To see the other types of publications on this topic, follow the link: Scanning optical microscopy.
Dissertations / Theses on the topic 'Scanning optical microscopy'
Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles
Consult the top 50 dissertations / theses for your research on the topic 'Scanning optical microscopy.'
Next to every source in the list of references, there is an 'Add to bibliography' button. Press on it, and we will generate automatically the bibliographic reference to the chosen work in the citation style you need: APA, MLA, Harvard, Chicago, Vancouver, etc.
You can also download the full text of the academic publication as pdf and read online its abstract whenever available in the metadata.
Browse dissertations / theses on a wide variety of disciplines and organise your bibliography correctly.
1
Hewlett, Simon J. "Imaging strategies in scanning optical microscopy." Thesis, University of Oxford, 1991. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.302904.
Full text
2
Higdon, Paul D. "Polarisation effects in scanning optical microscopy." Thesis, University of Oxford, 1998. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.299817.
Full text
3
Tan, Juan Boon. "Image enhancement in scanning optical microscopy." Thesis, University of Oxford, 1995. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.306886.
Full text
4
McCabe, Eithne. "Scanning optical microscopy of semiconductor devices." Thesis, University of Oxford, 1987. http://ora.ox.ac.uk/objects/uuid:aec769d9-5c8a-48d6-88fe-3a1632e0888d.
Full textAbstract:
A new method to display low contrast OBIC images has been used to highlight defects in semiconductor devices. In addition an exciting novel method to obtain spatial information on the distribution of defects at the silicon/silicon-dioxide interface in metal oxide semiconductor devices has been found. This method can examine many defects which cause serious problems for device manufacturers including the effect of radiation damage on device performance. Other non-destructive techniques which can complement OBIC imaging are explored including photoluminescence and infrared transmission imaging. Additional research is proposed for the future. This research in conjunction with the research in this thesis would allow a comprehensive and powerful examination approach of both static and dynamic conditions of semiconductor devices.
5
Leong, Siang Huei. "Apertureless scanning near-field optical microscopy." Thesis, University of Cambridge, 2004. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.615953.
Full text
6
Carlini, A. R. "Imaging modes of confocal scanning microscopy." Thesis, University of Oxford, 1988. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.233485.
Full text
7
LeBlanc, Philip R. "Dual-wavelength scanning near-field optical microscopy." Thesis, McGill University, 2002. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=82911.
Full textAbstract:
A dual-wavelength Scanning Near-Field Optical Microscope was developed in order to investigate near-field contrast mechanisms as well as biological samples in air. Using a helium-cadmium laser, light of wavelengths 442 and 325 nanometers is coupled into a single mode optical fiber. The end of the probe is tapered to a sub-wavelength aperture, typically 50 nanometers, and positioned in the near-field of the sample. Light from the aperture is transmitted through the sample and detected in a confocal arrangement by two photomultiplier tubes. The microscope has a lateral topographic resolution of 10 nanometers, a vertical resolution of 0.1 nanometer and an optical resolution of 30 nanometers. Two alternate methods of producing the fiber probes, heating and pulling, or acid etching, are compared and the metal coating layer defining the aperture is discussed. So-called "shear-force" interactions between the tip and sample are used as the feedback mechanism during raster scanning of the sample. An optical and topographic sample standard was developed to calibrate the microscope and extract the ultimate resolution of the instrument. The novel use of two wavelengths enables the authentication of true near-field images, as predicted by various models, as well as the identification of scanning artifacts and the deconvolution of often highly complicated relationships between the topographical and optical images. Most importantly, the use of two wavelengths provides information on the chemical composition of the sample. Areas of a polystyrene film are detected by a significant change in the relative transmission of the two wavelengths with a resolution of 30 nanometers. As a biological application, a preliminary investigation of the composition of Black Spruce wood cell fibers was performed. Comparisons of the two optical channels reveal the expected lignin distributions in the cell wall.
8
Schilling, Bradley Wade Jr. "Three-Dimensional Fluorescence Microscopy by Optical Scanning Holography." Diss., Virginia Tech, 1997. http://hdl.handle.net/10919/29829.
Full textAbstract:
As three-dimensional (3D) imaging and fluorescence techniques become standard in optical microscopy, novel approaches to 3D fluorescence microscopy are emerging. One such approach is based on the incoherent holography technique called optical scanning holography (OSH). The main advantage of OSH-based microscopy is that only a single two-dimensional (2D) scan is required to record 3D information, whereas most current 3D microscopes rely on sectioning techniques. To acquire a 3D representation of an object, current microscopes must physically scan the specimen in a series of 2D sections along the z-axis.
In order to record holograms by OSH, the fluorescent specimen is scanned with an optically heterodyned laser field consisting of a Fresnel zone pattern. A unique acousto-optic modulator configuration is employed to generate a suitable heterodyne frequency for excitation of the fluorescent object. The optical response of a solution containing a high concentration of 15 um fluorescent latex beads to this type of excitation field has been recorded. In addition, holograms of the same beads have been recorded and reconstructed. To demonstrate the 3D imaging capability of the technique, the hologram includes beads with longitudinal separation of about 2 mm.
A detailed comparison of 3D fluorescence microscopy by OSH and the confocal approach was conducted. Areas for comparison were 3D image acquisition time, resolution limits and photobleaching. The analysis shows that an optimized OSH-based fluorescence microscope can offer improved image acquisition time with equal lateral resolution, but with degraded longitudinal resolution when compared to confocal scanning optical microscopy (CSOM). For the photobleaching investigation, the parameter of concern is the fluence received by the specimen during excitation, which takes into account both the irradiance level and the time of illumination. Both peak and average fluence levels are addressed in the comparison. The analysis shows that during a 3D image acquisition, the OSH system will deliver lower peak fluence but higher average fluence levels to the specimen when compared to CSOM.Ph. D.
9
Kohlgraf-Owens, Dana. "Optically Induced Forces in Scanning Probe Microscopy." Doctoral diss., University of Central Florida, 2013. http://digital.library.ucf.edu/cdm/ref/collection/ETD/id/5649.
Full textAbstract:
The focus of this dissertation is the study of measuring light not by energy transfer as is done with a standard photodetector such as a photographic film or charged coupled device, but rather by the forces which the light exerts on matter. In this manner we are able to replace or complement standard photodetector-based light detection techniques. One key attribute of force detection is that it permits the measurement of light over a very large range of frequencies including those which are difficult to access with standard photodetectors, such as the far IR and THz. The dissertation addresses the specific phenomena associated with optically induced force (OIF) detection in the near-field where light can be detected with high spatial resolution close to material interfaces. This is accomplished using a scanning probe microscope (SPM), which has the advantage of already having a sensitive force detector integrated into the system. The two microscopies we focus on here are atomic force microscopy (AFM) and near-field scanning optical microscopy (NSOM). By detecting surface-induced forces or force gradients applied to a very small size probe ( diameter), AFM measures the force acting on the probe as a function of the tip-sample separation or extracts topography information. Typical NSOM utilizes either a small aperture ( diameter) to collect and/or radiate light in a small volume or a small scatterer ( diameter) in order to scatter light in a very small volume. This light is then measured with an avalanche photodiode or a photomultiplier tube. These two modalities may be combined in order to simultaneously map the local intensity distribution and topography of a sample of interest. A critical assumption made when performing such a measurement is that the distance regulation, which is based on surface induced forces, and the intensity distribution are independent. In other words, it is assumed that the presence of optical fields does not influence the AFM operation. However, it is well known that light exerts forces on the matter with which it interacts. This light-induced force may affect the atomic force microscope tip-sample distance regulation mechanism or, by modifying the tip, it may also indirectly influence the distance between the probe and the surface. This dissertation will present evidence that the effect of optically induced forces is strong enough to be observed when performing typical NSOM measurements. This effect is first studied on common experimental situations to show where and how these forces manifest themselves. Afterward, several new measurement approaches are demonstrated, which take advantage of this additional information to either complement or replace standard NSOM detection. For example, the force acting on the probe can be detected while simultaneously extracting the tip-sample separation, a measurement characteristic which is typically difficult to obtain. Moreover, the standard field collection with an aperture NSOM and the measurement of optically induced forces can be operated simultaneously. Thus, complementary information about the field intensity and its gradient can be, for the first time, collected with a single probe. Finally, a new scanning probe modality, multi-frequency NSOM (MF-NSOM), will be demonstrated. In this approach, the tuning fork is driven electrically at one frequency to perform a standard tip-sample distance regulation to follow the sample topography and optically driven at another frequency to measure the optically induced force. This novel technique provides a viable alternative to standard NSOM scanning and should be of particular interest in the long wavelength regime, e.g. far IR and THz.Ph.D.
Doctorate
Optics and Photonics
Optics and Photonics
Optics
10
Hadjipanayi, Maria. "Scanning near-field optical microscopy of semiconducting nano-structures." Thesis, University of Oxford, 2006. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.442754.
Full text
11
Schneider, Susanne Christine. "Scattering Scanning Near-Field Optical Microscopy on Anisotropic Dielectrics." Doctoral thesis, Saechsische Landesbibliothek- Staats- und Universitaetsbibliothek Dresden, 2007. http://nbn-resolving.de/urn:nbn:de:swb:14-1192105974322-82865.
Full textAbstract:
Near-field optical microscopy allows the nondestructive examination of surfaces with a spatial resolution far below the diffraction limit of Abbe. In fact, the resolution of this kind of microscope is not at all dependent on the wavelength, but is typically in the range of 10 to 100 nanometers. On this scale, many materials are anisotropic, even though they might appear isotropic on the macroscopic length scale. In the present work, the previously never studied interaction between a scattering-type near-field probe and an anisotropic sample is examined theoretically as well as experimentally. In the theoretical part of the work, the analytical dipole model, which is well known for isotropic samples, is extended to anisotropic samples. On isotropic samples one observes an optical contrast between different materials, whereas on anisotropic samples one expects an additional contrast between areas with different orientations of the same dielectric tensor. The calculations show that this anisotropy contrast is strong enough to be observed if the sample is excited close to a polariton resonance. The experimental setup allows the optical examination in the visible and in the infrared wavelength regimes. For the latter, a free-electron laser was used as a precisely tunable light source for resonant excitation. The basic atomic force microscope provides a unique combination of different scanning probe microscopy methods that are indispensable in order to avoid artifacts in the measurement of the near-field signal and the resulting anisotropy contrast. Basic studies of the anisotropy contrast were performed on the ferroelectric single crystals barium titanate and lithium niobate. On lithium niobate, we examined the spectral dependence of the near-field signal close to the phonon resonance of the sample as well as its dependence on the tip-sample distance, the polarization of the incident light, and the orientation of the sample. On barium titanate, analogous measurements were performed and, additionally, areas with different types of domains were imaged and the near-field optical contrast due to the anisotropy of the sample was directly measured. The experimental results of the work agree with the theoretical predictions. A near-field optical contrast due to the anisotropy of the sample can be measured and allows areas with different orientations of the dielectric tensor to be distinguished optically. The contrast results from variations of the dielectric tensor components both parallel and perpendicular to the sample surface. The presented method allows the optical examination of anisotropies of a sample with ultrahigh resolution, and promises applications in many fields of research, such as materials science, information technology, biology, and nanoopticsDie optische Nahfeldmikroskopie ermöglicht die zerstörungsfreie optische Unter- suchung von Oberflächen mit einer räumlichen Auflösung weit unterhalb des klas- sischen Beugungslimits von Abbe. Die Auflösung dieser Art von Mikroskopie ist unabhängig von der verwendeten Wellenlänge und liegt typischerweise im Bereich von 10-100 Nanometern. Auf dieser Längenskala zeigen viele Materialien optisch anisotropes Verhalten, auch wenn sie makroskopisch isotrop erscheinen. In der vorliegenden Arbeit wird die bisher noch nicht bestimmte Wechselwirkung einer streuenden Nahfeldsonde mit einer anisotropen Probe sowohl theoretisch als auch experimentell untersucht. Im theoretischen Teil wird das für isotrope Proben bekannte analytische Dipol- modell auf anisotrope Materialien erweitert. Während fÄur isotrope Proben ein reiner Materialkontrast beobachtet wird, ist auf anisotropen Proben zusätzlich ein Kontrast zwischen Bereichen mit unterschiedlicher Orientierung des Dielektrizitätstensors zu erwarten. Die Berechnungen zeigen, dass dieser Anisotropiekontrast messbar ist, wenn die Probe nahe einer Polaritonresonanz angeregt wird. Der verwendete experimentelle Aufbau ermöglicht die optische Untersuchung von Materialien im sichtbaren sowie im infraroten Wellenlängenbereich, wobei zur re- sonanten Anregung ein Freie-Elektronen-Laser verwendet wurde. Das dem Nahfeld- mikroskop zugrunde liegende Rasterkraftmikroskop bietet eine einzigartige Kombi- nation verschiedener Rastersondenmikroskopie-Methoden und ermöglicht neben der Untersuchung von komplementären Probeneigenschaften auch die Unterdrückung von mechanisch und elektrisch induzierten Fehlkontrasten im optischen Signal. An den ferroelektrischen Einkristallen Lithiumniobat und Bariumtitanat wurde der anisotrope Nahfeldkontrast im infraroten WellenlÄangenbereich untersucht. An eindomÄanigem Lithiumniobat wurden das spektrale Verhalten des Nahfeldsignals sowie dessen charakteristische Abhängigkeit von Polarisation, Abstand und Proben- orientierung grundlegend untersucht. Auf Bariumtitanat, einem mehrdomänigen Kristall, wurden analoge Messungen durchgeführt und zusätzlich Gebiete mit ver- schiedenen Domänensorten abgebildet, wobei ein direkter nachfeldoptischer Kon- trast aufgrund der Anisotropie der Probe nachgewiesen werden konnte. Die experimentellen Ergebnisse dieser Arbeit stimmen mit den theoretischen Vorhersagen überein. Ein durch die optische Anisotropie der Probe induzierter Nahfeldkontrast ist messbar und erlaubt die optische Unterscheidung von Gebie- ten mit unterschiedlicher Orientierung des Dielektriziätstensors, wobei eine Än- derung desselben sowohl parallel als auch senkrecht zur Probenoberfläche messbar ist. Diese Methode erlaubt die hochauflösende optische Untersuchung von lokalen Anisotropien, was in zahlreichen Gebieten der Materialwissenschaft, Speichertech- nik, Biologie und Nanooptik von Interesse ist
12
Low, Chun Hong. "Near Field Scanning Optical Microscopy(NSOM) of nano devices." Thesis, Monterey, Calif. : Naval Postgraduate School, 2008. http://edocs.nps.edu/npspubs/scholarly/theses/2008/Dec/08Dec%5FLow.pdf.
Full textAbstract:
Thesis (M.S. in Combat Systems Science and Technology)--Naval Postgraduate School, December 2008.Thesis Advisor(s): Haegel, Nancy M. ; Luscombe, James. "December 2008." Description based on title screen as viewed on January 29, 2009. Sponsoring/Monitoring Agency Report Number: "DMR-0526330." Includes bibliographical references (p. 59-61). Also available in print.
13
Stevenson, Richard. "Scanning near-field optical microscopy (SNOM) of semiconductor nanostructures." Thesis, University of Cambridge, 2000. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.621756.
Full text
14
Weeks, Ann Elizabeth. "Si(111) atom-optical mirrors for scanning helium microscopy." Thesis, University of Cambridge, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.611911.
Full text
15
Chaipiboonwong, Tipsuda. "Characterising nonlinear waveguides by scanning near-field optical microscopy." Thesis, University of Southampton, 2008. https://eprints.soton.ac.uk/65528/.
Full textAbstract:
Scanning near-field optical microscopy (SNOM) has been applied to investigate the dispersion and nonlinear phenomena in a multimode Ta2O5 rectangular waveguide. Unlike the conventional approach of observing only the output spectra, the SNOM technique can collect the localised spectra from the evanescent field at various locations of the waveguide. This provides the visualisation of pulse evolution prior to the final development as the output light. The SNOM-acquired spectra consist of unique features which have not been observed before in previous nonlinear pulse propagation researches. These distinctive characteristics are attributed to the localised nature of the data and the multimode nonlinear pulse propagation. In order to understand the underlying physics of the experimental data, a numerical model simulating this SNOM visualisation has been developed. The simulation was based on the nonlinear Schrödinger equation, adapted for multimode pulses, and performed by the split-step Fourier algorithm. The spectra exhibit very fine features which can be attributed to the interference of various modes with different phase modulation owing to dispersion and nonlinear effects. Accordingly, the complexity of the spectral features increase with the propagation distance and the number of contributing modes. The multimode spectra rapidly broaden at the beginning stage of the propagation, owing to the supplementary intermodal phase modulation. Unlike the single-mode case, in which the spectral broadening caused by the self-phase modulation continuously develops along the propagation distance, the broadening process in the multimode pulse is decelerated at the later distance. This is owing to the separation of the higher-order modes and consequently the influence of the cross-phase modulation on the spectral broadening is reduced. The SNOM technique can also provide the observation of high resolution evolution of the pulse spectra. Both spectral variations along the length of the waveguide and across the waveguide are observable. Such a variation over the wavelength scale is caused by the interference of modes with different phases complexly formed by the dispersion and nonlinear effects.
16
Chrusch, Peter P. "Conventional and differential scanning optical microscopy using higher-order Gaussian-Hermite beam patterns /." Online version of thesis, 1990. http://hdl.handle.net/1850/10897.
Full text
17
Behan, Gavin Joseph. "Optical sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope." Thesis, University of Oxford, 2009. http://ora.ox.ac.uk/objects/uuid:10c7151c-ff1f-4f88-a783-9ad5cf4831ec.
Full textAbstract:
This thesis concerns the experimental application of the technique of optical sectioning in the aberration-corrected scanning transmission electron microscope (STEM). Another aim was to perform optical sectioning experiments on the still relatively new scanning confocal electron microscope (SCEM). To test the feasibility of this technique, experiments were performed on a variety of samples to measure the achievable depth response. Deconvolution methods were explored in an attempt to further improve the depth response. Finally, some of the first optical sectioning experiments were performed in the SCEM using both elastic and inelastically scattered electrons. The results showed a clear need to investigate confocal electron microscopy due to the missing cone problem for incoherent imaging in the STEM. This is particularly evident when imaging objects of greater width than the STEM probe. Confocal electron microscopy using inelastic electrons appeared to be a promising imaging mode for the future with this thesis consisting of early work in the field.
18
Xiao, Zhizhao. "Optical properties of zinc oxide nanostructure materials using near-field scanning optical microscopy /." View abstract or full-text, 2007. http://library.ust.hk/cgi/db/thesis.pl?PHYS%202007%20XIAO.
Full text
19
Froehlich, Fred Franklin. "Optical contrast mechanisms and shear force interactions in near-field scanning optical microscopy." Diss., The University of Arizona, 1996. http://hdl.handle.net/10150/187486.
Full textAbstract:
This dissertation investigates mechanisms that influence image formation in near-field scanning optical microscopy (NSOM) performed with tapered fiber aperture probes. Both the generation of optical contrast for transmission mode NSOM and the force interaction between the probe and sample that is the basis for topographic imaging by shear force microscopy (SFM) are studied. A brief introduction and review of the field of NSOM are given. The lack of understanding in the previous work of the optical and force interactions between the probe and sample is cited as the motivation for the present investigation. A theoretical model is developed that describes the linear scattering of the probe's source field by the complex transmittance of the sample. The imaging of subwavelength features is shown to arise from the spatial mixing of the evanescent waves of the probe's source field with the high spatial frequencies of the object. Calculations of the optical transfer function are presented. The shear force servo that regulates the probe-to-sample separation and facilitates the acquisition of SFM imagery is extensively analyzed. The optical detection scheme that measures the dither vibration of the probe is characterized in order to optimize the servo performance. The shear force interaction is then analyzed by modeling the probe as a simple harmonic oscillator. Measurements of the probe's resonant response while interacting with the sample reveal that the shear force is mainly frictional. The magnitude of the force is derived, and limitations on its measurement are established through analysis of the minimum detectable displacement of the probe. The servo performance is shown to be shot noise limited, as opposed to being limited by the thermal vibration noise of the probe. Experimental SFM and NSOM images of various grating structures and optical data storage materials are presented. The optical contrast mechanisms displayed in the images are identified. Linear scattering generally dominates the contrast, but some images exhibit unique near-field effects due to probe-sample interactions that lead to nonlinear imaging behavior. The origin of these interactions is the boundary conditions imposed on the probe's aperture by the sample's composition and structure.
20
Kershaw, Kevin Neil. "Development of scanning near-field optical microscopy for biological applications." Thesis, University of Leeds, 1994. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.405591.
Full text
21
Demming, Anna Linda. "Theoretical investigations into apertureless scanning near field optical microscopy systems." Thesis, King's College London (University of London), 2006. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.429644.
Full text
22
Milner, Robert George. "Scanning near field optical microscopy : aperture experiments and apertureless theory." Thesis, University of Cambridge, 2002. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.620218.
Full text
23
SHARMA, ADITI. "A NEAR FIELD SCANNING OPTICAL MICROSCOPY INVESTIGATION OF PHOTONIC STRUCTURES." University of Cincinnati / OhioLINK, 2003. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1046725704.
Full text
24
Lelaidier, Tony. "Organic semiconductor characterisation by scanning tunnelling microscopy and optical spectroscopy." Thesis, Aix-Marseille, 2016. http://www.theses.fr/2016AIXM4032/document.
Full textAbstract:
Les propriétés électroniques et d'autoassemblage de deux composés organiques, le DHTAP et le bis-pyrène, ont été étudiées par microscopie à effet tunnel (STM), sous ultra-vide et à basse température. Les propriétés optiques ont été étudiées par spectroscopie en cavité résonnante (CRD), également sous ultravide.La croissance du DHTAP a été étudiée sur différents métaux nobles. La croissance du bis-pyrène a été étudiée sur Au(111). Dans chaque cas, les conditions de température idéales pour la formation d’une première couche organisée ont été déterminées. Différents modèles sont proposés pour les structures observées en première couche. La formation de la seconde couche moléculaire à également été étudiée.L'évolution des propriétés optiques, étudié par CRD, du bis-pyrène déposé sur du verre borosilicate combinée aux informations obtenues par STM ont permit d’associer ces modifications aux interactions des moments dipolaires de transition des molécules de la première et de la seconde couche et on également permit de déterminer le mode de croissance.Finalement, la possibilité d’induire des modifications chimique de la molécule de DHTAP, intégrée dans une couche auto-assemblée, en utilisant le courant tunnel du STM a été observé. Il s’avère que la molécule de DHTAP intégrée en première couche peut subir une double déshydrogénation pour conduire à la formation d’un composé identifié comme étant le 5,7,12,14-tetraazapentacene (TAP). En seconde couche, la formation de deux radicaux, en plus du TAP, a été observé. La molécule de TAP présente un certain intérêt du fait qu’elle n’est pas synthétisable pas les méthodes conventionnelle de chimie organiqueElectronic and self-assembling properties of two organic compound, the DHTAP and the bis-pyrene, have been studied by the means of low temperature scanning tunnelling microscopy (STM) under ultrahigh vacuum conditions. Optical properties have been studied by cavity ring-down (CRD) spectroscopy, also under ultrahigh vacuum conditions.The growth of DHTAP has been studied on different metallic substrate. The growth of bis-pyrene has been studied on Au(111). In each case, the optimal temperature conditions for the formation of a well-ordered first monolayer have been determined. The formation of second monolayers has also been studied. The evolution of the optical properties, studied by CRD, of bis-pyrene deposited on borosilicate glass combined with information obtained from STM allow us to identify these modifications as interactions between transition dipole moments of molecules in the first and in the second layer, and also determine the growth mode.Finally, the possibility to induce chemical modification of DHTAP molecules embedded in an ordered monolayer using the tunnelling current of the STM has been studied. It appears that the molecule embedded in the first ML can be doubly dehydrogenated which leads to the formation of a compound identified as 5,7,12,14-tetraazapentacene (TAP). In the second layer, the formation of two radicals in addition to the TAP has been observed. The TAP molecule is interesting because of that it cannot be synthesized using common organic chemical methods
25
Morrish, Dru, and DruMorrish@gmail com. "Morphology dependent resonance of a microscope and its application in near-field scanning optical microscopy." Swinburne University of Technology. Centre for Micro-Photonics, 2005. http://adt.lib.swin.edu.au./public/adt-VSWT20051124.121838.
Full textAbstract:
In recent times, near-field optical microscopy has received increasing attention for its
ability to obtain high-resolution images beyond the diffraction limit. Near-field optical
microscopy is achieved via the positioning and manipulation of a probe on a scale less
than the wavelength of the incident light.
Despite many variations in the mechanical design of near-field optical microscopes almost all rely on direct mechanical access of a cantilever or a derivative form to probe the sample. This constricts the study to surface examinations in simple sample environments. Distance regulation between the sample surface and the delicate probe
requires its own feedback mechanism. Determination of feedback is achieved through
monitoring the shift of resonance of one arm of a 'tuning fork', which is caused by the interaction of the probes tip with the Van der Waals force. Van der Waals force emanates from atom-atom interaction at the top of the sample surface. Environmental contamination of the sample surface with additional molecules such as water makes accurate measurement of these forces particularly challenging. The near-field study of
living biological material is extremely difficult as an aqueous environment is required for its extended survival. Probe-sample interactions within an aqueous environment that
result in strong detectable signal is a challenging problem that receives considerable
attention and is a focus of this thesis.
In order to increase the detectible signal a localised field enhancement in the probing region is required. The excitation of an optically resonant probe by morphology dependent resonance (MDR) provides a strong localised field enhancement. Efficient MDR excitation requires important coupling conditions be met, of which the localisation of the incident excitation is a critical factor.
Evanescent coupling by frustrated total internal reflection to a MDR microcavity provides an ideal method for localised excitation. However it has severe drawbacks if the probe is to be manipulated in a scanning process. Tightly focusing the incident illumination by a high numerical aperture objective lens provides the degree of freedom to enable both MDR excitation and remote manipulation. Two-photon nonlinear excitation is shown to couple efficiently to MDR modes due to the high spatial localisation of the incident excitation in three-dimensions. The dependence of incident excitation localisation by high numerical aperture objective on MDR efficiency is thoroughly examined in this thesis. The excitation of MDR can be enhanced by up to 10 times with the localisation of the incident illumination from the centre of the
microcavity to its perimeter.
Illuminating through a high numerical aperture objective enables the remote noninvasive
manipulation of a microcavity probe by laser trapping. The transfer of photon momentum from the reflection and refraction of the trapping beam is sufficient enough to exert piconewtons of force on a trapped particle. This allows the particle to be held and scanned in a predictable fashion in all three-dimensions. Optical trapping
removes the need for invasive mechanical access to the sample surface and provides a means of remote distance regulation between the trapped probe and the sample. The femtosecond pulsed beam utilised in this thesis allows the simultaneous induction of two-photon excitation and laser trapping. It is found in this thesis that a MDR microcavity can be excited and translated in an efficient manner. The application of this technique to laser trapped near-field microscopy and single molecule detection is of particular interest.
Monitoring the response of the MDR signal as it is scanned over a sample object enables a near-field image to be built up. As the enhanced evanescent field from the propagation of MDR modes around a microcavity interacts with different parts of the sample, a measurable difference in energy leakage from the cavity modes occurs. The definitive spectral properties of MDR enables a multidimensional approach to imaging and sensing, a focus of this thesis. Examining the spectral modality of the MDR signal
can lead to a contrast enhancement in laser trapped imaging. Observing a single MDR mode during the scanning process can increase the image contrast by up to 1:23 times compared to that of the integrated MDR fluorescence spectrum.
The work presented in this thesis leads to the possibility of two-photon fluorescence
excitation of MDR in combination with laser trapping becoming a valuable tool in near-
field imaging, sensing and single molecule detection in vivo. It has been demonstrated
that particle scanned, two-photon fluorescence excitation of MDR, by laser trapping 'tweezers' can provide a contrast enhancement and multiple imaging modalities. The spectral imaging modality has particular benefits for image contrast enhancements.
26
Yildiz, Bilge Can. "Imaging Of Metal Surfaces Using Confocal Laser Scanning Microscopy." Master's thesis, METU, 2011. http://etd.lib.metu.edu.tr/upload/12613641/index.pdf.
Full textAbstract:
Optical imaging techniques have improved much over the last fifty years since the invention of the laser. With a high brightness source many imaging applications which were once inaccessible to researchers have now become a reality. Among these techniques, the most beneficial one is the use of lasers for both wide-field and
confocal imaging systems.
The aim of this study was to design a laser imaging system based on the concept of laser scanning confocal microscopy. Specifically the optical system was based on optical fibers allowing the user to image remote areas such as the inner surface of rifled gun barrels and/or pipes with a high degree of precision (+/- 0.01 mm). In order to build such a system, initially the theoretical foundation for a confocal as well as a wide-field imaging system was analyzed. Using this basis a free-space optical confocal system was built and analyzed. The measurements support the fact that both the objective numerical aperture and pinhole size play an important role in the radial and axial resolution of the system as well as the quality of the images obtained.
To begin construction of a confocal, optical-fiber based imaging system first an all fiber wide-field imaging system was designed and tested at a working wavelength of 1550 nm. Then an all fiber confocal system was designed at a working wavelength of 808 nm. In both cases results showed that while lateral resolution was adequate, axial resolution suffered since it was found that the design of the optical system needs to take into account under-filling of the objective lens, a result common with the use of laser beams whose divergence is not at all like that of a point source.
The work done here will aid technology that will be used in the elimination process of faulty rifling fabrication in defense industry. The reason why the confocal technique is preferred to the conventional wide-field one is the need for better resolution in all directions. Theoretical concepts and mathematical background are discussed as well as the experimental results and the practical advantages of such a system.
27
Kameni, Boumenou Christian. "Scanning probe force microscopy of III-V semiconductor structures." Thesis, Nelson Mandela University, 2017. http://hdl.handle.net/10948/13992.
Full textAbstract:
In this dissertation, cross-sectional potential imaging of GaAs-based homoepitaxial, heteroepitaxial and quantum well structures, all grown by atmospheric pressure Metal-organic Vapor Phase Epitaxy (MOVPE) is investigated. Kelvin probe force microscopy (KPFM), using amplitude modulation (AM) and frequency modulation (FM) modes in air and at room temperature, is used for the potential imaging. Studies performed on n-type GaAs homoepitaxial structures have shown two different potential profiles, related to the difference in electron density between the semi-insulating (SI) substrate and the epilayers. It is shown that the contact potential difference (CPD) between the tip and sample is higher on the semi-insulating substrate side than on the n-type epilayer side. This change in CPD across the interface has been explained by means of energy band diagrams indicating the relative Fermi level positions. In addition, it has also been found that the CPD across the interface increases with electron density. This result is in qualitative agreement with theory. In addition, as known from literature, even under ambient conditions FM mode KPFM provides better lateral resolution and more realistic CPD values than AM mode KPFM. Compared to the case of AM mode analysis, where the experimental CPD values were on average of the theoretical values, the CPD values from FM mode analysis are on average of the theoretical ones. Furthermore, by using FM mode, the transition across the interface is sharper and the surface potential flattens/saturates as expected when scanning sufficiently far away from the junction. The non-neutral space charge region of the sample with an electron density of for example, is as measured by FM-KPFM, whereas for AM-KPFM, the width is even more than and the potential profiles do not saturate. For the p-type GaAs homoepitaxial structures, FM mode measurements from a sample with a dopant density of are presented. As in the case of n-type GaAs,a similar potential profile showing two main domains has been obtained. However, unlike the case of type GaAs where the potential measured on the epilayer side is higher than that on the substrate side, the potential on the epilayer side of the junction is lower in this case due to the fact that the Fermi level of p-type GaAs is below that of the substrate.
28
Mannelquist, Anders. "Near-field scanning optical microscopy and fractal characterization with atomic force microscopy and other methods /." Luleå, 2000. http://epubl.luth.se/1402-1544/2000/40/index.html.
Full text
29
Fenwick, Oliver. "Scanning near-field optical lithography and microscopy of conjugated polymer structures." Thesis, University College London (University of London), 2007. http://discovery.ucl.ac.uk/1445444/.
Full textAbstract:
This thesis is concerned with the use of the scanning near-field optical microscope (SNOM) to pattern and image conjugated polymer structures. The SNOM is one of just a few optical instruments which are capable of breaking the diffraction limit which limits conventional microscopes to a resolution of approximately half a wavelength. It does so by directing light onto a sub-wavelength aperture at the apex of a probe, establishing a local evanescent field of subwavelength dimensions around the aperture. Conjugated polymers on the other hand are an interesting class of materials which have semiconducting properties and a rich photophysics making them suitable for use in novel light-emitting diodes, transistors and solar cells. I demonstrate direct patterning of several conjugated polymers using the SNOM with a resolution extending below 100 nm and attempt to explain the resolution of the lithography through simulations using the Bethe-Bouwkamp model of the field surrounding a sub-wavelength aperture. In particular the modelling focuses on the role of the film thickness and reflections from the substrate. Further experiments demonstrate that thermal effects which can be caused by heating of the SNOM probe do not play a role in lithography with the SNOM in this case. However, I demonstrate the use of a scanning thermal microscope to do a novel and purely thermal lithography on one of the same conjugated polymers. Resolutions of 120 nm are demonstrated, and finite element analysis is used to show that significant improvements in resolution should be possible by optimisation of the probe and the polymer film. In addition, I present simulations of imaging artefacts caused by topography on samples under SNOM investigation, and use the same model to look at the potential of the SNOM to obtain information about sub-surface objects. SNOM images are presented of blends and supramolecular fibres of conjugated polymers.
30
Gregoriev, Ross. "DEVELOPMENT OF A SILICON NANOWIRE MASK USING SCANNING PROBE MICROSCOPY." DigitalCommons@CalPoly, 2014. https://digitalcommons.calpoly.edu/theses/1283.
Full textAbstract:
Scanning probe microscopy techniques were used to investigate the desorption of hydrogen passivated silicon to form SiO2 etch masks The application of the etch masks were planned on being used to manufacture silicon nanowires. Low concentration hydrofluoric acid was used to passivate the surface. The surface was selectively depassivated by SPM techniques. Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) were used to create the masks. The STM system used was found to desorb hydrogen from the surface faster than the STM could image and was considered incapable in the configuration investigated. This led to the use of atomic force microscopy (AFM). Using a conductive tip in contact mode, lithography on the passivated surface was performed. The topography of the lithography was compared to similar works and found to be similar in size. The width was found to be 80nm and the thickness 1nm. The depassivated layers were confirmed to be oxide through electronic force microscopy (EFM). Finally, voltages were swept with the tip in contact with the surface to find the bandgap of the oxide. It was found that the voltage sweeps were severely modifying the tip along with producing inconsistent desorption thicknesses ranging from 0.2 to 12nm. Despite the results from the voltage sweeps, the lithography procedure performed using the AFM was found to be successful.
31
Esposito, Elric. "Nonlinear optical frequency conversion based soures for improved confocal laser scanning microscopy." Thesis, University of Strathclyde, 2009. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.510907.
Full text
32
Yoxall, Edward. "Applications of scattering-type scanning near-field optical microscopy in the infrared." Thesis, Imperial College London, 2013. http://hdl.handle.net/10044/1/23637.
Full textAbstract:
This thesis is split into two broad sections. These are defined by the various applications of scattering-type near-field optical microscopy (s-SNOM) in different parts of the electromagnetic spectrum; the near-infrared (700 - 1000nm) and the mid-infrared (6 - 10um). S-SNOM is a means of imaging surfaces at resolutions well below the diffraction limit - the level of recorded detail does not depend on the wavelength of light (as it does with traditional optical microscopy), but instead on the sharpness of a probe (usually around 10nm), meaning an image resolution approaching a thousandth of a wavelength in the mid-infrared. For the work presented in the near-infrared, the focus lies with the modelling and mapping of various plasmonic resonances supported by metallic nanostructures. These resonances have the ability to "squeeze" light into substantially sub-wavelength volumes which is useful for a variety of applications ranging from cancer treatments to molecular sensing. The mid-infrared section starts with the implementation of a pulsed quantum cascade laser (QCL) as the system's light source. This presents some instrumentation challenges as all s-SNOM imaging to date has been conducted with continuous-wave (CW) lasers. Using a pulsed laser also raises some significant signal-to-noise implications which are quantified and discussed. In terms of the experimental applications of such a setup, the first steps towards ultra-high resolution infrared chemical spectroscopy are made by studying the epithelial cells of an oesophageal biopsy. The thesis concludes with an examination of the major noise sources faced by s-SNOM, and makes a number of recommendations on how their effects can be mitigated.
33
Hall, Jeffrey E. "Exploring photorefractive polymer-dispersed liquid crystals using near-field scanning optical microscopy /." Search for this dissertation online, 2004. http://wwwlib.umi.com/cr/ksu/main.
Full text
34
Byrnes, Daniel P. "Scanning tunneling optical resonance microscopy applied to indium arsenide quantum dot structures /." Online version of thesis, 2009. http://hdl.handle.net/1850/11200.
Full text
35
Hill, Cory J. McGill T. C. "Investigation of spin injection and optical imaging with scanning probe microscopy techniques /." Diss., Pasadena, Calif. : California Institute of Technology, 2001. http://resolver.caltech.edu/CaltechETD:etd-12172004-153816.
Full text
36
Berry, Sam. "Ultra-high spatial and temporal resolution using Scanning Near-field Optical Microscopy." Thesis, University of Southampton, 2013. https://eprints.soton.ac.uk/348102/.
Full textAbstract:
Scanning near-field optical microscopy (SNOM) is a system that can image beyond the conventional diffraction limit. It does this by collecting the information contained within evanescent fields. This unique ability to image using evanescent fields also enables SNOM to directly measure the electric field distribution in waveguides, where light is guided by total internal reflection. When SNOM is used with a spectrally resolving detector, local temporal phenomena can be detected by analysing spectral interference in the spectra collected by the probe. This spectrally resolving configuration was used to directly measure inter-modal group velocity difference in a multimode ridge waveguide and, using the modes’ spatial profiles to experimentally determine the mode amplitude coefficient ratio. Such an ability to provide measurements on the local dispersion characteristics and relative modal amplitudes of guided light establishes SNOM as a route for investigating the conversion of current single mode photonic devices into multimode devices. The spectrally resolving SNOM system was also used to investigate the sources of temporal delays created by a quasi disordered scattering sample, which was based on John H. Conway’s pinwheel tiling. Whilst the measurements do not create a complete picture of the scattering phenomena in this work, suggestions for improvement are offered with the aim establishing spectrally resolving SNOM systems as tools for mapping localised temporal phenomena in disordered scattering systems.
37
Antognozzi, Massimo. "Investigation of the shear force contrast mechanism in transverse dynamic force microscopy." Thesis, University of Bristol, 2000. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.340356.
Full text
38
Williamson, Ricky Lawrence. "Near-field optical and shear force microscopy : instrument development, theoretical background and applications." Thesis, University of Bristol, 1995. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.296690.
Full text
39
Mehravar, SeyedSoroush, and SeyedSoroush Mehravar. "Design and Development of Compact Multiphoton Microscopes." Diss., The University of Arizona, 2016. http://hdl.handle.net/10150/621768.
Full textAbstract:
A compact multi-photon microscope (MPM) was designed and developed with the use of low-cost mode-locked fiber lasers operating at 1040nm and 1560nm. The MPM was assembled in-house and the system aberration was investigated using the optical design software: Zemax. A novel characterization methodology based on 'nonlinear knife-edge' technique was also introduced to measure the axial, lateral resolution, and the field curvature of the multi-photon microscope's image plane. The field curvature was then post-corrected using data processing in MATLAB. A customized laser scanning software based on LabVIEW was developed for data acquisition, image display and controlling peripheral electronics. Finally, different modalities of multi-photon excitation such as second- and third harmonic generation, two- and three-photon fluorescence were utilized to study a wide variety of samples from cancerous cells to 2D-layered materials.
40
Nowak, Derek Brant. "The Design of a Novel Tip Enhanced Near-field Scanning Probe Microscope for Ultra-High Resolution Optical Imaging." PDXScholar, 2010. https://pdxscholar.library.pdx.edu/open_access_etds/361.
Full textAbstract:
Traditional light microscopy suffers from the diffraction limit, which limits the spatial resolution to λ/2. The current trend in optical microscopy is the development of techniques to bypass the diffraction limit. Resolutions below 40 nm will make it possible to probe biological systems by imaging the interactions between single molecules and cell membranes. These resolutions will allow for the development of improved drug delivery mechanisms by increasing our understanding of how chemical communication within a cell occurs. The materials sciences would also benefit from these high resolutions. Nanomaterials can be analyzed with Raman spectroscopy for molecular and atomic bond information, or with fluorescence response to determine bulk optical properties with tens of nanometer resolution. Near-field optical microscopy is one of the current techniques, which allows for imaging at resolutions beyond the diffraction limit. Using a combination of a shear force microscope (SFM) and an inverted optical microscope, spectroscopic resolutions below 20 nm have been demonstrated. One technique, in particular, has been named tip enhanced near-field optical microscopy (TENOM). The key to this technique is the use of solid metal probes, which are illuminated in the far field by the excitation wavelength of interest. These probes are custom-designed using finite difference time domain (FDTD) modeling techniques, then fabricated with the use of a focused ion beam (FIB) microscope. The measure of the quality of probe design is based directly on the field enhancement obtainable. The greater the field enhancement of the probe, the more the ratio of near-field to far-field background contribution will increase. The elimination of the far-field signal by a decrease of illumination power will provide the best signal-to-noise ratio in the near-field images. Furthermore, a design that facilitates the delocalization of the near-field imaging from the far-field will be beneficial. Developed is a novel microscope design that employs two-photon non-linear excitation to allow the imaging of the fluorescence from almost any visible fluorophore at resolutions below 30 nm without changing filters or excitation wavelength. The ability of the microscope to image samples at atmospheric pressure, room temperature, and in solution makes it a very promising tool for the biological and materials science communities. The microscope demonstrates the ability to image topographical, optical, and electronic state information for single-molecule identification. A single computer, simple custom control circuits, field programmable gate array (FPGA) data acquisition, and a simplified custom optical system controls the microscope are thoroughly outlined and documented. This versatility enables the end user to custom-design experiments from confocal far-field single molecule imaging to high resolution scanning probe microscopy imaging. Presented are the current capabilities of the microscope, most importantly, high-resolution near-field images of J-aggregates with PIC dye. Single molecules of Rhodamine 6G dye and quantum dots imaged in the far-field are presented to demonstrate the sensitivity of the microscope. A comparison is made with the use of a mode-locked 50 fs pulsed laser source verses a continuous wave laser source on single molecules and J-aggregates in the near-field and far-field. Integration of an intensified CCD camera with a high-resolution monochromator allows for spectral information about the sample. The system will be disseminated as an open system design.
41
Lee, Young Mi. "Development of combined scanning electrochemical optical microscopy with shear force feedback using a tuning fork and current feedback." Access restricted to users with UT Austin EID Full text (PDF) from UMI/Dissertation Abstracts International, 2001. http://wwwlib.umi.com/cr/utexas/fullcit?p3037516.
Full text
42
Battistella, Eliana. "Towards an improved photonic force microscope: a novel technique for biological microscopy." Master's thesis, Alma Mater Studiorum - Università di Bologna, 2017. http://amslaurea.unibo.it/14864/.
Full textAbstract:
Una delle tecniche più note nello studio topografico di campioni biologici è l’AFM. Ci sono però limitazioni dovute alla presenza del cantilever, il quale pone un limite nella forza minima applicabile su un campione per ottenere un’immagine topografica. Questa forza (ordine dei 10 pN) può essere sufficiente a danneggiare il campione e a deformare i dettagli topografici che si vorrebbero evidenziare. Per superare questo problema si può usare un Photonic Force Microscope, dove il cantilever è sostituito da Optical Tweezers. Questa tecnica permette di effettuare scansioni di campioni biologici applicando forze dell’ordine dei 100 fN. All’interno della trappola ottica viene posizionata una microparticella che agisce da sonda, attraverso la quale possono essere rilevati dettagli topografici del campione. La differenza rispetto al PFM tradizionale si trova proprio nel tipo di sonda utilizzata durante la scansione. Lo standard prevede l’utilizzo di una sonda sferica, di dimensioni dell’ordine dei 100 nm mentre l’ipotesi è che si possano utilizzare delle sonde cilindriche con alla base un dettaglio acuminato che richiama la punta dell’AFM. Questo tipo di sonda consentirebbe di raggiungere una risoluzione maggiore, rispetto al PFM tradizionale, che risente del limite dato dal diametro della sfera. Due differenti setup per la PFM sono stati costruiti e testati durante questo periodo di tesi. Sono state testate diverse microparticelle cilindriche, di dimensioni differenti in termini di aspect ratio con lo scopo di osservare la stabilità di questo tipo di sonda. Nei risultati viene proposto un metodo per controllare la stabilità e l’orientazione della microparticella cilindrica all’interno della trappola ottica. Viene inoltre fatta un’ipotesi su un metodo per stimare la lunghezza della punta che dovrà essere verificata da una misura sistematica. I risultati preliminari riguardanti la scansione di strutture note suggeriscono la validità dell’uso di questo nuovo tipo di sonda.
43
Quartel, John Conrad. "A study of near-field optical imaging using an infrared microscope." Thesis, Imperial College London, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.313413.
Full text
44
López, Ayón Gabriela. "Applying a commercial atomic force microscope for scanning near-field optical microscopy techniques and investigation of Cell-cell signalling." Thesis, McGill University, 2010. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=92400.
Full textAbstract:
The field of research of this thesis is Condensed Matter Physics applied to Biology. Specifically it describes the development of different Atomic Force Microscopy techniques and tools towards the study of living cells in physiological solution. Particular interest is put into the understanding of the influence of noise in the determination of ordered liquid layers above a mica surface - as work towards the study of the role of water and ions in biological processes - and the influence of "diving bell" to boost the Q factor and allow stable imaging and force spectroscopy with tips based on Scanning Near-field Optical Microscopy [LeDue, 2010 and LeDue, 2008]. By combining SNOM techniques as a local illumination method (and thus avoiding photo bleaching of individual molecules) and high resolution AFM techniques we will be able to investigate mechano-transduction and associated signaling in living cells and individual proteins.Le domaine de recherche de cette thèse consiste en l'application de la physique de la matière condensée à la biologie. Plus précisément, ce travail décrit le développement de différentes techniques de Microscopie à Force Atomique (MFA) et d'outils permettant l'étude de cellules vivantes en solution physiologique. Un intérêt particulier est porté à la compréhension de l'influence du bruit dans la détermination de couches liquides ordonnées au-dessus d'une surface de mica - en tant que travail préalable à l'étude du rôle de l'eau et des ions dans les processus biologiques - et de l'influence d'une "cloche de plongée" pour renforcer le facteur Q ainsi que pour permettre l'imagerie stable et la spectrométrie de force avec des sondes basées sur la Microscopie Optique en Champ Proche (MOCP). En combinant des techniques MOCP, utilisées comme méthode d'éclairement local (évitant ainsi le photoblanchiment des molécules individuelles), et des techniques MFA haute résolution, nous serons capables d'investir la mécano-transduction et le signalement associé dans des cellules vivantes et dans des protéines individuelles.
45
Inglis, William. "Investigating probe-sample interactions in NSOM." Thesis, University of Nottingham, 2002. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.288999.
Full text
46
Kolb, Paul Walter. "Cryogenic near-field scanning optical microscopy : quantum dots, charge-ordered domains, and ferromagnetic nucleation /." College Park, Md. : University of Maryland, 2004. http://hdl.handle.net/1903/1497.
Full textAbstract:
Thesis (Ph. D.) -- University of Maryland, College Park, 2004.Thesis research directed by: Physics. Title from t.p. of PDF. Includes bibliographical references. Published by UMI Dissertation Services, Ann Arbor, Mich. Also available in paper.
47
Reitz, Frederick B. "Fluorescence anisotropy near-field scanning optical microscopy (FANSOM) : a new technique for biological microviscometry /." Thesis, Connect to this title online; UW restricted, 2001. http://hdl.handle.net/1773/8098.
Full text
48
Tsai, Philbert S. "All-optical histology using two photon laser scanning microscopy and ablation with ultrashort pulses /." Diss., Connect to a 24 p. preview or request complete full text in PDF format. Access restricted to UC campuses, 2004. http://wwwlib.umi.com/cr/ucsd/fullcit?p3144318.
Full text
49
Ube, Toru. "Orientation and Conformation of Single Polymer Chain Studied by Scanning Near-Field Optical Microscopy." 京都大学 (Kyoto University), 2011. http://hdl.handle.net/2433/142243.
Full text
50
Teetsov, Julie Ann. "Photophysical characterization and near-field scanning optical microscopy of dilute solutions and ordered films of alkyl-substituted polyfluorenes /." Full text (PDF) from UMI/Dissertation Abstracts International, 2000. http://wwwlib.umi.com/cr/utexas/fullcit?p3004384.
Full text