Academic literature on the topic 'Reflectance'
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Journal articles on the topic "Reflectance"
Ahmad, Noraini, Sabarinah Sh Ahmad, and Anuar Talib. "Surface Reflectance for Illuminance Level Control in Daylit Historical Museum Gallery under Tropical Sky Conditions." Advanced Materials Research 610-613 (December 2012): 2854–58. http://dx.doi.org/10.4028/www.scientific.net/amr.610-613.2854.
Full textHedley, John, Maryam Mirhakak, Adam Wentworth, and Heidi Dierssen. "Influence of Three-Dimensional Coral Structures on Hyperspectral Benthic Reflectance and Water-Leaving Reflectance." Applied Sciences 8, no. 12 (December 19, 2018): 2688. http://dx.doi.org/10.3390/app8122688.
Full textLu, Xiaomei, Yongxiang Hu, Yuekui Yang, Mark Vaughan, Zhaoyan Liu, Sharon Rodier, William Hunt, Kathy Powell, Patricia Lucker, and Charles Trepte. "Laser pulse bidirectional reflectance from CALIPSO mission." Atmospheric Measurement Techniques 11, no. 6 (June 8, 2018): 3281–96. http://dx.doi.org/10.5194/amt-11-3281-2018.
Full textLeckie, D. G., D. P. Ostaff, P. M. Teillet, and G. Fedosjevs. "Spectral Characteristics of Tree Components of Balsam Fir and Spruce Damaged by Spruce Budworm." Forest Science 35, no. 2 (June 1, 1989): 582–600. http://dx.doi.org/10.1093/forestscience/35.2.582.
Full textWinther, Jan-Gunnar. "Spectral bi-directional reflectance of snow and glacier ice measured in Dronning Maud Land, Antarctica." Annals of Glaciology 20 (1994): 1–5. http://dx.doi.org/10.3189/1994aog20-1-1-5.
Full textWinther, Jan-Gunnar. "Spectral bi-directional reflectance of snow and glacier ice measured in Dronning Maud Land, Antarctica." Annals of Glaciology 20 (1994): 1–5. http://dx.doi.org/10.1017/s0260305500016141.
Full textLiao, Hsien-Shun, Ya-Kang Huang, Jian-Yuan Syu-Gu, and En-Te Hwu. "Real-Time Reflectance Measurement Using an Astigmatic Optical Profilometer." Sensors 22, no. 16 (August 19, 2022): 6242. http://dx.doi.org/10.3390/s22166242.
Full textGene, Jinhwa, Min Yong Jeon, and Sun Do Lim. "Reflectometers for Absolute and Relative Reflectance Measurements in the Mid-IR Region at Vacuum." Sensors 21, no. 4 (February 7, 2021): 1169. http://dx.doi.org/10.3390/s21041169.
Full textHenniger, Hans, Friedrich J. Bohn, Kim Schmidt, and Andreas Huth. "A New Approach Combining a Multilayer Radiative Transfer Model with an Individual-Based Forest Model: Application to Boreal Forests in Finland." Remote Sensing 15, no. 12 (June 12, 2023): 3078. http://dx.doi.org/10.3390/rs15123078.
Full textYamada, Takatoshi, Makoto Hisa, and Masataka Hasegawa. "Optical properties of vertically aligned graphene sheets." MRS Advances 2, no. 02 (2017): 77–82. http://dx.doi.org/10.1557/adv.2017.16.
Full textDissertations / Theses on the topic "Reflectance"
Ibbett, R. N. "Infrared diffuse reflectance spectroscopy." Thesis, University of East Anglia, 1988. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.382895.
Full textEvens, Anne F. "Spectral reflectance of vitrinite." Thesis, University of Newcastle Upon Tyne, 2000. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.311095.
Full textChen, Qiao. "Modelling of spectral reflectance." Thesis, University of Leeds, 2006. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.438575.
Full textFeng, Xiaofan. "Comparison of methods for generation of absolute reflectance factor measurement for BRDF studies /." Online version of thesis, 1990. http://hdl.handle.net/1850/10922.
Full textBeigpour, Shida. "Illumination and Object Reflectance Modeling." Doctoral thesis, Universitat Autònoma de Barcelona, 2013. http://hdl.handle.net/10803/113551.
Full textSurface reflectance modeling is an important key to scene understanding. An accurate reflectance model which is based on the laws of physics allows us to achieve realistic and physically plausible results. Using such model, a more profound knowledge about the interaction of light with objects surfaces can be established which proves crucial to variety of computer vision application. Due to high complexity of the reflectance model, the vast majority of the existing computer vision applications base their methods on simplifying assumptions such as Lambertian reflectance or uniform illumination to be able to solve their problem. However, in real world scenes, objects tend to exhibit more complex reflections (diffuse and specular) and are furthermore affected by the characteristics and chromaticity of the illuminants. In this thesis, we incorporate a more realistic reflection model in computer vision applications. To address such complex physical phenomenon, we extend the state-of-the-art object reflectance models by introducing a Multi-Illuminant Dichromatic Reflection model (MIDR). Using MIDR we are able to model and decompose the reflectance of an object with complex specularities under multiple illuminants presenting shadows and inter-reflections. We show that this permits us to perform realistic re-coloring of objects lit by colored lights, and multiple illuminants. Furthermore, we propose a “local” illuminant estimation method in order to model the scenes with non-uniform illumination (e.g., an outdoor scene with a blue sky and a yellow sun, a scene with indoor lighting combined with outdoor lighting through a window, or any other case in which two or more lights with distinct colors illuminating different parts of the scene). The proposed method takes advantage of a probabilistic and graph-based model and solves the problem by re-defining the estimation problem as an energy minimization. This method provides us with local illuminant estimations which improve greatly over state-of-the-art color constancy methods. Moreover, we captured our own multi-illuminant dataset which consists of complex scenes and illumination conditions both outdoor and in laboratory conditions. We show improvement achieved using our method over state-of-the-art methods for local illuminant estimation. We demonstrate that having a more realistic and accurate model of the scene illumination and object reflectance greatly improves the quality of many computer vision and computer graphics tasks. We show examples of improved automatic white balance, scene relighting, and object re-coloring. The proposed theory can be employed in order to improve color naming, object detection, recognition, and segmentation which are among the most popular computer vision trends.
Bernhardsson, Daniel, and Johan Törne. "Video Neutralization and Reflectance Spoofing." Thesis, Linköpings universitet, Institutionen för teknik och naturvetenskap, 2005. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-97756.
Full textBlount, Christopher. "Near infrared reflectance in Anura." Thesis, University of Manchester, 2018. https://www.research.manchester.ac.uk/portal/en/theses/near-infrared-reflectance-in-anura(f730de01-8d4a-43de-b2dd-2ef3027bfc2f).html.
Full textMatusik, Wojciech 1973. "A data-driven reflectance model." Thesis, Massachusetts Institute of Technology, 2003. http://hdl.handle.net/1721.1/87454.
Full text"September 2003."
Includes bibliographical references (leaves 112-115).
I present a data-driven model for isotropic bidirectional reflectance distribution functions (BRDFs) based on acquired reflectance data. Instead of using analytic reflectance models, each BRDF is represented as a dense set of measurements. This representation allows interpolation and extrapolation in the space of acquired BRDFs to create new BRDFs. Each acquired BRDF is treated as a single high-dimensional vector taken from the space of all possible BRDFs. Both linear (subspace) and non-linear (manifold) dimensionality reduction tools are applied in an effort to discover a lower-dimensional representation that characterizes the acquired BRDFs. To complete the model, users are provided with the means for defining perceptually meaningful parametrizations that allow them to navigate in the reduced-dimension BRDF space. On the low-dimensional manifold, movement along these directions produces novel, but valid, BRDFs. By analyzing a large collection of reflectance data, I also derive two novel reflectance sampling procedures that require fewer total measurements than standard uniform sampling approaches. Using densely sampled measurements the general surface reflectance function is analyzed to determine the local signal variation at each point in the function's domain. Wavelet analysis is used to derive a common basis for all of the acquired reflectance functions, as well as a non-uniform sampling pattern that corresponds to all non-zero wavelet coefficients. Second, I show that the reflectance of an arbitrary material can be represented as a linear combination of the surface reflectance functions. Furthermore, this analysis specifies a reduced set of sampling points that permits the robust estimation of the coefficients of this linear combination.
(cont.) These procedures dramatically shorten the acquisition time for isotropic reflectance measurements.
by Wojciech Matusik.
Ph.D.
Randeberg, Lise Lyngsnes. "Diagnostic applications of diffuse reflectance spectroscopy." Doctoral thesis, Norwegian University of Science and Technology, Faculty of Information Technology, Mathematics and Electrical Engineering, 2005. http://urn.kb.se/resolve?urn=urn:nbn:no:ntnu:diva-691.
Full textThis thesis covers a wide field of applications, with an emphasis on applications of reflectance spectroscopy for diagnostic purposes. Reflectance spectroscopy in the visible part of the spectrum has been proved to be a valuable tool in a variety of applications including e. g. port-wine stain diagnostics, diagnostics of liver pathology, neonatal jaundice and age determination of bruises for forensic applications.
Chou, Ti-Fan. "Obtaining reflectance functions using digital cameras." Thesis, University of Leeds, 2013. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.634750.
Full textBooks on the topic "Reflectance"
J, Hsia J., ed. Spectral reflectance. Gaithersburg, MD: U.S. Dept. of Commerce, National Bureau of Standards, 1987.
Find full textA, Early Edward, Parr A. C, and National Institute of Standards and Technology (U.S.), eds. Spectral reflectance. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1998.
Find full textBogdanowicz, Janusz. Photomodulated Optical Reflectance. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-30108-7.
Full textIbbett, Roger Norman. Infrared diffuse reflectance spectroscopy. Norwich: University of East Anglia, 1988.
Find full textWeidner, Victor R. NBS measurement services: Spectral reflectance. Washington, D.C: National Bureau of Standards, 1987.
Find full textRaja, Sekhar B. N., and Bhabha Atomic Research Centre, eds. A laboratory experimental setup for reflectivity experiments. Mumbai: Bhabha Atomic Research Centre, 1999.
Find full textHofmann-Wellenhof, Rainer, Giovanni Pellacani, Joseph Malvehy, and Hans Peter Soyer, eds. Reflectance Confocal Microscopy for Skin Diseases. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-21997-9.
Full textMukhopadhyay, Prasanta K., and Wallace G. Dow, eds. Vitrinite Reflectance as a Maturity Parameter. Washington, DC: American Chemical Society, 1994. http://dx.doi.org/10.1021/bk-1994-0570.
Full textWinston, Richard B. Vitrinite reflectance of Alabama's bituminous coal. Tuscaloosa, Ala: Geological Survey of Alabama, 1990.
Find full textPittsburgh Research Center (United States. Dept. of Energy), ed. Moisture-corrected reflectance rock dust meter. [Pittsburgh, PA]: U.S. Dept. of Energy, Pittsburgh Research Center, 1996.
Find full textBook chapters on the topic "Reflectance"
Gooch, Jan W. "Reflectance." In Encyclopedic Dictionary of Polymers, 613. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_9848.
Full textWeik, Martin H. "reflectance." In Computer Science and Communications Dictionary, 1445. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/1-4020-0613-6_15826.
Full textGooch, Jan W. "Diffuse Reflectance." In Encyclopedic Dictionary of Polymers, 220. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_3653.
Full textGooch, Jan W. "Directional Reflectance." In Encyclopedic Dictionary of Polymers, 234. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_3810.
Full textGooch, Jan W. "Reflectance, Absolute." In Encyclopedic Dictionary of Polymers, 613. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_9849.
Full textGooch, Jan W. "Reflectance, Diffuse." In Encyclopedic Dictionary of Polymers, 614. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_9850.
Full textGooch, Jan W. "Reflectance, Directional." In Encyclopedic Dictionary of Polymers, 614. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_9851.
Full textGooch, Jan W. "Reflectance Factor." In Encyclopedic Dictionary of Polymers, 614. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_9852.
Full textGooch, Jan W. "Reflectance, Fresnel." In Encyclopedic Dictionary of Polymers, 614. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_9853.
Full textGooch, Jan W. "Reflectance, Hemispherical." In Encyclopedic Dictionary of Polymers, 614. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_9854.
Full textConference papers on the topic "Reflectance"
De Zeeuw, Michael, and Aswin C. Sankaranarayanan. "Scanning Iridescent Reflectance." In 2024 IEEE International Conference on Computational Photography (ICCP), 1–12. IEEE, 2024. http://dx.doi.org/10.1109/iccp61108.2024.10644223.
Full textVerly, P. G., and G. Duplain. "Design of Fully Shaped Graded Reflectance Mirrors With Phase Control." In Optical Interference Coatings. Washington, D.C.: Optica Publishing Group, 1992. http://dx.doi.org/10.1364/oic.1992.omb2.
Full textHoffman, Naty. "Reflectance." In ACM SIGGRAPH 2006 Courses. New York, New York, USA: ACM Press, 2006. http://dx.doi.org/10.1145/1185657.1185756.
Full textSewall, Laura, and Daniel Kersten. "Limits to lightness constancy." In OSA Annual Meeting. Washington, D.C.: Optica Publishing Group, 1986. http://dx.doi.org/10.1364/oam.1986.tuh2.
Full textLv, Jipeng, Heng Guo, Guanying Chen, Jinxiu Liang, and Boxin Shi. "Non-Lambertian Multispectral Photometric Stereo via Spectral Reflectance Decomposition." In Thirty-Second International Joint Conference on Artificial Intelligence {IJCAI-23}. California: International Joint Conferences on Artificial Intelligence Organization, 2023. http://dx.doi.org/10.24963/ijcai.2023/139.
Full textBrill, Michael H. "Reflectance ensembles with illuminant-Invariant chromaticity ordering." In OSA Annual Meeting. Washington, D.C.: Optica Publishing Group, 1988. http://dx.doi.org/10.1364/oam.1988.wq6.
Full textKim, Hongsuk H. "Critical Reflectance." In Optical Remote Sensing of the Atmosphere. Washington, D.C.: Optica Publishing Group, 1990. http://dx.doi.org/10.1364/orsa.1990.wd15.
Full textKnill, David C., and Daniel Kersten. "Cooperativity in the perception of surface shape and reflectance." In OSA Annual Meeting. Washington, D.C.: Optica Publishing Group, 1989. http://dx.doi.org/10.1364/oam.1989.mjj1.
Full textTominaga, Shoji, and Brian A. Wandell. "Estimation of Surface Spectral Reflectance on the Standard Model." In Image Understanding and Machine Vision. Washington, D.C.: Optica Publishing Group, 1989. http://dx.doi.org/10.1364/iumv.1989.mb2.
Full textMesserschmidt, Robert G. "Toward Quantitative Diffuse Reflectance: Diffuse Reflectance Without Specular Impurity." In 1985 International Conference on Fourier and Computerized Infrared Spectroscopy, edited by David G. Cameron and Jeannette G. Grasselli. SPIE, 1985. http://dx.doi.org/10.1117/12.970798.
Full textReports on the topic "Reflectance"
Barnes, P. Yvonne, Edward A. Early, and Albert C. Parr. Spectral reflectance. Gaithersburg, MD: National Institute of Standards and Technology, 1998. http://dx.doi.org/10.6028/nist.sp.250-48.
Full textWeidner, Victor R., and Jack J. Hsia. Spectral reflectance. Gaithersburg, MD: National Bureau of Standards, 1987. http://dx.doi.org/10.6028/nbs.sp.250-8.
Full textLeblanc, S. G., J. M. Chen, H. P. White, R. Latifovic, R. Fernandes, J. L. Roujean, and R. Lacaze. Mapping leaf area index heterogeneity over Canada using directional reflectance and anisotropy canopy reflectance models using directional reflectance and anisotropy canopy reflectance models. Natural Resources Canada/ESS/Scientific and Technical Publishing Services, 2002. http://dx.doi.org/10.4095/219874.
Full textAlchanatis, Victor, Stephen W. Searcy, Moshe Meron, W. Lee, G. Y. Li, and A. Ben Porath. Prediction of Nitrogen Stress Using Reflectance Techniques. United States Department of Agriculture, November 2001. http://dx.doi.org/10.32747/2001.7580664.bard.
Full textBarron, Jonathan, and Jitendra Malik. Shape, Illumination, and Reflectance from Shading. Fort Belvoir, VA: Defense Technical Information Center, May 2013. http://dx.doi.org/10.21236/ada586648.
Full textVeloso, Rita Carvalho, Catarina Dias, Andrea Resende Souza, Joana Maia, Nuno M. M. Ramos, and João Ventura. Improving the optical properties of finishing coatings for façade systems. Department of the Built Environment, 2023. http://dx.doi.org/10.54337/aau541592743.
Full textRamos, Nuno M. M., Joana Maia, Rita Carvalho Veloso, Andrea Resende Souza, Catarina Dias, and João Ventura. Envelope systems with high solar reflectance by the inclusion of nanoparticles – an overview of the EnReflect Project. Department of the Built Environment, 2023. http://dx.doi.org/10.54337/aau541621982.
Full textLetcher, Theodore, Julie Parno, Zoe Courville, Lauren Farnsworth, and Jason Olivier. A generalized photon-tracking approach to simulate spectral snow albedo and transmittance using X-ray microtomography and geometric optics. Engineer Research and Development Center (U.S.), June 2023. http://dx.doi.org/10.21079/11681/47122.
Full textB. R. Marshall. Glue Film Thickness Measurements by Spectral Reflectance. Office of Scientific and Technical Information (OSTI), September 2010. http://dx.doi.org/10.2172/991875.
Full textFox, Jay A., and Cynthia R. Gautier. Model Tank Reflectance Study at Two Wavelengths. Fort Belvoir, VA: Defense Technical Information Center, June 1990. http://dx.doi.org/10.21236/ada225468.
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