Relevant bibliographies by topics / Scanning near-field microscopy / Journal articles

Journal articles on the topic 'Scanning near-field microscopy'

To see the other types of publications on this topic, follow the link: Scanning near-field microscopy.
Author: Grafiati
Published: 4 June 2021
Last updated: 1 February 2022

Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles

Select a source type:

Consult the top 50 journal articles for your research on the topic 'Scanning near-field microscopy.'

Next to every source in the list of references, there is an 'Add to bibliography' button. Press on it, and we will generate automatically the bibliographic reference to the chosen work in the citation style you need: APA, MLA, Harvard, Chicago, Vancouver, etc.

You can also download the full text of the academic publication as pdf and read online its abstract whenever available in the metadata.

Browse journal articles on a wide variety of disciplines and organise your bibliography correctly.

1

Chornii, V. "New materials for luminescent scanning near-field microscopy." Functional materials 20, no. 3 (September 25, 2013): 402–6. http://dx.doi.org/10.15407/fm20.03.402.

Full text
APA, Harvard, Vancouver, ISO, and other styles
2

Vobornik, Dušan, and Slavenka Vobornik. "Scanning Near-Field Optical Microscopy." Bosnian Journal of Basic Medical Sciences 8, no. 1 (February 20, 2008): 63–71. http://dx.doi.org/10.17305/bjbms.2008.3000.

Full text
Abstract:
An average human eye can see details down to 0,07 mm in size. The ability to see smaller details of the matter is correlated with the development of the science and the comprehension of the nature. Today’s science needs eyes for the nano-world. Examples are easily found in biology and medical sciences. There is a great need to determine shape, size, chemical composition, molecular structure and dynamic properties of nano-structures. To do this, microscopes with high spatial, spectral and temporal resolution are required. Scanning Near-field Optical Microscopy (SNOM) is a new step in the evolution of microscopy. The conventional, lens-based microscopes have their resolution limited by diffraction. SNOM is not subject to this limitation and can offer up to 70 times better resolution.
APA, Harvard, Vancouver, ISO, and other styles
3

OKAZAKI, Satoshi, and Toshihiko NAGAMURA. "Near-field Scanning Optical Microscopy." Journal of the Japan Society for Precision Engineering 57, no. 7 (1991): 1155–58. http://dx.doi.org/10.2493/jjspe.57.1155.

Full text
APA, Harvard, Vancouver, ISO, and other styles
4

Troyon, Michel, David Pastré, Jean Pierre Jouart, and Jean Louis Beaudoin. "Scanning near-field cathodoluminescence microscopy." Ultramicroscopy 75, no. 1 (October 1998): 15–21. http://dx.doi.org/10.1016/s0304-3991(98)00049-7.

Full text
APA, Harvard, Vancouver, ISO, and other styles
5

Buratto, Steven K. "Near-field scanning optical microscopy." Current Opinion in Solid State and Materials Science 1, no. 4 (August 1996): 485–92. http://dx.doi.org/10.1016/s1359-0286(96)80062-3.

Full text
APA, Harvard, Vancouver, ISO, and other styles
6

Kirstein, Stefan. "Scanning near-field optical microscopy." Current Opinion in Colloid & Interface Science 4, no. 4 (August 1999): 256–64. http://dx.doi.org/10.1016/s1359-0294(99)90005-5.

Full text
APA, Harvard, Vancouver, ISO, and other styles
7

AOKI, Hiroyuki. "Scanning Near-Field Optical Microscopy." Kobunshi 55, no. 10 (2006): 831–35. http://dx.doi.org/10.1295/kobunshi.55.831.

Full text
APA, Harvard, Vancouver, ISO, and other styles
8

Paule, E., and P. Reineker. "Scanning near field exciton microscopy." Journal of Luminescence 83-84 (November 1999): 121–26. http://dx.doi.org/10.1016/s0022-2313(99)00084-8.

Full text
APA, Harvard, Vancouver, ISO, and other styles
9

Dürig, U., D. W. Pohl, and F. Rohner. "Near‐field optical‐scanning microscopy." Journal of Applied Physics 59, no. 10 (May 15, 1986): 3318–27. http://dx.doi.org/10.1063/1.336848.

Full text
APA, Harvard, Vancouver, ISO, and other styles
10

Dunn, Robert C. "Near-Field Scanning Optical Microscopy." Chemical Reviews 99, no. 10 (October 1999): 2891–928. http://dx.doi.org/10.1021/cr980130e.

Full text
APA, Harvard, Vancouver, ISO, and other styles
11

Betzig, E., M. Isaacson, A. Lewis, and K. Lin. "Near-Field Scanning Optical Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 184–87. http://dx.doi.org/10.1017/s0424820100125853.

Full text
Abstract:
The spatial resolution of most of the imaging or microcharacterization methods presently in use are fundamentally limited by the wavelength of the exciting or the emitted radiation being used. In general, the smaller the wavelength of the exciting probe, the greater the structural damage to the sample under study. Thus, the requirements of minimal sample alteration and high spatial resolution seem to be at odds with one another.However, the reason for this wavelength resolution limit is due to the far field methods for producing or detecting the radiation of interest. If one does not use far field optics, but rather the method of near field imaging, the spatial resolution attainable can be much smaller than the wavelength of the radiation used. This method of near field imaging has a general applicability for all wave probes.
APA, Harvard, Vancouver, ISO, and other styles
12

Betzig, E., A. Harootunian, M. Isaacson, and A. Lewis. "Near-field scanning optical microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 642–43. http://dx.doi.org/10.1017/s0424820100144644.

Full text
Abstract:
In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.
APA, Harvard, Vancouver, ISO, and other styles
13

Stopka, M., E. Oesterschulze, J. Schulte, and R. Kassing. "Photothermal scanning near-field microscopy." Materials Science and Engineering: B 24, no. 1-3 (May 1994): 226–28. http://dx.doi.org/10.1016/0921-5107(94)90333-6.

Full text
APA, Harvard, Vancouver, ISO, and other styles
14

G�nther, P., U. Ch Fischer, and K. Dransfeld. "Scanning near-field acoustic microscopy." Applied Physics B Photophysics and Laser Chemistry 48, no. 1 (January 1989): 89–92. http://dx.doi.org/10.1007/bf00694423.

Full text
APA, Harvard, Vancouver, ISO, and other styles
15

Heinzelmann, H., and D. W. Pohl. "Scanning near-field optical microscopy." Applied Physics A Solids and Surfaces 59, no. 2 (August 1994): 89–101. http://dx.doi.org/10.1007/bf00332200.

Full text
APA, Harvard, Vancouver, ISO, and other styles
16

Vincent, Tom. "Scanning near-field infrared microscopy." Nature Reviews Physics 3, no. 8 (June 1, 2021): 537. http://dx.doi.org/10.1038/s42254-021-00337-y.

Full text
APA, Harvard, Vancouver, ISO, and other styles
17

Pylkki, Russell J., Patrick J. Moyer, and Paul E. West. "Scanning Near-Field Optical Microscopy and Scanning Thermal Microscopy." Japanese Journal of Applied Physics 33, Part 1, No. 6B (June 30, 1994): 3785–90. http://dx.doi.org/10.1143/jjap.33.3785.

Full text
APA, Harvard, Vancouver, ISO, and other styles
18

Bouhelier, Alexandre. "Field-enhanced scanning near-field optical microscopy." Microscopy Research and Technique 69, no. 7 (2006): 563–79. http://dx.doi.org/10.1002/jemt.20328.

Full text
APA, Harvard, Vancouver, ISO, and other styles
19

Betzig, E., A. Lewis, A. Harootunian, M. Isaacson, and E. Kratschmer. "Near Field Scanning Optical Microscopy (NSOM)." Biophysical Journal 49, no. 1 (January 1986): 269–79. http://dx.doi.org/10.1016/s0006-3495(86)83640-2.

Full text
APA, Harvard, Vancouver, ISO, and other styles
20

Fleischer, Monika. "Near-field scanning optical microscopy nanoprobes." Nanotechnology Reviews 1, no. 4 (August 1, 2012): 313–38. http://dx.doi.org/10.1515/ntrev-2012-0027.

Full text
Abstract:
AbstractNear-field scanning optical microscopy (NSOM) is a powerful method for the optical imaging of surfaces with a resolution down to the nanometer scale. By focusing an external electromagnetic field to the subwavelength aperture or apex of a sharp tip, the diffraction limit is avoided and a near-field spot with a size on the order of the aperture or tip diameter can be created. This point light source is used for scanning a sample surface and recording the signal emitted from the small surface area that interacts with the near field of the probe. In tip-enhanced Raman spectroscopy, such a tip configuration can be used as well to record a full spectrum at each image point, from which chemically specific spectral images of the surface can be extracted. In either case, the contrast and resolution of the images depend critically on the properties of the NSOM probe used in the experiment. In this review, an overview of eligible tip properties and different approaches for tailoring specifically engineered NSOM probes is given from a fabrication point of view.
APA, Harvard, Vancouver, ISO, and other styles
21

Bründermann, Erik, and Martina Havenith. "SNIM: Scanning near-field infrared microscopy." Annual Reports Section "C" (Physical Chemistry) 104 (2008): 235. http://dx.doi.org/10.1039/b703982b.

Full text
APA, Harvard, Vancouver, ISO, and other styles
22

Sáenz, Juan José, and Ricardo García. "Near field emission scanning tunneling microscopy." Applied Physics Letters 65, no. 23 (December 5, 1994): 3022–24. http://dx.doi.org/10.1063/1.112496.

Full text
APA, Harvard, Vancouver, ISO, and other styles
23

ITO, Shinzaburo, and Hiroyuki AOKI. "Scanning Near Field Optical Microscopy : SNOM." Journal of The Adhesion Society of Japan 41, no. 5 (2005): 170–76. http://dx.doi.org/10.11618/adhesion.41.170.

Full text
APA, Harvard, Vancouver, ISO, and other styles
24

Schultz, Sheldon. "Near-field plasmon-resonance scanning microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 48–49. http://dx.doi.org/10.1017/s0424820100136611.

Full text
Abstract:
In the past few years the field of near-field scanning optical microscopy (NSOM) has developed rapidly with applications spanning all the physical sciences. A key goal of this form of microscopy is to obtain resolution at levels well beyond those possible with the usual far-field optics. In contrast to far-field optics, which is bounded by the well known limits imposed by diffraction, near-field optics has no "in principle" fundamental lower limit in lateral size, at least down to atomic dimensions, although in practice, signal-to-noise considerations may restrict the application of NSOM to a few nanometers.The simplest form of NSOM to visualize is based on the principle of a sub-wavelength aperture (with D/λ < < 1) in an opaque plane. Light impinging on this aperture may only be transmitted through the diameter D, and, indeed, were it observed in the far-field, would be spread out over the entire half space due to diffraction. However, if the sample to be studied is placed in the near-field of the aperture, say within a distance D away, the region illuminated will also be restricted to a lateral dimension very close to D.
APA, Harvard, Vancouver, ISO, and other styles
25

Ozcan, Aydogan, Ertugrul Cubukcu, Alberto Bilenca, Kenneth B. Crozier, Brett E. Bouma, Federico Capasso, and Guillermo J. Tearney. "Differential Near-Field Scanning Optical Microscopy." Nano Letters 6, no. 11 (November 2006): 2609–16. http://dx.doi.org/10.1021/nl062110v.

Full text
APA, Harvard, Vancouver, ISO, and other styles
26

Schultz, Sheldon. "Near-Field Plasmon-Resonance Scanning Microscopy." Microscopy Today 3, no. 8 (October 1995): 3–4. http://dx.doi.org/10.1017/s1551929500062842.

Full text
Abstract:
In the past few years the field of near-field scanning optical microscopy (NSOM) has developed rapidly with applications spanning all the physical sciences. A key goal of this form of microscopy is to obtain resolution at levels well beyond those possible with the usual far-field optics. In contrast to far-field optics, which is bounded by the well known limits imposed by diffraction, near-field optics has no “in principle” fundamental lower limit in lateral size, at least down to atomic dimensions, although in practice, signal-to-noise considerations may restrict the application of NSOM to a few nanometers.
APA, Harvard, Vancouver, ISO, and other styles
27

Lapshin, D. A., S. K. Sekatskii, V. S. Letokhov, and V. N. Reshetov. "Contact scanning near-field optical microscopy." Journal of Experimental and Theoretical Physics Letters 67, no. 4 (February 1998): 263–68. http://dx.doi.org/10.1134/1.567661.

Full text
APA, Harvard, Vancouver, ISO, and other styles
28

Kirk, T. L., U. Ramsperger, and D. Pescia. "Near field emission scanning electron microscopy." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 27, no. 1 (2009): 152. http://dx.doi.org/10.1116/1.3071849.

Full text
APA, Harvard, Vancouver, ISO, and other styles
29

Nechay, B. A. "Femtosecond near-field scanning optical microscopy." Journal of Microscopy 194, no. 2-3 (May 1999): 329. http://dx.doi.org/10.1046/j.1365-2818.1999.00528.x.

Full text
APA, Harvard, Vancouver, ISO, and other styles
30

Pohl, D. W., U. Ch Fischer, and U. T. Dürig. "Scanning near-field optical microscopy (SNOM)." Journal of Microscopy 152, no. 3 (December 1988): 853–61. http://dx.doi.org/10.1111/j.1365-2818.1988.tb01458.x.

Full text
APA, Harvard, Vancouver, ISO, and other styles
31

Isaacson, M. "Near-field scanning optical microscopy II." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 9, no. 6 (November 1991): 3103. http://dx.doi.org/10.1116/1.585320.

Full text
APA, Harvard, Vancouver, ISO, and other styles
32

Cricenti, A. "Scanning near-field optical microscopy (SNOM)." physica status solidi (c) 5, no. 8 (June 2008): 2615–20. http://dx.doi.org/10.1002/pssc.200779106.

Full text
APA, Harvard, Vancouver, ISO, and other styles
33

Barbara, A., T. López-Ríos, and P. Quémerais. "Near-field optical microscopy with a scanning tunneling microscope." Review of Scientific Instruments 76, no. 2 (February 2005): 023704. http://dx.doi.org/10.1063/1.1849028.

Full text
APA, Harvard, Vancouver, ISO, and other styles
34

Betzig, E., M. Isaacson, H. Barshatzky, K. Lin, and A. Lewis. "Progress in near-field scanning optical microscopy (NSOM)." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 436–37. http://dx.doi.org/10.1017/s0424820100104248.

Full text
Abstract:
The concept of near field scanning optical microscopy was first described more than thirty years ago1 almost two decades before the validity of the technique was verified experimentally for electromagnetic radiation of 3cm wavelength.2 The extension of the method to the visible region of the spectrum took another decade since it required the development of micropositioning and aperture fabrication on a scale five orders of magnitude smaller than that used for the microwave experiments. Since initial reports on near field optical imaging8-6, there has been a growing effort by ourselves6 and other groups7 to extend the technology and develop the near field scanning optical microscope (NSOM) into a useful tool to complement conventional (i.e., far field) scanning optical microscopy (SOM), scanning electron microscopy (SEM) and scanning tunneling microscopy. In the context of this symposium on “Microscopy Without Lenses”, NSOM can be thought of as an addition to the exploding field of scanned tip microscopy although we did not originally conceive it as such.
APA, Harvard, Vancouver, ISO, and other styles
35

Labouesse, Simon, Samuel C. Johnson, Hans A. Bechtel, Markus B. Raschke, and Rafael Piestun. "Smart Scattering Scanning Near-Field Optical Microscopy." ACS Photonics 7, no. 12 (November 12, 2020): 3346–52. http://dx.doi.org/10.1021/acsphotonics.0c00553.

Full text
APA, Harvard, Vancouver, ISO, and other styles
36

Shiku, Hitoshi, and Robert C. Dunn. "Peer Reviewed: Near-Field Scanning Optical Microscopy." Analytical Chemistry 71, no. 1 (January 1999): 23A—29A. http://dx.doi.org/10.1021/ac9900984.

Full text
APA, Harvard, Vancouver, ISO, and other styles
37

Jenei, Attila, Achim K. Kirsch, Vinod Subramaniam, Donna J. Arndt-Jovin, and Thomas M. Jovin. "Picosecond Multiphoton Scanning Near-Field Optical Microscopy." Biophysical Journal 76, no. 2 (February 1999): 1092–100. http://dx.doi.org/10.1016/s0006-3495(99)77274-7.

Full text
APA, Harvard, Vancouver, ISO, and other styles
38

Rücker, M., F. C. De Schryver, P. Vanoppen, K. Jeuris, S. De Feyter, J. Hotta, and H. Masuhara. "Near-field scanning optical microscopy and polymers." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 131, no. 1-4 (August 1997): 30–37. http://dx.doi.org/10.1016/s0168-583x(97)00191-2.

Full text
APA, Harvard, Vancouver, ISO, and other styles
39

Wei, P. K., and W. S. Fann. "Large scanning area near field optical microscopy." Review of Scientific Instruments 69, no. 10 (October 1998): 3614–17. http://dx.doi.org/10.1063/1.1149147.

Full text
APA, Harvard, Vancouver, ISO, and other styles
40

Zayats, Anatoly V., and Vahid Sandoghdar. "Apertureless scanning near-field second-harmonic microscopy." Optics Communications 178, no. 1-3 (May 2000): 245–49. http://dx.doi.org/10.1016/s0030-4018(00)00655-6.

Full text
APA, Harvard, Vancouver, ISO, and other styles
41

Pastré, D., J. L. Bubendorff, and M. Troyon. "Resolution in scanning near-field cathodoluminescence microscopy." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 18, no. 3 (2000): 1138. http://dx.doi.org/10.1116/1.591349.

Full text
APA, Harvard, Vancouver, ISO, and other styles
42

Bukofsky, S. J., and R. D. Grober. "Video rate near-field scanning optical microscopy." Applied Physics Letters 71, no. 19 (November 10, 1997): 2749–51. http://dx.doi.org/10.1063/1.120123.

Full text
APA, Harvard, Vancouver, ISO, and other styles
43

Kohlgraf-Owens, Dana C., Léo Greusard, Sergey Sukhov, Yannick De Wilde, and Aristide Dogariu. "Multi-frequency near-field scanning optical microscopy." Nanotechnology 25, no. 3 (December 17, 2013): 035203. http://dx.doi.org/10.1088/0957-4484/25/3/035203.

Full text
APA, Harvard, Vancouver, ISO, and other styles
44

Nozokido, Tatsuo, Ryohei Iibuchi, Jongsuck Bae, Koji Mizuno, and Hiroyuki Kudo. "Millimeter-wave scanning near-field anisotropy microscopy." Review of Scientific Instruments 76, no. 3 (March 2005): 033702. http://dx.doi.org/10.1063/1.1866255.

Full text
APA, Harvard, Vancouver, ISO, and other styles
45

Bohm, C., J. Bangert, W. Mertin, and E. Kubalek. "Time resolved near-field scanning optical microscopy." Journal of Physics D: Applied Physics 27, no. 10 (October 14, 1994): 2237–40. http://dx.doi.org/10.1088/0022-3727/27/10/038.

Full text
APA, Harvard, Vancouver, ISO, and other styles
46

Dearo, Jessie A., Kenneth D. Weston, and Steven K. Buratto. "Near-field scanning optical microscopy of nanostructures." Phase Transitions 68, no. 1 (February 1999): 27–57. http://dx.doi.org/10.1080/01411599908224514.

Full text
APA, Harvard, Vancouver, ISO, and other styles
47

Kryukov, A. E., Y. K. Kim, and J. B. Ketterson. "Surface plasmon scanning near-field optical microscopy." Journal of Applied Physics 82, no. 11 (December 1997): 5411–15. http://dx.doi.org/10.1063/1.365568.

Full text
APA, Harvard, Vancouver, ISO, and other styles
48

Chiu, Chui-Min, Hung-Wen Chen, Yu-Ru Huang, Yuh-Jing Hwang, Wen-Jeng Lee, Hsin-Yi Huang, and Chi-Kuang Sun. "All-terahertz fiber-scanning near-field microscopy." Optics Letters 34, no. 7 (March 27, 2009): 1084. http://dx.doi.org/10.1364/ol.34.001084.

Full text
APA, Harvard, Vancouver, ISO, and other styles
49

Sekatskii, S. K., G. T. Shubeita, and G. Dietler. "Time-gated scanning near-field optical microscopy." Applied Physics Letters 77, no. 14 (October 2, 2000): 2089–91. http://dx.doi.org/10.1063/1.1314287.

Full text
APA, Harvard, Vancouver, ISO, and other styles
50

Dunn, Robert C. "ChemInform Abstract: Near-Field Scanning Optical Microscopy." ChemInform 30, no. 50 (June 12, 2010): no. http://dx.doi.org/10.1002/chin.199950294.

Full text
APA, Harvard, Vancouver, ISO, and other styles
You might also be interested in the bibliographies on the topic 'Scanning near-field microscopy' for other source types:
Dissertations / Theses
We offer discounts on all premium plans for authors whose works are included in thematic literature selections. Contact us to get a unique promo code!

To the bibliography