Journal articles on the topic 'Reliability qualification'
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S., VELMOURUOGAN, DHAVACHELVAN P., and BASKARAN R. "Software Reliability Qualification Model." International Journal of Performability Engineering 8, no. 4 (2012): 437. http://dx.doi.org/10.23940/ijpe.12.4.p437.mag.
Full textRegard, Charles, Christian Gautier, Hélène Fremont, Patrick Poirier, M. A. Xiaosong, and Kaspar M. B. Jansen. "Fast reliability qualification of SiP products." Microelectronics Reliability 49, no. 9-11 (September 2009): 958–62. http://dx.doi.org/10.1016/j.microrel.2009.07.042.
Full textPorter, Alex. "Accelerated Reliability Qualification in Automotive Testing." Quality and Reliability Engineering International 20, no. 2 (February 25, 2004): 115–20. http://dx.doi.org/10.1002/qre.619.
Full textReffiane, Fine, Choirul Huda, Mudzanatun Mudzanatun, and Ferina Agustini. "ANALISIS DIFERENSIASI KARYA PADA KEMAMPUAN LITERASI SAINTEK MAHASISWA KEPENDIDIKAN UNIVERSITAS PGRI SEMARANG." Refleksi Edukatika : Jurnal Ilmiah Kependidikan 14, no. 2 (June 28, 2024): 208–13. http://dx.doi.org/10.24176/re.v14i2.12498.
Full textHarry, C. C., and C. H. Mathiowetz. "ASIC reliability and qualification: a user's perspective." Proceedings of the IEEE 81, no. 5 (May 1993): 759–67. http://dx.doi.org/10.1109/5.220906.
Full textRoush, M., and J. Maynes. "Saw devices: Space qualification and reliability issues." International Journal of Satellite Communications 7, no. 4 (October 1989): 361–71. http://dx.doi.org/10.1002/sat.4600070413.
Full textTIAN, XIJIN. "DC-DC CONVERTER RELIABILITY: DESIGN, COMPONENTS AND QUALIFICATION." International Journal of Reliability, Quality and Safety Engineering 12, no. 05 (October 2005): 459–74. http://dx.doi.org/10.1142/s021853930500194x.
Full textKlewer, Christian, Frank Kuechenmeister, Jens Paul, Dirk Breuer, Bjoern Boehme, Jae Kyu Cho, Simone Capecchi, and Michael Thiele. "Package Qualification Envelope for 22FDX® Technology." International Symposium on Microelectronics 2019, no. 1 (October 1, 2019): 000169–75. http://dx.doi.org/10.4071/2380-4505-2019.1.000169.
Full textMikhaylenko, Leonid V., and Dmitry A. Shchelokov. "Digital discrete simulation model of profit formation taking into account the dynamics of cash flows, the level of reliability of launch vehicles and professional development of employees." Vestnik of Samara University. Economics and Management 14, no. 4 (January 23, 2024): 221–31. http://dx.doi.org/10.18287/2542-0461-2023-14-4-221-231.
Full textDenney, Dennis. "Reliability Qualification Testing for Permanently Installed Wellbore Equipment." Journal of Petroleum Technology 52, no. 10 (October 1, 2000): 60–61. http://dx.doi.org/10.2118/1000-0060-jpt.
Full textChamberlain, Suzanne. "Qualification users’ perceptions and experiences of assessment reliability." Research Papers in Education 28, no. 1 (February 2013): 118–33. http://dx.doi.org/10.1080/02671522.2012.754231.
Full textIoannou, Dimitris P. "HKMG CMOS technology qualification: The PBTI reliability challenge." Microelectronics Reliability 54, no. 8 (August 2014): 1489–99. http://dx.doi.org/10.1016/j.microrel.2014.03.018.
Full textGoudard, JL, X. Boddaert, J. Périnet, and D. Laffitte. "Reliability of optoelectronics components: towards new qualification practices." Microelectronics Reliability 43, no. 9-11 (September 2003): 1767–69. http://dx.doi.org/10.1016/s0026-2714(03)00297-x.
Full textBora, Mumtaz Y. "Qualification of Automotive RF-IC Packages." International Symposium on Microelectronics 2014, no. 1 (October 1, 2014): 000820–25. http://dx.doi.org/10.4071/isom-thp23.
Full textFlaig, John J., and William C. Spencer. "Process Qualification." Quality Engineering 16, no. 1 (January 9, 2003): 57–66. http://dx.doi.org/10.1081/qen-120020771.
Full textWaluyanti, Sri, and Herminarto Sofyan. "Tiered teacher competency qualification standards as CPD guide VHS teachers." Jurnal Pendidikan Vokasi 8, no. 1 (February 28, 2018): 97. http://dx.doi.org/10.21831/jpv.v8i1.18610.
Full texthung, Ayes, Rose Imoniri Etuk, EtoroAbasi Ndia Offiong, and Okoh Efanga. "TEACHER’S EXPERIENCE, EDUCATIONAL QUALIFICATION AND MASTERY OF DIFFICULT CONCEPTS IN PHYSICS IN CALABAR METROPOLIS, CROSS RIVER STATE, NIGERIA." Education, Sustainability & Society 5, no. 1 (January 5, 2023): 16–19. http://dx.doi.org/10.26480/ess.01.2023.16.19.
Full textCleopas, Blessing Chinyere, and Favour Chigozirim Onwuchekwa. "Impact of chemistry teachers’ qualification and years of experience on academic performance of secondary school chemistry students in Ogbia local government area Bayelsa state." Contemporary Research in Education and English Language Teaching 6, no. 1 (July 31, 2024): 62–72. http://dx.doi.org/10.55214/26410230.v6i1.1133.
Full textCalò, C., A. Lay-Ekuakille, P. Vergallo, C. Chiffi, A. Trotta, A. Fasanella, and A. M. Fasanella. "Measurements and Characterization of Photovoltaic Modules for Tolerance Verification." International Journal of Measurement Technologies and Instrumentation Engineering 1, no. 2 (April 2011): 73–83. http://dx.doi.org/10.4018/ijmtie.2011040106.
Full textvan Hassel, J. G., G. A. D. Bock, and G. van den Berg. "Failure mechanisms in advanced BCD technology during reliability qualification." Microelectronics Reliability 51, no. 9-11 (September 2011): 1697–700. http://dx.doi.org/10.1016/j.microrel.2011.07.043.
Full textRouse, Steven V. "Reliability of MTurk Data From Masters and Workers." Journal of Individual Differences 41, no. 1 (January 2020): 30–36. http://dx.doi.org/10.1027/1614-0001/a000300.
Full textSUHAIMI, Suhaimi, Nagaliman NAGALIMAN, and Sarmini SARMINI. "The Effect of Educational Qualifications, Loyalty, and Commitment on Career Development of Tanjung Batu Kundur Hospital Employees Through Work Placement." International Journal of Environmental, Sustainability, and Social Science 5, no. 3 (May 31, 2024): 866–74. https://doi.org/10.38142/ijesss.v5i3.1130.
Full textWare, A. G., M. E. Nitzel, and J. D. Page. "A Summary of NRC Generic Safety Issue 113: Dynamic Qualification and Testing of Large Bore Hydraulic Snubbers." Journal of Pressure Vessel Technology 116, no. 2 (May 1, 1994): 85–95. http://dx.doi.org/10.1115/1.2929581.
Full textLambert, B., J. Thorpe, R. Behtash, B. Schauwecker, F. Bourgeois, H. Jung, J. Bataille, et al. "Reliability data’s of 0.5μm AlGaN/GaN on SiC technology qualification." Microelectronics Reliability 52, no. 9-10 (September 2012): 2200–2204. http://dx.doi.org/10.1016/j.microrel.2012.06.098.
Full textTsuyuzaki, Eisuke. "New perspectives in reliability testing and performance qualification for wearables." OPE Journal 14, no. 47 (2024): 22–23. http://dx.doi.org/10.51202/2366-8040-2024-47-022.
Full textWilliam Stoten, David. "The Extended Project Qualification." International Journal for Lesson and Learning Studies 3, no. 1 (December 20, 2013): 66–77. http://dx.doi.org/10.1108/ijlls-06-2013-0035.
Full textAbdullaiev, A., S. Bozhko, V. Krasnorutskyi, R. Latorre, V. Tatarinov, N. Shumkova, and A. Shepitchak. "Ukraine Nuclear Fuel Qualification Project (UNFQP)." Nuclear and Radiation Safety, no. 4(76) (November 17, 2017): 3–10. http://dx.doi.org/10.32918/nrs.2017.4(76).01.
Full textXie, Zong Ren, Jian Wei Lv, and Zhong Hua Liu. "Research on Reliability Qualification Test of Mechanical and Electric Equipment Onboard." Advanced Materials Research 605-607 (December 2012): 708–12. http://dx.doi.org/10.4028/www.scientific.net/amr.605-607.708.
Full textDordlofva, Christo, Olivia Borgue, Massimo Panarotto, and Ola Isaksson. "Drivers and Guidelines in Design for Qualification Using Additive Manufacturing in Space Applications." Proceedings of the Design Society: International Conference on Engineering Design 1, no. 1 (July 2019): 729–38. http://dx.doi.org/10.1017/dsi.2019.77.
Full textMoreau, S., J. Jourdon, S. Lhostis, D. Bouchu, B. Ayoub, L. Arnaud, and H. Frémont. "Review—Hybrid Bonding-Based Interconnects: A Status on the Last Robustness and Reliability Achievements." ECS Journal of Solid State Science and Technology 11, no. 2 (February 1, 2022): 024001. http://dx.doi.org/10.1149/2162-8777/ac4ffe.
Full textBoginskaya, Zoya, and Tatyana Gladkova. "Accounting Reliability Concept: Audit Practices." Auditor 7, no. 10 (November 3, 2021): 33–39. http://dx.doi.org/10.12737/1998-0701-2021-7-10-33-39.
Full textMadison, B. J. C. "Reliabilists Should Still Fear the Demon." Logos & Episteme 12, no. 2 (2021): 193–202. http://dx.doi.org/10.5840/logos-episteme202112213.
Full textGreen, Ronald, Aivars J. Lelis, and Daniel B. Habersat. "Charge Trapping in Sic Power MOSFETs and its Consequences for Robust Reliability Testing." Materials Science Forum 717-720 (May 2012): 1085–88. http://dx.doi.org/10.4028/www.scientific.net/msf.717-720.1085.
Full textMorris, Seymour, and Preston MacDiarmid. "Reliability Growth Testing Effectiveness." Journal of the IEST 28, no. 4 (July 1, 1985): 21–28. http://dx.doi.org/10.17764/jiet.1.28.4.c353w77743v27v43.
Full textRobles, James A. "The Systems Engineering Relationship between Qualification, Environmental Stress Screening and Reliability." SAE International Journal of Aerospace 2, no. 1 (November 10, 2009): 268–74. http://dx.doi.org/10.4271/2009-01-3274.
Full textStoltz, M. P., P. Burgaud, F. Murgadella, J. P. Hirtz, P. Petit, and A. Vervoitte. "Reliability and qualification methodology of 60 W QCW linear bar arrays." Microelectronics Reliability 38, no. 4 (April 1998): 689–96. http://dx.doi.org/10.1016/s0026-2714(97)00202-3.
Full textThompson, P. "Reliability development and qualification of a low-cost PQFP-based MCM." IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A 18, no. 1 (March 1995): 10–14. http://dx.doi.org/10.1109/95.370728.
Full textBora, Mumtaz Y. "fcLGA Package Assembly Qualification for Mobile Applications." International Symposium on Microelectronics 2018, no. 1 (October 1, 2018): 000115–20. http://dx.doi.org/10.4071/2380-4505-2018.1.000115.
Full textAdebola, Oladiji Alaba, Ayobami Oyelade Anthonia, Rukayat Oyebola Iwintolu, and Emmanuel Opeyemi Amusan. "Qualification and ICT Knowledge as Predictors of Technical Subject Teaching Competence of Teachers in Osun State, Nigeria." Kampala International University Journal of Education 3, no. 2 (December 14, 2023): 9–20. http://dx.doi.org/10.59568/kjed-2023-3-2-02.
Full textRamesham, Rajeshuni, Justin N. Maki, and Gordon C. Cucullu. "Qualification Testing of Engineering Camera and Platinum Resistance Thermometer (PRT) Sensors for MSL Project Under Extreme Temperatures to Assess Reliability and to Enhance Mission Assurance." Journal of Microelectronics and Electronic Packaging 6, no. 2 (April 1, 2009): 125–34. http://dx.doi.org/10.4071/1551-4897-6.2.125.
Full textBensoussan, Alain. "Microelectronic reliability models for more than moore nanotechnology products." Facta universitatis - series: Electronics and Energetics 30, no. 1 (2017): 1–25. http://dx.doi.org/10.2298/fuee1701001b.
Full textIzvekov, Yu A., and M. Yu Narkevich. "QUALIFICATION METHOD FOR QUALITY ASSESSMENT OF METALLURGICAL FACILITIES." Izvestiya of Samara Scientific Center of the Russian Academy of Sciences 23, no. 2 (2021): 42–45. http://dx.doi.org/10.37313/1990-5378-2021-23-2-42-45.
Full textNa, Ji-Hyun, and Chun-Sung Youn. "Perception of Waxing Practitioner Licensing System." Korean Society of Beauty and Art 21, no. 3 (September 20, 2020): 181–200. http://dx.doi.org/10.18693/jksba.2020.21.3.181.
Full textSuwanroj, Thamasan, Orawan Saeung, Punnee Leekitchwatana, and Kanaporn Kaewkamjan. "Qualifications Framework of Essential Learning Outcomes for Computer Innovation and Digital Industry Professionals." International Journal of Information and Education Technology 13, no. 2 (2023): 266–78. http://dx.doi.org/10.18178/ijiet.2023.13.2.1804.
Full textIbnatur Husnul, Nisak Ruwah, and Vivi Iswanti Nursyirwan. "GAMIFICATION-BASED ASSISTED LEARNING VIDEO DEVELOPMENT IN BASIC STATISTICS FOR DEAF STUDENTS." Daya Matematis: Jurnal Inovasi Pendidikan Matematika 10, no. 3 (December 25, 2022): 185. http://dx.doi.org/10.26858/jdm.v10i3.37853.
Full textKim, Yong Sik, Seung Han Yang, Byung Sik Yoon, and Hee Jong Lee. "Comparison between Conventional and Performance Demonstration UT Method by Round Robin Test." Key Engineering Materials 321-323 (October 2006): 1754–57. http://dx.doi.org/10.4028/www.scientific.net/kem.321-323.1754.
Full textBack, Seung Jun, Young Kap Son, Jun Hee Kim, and Jong Cheol Lee. "Reliability Qualification Test of a Unmanned Control Robot System for an Excavator." Transactions of the Korean Society of Mechanical Engineers A 39, no. 4 (April 1, 2015): 397–403. http://dx.doi.org/10.3795/ksme-a.2015.39.4.397.
Full textTripathi, Shivendra, Hitesh M. Patel, Shrikant A. Patil, Deep Kumar Pandey, Ishwar Lal Prajapati, Chandresh N. Joshi, Rakesh S. Sharma, and Rajkumar Arora. "Ceramic Column Grid Array Assembly Qualification and Reliability Analysis for Space Missions." IEEE Transactions on Components, Packaging and Manufacturing Technology 5, no. 2 (February 2015): 279–86. http://dx.doi.org/10.1109/tcpmt.2014.2383172.
Full textSamuel, Mathews P., Aditya Kumar Mishra, and R. K. Mishra. "Additive Manufacturing of Ti-6Al-4V Aero Engine Parts: Qualification for Reliability." Journal of Failure Analysis and Prevention 18, no. 1 (January 10, 2018): 136–44. http://dx.doi.org/10.1007/s11668-018-0393-9.
Full textHakim, Edward B. "DoD microcircuit qualification innovation–QML." Quality and Reliability Engineering International 6, no. 1 (January 1990): 47–50. http://dx.doi.org/10.1002/qre.4680060109.
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