Dissertations / Theses on the topic 'Scanning near-field microscopy'
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Leong, Siang Huei. "Apertureless scanning near-field optical microscopy." Thesis, University of Cambridge, 2004. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.615953.
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LeBlanc, Philip R. "Dual-wavelength scanning near-field optical microscopy." Thesis, McGill University, 2002. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=82911.
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A dual-wavelength Scanning Near-Field Optical Microscope was developed in order to investigate near-field contrast mechanisms as well as biological samples in air. Using a helium-cadmium laser, light of wavelengths 442 and 325 nanometers is coupled into a single mode optical fiber. The end of the probe is tapered to a sub-wavelength aperture, typically 50 nanometers, and positioned in the near-field of the sample. Light from the aperture is transmitted through the sample and detected in a confocal arrangement by two photomultiplier tubes. The microscope has a lateral topographic resolution of 10 nanometers, a vertical resolution of 0.1 nanometer and an optical resolution of 30 nanometers. Two alternate methods of producing the fiber probes, heating and pulling, or acid etching, are compared and the metal coating layer defining the aperture is discussed. So-called "shear-force" interactions between the tip and sample are used as the feedback mechanism during raster scanning of the sample. An optical and topographic sample standard was developed to calibrate the microscope and extract the ultimate resolution of the instrument. The novel use of two wavelengths enables the authentication of true near-field images, as predicted by various models, as well as the identification of scanning artifacts and the deconvolution of often highly complicated relationships between the topographical and optical images. Most importantly, the use of two wavelengths provides information on the chemical composition of the sample. Areas of a polystyrene film are detected by a significant change in the relative transmission of the two wavelengths with a resolution of 30 nanometers. As a biological application, a preliminary investigation of the composition of Black Spruce wood cell fibers was performed. Comparisons of the two optical channels reveal the expected lignin distributions in the cell wall.
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Thoma, Arne [Verfasser]. "Apertureless Scanning Terahertz Near Field Microscopy / Arne Thoma." München : Verlag Dr. Hut, 2011. http://d-nb.info/1011442043/34.
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Hadjipanayi, Maria. "Scanning near-field optical microscopy of semiconducting nano-structures." Thesis, University of Oxford, 2006. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.442754.
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Schneider, Susanne Christine. "Scattering Scanning Near-Field Optical Microscopy on Anisotropic Dielectrics." Doctoral thesis, Saechsische Landesbibliothek- Staats- und Universitaetsbibliothek Dresden, 2007. http://nbn-resolving.de/urn:nbn:de:swb:14-1192105974322-82865.
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Near-field optical microscopy allows the nondestructive examination of surfaces with a spatial resolution far below the diffraction limit of Abbe. In fact, the resolution of this kind of microscope is not at all dependent on the wavelength, but is typically in the range of 10 to 100 nanometers. On this scale, many materials are anisotropic, even though they might appear isotropic on the macroscopic length scale. In the present work, the previously never studied interaction between a scattering-type near-field probe and an anisotropic sample is examined theoretically as well as experimentally. In the theoretical part of the work, the analytical dipole model, which is well known for isotropic samples, is extended to anisotropic samples. On isotropic samples one observes an optical contrast between different materials, whereas on anisotropic samples one expects an additional contrast between areas with different orientations of the same dielectric tensor. The calculations show that this anisotropy contrast is strong enough to be observed if the sample is excited close to a polariton resonance. The experimental setup allows the optical examination in the visible and in the infrared wavelength regimes. For the latter, a free-electron laser was used as a precisely tunable light source for resonant excitation. The basic atomic force microscope provides a unique combination of different scanning probe microscopy methods that are indispensable in order to avoid artifacts in the measurement of the near-field signal and the resulting anisotropy contrast. Basic studies of the anisotropy contrast were performed on the ferroelectric single crystals barium titanate and lithium niobate. On lithium niobate, we examined the spectral dependence of the near-field signal close to the phonon resonance of the sample as well as its dependence on the tip-sample distance, the polarization of the incident light, and the orientation of the sample. On barium titanate, analogous measurements were performed and, additionally, areas with different types of domains were imaged and the near-field optical contrast due to the anisotropy of the sample was directly measured. The experimental results of the work agree with the theoretical predictions. A near-field optical contrast due to the anisotropy of the sample can be measured and allows areas with different orientations of the dielectric tensor to be distinguished optically. The contrast results from variations of the dielectric tensor components both parallel and perpendicular to the sample surface. The presented method allows the optical examination of anisotropies of a sample with ultrahigh resolution, and promises applications in many fields of research, such as materials science, information technology, biology, and nanoopticsDie optische Nahfeldmikroskopie ermöglicht die zerstörungsfreie optische Unter- suchung von Oberflächen mit einer räumlichen Auflösung weit unterhalb des klas- sischen Beugungslimits von Abbe. Die Auflösung dieser Art von Mikroskopie ist unabhängig von der verwendeten Wellenlänge und liegt typischerweise im Bereich von 10-100 Nanometern. Auf dieser Längenskala zeigen viele Materialien optisch anisotropes Verhalten, auch wenn sie makroskopisch isotrop erscheinen. In der vorliegenden Arbeit wird die bisher noch nicht bestimmte Wechselwirkung einer streuenden Nahfeldsonde mit einer anisotropen Probe sowohl theoretisch als auch experimentell untersucht. Im theoretischen Teil wird das für isotrope Proben bekannte analytische Dipol- modell auf anisotrope Materialien erweitert. Während fÄur isotrope Proben ein reiner Materialkontrast beobachtet wird, ist auf anisotropen Proben zusätzlich ein Kontrast zwischen Bereichen mit unterschiedlicher Orientierung des Dielektrizitätstensors zu erwarten. Die Berechnungen zeigen, dass dieser Anisotropiekontrast messbar ist, wenn die Probe nahe einer Polaritonresonanz angeregt wird. Der verwendete experimentelle Aufbau ermöglicht die optische Untersuchung von Materialien im sichtbaren sowie im infraroten Wellenlängenbereich, wobei zur re- sonanten Anregung ein Freie-Elektronen-Laser verwendet wurde. Das dem Nahfeld- mikroskop zugrunde liegende Rasterkraftmikroskop bietet eine einzigartige Kombi- nation verschiedener Rastersondenmikroskopie-Methoden und ermöglicht neben der Untersuchung von komplementären Probeneigenschaften auch die Unterdrückung von mechanisch und elektrisch induzierten Fehlkontrasten im optischen Signal. An den ferroelektrischen Einkristallen Lithiumniobat und Bariumtitanat wurde der anisotrope Nahfeldkontrast im infraroten WellenlÄangenbereich untersucht. An eindomÄanigem Lithiumniobat wurden das spektrale Verhalten des Nahfeldsignals sowie dessen charakteristische Abhängigkeit von Polarisation, Abstand und Proben- orientierung grundlegend untersucht. Auf Bariumtitanat, einem mehrdomänigen Kristall, wurden analoge Messungen durchgeführt und zusätzlich Gebiete mit ver- schiedenen Domänensorten abgebildet, wobei ein direkter nachfeldoptischer Kon- trast aufgrund der Anisotropie der Probe nachgewiesen werden konnte. Die experimentellen Ergebnisse dieser Arbeit stimmen mit den theoretischen Vorhersagen überein. Ein durch die optische Anisotropie der Probe induzierter Nahfeldkontrast ist messbar und erlaubt die optische Unterscheidung von Gebie- ten mit unterschiedlicher Orientierung des Dielektriziätstensors, wobei eine Än- derung desselben sowohl parallel als auch senkrecht zur Probenoberfläche messbar ist. Diese Methode erlaubt die hochauflösende optische Untersuchung von lokalen Anisotropien, was in zahlreichen Gebieten der Materialwissenschaft, Speichertech- nik, Biologie und Nanooptik von Interesse ist
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Low, Chun Hong. "Near Field Scanning Optical Microscopy(NSOM) of nano devices." Thesis, Monterey, Calif. : Naval Postgraduate School, 2008. http://edocs.nps.edu/npspubs/scholarly/theses/2008/Dec/08Dec%5FLow.pdf.
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Thesis (M.S. in Combat Systems Science and Technology)--Naval Postgraduate School, December 2008.Thesis Advisor(s): Haegel, Nancy M. ; Luscombe, James. "December 2008." Description based on title screen as viewed on January 29, 2009. Sponsoring/Monitoring Agency Report Number: "DMR-0526330." Includes bibliographical references (p. 59-61). Also available in print.
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Stevenson, Richard. "Scanning near-field optical microscopy (SNOM) of semiconductor nanostructures." Thesis, University of Cambridge, 2000. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.621756.
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Chaipiboonwong, Tipsuda. "Characterising nonlinear waveguides by scanning near-field optical microscopy." Thesis, University of Southampton, 2008. https://eprints.soton.ac.uk/65528/.
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Scanning near-field optical microscopy (SNOM) has been applied to investigate the dispersion and nonlinear phenomena in a multimode Ta2O5 rectangular waveguide. Unlike the conventional approach of observing only the output spectra, the SNOM technique can collect the localised spectra from the evanescent field at various locations of the waveguide. This provides the visualisation of pulse evolution prior to the final development as the output light. The SNOM-acquired spectra consist of unique features which have not been observed before in previous nonlinear pulse propagation researches. These distinctive characteristics are attributed to the localised nature of the data and the multimode nonlinear pulse propagation. In order to understand the underlying physics of the experimental data, a numerical model simulating this SNOM visualisation has been developed. The simulation was based on the nonlinear Schrödinger equation, adapted for multimode pulses, and performed by the split-step Fourier algorithm. The spectra exhibit very fine features which can be attributed to the interference of various modes with different phase modulation owing to dispersion and nonlinear effects. Accordingly, the complexity of the spectral features increase with the propagation distance and the number of contributing modes. The multimode spectra rapidly broaden at the beginning stage of the propagation, owing to the supplementary intermodal phase modulation. Unlike the single-mode case, in which the spectral broadening caused by the self-phase modulation continuously develops along the propagation distance, the broadening process in the multimode pulse is decelerated at the later distance. This is owing to the separation of the higher-order modes and consequently the influence of the cross-phase modulation on the spectral broadening is reduced. The SNOM technique can also provide the observation of high resolution evolution of the pulse spectra. Both spectral variations along the length of the waveguide and across the waveguide are observable. Such a variation over the wavelength scale is caused by the interference of modes with different phases complexly formed by the dispersion and nonlinear effects.
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Kershaw, Kevin Neil. "Development of scanning near-field optical microscopy for biological applications." Thesis, University of Leeds, 1994. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.405591.
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Demming, Anna Linda. "Theoretical investigations into apertureless scanning near field optical microscopy systems." Thesis, King's College London (University of London), 2006. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.429644.
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Milner, Robert George. "Scanning near field optical microscopy : aperture experiments and apertureless theory." Thesis, University of Cambridge, 2002. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.620218.
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SHARMA, ADITI. "A NEAR FIELD SCANNING OPTICAL MICROSCOPY INVESTIGATION OF PHOTONIC STRUCTURES." University of Cincinnati / OhioLINK, 2003. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1046725704.
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Jacob, Rainer. "Scanning near-field infrared microspectroscopy on semiconductor structures." Helmholtz-Zentrum Dresden-Rossendorf, 2012. http://nbn-resolving.de/urn:nbn:de:bsz:d120-qucosa-85330.
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Near-field optical microscopy has attracted remarkable attention, as it is the only technique that allows the investigation of local optical properties with a resolution far below the diffraction limit. Especially, the scattering-type near-field optical microscopy allows the nondestructive examination of surfaces without restrictions to the applicable wavelengths. However, its usability is limited by the availability of appropriate light sources. In the context of this work, this limit was overcome by the development of a scattering-type near-field microscope that uses a widely tunable free-electron laser as primary light source.
In the theoretical part, it is shown that an optical near-field contrast can be expected when materials with different dielectric functions are combined. It is derived that these differences yield different scattering cross-sections for the coupled system of the probe and the sample. Those cross-sections define the strength of the near-field signal that can be measured for different materials. Hence, an optical contrast can be expected, when different scattering cross-sections are probed. This principle also applies to vertically stacked or even buried materials, as shown in this thesis experimentally for two sample systems.
In the first example, the different dielectric functions were obtained by locally changing the carrier concentration in silicon by the implantation of boron. It is shown that the concentration of free charge-carriers can be deduced from the near-field contrast between implanted and pure silicon. For this purpose, two different experimental approaches were used, a non-interferometric one by using variable wavelengths and an interferometric one with a fixed wavelength. As those techniques yield complementary information, they can be used to quantitatively determine the effective carrier concentration. Both approaches yield consistent results for the carrier concentration, which excellently agrees with predictions from literature. While the structures of the first system were in the micrometer regime, the capability to probe buried nanostructures is demonstrated at a sample of indium arsenide quantum dots. Those dots are covered by a thick layer of gallium arsenide. For the first time ever, it is shown experimentally that transitions between electron states in single quantum dots can be investigated by near-field microscopy. By monitoring the near-field response of these quantum dots while scanning the wavelength of the incident light beam, it was possible to obtain characteristic near-field signatures of single dots. Near-field contrasts up to 30 % could be measured for resonant excitation of electrons in the conduction band of the indium arsenide dots.
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Morrish, Dru, and DruMorrish@gmail com. "Morphology dependent resonance of a microscope and its application in near-field scanning optical microscopy." Swinburne University of Technology. Centre for Micro-Photonics, 2005. http://adt.lib.swin.edu.au./public/adt-VSWT20051124.121838.
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In recent times, near-field optical microscopy has received increasing attention for its
ability to obtain high-resolution images beyond the diffraction limit. Near-field optical
microscopy is achieved via the positioning and manipulation of a probe on a scale less
than the wavelength of the incident light.
Despite many variations in the mechanical design of near-field optical microscopes almost all rely on direct mechanical access of a cantilever or a derivative form to probe the sample. This constricts the study to surface examinations in simple sample environments. Distance regulation between the sample surface and the delicate probe
requires its own feedback mechanism. Determination of feedback is achieved through
monitoring the shift of resonance of one arm of a 'tuning fork', which is caused by the interaction of the probes tip with the Van der Waals force. Van der Waals force emanates from atom-atom interaction at the top of the sample surface. Environmental contamination of the sample surface with additional molecules such as water makes accurate measurement of these forces particularly challenging. The near-field study of
living biological material is extremely difficult as an aqueous environment is required for its extended survival. Probe-sample interactions within an aqueous environment that
result in strong detectable signal is a challenging problem that receives considerable
attention and is a focus of this thesis.
In order to increase the detectible signal a localised field enhancement in the probing region is required. The excitation of an optically resonant probe by morphology dependent resonance (MDR) provides a strong localised field enhancement. Efficient MDR excitation requires important coupling conditions be met, of which the localisation of the incident excitation is a critical factor.
Evanescent coupling by frustrated total internal reflection to a MDR microcavity provides an ideal method for localised excitation. However it has severe drawbacks if the probe is to be manipulated in a scanning process. Tightly focusing the incident illumination by a high numerical aperture objective lens provides the degree of freedom to enable both MDR excitation and remote manipulation. Two-photon nonlinear excitation is shown to couple efficiently to MDR modes due to the high spatial localisation of the incident excitation in three-dimensions. The dependence of incident excitation localisation by high numerical aperture objective on MDR efficiency is thoroughly examined in this thesis. The excitation of MDR can be enhanced by up to 10 times with the localisation of the incident illumination from the centre of the
microcavity to its perimeter.
Illuminating through a high numerical aperture objective enables the remote noninvasive
manipulation of a microcavity probe by laser trapping. The transfer of photon momentum from the reflection and refraction of the trapping beam is sufficient enough to exert piconewtons of force on a trapped particle. This allows the particle to be held and scanned in a predictable fashion in all three-dimensions. Optical trapping
removes the need for invasive mechanical access to the sample surface and provides a means of remote distance regulation between the trapped probe and the sample. The femtosecond pulsed beam utilised in this thesis allows the simultaneous induction of two-photon excitation and laser trapping. It is found in this thesis that a MDR microcavity can be excited and translated in an efficient manner. The application of this technique to laser trapped near-field microscopy and single molecule detection is of particular interest.
Monitoring the response of the MDR signal as it is scanned over a sample object enables a near-field image to be built up. As the enhanced evanescent field from the propagation of MDR modes around a microcavity interacts with different parts of the sample, a measurable difference in energy leakage from the cavity modes occurs. The definitive spectral properties of MDR enables a multidimensional approach to imaging and sensing, a focus of this thesis. Examining the spectral modality of the MDR signal
can lead to a contrast enhancement in laser trapped imaging. Observing a single MDR mode during the scanning process can increase the image contrast by up to 1:23 times compared to that of the integrated MDR fluorescence spectrum.
The work presented in this thesis leads to the possibility of two-photon fluorescence
excitation of MDR in combination with laser trapping becoming a valuable tool in near-
field imaging, sensing and single molecule detection in vivo. It has been demonstrated
that particle scanned, two-photon fluorescence excitation of MDR, by laser trapping 'tweezers' can provide a contrast enhancement and multiple imaging modalities. The spectral imaging modality has particular benefits for image contrast enhancements.
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Cvitković, Antonija. "Substrate-enhanced scattering-type scanning near-field infrared microscopy of nanoparticles." München Verl. Dr. Hut, 2009. http://d-nb.info/998908762/04.
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Fenwick, Oliver. "Scanning near-field optical lithography and microscopy of conjugated polymer structures." Thesis, University College London (University of London), 2007. http://discovery.ucl.ac.uk/1445444/.
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This thesis is concerned with the use of the scanning near-field optical microscope (SNOM) to pattern and image conjugated polymer structures. The SNOM is one of just a few optical instruments which are capable of breaking the diffraction limit which limits conventional microscopes to a resolution of approximately half a wavelength. It does so by directing light onto a sub-wavelength aperture at the apex of a probe, establishing a local evanescent field of subwavelength dimensions around the aperture. Conjugated polymers on the other hand are an interesting class of materials which have semiconducting properties and a rich photophysics making them suitable for use in novel light-emitting diodes, transistors and solar cells. I demonstrate direct patterning of several conjugated polymers using the SNOM with a resolution extending below 100 nm and attempt to explain the resolution of the lithography through simulations using the Bethe-Bouwkamp model of the field surrounding a sub-wavelength aperture. In particular the modelling focuses on the role of the film thickness and reflections from the substrate. Further experiments demonstrate that thermal effects which can be caused by heating of the SNOM probe do not play a role in lithography with the SNOM in this case. However, I demonstrate the use of a scanning thermal microscope to do a novel and purely thermal lithography on one of the same conjugated polymers. Resolutions of 120 nm are demonstrated, and finite element analysis is used to show that significant improvements in resolution should be possible by optimisation of the probe and the polymer film. In addition, I present simulations of imaging artefacts caused by topography on samples under SNOM investigation, and use the same model to look at the potential of the SNOM to obtain information about sub-surface objects. SNOM images are presented of blends and supramolecular fibres of conjugated polymers.
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Venkatesh, Vijay. "Mechanoelectrochemistry of electroactive polymers using shear-force based near-field microscopy." The Ohio State University, 2020. http://rave.ohiolink.edu/etdc/view?acc_num=osu158635396991601.
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Mannelquist, Anders. "Near-field scanning optical microscopy and fractal characterization with atomic force microscopy and other methods /." Luleå, 2000. http://epubl.luth.se/1402-1544/2000/40/index.html.
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Doughty, Jeffrey Jon. "Symmetric Near-Field Probe Design and Comparison to Asymmetric Probes." PDXScholar, 2010. https://pdxscholar.library.pdx.edu/open_access_etds/390.
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Tip Enhanced Near-field Optical Microscopy (TENOM) is a method for optically imaging at resolutions far below the diffraction limit. This technique requires optical nano-probes with very specialized geometries, in order to obtain large, localized enhancements of the electromagnetic field, which is the driver behind this imaging method. Traditional methods for the fabrication of these nano-probes involve electrochemical etching and subsequent FIB milling. However, this milling process is non-trivial, requiring multiple cuts on each probe. This requires multiple rotations of the probe within the FIB system, which may not be possible in all systems, meaning the sample must be removed from vacuum, rotated by hand and placed back under vacuum. This is time consuming and costly and presents a problem with reproducibility. The method presented here is to replace multiple cuts from a side profile with a small number of cuts from a top down profile. This method uses the inherent imaging characteristics of the FIB, by assigning beam dwell times to specific locations on the sample, through the use of bitmap images. These bitmaps are placed over the sample while imaging and provide a lookup table for the beam while milling. These images are grayscale with the color of each pixel representing the dwell time at that pixel. This technique, combined with grayscale gradients, can provide probes with a symmetric geometry, making the system polarization independent.
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Jacob, Rainer. "Scanning near-field infrared microspectroscopy on semiconductor structures." Doctoral thesis, Saechsische Landesbibliothek- Staats- und Universitaetsbibliothek Dresden, 2011. http://nbn-resolving.de/urn:nbn:de:bsz:14-qucosa-68317.
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Near-field optical microscopy has attracted remarkable attention, as it is the only technique that allows the investigation of local optical properties with a resolution far below the diffraction limit. Especially, the scattering-type near-field optical microscopy allows the nondestructive examination of surfaces without restrictions to the applicable wavelengths. However, its usability is limited by the availability of appropriate light sources. In the context of this work, this limit was overcome by the development of a scattering-type near-field microscope that uses a widely tunable free-electron laser as primary light source. In the theoretical part, it is shown that an optical near-field contrast can be expected when materials with different dielectric functions are combined. It is derived that these differences yield different scattering cross-sections for the coupled system of the probe and the sample. Those cross-sections define the strength of the near-field signal that can be measured for different materials. Hence, an optical contrast can be expected, when different scattering cross-sections are probed. This principle also applies to vertically stacked or even buried materials, as shown in this thesis experimentally for two sample systems. In the first example, the different dielectric functions were obtained by locally changing the carrier concentration in silicon by the implantation of boron. It is shown that the concentration of free charge-carriers can be deduced from the near-field contrast between implanted and pure silicon. For this purpose, two different experimental approaches were used, a non-interferometric one by using variable wavelengths and an interferometric one with a fixed wavelength. As those techniques yield complementary information, they can be used to quantitatively determine the effective carrier concentration. Both approaches yield consistent results for the carrier concentration, which excellently agrees with predictions from literature. While the structures of the first system were in the micrometer regime, the capability to probe buried nanostructures is demonstrated at a sample of indium arsenide quantum dots. Those dots are covered by a thick layer of gallium arsenide. For the first time ever, it is shown experimentally that transitions between electron states in single quantum dots can be investigated by near-field microscopy. By monitoring the near-field response of these quantum dots while scanning the wavelength of the incident light beam, it was possible to obtain characteristic near-field signatures of single dots. Near-field contrasts up to 30 % could be measured for resonant excitation of electrons in the conduction band of the indium arsenide dotsDie optische Nahfeldmikroskopie hat viel Beachtung auf sich gezogen, da sie die einzige Technologie ist, welche die Untersuchung lokaler optischer Eigenschaften mit Auflösungen unterhalb der Beugungsgrenze ermöglicht. Speziell die streuende Nahfeldmikroskopie erlaubt die zerstörungsfreie Untersuchung von Oberflächen ohne Einschränkung der verwendbaren Wellenlängen. Die Nutzung ist jedoch durch das Vorhandensein entsprechender Lichtquellen beschränkt. Im Rahmen dieser Arbeit wurde diese Beschränkung durch Entwicklung eines streuenden Nahfeldmikroskops überwunden, das einen weit stimmbaren Freie-Elektronen-Laser als primäre Lichtquelle benutzt. Im theoretischen Teil wird gezeigt, dass ein optischer Kontrast erwartet werden kann, wenn Materialien mit unterschiedlichen Dielektrizitätskonstanten kombiniert werden. Es wird hergeleitet, dass diese Unterschiede in unterschiedlichen Streuquerschnitten für das gekoppelte System aus Messkopf und Probe resultieren. Diese Streuquerschnitte definieren die Stärke des Nahfeldsignals, welches auf unterschiedlichen Materialien gemessen werden kann. Ein optischer Kontrast kann also erwartet werden, wenn unterschiedliche Streuquerschnitte untersucht werden. Dass dieses Prinzip auch auf übereinander geschichtete oder sogar verborgene Strukturen angewendet werden kann, wird in dieser Doktorarbeit an zwei Probensystemen experimentell gezeigt. Im ersten Beispiel wurden die unterschiedlichen Dielektrizitätskonstanten durch örtliches Ändern der Ladungsträgerdichte in Silizium durch Bor-Implantation erreicht. Es wird gezeigt, dass die Dichte der freien Ladungsträger an Hand des optischen Kontrastes zwischen implantiertem und reinem Silizium ermittelt werden kann. Zu diesem Zweck wurden zwei unterschiedliche Ansätze verwendet, ein nicht-interferometrischer mittels variabler Wellenlängen und ein interferometrischer mit einer konstanten Wellenlänge. Weil diese Techniken gegensätzliche Informationen liefern, können sie genutzt werden, um die effektive Ladungsträgerdichte quantitativ zu bestimmen. Beide Ansätze lieferten konsistente Resultate für die Trägerdichte, welche sehr gut mit den Vorhersagen der Literatur übereinstimmt. Während die Strukturen im ersten Beispiel im Mikrometer-Bereich lagen, wird die Möglichkeit, verborgene Nanostrukturen zu untersuchen, an Hand einer Probe mit Indiumarsenid Quantenpunkten demonstriert. Diese sind von einer dicken Schicht Galliumarsenid bedeckt. Zum ersten Mal wird experimentell gezeigt, dass Übergänge zwischen Elektronenzuständen in einzelnen Quantenpunkten mit Nahfeldmikroskopie untersucht werden können. Durch die Messung der Nahfeld-Antwort der Quantenpunkte unter Änderung der Wellenlänge des eingestrahlten Lichtes war es möglich, charakteristische Nahfeld-Signaturen der einzelnen Quantenpunkte zu erhalten. Nahfeld-Kontraste bis zu 30 Prozent konnten für die resonante Anregung der Elektronen im Leitungsband der Indiumarsenid Punkte beobachtet werden
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Yoxall, Edward. "Applications of scattering-type scanning near-field optical microscopy in the infrared." Thesis, Imperial College London, 2013. http://hdl.handle.net/10044/1/23637.
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This thesis is split into two broad sections. These are defined by the various applications of scattering-type near-field optical microscopy (s-SNOM) in different parts of the electromagnetic spectrum; the near-infrared (700 - 1000nm) and the mid-infrared (6 - 10um). S-SNOM is a means of imaging surfaces at resolutions well below the diffraction limit - the level of recorded detail does not depend on the wavelength of light (as it does with traditional optical microscopy), but instead on the sharpness of a probe (usually around 10nm), meaning an image resolution approaching a thousandth of a wavelength in the mid-infrared. For the work presented in the near-infrared, the focus lies with the modelling and mapping of various plasmonic resonances supported by metallic nanostructures. These resonances have the ability to "squeeze" light into substantially sub-wavelength volumes which is useful for a variety of applications ranging from cancer treatments to molecular sensing. The mid-infrared section starts with the implementation of a pulsed quantum cascade laser (QCL) as the system's light source. This presents some instrumentation challenges as all s-SNOM imaging to date has been conducted with continuous-wave (CW) lasers. Using a pulsed laser also raises some significant signal-to-noise implications which are quantified and discussed. In terms of the experimental applications of such a setup, the first steps towards ultra-high resolution infrared chemical spectroscopy are made by studying the epithelial cells of an oesophageal biopsy. The thesis concludes with an examination of the major noise sources faced by s-SNOM, and makes a number of recommendations on how their effects can be mitigated.
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Hall, Jeffrey E. "Exploring photorefractive polymer-dispersed liquid crystals using near-field scanning optical microscopy /." Search for this dissertation online, 2004. http://wwwlib.umi.com/cr/ksu/main.
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Berry, Sam. "Ultra-high spatial and temporal resolution using Scanning Near-field Optical Microscopy." Thesis, University of Southampton, 2013. https://eprints.soton.ac.uk/348102/.
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Scanning near-field optical microscopy (SNOM) is a system that can image beyond the conventional diffraction limit. It does this by collecting the information contained within evanescent fields. This unique ability to image using evanescent fields also enables SNOM to directly measure the electric field distribution in waveguides, where light is guided by total internal reflection. When SNOM is used with a spectrally resolving detector, local temporal phenomena can be detected by analysing spectral interference in the spectra collected by the probe. This spectrally resolving configuration was used to directly measure inter-modal group velocity difference in a multimode ridge waveguide and, using the modes’ spatial profiles to experimentally determine the mode amplitude coefficient ratio. Such an ability to provide measurements on the local dispersion characteristics and relative modal amplitudes of guided light establishes SNOM as a route for investigating the conversion of current single mode photonic devices into multimode devices. The spectrally resolving SNOM system was also used to investigate the sources of temporal delays created by a quasi disordered scattering sample, which was based on John H. Conway’s pinwheel tiling. Whilst the measurements do not create a complete picture of the scattering phenomena in this work, suggestions for improvement are offered with the aim establishing spectrally resolving SNOM systems as tools for mapping localised temporal phenomena in disordered scattering systems.
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Xiao, Zhizhao. "Optical properties of zinc oxide nanostructure materials using near-field scanning optical microscopy /." View abstract or full-text, 2007. http://library.ust.hk/cgi/db/thesis.pl?PHYS%202007%20XIAO.
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Williamson, Ricky Lawrence. "Near-field optical and shear force microscopy : instrument development, theoretical background and applications." Thesis, University of Bristol, 1995. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.296690.
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Quartel, John Conrad. "A study of near-field optical imaging using an infrared microscope." Thesis, Imperial College London, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.313413.
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Froehlich, Fred Franklin. "Optical contrast mechanisms and shear force interactions in near-field scanning optical microscopy." Diss., The University of Arizona, 1996. http://hdl.handle.net/10150/187486.
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This dissertation investigates mechanisms that influence image formation in near-field scanning optical microscopy (NSOM) performed with tapered fiber aperture probes. Both the generation of optical contrast for transmission mode NSOM and the force interaction between the probe and sample that is the basis for topographic imaging by shear force microscopy (SFM) are studied. A brief introduction and review of the field of NSOM are given. The lack of understanding in the previous work of the optical and force interactions between the probe and sample is cited as the motivation for the present investigation. A theoretical model is developed that describes the linear scattering of the probe's source field by the complex transmittance of the sample. The imaging of subwavelength features is shown to arise from the spatial mixing of the evanescent waves of the probe's source field with the high spatial frequencies of the object. Calculations of the optical transfer function are presented. The shear force servo that regulates the probe-to-sample separation and facilitates the acquisition of SFM imagery is extensively analyzed. The optical detection scheme that measures the dither vibration of the probe is characterized in order to optimize the servo performance. The shear force interaction is then analyzed by modeling the probe as a simple harmonic oscillator. Measurements of the probe's resonant response while interacting with the sample reveal that the shear force is mainly frictional. The magnitude of the force is derived, and limitations on its measurement are established through analysis of the minimum detectable displacement of the probe. The servo performance is shown to be shot noise limited, as opposed to being limited by the thermal vibration noise of the probe. Experimental SFM and NSOM images of various grating structures and optical data storage materials are presented. The optical contrast mechanisms displayed in the images are identified. Linear scattering generally dominates the contrast, but some images exhibit unique near-field effects due to probe-sample interactions that lead to nonlinear imaging behavior. The origin of these interactions is the boundary conditions imposed on the probe's aperture by the sample's composition and structure.
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Inglis, William. "Investigating probe-sample interactions in NSOM." Thesis, University of Nottingham, 2002. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.288999.
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Teetsov, Julie Ann. "Photophysical characterization and near-field scanning optical microscopy of dilute solutions and ordered films of alkyl-substituted polyfluorenes /." Full text (PDF) from UMI/Dissertation Abstracts International, 2000. http://wwwlib.umi.com/cr/utexas/fullcit?p3004384.
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Kolb, Paul Walter. "Cryogenic near-field scanning optical microscopy : quantum dots, charge-ordered domains, and ferromagnetic nucleation /." College Park, Md. : University of Maryland, 2004. http://hdl.handle.net/1903/1497.
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Thesis (Ph. D.) -- University of Maryland, College Park, 2004.Thesis research directed by: Physics. Title from t.p. of PDF. Includes bibliographical references. Published by UMI Dissertation Services, Ann Arbor, Mich. Also available in paper.
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Reitz, Frederick B. "Fluorescence anisotropy near-field scanning optical microscopy (FANSOM) : a new technique for biological microviscometry /." Thesis, Connect to this title online; UW restricted, 2001. http://hdl.handle.net/1773/8098.
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Ube, Toru. "Orientation and Conformation of Single Polymer Chain Studied by Scanning Near-Field Optical Microscopy." 京都大学 (Kyoto University), 2011. http://hdl.handle.net/2433/142243.
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Nowak, Derek Brant. "The Design of a Novel Tip Enhanced Near-field Scanning Probe Microscope for Ultra-High Resolution Optical Imaging." PDXScholar, 2010. https://pdxscholar.library.pdx.edu/open_access_etds/361.
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Traditional light microscopy suffers from the diffraction limit, which limits the spatial resolution to λ/2. The current trend in optical microscopy is the development of techniques to bypass the diffraction limit. Resolutions below 40 nm will make it possible to probe biological systems by imaging the interactions between single molecules and cell membranes. These resolutions will allow for the development of improved drug delivery mechanisms by increasing our understanding of how chemical communication within a cell occurs. The materials sciences would also benefit from these high resolutions. Nanomaterials can be analyzed with Raman spectroscopy for molecular and atomic bond information, or with fluorescence response to determine bulk optical properties with tens of nanometer resolution. Near-field optical microscopy is one of the current techniques, which allows for imaging at resolutions beyond the diffraction limit. Using a combination of a shear force microscope (SFM) and an inverted optical microscope, spectroscopic resolutions below 20 nm have been demonstrated. One technique, in particular, has been named tip enhanced near-field optical microscopy (TENOM). The key to this technique is the use of solid metal probes, which are illuminated in the far field by the excitation wavelength of interest. These probes are custom-designed using finite difference time domain (FDTD) modeling techniques, then fabricated with the use of a focused ion beam (FIB) microscope. The measure of the quality of probe design is based directly on the field enhancement obtainable. The greater the field enhancement of the probe, the more the ratio of near-field to far-field background contribution will increase. The elimination of the far-field signal by a decrease of illumination power will provide the best signal-to-noise ratio in the near-field images. Furthermore, a design that facilitates the delocalization of the near-field imaging from the far-field will be beneficial. Developed is a novel microscope design that employs two-photon non-linear excitation to allow the imaging of the fluorescence from almost any visible fluorophore at resolutions below 30 nm without changing filters or excitation wavelength. The ability of the microscope to image samples at atmospheric pressure, room temperature, and in solution makes it a very promising tool for the biological and materials science communities. The microscope demonstrates the ability to image topographical, optical, and electronic state information for single-molecule identification. A single computer, simple custom control circuits, field programmable gate array (FPGA) data acquisition, and a simplified custom optical system controls the microscope are thoroughly outlined and documented. This versatility enables the end user to custom-design experiments from confocal far-field single molecule imaging to high resolution scanning probe microscopy imaging. Presented are the current capabilities of the microscope, most importantly, high-resolution near-field images of J-aggregates with PIC dye. Single molecules of Rhodamine 6G dye and quantum dots imaged in the far-field are presented to demonstrate the sensitivity of the microscope. A comparison is made with the use of a mode-locked 50 fs pulsed laser source verses a continuous wave laser source on single molecules and J-aggregates in the near-field and far-field. Integration of an intensified CCD camera with a high-resolution monochromator allows for spectral information about the sample. The system will be disseminated as an open system design.
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López, Ayón Gabriela. "Applying a commercial atomic force microscope for scanning near-field optical microscopy techniques and investigation of Cell-cell signalling." Thesis, McGill University, 2010. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=92400.
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The field of research of this thesis is Condensed Matter Physics applied to Biology. Specifically it describes the development of different Atomic Force Microscopy techniques and tools towards the study of living cells in physiological solution. Particular interest is put into the understanding of the influence of noise in the determination of ordered liquid layers above a mica surface - as work towards the study of the role of water and ions in biological processes - and the influence of "diving bell" to boost the Q factor and allow stable imaging and force spectroscopy with tips based on Scanning Near-field Optical Microscopy [LeDue, 2010 and LeDue, 2008]. By combining SNOM techniques as a local illumination method (and thus avoiding photo bleaching of individual molecules) and high resolution AFM techniques we will be able to investigate mechano-transduction and associated signaling in living cells and individual proteins.Le domaine de recherche de cette thèse consiste en l'application de la physique de la matière condensée à la biologie. Plus précisément, ce travail décrit le développement de différentes techniques de Microscopie à Force Atomique (MFA) et d'outils permettant l'étude de cellules vivantes en solution physiologique. Un intérêt particulier est porté à la compréhension de l'influence du bruit dans la détermination de couches liquides ordonnées au-dessus d'une surface de mica - en tant que travail préalable à l'étude du rôle de l'eau et des ions dans les processus biologiques - et de l'influence d'une "cloche de plongée" pour renforcer le facteur Q ainsi que pour permettre l'imagerie stable et la spectrométrie de force avec des sondes basées sur la Microscopie Optique en Champ Proche (MOCP). En combinant des techniques MOCP, utilisées comme méthode d'éclairement local (évitant ainsi le photoblanchiment des molécules individuelles), et des techniques MFA haute résolution, nous serons capables d'investir la mécano-transduction et le signalement associé dans des cellules vivantes et dans des protéines individuelles.
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Kohlgraf-Owens, Dana. "Optically Induced Forces in Scanning Probe Microscopy." Doctoral diss., University of Central Florida, 2013. http://digital.library.ucf.edu/cdm/ref/collection/ETD/id/5649.
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The focus of this dissertation is the study of measuring light not by energy transfer as is done with a standard photodetector such as a photographic film or charged coupled device, but rather by the forces which the light exerts on matter. In this manner we are able to replace or complement standard photodetector-based light detection techniques. One key attribute of force detection is that it permits the measurement of light over a very large range of frequencies including those which are difficult to access with standard photodetectors, such as the far IR and THz. The dissertation addresses the specific phenomena associated with optically induced force (OIF) detection in the near-field where light can be detected with high spatial resolution close to material interfaces. This is accomplished using a scanning probe microscope (SPM), which has the advantage of already having a sensitive force detector integrated into the system. The two microscopies we focus on here are atomic force microscopy (AFM) and near-field scanning optical microscopy (NSOM). By detecting surface-induced forces or force gradients applied to a very small size probe ( diameter), AFM measures the force acting on the probe as a function of the tip-sample separation or extracts topography information. Typical NSOM utilizes either a small aperture ( diameter) to collect and/or radiate light in a small volume or a small scatterer ( diameter) in order to scatter light in a very small volume. This light is then measured with an avalanche photodiode or a photomultiplier tube. These two modalities may be combined in order to simultaneously map the local intensity distribution and topography of a sample of interest. A critical assumption made when performing such a measurement is that the distance regulation, which is based on surface induced forces, and the intensity distribution are independent. In other words, it is assumed that the presence of optical fields does not influence the AFM operation. However, it is well known that light exerts forces on the matter with which it interacts. This light-induced force may affect the atomic force microscope tip-sample distance regulation mechanism or, by modifying the tip, it may also indirectly influence the distance between the probe and the surface. This dissertation will present evidence that the effect of optically induced forces is strong enough to be observed when performing typical NSOM measurements. This effect is first studied on common experimental situations to show where and how these forces manifest themselves. Afterward, several new measurement approaches are demonstrated, which take advantage of this additional information to either complement or replace standard NSOM detection. For example, the force acting on the probe can be detected while simultaneously extracting the tip-sample separation, a measurement characteristic which is typically difficult to obtain. Moreover, the standard field collection with an aperture NSOM and the measurement of optically induced forces can be operated simultaneously. Thus, complementary information about the field intensity and its gradient can be, for the first time, collected with a single probe. Finally, a new scanning probe modality, multi-frequency NSOM (MF-NSOM), will be demonstrated. In this approach, the tuning fork is driven electrically at one frequency to perform a standard tip-sample distance regulation to follow the sample topography and optically driven at another frequency to measure the optically induced force. This novel technique provides a viable alternative to standard NSOM scanning and should be of particular interest in the long wavelength regime, e.g. far IR and THz.Ph.D.
Doctorate
Optics and Photonics
Optics and Photonics
Optics
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Vilain, S. "Characterisation of plasmonic crystals and integrated photonic devices with hyperspectral scanning near field optical microscopy." Thesis, Queen's University Belfast, 2012. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.557848.
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Plasmonic nanostructures are an important class of nanophotonic components capable of localising light near a metal interface on subwavelength scales. Surface plasmon polaritons (SPPs) are confmed to the metal interface and can only be studied in the past in the far-field by indirect investigation of the light resulting from their scattering. They can be studied directly using optical near-field microscopy which is capable of detecting the optical field in proximity to the surface, with sub-wavelength spatial resolution. We have developed a new tool for the investigation of surface plasmonic polaritons in a broad spectral range, the hyperspectral scanning near- field optical microscope, capable of simultaneously recording multiple near-field images in the 500-800nm spectral wavelength range. Using this microscope, the Bloch mode formation in plasmonic crystals, periodically structured metal films, have been studied along with the SPP excitation by the crystals. The role of the film thickness and crystal lattice has been studied in both the far-field and near-field. Novel plasmonic crystals with exotic lattices have been designed which provides additional advantages over the standard square lattice crystals in terms of band structure engineering and designing flat SPP bands, advantageous for applications in light extraction and unidirectional transmission. SNOM has then been used to demonstrate the new plasmonic platform based on VCSEL light source, showing direct SPP excitation on the laser surface and their efficient guiding. Multimode and single mode waveguides, Y -splitters and Mach-Zehnder interferometer configurations wen: realised. Plasmonic waveguide-ring resonators were studied incorporating non linear optical materials and optical switching has been demonstrated. The developed hyperspectral SNOM is a powerful technique for understanding the optical properties of plasmonic nanostructures and evaluating their nanophotonic capabilities. The studied plasmonic components, such as plasmonic crystals, integrated plasmonic waveguides and ring- resonator exhibit unique optical properties that pave the way for applications in photonic device optimisation and developing new concepts of signal guiding and manipulation.
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Farace, Giosi. "Biophysical applications of near-field scanning optical microscopy and the development of protein micro-patterns." Thesis, University of Nottingham, 2000. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.312241.
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Walker, Kelly-Ann D. "Scanning near-field optical microscopy studies of cell membrane proteins labelled with fluorescent quantum dots." Thesis, Swansea University, 2010. https://cronfa.swan.ac.uk/Record/cronfa43114.
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Scanning near-field optical microscopy (SNOM) has been employed to simultaneously acquire high-resolution fluorescence images along with shear-force atomic force microscopy of cell membranes. Implementing such a technique overcomes the limits of optical diffraction found in standard fluorescence microscopy and also yields vital topographic information. However, one of the biggest challenges of imaging fluorescent biological specimens with SNOM, is the photostability and low yield of fluorescent labelling agents. Semiconductor quantum dots are a recently developed class of fluorophores which exhibit superior optical properties. They are significantly brighter and more resistant to photo-degradation than organic fluorophores. In this study, SNOM has been utilised in conjunction with quantum dot labelling to interrogate the biomolecular composition of cell membranes. The technique has been applied to investigate cell-cell adhesion in human epithelial cells. This has been realised through immunofluorescence labelling of the cell-cell adhesion protein E-cadherin. Moreover, a dual labelling protocol has been optimised to facilitate a comparative study of the adhesion mechanisms, and the effect of aberrant adhesion protein expression, in both healthy and cancerous epithelial cells. This study reports clear differences in the morphology and phenotype of healthy and cancerous cells. In healthy prostate epithelial cells (PNT2 cells), Ecadherin was predominantly located along the cell periphery and within filopodial protrusion. The presence of E-cadherin appeared to be enhanced when cell-cell contact was established. Furthermore this study has revealed the interactions of filopodia and their functional relationship in establishing adherens junctions in PNT2 cells. In contrast, examination of metastatic prostate cancer cells (PC-3 cells) revealed E-cadherin to be predominantly localised around the nuclear region of the cell, with no E-cadherin labelling around the periphery of the cells. This lack of functional E-cadherin in PC-3 cells coincided with a markedly different morphology and PC-3 cells were not observed to form tight cell-cell associations with their neighbours. Facilitated by the high-resolution imaging afforded by the SNOM technique, this research further highlights the important role th at E-cadherin plays in the development of invasive, metastatic cancers.
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Gates, James Christopher. "Measurement of the local optical phase and amplitude in photonic devices using scanning near-field microscopy." Thesis, University of Southampton, 2003. https://eprints.soton.ac.uk/15469/.
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This thesis presents the optical characterisation of various photonic devices using scanning near-field microscopy (SNOM). The SNOM technique has a unique capability of achieving a resolution beyond the diffraction limit. Placing the SNOM into the arm of a heterodyne interferometer also enables the measurement of both the optical phase and amplitude in the near infrared. In this work three different photonic devices are investigated. The optical field distribution within a fibre Bragg grating is investigated as a function of wavelength. This work details the direct observation of the spatial shift of the standing wave across the stop band of a fibre grating. The shift is an explicit feature of fibre Bragg gratings and has previously only been theoretically predicted. The thesis also details three analytical techniques for measuring the microscopic loss of planar or channel waveguides. Two of the techniques are experimentally tested. The techniques exploit a standing wave generated within the waveguide, the visibility of the standing wave provides sufficient information to determine to loss between two points. The present limitations of the techniques are presented. The SNOM technique has also been applied to the measurement of a large mode holey fibre. The work details the accurate characterisation of the mode at the end face of the fibre and as it propagates into free space. The results are compared to theoretically predicted modes.
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Haenssler, Olaf Christian. "Multimodal sensing and imaging technology by integrated scanning electron, force, and near-field microwave microscopy and its application to submicrometer studies." Thesis, Lille, 2018. http://www.theses.fr/2018LIL1I006.
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La combinaison de plusieurs procédés d’imagerie et de mesure permet d’obtenir des ensembles de données complémentaires et parfois uniques. A l’aide d’une technique hybride de microscopie présentant des modalités de mesure différentes et des enregistrements synchrones, on peut recueillir des informations complémentaires sur des échantillons à l’échelle nanométrique. De plus, l’intégration de procédés nanorobotiques et de logiciels open-source permet une approche technologique pour la recherche sur les semi-conducteurs et les sciences des matériaux. Ce travail démontre le potentiel d’une telle technologie. Ce démonstrateur fonctionne dans la chambre d‘un MEB et sert de plateforme technologique dans laquelle sont intégrés différentes modalités, technologies et procédés. Un AFM basé sur un interféromètre optique compact permet l’imagerie de la topographie de surface tandis qu’un microscope à micro-ondes à balayage enregistre les caractéristiques électromagnétiques dans la gamme de fréquence des micro-ondes, le tout opérant dans le même MEB. L’engin est contrôlé par un ensemble de logiciels qui est optimisé pour la nanorobotique basée sur l‘imagerie. Ce démonstrateur technologique permet d’observer en direct la région d’intérêt à l’aide du microscope électronique tandis qu’est effectuée en champ proche la caractérisation de la surface de l’échantillon par intermédiaire des micro-ondes évanescentes et des forces intermoléculaires. Ensuite, est présenté un standard multimodal de test et qui valide la fonctionnalité de l’instrument démonstrateur. Le présent travail est complété par une analyse électrique de capacités MOS ainsi que leur approximation destinée au calibrageVarious disciplines of micro- and nanotechnology requires combinatorial tools for the investigation, manipulation and transport of materials in the submicrometer range. The coupling of multiple sensing and imaging techniques allows for obtaining complementary and often unique datasets of samples under test. By means of an integrated microscopy technique with different modalities, it is possible to gain multiple information about nanoscale samples by recording at the same time. The expansion with nanorobotics and an open-source software framework, leads to a technology approach for semiconductor research and material science. This work shows the potential of such a multimodal technology approach by focusing on a demonstrator setup. It operates under high-vacuum conditions inside the chamber of a Scanning Electron Microscope and serves as a technology platform by fusing various microscopy modalities, techniques and processes. An Atomic Force Microscope based on a compact, optical interferometer performs imaging of surface topography, and a Scanning Microwave Microscope records electromagnetic properties in the microwave frequency domain, both operating inside an SEM. A software framework controls the instrument. The setup allows for observing with SEM, while imaging and characterizing with interacting evanescent microwaves and intermolecular forces simultaneously. In addition, a multimodal test standard is introduced and subsequently confirms the functionality of the demonstrator. Within this context, the work also includes an electrical analysis of micro-scale MOS capacitors, including an approximation for use in the calibration
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Mills, John David. "An investigation of phase-mask diffraction patterns and fibre Bragg gratings with scanning near-field optical microscopy." Thesis, University of Southampton, 2001. https://eprints.soton.ac.uk/15492/.
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In recent years, near-field microscopy has been utilized for assessing the properties of optical wave-guides at an increasing rate. Here, a Scanning Near-field Optical Microscope (SNOM) has been designed and constructed in order to expand this work into an analysis of the optical and structural properties of fibre Bragg gratings, which are used throughout the optical fibre telecommunications network. By imaging the evanescent fields of Bragg gratings, a characterization technique has been developed which has enabled the acquisition of sub-wavelength information about the optical field distribution within a fibre grating and its refractive index structure. Six separate fibre grating samples have been examined, demonstrating the feasibility of the developed scanning technique to become a useful characterization tool. In particular, the study has enabled grating standing wave fringes to be imaged relative to corresponding refractive index fringes, for the first time. The SNOM has also been utilized to map free-space diffraction patterns close to a phase-mask (transmission diffraction grating). The patterns are normally used to create fibre gratings via UV photosensitivity mechanisms. The field distributions have been imaged under various experimental conditions and have revealed some of the technical problems that might occur during the writing of gratings. The measured patterns have also served to confirm existing diffraction grating theory, which has been expanded during the course of this work to produce a new expression for the 'Talbot length', originally formulated by Rayleigh in 1881.
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Lucchesi, Christophe. "Design and development of a near-field thermophotovoltaic conversion device." Thesis, Lyon, 2020. http://www.theses.fr/2020LYSEI053.
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Une cellule thermophotovoltaïque (TPV) convertit l’énergie de photons émis par des corps chauds en énergie électrique. Lorsque la distance séparant deux corps rayonnants devient inférieure à la longueur d’onde caractéristique du rayonnement thermique (~10 µm à température ambiante, ~2,3 µm vers 1000°C), le transfert de chaleur radiatif peut s’accroître de plusieurs ordres de grandeur grâce à la contribution des ondes évanescentes. Cette propriété a un intérêt pour la récupération d’énergie en promettant une augmentation de la puissance électrique générée par une cellule TPV lorsqu’elle est placée en champ proche d’un émetteur thermique radiatif. Dans le but de vérifier cette prédiction, cette thèse a consisté à développer un banc expérimental de mesures TPV en champ proche. Le dispositif est basé sur un montage de microscopie thermique avec actuateurs piézo-électriques (SThM). L’émetteur est une sphère micrométrique de graphite attachée sur un levier SThM chauffé de manière thermorésistive jusqu’à 1200 K et la cellule TPV en antimoniure d’indium (InSb), qui ne peut fonctionner au-delà de 100 K, est placée sur le doigt froid d’un cryostat. Le flux radiatif en champ proche transféré par l’émetteur peut être mesuré indépendamment de la puissance électrique générée par la cellule. La preuve expérimentale de l’accroissement de la densité de puissance électrique générée en champ proche, par rapport à la prédiction de la théorie macroscopique du rayonnement, a été apportée avec un facteur jusqu’à 6. L’étude de différents paramètres a permis d’atteindre des puissances TPV de 7.5 kW.m-2 et des rendements de conversion mesurés de ~20 %. Des expériences de transfert radiatif en champ proche dans diverses configurations (matériaux, géométries, températures) ont également été menées. La puissance radiative transférée en champ proche suit des lois de puissance très différentes de celles du champ lointain. Ces résultats démontrent expérimentalement l’intérêt applicatif des effets de champ proche pour le rayonnement thermiqueThermophotovoltaic (TPV) cells convert the energy of photons emitted by hot bodies into electrical energy. When the distance between two radiating bodies becomes smaller than the characteristic wavelength of thermal radiation (~ 10 µm at room temperature and ~ 2.3 µm near 1000 °C), radiative heat transfer can be enhanced by several orders of magnitude due to the contribution of evanescent waves. This property has an interest for energy harvesting because it should increase the electrical power generated by a TPV cell located in the near field of a radiative thermal emitter. With the aim of confirming this prediction, this thesis consisted in the development of an experimental setup for performing near-field TPV measurements. The setup is based on a scanning thermal microscopy (SThM) design involving piezoelectric actuators. The emitter is a microsphere made of graphite and glued on a SThM cantilever heated by Joule effect up to 1200 K and the TPV cell made of indium antimonide (InSb), which cannot operate above 100 K, is placed on the cold finger of a cryostat. Near-field radiative heat flux transferred from the emitter is measured independently from the electrical power generated by the cell. A study of different parameters provided the experimental proof of the near-field enhancement of the electrical power density generated in the near field by a factor up to 6 compared with the prediction based on the macroscale theory of thermal radiation. Output electrical power densities reach 7.5 kW.m-2 and conversion efficiencies ~20 %. In addition, near-field radiative heat transfer experiments were performed in various configurations (materials, geometries and temperatures). The near-field radiative power follows power laws different from those of the far field. These results highlight the interest of near-field effects on radiative heat transfer for applications
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Craig, Timothy. "The development of infrared scanning near-field optical microscopy for the study of cancer and other biological problems." Thesis, University of Liverpool, 2016. http://livrepository.liverpool.ac.uk/3004490/.
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Tisler, Julia [Verfasser]. "Nitrogen-vacancy center in diamond as sensor for Fluorescence Resonance Energy Transfer Scanning Near Field Optical Microscopy / Julia Tisler." München : Verlag Dr. Hut, 2014. http://d-nb.info/1050331583/34.
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Mehtani, Disha. "Development and Optimization of Scanning nano-Raman Spectroscopy." University of Akron / OhioLINK, 2006. http://rave.ohiolink.edu/etdc/view?acc_num=akron1152212506.
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Brun, Boris. "Electron interactions in mesoscopic physics : Scanning Gate Microscopy and interferometry at a quantum point contact." Thesis, Grenoble, 2014. http://www.theses.fr/2014GRENY049/document.
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Au cours de cette thèse nous avons étudié les effets des interactions entre électrons dansles contacts ponctuels quantiques (QPCs). Les contacts ponctuels quantiques sont des petitscanaux quasi-unidimensionnels, définis à partir de gaz électroniques bidimensionnelsde haute mobilité (2DEG). Une tension négative appliquée sur des grilles métalliques audessus de la surface permet d’ouvrir ou fermer le QPC. Lorsqu’un QPC s’ouvre, de plusen plus de modes électroniques peuvent traverser le QPC, et sa conductance augmente parpas discrets, séparés par un quantum de conductance 2e2/h. On peut le comprendre parle transport unidimensionnel d’une seule particule, car chaque mode transverse contribuepour un quantum de conductance.Mais depuis leurs premières réalisations, les QPCs ont montré des déviations par rapportà ce modèle à une particule. Les plus connues sont un épaulement sous le premier plateau,autour de 0.7×2e2/h, appelé "l’anomalie 0.7", et un pic dans la conductance différentiellequi apparaît à basse température: l’anomalie à zéro polarisation (ZBA).L’instrument que nous avons utilisé pour étudier ces effets d’interactions est un microscopeà effet de grille local (SGM). Cette technique consiste à modifier localement le potentield’un dispositif à l’aide d’une pointe de microscope à force atomique (AFM) chargée négativement,et enregistrer les modifications de la conductance en fonction de la position dela pointe. En utilisant cette technique à très basse température, nous avons montré quenous pouvons moduler les anomalies de conductance du QPC. Nous avons interprété nosrésultats comme la signature d’un cristal d’électrons se formant spontanément à bassedensité dans le QPC à cause de la répulsion Coulombienne: un cristal de Wigner. Onpeut modifier le nombre d’électrons cristallisés en approchant la pointe, et obtenir dessignatures de la parité du nombre d’électrons localisés dans le transport électronique.En fonction de cette parité, le cristal de Wigner présente un état de spin différent, etl’écrantage de ce spin par les électrons de conduction au travers d’un mécanisme appeléeffet Kondo donne une anomalie à zéro polarisation formant alternativement un simplepic ou un double pic. Cette découverte apporte une avancée significative à ce domaine,qui a concentré les efforts de plusieurs groupes importants ces 15 dernières années.Nous avons ensuite réalisé des mesures interférométriques à l’aide du microscope SGM,en créant in situ des interféromètres dans le gaz 2D. Nous avons obtenu les signaturesd’un déphasage supplémentaire dans le régime de la ZBA. Nous attribuons cet effet audéphasage universel accumulé par les électrons à la traversée d’un singulet Kondo, ce quirenforce le fait que la ZBA trouve son origine dans les phénomènes Kondo.Enfin, nous avons adapté la technique SGM au transport thermoélectrique dans les QPCs,et avons imagé pour la première fois les interférences d’électrons se déplaçant sous l’effetd’une différence de températureIn this thesis, we studied the effect of electron electron interactions in quantum pointcontacts (QPCs). Quantum point contacts are small quasi-one dimensional channels,designed on a high mobility two-dimensional electron gas (2DEG). A negative voltageapplied on a pair of metallic split gates above the sample surface allows to open or closethe QPC. As a QPC opens, more and more electronic modes are allowed to cross theQPC, and its conductance increases by discrete steps, separated by a conductance quantum2e2/h. This can be understood from a single-particle picture in one-dimensionaltransport, as each transverse mode carries a conductance quantum.But from their first realization 25 years ago, quantum point contacts have shown deviationsfrom this picture, attributed to electron electron interactions. The most well knownare a shoulder below the first plateau, around 0.7×2e2/h, called the "0.7 anomaly", and apeak in the differential conductance that arises at low temperature: the zero bias anomaly(ZBA).The tool we used to study these interaction effects is a scanning gate microscope (SGM).It consists by changing locally the device’s potential with the polarized tip of an atomicforce microscope (AFM), and record the changes in conductance as a function of the tipposition. By performing this technique at very low temperature, we showed that we canmodulate the conductance anomalies of QPCs. We interpret our result as the signatureof a small electrons crystal forming spontaneously at low density in the QPC due to theCoulomb repulsion: a Wigner crystal. We can modify the number of crystallized electronsby approaching the tip, and obtain signatures of the parity of the localized electrons numberin transport features. Depending on this parity, the Wigner crystal has a differentspin state, and screening of this spin by the surrounding electrons through the so-calledKondo effect leads alternatively to a single peak or a split ZBA. This discovery bringsa significant advance in this field, that has attracted research efforts of many importantgroups in the world over the past 15 years.We then performed interferometric measurements thanks to the scanning gate microscopeby creating in-situ interferometers in the 2DEG. We obtained signatures of an additionalphase shift accumulated by the electrons in the ZBA regime. We attribute this effect tothe universal phase shift that electrons accumulate when crossing a Kondo singlet, reinforcingthat the debated origin of the ZBA lies in Kondo physics.Finally, we adapted the SGM technique to the study of thermoelectric transport in QPCs,and for the first time imaged interferences of electrons driven by a temperature difference
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Lehnen, Stephan [Verfasser]. "Investigation of light propagation in thin-film silicon solar cells by dual-probe scanning near-field optical microscopy / Stephan Lehnen." Aachen : Hochschulbibliothek der Rheinisch-Westfälischen Technischen Hochschule Aachen, 2015. http://d-nb.info/1114841439/34.
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Jia, Baohua, and n/a. "A study on the complex evanescent focal region of a high numerical aperture objective and its applications." Swinburne University of Technology, 2006. http://adt.lib.swin.edu.au./public/adt-VSWT20070205.150740.
Full textAbstract:
In recent years, optical near-field has received an ever-increasing attention owing to
its ability to localise optical signals beyond the diffraction limit. Optical near-field is
a non-propagating field existing in the close vicinity of a matter within a range less
than the wavelength of the illumination light and it carries the high spatial frequency
information showing the fine details of the matter.
An optical near-field can be generated by a near-field optical microscope with a
nano-aperture or a metal-coated fibre tip. However, common difficulties associated
with this approach, such as a fragile probe, a low throughput and signal-to-noise ratio,
and a slow response of gap controlling between the probe and the sample, make it
less applicable. Alternatively, optical near-field can be produced by total internal
reflection (TIR) occurring at the interface of a prism, which is capable of localising
the electromagnetic (EM) field in the close vicinity of the interface. However, in this
geometry, no confinement of the field can be achieved in the transverse direction,
whereas, in most applications such as optical trapping, micro-fabrication and optical
data storage, a transverse confinement of the light field is essential.
In order to achieve a transverse confinement of the light field, maintaining the
high spatial resolution of the optical near-field, and at the same time eliminating
the drawbacks associated with the conventional near-field optical microscope, a novel
near-field probe based on a high numerical aperture (NA) TIR objective combined
with annular illumination has been developed recently. In this arrangement, an
obstruction disk is inserted at the back aperture of the objective to block the light
with a convergence angle lower than the critical angle determined by the refractive
indices of the two media, resulting in a pure focused evanescent field in the second
medium.
The evanescent field produced by this method provides a useful tool for studying
light-matter interaction at the single molecule level not only because of its high
resolution but also due to its inherent merits such as no distance regulation, no heating
effect and simple experimental setup. But, the most significant advantage that makes
this method unique and superior to the other approaches in terms of producing the
optical near-field is that it allows the dynamic control of the focal field by simply
modulating the phase or amplitude or even the polarisation state of the incident beam
before it enters the objective so that complex illumination beams can be generated,
whereas in other fibre probe based approaches this goal is extremely difficult to achieve.
To make use of such a novel near-field probe, a thorough theoretical and
experimental investigation is required. A complete knowledge of the focused evanescent
field is a prerequisite for a wide range of applications including single molecule
detection, Raman spectroscopy, near-field non-linear imaging and near-field trapping.
Therefore, it is not only necessary but also urgent to exploit the focusing properties
of a focused evanescent field under complex field illumination both experimentally and
theoretically and this is the major aim of this thesis.
The complex fields, which are of particular interest in this thesis, are the radially
polarised beam and the Laguerre-Gaussian (LG) beam, because the former owns a
more compact circularly symmetric field distribution in the focal region when focused
by a high NA objective, while the latter is capable of rotating a trapped particle
by transferring the orbital angular momentum. Combining them with the focused
evanescent field is potentially able to induce novel functions in the near-field region,
which cannot be fulfilled by other near-field approaches. In this thesis, in order to
generate these two types of beams, a single liquid crystal spatial light modulator
(LCSLM) is employed to produce useful phase modulation to the incident beam.
Experimental characterisation of an evanescent focal spot is performed with
scanning near-field optical microscopy (SNOM), which is capable of providing the direct
mapping of the focused evanescent field not only because of its high spatial resolution
and its ability to detect the near-field and far-field signals simultaneously, but also due
to the motion of the piezzo-stage enables a three-dimensional characterisation of the
evanescent focal spot.
In this thesis, a SNOM system with an aluminum coated aperture probe is
implemented. The field distributions at both the interface and parallel planes with
a small distance away from the interface are obtained. To verify the applicability of
SNOM as a characterisation methodology, the field distribution in the focal region
of a high NA objective illuminated by a linearly polarised plane wave is measured
first. A focus splitting along the direction of incident polarisation is observed threedimensionally
near the interface under such a circumstance. It has been demonstrated
that the depolarisation effect plays an important role in determining the coupling
behaviour of the light into the fibre probe of SNOM. The good match between the
experimental results and theoretical predications confirms the validity of SNOM.
Theoretical investigation of a tightly focused radially polarised beam is undertaken
based on the vectorial-Debye diffraction theory because under the tight focusing of a
high NA objective, the vectorial nature of the highly localised field has to be carefully
considered in order to represent the field distribution accurately. The calculations
on the focusing properties of a radially polarised beam suggest that the longitudinal
field component in the focal region plays a dominant role in determining the overall
field distribution. Direct measurement of the focused evanescent radially polarised
beam in a three-dimensional manner near the interface is performed with SNOM. A
highly localised focal spot is achieved in the close vicinity of the coverglass. The
measured intensity distributions from SNOM show that correction of the focal spot
deformation associated with a linearly polarised beam is achieved by taking advantage
of the radially symmetric focal spot of a radially polarised beam. A smaller focal spot is
acquired due to the dominant longitudinal polarisation component in the focal region,
which possesses a more compact focal intensity distribution than that of the overall
field. The experimental results demonstrate a good agreement with the theoretical
expectations.
The fact that a radially polarised beam is capable of eliminating the focus
deformation often presented in the focal region of a high NA objective when a linearly
polarised beam is employed can be very useful in many applications, including microfabrication
using two-photon photopolymerisation technique. The theoretical study
on the two-photon point spread function (PSF) of a radially polarised beam indicates
that the focus elongation and splitting associated with a linearly polarised beam are
eliminated and the achievable lateral size of the focal spot is approximately a quarter
of the illumination wavelength, which is less than half of that under the illumination
of a linearly polarised beam. A further reductiont of the lateral size can be expected
by using annular radial beam illumination.
The investigation on the focusing properties of LG beams has also been one of
the major tasks of this thesis. Theoretical investigations of a focused evanescent LG
beam suggest that the phase shift induced by the boundary effect when a light beam
passes the interface satisfying TIR condition plays a vital role in determining the
overall shape of the total field distribution. A severe focal intensity deformation is
predicted theoretically in the case of focused evanescent LG beam illumination, which
might involve new physical phenomena when applied in the near-field trapping. Such
a focal intensity deformation is evidenced experimentally by the direct mapping result
obtained from the SNOM probe. A quantitative cross-section comparison with the
theoretical predication is conducted, which demonstrates a good agreement.
To achieve a controllable optical trap and rotation in the near-field region, complex
optical fields such as LG beams carrying orbital angular momentum, have been induced
for the manipulation of a polystyrene particle. The influence of the focal intensity
deformation on a near-field trapping has been thoroughly investigated. Rotation
motion of the particle is examined by mapping the two-dimensional (2D) transverse
trapping efficiency of the particle. Theoretical investigation reveals that a significant
tangential force component is generated on the particle when it is illuminated by a
focused evanescent LG beam. Such findings may prove useful in introducing a rotation
mechanism in near-field trapping.
The research investigations and methodologies described in this thesis provide a new
approach to characterise the near-field focal spot under complex field illumination.
It enhances the understanding of the novel near-field probe, thus opening the
pathway for numerous near-field applications including optical trapping, two-photon
excitation (photopolymerisation) and spectroscopy. The focal field rotation phenomena
demonstrated in this thesis may prove particularly beneficial in introducing a rotation
mechanism in near-field trapping using a focused evanescent field.
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Cao, Zhao [Verfasser], Thomas [Akademischer Betreuer] Taubner, and Uwe [Akademischer Betreuer] Rau. "High-resolution photocurrent mapping of thin-film silicon solar cells using scanning near-field optical microscopy / Zhao Cao ; Thomas Taubner, Uwe Rau." Aachen : Universitätsbibliothek der RWTH Aachen, 2021. http://d-nb.info/1239116829/34.
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Eftekhar, Ali Asghar. "Nanoscale light-matter interactions in the near-field of high-Q microresonators." Diss., Georgia Institute of Technology, 2011. http://hdl.handle.net/1853/45900.
Full textAbstract:
The light-matter interaction in the near-field of high-Q resonators in SOI and SiN platforms is studied. The interactions of high-Q traveling-wave resonators with both resonant and non-resonant nanoparticles are studied and different applications based on this enhanced interactions in near-field such as high-resolution imaging of mode profile of high-Q resonators, label-free sensing, optical trapping, and SERS sensing are investigated. A near-field imaging system for the investigation of the near-field phenomena in the near-field of high-Q resonators is realized. A new technique for high-resolution imaging of the optical modes in high-Q resonators based on the near-field perturbation is developed that enables to achieve a very high resolution (< 10 nm) near-field image. The prospect of the high Q resonators on SOI platform for highly multiplexed label-free sensing and the effect of different phenomena such as the analyte drift and diffusion and the binding kinetics are studied. Also, the possibility of enhancing nanoparticle binding to the sensor surface using optical trapping is investigated and the dynamic of a nanoparticle in the high-Q resonator optical trap is studied. Furthermore, the interaction between a resonant nanoparticle with a high-Q microdisk resonator and its application for SERS sensing is studied. A model for interaction of resonant nanoparticles with high-Q resonators is developed and the optimal parameters for the design of coupled microdisk resonator and a plasmonic nanoparticle are calculated. The possible of resonant plasmonic nanoparticle trapping and alignment in an SiN microdisk resonator optical trap is also shown.