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Academic literature on the topic 'Scanning Tunneling Microscopy [Tool]'

Author: Grafiati

Published: 7 September 2023

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Journal articles on the topic "Scanning Tunneling Microscopy [Tool]"

1

Chiang, Shirley, and Robert J. Wilson. "Scanning Tunneling Microscopy: A Surface Structural Tool." Analytical Chemistry 59, no. 21 (November 1987): 1267A—1270A. http://dx.doi.org/10.1021/ac00148a748.

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Stemmer, A., A. Engel, R. Häring, R. Reichelt, and U. Aebi. "Scanning tunneling microscopy of biomacromolecules." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 444–45. http://dx.doi.org/10.1017/s0424820100104285.

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Since its invention in the early 1980s the scanning tunneling microscope (STM) has rapidly evolved into a well established tool in solid state physics for surface structure analysis at atomic resolution. Recently a growing interest in the STM for investigating biological matter has been expressed, since surface ‘topographs’ of biomacromolecules can be recorded at ambient pressure or possibly in buffer solutions, thereby eliminating structural alterations induced by specimen dehydration such as required for electron microscopy (EM).As simple as a STM may look, it provides a wealth of information ranging from mere surface topography and local variations in the tunnel-barrier height to local spectroscopy of electronic states and elasticity. On the other hand the physics involved in imaging biological specimens such as protein or DNA, membranes, or fatty acid monolayers, which are generally known to be poor conductors, is not quite understood yet. To cope with insulators the atomic force microscope (AFM), a relative of the STM, provides a means to obtain topographs and elasticity data.

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Denley, D. R. "Practical applications of scanning tunneling microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 18–19. http://dx.doi.org/10.1017/s0424820100152069.

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Scanning tunneling microscopy (STM) has recently been introduced as a promising tool for analyzing surface atomic structure. We have used STM for its extremely high resolution (especially the direction normal to surfaces) and its ability for imaging in ambient atmosphere. We have examined surfaces of metals, semiconductors, and molecules deposited on these materials to achieve atomic resolution in favorable cases.When the high resolution capability is coupled with digital data acquisition, it is simple to get quantitative information on surface texture. This is illustrated for the measurement of surface roughness of evaporated gold films as a function of deposition temperature and annealing time in Figure 1. These results show a clear trend for which the roughness, as well as the experimental deviance of the roughness is found to be minimal for evaporation at 300°C. It is also possible to contrast different measures of roughness.

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van de Walle, G. F. A., B. J. Nelissen, L. L. Soethout, and H. van Kempen. "Scanning tunneling microscopy: A powerful tool for surface analysis." Fresenius' Zeitschrift für analytische Chemie 329, no. 2-3 (January 1987): 108–12. http://dx.doi.org/10.1007/bf00469119.

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Rohrer, H. "Scanning tunneling microscopy: a surface science tool and beyond." Surface Science 299-300 (January 1994): 956–64. http://dx.doi.org/10.1016/0039-6028(94)90709-9.

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Bracker, CE, and P. K. Hansma. "Scanning tunneling microscopy and atomic force microscopy: New tools for biology." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 778–79. http://dx.doi.org/10.1017/s0424820100155864.

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A new family of scanning probe microscopes has emerged that is opening new horizons for investigating the fine structure of matter. The earliest and best known of these instruments is the scanning tunneling microscope (STM). First published in 1982, the STM earned the 1986 Nobel Prize in Physics for two of its inventors, G. Binnig and H. Rohrer. They shared the prize with E. Ruska for his work that had led to the development of the transmission electron microscope half a century earlier. It seems appropriate that the award embodied this particular blend of the old and the new because it demonstrated to the world a long overdue respect for the enormous contributions electron microscopy has made to the understanding of matter, and at the same time it signalled the dawn of a new age in microscopy. What we are seeing is a revolution in microscopy and a redefinition of the concept of a microscope.Several kinds of scanning probe microscopes now exist, and the number is increasing. What they share in common is a small probe that is scanned over the surface of a specimen and measures a physical property on a very small scale, at or near the surface. Scanning probes can measure temperature, magnetic fields, tunneling currents, voltage, force, and ion currents, among others.

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Edel’man, V. S. "The scanning tunneling microscopy combined with the scanning electron microscopy—A tool for the nanometry." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 9, no. 2 (March 1991): 618. http://dx.doi.org/10.1116/1.585471.

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Betzig, E., M. Isaacson, H. Barshatzky, K. Lin, and A. Lewis. "Progress in near-field scanning optical microscopy (NSOM)." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 436–37. http://dx.doi.org/10.1017/s0424820100104248.

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The concept of near field scanning optical microscopy was first described more than thirty years ago1 almost two decades before the validity of the technique was verified experimentally for electromagnetic radiation of 3cm wavelength.2 The extension of the method to the visible region of the spectrum took another decade since it required the development of micropositioning and aperture fabrication on a scale five orders of magnitude smaller than that used for the microwave experiments. Since initial reports on near field optical imaging8-6, there has been a growing effort by ourselves6 and other groups7 to extend the technology and develop the near field scanning optical microscope (NSOM) into a useful tool to complement conventional (i.e., far field) scanning optical microscopy (SOM), scanning electron microscopy (SEM) and scanning tunneling microscopy. In the context of this symposium on “Microscopy Without Lenses”, NSOM can be thought of as an addition to the exploding field of scanned tip microscopy although we did not originally conceive it as such.

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Elings, Virgil. "Scanning probe microscopy: A new technology takes off." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 3 (August 12, 1990): 959. http://dx.doi.org/10.1017/s0424820100162363.

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With the expanding use of the scanning tunneling microscope, the technology is developing into other scanning near field microscopes, microscopes whose resolution is determined by the size of the probe, not by some wavelength. The first available “son of STM” will be the atomic force microscope (AFM), a very low force profilometer which has atomic resolution and can profile non-conducting surfaces. The hope is that this microscope may find more applications in biology than the scanning tunneling microscope (STM), which requires a conducting or very thin sample.In the past five years, the STM has progressed from curiosity to everyday lab tool, imaging surfaces with scans from a few nanometers up to 100 microns. When compared to an SEM, the STM has the advantages of higher resolution, lower cost, operation in air or liquid, real three-dimensional output, and small size. The disadvantages are smaller scan size, slower scan speeds, fewer spectroscopic functions and, of course, not as many of the nice features of the more mature electron microscopes. The AFM has similar features to the STM except that the detector and profiling tips are more complicated and more difficult to operate—disadvantages that will decrease with time.

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XIE, XIAN NING, HONG JING CHUNG, and ANDREW THYE SHEN WEE. "SCANNING PROBE MICROSCOPY BASED NANOSCALE PATTERNING AND FABRICATION." COSMOS 03, no. 01 (November 2007): 1–21. http://dx.doi.org/10.1142/s0219607707000207.

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Nanotechnology is vital to the fabrication of integrated circuits, memory devices, display units, biochips and biosensors. Scanning probe microscope (SPM) has emerged to be a unique tool for materials structuring and patterning with atomic and molecular resolution. SPM includes scanning tunneling microscopy (STM) and atomic force microscopy (AFM). In this chapter, we selectively discuss the atomic and molecular manipulation capabilities of STM nanolithography. As for AFM nanolithography, we focus on those nanopatterning techniques involving water and/or air when operated in ambient. The typical methods, mechanisms and applications of selected SPM nanolithographic techniques in nanoscale structuring and fabrication are reviewed.

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Dissertations / Theses on the topic "Scanning Tunneling Microscopy [Tool]"

1

Kulawik, Maria. "Low temperature scanning tunneling microscopy." Doctoral thesis, [S.l.] : [s.n.], 2006. http://deposit.ddb.de/cgi-bin/dokserv?idn=979718848.

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Ding, Haifeng. "Spin-polarized scanning tunneling microscopy." [S.l. : s.n.], 2001. http://deposit.ddb.de/cgi-bin/dokserv?idn=963217186.

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Gustafsson, Alexander. "Theoretical modeling of scanning tunneling microscopy." Doctoral thesis, Linnéuniversitetet, Institutionen för fysik och elektroteknik (IFE), 2017. http://urn.kb.se/resolve?urn=urn:nbn:se:lnu:diva-69012.

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The main body of this thesis describes how to calculate scanning tunneling microscopy (STM) images from first-principles methods. The theory is based on localized orbital density functional theory (DFT), whose limitations for large-vacuum STM models are resolved by propagating localized-basis wave functions close to the surface into the vacuum region in real space. A finite difference approximation is used to define the vacuum Hamiltonian, from which accurate vacuum wave functions are calculated using equations based on standard single-particle Green’s function techniques, and ultimately used to compute the conductance. By averaging over the lateral reciprocal space, the theory is compared to a series of high-quality experiments in the low- bias limit, concerning copper surfaces with adsorbed carbon monoxide (CO) species and adsorbate atoms, scanned by pure and CO-functionalized copper tips. The theory compares well to the experiments, and allows for further insights into the elastic tunneling regime. A second significant project in this thesis concerns first-principles calculations of a simple chemical reaction of a hydroxyl (oxygen-deuterium) monomer adsorbed on a copper surface. The reaction mechanism is provided by tunneling electrons that, via a finite electron-vibration coupling, trigger the deuterium atom to flip between two nearly identical configurational states along a frustrated rotational motion. The theory suggests that the reaction primarily occurs via nuclear tunneling for the deuterium atom through the estimated reaction barrier, and that over-barrier ladder climbing processes are unlikely.

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Blackham, Ian George. "Scanning tunneling microscopy of electrode surfaces." Thesis, University of Oxford, 1992. https://ora.ox.ac.uk/objects/uuid:f9d27595-1177-406f-89a2-1448ac654dd3.

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A scanning tunneling microscope (STM) suitable for the in-situ study of electrode surfaces under electrochemical control has been developed. The system consists of commercially available software and feedback electronics, with a custom-built stage and electrochemical control. The stage incorporates an automatic coarse approach mechanism for ease of operation. Gold single crystal spheres (SCS) and gold on mica thin films have been studied as surfaces potentially suitable for samples in in-situ electrochemical STM experiments. Characteristic features of each surface have been identified. High resolution in-situ STM imaging of the electro-oxidation of a gold surface in a sulphuric acid electrolyte has been achieved. Surface rearrangement at potentials positive of the double layer region has been observed and correlated with cyclic voltammetry. As yet unexplained features resulting from biasing the surface at potentials negative of the double layer region are reported. In phosphate electrolyte, bulk surface oxide formation and the surface resulting from reduction of the oxide have been imaged. Some aspects of the direct electrochemistry of cytochrome c at 4,4' dithiodipyridine (SSBPY) modified gold electrodes have been investigated. In-situ FTIR showed the potential dependent orientation of adsorbed thiopyridine species, while ex-situ and in-situ STM studies showed a novel surface pitting process to be active. It is hypothesised the STM experiment itself induces the process to take place. Features attributable to cytochrome c molecules have been observed. Rearrangement of gold on mica surfaces, on exposure to certain aqueous solutions has been observed and the process is attributed to the interaction of the solutions with the original surface structure present.

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Heben, Michael J. Lewis Nathan Saul Lewis Nathan Saul. "Scanning tunneling microscopy in electrochemical environments /." Diss., Pasadena, Calif. : California Institute of Technology, 1990. http://resolver.caltech.edu/CaltechETD:etd-06122007-104233.

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Weeks, Brandon Lea. "Applications of high-pressure scanning tunneling microscopy." Thesis, University of Cambridge, 2000. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.621999.

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Salazar, Enríquez Christian David. "Scanning tunneling microscopy on low dimensional systems." Doctoral thesis, Saechsische Landesbibliothek- Staats- und Universitaetsbibliothek Dresden, 2016. http://nbn-resolving.de/urn:nbn:de:bsz:14-qucosa-211572.

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This thesis contains experimental studies on low dimensional systems by means of scanning tunneling microscopy (STM). These studies include investigations on dinickel molecular complexes and experiments on iron nanostructures used for the implementation of the spin-polarized scanning tunneling microscopy technique at the IFW-Dresden. Additionally, this work provides detailed information of the experimental technique (STM), from the theoretical background to the STM-construction, which was part of this doctoral work. Molecular anchoring and electronic properties of macrocyclic magnetic complexes on gold surfaces have been investigated by mainly scanning tunneling microscopy and complemented by X-rays photoelectron spectroscopy. Exchange–coupled macrocyclic complexes [Ni2L(Hmba)]+ were deposited via 4-mercaptobenzoate ligands on the surface of Au(111) single crystals. The results showed the success of gold surface-grafted magnetic macrocyclic complexes forming large monolayers. Based on the experimental data, a growth model containing two ionic granular structures was proposed. Spectroscopy measurements suggest a higher gap on the cationic structures than on the anionic ones. Furthermore, the film stability was probed by the STM tip with long-term measurements. This investigation contributes to a new promising direction in the anchoring of molecular magnets to metallic surfaces. Iron nanostructures of two atomic layers and iron-coated tungsten tips were used in order to implement the spin-polarized scanning tunneling microscopy technique at the IFW-Dresden. First of all, a systematic study of the iron growth, from sub-monolayers to multilayers on a W(110) crystal is presented. Subsequent to the well-understanding of the iron growth, the experiments were focused on revealing, for the first time at the IFW-Dresden, the magnetic inner structure of iron nanostructures. The results evidently showed the presence of magnetic domains of irregular shapes. Furthermore, SP-STM probed the bias voltage dependence of the magnetic contrast on the iron nanostructures. This technique opens up a new powerful research line at the IFW-Dresden which is promising for the study of quantum materials as molecular magnets and strongly correlated systems.

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DiLullo, Andrew R. "Manipulative Scanning Tunneling Microscopy and Molecular Spintronics." Ohio University / OhioLINK, 2013. http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1363821351.

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9

Kersell, Heath R. "Alternative Excitation Methods in Scanning Tunneling Microscopy." Ohio University / OhioLINK, 2015. http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1449074449.

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Gambrel, Grady A. "Scanning Tunneling Microscopy of Two-Dimensional Materials." The Ohio State University, 2017. http://rave.ohiolink.edu/etdc/view?acc_num=osu149424786854182.

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Books on the topic "Scanning Tunneling Microscopy [Tool]"

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Neddermeyer, H., ed. Scanning Tunneling Microscopy. Dordrecht: Springer Netherlands, 1993. http://dx.doi.org/10.1007/978-94-011-1812-5.

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1956-, Stroscio Joseph Anthony, and Kaiser William J. 1955-, eds. Scanning tunneling microscopy. Boston: Academic Press, 1993.

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1956-, Stroscio Joseph Anthony, and Kaiser William J. 1955-, eds. Scanning tunneling microscopy. San Diego: Academic Press, 1993.

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1956-, Stroscio Joseph A., and Kaiser William J. 1955-, eds. Scanning tunneling microscopy. London: Academic Press, 1993.

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5

H, Neddermeyer, ed. Scanning tunneling microscopy. Dordrecht: Kluwer Academic Publishers, 1993.

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Güntherodt, Hans-Joachim, and Roland Wiesendanger, eds. Scanning Tunneling Microscopy I. Berlin, Heidelberg: Springer Berlin Heidelberg, 1994. http://dx.doi.org/10.1007/978-3-642-79255-7.

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Güntherodt, Hans-Joachim, and Roland Wiesendanger, eds. Scanning Tunneling Microscopy I. Berlin, Heidelberg: Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-97343-7.

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Wiesendanger, Roland, and Hans-Joachim Güntherodt, eds. Scanning Tunneling Microscopy II. Berlin, Heidelberg: Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-97363-5.

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Wiesendanger, Roland, and Hans-Joachim Güntherodt, eds. Scanning Tunneling Microscopy III. Berlin, Heidelberg: Springer Berlin Heidelberg, 1993. http://dx.doi.org/10.1007/978-3-642-97470-0.

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Wiesendanger, Roland, and Hans-Joachim Güntherodt, eds. Scanning Tunneling Microscopy III. Berlin, Heidelberg: Springer Berlin Heidelberg, 1996. http://dx.doi.org/10.1007/978-3-642-80118-1.

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Book chapters on the topic "Scanning Tunneling Microscopy [Tool]"

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Howland, Rebecca S. "The Scanning Probe Microscope as a Metrology Tool." In Atomic Force Microscopy/Scanning Tunneling Microscopy, 347–58. Boston, MA: Springer US, 1994. http://dx.doi.org/10.1007/978-1-4757-9322-2_35.

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Della Pia, Ada, and Giovanni Costantini. "Scanning Tunneling Microscopy." In Surface Science Techniques, 565–97. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-34243-1_19.

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Feenstra, R. M. "Scanning Tunneling Microscopy." In Interaction of Atoms and Molecules with Solid Surfaces, 357–79. Boston, MA: Springer US, 1990. http://dx.doi.org/10.1007/978-1-4684-8777-0_11.

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Binning, G., and H. Rohrer. "Scanning tunneling microscopy." In Scanning Tunneling Microscopy, 40–54. Dordrecht: Springer Netherlands, 1986. http://dx.doi.org/10.1007/978-94-011-1812-5_3.

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Ng, Kwok-Wai. "SCANNING TUNNELING MICROSCOPY." In Handbook of Measurement in Science and Engineering, 2025–42. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2016. http://dx.doi.org/10.1002/9781119244752.ch56.

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Pia, Ada Della, and Giovanni Costantini. "Scanning Tunneling Microscopy." In Encyclopedia of Nanotechnology, 3531–43. Dordrecht: Springer Netherlands, 2016. http://dx.doi.org/10.1007/978-94-017-9780-1_45.

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Voigtländer, Bert. "Scanning Tunneling Microscopy." In Scanning Probe Microscopy, 279–308. Berlin, Heidelberg: Springer Berlin Heidelberg, 2015. http://dx.doi.org/10.1007/978-3-662-45240-0_20.

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Niehus, Horst. "Scanning Tunneling Microscopy." In Equilibrium Structure and Properties of Surfaces and Interfaces, 29–68. Boston, MA: Springer US, 1992. http://dx.doi.org/10.1007/978-1-4615-3394-8_2.

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Tomitori, Masahiko. "Scanning Tunneling Microscopy." In Roadmap of Scanning Probe Microscopy, 7–14. Berlin, Heidelberg: Springer Berlin Heidelberg, 2007. http://dx.doi.org/10.1007/978-3-540-34315-8_2.

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Hasegawa, Yukio. "Scanning Tunneling Microscopy." In Compendium of Surface and Interface Analysis, 599–604. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_97.

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Conference papers on the topic "Scanning Tunneling Microscopy [Tool]"

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Zaitsev, Boris. "Atomic Force Microscopy as a Tool for Applied Virology and Microbiology." In SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference STM'03. AIP, 2003. http://dx.doi.org/10.1063/1.1639726.

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Ohtsu, Motoichi. "Photon Scanning Tunneling Microscope." In Spectral Hole-Burning and Related Spectroscopies: Science and Applications. Washington, D.C.: Optica Publishing Group, 1994. http://dx.doi.org/10.1364/shbs.1994.fc1.

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A photon scanning tunneling microscope (PSTM) is an optical microscope with super-resolution beyond the diffraction-limit based on the near field optics, which has been intensively studied in these years[1]. Since it can be used not only as a microscope but also as a nanometric fabrication tool and a manipulator of nanometric particles, a variety of applications have been proposed[2]. This paper reviews the recent progress of our study on PSTM.

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de Pablos, P. F. "Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot-Electron Lifetimes in Metals." In SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference STM'03. AIP, 2003. http://dx.doi.org/10.1063/1.1639790.

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Courjon, D. "Near Field Optical Microscopy." In The European Conference on Lasers and Electro-Optics. Washington, D.C.: Optica Publishing Group, 1996. http://dx.doi.org/10.1364/cleo_europe.1996.tutc.

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Near field microscopy is about ten years old. Unlike Scanning Tunneling Microscopy, its progress has been slow and somewhat erratic. Today, we can consider that this new tool is mature enough to be used in a few routine surface characterization procedures.

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Clayton, G. M., and S. Devasia. "Image-Based Trajectory Estimation for Scanning Tunneling Microscopy." In ASME 2007 International Mechanical Engineering Congress and Exposition. ASMEDC, 2007. http://dx.doi.org/10.1115/imece2007-42262.

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In this article we present an image-based approach to estimate the probe position trajectory in scanning tunneling microscopes (STMs). STMs are key enabling tools in the experimental investigation and manipulation of nano and sub-nano scale phenomena; however, due to an inability to measure the STM-probe position, typical STMs are limited to low bandwidth operations to ensure positioning accuracy. To overcome sensor deficiencies, thus enabling higher bandwidth STMs, an image-based method which produces discrete samples of the STM-tip trajectory has been developed. In this article we explore how the STM calibration sample and the output affect the reconstructability of the STM trajectory.

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Bennett, Jean M., Jay Jahanmir, John C. Podlesny, Tami L. Balter, and Daniel T. Hobbs. "The Scanning Force Microscope as a Tool for Studying Optical Surfaces." In Optical Fabrication and Testing. Washington, D.C.: Optica Publishing Group, 1994. http://dx.doi.org/10.1364/oft.1994.omd1.

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Traditional instruments that have been used to study optical surfaces include the Nomarski microscope, various types of optical and mechanical profilers, scanning electron microscope, and transmission electron microscope. Although most of these instruments are sensitive to very small height variations, they have limited lateral resolution. Hence, features such as tiny scratches, closely spaced structure of metal and dielectric films, tiny laser damage craters, and impact craters from space debris cannot be seen by the traditional surface characterization instruments. With the advent of the scanning tunneling microscope in 1982 followed by a variety of scanning probe microscopes, new characterization tools have become available for studying optical surfaces. The scanning tunneling microscope has limited usefulness since it requires that the sample surface be conducting. Most optical samples and their multilayer film coatings are insulating. Even metals such as aluminum, copper, silicon, beryllium, and molybdenum, all of which have optical applications, are covered with layers of native oxide, making them nonconductive. Fortunately the scanning force microscope (SFM), formerly called the atomic force microscope (AFM), is ideally suited for studying optical surfaces.1 It uses a pyramidal silicon nitride probe with a tip radius ~400 Å, which contacts the surface with very light loading, approximately 1000 times smaller than the loading used with the highest performance commercial mechanical profilers. Under suitable conditions, the SFM can show structure on high quality optical surfaces that has rms heights down to the subangstrom level and lateral dimensions of a few tens of angstroms. The SFM can resolve lateral dimensions ~1000 times smaller than those resolved with most optical profilers and ~100 times smaller than is possible with the best mechanical profilers.

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Cricenti, Antonio, S. Selci, M. Scarselli, Renato Generosi, F. Amaldi, and G. Chiarotti. "Gap-modulated versus constant current mode as a tool to discriminate between DNA and substrate structure in scanning tunneling microscopy." In OE/LASE'93: Optics, Electro-Optics, & Laser Applications in Science& Engineering, edited by Clayton C. Williams. SPIE, 1993. http://dx.doi.org/10.1117/12.146384.

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Avouris, Ph, I. W. Lyo, F. Bozso, B. Schubert, and R. Hoffmann. "The Elucidation of the Mechanism of the Initial Stages of Si(111)-7x7 Oxidation Using Scanning Tunneling Microscopy." In The Microphysics of Surfaces: Beam-Induced Processes. Washington, D.C.: Optica Publishing Group, 1991. http://dx.doi.org/10.1364/msbip.1991.mb2.

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The capability of the scanning tunneling microscopy (STM) and spectroscopy (STS) to probe the topography and electronic structure of surfaces and adsorbate layers with atomic resolution makes it a powerful tool in the study of surface chemistry (1). Here we use STM, STS, ultraviolet photocmission spectroscopy (UPS) and electronic structure calculations to study the long-standing problem involving the nature of the initial stages of the oxidation of silicon. There have been a large number of studies on this issue utilizing a great variety of techniques. However, not only is the mechanism of oxidation still unclear, but there is not even agreement on what kind of product(s) is formed. Several different configurations have been proposed for the oxygen-containing sites in the early stages of the reaction (2). They involve oxygen atoms saturating the dangling-bonds of top-layer Si atoms, oxygen atoms inserted in back-bonds but leaving the dangling-bonds intact, or molecular forms of oxygen attached to surface atoms or bridging two surface Si atoms.

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Jalili, Nader, Mohsen Dadfarnia, and Darren M. Dawson. "Distributed-Parameters Base Modeling and Vibration Analysis of Micro-Cantilevers Used in Atomic Force Microscopy." In ASME 2003 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2003. http://dx.doi.org/10.1115/detc2003/vib-48502.

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The atomic force microscope (AFM) system has evolved into a useful tool for direct measurements of intermolecular forces with atomic-resolution characterization that can be employed in a broad spectrum of applications such as electronics, semi-conductors, materials, manufacturing, polymers, biological analysis, and biomaterials. The noncontact AFM offers unique advantages over other contemporary scanning probe techniques such as contact AFM and scanning tunneling microscopy. Current AFM imaging techniques are often based on a lumped-parameters model and ordinary differential equation (ODE) representation of the micro-cantilevers coupled with an ad-hoc method for atomic interaction force estimation (especially in non-contact mode). Since the magnitude of the interaction force lies within the range of nano-Newtons to pica-Newtons, precise estimation of the atomic force is crucial for accurate topographical imaging. In contrast to the previously utilized lumped modeling methods, this paper aims at improving current AFM measurement technique through developing a general distributed-parameters base modeling approach that reveals greater insight into the fundamental characteristics of the microcantilever-sample interaction. For this, the governing equations of motion are derived in the global coordinates via the Hamilton’s Extended Principle. By properly selecting a set of general coordinates, the resulting non-homogenous boundary value problem is then converted to a homogenous one, and hence, analytically solvable. The AFM controller can then be designed based on the original infinite dimensional distributed-parameters system which, in turn, removes some of the disadvantages associated with the truncated-model base controllers such as control spillovers, residual oscillations and increased order of the control. Numerical simulations are provided to support these claims.

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10

Jaculbia, Rafael B., Hiroshi Imada, Kuniyuki Miwa, Takeshi Iwasa, Masato Takenaka, Bo Yang, Emiko Kazuma, Norihiko Hayazawa, Tetsuya Taketsugu, and Yousoo Kim. "Vibrational symmetry of a single molecule revealed by tip-enhanced Raman spectroscopy." In JSAP-OSA Joint Symposia. Washington, D.C.: Optica Publishing Group, 2019. http://dx.doi.org/10.1364/jsap.2019.18p_e208_9.

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Abstract:

The scanning tunneling microscope (STM) is a powerful tool for studying various nanoscale materials with atomic scale spatial resolution. Despite the atom scale spatial sensitivity however, the STM lacks the chemical sensitivity crucial to the investigation of nanomaterials. Raman spectroscopy on the other hand has a very strong chemical sensitivity but its spatial resolution is highly restricted by the diffraction limit of light allowing only about several hundreds of nanometer resolution. Combining these two powerful experiments into a technique called STM-tip enhanced Raman spectroscopy (STM-TERS) alleviates the limitation of STM and Raman allowing for simultaneous subnanometer spatial resolution and high chemical sensitivity.

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Reports on the topic "Scanning Tunneling Microscopy [Tool]"

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Bartels, Ludwig. Towards the Assembly and Characterization of Individual Molecules by Use of the Scanning Tunneling Microscope as a Nanoscopic Tool. Fort Belvoir, VA: Defense Technical Information Center, September 2002. http://dx.doi.org/10.21236/ada408395.

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2

Dow, John D. Scanning Tunneling Microscopy. Fort Belvoir, VA: Defense Technical Information Center, March 1992. http://dx.doi.org/10.21236/ada249262.

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3

Botkin, D. A. Ultrafast scanning tunneling microscopy. Office of Scientific and Technical Information (OSTI), September 1995. http://dx.doi.org/10.2172/270266.

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4

Quate, C. F. Scanning Tunneling Microscopy of Semiconductor Surfaces. Fort Belvoir, VA: Defense Technical Information Center, September 1988. http://dx.doi.org/10.21236/ada199836.

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Lyding, Joseph W. Cryogenic Ultrahigh Vacuum Scanning Tunneling Microscopy. Fort Belvoir, VA: Defense Technical Information Center, March 1993. http://dx.doi.org/10.21236/ada262264.

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Snyder, Shelly R., and Henry S. White. Scanning Tunneling Microscopy, Atomic Force Microscopy, and Related Techniques. Fort Belvoir, VA: Defense Technical Information Center, February 1992. http://dx.doi.org/10.21236/ada246852.

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Heben, M. J., T. L. Longin, R. Pyllki, R. M. Penner, R. Blumenthal, and N. S. Lewis. Applications of Scanning Tunneling Microscopy to Electrochemistry. Fort Belvoir, VA: Defense Technical Information Center, September 1992. http://dx.doi.org/10.21236/ada263326.

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Lewis, Nathan S. Applications of Scanning Tunneling Microscopy to Electrochemistry. Fort Belvoir, VA: Defense Technical Information Center, August 1993. http://dx.doi.org/10.21236/ada269129.

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Williams, Ellen D. Scanning Tunneling Microscopy as a Surface Chemical Probe. Fort Belvoir, VA: Defense Technical Information Center, March 1988. http://dx.doi.org/10.21236/ada192710.

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Coleman, R. V. Surface structure and analysis with scanning tunneling microscopy and electron tunneling spectroscopy. Office of Scientific and Technical Information (OSTI), January 1992. http://dx.doi.org/10.2172/6017304.

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