Books on the topic 'Scan testing'

K, Cheung Peter Y., ed. Boundary-scan interconnect diagnosis. Boston: Kluwer Academic, 2001.

Parker, Kenneth P. The Boundary-Scan handbook. Boston: Kluwer Academic Publishers, 1992.

The boundary-scan handbook. 3rd ed. Boston, Mass: Kluwer Academic Publishers, 2003.

Sousa, José T. de. Boundary-scan interconnect diagnosis. Boston: Kluwer Academic Publishers, 2001.

Jardine, P. N. The boundary-scan architecture standard IEEE-1149.1 (1990): The technology and its use. Leatherhead, Surrey, England: ERA Technology, 1993.

Parker, Kenneth P. The boundary-scan handbook: Analog and digital. 2nd ed. Boston: Kluwer Academic Publishers, 1998.

Parker, Kenneth P. The boundary-scan handbook: Analog and digital. 2nd ed. New York: Kluwer Academic, 2002.

den, Eijnden Peter van, and Jong Frans de, eds. Boundary-scan test: A practical approach. Dordrecht: Kluwer Academic Publishers, 1993.

Parker, Kenneth P. The Boundary-Scan Handbook. 3rd ed. Springer, 2003.

Sousa, José T. de, and Peter Y. K. Cheung. Boundary-Scan Interconnect Diagnosis. Springer, 2010.

Sousa, José T. de, and Peter Y. K. Cheung. Boundary-Scan Interconnect Diagnosis (Frontiers in Electronic Testing). Springer, 2001.

M, Maunder Colin, and Tulloss Rodham E, eds. The Test access port and boundary-scan architecture. Los Alamitos, Calif: IEEE Computer Society Press, 1991.

Board, IEEE Standards, and IEEE Computer Society. Test Technology Technical Committee., eds. IEEE standard test access port and boundary-scan architecture. New York, N.Y., USA: Institute of Electrical and Electronics Engineers, 1990.

J, Turney William, and Chek-Chart Publications (Firm), eds. Scan tool and lab scope guide. [San Jose, Calif.]: Chek-Chart Publications, 1997.

Institute Of Electrical and Electronics Engineers. IEEE Standard Test Access Port and Boundary-Scan Architecture: Includes Supplement (Includes Ieee Std 1149.1a-1993, Ieee Standard Test Access Port and Boundary-Scan Architecture). Institute of Electrical & Electronics Enginee, 1993.

IEEE Computer Society. Test Technology Standards Committee., Institute of Electrical and Electronics Engineers., IEEE Standards Board, and IEEE Standards Association, eds. IEEE standard test access port and boundary-scan architecture. New York: Institute of Electrical and Electronics Engineers, 2001.

Eijnden, Peter van den, Frans de Jong, and Harry Bleeker. Boundary-Scan Test: A Practical Approach. Springer, 1992.

Eijnden, Peter van den, Frans de Jong, and Harry Bleeker. Boundary-Scan Test: A Practical Approach. Springer, 2012.

Analog and mixed-signal boundary-scan: A guide to the IEEE 1149.4 test standard. Boston: Kluwer Academic Publishers, 1999.

Osseiran, Adam. Analog and Mixed-Signal Boundary-Scan: A Guide To The Ieee 1149.4 Test Standard. Springer, 2010.

Flinter, Frances. Antenatal diagnosis and pre-implantation genetic testing. Edited by Neil Turner. Oxford University Press, 2018. http://dx.doi.org/10.1093/med/9780199592548.003.0302_update_001.

Osseiran, Adam. Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149. 4 Test Standard. Springer London, Limited, 2013.

G, VanDyk Steven, Lockheed Martin Missiles & Space (Firm), NASA Glenn Research Center, and Aerospace Mechanisms Symposium (35th : 2001 : Mountain View, Calif.), eds. The role of bearing and scan mechanism life testing in flight qualification of the MODIS instrument. [Cleveland, Ohio]: National Aeronautics and Space Administration, Glenn Research Center, 2001.

G, VanDyk Steven, Lockheed Martin Missiles & Space (Firm), NASA Glenn Research Center, and Aerospace Mechanisms Symposium (35th : 2001 : Mountain View, Calif.), eds. The role of bearing and scan mechanism life testing in flight qualification of the MODIS instrument. [Cleveland, Ohio]: National Aeronautics and Space Administration, Glenn Research Center, 2001.

Osseiran, Adam. Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing). Springer, 1999.

Joniau, Steve, S. Van Bruwaene, J. Karnes, G. De Meerleer, P. Gontero, M. Spahn, and A. Briganti. High-risk prostate cancer. Edited by James W. F. Catto. Oxford University Press, 2017. http://dx.doi.org/10.1093/med/9780199659579.003.0066.

United States. National Aeronautics and Space Administration., ed. MMPP Traffic Generator for the testing of the SCAR 2 Fast Packet Switch. [Washington, DC: National Aeronautics and Space Administration, 1995.

Review of Assessment and Testing - Report from SCAA to the Secretary of State. School Curriculum and Assessment Authority, 1995.

National Aeronautics and Space Administration (NASA) Staff. Mmpp Traffic Generator for the Testing of the Scar 2 Fast Packet Switch. Independently Published, 2018.

Grabe, Magnus, and Björn Wullt. Urinary tract infection. Edited by Rob Pickard. Oxford University Press, 2017. http://dx.doi.org/10.1093/med/9780199659579.003.0004.