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Journal articles on the topic 'Scan testing'

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Author: Grafiati
Published: 10 December 2022
Last updated: 28 January 2023

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1

Maunder, Colin. "Boundary-scan testing." Microprocessors and Microsystems 17, no. 5 (June 1993): 258. http://dx.doi.org/10.1016/0141-9331(93)90001-n.

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2

Sachdev, M. "Testing Defects in Scan Chains." IEEE Design and Test of Computers 12, no. 4 (1995): 45. http://dx.doi.org/10.1109/mdt.1995.473312.

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3

Sachdev, M. "Testing defects in scan chains." IEEE Design & Test of Computers 12, no. 4 (1995): 45–51. http://dx.doi.org/10.1109/54.491237.

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4

Arvaniti, Efi, and Yiorgos Tsiatouhas. "Low-Power Scan Testing: A Scan Chain Partitioning and Scan Hold Based Technique." Journal of Electronic Testing 30, no. 3 (May 22, 2014): 329–41. http://dx.doi.org/10.1007/s10836-014-5453-9.

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5

Mojtabavi Naeini, Mahshid, and Chia Yee Ooi. "A Novel Scan Architecture for Low Power Scan-Based Testing." VLSI Design 2015 (April 22, 2015): 1–13. http://dx.doi.org/10.1155/2015/264071.

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Test power has been turned to a bottleneck for test considerations as the excessive power dissipation has serious negative effects on chip reliability. In scan-based designs, rippling transitions caused by test patterns shifting along the scan chain not only elevate power consumption but also introduce spurious switching activities in the combinational logic. In this paper, we propose a novel area-efficient gating scan architecture that offers an integrated solution for reducing total average power in both scan cells and combinational part during shift mode. In the proposed gating scan structure, conventional master/slave scan flip-flop has been modified into a new gating scan cell augmented with state preserving and gating logic that enables average power reduction in combinational logic during shift mode. The new gating scan cells also mitigate the number of transitions during shift and capture cycles. Thus, it contributes to average power reduction inside the scan cell during scan shifting with low impact on peak power during capture cycle. Simulation results have shown that the proposed gating scan cell saves 28.17% total average power compared to conventional scan cell that has no gating logic and up to 44.79% compared to one of the most common existing gating architectures.
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6

Touati, Aymen, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda, and Etienne Auvray. "Scan-Chain Intra-Cell Aware Testing." IEEE Transactions on Emerging Topics in Computing 6, no. 2 (April 1, 2018): 278–87. http://dx.doi.org/10.1109/tetc.2016.2624311.

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7

Xijiiang Lin, R. Press, J. Rajski, P. Reuter, T. Rinderknecht, B. Swanson, and N. Tamarapalli. "High-frequency, at-speed scan testing." IEEE Design & Test of Computers 20, no. 5 (September 2003): 17–25. http://dx.doi.org/10.1109/mdt.2003.1232252.

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8

Dervisoglu, B. I. "Scan-path architecture for pseudorandom testing." IEEE Design & Test of Computers 6, no. 4 (August 1989): 32–48. http://dx.doi.org/10.1109/54.32420.

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9

Kavousianos, Xrysovalantis, Dimitris Bakalis, and Dimitris Nikolos. "Efficient partial scan cell gating for low-power scan-based testing." ACM Transactions on Design Automation of Electronic Systems 14, no. 2 (March 2009): 1–15. http://dx.doi.org/10.1145/1497561.1497571.

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10

Li, Jia, Yu Hu, and XiaoWei Li. "Scan chain design for shift power reduction in scan-based testing." Science China Information Sciences 54, no. 4 (February 28, 2011): 767–77. http://dx.doi.org/10.1007/s11432-011-4205-z.

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11

Huh, Kyung-Hoi, Yong-Seok Kang, and Sungho Kang. "Efficient Path Delay Testing Using Scan Justification." ETRI Journal 25, no. 3 (June 9, 2003): 187–94. http://dx.doi.org/10.4218/etrij.03.0102.0304.

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12

Huang, T. C., and K. J. Lee. "Token scan cell for low power testing." Electronics Letters 37, no. 11 (2001): 678. http://dx.doi.org/10.1049/el:20010463.

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13

Doumanidis,, C. C. "Thermomechanical Modeling and Testing of Scan Weldments." Journal of the Mechanical Behavior of Materials 6, no. 1 (December 1995): 1–10. http://dx.doi.org/10.1515/jmbm.1995.6.1.1.

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14

Zhong, Fei, Wei Zhang, Biao Qiang Jiao, and Yue Xian Zhong. "Survey of Materials Testing Using Ultrasonic." Advanced Materials Research 146-147 (October 2010): 412–16. http://dx.doi.org/10.4028/www.scientific.net/amr.146-147.412.

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In this paper, ultrasonic materials testing researches are reviewed. The latest progress of ultrasonic testing technology is introduced, including water-squirting ultrasonic C-scan testing, laser ultrasound, ultrasonic feature scan imaging, signal processing and pattern recognition technology in the application of ultrasonic testing.
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15

Ma, Hong Wei, Ming Dong, Yuan Chen, and Qing Hua Mao. "Development of Ultrasonic Automatic Testing System for Flaws of Rotary Parts." Applied Mechanics and Materials 128-129 (October 2011): 575–79. http://dx.doi.org/10.4028/www.scientific.net/amm.128-129.575.

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In order to conquer the disadvantages of undetection, misjudgment and low-efficiency in ultrasonic A-scan testing for rotary parts, an ultrasonic automatic imaging system was developed, and automatic scan device was specially designed for rotary parts. Moreover, the testing software was programmed by LabWindows/CVI, which achieves the acquisition and processing of ultrasonic signals, and displays A, B, C, D and P-scan image. On the basis of storing A-scan data and transforming non-isotropic resolution B-scan image into isotropic one, P-scan imaging is realized. Medium filtering was applied to A-scan signal and C-scan image and the Signal-to-Noise is improved. The experimental results show that this system has well achieved numeralization, automatization and imaging of ultrasonic testing.
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16

Choi, Yoon-Hwa, and Edward Jung. "Configuring a boundary scan chain for optimal testing of non-scan logic clusters." International Journal of Electronics 87, no. 3 (March 2000): 281–91. http://dx.doi.org/10.1080/002072100132183.

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17

Gong, Yin Shui, and Hui Yun Li. "FPGA Based Testing Method to Improve Digital IC Testability." Applied Mechanics and Materials 130-134 (October 2011): 3920–23. http://dx.doi.org/10.4028/www.scientific.net/amm.130-134.3920.

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With the development of integrated circuit technology, design for test (DFT) is on the agenda. In this paper, we propose a new method that the non-test part of a SIP chip can be easily tested with the boundary-scan test utilizing the boundary scan chain of the FPGA. The problem of no boundary scan test structure in one (or more) chip in a system-in-package (SIP) can be solved by connecting the interconnection (s) to be tested to the FPGA to form an enlarged boundary scan daisy chain.
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18

Kim, Jung-Tae, In-Soo Kim, Keon-Ho Lee, Yong-Hyun Kim, Chul-Ki Baek, Kyu-Taek Lee, and Hyoung-Bok Min. "A Novel High Performance Scan Architecture with Dmuxed Scan Flip-Flop (DSF) for Low Shift Power Scan Testing." Journal of Electrical Engineering and Technology 4, no. 4 (December 1, 2009): 559–65. http://dx.doi.org/10.5370/jeet.2009.4.4.559.

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19

Rahman, Md Siddiqur, Yoshitaka Nagai, H. Akiko Popiel, Muzahed Uddin Ahmed, Md Jalal Uddin, and Talsushi Toda. "Genetic testing for Spinocerebellar Ataxias (SCA) in Parkinsonism." Bangladesh Journal of Neuroscience 28, no. 1 (November 30, 2013): 16–23. http://dx.doi.org/10.3329/bjn.v28i1.17188.

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Objective: The study was conducted to find out Spinocerebellar Ataxias (SCA) by genetic analysis from those presenting with parkinsonism in the Neurology department of Mymensingh Medical College.Materials and methods: A sample of about 5ml blood was collected by venipuncture in EDTA tube with informed consent from the patients following institutional ethics committee approval by genetic study from 7 healthy people and 9 patients. The neurological disorder along with a complete physical and/or psychological, as well as family history and demographic data was recorded with a prescribed questionnaire by the neurologists of Mymensingh Medical College. Extraction of genomic DNA from the venous blood using FlexiGene DNA kit (Qiagen, Japan) was performed in Department of Medicine, Bangladesh Agricultural University, Mymensingh 2202, Bangladesh. The extracted DNA was stored and accumulated and then these DNA were sent to Division of Clinical Genetics, Department of Medical Genetics, Osaka University Medical School, Suita, Osaka 565 0871, Japan for PCR and further analysis. PCR amplification of the CAG repeat was performed for the SCA1, SCA2, SCA3, SCA6 loci using primers SCA1N-F1 and SCA1N-R1, SCA2-F1 and SCA2-R1, MJDF1 and MJDR1, SCA6-F1 and SCA6-R1, respectively.Results: SCA1 PCR of both healthy individual and suspected PD patients DNA is about 250 bp (no. of CAG repeats=36). SCA2 PCR products reveal the DNA products of about 150 bp (no. of CAG repeats=23) except one patient that we suspected and it was sequenced and revealed 175bp (no. of CAG repeats=30). SCA3 PCR product size of both healthy individual and patient DNA is within about 250 (no. of CAG=11) to 300 bp (no. of CAG repeats=28) except one patient which is about 320bp and its CAG repeats is about 34. SCA6 PCR product size of both healthy individual and patient DNA is about 150bp (no. of CAG=16).Conclusion: This is the first time from Bangladesh regarding the range of CAG repeats in patients as well as healthy individual.
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20

P, Reshma, and M. Geetha Priya. "Power Management During Scan Based Sequential Circuit Testing." Advanced Computing: An International Journal 2, no. 3 (May 31, 2011): 9–20. http://dx.doi.org/10.5121/acij.2011.2302.

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21

Kishinevsky, M., A. Kondratyev, L. Lavagno, A. Saldanha, and A. Taubin. "Partial-scan delay fault testing of asynchronous circuits." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 17, no. 11 (1998): 1184–99. http://dx.doi.org/10.1109/43.736191.

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22

Dettmer, Roger. "JTAG—setting the standard for boundary-scan testing." IEE Review 35, no. 2 (1989): 49. http://dx.doi.org/10.1049/ir:19890023.

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23

Haga, Susanne B., and Ariel Kantor. "Horizon Scan Of Clinical Laboratories Offering Pharmacogenetic Testing." Health Affairs 37, no. 5 (May 2018): 717–23. http://dx.doi.org/10.1377/hlthaff.2017.1564.

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24

Vinoski, S. "RISE++: a symbolic environment for scan-based testing." IEEE Design & Test of Computers 10, no. 2 (June 1993): 46–54. http://dx.doi.org/10.1109/54.211528.

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25

Hosseinabady, Mohammad, Shervin Sharifi, Fabrizio Lombardi, and Zainalabedin Navabi. "A Selective Trigger Scan Architecture for VLSI Testing." IEEE Transactions on Computers 57, no. 3 (2008): 316–28. http://dx.doi.org/10.1109/tc.2007.70806.

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26

Bareisa, Eduardas, Vacius Jusas, Kestutis Motiejunas, and Rimantas Seinauskas. "Delay fault testing using partial multiple scan chains." Microelectronics Reliability 53, no. 12 (December 2013): 2070–77. http://dx.doi.org/10.1016/j.microrel.2013.07.002.

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27

Miles, J. R. "Testing terminated printed circuit interconnections using boundary scan." Electronics Letters 29, no. 3 (1993): 294. http://dx.doi.org/10.1049/el:19930201.

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28

Yau, Chi W., James Beausang, F. Edward Crane, Najml T. Jarwala, and Rodham E. Tulloss. "Boundary-Scan Testing for Electronic Subassemblies and Systems." AT&T Technical Journal 73, no. 2 (March 4, 1994): 40–48. http://dx.doi.org/10.1002/j.1538-7305.1994.tb00577.x.

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29

Dong Xiang, Dianwei Hu, Qiang Xu, and A. Orailoglu. "Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 28, no. 7 (July 2009): 1101–5. http://dx.doi.org/10.1109/tcad.2009.2018775.

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30

Xiang, Dong, Kaiwei Li, Hideo Fujiwara, Krishnaiyan Thulasiraman, and Jiaguang Sun. "Constraining Transition Propagation for Low-Power Scan Testing Using a Two-Stage Scan Architecture." IEEE Transactions on Circuits and Systems II: Express Briefs 54, no. 5 (May 2007): 450–54. http://dx.doi.org/10.1109/tcsii.2007.892393.

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31

Freiling, Isabelle, and Lisa Weidmuller. "Scan method tracks reader attention, engagement." Newspaper Research Journal 38, no. 4 (November 14, 2017): 449–61. http://dx.doi.org/10.1177/0739532917739874.

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A methodological comparison was conducted between copy testing, eye-tracking and a relatively new scan method, where panelists record where they stop reading a news item. Results show: news item characteristics that proved most influential in previous research also significantly affect reading behavior measured with the scan method. By being precise and more practicable than copy testing and eye-tracking, the scan method can help the struggling newspaper industry to better understand their readers.
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32

Lee, Sangjun, Kyunghwan Cho, Jihye Kim, Jongho Park, Inhwan Lee, and Sungho Kang. "Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor Networks." Sensors 21, no. 18 (September 12, 2021): 6111. http://dx.doi.org/10.3390/s21186111.

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Cryptographic circuits generally are used for applications of wireless sensor networks to ensure security and must be tested in a manufacturing process to guarantee their quality. Therefore, a scan architecture is widely used for testing the circuits in the manufacturing test to improve testability. However, during scan testing, test-power consumption becomes more serious as the number of transistors and the complexity of chips increase. Hence, the scan chain reordering method is widely applied in a low-power architecture because of its ability to achieve high power reduction with a simple architecture. However, achieving a significant power reduction without excessive computational time remains challenging. In this paper, a novel scan correlation-aware scan cluster reordering is proposed to solve this problem. The proposed method uses a new scan correlation-aware clustering in order to place highly correlated scan cells adjacent to each other. The experimental results demonstrate that the proposed method achieves a significant power reduction with a relatively fast computational time compared with previous methods. Therefore, by improving the reliability of cryptography circuits in wireless sensor networks (WSNs) through significant test-power reduction, the proposed method can ensure the security and integrity of information in WSNs.
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33

Wu, Wei, Ling Yun Zhu, and Guang Feng Wu. "Bond Interface Evaluation by Ultrasonic Testing and SEM for Radial Friction Welding Joints of Copper and Steel." Advanced Materials Research 328-330 (September 2011): 1457–61. http://dx.doi.org/10.4028/www.scientific.net/amr.328-330.1457.

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The bonds of T2 copper/50steel were studied by inertial radial friction welding techniques at different conditions. Ultrasonic C-scan testing was employed to evaluate the bonding situation. In order to verify the reliability of ultrasonic C-scan testing results, the optical microscope, SEM and shear test were used to analyse the microstructure and mechanical properties. It was found that ultrasonic C-scan testing was useful to evaluate the inertial radial friction welding joint situations by analyzing the ratio of good bonded area in the bond area of ultrasonic C-scan images. And the correctness of ultrasonic C-scan testing was testified by microstructure examination. Furthermore, it was concluded that enough metalline plastic deformation occurred, oxide film of joint was destroyed and constituent elements were mutually diffused sufficiently, when two stage pressure was employed and friction pressure 78 MPa, friction speed 3200r/min were used.
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34

Zheng, Xiang Ming, Jie Hu, and Yao Sheng Chen. "The Development of an Automatic Ultrasonic Non-Destructive Testing System." Applied Mechanics and Materials 599-601 (August 2014): 1120–23. http://dx.doi.org/10.4028/www.scientific.net/amm.599-601.1120.

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The testing principle of metal ultrasonic is using ultrasonic probe to scan in the work-piece surface, and acquire the probe of reflection signal which is sent to computer to analysis by the ultrasonic data acquisition card so as to detect and locate defects in surface of the parts. This system designed a unique scanning structure using the principle of ultrasonic detection and scans the hardware and software control system to realize internal shape detection for different shape of work-piece.
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35

Gooch, Robert, Lisa Bryski, and Ewa Courvoisier-Grzywacz. "Surviving a stressful MIBI scan." CJEM 15, no. 06 (November 2013): 392–96. http://dx.doi.org/10.2310/8000.2013.130997.

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ABSTRACTDipyridamole/technetium sestamibi scans (more commonly known as MIBI scans, an acronym for methoxyisobutyl isonitrile) are used commonly for the diagnosis and risk stratification of coronary artery disease. Adverse events from MIBI scans are extremely rare. We present the case of a 64-year-old man who was successfully resuscitated after two asystolic episodes following dipyridamole infusion for a MIBI scan. The second asystolic episode occurred in the emergency department 40 minutes after the patient had been transferred from the Cardiac Stress Test Laboratory. To our knowledge, there are no previous reports of patients having two discrete asystolic episodes or an asystolic episode as delayed as we report after a MIBI scan. Our case illustrates why emergency physicians should be aware of the potential for asystole following MIBI scanning and why aminophylline, the antidote for dipyridamole, should be readily available in emergency departments that could see patients after pharmacologic stress testing. Patients who become asystolic following dipyridamole infusion likely require prolonged cardiac monitoring, given the potential for further episodes after periods of hemodynamic stability.
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36

Du, Min Jie, Jin Yan Ai, Li Min Liu, and Sai Zhu. "Summarization on the Techniques of Testing Electronical System." Advanced Materials Research 433-440 (January 2012): 6437–40. http://dx.doi.org/10.4028/www.scientific.net/amr.433-440.6437.

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With the fast development of electronic industry,the techniques of testing electronical system have varied from traditional functional test to structured test accordingly.The principel of functional test is presented in this paper and the representative techniques of structured test, as in-circuit test(ICT),boundary-scan test(BST),build-in self-test(BIST) and scan-path test,are explored subsequently.Finally,the developmenting trends in the future are looked forward to.
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37

Sundar, Dr M. Shyam. "Area Efficient Thermal Aware Testing Using Scan Chain Architecture." International Journal for Research in Applied Science and Engineering Technology V, no. XI (November 23, 2017): 1842–49. http://dx.doi.org/10.22214/ijraset.2017.11266.

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38

Ben Ahmed, Asma, Olfa Mosbahi, Mohamed Khalgui, and Zhiwu Li. "Boundary Scan Extension for Testing Distributed Reconfigurable Hardware Systems." IEEE Transactions on Circuits and Systems I: Regular Papers 66, no. 7 (July 2019): 2699–708. http://dx.doi.org/10.1109/tcsi.2019.2894441.

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39

Lee, Kuen-Jong, Tian-Pao Lee, Rong-Chang Wen, and Zhe-Yi Lin. "Analogue boundary scan architecture for DC and AC testing." Electronics Letters 32, no. 8 (1996): 704. http://dx.doi.org/10.1049/el:19960501.

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40

Bassett, R. W., M. E. Turner, J. H. Panner, P. S. Gillis, S. F. Oakland, and D. W. Stout. "Boundary-scan design principles for efficient LSSD ASIC testing." IBM Journal of Research and Development 34, no. 2.3 (March 1990): 339–54. http://dx.doi.org/10.1147/rd.342.0339.

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41

Bleeker, Harry. "An economic, hands-on start to boundary-scan testing." Microprocessors and Microsystems 17, no. 5 (June 1993): 299–303. http://dx.doi.org/10.1016/0141-9331(93)90007-t.

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42

Lin, Wei, and Wenlong Shi. "A new circuit for at-speed scan SoC testing." Journal of Semiconductors 34, no. 12 (December 2013): 125012. http://dx.doi.org/10.1088/1674-4926/34/12/125012.

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43

Xu, Zhen Ying, Shu Yuan Gao, Jun Huang, and Yun Wang. "Non-Destructive Testing of Polycrystalline Silicon Solar Panel by Scan Acoustic Microscopy." Advanced Materials Research 764 (September 2013): 9–13. http://dx.doi.org/10.4028/www.scientific.net/amr.764.9.

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The inner structure and defects of the silicon panel will influence the transfer efficiency and the stability of the polycrystalline solar cells, thus the non-destructive testing of the silicon panel is very important. In this paper, a Scan Acoustic Microscopy is applied to test the inner structure of polycrystalline silicon solar panel. From the grey image of C-Scan by the microscopy, the amplitude distribution of the bottom wave generated by the interaction between the inner grains of the polycrystalline silicon and the acoustic beam can be seen clearly. Furthermore, the defects as well as their size and position can also be tested by A-Scan, B-Scan and C-Scan with high resolution and high accuracy. The experiment results show that it is a good non-destructive method to test and evaluate the quality of the inner structure of polycrystalline silicon solar panel.
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44

Lopes-Cendes, Iscia, Carlos E. Steiner, Isabel Silveira, Walter Pinto-Junior, Jayme A. Maciel, and Guy A. Rouleau. "Clinical and molecular characteristics of a Brazilian family with spinocerebellar ataxia type 1." Arquivos de Neuro-Psiquiatria 54, no. 3 (September 1996): 412–18. http://dx.doi.org/10.1590/s0004-282x1996000300009.

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The spinocerebellar ataxias (SCAs) are a clinically and genetically heterogeneous group of late onset neurodegenerative disorders. To date, seven different genes causing autosomal dominant SCA have been mapped: SCA1, SCA2, Machado-Joseph disease (MJD)/SCA3, SCA4, SCA5, SCA7 and dentatorubropallidoluysian atrophy (DRPLA). Expansions of an unstable trinucleotide CAG repeat cause three of these disorders: SCA1, MJD/SCA3 and DRPLA. We studied one Brazilian family segregating an autosomal dominant type of SCA. A total of ten individuals were examined and tested for the presence of the SCA1, MJD and DRPLA mutations. Three individuals, one male and two females, were considered affected based on neurological examination; ages at onset were: 32, 36 and 41 years. The first complaint in all three patients was gait ataxia which progressed slowly over the years. Six individuals showed one allele containing an expanded CAG repeat in the SCA1 gene. The mean size of the expanded allele was 48.2 CAG units. Instability of the expanded CAG tract was seen in the two transmissions that were observed in this family. In both occasions there was a contraction of the CAG tract. Our study demonstrates that SCA1 occurs in the Brazilian population. In addition, our results stress the importance of molecular studies in the confirmation of diagnosis and for pre-symptomatic testing in SCAs.
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45

Kim, Jeong Guk, Jong Duk Chung, Joon Hyun Lee, Yeon Uk Jeong, Yong Ki Hong, Won Kyung Kim, Jang Sik Pyun, and Dae Sung Bae. "Damage Characterization of Ceramic Matrix Composites (CMCs) during Tensile Testing." Key Engineering Materials 297-300 (November 2005): 2533–38. http://dx.doi.org/10.4028/www.scientific.net/kem.297-300.2533.

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Nondestructive evaluation (NDE) techniques were used for the tensile damage characterization in ceramic matrix composites (CMCs). Ultrasonic testing (UT) and infrared (IR) thermography were employed to assess defects and/or damage evolution before and during mechanical testing. Prior to tensile testing, a UT C-scan and a xenon flash method were performed to obtain initial defect information in light of UT C-scans and thermal diffusivity maps, respectively. An IR camera was used for in-situ monitoring of progressive damages. The IR camera measured temperature changes during tensile testing. This paper has presented the feasibility of using NDE techniques to interpret structural performance of CMCs.
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46

Krstulović-Opara, Lovre, Petra Bagavac, Antun Božanić, and Željko Domazet. "NDT of Composites Based on Active Infrared Thermography and Ultrasound Testing." Journal of Energy - Energija 70, no. 2 (June 30, 2021): 3–6. http://dx.doi.org/10.37798/202170210.

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Composite materials, such as glass and carbon reinforced ones, are characterized by inhomogeneous structure that requires non destructive testing based on uncommon evaluation methods. The presented approach is based on the active infrared thermography, supported by the A-scan ultrasound testing. The heat wave propagation induced by halogen or xenon bulbs, due to the differences in thermal conductivity, reveals material structure and anomalies. In our previous work we have developed several signal processing and depth evaluation methods, but the real engineering approach requires additional approval testing methods such as the A-scan ultrasound is. The A-scan ultrasound, based on the low frequency probe, enables approval of anomalies located by infrared thermography. The active infrared thermography, as a full field method, enables evaluation of the whole scanned area. The A-scan, as a point-wise method, does not provide the image of whole area of interest. By combining these two methods, robust and reliable approach to analysis of composite structure is enabled.
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47

Stanbridge, A. B., D. J. Ewins, and A. Z. Khan. "Modal Testing Using Impact Excitation and a Scanning LDV." Shock and Vibration 7, no. 2 (2000): 91–100. http://dx.doi.org/10.1155/2000/527389.

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If a laser Doppler vibrometer is used in a continuously-scanning mode to measure the response of a vibrating structure, its output spectrum contains side-bands from which the response mode shape, as defined along the scan line, may be obtained. With impact excitation, the response is the summation of a set of exponentially-decaying sinusoids which, in the frequency domain, has peaks at the natural frequencies and at `sideband' pseudo-natural frequencies, spaced at multiples of the scan frequency. Techniques are described for deriving natural mode shapes from these, using standard modal analysis procedures. Some limitations as to the types of mode which can be analysed are described. The process is simple and speedy, even when compared with a normal point-by-point impact test survey. Information may also be derived, using a circular scan, on the direction of vibration, and angular vibration, at individual points.
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48

Yamato, Yuta, Kohei Miyase, Seiji Kajihara, Xiaoqing Wen, Laung-Terng Wang, and Michael A. Kochte. "LCTI–SS: Low-Clock-Tree-Impact Scan Segmentation for Avoiding Shift Timing Failures in Scan Testing." IEEE Design & Test 30, no. 4 (August 2013): 60–70. http://dx.doi.org/10.1109/mdt.2012.2221152.

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49

Moro, Adriana, Renato Puppi Munhoz, Walter Oleschko Arruda, Salmo Raskin, and Hélio Afonso Ghizoni Teive. "Clinical relevance of "bulging eyes" for the differential diagnosis of spinocerebellar ataxias." Arquivos de Neuro-Psiquiatria 71, no. 7 (July 2013): 428–30. http://dx.doi.org/10.1590/0004-282x20130056.

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ObjectiveTo investigate the relevance of the clinical finding of bulging eyes (BE) in a large Brazilian cohort of spinocerebellar ataxias (SCA), to assess its importance in clinical differential diagnosis among SCA.MethodsThree hundred sixty-nine patients from 168 Brazilian families with SCA were assessed with neurological examination and molecular genetic testing. BE was characterized by the presence of eyelid retraction. Genetically ascertained SCA3 was detected in 167 patients, SCA10 in 68 patients, SCA2 in 20, SCA1 in 9, SCA7 in 6, and SCA6 in 3 patients.ResultsBE was detected in 123 patients with SCA (33.3%), namely 109 of the 167 SCA3 patients (65.3%) and in 5 of the others SCA patients (1 SCA10 patient, 2 SCA1 patients and 2 SCA2 patients).ConclusionBE was detected in the majority of patients with SCA3 (65.3%) and could be used with a clinical tool for the differential diagnosis of SCA.
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50

Prasad N, Nagendra, and Dr Kiran V. "I2C Master Scan Chain Insertion and Functional Coverage." International Journal of Research and Review 9, no. 11 (November 3, 2022): 54–59. http://dx.doi.org/10.52403/ijrr.20221108.

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I2C is a serial, bidirectional bus for communication that Philips Semiconductors created. only two bus lines are needed a (SDA) serial data line and a (SCL) serial clock line. With the addition of scan chains, a method for I2C Bus testing has been implemented in this study. In order to achieve the necessary requirements, the number of scan chain insertions is predetermined. The coverage of the Functions is also performed to verify the test bench. Keywords: I2C, Scan Chain, Coverage, Testing, Design for test
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