Relevant bibliographies by topics / Reference-free X-ray fluorescence

Academic literature on the topic 'Reference-free X-ray fluorescence'

Author: Grafiati
Published: 14 March 2023

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Journal articles on the topic "Reference-free X-ray fluorescence"

1

Wählisch, André, Cornelia Streeck, Philipp Hönicke, and Burkhard Beckhoff. "Validation of secondary fluorescence excitation in quantitative X-ray fluorescence analysis of thin alloy films." Journal of Analytical Atomic Spectrometry 35, no. 8 (2020): 1664–70. http://dx.doi.org/10.1039/d0ja00171f.

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2

Beckhoff, B., M. Kolbe, O. Hahn, A. G. Karydas, Ch Zarkadas, D. Sokaras, and M. Mantler. "Reference-free x-ray fluorescence analysis of an ancient Chinese ceramic." X-Ray Spectrometry 37, no. 4 (July 2008): 462–65. http://dx.doi.org/10.1002/xrs.1073.

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3

Unterumsberger, Rainer, Philipp Hönicke, Yves Kayser, Beatrix Pollakowski-Herrmann, Saeed Gholhaki, Quanmin Guo, Richard E. Palmer, and Burkhard Beckhoff. "Interaction of nanoparticle properties and X-ray analytical techniques." Journal of Analytical Atomic Spectrometry 35, no. 5 (2020): 1022–33. http://dx.doi.org/10.1039/d0ja00049c.

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In this work, Pt–Ti core–shell nanoparticles were characterized using reference-free X-ray fluorescence analysis and used for the investigation of the modification of the X-Ray Standing Wave (XSW) field intensity with increasing NP surface coverage.
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4

Unterumsberger, Rainer, Philipp Hönicke, Julien L. Colaux, Chris Jeynes, Malte Wansleben, Matthias Müller, and Burkhard Beckhoff. "Accurate experimental determination of gallium K- and L3-shell XRF fundamental parameters." Journal of Analytical Atomic Spectrometry 33, no. 6 (2018): 1003–13. http://dx.doi.org/10.1039/c8ja00046h.

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The fluorescence yield of the K- and L3-shell of gallium was determined using the radiometrically calibrated (reference-free) X-ray fluorescence instrumentation at the BESSY II synchrotron radiation facility.
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5

Soltwisch, Victor, Philipp Hönicke, Yves Kayser, Janis Eilbracht, Jürgen Probst, Frank Scholze, and Burkhard Beckhoff. "Element sensitive reconstruction of nanostructured surfaces with finite elements and grazing incidence soft X-ray fluorescence." Nanoscale 10, no. 13 (2018): 6177–85. http://dx.doi.org/10.1039/c8nr00328a.

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6

Cara, Eleonora, Luisa Mandrile, Alessio Sacco, Andrea M. Giovannozzi, Andrea M. Rossi, Federica Celegato, Natascia De Leo, et al. "Towards a traceable enhancement factor in surface-enhanced Raman spectroscopy." Journal of Materials Chemistry C 8, no. 46 (2020): 16513–19. http://dx.doi.org/10.1039/d0tc04364h.

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7

Kolbe, Michael, Burkhard Beckhoff, Michael Krumrey, and Gerhard Ulm. "Comparison of reference-free X-ray fluorescence analysis and X-ray reflectometry for thickness determination in the nanometer range." Applied Surface Science 252, no. 1 (September 2005): 49–52. http://dx.doi.org/10.1016/j.apsusc.2005.01.112.

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8

Beckhoff, Burkhard, Rolf Fliegauf, Michael Kolbe, Matthias Müller, Jan Weser, and Gerhard Ulm. "Reference-Free Total Reflection X-ray Fluorescence Analysis of Semiconductor Surfaces with Synchrotron Radiation." Analytical Chemistry 79, no. 20 (October 2007): 7873–82. http://dx.doi.org/10.1021/ac071236p.

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9

Reinhardt, Falk, János Osán, Szabina Török, Andrea Edit Pap, Michael Kolbe, and Burkhard Beckhoff. "Reference-free quantification of particle-like surface contaminations by grazing incidence X-ray fluorescence analysis." J. Anal. At. Spectrom. 27, no. 2 (2012): 248–55. http://dx.doi.org/10.1039/c2ja10286b.

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10

Kolbe, M., B. Beckhoff, M. Krumrey, and G. Ulm. "F15 Thickness Determination of Copper and Nickel Nanolayers: Comparison of Completely Reference-Free X-ray Fluorescence Analysis and X-ray Reflectometry." Powder Diffraction 20, no. 2 (June 2005): 174. http://dx.doi.org/10.1154/1.1979030.

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