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Journal articles on the topic 'Scanning optical microscopy'

Author: Grafiati

Published: 4 June 2021

Last updated: 15 February 2022

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1

Battistella, Florent, Steven Berger, and Andrew Mackintosh. "Scanning Optical Microscopy via a Scanning Electron Microscope." Journal of Electron Microscopy Technique 6, no. 4 (August 1987): 377–84. http://dx.doi.org/10.1002/jemt.1060060408.

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2

Wilson, T. "Scanning optical microscopy." Scanning 7, no. 2 (1985): 79–87. http://dx.doi.org/10.1002/sca.4950070203.

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3

Kino, G. S. "Scanning optical microscopy." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 8, no. 6 (November 1990): 1652. http://dx.doi.org/10.1116/1.585134.

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4

Wilke, V. "Optical scanning microscopy-The laser scan microscope." Scanning 7, no. 2 (1985): 88–96. http://dx.doi.org/10.1002/sca.4950070204.

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5

Pylkki, Russell J., Patrick J. Moyer, and Paul E. West. "Scanning Near-Field Optical Microscopy and Scanning Thermal Microscopy." Japanese Journal of Applied Physics 33, Part 1, No. 6B (June 30, 1994): 3785–90. http://dx.doi.org/10.1143/jjap.33.3785.

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6

Kino, Gordon S., and Timothy R. Corle. "Confocal Scanning Optical Microscopy." Physics Today 42, no. 9 (September 1989): 55–62. http://dx.doi.org/10.1063/1.881183.

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7

Courjon, D., K. Sarayeddine, and M. Spajer. "Scanning tunneling optical microscopy." Optics Communications 71, no. 1-2 (May 1989): 23–28. http://dx.doi.org/10.1016/0030-4018(89)90297-6.

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8

Vobornik, Dušan, and Slavenka Vobornik. "Scanning Near-Field Optical Microscopy." Bosnian Journal of Basic Medical Sciences 8, no. 1 (February 20, 2008): 63–71. http://dx.doi.org/10.17305/bjbms.2008.3000.

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An average human eye can see details down to 0,07 mm in size. The ability to see smaller details of the matter is correlated with the development of the science and the comprehension of the nature. Today’s science needs eyes for the nano-world. Examples are easily found in biology and medical sciences. There is a great need to determine shape, size, chemical composition, molecular structure and dynamic properties of nano-structures. To do this, microscopes with high spatial, spectral and temporal resolution are required. Scanning Near-field Optical Microscopy (SNOM) is a new step in the evolution of microscopy. The conventional, lens-based microscopes have their resolution limited by diffraction. SNOM is not subject to this limitation and can offer up to 70 times better resolution.

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9

Jester, J. V., H. D. Cavanagh, and M. A. Lemp. "In vivo confocal imaging of the eye using tandem scanning confocal microscopy (TSCM)." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 56–57. http://dx.doi.org/10.1017/s0424820100102365.

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New developments in optical microscopy involving confocal imaging are now becoming available which dramatically increase resolution, contrast and depth of focus by optically sectioning through structures. The transparency of the anterior ocular structures, cornea and lens, make microscopic visualization and optical sectioning of the living intact eye an interesting possibility. Of the confocal microscopes available, the Tandem Scanning Reflected Light Microscope (referred to here as the Tandem Scanning Confocal Microscope), developed by Professors Petran and Hadravsky at Charles University in Pilzen, Czechoslovakia, permits real-time image acquisition and analysis facilitating in vivo studies of ocular structures.Currently, TSCM imaging is most successful for the cornea. The corneal epithelium, stroma, and endothelium have been studied in vivo and photographed in situ. Confocal scanning images of the superficial epithelium, similar to those obtained by scanning electron microscopy, show both light and dark surface epithelial cells.

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10

Attota, Ravi Kiran, and Haesung Park. "Optical microscope illumination analysis using through-focus scanning optical microscopy." Optics Letters 42, no. 12 (June 12, 2017): 2306. http://dx.doi.org/10.1364/ol.42.002306.

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11

Hamilton, D. K., and T. Wilson. "Scanning optical microscopy by objective lens scanning." Journal of Physics E: Scientific Instruments 19, no. 1 (January 1986): 52–54. http://dx.doi.org/10.1088/0022-3735/19/1/009.

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12

OKAZAKI, Satoshi, and Toshihiko NAGAMURA. "Near-field Scanning Optical Microscopy." Journal of the Japan Society for Precision Engineering 57, no. 7 (1991): 1155–58. http://dx.doi.org/10.2493/jjspe.57.1155.

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13

Buratto, Steven K. "Near-field scanning optical microscopy." Current Opinion in Solid State and Materials Science 1, no. 4 (August 1996): 485–92. http://dx.doi.org/10.1016/s1359-0286(96)80062-3.

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14

Kirstein, Stefan. "Scanning near-field optical microscopy." Current Opinion in Colloid & Interface Science 4, no. 4 (August 1999): 256–64. http://dx.doi.org/10.1016/s1359-0294(99)90005-5.

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15

AOKI, Hiroyuki. "Scanning Near-Field Optical Microscopy." Kobunshi 55, no. 10 (2006): 831–35. http://dx.doi.org/10.1295/kobunshi.55.831.

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16

Dürig, U., D. W. Pohl, and F. Rohner. "Near‐field optical‐scanning microscopy." Journal of Applied Physics 59, no. 10 (May 15, 1986): 3318–27. http://dx.doi.org/10.1063/1.336848.

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17

Bacsa, W. S., and A. Kulik. "Interference scanning optical probe microscopy." Applied Physics Letters 70, no. 26 (June 30, 1997): 3507–9. http://dx.doi.org/10.1063/1.119215.

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18

Dunn, Robert C. "Near-Field Scanning Optical Microscopy." Chemical Reviews 99, no. 10 (October 1999): 2891–928. http://dx.doi.org/10.1021/cr980130e.

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19

Betzig, E., M. Isaacson, A. Lewis, and K. Lin. "Near-Field Scanning Optical Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 184–87. http://dx.doi.org/10.1017/s0424820100125853.

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The spatial resolution of most of the imaging or microcharacterization methods presently in use are fundamentally limited by the wavelength of the exciting or the emitted radiation being used. In general, the smaller the wavelength of the exciting probe, the greater the structural damage to the sample under study. Thus, the requirements of minimal sample alteration and high spatial resolution seem to be at odds with one another.However, the reason for this wavelength resolution limit is due to the far field methods for producing or detecting the radiation of interest. If one does not use far field optics, but rather the method of near field imaging, the spatial resolution attainable can be much smaller than the wavelength of the radiation used. This method of near field imaging has a general applicability for all wave probes.

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20

Betzig, E., A. Harootunian, M. Isaacson, and A. Lewis. "Near-field scanning optical microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 642–43. http://dx.doi.org/10.1017/s0424820100144644.

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In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.

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21

MANSURIPUR, MASUD, LIFENG LI, and WEI-HUNG YEH. "Scanning Optical Microscopy, Part I." Optics and Photonics News 9, no. 5 (May 1, 1998): 56. http://dx.doi.org/10.1364/opn.9.5.000056.

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22

MANSURIPUR, MASUD, LIFENG LI, and WEI-HUNG YEH. "Scanning Optical Microscopy: Part 2." Optics and Photonics News 9, no. 6 (June 1, 1998): 42. http://dx.doi.org/10.1364/opn.9.6.000042.

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23

Wilson, T. "Techniques of optical scanning microscopy." Journal of Physics E: Scientific Instruments 22, no. 8 (August 1989): 532–47. http://dx.doi.org/10.1088/0022-3735/22/8/001.

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24

Wang, Lin, Qihao Song, Hongbo Zhang, Caojin Yuan, and Ting-Chung Poon. "Optical scanning Fourier ptychographic microscopy." Applied Optics 60, no. 4 (November 30, 2020): A243. http://dx.doi.org/10.1364/ao.402644.

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25

Sheppard, C. J. R. "Scanning methods in optical microscopy." Endeavour 10, no. 1 (January 1986): 17–19. http://dx.doi.org/10.1016/0160-9327(86)90045-1.

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26

Heinzelmann, H., and D. W. Pohl. "Scanning near-field optical microscopy." Applied Physics A Solids and Surfaces 59, no. 2 (August 1994): 89–101. http://dx.doi.org/10.1007/bf00332200.

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27

Chen, Xiaodong, Bin Zheng, and Hong Liu. "Optical and Digital Microscopic Imaging Techniques and Applications in Pathology." Analytical Cellular Pathology 34, no. 1-2 (2011): 5–18. http://dx.doi.org/10.1155/2011/150563.

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The conventional optical microscope has been the primary tool in assisting pathological examinations. The modern digital pathology combines the power of microscopy, electronic detection, and computerized analysis. It enables cellular-, molecular-, and genetic-imaging at high efficiency and accuracy to facilitate clinical screening and diagnosis. This paper first reviews the fundamental concepts of microscopic imaging and introduces the technical features and associated clinical applications of optical microscopes, electron microscopes, scanning tunnel microscopes, and fluorescence microscopes. The interface of microscopy with digital image acquisition methods is discussed. The recent developments and future perspectives of contemporary microscopic imaging techniques such as three-dimensional and in vivo imaging are analyzed for their clinical potentials.

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28

Moreno, Sergio, Joan Canals, Victor Moro, Nil Franch, Anna Vilà, Albert Romano-Rodriguez, Joan Daniel Prades, et al. "Pursuing the Diffraction Limit with Nano-LED Scanning Transmission Optical Microscopy." Sensors 21, no. 10 (May 11, 2021): 3305. http://dx.doi.org/10.3390/s21103305.

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Recent research into miniaturized illumination sources has prompted the development of alternative microscopy techniques. Although they are still being explored, emerging nano-light-emitting-diode (nano-LED) technologies show promise in approaching the optical resolution limit in a more feasible manner. This work presents the exploration of their capabilities with two different prototypes. In the first version, a resolution of less than 1 µm was shown thanks to a prototype based on an optically downscaled LED using an LED scanning transmission optical microscopy (STOM) technique. This research demonstrates how this technique can be used to improve STOM images by oversampling the acquisition. The second STOM-based microscope was fabricated with a 200 nm GaN LED. This demonstrates the possibilities for the miniaturization of on-chip-based microscopes.

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29

Barbara, A., T. López-Ríos, and P. Quémerais. "Near-field optical microscopy with a scanning tunneling microscope." Review of Scientific Instruments 76, no. 2 (February 2005): 023704. http://dx.doi.org/10.1063/1.1849028.

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30

Marickar, Y. M. Fazil, P. R. Lekshmi, Luxmi Varma, and Peter Koshy. "Optical microscopy versus scanning electron microscopy in urolithiasis." Urological Research 37, no. 5 (August 21, 2009): 293–97. http://dx.doi.org/10.1007/s00240-009-0211-7.

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31

Kristály, Ferenc, and László A. Gömze. "Remnants of organic pore-forming additives in conventional clay brickmaterials: Optical Microscopy and Scanning Electron Microscopy study." Epitoanyag - Journal of Silicate Based and Composite Materials 60, no. 2 (2008): 34–38. http://dx.doi.org/10.14382/epitoanyag-jsbcm.2008.7.

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32

McMillan, William. "Laser Scanning Confocal Microscopy for Materials Science." Microscopy Today 6, no. 5 (July 1998): 20–23. http://dx.doi.org/10.1017/s1551929500067791.

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Confocal microscopy has gained great popularity in biology and medical research because of the ability to image three-dimensional objects at greater resolution than conventional optical microscopes. In a typical Laser Scanning Confocal Microscope (LSCM), the specimen stage is stepped up or down to collect a series of two-dimensional images (or slices) at each focal plane. Conventional light microscopes create images with a depth of field, at high power, of 2 to 3 μm. The depth of field of confocal microscopes ranges from 0.5 to 1.5 μm, which allows information to be collected from a well defined optical section rather than from most of the specimen. Therefore, due to this “thin” focal plane, out of focus light is virtually eliminated which results in an increase in contrast, clarity and detection.

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33

Barchiesi. "Characterization of reflection scanning near-field optical microscopy and scanning tunnelling optical microscopy/photon scanning tunnelling microscopy working in preliminary approach constant height scanning mode." Journal of Microscopy 194, no. 2-3 (May 1999): 299–306. http://dx.doi.org/10.1046/j.1365-2818.1999.00566.x.

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34

Betzig, E., A. Lewis, A. Harootunian, M. Isaacson, and E. Kratschmer. "Near Field Scanning Optical Microscopy (NSOM)." Biophysical Journal 49, no. 1 (January 1986): 269–79. http://dx.doi.org/10.1016/s0006-3495(86)83640-2.

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35

Wilson, T. "Scanning optical microscopy and integrated circuits." Microelectronic Engineering 7, no. 2-4 (January 1987): 297–307. http://dx.doi.org/10.1016/s0167-9317(87)80024-2.

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36

Reddick, R. C., R. J. Warmack, and T. L. Ferrell. "New form of scanning optical microscopy." Physical Review B 39, no. 1 (January 1, 1989): 767–70. http://dx.doi.org/10.1103/physrevb.39.767.

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37

Fleischer, Monika. "Near-field scanning optical microscopy nanoprobes." Nanotechnology Reviews 1, no. 4 (August 1, 2012): 313–38. http://dx.doi.org/10.1515/ntrev-2012-0027.

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AbstractNear-field scanning optical microscopy (NSOM) is a powerful method for the optical imaging of surfaces with a resolution down to the nanometer scale. By focusing an external electromagnetic field to the subwavelength aperture or apex of a sharp tip, the diffraction limit is avoided and a near-field spot with a size on the order of the aperture or tip diameter can be created. This point light source is used for scanning a sample surface and recording the signal emitted from the small surface area that interacts with the near field of the probe. In tip-enhanced Raman spectroscopy, such a tip configuration can be used as well to record a full spectrum at each image point, from which chemically specific spectral images of the surface can be extracted. In either case, the contrast and resolution of the images depend critically on the properties of the NSOM probe used in the experiment. In this review, an overview of eligible tip properties and different approaches for tailoring specifically engineered NSOM probes is given from a fabrication point of view.

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38

Cretin, B., and P. Vairac. "Optical detection for scanning microdeformation microscopy." Applied Physics Letters 71, no. 15 (October 13, 1997): 2082–84. http://dx.doi.org/10.1063/1.119348.

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39

ITO, Shinzaburo, and Hiroyuki AOKI. "Scanning Near Field Optical Microscopy : SNOM." Journal of The Adhesion Society of Japan 41, no. 5 (2005): 170–76. http://dx.doi.org/10.11618/adhesion.41.170.

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40

Ozcan, Aydogan, Ertugrul Cubukcu, Alberto Bilenca, Kenneth B. Crozier, Brett E. Bouma, Federico Capasso, and Guillermo J. Tearney. "Differential Near-Field Scanning Optical Microscopy." Nano Letters 6, no. 11 (November 2006): 2609–16. http://dx.doi.org/10.1021/nl062110v.

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41

Lapshin, D. A., S. K. Sekatskii, V. S. Letokhov, and V. N. Reshetov. "Contact scanning near-field optical microscopy." Journal of Experimental and Theoretical Physics Letters 67, no. 4 (February 1998): 263–68. http://dx.doi.org/10.1134/1.567661.

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42

Dereux, A., C. Girard, O. J. F. Martin, and M. Devel. "Optical Binding in Scanning Probe Microscopy." Europhysics Letters (EPL) 26, no. 1 (April 1, 1994): 37–42. http://dx.doi.org/10.1209/0295-5075/26/1/007.

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43

Xie, Zhixing, Shuliang Jiao, Hao F. Zhang, and Carmen A. Puliafito. "Laser-scanning optical-resolution photoacoustic microscopy." Optics Letters 34, no. 12 (June 2, 2009): 1771. http://dx.doi.org/10.1364/ol.34.001771.

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44

SHIGEKAWA, Hidemi, Shoji YOSHIDA, and Osamu TAKEUCHI. "Optical Pump-Probe Scanning Tunneling Microscopy." Hyomen Kagaku 35, no. 12 (2014): 656–61. http://dx.doi.org/10.1380/jsssj.35.656.

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45

Roblin, G., L. Bernstein, M. Prevost, and G. Slucki. "Scanning optical microscopy applied to fluorimetry." Journal of Optics 17, no. 6 (November 1986): 259–69. http://dx.doi.org/10.1088/0150-536x/17/6/001.

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46

Nechay, B. A. "Femtosecond near-field scanning optical microscopy." Journal of Microscopy 194, no. 2-3 (May 1999): 329. http://dx.doi.org/10.1046/j.1365-2818.1999.00528.x.

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47

Pohl, D. W., U. Ch Fischer, and U. T. Dürig. "Scanning near-field optical microscopy (SNOM)." Journal of Microscopy 152, no. 3 (December 1988): 853–61. http://dx.doi.org/10.1111/j.1365-2818.1988.tb01458.x.

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48

Teulle, Alexandre, Renaud Marty, Sviatlana Viarbitskaya, Arnaud Arbouet, Erik Dujardin, Christian Girard, and Gérard Colas des Francs. "Scanning optical microscopy modeling in nanoplasmonics." Journal of the Optical Society of America B 29, no. 9 (August 21, 2012): 2431. http://dx.doi.org/10.1364/josab.29.002431.

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49

Isaacson, M. "Near-field scanning optical microscopy II." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 9, no. 6 (November 1991): 3103. http://dx.doi.org/10.1116/1.585320.

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50

Gu, Min, and C. J. R. Sheppard. "Fibre-optical confocal scanning interference microscopy." Optics Communications 100, no. 1-4 (July 1993): 79–86. http://dx.doi.org/10.1016/0030-4018(93)90560-r.

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