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Books on the topic 'Scanning optical microscopy'

Author: Grafiati
Published: 4 June 2021
Last updated: 15 February 2022

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1

Corle, Timothy R. Confocal scanning optical microscopy and related imaging systems. San Diego: Academic Press, 1996.

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2

Yamashita, Mikio, Hidemi Shigekawa, and Ryuji Morita, eds. Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy. Berlin/Heidelberg: Springer-Verlag, 2005. http://dx.doi.org/10.1007/b138671.

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3

Pennycook, Stephen J. Scanning Transmission Electron Microscopy: Imaging and Analysis. New York, NY: Springer Science+Business Media, LLC, 2011.

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4

Keates, Sarah E. Techniques for preparing plant tissues for optical and scanning electron microscopy. [Victoria, B.C.]: Forestry Canada, 1990.

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5

International Conference on Scanning Tunneling Microscopy/Spectroscopy (5th 1990 Baltimore, Md.). Proceedings of the Fifth International Conference on Scanning Tunneling Microscopy/Spectroscopy and the First International Conference on Nanometer Scale Science and Technology, 23-27 July 1990, Hyatt Regency, Baltimore, Maryland, USA. Edited by Colton Richard J, Marrian Christie R. K, Stroscio Joseph Anthony 1956-, American Vacuum Society, and International Conference on Nanometer Scale Science and Technology (1st : 1990 : Baltimore, Md.). New York: Published for the American Vacuum Society by the American Institute of Physics, 1991.

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6

Microcantilevers for atomic force microscope data storage. Boston, Mass: Kluwer Academic Publishers, 1998.

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7

Image formation in low-voltage scanning electron microscopy. Bellingham, Wash: SPIE Optical Engineering Press, 1993.

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8

Cheng, Shih-Tung. A scanning force microscope based on an optical interferometer detection system. Manchester: University of Manchester, 1994.

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9

Zhang, Peng. Development of a near-field scanning optical microscope and its application in studying the optical mode localization of self-affine Ag colloidal films. Ottawa: National Library of Canada = Bibliothèque nationale du Canada, 1998.

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10

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching. Springer Berlin Heidelberg, 2006. http://dx.doi.org/10.1007/978-3-540-28472-7.

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11

Kino, Gordon S., and Timothy R. Corle. Confocal Scanning Optical Microscopy and Related Imaging Systems. Academic Press, 1996.

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12

Ryuji Morita,Mikio Yamashita,Hidemi Shigekawa. Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy. Springer, 2008.

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13

Confocal Scanning Optical Microscopy and Related Imaging Systems. Elsevier, 1996. http://dx.doi.org/10.1016/b978-0-12-408750-7.x5008-3.

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14

1961-, Wiesendanger R., Güntherodt H. J. 1939-, and Baumeister W. 1946-, eds. Scanning tunneling microscopy II: Further applications and related scanning techniques. Berlin: Springer-Verlag, 1992.

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15

1961-, Wiesendanger R., Güntherodt H. J. 1939-, and Baumeister W. 1946-, eds. Scanning tunneling microscopy II: Further applications and related scanning techniques. 2nd ed. Berlin: Springer, 1995.

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16

Reimer, Ludwig. Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences). Springer, 1986.

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17

Wang, Zhong Lin, and Weilie Zhou. Scanning Microscopy for Nanotechnology: Techniques and Applications. Springer, 2010.

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18

W, Zhou, and Wang Zhong Lin, eds. Scanning microscopy for nanotechnology: Techniques and applications. New York, NY: Springer Science+Business Media, 2007.

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19

Scanning microscopy for nanotechnology: Techniques and applications. New York, NY: Springer, 2006.

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20

(Editor), H. J. Guntherodt, R. Wiesendanger (Editor), and H. J. Guentherodt (Editor), eds. Scanning Tunneling Microscopy (Springer Series in Surface Sciences). Springer-Verlag Berlin and Heidelberg GmbH & Co. K, 1992.

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21

(Editor), H. J. Guntherodt, R. Wiesendanger (Editor), and H. J. Guentherodt (Editor), eds. Scanning Tunneling Microscopy (Springer Series in Surface Sciences). Springer-Verlag Berlin and Heidelberg GmbH & Co. K, 1992.

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22

D, Batteas James, Michaels Chris A, Walker Gilbert C, and American Chemical Society. Division of Polymeric Materials: Science and Engineering, eds. Applications of scanned probe microscopy to polymers. Washington, DC: American Chemical Society, 2005.

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23

K, Sahoo N., and Bhabha Atomic Research Centre, eds. Multimode scanning probe microscopy in characterizing precision optical thin films and multilayers. Mumbai: Bhabha Atomic Research Centre, 2001.

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24

(Contributor), W. Baumeister, P. Grütter (Contributor), R. Guckenberger (Contributor), H. J. Güntherodt (Contributor), T. Hartmann (Contributor), H. Heinzelmann (Contributor), H. F. Knapp (Contributor), et al., eds. Scanning Tunneling Microscopy II: Further Applications and Related Scanning Techniques (Springer Series in Surface Sciences). 2nd ed. Springer, 1995.

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25

Applications of Scanned Probe Microscopy to Polymers (Acs Symposium Series). An American Chemical Society Publication, 2005.

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26

Morita, Ryuji, Mikio Yamashita, and Hidemi Shigekawa. Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy: Route to Femtosecond Ångstrom Technology. Springer, 2010.

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27

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (NanoScience and Technology). Springer, 2006.

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28

(Editor), M. Yamashita, H. Shigekawa (Editor), and R. Morita (Editor), eds. Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy: Route to Femtosecond Ångstrom Technology (Springer Series in Optical Sciences). Springer, 2005.

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29

1939-, Güntherodt H. J., Wiesendanger R. 1961-, and Anselmetti D, eds. Scanning tunneling microscopy I: General principles and applications to clean and adsorbate-covered surfaces. Berlin: Springer-Verlag, 1992.

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30

1939-, Güntherodt H. J., and Wiesendanger R. 1961-, eds. Scanning tunneling microscopy I: General principles and applications to clean and adsorbate-covered surfaces. 2nd ed. Berlin: Springer-Verlag, 1994.

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31

(Contributor), D. Anselmetti, R. J. Behm (Contributor), P.J.M. van Bentum (Contributor), S. Chiang (Contributor), Hans-Joachim Güntherodt (Contributor Editor), R. J. Hamers (Contributor), H. J. Hug (Contributor), et al., eds. Scanning Tunneling Microscopy I: General Principles and Applications to Clean and Absorbate-Covered Surfaces (Springer Series in Surface Sciences). 2nd ed. Springer, 1994.

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32

Krishnan, Kannan M. Principles of Materials Characterization and Metrology. Oxford University Press, 2021. http://dx.doi.org/10.1093/oso/9780198830252.001.0001.

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Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behavior (Engineering). With this focus, the book presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids, and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-solid interactions that determine or limit their use, are presented. This is followed by ion-scattering methods, optics, optical diffraction, microscopy, and ellipsometry. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals, leads to X-ray, electron, and neutron diffraction methods, both from surfaces and the bulk. Discussion of transmission and analytical electron microscopy, including recent developments, is followed by chapters on scanning electron microscopy and scanning probe microscopies. It concludes with elaborate tables to provide a convenient and easily accessible way of summarizing the key points, features, and inter-relatedness of the different spectroscopy, diffraction, and imaging techniques presented throughout. The book uniquely combines a discussion of the physical principles and practical application of these characterization techniques to explain and illustrate the fundamental properties of a wide range of materials in a tool-based approach. Based on forty years of teaching and research, and including worked examples, test your knowledge questions, and exercises, the target readership of the book is wide, for it is expected to appeal to the teaching of undergraduate and graduate students, and to post-docs, in multiple disciplines of science, engineering, biology and art conservation, and to professionals in industry.
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33

Martin, Francis L., and Hubert M. Pollock. Microspectroscopy as a tool to discriminate nanomolecular cellular alterations in biomedical research. Edited by A. V. Narlikar and Y. Y. Fu. Oxford University Press, 2017. http://dx.doi.org/10.1093/oxfordhb/9780199533053.013.8.

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This article considers the use of microspectroscopy for discriminating nanomolecular cellular alterations in biomedical research. It begins with an overview of some existing mid-infrared microspectroscopy techniques, including FTIR microspectroscopy and Raman microspectroscopy. It then discusses near-field techniques such as scanning near-field optical microscopy, near-field Raman microscopy, and photothermal microspectroscopy (PTMS). It also examines promising alternative sources of IR light, possible advantages of using normal atomic force microscopy probes, experimental procedures for PTMS, and prospects for high spatial resolution in near-field FTIR spectroscopy. Finally, it describes the spectroscopic detection of small particles, along with the use of the analysis paradigm to discriminate nanomolecular cellular alterations in biomedical research.
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34

Proceedings of the Fifth International Conference on Scanning Tunneling Microscopy/Spectroscopy and the First International Conference on Nanometer Scale ... Hyatt Regency, Baltimore, Maryland, USA. Published for the American Vacuum Society by the American Institute of Physics, 1991.

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35

Collins, Philip G. Defects and disorder in carbon nanotubes. Edited by A. V. Narlikar and Y. Y. Fu. Oxford University Press, 2017. http://dx.doi.org/10.1093/oxfordhb/9780199533053.013.2.

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This article examines the physical consequences of defects and disorder in carbon nanotubes (CNTs). It begins with a pedagogical categorization of the types of defects and disorder found in CNTs, including lattice vacancies and bond rotations, and goes on to discuss considers two primary sources of disorder: the environment surrounding a CNT and the substrate supporting it. It then considers various experimental methods for locating defects in CNTs, including atomic-resolution scanning tunnelling microscopy, transmission electron microscopy, electrochemical and chemoselective labelling, optical spectroscopy, and electrical conductance. The article concludes with a review of the long-range consequences of defects and disorder on the physical properties of CNTs such as chemical reactivity, electrical transport, and mechanical effects.
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36

Yang, Seung Yun. Imaging silver nanowire using near-field scanning optical microscope. 2001.

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37

Nagy, Noemi Zsuzsanna. Development of a hybrid near-field scanning optical chemical probe microscope. 2002, 2002.

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38

Nagy, Noémi Zsuzsanna. Development of a hybrid near-field scanning optical chemical probe microscope. 2002.

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39

Narlikar, A. V., and Y. Y. Fu, eds. Oxford Handbook of Nanoscience and Technology. Oxford University Press, 2017. http://dx.doi.org/10.1093/oxfordhb/9780199533053.001.0001.

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This Handbook presents important developments in the field of nanoscience and technology, focusing on the advances made with a host of nanomaterials including DNA and protein-based nanostructures. Topics include: optical properties of carbon nanotubes and nanographene; defects and disorder in carbon nanotubes; roles of shape and space in electronic properties of carbon nanomaterials; size-dependent phase transitions and phase reversal at the nanoscale; scanning transmission electron microscopy of nanostructures; the use of microspectroscopy to discriminate nanomolecular cellular alterations in biomedical research; holographic laser processing for three-dimensional photonic lattices; and nanoanalysis of materials using near-field Raman spectroscopy. The volume also explores new phenomena in the nanospace of single-wall carbon nanotubes; ZnO wide-bandgap semiconductor nanostructures; selective self-assembly of semi-metal straight and branched nanorods on inert substrates; nanostructured crystals and nanocrystalline zeolites; unusual properties of nanoscale ferroelectrics; structural, electronic, magnetic, and transport properties of carbon-fullerene-based polymers; fabrication and characterization of magnetic nanowires; and properties and potential of protein-DNA conjugates for analytic applications.
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40

Scheuerle, A. F., and E. Schmidt. Atlas of Laser Scanning Ophthalmoscopy. Springer, 2004.

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41

Hawkes, Peter. Advances in Imaging and Electron Physics: The Scanning Transmission Electron Microscope. Elsevier Science & Technology Books, 2009.

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42

Hirohata, A., and J. Y. Kim. Optically Induced and Detected Spin Current. Oxford University Press, 2017. http://dx.doi.org/10.1093/oso/9780198787075.003.0006.

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This chapter presents an alternative method of injecting spin-polarized electrons into a nonmagnetic semiconductor through photoexcitation. This method uses circularly-polarized light, whose energy needs to be the same as, or slightly larger than, the semiconductor band-gap, to excite spin-polarized electrons. This process will introduce a spin-polarized electron-hole pair, which can be detected as electrical signals. Such an optically induced spin-polarized current can only be generated in a direct band-gap semiconductor due to the selection rule described in the following sections. This introduction of circularly polarized light can also be used for spin-polarized scanning tunnelling microscopy.
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43

Hoy, Bennett Marylyn, Society of Photo-optical Instrumentation Engineers., and Semiconductor Equipment and Materials International., eds. Integrated circuit metrology, inspection, and process control IX: 20-22 February 1995, Santa Clara, California. Bellingham, Wash., USA: SPIE, 1995.

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44

Advances in Electronics and Electron Physics (Advances in Imaging and Electron Physics). Academic Pr, 1985.

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45

Hawkes, Peter W. Advances in Electronics and Electron Physics (Advances in Imaging and Electron Physics). Academic Press, 1990.

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46

Hawkes, Peter W. Advances in Electronics and Electron Physics (Advances in Imaging and Electron Physics). Academic Press, 1990.

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47

Hawkes, Peter W. Advances in Electronics and Electron Physics (Advances in Imaging and Electron Physics). Academic Press, 1986.

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48

Advances in Electronics and Electron Physics (Advances in Imaging and Electron Physics). Academic Press, 1991.

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49

Hawkes, Peter W. Advances in Electronics and Electron Physics (Advances in Imaging and Electron Physics). Academic Press, 1985.

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50

Hawkes, Peter W. Advances in Electronics and Electron Physics (Advances in Imaging and Electron Physics). Academic Press, 1987.

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