Journal articles on the topic 'Reliability characterization'
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Amirabdollahian, Mahsa, and Bithin Datta. "Reliability Evaluation of Groundwater Contamination Source Characterization under Uncertain Flow Field." International Journal of Environmental Science and Development 6, no. 7 (2015): 512–18. http://dx.doi.org/10.7763/ijesd.2015.v6.647.
Full textTsuchiya, Toshiyuki. "Reliability Characterization of MEMS Materials." IEEJ Transactions on Sensors and Micromachines 125, no. 7 (2005): 289–93. http://dx.doi.org/10.1541/ieejsmas.125.289.
Full textSong, William, Saibal Mukhopadhyay, and Sudhakar Yalamanchili. "Architectural Reliability: Lifetime Reliability Characterization and Management ofMany-Core Processors." IEEE Computer Architecture Letters 14, no. 2 (July 1, 2015): 103–6. http://dx.doi.org/10.1109/lca.2014.2340873.
Full textYang, Q. J., H. L. J. Pang, Z. P. Wang, G. H. Lim, F. F. Yap, and R. M. Lin. "Vibration reliability characterization of PBGA assemblies." Microelectronics Reliability 40, no. 7 (July 2000): 1097–107. http://dx.doi.org/10.1016/s0026-2714(00)00036-6.
Full textEkwueme, Chukwuma G., and Gary C. Hart. "Structural reliability characterization of precast concrete." Structural Design of Tall Buildings 3, no. 1 (March 1994): 13–35. http://dx.doi.org/10.1002/tal.4320030103.
Full textLee, J. C., Chen Ih-Chin, and Hu Chenming. "Modeling and characterization of gate oxide reliability." IEEE Transactions on Electron Devices 35, no. 12 (1988): 2268–78. http://dx.doi.org/10.1109/16.8802.
Full textCheng, Bowen, Dirk De Bruyker, Chris Chua, Kunal Sahasrabuddhe, Ivan Shubin, John E. Cunningham, Ying Luo, Karl F. Bohringer, Ashok V. Krishnamoorthy, and Eugene M. Chow. "Microspring Characterization and Flip-Chip Assembly Reliability." IEEE Transactions on Components, Packaging and Manufacturing Technology 3, no. 2 (February 2013): 187–96. http://dx.doi.org/10.1109/tcpmt.2012.2213250.
Full textClaeys, C., E. Simoen, J. M. Rafi, Marcelo A. Pavanello, and Joao A. Martino. "Physical Characterization and Reliability Aspects of MuGFETs." ECS Transactions 9, no. 1 (December 19, 2019): 281–94. http://dx.doi.org/10.1149/1.2766899.
Full textSheikh, A. "A reliability model for fatigue life characterization." International Journal of Fatigue 17, no. 2 (February 1995): 121–28. http://dx.doi.org/10.1016/0142-1123(95)95891-j.
Full textShaddock, David, and Liang Yin. "Reliability of High Temperature Laminates." Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2015, HiTEN (January 1, 2015): 000100–000110. http://dx.doi.org/10.4071/hiten-session3b-paper3b_1.
Full textNAYAK, AMIYA, and NICOLA SANTORO. "ON RELIABILITY ANALYSIS OF CHORDAL RINGS." Journal of Circuits, Systems and Computers 05, no. 02 (June 1995): 199–213. http://dx.doi.org/10.1142/s0218126695000151.
Full textW., TAZBIT, and MIALHE P. "RELIABILITY OF MICROELECTRONIC DEVICES FROM EMITTERBASE JUNCTION CHARACTERIZATION." International Conference on Applied Mechanics and Mechanical Engineering 13, no. 13 (May 1, 2008): 29–37. http://dx.doi.org/10.21608/amme.2008.39820.
Full textTu, Zhijuan, Zhiping Zhou, and Xingjun Wang. "Reliability characterization of silicon-based germanium waveguide photodetectors." Optical Engineering 53, no. 5 (May 5, 2014): 057103. http://dx.doi.org/10.1117/1.oe.53.5.057103.
Full textDoyle, R., B. O'Flynn, W. Lawton, J. Barrett, and J. Buckley. "Glob-top reliability characterization: evaluation and analysis methods." IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A 21, no. 2 (June 1998): 292–300. http://dx.doi.org/10.1109/95.705478.
Full textRoss, R. G., G. R. Mon, L. Wen, C. C. Gonzalez, and R. S. Sugimura. "Measurement and characterization of thin film module reliability." Solar Cells 24, no. 3-4 (July 1988): 271–78. http://dx.doi.org/10.1016/0379-6787(88)90078-6.
Full textvan Beek, Andries, Peter Borm, and Marieke Quant. "Axiomatic Characterizations of a Proportional Influence Measure for Sequential Projects with Imperfect Reliability." Axioms 10, no. 4 (September 30, 2021): 247. http://dx.doi.org/10.3390/axioms10040247.
Full textLi, Qingshen, Yigang Lin, Shoudong Wang, Shanshan Wang, and Xiangou Zhu. "Storage Reliability Assessment Method for Aerospace Electromagnetic Relay Based on Belief Reliability Theory." Applied Sciences 12, no. 17 (August 29, 2022): 8637. http://dx.doi.org/10.3390/app12178637.
Full textDolnicar, Peter, Drago Milosevic, Zoran Jovovic, Vladimir Meglic, Marko Maras, and Ana Velimirovic. "Reliability of morphological and molecular characterization of lightsprouts for differentiation of potato accessions." Genetika 48, no. 2 (2016): 525–32. http://dx.doi.org/10.2298/gensr1602525d.
Full textBadger, Lacey L., Nikholas G. Toledo, Derek W. Slottke, John Thomas, Miguel Alamillo, Elliott Gunnarsson, Mark L. Le Rutt, and Ilan Tsameret. "Ultra-Fine Pitch Wedge bonding for Device Reliability Characterization." International Symposium on Microelectronics 2018, no. 1 (October 1, 2018): 000561–65. http://dx.doi.org/10.4071/2380-4505-2018.1.000561.
Full textCholda, Piotr, Janos Tapolcai, Tibor Cinkler, Krzysztof Wajda, and Andrzej Jajszczyk. "Quality of resilience as a network reliability characterization tool." IEEE Network 23, no. 2 (March 2009): 11–19. http://dx.doi.org/10.1109/mnet.2009.4804331.
Full textLin, Hua Tay, and Mattison K. Ferber. "Characterization of Mechanical Reliability of Silicon Nitride Microturbine Rotors." Key Engineering Materials 287 (June 2005): 393–403. http://dx.doi.org/10.4028/www.scientific.net/kem.287.393.
Full textCastellazzi, Alberto, and Mauro Ciappa. "Electrothermal Characterization for Reliability of Modern Low-Voltage PowerMOSFETs." IEEE Transactions on Device and Materials Reliability 7, no. 4 (December 2007): 571–80. http://dx.doi.org/10.1109/tdmr.2007.910439.
Full textSy, Fatoumata, Quentin Rafhay, Julien Poette, Gregory Grosa, Gaelle Beylier, Philippe Grosse, David Roy, and Jean-Emmanuel Broquin. "Reliability Characterization and Modeling of High Speed Ge Photodetectors." IEEE Transactions on Device and Materials Reliability 19, no. 4 (December 2019): 688–95. http://dx.doi.org/10.1109/tdmr.2019.2945996.
Full textDuong, Q. H., L. Buchaillot, D. Collard, P. Schmitt, X. Lafontan, P. Pons, F. Flourens, and F. Pressecq. "Thermal and electrostatic reliability characterization in RF MEMS switches." Microelectronics Reliability 45, no. 9-11 (September 2005): 1790–93. http://dx.doi.org/10.1016/j.microrel.2005.07.095.
Full textTazibt, W., P. Mialhe, J. P. Charles, and M. A. Belkhir. "A junction characterization for microelectronic devices quality and reliability." Microelectronics Reliability 48, no. 3 (March 2008): 348–53. http://dx.doi.org/10.1016/j.microrel.2007.06.002.
Full textMatmat, Mohamed, Fabio Coccetti, Antoine Marty, Robert Plana, Christophe Escriba, Jean-Yves Fourniols, and Daniel Esteve. "Capacitive RF MEMS analytical predictive reliability and lifetime characterization." Microelectronics Reliability 49, no. 9-11 (September 2009): 1304–8. http://dx.doi.org/10.1016/j.microrel.2009.06.049.
Full textBernal, S., F. J. Botana, R. García, F. Ramírez, and J. M. Rodríguez-Izquierdo. "Characterization of an experimental TPD-MS system. Reliability problems." Thermochimica Acta 98 (February 1986): 319–26. http://dx.doi.org/10.1016/0040-6031(86)87102-7.
Full textDubey, Vaibhav, and Deepak Khushalani. "Reliability characterization of MEMS switch using MIM test structures." Journal of Electrical Systems and Information Technology 1, no. 3 (December 2014): 187–97. http://dx.doi.org/10.1016/j.jesit.2014.12.002.
Full textMartin, Andreas. "Review on the reliability characterization of plasma-induced damage." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 27, no. 1 (2009): 426. http://dx.doi.org/10.1116/1.3054356.
Full textSuehle, J. S. "Ultrathin gate oxide reliability: physical models, statistics, and characterization." IEEE Transactions on Electron Devices 49, no. 6 (June 2002): 958–71. http://dx.doi.org/10.1109/ted.2002.1003712.
Full textLiu, Hongxia, and Yue Hao. "A new method of thin gate SiO2 reliability characterization." Surface and Interface Analysis 34, no. 1 (2002): 437–40. http://dx.doi.org/10.1002/sia.1333.
Full textLall, Pradeep, Michael Pecht, and Edward B. Hakim. "Characterization of functional relationship between temperature and microelectronic reliability." Microelectronics Reliability 35, no. 3 (March 1995): 377–402. http://dx.doi.org/10.1016/0026-2714(95)93067-k.
Full textDugan, M. Patrick. "Reliability characterization of a 3-mum cmos/sos process." Quality and Reliability Engineering International 3, no. 2 (April 1987): 99–105. http://dx.doi.org/10.1002/qre.4680030207.
Full textSundresh, Tippure S. "Macroscopic characterization of software and its relationship to reliability." Bell Labs Technical Journal 10, no. 1 (May 5, 2005): 169–74. http://dx.doi.org/10.1002/bltj.20086.
Full textCalò, C., A. Lay-Ekuakille, P. Vergallo, C. Chiffi, A. Trotta, A. Fasanella, and A. M. Fasanella. "Measurements and Characterization of Photovoltaic Modules for Tolerance Verification." International Journal of Measurement Technologies and Instrumentation Engineering 1, no. 2 (April 2011): 73–83. http://dx.doi.org/10.4018/ijmtie.2011040106.
Full textRushdi, Ali Muhammad Ali, and Fares Ahmad Muhammad Ghaleb. "Reliability Characterization of Binary-Imaged Multi-State Coherent Threshold Systems." International Journal of Mathematical, Engineering and Management Sciences 6, no. 1 (October 29, 2020): 309–21. http://dx.doi.org/10.33889/ijmems.2021.6.1.020.
Full textResch-Genger, Ute, and Paul C. DeRose. "Characterization of photoluminescence measuring systems (IUPAC Technical Report)." Pure and Applied Chemistry 84, no. 8 (June 4, 2012): 1815–35. http://dx.doi.org/10.1351/pac-rep-10-07-07.
Full textZaghloul, Usama, George J. Papaioannou, Bharat Bhushan, Fabio Coccetti, Patrick Pons, and Robert Plana. "New insights into reliability of electrostatic capacitive RF MEMS switches." International Journal of Microwave and Wireless Technologies 3, no. 5 (September 1, 2011): 571–86. http://dx.doi.org/10.1017/s1759078711000766.
Full textShaddock, David, Liang Yin, Zhenzhen Shen, Zhangming Zhou, and R. Wayne Johnson. "DIP Test Socket Characterization for 300°C." Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2013, HITEN (January 1, 2013): 000213–19. http://dx.doi.org/10.4071/hiten-wa12.
Full textPark, Heejin. "Reliability Evaluation Through Moisture Sorption Characterization of Electronic Packaging Materials." Transactions of the Korean Society of Mechanical Engineers A 37, no. 9 (September 1, 2013): 1151–58. http://dx.doi.org/10.3795/ksme-a.2013.37.9.1151.
Full textBruinsma, Wendy E., Thierry G. Guitton, Jon JP Warner, and David Ring. "Interobserver Reliability of Classification and Characterization of Proximal Humeral Fractures." Journal of Bone and Joint Surgery-American Volume 95, no. 17 (September 2013): 1600–1604. http://dx.doi.org/10.2106/jbjs.l.00586.
Full textAMAGAI, Masazumi. "Chip Scale Package Solder Joint Reliability Modeling and Material Characterization." Journal of Japan Institute of Electronics Packaging 3, no. 1 (2000): 45–56. http://dx.doi.org/10.5104/jiep.3.45.
Full textMathew, Varughese, and Tu Anh Tran. "Characterization of Over Pad Metallization (OPM) for High Temperature Reliability." International Symposium on Microelectronics 2012, no. 1 (January 1, 2012): 001097–104. http://dx.doi.org/10.4071/isom-2012-thp32.
Full textDas, H., S. Sunkari, M. Domeij, A. Konstantinov, F. Allerstam, and T. Neyer. "(Invited) Enabling SiC Yield and Reliability through Epitaxy and Characterization." ECS Transactions 69, no. 11 (October 2, 2015): 29–32. http://dx.doi.org/10.1149/06911.0029ecst.
Full textYoung, C. D., K. Akarvardar, K. Matthews, M. O. Baykan, J. Pater, I. Ok, T. Ngai, et al. "(Invited) Electrical Characterization and Reliability Assessment of Double-Gate FinFETs." ECS Transactions 50, no. 4 (March 15, 2013): 201–6. http://dx.doi.org/10.1149/05004.0201ecst.
Full textCheng, Y. L., W. Y. Chang, B. J. Wei, F. H. Lu, and Y. L. Wang. "Electrical and Reliability Characterization of Ti/TiN Thin Film Resistor." ECS Transactions 45, no. 6 (April 27, 2012): 81–90. http://dx.doi.org/10.1149/1.3700941.
Full textTardibuono, Mark J. "Characterization of PCB plated‐through‐hole reliability using statistical analysis." Circuit World 31, no. 1 (March 2005): 8–15. http://dx.doi.org/10.1108/03056120510553176.
Full textManzini, Stefano, and Mattia Rossetti. "Electrical Characterization and Reliability of Split-Gate High-Voltage Transistors." IEEE Transactions on Device and Materials Reliability 18, no. 2 (June 2018): 279–83. http://dx.doi.org/10.1109/tdmr.2018.2828985.
Full textKerber, Andreas, Tanya Nigam, Peter Paliwoda, and Fernando Guarin. "Reliability Characterization of Ring Oscillator Circuits for Advanced CMOS Technologies." IEEE Transactions on Device and Materials Reliability 20, no. 2 (June 2020): 230–41. http://dx.doi.org/10.1109/tdmr.2020.2981010.
Full textHong, Sung-Jei, Jong-Woong Kim, and Seung-Boo Jung. "Characterization of Reliability of Printed Indium Tin Oxide Thin Films." Journal of Nanoscience and Nanotechnology 13, no. 11 (November 1, 2013): 7770–73. http://dx.doi.org/10.1166/jnn.2013.7813.
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