Journal articles on the topic 'Scan testing'
Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles
Consult the top 50 journal articles for your research on the topic 'Scan testing.'
Next to every source in the list of references, there is an 'Add to bibliography' button. Press on it, and we will generate automatically the bibliographic reference to the chosen work in the citation style you need: APA, MLA, Harvard, Chicago, Vancouver, etc.
You can also download the full text of the academic publication as pdf and read online its abstract whenever available in the metadata.
Browse journal articles on a wide variety of disciplines and organise your bibliography correctly.
Maunder, Colin. "Boundary-scan testing." Microprocessors and Microsystems 17, no. 5 (June 1993): 258. http://dx.doi.org/10.1016/0141-9331(93)90001-n.
Full textSachdev, M. "Testing Defects in Scan Chains." IEEE Design and Test of Computers 12, no. 4 (1995): 45. http://dx.doi.org/10.1109/mdt.1995.473312.
Full textSachdev, M. "Testing defects in scan chains." IEEE Design & Test of Computers 12, no. 4 (1995): 45–51. http://dx.doi.org/10.1109/54.491237.
Full textArvaniti, Efi, and Yiorgos Tsiatouhas. "Low-Power Scan Testing: A Scan Chain Partitioning and Scan Hold Based Technique." Journal of Electronic Testing 30, no. 3 (May 22, 2014): 329–41. http://dx.doi.org/10.1007/s10836-014-5453-9.
Full textMojtabavi Naeini, Mahshid, and Chia Yee Ooi. "A Novel Scan Architecture for Low Power Scan-Based Testing." VLSI Design 2015 (April 22, 2015): 1–13. http://dx.doi.org/10.1155/2015/264071.
Full textTouati, Aymen, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda, and Etienne Auvray. "Scan-Chain Intra-Cell Aware Testing." IEEE Transactions on Emerging Topics in Computing 6, no. 2 (April 1, 2018): 278–87. http://dx.doi.org/10.1109/tetc.2016.2624311.
Full textXijiiang Lin, R. Press, J. Rajski, P. Reuter, T. Rinderknecht, B. Swanson, and N. Tamarapalli. "High-frequency, at-speed scan testing." IEEE Design & Test of Computers 20, no. 5 (September 2003): 17–25. http://dx.doi.org/10.1109/mdt.2003.1232252.
Full textDervisoglu, B. I. "Scan-path architecture for pseudorandom testing." IEEE Design & Test of Computers 6, no. 4 (August 1989): 32–48. http://dx.doi.org/10.1109/54.32420.
Full textKavousianos, Xrysovalantis, Dimitris Bakalis, and Dimitris Nikolos. "Efficient partial scan cell gating for low-power scan-based testing." ACM Transactions on Design Automation of Electronic Systems 14, no. 2 (March 2009): 1–15. http://dx.doi.org/10.1145/1497561.1497571.
Full textLi, Jia, Yu Hu, and XiaoWei Li. "Scan chain design for shift power reduction in scan-based testing." Science China Information Sciences 54, no. 4 (February 28, 2011): 767–77. http://dx.doi.org/10.1007/s11432-011-4205-z.
Full textHuh, Kyung-Hoi, Yong-Seok Kang, and Sungho Kang. "Efficient Path Delay Testing Using Scan Justification." ETRI Journal 25, no. 3 (June 9, 2003): 187–94. http://dx.doi.org/10.4218/etrij.03.0102.0304.
Full textHuang, T. C., and K. J. Lee. "Token scan cell for low power testing." Electronics Letters 37, no. 11 (2001): 678. http://dx.doi.org/10.1049/el:20010463.
Full textDoumanidis,, C. C. "Thermomechanical Modeling and Testing of Scan Weldments." Journal of the Mechanical Behavior of Materials 6, no. 1 (December 1995): 1–10. http://dx.doi.org/10.1515/jmbm.1995.6.1.1.
Full textZhong, Fei, Wei Zhang, Biao Qiang Jiao, and Yue Xian Zhong. "Survey of Materials Testing Using Ultrasonic." Advanced Materials Research 146-147 (October 2010): 412–16. http://dx.doi.org/10.4028/www.scientific.net/amr.146-147.412.
Full textMa, Hong Wei, Ming Dong, Yuan Chen, and Qing Hua Mao. "Development of Ultrasonic Automatic Testing System for Flaws of Rotary Parts." Applied Mechanics and Materials 128-129 (October 2011): 575–79. http://dx.doi.org/10.4028/www.scientific.net/amm.128-129.575.
Full textChoi, Yoon-Hwa, and Edward Jung. "Configuring a boundary scan chain for optimal testing of non-scan logic clusters." International Journal of Electronics 87, no. 3 (March 2000): 281–91. http://dx.doi.org/10.1080/002072100132183.
Full textGong, Yin Shui, and Hui Yun Li. "FPGA Based Testing Method to Improve Digital IC Testability." Applied Mechanics and Materials 130-134 (October 2011): 3920–23. http://dx.doi.org/10.4028/www.scientific.net/amm.130-134.3920.
Full textKim, Jung-Tae, In-Soo Kim, Keon-Ho Lee, Yong-Hyun Kim, Chul-Ki Baek, Kyu-Taek Lee, and Hyoung-Bok Min. "A Novel High Performance Scan Architecture with Dmuxed Scan Flip-Flop (DSF) for Low Shift Power Scan Testing." Journal of Electrical Engineering and Technology 4, no. 4 (December 1, 2009): 559–65. http://dx.doi.org/10.5370/jeet.2009.4.4.559.
Full textRahman, Md Siddiqur, Yoshitaka Nagai, H. Akiko Popiel, Muzahed Uddin Ahmed, Md Jalal Uddin, and Talsushi Toda. "Genetic testing for Spinocerebellar Ataxias (SCA) in Parkinsonism." Bangladesh Journal of Neuroscience 28, no. 1 (November 30, 2013): 16–23. http://dx.doi.org/10.3329/bjn.v28i1.17188.
Full textP, Reshma, and M. Geetha Priya. "Power Management During Scan Based Sequential Circuit Testing." Advanced Computing: An International Journal 2, no. 3 (May 31, 2011): 9–20. http://dx.doi.org/10.5121/acij.2011.2302.
Full textKishinevsky, M., A. Kondratyev, L. Lavagno, A. Saldanha, and A. Taubin. "Partial-scan delay fault testing of asynchronous circuits." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 17, no. 11 (1998): 1184–99. http://dx.doi.org/10.1109/43.736191.
Full textDettmer, Roger. "JTAG—setting the standard for boundary-scan testing." IEE Review 35, no. 2 (1989): 49. http://dx.doi.org/10.1049/ir:19890023.
Full textHaga, Susanne B., and Ariel Kantor. "Horizon Scan Of Clinical Laboratories Offering Pharmacogenetic Testing." Health Affairs 37, no. 5 (May 2018): 717–23. http://dx.doi.org/10.1377/hlthaff.2017.1564.
Full textVinoski, S. "RISE++: a symbolic environment for scan-based testing." IEEE Design & Test of Computers 10, no. 2 (June 1993): 46–54. http://dx.doi.org/10.1109/54.211528.
Full textHosseinabady, Mohammad, Shervin Sharifi, Fabrizio Lombardi, and Zainalabedin Navabi. "A Selective Trigger Scan Architecture for VLSI Testing." IEEE Transactions on Computers 57, no. 3 (2008): 316–28. http://dx.doi.org/10.1109/tc.2007.70806.
Full textBareisa, Eduardas, Vacius Jusas, Kestutis Motiejunas, and Rimantas Seinauskas. "Delay fault testing using partial multiple scan chains." Microelectronics Reliability 53, no. 12 (December 2013): 2070–77. http://dx.doi.org/10.1016/j.microrel.2013.07.002.
Full textMiles, J. R. "Testing terminated printed circuit interconnections using boundary scan." Electronics Letters 29, no. 3 (1993): 294. http://dx.doi.org/10.1049/el:19930201.
Full textYau, Chi W., James Beausang, F. Edward Crane, Najml T. Jarwala, and Rodham E. Tulloss. "Boundary-Scan Testing for Electronic Subassemblies and Systems." AT&T Technical Journal 73, no. 2 (March 4, 1994): 40–48. http://dx.doi.org/10.1002/j.1538-7305.1994.tb00577.x.
Full textDong Xiang, Dianwei Hu, Qiang Xu, and A. Orailoglu. "Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 28, no. 7 (July 2009): 1101–5. http://dx.doi.org/10.1109/tcad.2009.2018775.
Full textXiang, Dong, Kaiwei Li, Hideo Fujiwara, Krishnaiyan Thulasiraman, and Jiaguang Sun. "Constraining Transition Propagation for Low-Power Scan Testing Using a Two-Stage Scan Architecture." IEEE Transactions on Circuits and Systems II: Express Briefs 54, no. 5 (May 2007): 450–54. http://dx.doi.org/10.1109/tcsii.2007.892393.
Full textFreiling, Isabelle, and Lisa Weidmuller. "Scan method tracks reader attention, engagement." Newspaper Research Journal 38, no. 4 (November 14, 2017): 449–61. http://dx.doi.org/10.1177/0739532917739874.
Full textLee, Sangjun, Kyunghwan Cho, Jihye Kim, Jongho Park, Inhwan Lee, and Sungho Kang. "Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor Networks." Sensors 21, no. 18 (September 12, 2021): 6111. http://dx.doi.org/10.3390/s21186111.
Full textWu, Wei, Ling Yun Zhu, and Guang Feng Wu. "Bond Interface Evaluation by Ultrasonic Testing and SEM for Radial Friction Welding Joints of Copper and Steel." Advanced Materials Research 328-330 (September 2011): 1457–61. http://dx.doi.org/10.4028/www.scientific.net/amr.328-330.1457.
Full textZheng, Xiang Ming, Jie Hu, and Yao Sheng Chen. "The Development of an Automatic Ultrasonic Non-Destructive Testing System." Applied Mechanics and Materials 599-601 (August 2014): 1120–23. http://dx.doi.org/10.4028/www.scientific.net/amm.599-601.1120.
Full textGooch, Robert, Lisa Bryski, and Ewa Courvoisier-Grzywacz. "Surviving a stressful MIBI scan." CJEM 15, no. 06 (November 2013): 392–96. http://dx.doi.org/10.2310/8000.2013.130997.
Full textDu, Min Jie, Jin Yan Ai, Li Min Liu, and Sai Zhu. "Summarization on the Techniques of Testing Electronical System." Advanced Materials Research 433-440 (January 2012): 6437–40. http://dx.doi.org/10.4028/www.scientific.net/amr.433-440.6437.
Full textSundar, Dr M. Shyam. "Area Efficient Thermal Aware Testing Using Scan Chain Architecture." International Journal for Research in Applied Science and Engineering Technology V, no. XI (November 23, 2017): 1842–49. http://dx.doi.org/10.22214/ijraset.2017.11266.
Full textBen Ahmed, Asma, Olfa Mosbahi, Mohamed Khalgui, and Zhiwu Li. "Boundary Scan Extension for Testing Distributed Reconfigurable Hardware Systems." IEEE Transactions on Circuits and Systems I: Regular Papers 66, no. 7 (July 2019): 2699–708. http://dx.doi.org/10.1109/tcsi.2019.2894441.
Full textLee, Kuen-Jong, Tian-Pao Lee, Rong-Chang Wen, and Zhe-Yi Lin. "Analogue boundary scan architecture for DC and AC testing." Electronics Letters 32, no. 8 (1996): 704. http://dx.doi.org/10.1049/el:19960501.
Full textBassett, R. W., M. E. Turner, J. H. Panner, P. S. Gillis, S. F. Oakland, and D. W. Stout. "Boundary-scan design principles for efficient LSSD ASIC testing." IBM Journal of Research and Development 34, no. 2.3 (March 1990): 339–54. http://dx.doi.org/10.1147/rd.342.0339.
Full textBleeker, Harry. "An economic, hands-on start to boundary-scan testing." Microprocessors and Microsystems 17, no. 5 (June 1993): 299–303. http://dx.doi.org/10.1016/0141-9331(93)90007-t.
Full textLin, Wei, and Wenlong Shi. "A new circuit for at-speed scan SoC testing." Journal of Semiconductors 34, no. 12 (December 2013): 125012. http://dx.doi.org/10.1088/1674-4926/34/12/125012.
Full textXu, Zhen Ying, Shu Yuan Gao, Jun Huang, and Yun Wang. "Non-Destructive Testing of Polycrystalline Silicon Solar Panel by Scan Acoustic Microscopy." Advanced Materials Research 764 (September 2013): 9–13. http://dx.doi.org/10.4028/www.scientific.net/amr.764.9.
Full textLopes-Cendes, Iscia, Carlos E. Steiner, Isabel Silveira, Walter Pinto-Junior, Jayme A. Maciel, and Guy A. Rouleau. "Clinical and molecular characteristics of a Brazilian family with spinocerebellar ataxia type 1." Arquivos de Neuro-Psiquiatria 54, no. 3 (September 1996): 412–18. http://dx.doi.org/10.1590/s0004-282x1996000300009.
Full textKim, Jeong Guk, Jong Duk Chung, Joon Hyun Lee, Yeon Uk Jeong, Yong Ki Hong, Won Kyung Kim, Jang Sik Pyun, and Dae Sung Bae. "Damage Characterization of Ceramic Matrix Composites (CMCs) during Tensile Testing." Key Engineering Materials 297-300 (November 2005): 2533–38. http://dx.doi.org/10.4028/www.scientific.net/kem.297-300.2533.
Full textKrstulović-Opara, Lovre, Petra Bagavac, Antun Božanić, and Željko Domazet. "NDT of Composites Based on Active Infrared Thermography and Ultrasound Testing." Journal of Energy - Energija 70, no. 2 (June 30, 2021): 3–6. http://dx.doi.org/10.37798/202170210.
Full textStanbridge, A. B., D. J. Ewins, and A. Z. Khan. "Modal Testing Using Impact Excitation and a Scanning LDV." Shock and Vibration 7, no. 2 (2000): 91–100. http://dx.doi.org/10.1155/2000/527389.
Full textYamato, Yuta, Kohei Miyase, Seiji Kajihara, Xiaoqing Wen, Laung-Terng Wang, and Michael A. Kochte. "LCTI–SS: Low-Clock-Tree-Impact Scan Segmentation for Avoiding Shift Timing Failures in Scan Testing." IEEE Design & Test 30, no. 4 (August 2013): 60–70. http://dx.doi.org/10.1109/mdt.2012.2221152.
Full textMoro, Adriana, Renato Puppi Munhoz, Walter Oleschko Arruda, Salmo Raskin, and Hélio Afonso Ghizoni Teive. "Clinical relevance of "bulging eyes" for the differential diagnosis of spinocerebellar ataxias." Arquivos de Neuro-Psiquiatria 71, no. 7 (July 2013): 428–30. http://dx.doi.org/10.1590/0004-282x20130056.
Full textPrasad N, Nagendra, and Dr Kiran V. "I2C Master Scan Chain Insertion and Functional Coverage." International Journal of Research and Review 9, no. 11 (November 3, 2022): 54–59. http://dx.doi.org/10.52403/ijrr.20221108.
Full text