Journal articles: 'Scanning Tunneling Microscopy [Tool]'

1

Chiang, Shirley, and Robert J. Wilson. "Scanning Tunneling Microscopy: A Surface Structural Tool." Analytical Chemistry 59, no. 21 (November 1987): 1267A—1270A. http://dx.doi.org/10.1021/ac00148a748.

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Stemmer, A., A. Engel, R. Häring, R. Reichelt, and U. Aebi. "Scanning tunneling microscopy of biomacromolecules." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 444–45. http://dx.doi.org/10.1017/s0424820100104285.

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Since its invention in the early 1980s the scanning tunneling microscope (STM) has rapidly evolved into a well established tool in solid state physics for surface structure analysis at atomic resolution. Recently a growing interest in the STM for investigating biological matter has been expressed, since surface ‘topographs’ of biomacromolecules can be recorded at ambient pressure or possibly in buffer solutions, thereby eliminating structural alterations induced by specimen dehydration such as required for electron microscopy (EM).As simple as a STM may look, it provides a wealth of information ranging from mere surface topography and local variations in the tunnel-barrier height to local spectroscopy of electronic states and elasticity. On the other hand the physics involved in imaging biological specimens such as protein or DNA, membranes, or fatty acid monolayers, which are generally known to be poor conductors, is not quite understood yet. To cope with insulators the atomic force microscope (AFM), a relative of the STM, provides a means to obtain topographs and elasticity data.

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Denley, D. R. "Practical applications of scanning tunneling microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 18–19. http://dx.doi.org/10.1017/s0424820100152069.

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Scanning tunneling microscopy (STM) has recently been introduced as a promising tool for analyzing surface atomic structure. We have used STM for its extremely high resolution (especially the direction normal to surfaces) and its ability for imaging in ambient atmosphere. We have examined surfaces of metals, semiconductors, and molecules deposited on these materials to achieve atomic resolution in favorable cases.When the high resolution capability is coupled with digital data acquisition, it is simple to get quantitative information on surface texture. This is illustrated for the measurement of surface roughness of evaporated gold films as a function of deposition temperature and annealing time in Figure 1. These results show a clear trend for which the roughness, as well as the experimental deviance of the roughness is found to be minimal for evaporation at 300°C. It is also possible to contrast different measures of roughness.

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van de Walle, G. F. A., B. J. Nelissen, L. L. Soethout, and H. van Kempen. "Scanning tunneling microscopy: A powerful tool for surface analysis." Fresenius' Zeitschrift für analytische Chemie 329, no. 2-3 (January 1987): 108–12. http://dx.doi.org/10.1007/bf00469119.

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Rohrer, H. "Scanning tunneling microscopy: a surface science tool and beyond." Surface Science 299-300 (January 1994): 956–64. http://dx.doi.org/10.1016/0039-6028(94)90709-9.

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Bracker, CE, and P. K. Hansma. "Scanning tunneling microscopy and atomic force microscopy: New tools for biology." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 778–79. http://dx.doi.org/10.1017/s0424820100155864.

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A new family of scanning probe microscopes has emerged that is opening new horizons for investigating the fine structure of matter. The earliest and best known of these instruments is the scanning tunneling microscope (STM). First published in 1982, the STM earned the 1986 Nobel Prize in Physics for two of its inventors, G. Binnig and H. Rohrer. They shared the prize with E. Ruska for his work that had led to the development of the transmission electron microscope half a century earlier. It seems appropriate that the award embodied this particular blend of the old and the new because it demonstrated to the world a long overdue respect for the enormous contributions electron microscopy has made to the understanding of matter, and at the same time it signalled the dawn of a new age in microscopy. What we are seeing is a revolution in microscopy and a redefinition of the concept of a microscope.Several kinds of scanning probe microscopes now exist, and the number is increasing. What they share in common is a small probe that is scanned over the surface of a specimen and measures a physical property on a very small scale, at or near the surface. Scanning probes can measure temperature, magnetic fields, tunneling currents, voltage, force, and ion currents, among others.

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Edel’man, V. S. "The scanning tunneling microscopy combined with the scanning electron microscopy—A tool for the nanometry." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 9, no. 2 (March 1991): 618. http://dx.doi.org/10.1116/1.585471.

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Betzig, E., M. Isaacson, H. Barshatzky, K. Lin, and A. Lewis. "Progress in near-field scanning optical microscopy (NSOM)." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 436–37. http://dx.doi.org/10.1017/s0424820100104248.

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The concept of near field scanning optical microscopy was first described more than thirty years ago1 almost two decades before the validity of the technique was verified experimentally for electromagnetic radiation of 3cm wavelength.2 The extension of the method to the visible region of the spectrum took another decade since it required the development of micropositioning and aperture fabrication on a scale five orders of magnitude smaller than that used for the microwave experiments. Since initial reports on near field optical imaging8-6, there has been a growing effort by ourselves6 and other groups7 to extend the technology and develop the near field scanning optical microscope (NSOM) into a useful tool to complement conventional (i.e., far field) scanning optical microscopy (SOM), scanning electron microscopy (SEM) and scanning tunneling microscopy. In the context of this symposium on “Microscopy Without Lenses”, NSOM can be thought of as an addition to the exploding field of scanned tip microscopy although we did not originally conceive it as such.

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Elings, Virgil. "Scanning probe microscopy: A new technology takes off." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 3 (August 12, 1990): 959. http://dx.doi.org/10.1017/s0424820100162363.

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With the expanding use of the scanning tunneling microscope, the technology is developing into other scanning near field microscopes, microscopes whose resolution is determined by the size of the probe, not by some wavelength. The first available “son of STM” will be the atomic force microscope (AFM), a very low force profilometer which has atomic resolution and can profile non-conducting surfaces. The hope is that this microscope may find more applications in biology than the scanning tunneling microscope (STM), which requires a conducting or very thin sample.In the past five years, the STM has progressed from curiosity to everyday lab tool, imaging surfaces with scans from a few nanometers up to 100 microns. When compared to an SEM, the STM has the advantages of higher resolution, lower cost, operation in air or liquid, real three-dimensional output, and small size. The disadvantages are smaller scan size, slower scan speeds, fewer spectroscopic functions and, of course, not as many of the nice features of the more mature electron microscopes. The AFM has similar features to the STM except that the detector and profiling tips are more complicated and more difficult to operate—disadvantages that will decrease with time.

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XIE, XIAN NING, HONG JING CHUNG, and ANDREW THYE SHEN WEE. "SCANNING PROBE MICROSCOPY BASED NANOSCALE PATTERNING AND FABRICATION." COSMOS 03, no. 01 (November 2007): 1–21. http://dx.doi.org/10.1142/s0219607707000207.

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Nanotechnology is vital to the fabrication of integrated circuits, memory devices, display units, biochips and biosensors. Scanning probe microscope (SPM) has emerged to be a unique tool for materials structuring and patterning with atomic and molecular resolution. SPM includes scanning tunneling microscopy (STM) and atomic force microscopy (AFM). In this chapter, we selectively discuss the atomic and molecular manipulation capabilities of STM nanolithography. As for AFM nanolithography, we focus on those nanopatterning techniques involving water and/or air when operated in ambient. The typical methods, mechanisms and applications of selected SPM nanolithographic techniques in nanoscale structuring and fabrication are reviewed.

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SONG, SHAOTANG, JIE SU, XINNAN PENG, XINBANG WU, and MYKOLA TELYCHKO. "RECENT ADVANCES IN BOND-RESOLVED SCANNING TUNNELING MICROSCOPY." Surface Review and Letters 28, no. 08 (March 25, 2021): 2140007. http://dx.doi.org/10.1142/s0218625x21400072.

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Recent advances in bond-resolved scanning tunneling microscopy (BRSTM) have demonstrated the tremendous potential of this characterization technique to attain an ultra-high spatial resolution at the level of a single chemical bond. Due to such a unique ability to visualize chemical bonds, BRSTM has been recognized as a valuable characterization tool in the rapidly developing field of on-surface chemistry. In this paper, we discuss the recent experimental advances in BRSTM imaging techniques and their applications in the characterization of a wide scope of functional nanostructures, including individual molecules, elusive nanographenes fabricated by means of surface-assisted synthetic strategies and extended supramolecular self-assemblies.

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12

McCord, M. A., and R. F. W. Pease. "Scanning tunneling microscope as a micromechanical tool." Applied Physics Letters 50, no. 10 (March 9, 1987): 569–70. http://dx.doi.org/10.1063/1.98137.

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13

Yu, Edward T. "Cross-Sectional Scanning Tunneling Microscopy of Semiconductor Heterostructures." MRS Bulletin 22, no. 8 (August 1997): 22–26. http://dx.doi.org/10.1557/s0883769400033765.

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As characteristic dimensions in semiconductor devices continue to shrink and as advanced heterostructure devices increase in prominence, the ability to characterize structure and electronic properties in semiconductor materials and device structures at the atomic to nanometer scales has come to be of outstanding and immediate importance. Phenomena such as atomic-scale roughness of heterojunction interfaces, compositional ordering in semiconductor alloys, discreteness and spatial distribution of dopant atoms, and formation of self-assembled nanoscale structures can exert a profound influence on material properties and device behavior. The relationships between atomic-scale structure, epitaxial growth or processing conditions, and ultimately material properties and device behavior must be understood for realization and effective optimization of a wide range of semiconductor heterostructure and nanoscale devices.Cross-sectional scanning tunneling microscopy (STM) has emerged as a unique and powerful tool in the study of atomic-scale properties in III-V compound semiconductor heterostructures and of nanometer-scale structure and electronic properties in Si micro-electronic devices, offering unique capabilities for characterization that in conjunction with a variety of other, complementary experimental methods are providing new and important insights into material and device properties at the atomic to nanometer scale. In this article, we describe the basic experimental techniques involved in cross-sectional STM and give a few representative applications from our work that illustrate the ability, using cross-sectional STM in conjunction with other experimental techniques, to probe atomic-scale features in the structure of semiconductor heterojunctions and to correlate these features with epitaxial-growth conditions and device behavior.

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Farrell, H. H., and M. Levinson. "Scanning tunneling microscope as a structure-modifying tool." Physical Review B 31, no. 6 (March 15, 1985): 3593–98. http://dx.doi.org/10.1103/physrevb.31.3593.

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15

Reiss, G., and H. Brückl. "Electronic transport in metallic films — a tool for scanning tunneling microscopy investigations." Superlattices and Microstructures 11, no. 2 (January 1992): 171–74. http://dx.doi.org/10.1016/0749-6036(92)90245-z.

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García-García, Ricardo, and Juan JoséSáenz. "Is scanning tunneling microscopy a useful tool for probing the surface potential?" Surface Science Letters 251-252 (July 1991): A320. http://dx.doi.org/10.1016/0167-2584(91)90859-p.

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García-García, Ricardo, and Juan José Sáenz. "Is scanning tunneling microscopy a useful tool for probing the surface potential?" Surface Science 251-252 (July 1991): 223–27. http://dx.doi.org/10.1016/0039-6028(91)90986-3.

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Vang, Ronnie T., Jeppe V. Lauritsen, Erik Lægsgaard, and Flemming Besenbacher. "Scanning tunneling microscopy as a tool to study catalytically relevant model systems." Chemical Society Reviews 37, no. 10 (2008): 2191. http://dx.doi.org/10.1039/b800307f.

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19

Liu, J. B., Boyd Clark, and R. M. Fisher. "Applications of Scanning Tunneling Microscopy in the Materials Characterization Laboratory." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 316–17. http://dx.doi.org/10.1017/s0424820100180331.

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Scanning tunneling microscopy, first developed by G.Binnig, H.Rohrer, Ch.Gerber, and E.Weibel [1] in 1982 as a method of directly observing atom sites at the surface of graphite and other crystalline materials, is now being used in an ever increasing variety of applications as a result of steady and rapid advances in instrumentation, interpretation, and specimen handling techniques [2]. As a result the STM is widely recognized as a powerful method of observing surface structure on an atomic scale and is fast becoming an accessory tool in materials characterization laboratories that are devoted to solving industrial problems. Some examples representative materials characterization studies are described in mis paper.The first STM studies employed its high resolution capabilities for fundamental studies of the topography of atoms at surfaces [2]. More recently the value of the STM to observe both surface topography and electronic structure has been utilized. Figure 1 is a STM image of a charge density wave (CDW) from a TaS3 sample at 143K[3]. In this work the advantage of STM, due to sensitivity to both surface topography and electron structure, is apparent.The development of long scan STMs with scan capabilities of several micrometers or more has opened up a whole new class of materials where the magnifications required are comparable to that of a conventional SEM. The 3-dimensional structure of a processed optical recording disk, as revealed by the STM, is illustrated in Figure 2. The ability of the STM to observe both the course and ultrafine structure of such a sample makes it a powerful tool for relating processing conditions to surface structure defects and hence to the quality and reliability of the optical storage disk itself.

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Mack, James F., Philip B. Van Stockum, Hitoshi Iwadate, and Fritz B. Prinz. "A combined scanning tunneling microscope–atomic layer deposition tool." Review of Scientific Instruments 82, no. 12 (December 2011): 123704. http://dx.doi.org/10.1063/1.3669774.

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21

Shedd, G. M., and P. Russell. "The scanning tunneling microscope as a tool for nanofabrication." Nanotechnology 1, no. 1 (July 1, 1990): 67–80. http://dx.doi.org/10.1088/0957-4484/1/1/012.

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22

Hesjedal, T. "Scanning acoustic tunneling microscopy and spectroscopy: A probing tool for acoustic surface oscillations." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 15, no. 4 (July 1997): 1569. http://dx.doi.org/10.1116/1.589402.

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Ávila Bernal, Alba Graciela, and Ruy Sebastián Bonilla Osorio. "A study of surfaces using a scanning tunneling microscope (STM)." Ingeniería e Investigación 29, no. 3 (September 1, 2009): 121–27. http://dx.doi.org/10.15446/ing.investig.v29n3.15194.

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Sweeping/scanning microscopes have become an experimental scientist's hands and eyes in this century; they have become a powerful and necessary tool for nanoscale characterisation in education and research laboratories all around the world. This article presents the modifications made in the mechanical (isolation or designing an antivibration system) and electrical (piezoelectric and scanning system characterisation) implementation of a scanning tunnelling microscope (STM), thereby allowing nanoscale surfaces to be visualised and modified. A methodology for visualising and characterising surfaces using the aforementioned instrument is described, bidimensional quantification of up to 1,300 nm2, with ~15 nm resolution being reached. This experimental methodology took critical parameters for tunnelling current stability into account, such as scanning speed and microscope tip geometry and dimensions. This microscope's versatility allowed defects in highly oriented pyrolytic graphite (HOPG) samples to be modified and visualised by applying a voltage between the tip and the sample. The concepts of topography scanning and lithography can be easily understood by using the instrument implemented here.

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Hsu, Julia W. P. "Semiconductor Defect Studies Using Scanning Probes." Microscopy and Microanalysis 6, S2 (August 2000): 704–5. http://dx.doi.org/10.1017/s1431927600036011.

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Understanding how defects alter physical properties of materials has lead to improvements in materials growth as well as device performance. Transmission electron microscopy (TEM) provides an invaluable tool for structural characterization of defects. Our current knowledge of crystallographic defects, such as dislocations, would not have been possible without TEM. Recently, scanning tunneling microscopy and scanning force microscopy (SFM) have shown the capability of imaging surface defects with atomic or near-atomic resolution in topographic images. What is more important is to gain knowledge on how the presence of a certain type of defects changes the physical properties of materials. For example, how is the carrier lifetime altered near electrically active defects? How does photoresponse vary near grain boundaries? Where are defect levels in the forbidden bandgap? This talk will discuss several examples of how scanning probe microscopies (SPMs) can contribute to this aspect of defect studies in semiconductors.

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Joy, David C. "The Resolution of the SEM." Microscopy and Microanalysis 3, S2 (August 1997): 1173–74. http://dx.doi.org/10.1017/s1431927600012757.

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The resolution of any microscope is usually taken as the benchmark of its quality. When thinking about the scanning electron microscope(SEM) a comparison of its resolution to the resolutions quot-ed for other comparable instruments such as the transmission EM or the scanning tunneling micro-scope has unfortunately led some users to the view that the SEM is only a second best choice. In fact the spatial resolution that can be anticipated for an optimized SEM is highly competitive with its peers making it clearly the microscopy of choice.The resolution of the SEM depends on two classes of factors; those which are inherent to the use of electrons as an imaging tool, and those which relate to the performance of the instrumentation (and possibly of the operator) used to perform the microscopy. The use of electrons as the scanning probe, and the choice of secondary electrons as the usual imaging mode, potentially affects the achievable resolution in three ways.

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Chernoff, Donald A. "Atomic-force microscopy: Exotic invention or practical tool?" Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 526–27. http://dx.doi.org/10.1017/s0424820100148460.

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The Scanning Tunneling and Atomic Force Microscopes are well-known due to their extraordinary capability of imaging atoms using a simple mechanism. However, atomic resolution is usually not needed to solve most problems in development and manufacturing. So, many scientists and engineers (mistakenly) regard these new microscopes as more “exotic” than practical.Both the AFM and the STM make 3-dimensional images of solid surfaces, but the AFM has much broader applications. The reason for this is that the AFM uses a universal sensing mechanism (repulsive and attractive mechanical forces), whereas the STM uses an electrical signal, which requires that the surface be at least somewhat conductive. Using the extraordinary height sensitivity and wide scan capability of the AFM, we easily answer simple (but important) questions about surfaces and surface features, including: -Is a contaminant present?-Is a feature a pit or a peak?-How tall is it?-What is the grain size of a coating?-How rough is the surface?

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Schönenberger, C., S. F. Alvarado, and C. Ortiz. "Scanning tunneling microscopy as a tool to study surface roughness of sputtered thin films." Journal of Applied Physics 66, no. 9 (November 1989): 4258–61. http://dx.doi.org/10.1063/1.343967.

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Ju, Bing-Feng, Wu-Le Zhu, Shunyao Yang, and Keji Yang. "Scanning tunneling microscopy-basedin situmeasurement of fast tool servo-assisted diamond turning micro-structures." Measurement Science and Technology 25, no. 5 (March 14, 2014): 055004. http://dx.doi.org/10.1088/0957-0233/25/5/055004.

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Fisher, Knute A. "Scanned Probe Microscopy: Past, present, and future." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (August 1992): 18–19. http://dx.doi.org/10.1017/s0424820100120497.

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In the past decade a new family of image-forming devices has been developed, machines that do not use lenses and are collectively called scanned probe microscopes (SPM). The SPM family evolved from the scanning tunneling microscope (STM) developed by Binnig and Rohrer in the early 1980s. The tunneling microscope and subsequent probe microscopes, such as the atomic force microscope (AFM), are based on the precise positioning and scanning of a probe within nanometer distances of a surface. Sub-nanometer precision is accomplished using piezoelectric ceramics that change shape with applied electrical potential allowing probes to be moved laterally with less than 0.1-nm resolution and vertically with less than 0.01-nm resolution. This method of positioning has been routinely used with SPM over the past 10 years, during which time many different probes have been developed. These probes measure signals from a variety of physical phenomena such as electron tunneling, atomic force, electrical conductivity, temperature gradients, light absorption, ion currents, and magnetic properties. A significant difference between SPM and conventional light and electron microscopes is that the probes can operate in a wide range of environments including pressures that range from ultrahigh vacuum to ambient pressure, temperatures that range from liquid helium to hundreds of degrees Kelvin, and physical states that include immersion in hydrophobic liquids such as oil and hydrophilic liquids such biological buffers. The probes are usually scanned in either a constant signal mode or in a constant height mode. Signals are amplified and can be used to control the probe's vertical position. The signal is recorded digitally and displayed on a computer screen and thus can be manipulated by image-processing tools to generate topographic maps of the surface. The references at the end of this article cite several of the major reviews of probe microscopy.

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Drost, Robert, Maximilian Uhl, Piotr Kot, Janis Siebrecht, Alexander Schmid, Jonas Merkt, Stefan Wünsch, et al. "Combining electron spin resonance spectroscopy with scanning tunneling microscopy at high magnetic fields." Review of Scientific Instruments 93, no. 4 (April 1, 2022): 043705. http://dx.doi.org/10.1063/5.0078137.

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The continuous increase in storage densities and the desire for quantum memories and computers push the limits of magnetic characterization techniques. Ultimately, a tool that is capable of coherently manipulating and detecting individual quantum spins is needed. Scanning tunneling microscopy (STM) is the only technique that unites the prerequisites of high spatial and energy resolution, low temperature, and high magnetic fields to achieve this goal. Limitations in the available frequency range for electron spin resonance STM (ESR-STM) mean that many instruments operate in the thermal noise regime. We resolve challenges in signal delivery to extend the operational frequency range of ESR-STM by more than a factor of two and up to 100 GHz, making the Zeeman energy the dominant energy scale at achievable cryogenic temperatures of a few hundred millikelvin. We present a general method for augmenting existing instruments into ESR-STM to investigate spin dynamics in the high-field limit. We demonstrate the performance of the instrument by analyzing inelastic tunneling in a junction driven by a microwave signal and provide proof of principle measurements for ESR-STM.

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Bilger, R., H. J. Cantow, J. Heinze, and S. Magonov. "Scanning tunneling microscope images of doped polypyrrole on ITO glass." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 16–17. http://dx.doi.org/10.1017/s0424820100152057.

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Scanning tunneling microscopy (STM) becomes an excellent tool for surface structure studies in the case of conductive and semiconductive materials. The STM has advantage of extending the range of SEM and TEM studies to topography measurements in the angstrom scale. This method also does not require special sample preparations and can be used in air. The polymers with electronic conductivity are among compounds to be studied by STM. Recently the STM images of doped polypyrrole were obtained for polymer molecules deposited on graphite. The authors claimed the observation of single polypyrrole chains with helical structure and diameter approximately 1.2 nm. We had tried the electrochemical deposition of conductive polymers on ITO for preparing structured polypyrrole layers on a smooth conductive glass surface. These samples were studied by STM.The STM images of the surface of polypyrrole samples were obtained in air with the Nanoscope II).

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Ratner, Buddy D., Reto Luginbühll, Rene Overney, Michael Garrison, and Thomas Boland. "Recognition, Specificity, Scanning Probe Microscopy and Biomaterials." Microscopy and Microanalysis 7, S2 (August 2001): 130–31. http://dx.doi.org/10.1017/s1431927600026726.

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Although scanning probe microscopy (SPM) can generate images of surface topography, this class of techniques is exceptionally valuable in its ability to provide quantitative and chemically specific information about biomaterial surfaces with high spatial definition. Since engineered biomaterials are designed to deliver chemically defined information, often arrayed in specific geometries, tools that can characterize such materials are needed.A few years ago, we demonstrated how the atomic force microscope (AFM) could precisely distinguish between each of the four nucleotide bases that comprise DNA, measure the nucleotide-nucleotide force of interaction and spatially localize that information on a surface (1). in particular, we found that the nucleotide bases could self-assemble on gold. The assembly process was imaged using scanning tunneling microscopy (STM) and this led to an understanding of the structure of the assembled film. The assembled film structure was further characterized using electron spectroscopy for chemical analysis (ESCA) and secondary ion mass spectrometry (SIMS).

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Bonnell, Dawn A., and Qian Zhong. "Local geometric and electronic structure of oxides using scanning tunneling microscopy/spectroscopy." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1480–81. http://dx.doi.org/10.1017/s0424820100132030.

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The potential of scanning tunneling microscopy (STM) and related scanning probe microscopies is amply demonstrated by the geometric increase in the number of papers utilizing the techniques that are published each year. The power of STM derives, not only from imaging capabilities, but also from associated spectroscopies which can provide local information about the density of states and work function. Although the technique has been applied to a wide range of metal and semiconductor surfaces, application to large bandgap materials such as oxides is difficult. We demonstrate the successful application of STM/STS to oxides with an analysis of the effect of reduction mechanism on the geometric and electronic structure of TiO2 (110). The structure of defects in oxides is critical in that it affects many properties of practical interest including catalysis, photoelectrolysis, and electron transport. The presence of defects can affect the local cation valence, such that the variation of d-orbital occupation results in a range of electronic properties, from insulating to semiconducting in nature. STM/STS is the ideal tool to probe the structure of these defects.

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Yao, J. E., and G. Y. Shang. "A Simple Scanning Tunneling Microscope with Very Wide Scanning Range." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 314–15. http://dx.doi.org/10.1017/s042482010018032x.

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Scanning Tunneling Microscope (STM) has been a powerful tool for study of surfaces in the range of about 1 micrometer. The small field of view is enough for imaging homogeneous surfaces with atomic or near-atomic resolution. If, however, integrated circuits, gratings and other small “man-made” structures have to be observed, a STM with very wide scan range, for example, 10 to 100 micrometers is needed. In most of the STMs currently in use, three-dimensional scanner are fabricated from piezoceramic stacks, tubes and beams. The maximum scanning range is restricted to about a micrometer because of the maximum allowable control voltage and piezo element dimensions. Recently, Takashima Koshi has constructed a x/y scan stage for observation of grating(1). In a similar point of view, We have designed and built a simple scanner (Fig.1), which includes a base B, a mechanical amplifying device (consisting of a spring lever S and a metal tube M), x/y driving elements D, z control piezo tube P and tip T. The relation between the displacement dx(dy) and applied voltage V for the scanner is described by the equation:dx(dy)=KV(2L+l)/2d. Where, K is the voltage sensitivity in nm/v; L and l are the lengths of M and S respectively; d is the distance between the axis of S and that of D. When L=30mm, l =8mm, d=5mm, k=60nm/v, a scan range of 120μm will be obtained.

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Wang, Xuewen, Xuexia He, Hongfei Zhu, Linfeng Sun, Wei Fu, Xingli Wang, Lai Chee Hoong, et al. "Subatomic deformation driven by vertical piezoelectricity from CdS ultrathin films." Science Advances 2, no. 7 (July 2016): e1600209. http://dx.doi.org/10.1126/sciadv.1600209.

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Driven by the development of high-performance piezoelectric materials, actuators become an important tool for positioning objects with high accuracy down to nanometer scale, and have been used for a wide variety of equipment, such as atomic force microscopy and scanning tunneling microscopy. However, positioning at the subatomic scale is still a great challenge. Ultrathin piezoelectric materials may pave the way to positioning an object with extreme precision. Using ultrathin CdS thin films, we demonstrate vertical piezoelectricity in atomic scale (three to five space lattices). With an in situ scanning Kelvin force microscopy and single and dual ac resonance tracking piezoelectric force microscopy, the vertical piezoelectric coefficient (d33) up to 33 pm·V−1 was determined for the CdS ultrathin films. These findings shed light on the design of next-generation sensors and microelectromechanical devices.

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Kossakovski, Dmitri A., John D. Baldeschwieler, and J. L. Beauchamp. "Chemical Imaging With a Scanning Probe Microscope." Microscopy and Microanalysis 5, S2 (August 1999): 970–71. http://dx.doi.org/10.1017/s1431927600018171.

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Scanning Probe Microscopy (SPM) is a superb tool for topographical analysis of samples. However, traditional varieties of SPM such as Atomic Force, Scanning Tunneling and Near-field Scanning Optical Microscopy have limited chemical contrast capability. Recently, several advanced techniques have been reported which provide chemical information in addition to topographical data. All these methods derive advantage from combinations of scanning probe methodologies and some other, chemically sensitive technique. Examples of such approaches are: Near-field Scanning Raman Imaging, Near-field Scanning Infrared Microscopy and mass spectrometric analysis with laser ablation through fiber probes.In this contribution we report the development of a new method in this family of chemically sensitive scanning probe techniques: Laser Induced Breakdown Spectroscopy with Shear Force Microscopy, LIBS-SFM. Traditional LIBS experiments involve focusing a pulsed laser beam onto the sample and observing optical emission from the plasma formed in the ablation area. The emissions are mostly in the UV/visible range, and the signal is due to electronic transitions in excited atoms and ions in the plasma plume. The spectra are analyzed to identify chemical elements. The spatial resolution of LIBS is limited by the wavelength and beam quality of the laser used for ablation. The experiments may be conducted in vacuum, controlled atmosphere, or ambient air.

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Revel, Jean-Paul. "Attaboy! Attoboys, or the new Zeptoscopists." Microscopy Today 1, no. 8 (December 1993): 2–3. http://dx.doi.org/10.1017/s1551929500069029.

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As the year ends there is a bumper crop of announcements of advances that I find absolutely amazing. First of course is the continued clever use of light as a veritable tool in manipulating everything from atoms (entrapping them in “atomic molasses”) to having tugs of war with biological motors (using “light tweezers”). But these developments will be for discussion another time. What I want to talk about in this installment are advances in Near Field Scanning Optical Microscopy (NSOM), which has now been used by Chichester and Betzig to visualize single molecules.In classical (far field) optics, resolution is limited by diffraction to about 1/2 the wavelength of the radiation used for imaging. Near field optics overcome this limitation by use of scanning techniques similar to those employed in Scanning Tunneling or Scanning Force Microscopy.

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Li, Weixuan, Jihao Wang, Jing Zhang, Wenjie Meng, Caihong Xie, Yubin Hou, Zhigang Xia, and Qingyou Lu. "Atomic-Resolution Imaging of Micron-Sized Samples Realized by High Magnetic Field Scanning Tunneling Microscopy." Micromachines 14, no. 2 (January 22, 2023): 287. http://dx.doi.org/10.3390/mi14020287.

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Scanning tunneling microscopy (STM) can image material surfaces with atomic resolution, making it a useful tool in the areas of physics and materials. Many materials are synthesized at micron size, especially few-layer materials. Limited by their complex structure, very few STMs are capable of directly positioning and imaging a micron-sized sample with atomic resolution. Traditional STMs are designed to study the material behavior induced by temperature variation, while the physical properties induced by magnetic fields are rarely studied. In this paper, we present the design and construction of an atomic-resolution STM that can operate in a 9 T high magnetic field. More importantly, the homebuilt STM is capable of imaging micron-sized samples. The performance of the STM is demonstrated by high-quality atomic images obtained on a graphite surface, with low drift rates in the X–Y plane and Z direction. The atomic-resolution image obtained on a 32-μm graphite flake illustrates the new STM’s ability of positioning and imaging micron-sized samples. Finally, we present atomic resolution images at a magnetic field range from 0 T to 9 T. The above advantages make our STM a promising tool for investigating the quantum hall effect of micron-sized layered materials.

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Wang, Meng-Jiao, Siegfried Wolff, and Burkhard Freund. "Filler-Elastomer Interactions. Part XI. Investigation of the Carbon-Black Surface by Scanning Tunneling Microscopy." Rubber Chemistry and Technology 67, no. 1 (March 1, 1994): 27–41. http://dx.doi.org/10.5254/1.3538665.

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Abstract Scanning tunneling microscopy (STM) has recently been demonstrated to be a powerful and versatile tool to image the microstructure of the surface of carbonaceous materials. In this study, the surfaces of carbon blacks, both graphitized and nongraphitized, were investigated with this technique. The STM images show that the carbon-black surface can be classified into two domains, an organized and an unorganized one. The degree of carbon atom organization varies with the carbon-black grade and increases drastically upon graphitization. The surface energies and energy distributions of graphitized and nongraphitized carbon blacks, measured by inverse gas chromatography, correlate well with their surface microstructure. Mapping of the carbon-black topography showed that although the surface is not smooth, there is no significant porosity either.

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Rakovan, John, and F. Hochella Michael. "Heterogeneous Oxidation and Precipitation of Aqueous Mn(II) at the Goethite Surface: A SPM Study." Microscopy and Microanalysis 4, S2 (July 1998): 600–601. http://dx.doi.org/10.1017/s1431927600023126.

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Since its invention inl982 scanning probe microscopy (SPM) has become an important analytical tool in every branch of physical science. The two most widely used types of SPM are atomic force Microscopy (AFM) and scanning tunneling microscopy (STM). Both AFM and STM allow measurement of the microtopography of a surface down to the atomic scale. Many spin-off applications such as lateral force and magnetic force allow measurement of a variety of the physical properties of a surface while imaging its microtopography. SPM can be done in both air and liquid and hence can be used to observe the interactions that take place at a solid-solution interface.SPM has been used in mineralogy and geochemistry since 1989. Here as in other applications the great strength of SPM is in the characterization of the heterogeneous nature of mineral surfaces and the ability to observe many geochemical processes in real time.

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Ale Crivillero, Maria Victoria, Jean C. Souza, Vicky Hasse, Marcus Schmidt, Natalya Shitsevalova, Slavomir Gabáni, Konrad Siemensmeyer, Karol Flachbart, and Steffen Wirth. "Detection of Surface States in Quantum Materials ZrTe2 and TmB4 by Scanning Tunneling Microscopy." Condensed Matter 8, no. 1 (January 16, 2023): 9. http://dx.doi.org/10.3390/condmat8010009.

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Scanning Tunneling Microscopy and Spectroscopy (STM/S), with its exceptional surface sensitivity and exquisite energy resolution, is well suited for the investigation of surface states down to atomic length scales. As such, it became an essential tool to probe the surface states of materials, including those with non-trivial topology. One challenge, however, can be the preparation of clean surfaces which allow the study of preferably unchanged surface properties with respect to the bulk amount. Here, we report on the STM/S of two materials, ZrTe2 and TmB4. The former cleaves easily and defects can be examined in detail. However, our STS data can only qualitatively be compared to the results of band structure calculations. In the case of TmB4, the preparation of suitable surfaces is highly challenging, and atomically flat surfaces (likely of B-termination) were only encountered rarely. We found a large density of states (DOS) at the Fermi level EF and a mostly featureless differential conductance near EF. Further efforts are required to relate our results to the electronic structure predicted by ab initio calculations.

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Bogy, D. B. "Surface Modification and Measurement Using a Scanning Tunneling Microscope With a Diamond Tip." Journal of Tribology 114, no. 3 (July 1, 1992): 493–98. http://dx.doi.org/10.1115/1.2920910.

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Scanning Tunneling Microscopy is used to modify and measure the surface of magnetic media disks. A very rugged diamond tip allows continued scanning after it has severely scratched or punched the surface. Three techniques are used. First a manual method of penetrating the surface using a stand-alone head makes a scratch of essentially uncontrollable length and depth. Then the normal head is used to cause surface penetration by removing the bias voltage while scanning. Better control is obtained as regards the location and depth of the indentation. Excellent control of indentation location and depth can be obtained by using a new software developed by the STM manufacturer to push the tip into the surface with the piezoelectric scanner. The control of the indentations and their subsequent measurement may make the STM a useful tool as a hardness tester for ultra-thin films, on the order of a few tens of nanometers.

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Barbier, Luc, and Denis Gratias. "High resolution scanning tunneling microscopy studies of quasicrystal surfaces: an efficient tool to investigate quasiperiodic atomic structures." Progress in Surface Science 75, no. 3-8 (August 2004): 177–89. http://dx.doi.org/10.1016/j.progsurf.2004.05.006.

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Kelly, Thomas F., Keith Thompson, Emmanuelle A. Marquis, and David J. Larson. "Atom Probe Tomography Defines Mainstream Microscopy at the Atomic Scale." Microscopy Today 14, no. 4 (July 2006): 34–41. http://dx.doi.org/10.1017/s1551929500050264.

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When making a sculpture, it is the eyes that guide the hands and tools and perceive the outcome. In simple words, “in order to make, you must be able to see.” So too, when making a nanoelectronic device, it is the microscope (eyes) that guides the process equipment (hands and tools) and perceives the outcome. As we emerge into the century of nanotechnology, it is imperative that the eyes on the nanoworld provide an adequate ability to “see.” We have microscopies that resolve 0.02 nm on a surface (scanning tunneling microscope (STM)) or single atoms in a specimen (atom probe tomographs (APT) and transmission electron microscopes (TEM)).

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Huang, Haiming, Mingming Shuai, Yulong Yang, Rui Song, Yanghui Liao, Lifeng Yin, and Jian Shen. "Cryogen free spin polarized scanning tunneling microscopy and magnetic exchange force microscopy with extremely low noise." Review of Scientific Instruments 93, no. 7 (July 1, 2022): 073703. http://dx.doi.org/10.1063/5.0095271.

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Spin polarized scanning tunneling microscopy (SP-STM) and magnetic exchange force microscopy (MExFM) are powerful tools to characterize spin structure at the atomic scale. For low temperature measurements, liquid helium cooling is commonly used, which has the advantage of generating low noise but has the disadvantage of having difficulties in carrying out measurements with long durations at low temperatures and measurements with a wide temperature range. The situation is just reversed for cryogen-free STM, where the mechanical vibration of the refrigerator becomes a major challenge. In this work, we have successfully built a cryogen-free system with both SP-STM and MExFM capabilities, which can be operated under a 9 T magnetic field provided by a cryogen-free superconducting magnet and in a wide temperature range between 1.4 and 300 K. With the help of our specially designed vibration isolation system, the noise is reduced to an extremely low level of 0.7 pm. The Fe/Ir(111) magnetic skyrmion lattice is used to demonstrate the technical novelties of our cryogen-free system.

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Wang, X., A. P. Liu, and X. H. Yang. "System design and new applications for atomic force microscope based on tunneling." International Journal of Modern Physics B 29, no. 25n26 (October 14, 2015): 1542039. http://dx.doi.org/10.1142/s0217979215420394.

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The design of atomic force microscopy (AFM) with high resolution is introduced in this paper. Mainly, we have developed the system design of the apparatus based on tunneling. AFM.IPC-208B, this kind of apparatus combines scanning tunnel microscopy (STM) and AFM availability, and its lens body with original frame enhances the capability of the machine. In order to analyze the performance of AFM.IPC-208B, as a new tool in the field of Life Science, we make use of the system to study natural mica and molecular protein structures of Cattle-insulin and human antibody immunoglobulin G (IgG) coupled with staphylococcus protein A (SPA). As the results of new applications, the resolution of AFM.IPC-208B is proved to be 0.1 nm, and these nanometer measurement results provide much valuable information for the study of small molecular proteins and HIV experiments.

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De Feyter, Steven, André Gesquière, Mohamed M. Abdel-Mottaleb, Petrus C. M. Grim, Frans C. De Schryver, Christian Meiners, Michel Sieffert, Suresh Valiyaveettil, and Klaus Müllen. "Scanning Tunneling Microscopy: A Unique Tool in the Study of Chirality, Dynamics, and Reactivity in Physisorbed Organic Monolayers." Accounts of Chemical Research 33, no. 8 (August 2000): 520–31. http://dx.doi.org/10.1021/ar970040g.

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Chen, Kui, Wenkai Xiao, Zhengwu Li, Jiasheng Wu, Kairong Hong, and Xuefeng Ruan. "Effect of Graphene and Carbon Nanotubes on the Thermal Conductivity of WC–Co Cemented Carbide." Metals 9, no. 3 (March 24, 2019): 377. http://dx.doi.org/10.3390/met9030377.

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In recent years, it has been found that the service life of cemented carbide shield machine tools used in uneven soft and hard strata is substantially reduced in engineering practice. The study found that thermal stress is the main reason for the failure of cemented carbide shield tunneling tools when shield tunneling is carried out in uneven soft and hard soil. To maintain the hardness of cemented carbide, improving the thermal conductivity of the shield machine tool is of great importance for prolonging its service life and reducing engineering costs. In this study, graphene and carbon nanotubes were mixed with WC–Co powder and sintered by spark plasma sintering (SPS). The morphology was observed by scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDS). The Rockwell hardness, bending strength, and thermal conductivity of the samples were tested. The results show that adding a small amount of graphene or carbon nanotubes could increase the bending strength of the cemented carbide by approximately 50%, while keeping the hardness of the cemented carbide constant. The thermal conductivity of the cemented carbide could be increased by 10% with the addition of 0.12 wt % graphene alone.

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Cui, Daling, Jennifer M. MacLeod, and Federico Rosei. "Probing functional self-assembled molecular architectures with solution/solid scanning tunnelling microscopy." Chemical Communications 54, no. 75 (2018): 10527–39. http://dx.doi.org/10.1039/c8cc04341h.

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STM is emerging as a tool to elucidate and guide the use of self-assembled molecular systems in practical applications, including small molecule device engineering, molecular recognition and sensing and electronic modification of 2D materials.

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Jeon, Sangjun, Yonglong Xie, Jian Li, Zhijun Wang, B. Andrei Bernevig, and Ali Yazdani. "Distinguishing a Majorana zero mode using spin-resolved measurements." Science 358, no. 6364 (October 12, 2017): 772–76. http://dx.doi.org/10.1126/science.aan3670.

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One-dimensional topological superconductors host Majorana zero modes (MZMs), the nonlocal property of which could be exploited for quantum computing applications. We use spin-polarized scanning tunneling microscopy to show that MZMs realized in self-assembled Fe chains on the surface of Pb have a spin polarization that exceeds that stemming from the magnetism of these chains. This feature, captured by our model calculations, is a direct consequence of the nonlocality of the Hilbert space of MZMs emerging from a topological band structure. Our study establishes spin-polarization measurements as a diagnostic tool to distinguish topological MZMs from trivial in-gap states of a superconductor.

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Journal articles on the topic 'Scanning Tunneling Microscopy [Tool]'

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