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Relevant bibliographies by topics / Scanning optical microscopy

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Academic literature on the topic 'Scanning optical microscopy'

Author: Grafiati

Published: 4 June 2021

Last updated: 15 February 2022

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Journal articles on the topic "Scanning optical microscopy"

1

Battistella, Florent, Steven Berger, and Andrew Mackintosh. "Scanning Optical Microscopy via a Scanning Electron Microscope." Journal of Electron Microscopy Technique 6, no. 4 (August 1987): 377–84. http://dx.doi.org/10.1002/jemt.1060060408.

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Wilson, T. "Scanning optical microscopy." Scanning 7, no. 2 (1985): 79–87. http://dx.doi.org/10.1002/sca.4950070203.

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Kino, G. S. "Scanning optical microscopy." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 8, no. 6 (November 1990): 1652. http://dx.doi.org/10.1116/1.585134.

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Wilke, V. "Optical scanning microscopy-The laser scan microscope." Scanning 7, no. 2 (1985): 88–96. http://dx.doi.org/10.1002/sca.4950070204.

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Pylkki, Russell J., Patrick J. Moyer, and Paul E. West. "Scanning Near-Field Optical Microscopy and Scanning Thermal Microscopy." Japanese Journal of Applied Physics 33, Part 1, No. 6B (June 30, 1994): 3785–90. http://dx.doi.org/10.1143/jjap.33.3785.

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Kino, Gordon S., and Timothy R. Corle. "Confocal Scanning Optical Microscopy." Physics Today 42, no. 9 (September 1989): 55–62. http://dx.doi.org/10.1063/1.881183.

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Courjon, D., K. Sarayeddine, and M. Spajer. "Scanning tunneling optical microscopy." Optics Communications 71, no. 1-2 (May 1989): 23–28. http://dx.doi.org/10.1016/0030-4018(89)90297-6.

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Vobornik, Dušan, and Slavenka Vobornik. "Scanning Near-Field Optical Microscopy." Bosnian Journal of Basic Medical Sciences 8, no. 1 (February 20, 2008): 63–71. http://dx.doi.org/10.17305/bjbms.2008.3000.

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An average human eye can see details down to 0,07 mm in size. The ability to see smaller details of the matter is correlated with the development of the science and the comprehension of the nature. Today’s science needs eyes for the nano-world. Examples are easily found in biology and medical sciences. There is a great need to determine shape, size, chemical composition, molecular structure and dynamic properties of nano-structures. To do this, microscopes with high spatial, spectral and temporal resolution are required. Scanning Near-field Optical Microscopy (SNOM) is a new step in the evolution of microscopy. The conventional, lens-based microscopes have their resolution limited by diffraction. SNOM is not subject to this limitation and can offer up to 70 times better resolution.

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Jester, J. V., H. D. Cavanagh, and M. A. Lemp. "In vivo confocal imaging of the eye using tandem scanning confocal microscopy (TSCM)." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 56–57. http://dx.doi.org/10.1017/s0424820100102365.

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New developments in optical microscopy involving confocal imaging are now becoming available which dramatically increase resolution, contrast and depth of focus by optically sectioning through structures. The transparency of the anterior ocular structures, cornea and lens, make microscopic visualization and optical sectioning of the living intact eye an interesting possibility. Of the confocal microscopes available, the Tandem Scanning Reflected Light Microscope (referred to here as the Tandem Scanning Confocal Microscope), developed by Professors Petran and Hadravsky at Charles University in Pilzen, Czechoslovakia, permits real-time image acquisition and analysis facilitating in vivo studies of ocular structures.Currently, TSCM imaging is most successful for the cornea. The corneal epithelium, stroma, and endothelium have been studied in vivo and photographed in situ. Confocal scanning images of the superficial epithelium, similar to those obtained by scanning electron microscopy, show both light and dark surface epithelial cells.

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Attota, Ravi Kiran, and Haesung Park. "Optical microscope illumination analysis using through-focus scanning optical microscopy." Optics Letters 42, no. 12 (June 12, 2017): 2306. http://dx.doi.org/10.1364/ol.42.002306.

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Dissertations / Theses on the topic "Scanning optical microscopy"

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Hewlett, Simon J. "Imaging strategies in scanning optical microscopy." Thesis, University of Oxford, 1991. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.302904.

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Higdon, Paul D. "Polarisation effects in scanning optical microscopy." Thesis, University of Oxford, 1998. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.299817.

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Tan, Juan Boon. "Image enhancement in scanning optical microscopy." Thesis, University of Oxford, 1995. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.306886.

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McCabe, Eithne. "Scanning optical microscopy of semiconductor devices." Thesis, University of Oxford, 1987. http://ora.ox.ac.uk/objects/uuid:aec769d9-5c8a-48d6-88fe-3a1632e0888d.

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A new method to display low contrast OBIC images has been used to highlight defects in semiconductor devices. In addition an exciting novel method to obtain spatial information on the distribution of defects at the silicon/silicon-dioxide interface in metal oxide semiconductor devices has been found. This method can examine many defects which cause serious problems for device manufacturers including the effect of radiation damage on device performance. Other non-destructive techniques which can complement OBIC imaging are explored including photoluminescence and infrared transmission imaging. Additional research is proposed for the future. This research in conjunction with the research in this thesis would allow a comprehensive and powerful examination approach of both static and dynamic conditions of semiconductor devices.

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Leong, Siang Huei. "Apertureless scanning near-field optical microscopy." Thesis, University of Cambridge, 2004. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.615953.

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Carlini, A. R. "Imaging modes of confocal scanning microscopy." Thesis, University of Oxford, 1988. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.233485.

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LeBlanc, Philip R. "Dual-wavelength scanning near-field optical microscopy." Thesis, McGill University, 2002. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=82911.

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A dual-wavelength Scanning Near-Field Optical Microscope was developed in order to investigate near-field contrast mechanisms as well as biological samples in air. Using a helium-cadmium laser, light of wavelengths 442 and 325 nanometers is coupled into a single mode optical fiber. The end of the probe is tapered to a sub-wavelength aperture, typically 50 nanometers, and positioned in the near-field of the sample. Light from the aperture is transmitted through the sample and detected in a confocal arrangement by two photomultiplier tubes. The microscope has a lateral topographic resolution of 10 nanometers, a vertical resolution of 0.1 nanometer and an optical resolution of 30 nanometers. Two alternate methods of producing the fiber probes, heating and pulling, or acid etching, are compared and the metal coating layer defining the aperture is discussed. So-called "shear-force" interactions between the tip and sample are used as the feedback mechanism during raster scanning of the sample. An optical and topographic sample standard was developed to calibrate the microscope and extract the ultimate resolution of the instrument. The novel use of two wavelengths enables the authentication of true near-field images, as predicted by various models, as well as the identification of scanning artifacts and the deconvolution of often highly complicated relationships between the topographical and optical images. Most importantly, the use of two wavelengths provides information on the chemical composition of the sample. Areas of a polystyrene film are detected by a significant change in the relative transmission of the two wavelengths with a resolution of 30 nanometers. As a biological application, a preliminary investigation of the composition of Black Spruce wood cell fibers was performed. Comparisons of the two optical channels reveal the expected lignin distributions in the cell wall.

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Schilling, Bradley Wade Jr. "Three-Dimensional Fluorescence Microscopy by Optical Scanning Holography." Diss., Virginia Tech, 1997. http://hdl.handle.net/10919/29829.

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As three-dimensional (3D) imaging and fluorescence techniques become standard in optical microscopy, novel approaches to 3D fluorescence microscopy are emerging. One such approach is based on the incoherent holography technique called optical scanning holography (OSH). The main advantage of OSH-based microscopy is that only a single two-dimensional (2D) scan is required to record 3D information, whereas most current 3D microscopes rely on sectioning techniques. To acquire a 3D representation of an object, current microscopes must physically scan the specimen in a series of 2D sections along the z-axis. In order to record holograms by OSH, the fluorescent specimen is scanned with an optically heterodyned laser field consisting of a Fresnel zone pattern. A unique acousto-optic modulator configuration is employed to generate a suitable heterodyne frequency for excitation of the fluorescent object. The optical response of a solution containing a high concentration of 15 um fluorescent latex beads to this type of excitation field has been recorded. In addition, holograms of the same beads have been recorded and reconstructed. To demonstrate the 3D imaging capability of the technique, the hologram includes beads with longitudinal separation of about 2 mm. A detailed comparison of 3D fluorescence microscopy by OSH and the confocal approach was conducted. Areas for comparison were 3D image acquisition time, resolution limits and photobleaching. The analysis shows that an optimized OSH-based fluorescence microscope can offer improved image acquisition time with equal lateral resolution, but with degraded longitudinal resolution when compared to confocal scanning optical microscopy (CSOM). For the photobleaching investigation, the parameter of concern is the fluence received by the specimen during excitation, which takes into account both the irradiance level and the time of illumination. Both peak and average fluence levels are addressed in the comparison. The analysis shows that during a 3D image acquisition, the OSH system will deliver lower peak fluence but higher average fluence levels to the specimen when compared to CSOM.
Ph. D.

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Kohlgraf-Owens, Dana. "Optically Induced Forces in Scanning Probe Microscopy." Doctoral diss., University of Central Florida, 2013. http://digital.library.ucf.edu/cdm/ref/collection/ETD/id/5649.

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The focus of this dissertation is the study of measuring light not by energy transfer as is done with a standard photodetector such as a photographic film or charged coupled device, but rather by the forces which the light exerts on matter. In this manner we are able to replace or complement standard photodetector-based light detection techniques. One key attribute of force detection is that it permits the measurement of light over a very large range of frequencies including those which are difficult to access with standard photodetectors, such as the far IR and THz. The dissertation addresses the specific phenomena associated with optically induced force (OIF) detection in the near-field where light can be detected with high spatial resolution close to material interfaces. This is accomplished using a scanning probe microscope (SPM), which has the advantage of already having a sensitive force detector integrated into the system. The two microscopies we focus on here are atomic force microscopy (AFM) and near-field scanning optical microscopy (NSOM). By detecting surface-induced forces or force gradients applied to a very small size probe ( diameter), AFM measures the force acting on the probe as a function of the tip-sample separation or extracts topography information. Typical NSOM utilizes either a small aperture ( diameter) to collect and/or radiate light in a small volume or a small scatterer ( diameter) in order to scatter light in a very small volume. This light is then measured with an avalanche photodiode or a photomultiplier tube. These two modalities may be combined in order to simultaneously map the local intensity distribution and topography of a sample of interest. A critical assumption made when performing such a measurement is that the distance regulation, which is based on surface induced forces, and the intensity distribution are independent. In other words, it is assumed that the presence of optical fields does not influence the AFM operation. However, it is well known that light exerts forces on the matter with which it interacts. This light-induced force may affect the atomic force microscope tip-sample distance regulation mechanism or, by modifying the tip, it may also indirectly influence the distance between the probe and the surface. This dissertation will present evidence that the effect of optically induced forces is strong enough to be observed when performing typical NSOM measurements. This effect is first studied on common experimental situations to show where and how these forces manifest themselves. Afterward, several new measurement approaches are demonstrated, which take advantage of this additional information to either complement or replace standard NSOM detection. For example, the force acting on the probe can be detected while simultaneously extracting the tip-sample separation, a measurement characteristic which is typically difficult to obtain. Moreover, the standard field collection with an aperture NSOM and the measurement of optically induced forces can be operated simultaneously. Thus, complementary information about the field intensity and its gradient can be, for the first time, collected with a single probe. Finally, a new scanning probe modality, multi-frequency NSOM (MF-NSOM), will be demonstrated. In this approach, the tuning fork is driven electrically at one frequency to perform a standard tip-sample distance regulation to follow the sample topography and optically driven at another frequency to measure the optically induced force. This novel technique provides a viable alternative to standard NSOM scanning and should be of particular interest in the long wavelength regime, e.g. far IR and THz.
Ph.D.
Doctorate
Optics and Photonics
Optics and Photonics
Optics

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Hadjipanayi, Maria. "Scanning near-field optical microscopy of semiconducting nano-structures." Thesis, University of Oxford, 2006. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.442754.

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Books on the topic "Scanning optical microscopy"

1

Corle, Timothy R. Confocal scanning optical microscopy and related imaging systems. San Diego: Academic Press, 1996.

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Yamashita, Mikio, Hidemi Shigekawa, and Ryuji Morita, eds. Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy. Berlin/Heidelberg: Springer-Verlag, 2005. http://dx.doi.org/10.1007/b138671.

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Pennycook, Stephen J. Scanning Transmission Electron Microscopy: Imaging and Analysis. New York, NY: Springer Science+Business Media, LLC, 2011.

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Keates, Sarah E. Techniques for preparing plant tissues for optical and scanning electron microscopy. [Victoria, B.C.]: Forestry Canada, 1990.

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International Conference on Scanning Tunneling Microscopy/Spectroscopy (5th 1990 Baltimore, Md.). Proceedings of the Fifth International Conference on Scanning Tunneling Microscopy/Spectroscopy and the First International Conference on Nanometer Scale Science and Technology, 23-27 July 1990, Hyatt Regency, Baltimore, Maryland, USA. Edited by Colton Richard J, Marrian Christie R. K, Stroscio Joseph Anthony 1956-, American Vacuum Society, and International Conference on Nanometer Scale Science and Technology (1st : 1990 : Baltimore, Md.). New York: Published for the American Vacuum Society by the American Institute of Physics, 1991.

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Microcantilevers for atomic force microscope data storage. Boston, Mass: Kluwer Academic Publishers, 1998.

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Image formation in low-voltage scanning electron microscopy. Bellingham, Wash: SPIE Optical Engineering Press, 1993.

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Cheng, Shih-Tung. A scanning force microscope based on an optical interferometer detection system. Manchester: University of Manchester, 1994.

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Zhang, Peng. Development of a near-field scanning optical microscope and its application in studying the optical mode localization of self-affine Ag colloidal films. Ottawa: National Library of Canada = Bibliothèque nationale du Canada, 1998.

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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching. Springer Berlin Heidelberg, 2006. http://dx.doi.org/10.1007/978-3-540-28472-7.

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Book chapters on the topic "Scanning optical microscopy"

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Fischer, U. Ch. "Scanning Near Field Optical Microscopy." In Scanning Microscopy, 76–84. Berlin, Heidelberg: Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-84810-0_5.

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Fischer, U. C. "Scanning Near-Field Optical Microscopy." In Scanning Probe Microscopy, 161–210. Berlin, Heidelberg: Springer Berlin Heidelberg, 1998. http://dx.doi.org/10.1007/978-3-662-03606-8_7.

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Sure, T. "Real-Time Confocal Scanning Microscope — An Optical Instrument with a Better Depth Resolution." In Scanning Microscopy, 167–85. Berlin, Heidelberg: Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-84810-0_11.

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Narushima, Tetsuya. "Scanning Near-Field Optical Microscopy/Near-Field Scanning Optical Microscopy." In Compendium of Surface and Interface Analysis, 577–82. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_93.

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de Fornel, Frédärique. "Scanning Tunneling Optical Microscopy." In Springer Series in Optical Sciences, 185–214. Berlin, Heidelberg: Springer Berlin Heidelberg, 2001. http://dx.doi.org/10.1007/978-3-540-48913-9_10.

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Courjon, Daniel. "Scanning Tunneling Optical Microscopy." In Scanning Tunneling Microscopy and Related Methods, 497–505. Dordrecht: Springer Netherlands, 1990. http://dx.doi.org/10.1007/978-94-015-7871-4_28.

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Pohl, D. W. "Nano-optics and Scanning Near-Field Optical Microscopy." In Scanning Tunneling Microscopy II, 233–71. Berlin, Heidelberg: Springer Berlin Heidelberg, 1995. http://dx.doi.org/10.1007/978-3-642-79366-0_7.

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Pohl, D. W. "Nano-optics and Scanning Near-Field Optical Microscopy." In Scanning Tunneling Microscopy II, 233–71. Berlin, Heidelberg: Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-97363-5_7.

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Delaney, Peter, and Martin Harris. "Fiber-Optics in Scanning Optical Microscopy." In Handbook Of Biological Confocal Microscopy, 501–15. Boston, MA: Springer US, 2006. http://dx.doi.org/10.1007/978-0-387-45524-2_26.

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Masters, Barry R. "Confocal Laser Scanning Microscopy." In Handbook of Coherent Domain Optical Methods, 895–947. New York, NY: Springer US, 2004. http://dx.doi.org/10.1007/0-387-29989-0_21.

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Conference papers on the topic "Scanning optical microscopy"

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Haegel, Nancy M., Chun-Hong Low, Lee Baird, and Goon-Hwee Ang. "Transport imaging with near-field scanning optical microscopy." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.824114.

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Chumbley, L. S., D. J. Eisenmann, M. Morris, S. Zhang, J. Craft, C. Fisher, and A. Saxton. "Use of a scanning optical profilometer for toolmark characterization." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.825185.

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Poon, Ting-Chung, Kyu B. Doh, Bradley W. Schilling, Ming H. Wu, Kazunori K. Shinoda, and Yoshiji Suzuki. "Optical scanning holographic microscopy." In IS&T/SPIE's Symposium on Electronic Imaging: Science & Technology, edited by Tony Wilson and Carol J. Cogswell. SPIE, 1995. http://dx.doi.org/10.1117/12.205342.

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Bource, Leonard J. "Scanning Laser Acoustic Microscopy." In 1984 European Conference on Optics, Optical Systems and Applications, edited by Bouwe Bolger and Hedzer A. Ferwerda. SPIE, 1985. http://dx.doi.org/10.1117/12.943770.

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Conkey, Donald B., Antonio Caravaca, and Rafael Piestun. "Backscattering Scanning Fluorescence Microscopy." In Computational Optical Sensing and Imaging. Washington, D.C.: OSA, 2011. http://dx.doi.org/10.1364/cosi.2011.ctua2.

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Kohlgraf-Owens, D. C., L. Greusard, S. Sukhov, R. Colombelli, Y. De Wilde, and A. Dogariu. "Optical Multifrequency Scanning Probe Microscopy." In Frontiers in Optics. Washington, D.C.: OSA, 2012. http://dx.doi.org/10.1364/fio.2012.fw2f.3.

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Sukharenko, Vitaly, and Roger Dorsinville. "Evanescent field scanning optical microscopy." In SPIE OPTO, edited by Michel J. F. Digonnet and Shibin Jiang. SPIE, 2014. http://dx.doi.org/10.1117/12.2035166.

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Wang, Lin, Qihao Song, Hongbo Zhang, Yu Xin, and Ting-Chung Poon. "Optical Scanning Fourier Ptychographic Microscopy." In Digital Holography and Three-Dimensional Imaging. Washington, D.C.: OSA, 2019. http://dx.doi.org/10.1364/dh.2019.w3a.10.

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Attota, Ravikiran, Ronald G. Dixson, and Andras E. Vladár. "Through-focus scanning optical microscopy." In SPIE Defense, Security, and Sensing, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, David C. Joy, and Tim K. Maugel. SPIE, 2011. http://dx.doi.org/10.1117/12.884706.

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Wang, Yuan, Werayut Srituravanich, Cheng Sun, and Xiang Zhang. "Plasmonic nearfield scanning optical microscopy." In SPIE Optics + Photonics, edited by Satoshi Kawata, Vladimir M. Shalaev, and Din Ping Tsai. SPIE, 2006. http://dx.doi.org/10.1117/12.681482.

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Reports on the topic "Scanning optical microscopy"

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Nakakura, Craig Y., and Aaron Michael Katzenmeyer. Novel Applications of Near-Field Scanning Optical Microscopy (NSOM). Office of Scientific and Technical Information (OSTI), September 2018. http://dx.doi.org/10.2172/1475250.

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Yan, M., J. McWhirter, T. Huser, and W. Siekhaus. Defect studies of optical materials using near-field scanning optical microscopy and spectroscopy. Office of Scientific and Technical Information (OSTI), January 2001. http://dx.doi.org/10.2172/15004114.

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Prabhakaran, Ramprashad, Vineet V. Joshi, Mark A. Rhodes, Alan L. Schemer-Kohrn, Anthony D. Guzman, and Curt A. Lavender. U-10Mo Sample Preparation and Examination using Optical and Scanning Electron Microscopy. Office of Scientific and Technical Information (OSTI), March 2016. http://dx.doi.org/10.2172/1339911.

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Prabhakaran, Ramprashad, Vineet V. Joshi, Mark A. Rhodes, Alan L. Schemer-Kohrn, Anthony D. Guzman, and Curt A. Lavender. U-10Mo Sample Preparation and Examination using Optical and Scanning Electron Microscopy. Office of Scientific and Technical Information (OSTI), October 2016. http://dx.doi.org/10.2172/1339912.

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Hemminger, John C. Optical Spectroscopy and Scanning Tunneling Microscopy Studies of Molecular Adsorbates and Anisotropic Ultrathin Films. Office of Scientific and Technical Information (OSTI), July 2019. http://dx.doi.org/10.2172/1542895.

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Hemminger, J. C. Optical spectroscopy and scanning tunneling microscopy studies of molecular adsorbates and anisotropic ultrathin films. Final report. Office of Scientific and Technical Information (OSTI), September 1998. http://dx.doi.org/10.2172/656637.

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Barbara, Paul F. Ultrafast Near-Field Scanning Optical Microscopy (NSOM) of Emerging Display Technology Media: Solid State Electronic Structure and Dynamics,. Fort Belvoir, VA: Defense Technical Information Center, May 1995. http://dx.doi.org/10.21236/ada294879.

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Nowak, Derek. The Design of a Novel Tip Enhanced Near-field Scanning Probe Microscope for Ultra-High Resolution Optical Imaging. Portland State University Library, January 2000. http://dx.doi.org/10.15760/etd.361.

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Lawrence, Andrew. Development of a Hybrid Atomic Force and Scanning Magneto-Optic Kerr Effect Microscope for Investigation of Magnetic Domains. Portland State University Library, January 2000. http://dx.doi.org/10.15760/etd.147.

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