024

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1

Rozouvan, T. "Spatial resolution of scanning tunneling microscopy." Functional materials 22, no. 3 (October 1, 2015): 365–69. http://dx.doi.org/10.15407/fm22.03.365.

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2

Sakurai, Toshio, Akiko Kobayashi, and Akira Sakai. "Scanning tunneling microscopy." Bulletin of the Japan Institute of Metals 25, no. 10 (1986): 821–31. http://dx.doi.org/10.2320/materia1962.25.821.

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3

SAKURAI, Toshio, Akiko KOBAYASHI, and Akira SAKAI. "Scanning tunneling microscopy." Nihon Kessho Gakkaishi 28, no. 6 (1986): 404–7. http://dx.doi.org/10.5940/jcrsj.28.404.

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4

Hansma, Paul K., and Jerry Tersoff. "Scanning tunneling microscopy." Journal of Applied Physics 61, no. 2 (January 15, 1987): R1—R24. http://dx.doi.org/10.1063/1.338189.

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5

Griffith, J. E., and G. P. Kochanski. "Scanning Tunneling Microscopy." Annual Review of Materials Science 20, no. 1 (August 1990): 219–44. http://dx.doi.org/10.1146/annurev.ms.20.080190.001251.

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6

HOSOKI, Shigeyuki. "Scanning tunneling microscopy." Hyomen Kagaku 10, no. 10 (1989): 686–92. http://dx.doi.org/10.1380/jsssj.10.686.

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7

TAGAWA, TAKASHI. "Scanning Tunneling Microscopy." Sen'i Gakkaishi 44, no. 6 (1988): P207—P210. http://dx.doi.org/10.2115/fiber.44.6_p207.

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8

Binnig, G., and H. Rohrer. "Scanning tunneling microscopy." IBM Journal of Research and Development 44, no. 1.2 (January 2000): 279–93. http://dx.doi.org/10.1147/rd.441.0279.

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9

Rohrer, H. "Scanning tunneling microscopy." Proceedings of the National Academy of Sciences 84, no. 14 (July 1, 1987): 4666. http://dx.doi.org/10.1073/pnas.84.14.4666.

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10

LIEBER, CHARLES M. "SCANNING TUNNELING MICROSCOPY." Chemical & Engineering News 72, no. 16 (April 18, 1994): 28–44. http://dx.doi.org/10.1021/cen-v072n016.p028.

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11

Binnig, G., and H. Rohrer. "Scanning tunneling microscopy." Surface Science Letters 152-153 (April 1985): A106. http://dx.doi.org/10.1016/0167-2584(85)90065-9.

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12

Binnig, G., and H. Rohrer. "Scanning tunneling microscopy." Surface Science 152-153 (April 1985): 17–26. http://dx.doi.org/10.1016/0039-6028(85)90120-7.

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13

GIMZEWSKI, J. K. "Scanning tunneling microscopy." Le Journal de Physique IV 03, no. C7 (November 1993): C7–41—C7–48. http://dx.doi.org/10.1051/jp4:1993704.

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14

KAJIMURA, Koji, Hiroshi BANDO, Hiroshi TOKUMOTO, Wataru MIZUTANI, Makoto OKANO, Masatoshi ONO, Shigeo OKAYAMA, Hiroshi MURAKAMI, and Yuichi ONO. "Scanning tunneling microscopy." Hyomen Kagaku 8, no. 1 (1987): 2–13. http://dx.doi.org/10.1380/jsssj.8.2.

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15

Salemink, H. "Scanning tunneling microscopy." Microelectronic Engineering 5, no. 1-4 (December 1986): 501–8. http://dx.doi.org/10.1016/0167-9317(86)90083-3.

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16

Marti, O., B. Drake, S. Gould, and P. K. Hansma. "Atomic force microscopy and scanning tunneling microscopy with a combination atomic force microscope/scanning tunneling microscope." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 6, no. 3 (May 1988): 2089–92. http://dx.doi.org/10.1116/1.575191.

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17

ALVARADO, S. F. "SCANNING TUNNELING MICROSCOPY AND SCANNING FORCE MICROSCOPY." Surface Review and Letters 02, no. 05 (October 1995): 607–17. http://dx.doi.org/10.1142/s0218625x95000571.

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18

Chen, C. Julian. "Microscopic view of scanning tunneling microscopy." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 9, no. 1 (January 1991): 44–50. http://dx.doi.org/10.1116/1.577128.

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19

Yarotski, Dzmitry, and Antoinette J. Taylor. "Microscopy: Ultrafast Scanning Tunneling Microscopy." Optics and Photonics News 13, no. 12 (December 1, 2002): 26. http://dx.doi.org/10.1364/opn.13.12.000026.

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20

Kubby, J. A. "“Stm” Scanning Tunneling Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 196–97. http://dx.doi.org/10.1017/s0424820100125889.

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Scanning Tunneling Microscopy is a recently developed technique within the area of Scanned Image Microscopy that is based on tunneling between two conducting electrodes. This method offers, for the first time, the possibility of direct, real space determination of surface atomic and electronic structure in three dimensions on an atomic length scale, including nonperiodic structures.In this technique a sharp metal tip, mounted on a piezoelectric tripod that forms an orthogonal coordinate system, is brought to within a few Angstroms of the sample surface without “touching” the region to be scanned. A tunneling current I, on the order of 0.1 to 1 nA, is established by applying a bias between the tip and sample. The tunneling current is given to first order by;

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21

Asenjo, A. "Scanning tunneling microscopy/scanning electron microscopy combined instrument." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 12, no. 3 (May 1994): 1658. http://dx.doi.org/10.1116/1.587256.

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22

Gentz, Knud, and Klaus Wandelt. "Electrochemical Scanning Tunneling Microscopy." CHIMIA International Journal for Chemistry 66, no. 1 (February 29, 2012): 44–51. http://dx.doi.org/10.2533/chimia.2012.44.

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23

Aiello, Clarice D. "Coherent scanning tunneling microscopy." Science 367, no. 6476 (January 23, 2020): 368. http://dx.doi.org/10.1126/science.aba0714.

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24

WANG, Erkang. "Electrochemical Scanning Tunneling Microscopy." Analytical Sciences 10, no. 1 (1994): 155–56. http://dx.doi.org/10.2116/analsci.10.155.

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25

Grafström, Stefan. "Photoassisted scanning tunneling microscopy." Journal of Applied Physics 91, no. 4 (February 15, 2002): 1717–53. http://dx.doi.org/10.1063/1.1432113.

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26

Guntherodt, H. ‐J, R. Wiesendanger, and Joseph Demuth. "Scanning Tunneling Microscopy I." Physics Today 46, no. 12 (December 1993): 43–44. http://dx.doi.org/10.1063/1.2809126.

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27

Reddick, R. C., R. J. Warmack, D. W. Chilcott, S. L. Sharp, and T. L. Ferrell. "Photon scanning tunneling microscopy." Review of Scientific Instruments 61, no. 12 (December 1990): 3669–77. http://dx.doi.org/10.1063/1.1141534.

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28

Friesen, Cody, Hermann Osterhage, Johannes Friedlein, Anika Schlenhoff, Roland Wiesendanger, and Stefan Krause. "Scanning Seebeck tunneling microscopy." Journal of Physics D: Applied Physics 51, no. 32 (July 13, 2018): 324001. http://dx.doi.org/10.1088/1361-6463/aacfab.

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29

Courjon, D., K. Sarayeddine, and M. Spajer. "Scanning tunneling optical microscopy." Optics Communications 71, no. 1-2 (May 1989): 23–28. http://dx.doi.org/10.1016/0030-4018(89)90297-6.

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30

NISHIKAWA, OSAMU. "Scanning Tunneling Microscopy(STM). Wishing Dream on Tunneling Microscopy." Nihon Kessho Gakkaishi 35, no. 2 (1993): 71–74. http://dx.doi.org/10.5940/jcrsj.35.71.

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31

SHIGEKAWA, HIDEMI. "Scanning Tunneling Microscopy(STM). Application for Chemistry. Scanning Tunneling Microscopy on Organic Materials." Nihon Kessho Gakkaishi 35, no. 2 (1993): 126–34. http://dx.doi.org/10.5940/jcrsj.35.126.

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32

Li Bassi, A., C. S. Casari, D. Cattaneo, F. Donati, S. Foglio, M. Passoni, C. E. Bottani, et al. "Bulk Cr tips for scanning tunneling microscopy and spin-polarized scanning tunneling microscopy." Applied Physics Letters 91, no. 17 (October 22, 2007): 173120. http://dx.doi.org/10.1063/1.2800810.

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33

Möller, R., A. Esslinger, and M. Rauscher. "Tunneling tips imaged by scanning tunneling microscopy." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 8, no. 1 (January 1990): 434–37. http://dx.doi.org/10.1116/1.576414.

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34

Pan, J., T. W. Jing, and S. M. Lindsay. "Tunneling Barriers in Electrochemical Scanning Tunneling Microscopy." Journal of Physical Chemistry 98, no. 16 (April 1994): 4205–8. http://dx.doi.org/10.1021/j100067a001.

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35

Stemmer, A., A. Engel, R. Häring, R. Reichelt, and U. Aebi. "Scanning tunneling microscopy of biomacromolecules." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 444–45. http://dx.doi.org/10.1017/s0424820100104285.

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Abstract:

Since its invention in the early 1980s the scanning tunneling microscope (STM) has rapidly evolved into a well established tool in solid state physics for surface structure analysis at atomic resolution. Recently a growing interest in the STM for investigating biological matter has been expressed, since surface ‘topographs’ of biomacromolecules can be recorded at ambient pressure or possibly in buffer solutions, thereby eliminating structural alterations induced by specimen dehydration such as required for electron microscopy (EM).As simple as a STM may look, it provides a wealth of information ranging from mere surface topography and local variations in the tunnel-barrier height to local spectroscopy of electronic states and elasticity. On the other hand the physics involved in imaging biological specimens such as protein or DNA, membranes, or fatty acid monolayers, which are generally known to be poor conductors, is not quite understood yet. To cope with insulators the atomic force microscope (AFM), a relative of the STM, provides a means to obtain topographs and elasticity data.

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36

Schmidt-Ott, A., B. Marsen, and K. Sattler. "Characterizing nanoparticles by scanning tunneling microscopy and scanning tunneling spectroscopy." Journal of Aerosol Science 28 (September 1997): S729—S730. http://dx.doi.org/10.1016/s0021-8502(97)85363-3.

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37

Fu, J., R. D. Young, and T. V. Vorburger. "Long‐range scanning for scanning tunneling microscopy." Review of Scientific Instruments 63, no. 4 (April 1992): 2200–2205. http://dx.doi.org/10.1063/1.1143139.

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38

Khaikin, M. S. "Scanning tunneling microscopy and spectroscopy." Uspekhi Fizicheskih Nauk 155, no. 5 (1988): 158–59. http://dx.doi.org/10.3367/ufnr.0155.198805i.0158.

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39

Edel'man, Valeryan S. "Low-temperature scanning tunneling microscopy." Physics-Uspekhi 43, no. 9 (September 30, 2000): 925–26. http://dx.doi.org/10.1070/pu2000v043n09abeh000807.

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40

Hameroff, S., J. Simic-Kratic, M. Trifunovic, and D. Koruga. "SCANNING TUNNELING MICROSCOPY OF LUCIFERASE." Anesthesiology 77, Supplement (September 1992): A350. http://dx.doi.org/10.1097/00000542-199209001-00350.

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41

Edel'man, Valeryan S. "Low-temperature scanning tunneling microscopy." Uspekhi Fizicheskih Nauk 170, no. 9 (2000): 995. http://dx.doi.org/10.3367/ufnr.0170.200009e.0995.

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42

Khaĭkin, M. S. "Scanning tunneling microscopy and spectroscopy." Soviet Physics Uspekhi 31, no. 5 (May 31, 1988): 473–74. http://dx.doi.org/10.1070/pu1988v031n05abeh003552.

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43

Mainsbridge, B. "Scanning tunneling microscopy of chloroplasts." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 9, no. 2 (March 1991): 1259. http://dx.doi.org/10.1116/1.585216.

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44

Miles, M. J., T. McMaster, H. J. Carr, A. S. Tatham, P. R. Shewry, J. M. Field, P. S. Belton, et al. "Scanning tunneling microscopy of biomolecules." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 8, no. 1 (January 1990): 698–702. http://dx.doi.org/10.1116/1.576986.

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45

Chen, C. Julian, and Walter F. Smith. "Introduction to Scanning Tunneling Microscopy." American Journal of Physics 62, no. 6 (June 1994): 573–74. http://dx.doi.org/10.1119/1.17525.

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46

Paesler, M. A., P. J. Moyer, C. J. Jahncke, C. E. Johnson, R. C. Reddick, R. J. Warmack, and T. L. Ferrell. "Analytical photon scanning tunneling microscopy." Physical Review B 42, no. 10 (October 1, 1990): 6750–53. http://dx.doi.org/10.1103/physrevb.42.6750.

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47

Hoffmann, D., A. Haas, T. Kunstmann, J. Seifritz, and R. Möller. "Thermovoltage in scanning tunneling microscopy." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 15, no. 3 (May 1997): 1418–22. http://dx.doi.org/10.1116/1.580553.

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48

Hoffmann, D., J. Seifritz, B. Weyers, and R. Möller. "Thermovoltage in scanning tunneling microscopy." Journal of Electron Spectroscopy and Related Phenomena 109, no. 1-2 (August 2000): 117–25. http://dx.doi.org/10.1016/s0368-2048(00)00111-0.

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49

Yu, Edward T. "Cross-Sectional Scanning Tunneling Microscopy." Chemical Reviews 97, no. 4 (June 1997): 1017–44. http://dx.doi.org/10.1021/cr960084n.

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50

Reihl, B., J. K. Gimzewski, R. Schlittler, M. Tschudy, R. Berndt, R. Gaisch, and W. D. Schneider. "Low-temperature scanning tunneling microscopy." Physica B: Condensed Matter 197, no. 1-4 (March 1994): 64–71. http://dx.doi.org/10.1016/0921-4526(94)90199-6.

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