Books on the topic 'Scan testing'
Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles
Consult the top 30 books for your research on the topic 'Scan testing.'
Next to every source in the list of references, there is an 'Add to bibliography' button. Press on it, and we will generate automatically the bibliographic reference to the chosen work in the citation style you need: APA, MLA, Harvard, Chicago, Vancouver, etc.
You can also download the full text of the academic publication as pdf and read online its abstract whenever available in the metadata.
Browse books on a wide variety of disciplines and organise your bibliography correctly.
K, Cheung Peter Y., ed. Boundary-scan interconnect diagnosis. Boston: Kluwer Academic, 2001.
Find full textParker, Kenneth P. The Boundary-Scan handbook. Boston: Kluwer Academic Publishers, 1992.
Find full textThe boundary-scan handbook. 3rd ed. Boston, Mass: Kluwer Academic Publishers, 2003.
Find full textSousa, José T. de. Boundary-scan interconnect diagnosis. Boston: Kluwer Academic Publishers, 2001.
Find full textJardine, P. N. The boundary-scan architecture standard IEEE-1149.1 (1990): The technology and its use. Leatherhead, Surrey, England: ERA Technology, 1993.
Find full textParker, Kenneth P. The boundary-scan handbook: Analog and digital. 2nd ed. Boston: Kluwer Academic Publishers, 1998.
Find full textParker, Kenneth P. The boundary-scan handbook: Analog and digital. 2nd ed. New York: Kluwer Academic, 2002.
Find full textden, Eijnden Peter van, and Jong Frans de, eds. Boundary-scan test: A practical approach. Dordrecht: Kluwer Academic Publishers, 1993.
Find full textParker, Kenneth P. The Boundary-Scan Handbook. 3rd ed. Springer, 2003.
Find full textSousa, José T. de, and Peter Y. K. Cheung. Boundary-Scan Interconnect Diagnosis. Springer, 2010.
Find full textSousa, José T. de, and Peter Y. K. Cheung. Boundary-Scan Interconnect Diagnosis (Frontiers in Electronic Testing). Springer, 2001.
Find full textM, Maunder Colin, and Tulloss Rodham E, eds. The Test access port and boundary-scan architecture. Los Alamitos, Calif: IEEE Computer Society Press, 1991.
Find full textBoard, IEEE Standards, and IEEE Computer Society. Test Technology Technical Committee., eds. IEEE standard test access port and boundary-scan architecture. New York, N.Y., USA: Institute of Electrical and Electronics Engineers, 1990.
Find full textJ, Turney William, and Chek-Chart Publications (Firm), eds. Scan tool and lab scope guide. [San Jose, Calif.]: Chek-Chart Publications, 1997.
Find full textInstitute Of Electrical and Electronics Engineers. IEEE Standard Test Access Port and Boundary-Scan Architecture: Includes Supplement (Includes Ieee Std 1149.1a-1993, Ieee Standard Test Access Port and Boundary-Scan Architecture). Institute of Electrical & Electronics Enginee, 1993.
Find full textIEEE Computer Society. Test Technology Standards Committee., Institute of Electrical and Electronics Engineers., IEEE Standards Board, and IEEE Standards Association, eds. IEEE standard test access port and boundary-scan architecture. New York: Institute of Electrical and Electronics Engineers, 2001.
Find full textEijnden, Peter van den, Frans de Jong, and Harry Bleeker. Boundary-Scan Test: A Practical Approach. Springer, 1992.
Find full textEijnden, Peter van den, Frans de Jong, and Harry Bleeker. Boundary-Scan Test: A Practical Approach. Springer, 2012.
Find full textAnalog and mixed-signal boundary-scan: A guide to the IEEE 1149.4 test standard. Boston: Kluwer Academic Publishers, 1999.
Find full textOsseiran, Adam. Analog and Mixed-Signal Boundary-Scan: A Guide To The Ieee 1149.4 Test Standard. Springer, 2010.
Find full textFlinter, Frances. Antenatal diagnosis and pre-implantation genetic testing. Edited by Neil Turner. Oxford University Press, 2018. http://dx.doi.org/10.1093/med/9780199592548.003.0302_update_001.
Full textOsseiran, Adam. Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149. 4 Test Standard. Springer London, Limited, 2013.
Find full textG, VanDyk Steven, Lockheed Martin Missiles & Space (Firm), NASA Glenn Research Center, and Aerospace Mechanisms Symposium (35th : 2001 : Mountain View, Calif.), eds. The role of bearing and scan mechanism life testing in flight qualification of the MODIS instrument. [Cleveland, Ohio]: National Aeronautics and Space Administration, Glenn Research Center, 2001.
Find full textG, VanDyk Steven, Lockheed Martin Missiles & Space (Firm), NASA Glenn Research Center, and Aerospace Mechanisms Symposium (35th : 2001 : Mountain View, Calif.), eds. The role of bearing and scan mechanism life testing in flight qualification of the MODIS instrument. [Cleveland, Ohio]: National Aeronautics and Space Administration, Glenn Research Center, 2001.
Find full textOsseiran, Adam. Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing). Springer, 1999.
Find full textJoniau, Steve, S. Van Bruwaene, J. Karnes, G. De Meerleer, P. Gontero, M. Spahn, and A. Briganti. High-risk prostate cancer. Edited by James W. F. Catto. Oxford University Press, 2017. http://dx.doi.org/10.1093/med/9780199659579.003.0066.
Full textUnited States. National Aeronautics and Space Administration., ed. MMPP Traffic Generator for the testing of the SCAR 2 Fast Packet Switch. [Washington, DC: National Aeronautics and Space Administration, 1995.
Find full textReview of Assessment and Testing - Report from SCAA to the Secretary of State. School Curriculum and Assessment Authority, 1995.
Find full textNational Aeronautics and Space Administration (NASA) Staff. Mmpp Traffic Generator for the Testing of the Scar 2 Fast Packet Switch. Independently Published, 2018.
Find full textGrabe, Magnus, and Björn Wullt. Urinary tract infection. Edited by Rob Pickard. Oxford University Press, 2017. http://dx.doi.org/10.1093/med/9780199659579.003.0004.
Full text