Academic literature on the topic 'Reconfigurable scan networks'
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Journal articles on the topic "Reconfigurable scan networks"
Baranowski, Rafal, Michael A. Kochte, and Hans-Joachim Wunderlich. "Reconfigurable Scan Networks." ACM Transactions on Design Automation of Electronic Systems 20, no. 2 (March 2, 2015): 1–27. http://dx.doi.org/10.1145/2699863.
Full textLarsson, Erik, Zehang Xiang, and Prathamesh Murali. "Graceful Degradation of Reconfigurable Scan Networks." IEEE Transactions on Very Large Scale Integration (VLSI) Systems 29, no. 7 (July 2021): 1475–79. http://dx.doi.org/10.1109/tvlsi.2021.3076593.
Full textCantoro, Riccardo, Farrokh Ghani Zadegan, Marco Palena, Paolo Pasini, Erik Larsson, and Matteo Sonza Reorda. "Test of Reconfigurable Modules in Scan Networks." IEEE Transactions on Computers 67, no. 12 (December 1, 2018): 1806–17. http://dx.doi.org/10.1109/tc.2018.2834915.
Full textBaranowski, Rafal, Michael A. Kochte, and Hans-Joachim Wunderlich. "Access Port Protection for Reconfigurable Scan Networks." Journal of Electronic Testing 30, no. 6 (October 18, 2014): 711–23. http://dx.doi.org/10.1007/s10836-014-5484-2.
Full textXu, Yizhen, Shouhong Chen, Jun Ma, Cuifeng Xu, and Ke Zeng. "Topology Modeling for Reconfigurable Scan Networks in IEEE 1687 Networks." Journal of Physics: Conference Series 2221, no. 1 (May 1, 2022): 012055. http://dx.doi.org/10.1088/1742-6596/2221/1/012055.
Full textBaranowski, Rafal, Michael A. Kochte, and Hans-Joachim Wunderlich. "Fine-Grained Access Management in Reconfigurable Scan Networks." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 34, no. 6 (June 2015): 937–46. http://dx.doi.org/10.1109/tcad.2015.2391266.
Full textHajian, M., B. Kuijpers, K. Buisman, A. Akhnoukh, M. Pelk, L. C. N. de Vreede, J. Zijdeveld, L. P. Ligthart, and C. Spitas. "Passive and Active Reconfigurable Scan-Beam Hollow Patch Reflectarray Antennas." ISRN Communications and Networking 2012 (May 6, 2012): 1–10. http://dx.doi.org/10.5402/2012/290534.
Full textCantoro, Riccardo, Aleksa Damljanovic, Matteo Sonza Reorda, and Giovanni Squillero. "An Enhanced Evolutionary Technique for the Generation of Compact Reconfigurable Scan-Network Tests." Journal of Circuits, Systems and Computers 28, supp01 (December 1, 2019): 1940007. http://dx.doi.org/10.1142/s0218126619400073.
Full textCantoro, Riccardo, Aleksa Damljanovic, Matteo Sonza Reorda, and Giovanni Squillero. "A Novel Sequence Generation Approach to Diagnose Faults in Reconfigurable Scan Networks." IEEE Transactions on Computers 69, no. 1 (January 1, 2020): 87–98. http://dx.doi.org/10.1109/tc.2019.2939125.
Full textGhani, Arfan, Akinyemi Aina, Chan Hwang See, Hongnian Yu, and Simeon Keates. "Accelerated Diagnosis of Novel Coronavirus (COVID-19)—Computer Vision with Convolutional Neural Networks (CNNs)." Electronics 11, no. 7 (April 6, 2022): 1148. http://dx.doi.org/10.3390/electronics11071148.
Full textDissertations / Theses on the topic "Reconfigurable scan networks"
Baranowski, Rafal [Verfasser], and Hans-Joachim [Akademischer Betreuer] Wunderlich. "Reconfigurable scan networks : formal verification, access optimization, and protection / Rafal Baranowski. Betreuer: Hans-Joachim Wunderlich." Stuttgart : Universitätsbibliothek der Universität Stuttgart, 2014. http://d-nb.info/1048558843/34.
Full textBook chapters on the topic "Reconfigurable scan networks"
Bertossi, Alan A., and Alessandro Mei. "Optimal Segmented Scan and Simulation of Reconfigurable Architectures on Fixed Connection Networks." In High Performance Computing — HiPC 2000, 51–60. Berlin, Heidelberg: Springer Berlin Heidelberg, 2000. http://dx.doi.org/10.1007/3-540-44467-x_5.
Full textConference papers on the topic "Reconfigurable scan networks"
Lylina, Natalia, Chih-Hao Wang, and Hans-Joachim Wunderlich. "Robust Reconfigurable Scan Networks." In 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE). IEEE, 2022. http://dx.doi.org/10.23919/date54114.2022.9774770.
Full textBaranowski, Rafal, Michael A. Kochte, and Hans-Joachim Wunderlich. "Securing Access to Reconfigurable Scan Networks." In 2013 22nd Asian Test Symposium (ATS). IEEE, 2013. http://dx.doi.org/10.1109/ats.2013.61.
Full textKochte, Michael A., Rafal Baranowski, Marcel Schaal, and Hans-Joachim Wunderlich. "Test Strategies for Reconfigurable Scan Networks." In 2016 IEEE 25th Asian Test Symposium (ATS). IEEE, 2016. http://dx.doi.org/10.1109/ats.2016.35.
Full textLylina, Natalia, Ahmed Atteya, Pascal Raiola, Matthias Sauer, Bernd Becker, and Hans-Joachim Wunderlich. "Security Compliance Analysis of Reconfigurable Scan Networks." In 2019 IEEE International Test Conference (ITC). IEEE, 2019. http://dx.doi.org/10.1109/itc44170.2019.9000114.
Full textCantoro, Riccardo, Marco Palena, Paolo Pasini, and Matteo Sonza Reorda. "Test Time Minimization in Reconfigurable Scan Networks." In 2016 IEEE 25th Asian Test Symposium (ATS). IEEE, 2016. http://dx.doi.org/10.1109/ats.2016.58.
Full textUll, Dominik, Michael Kochte, and Hans-Joachim Wunderlich. "Structure-Oriented Test of Reconfigurable Scan Networks." In 2017 IEEE 26th Asian Test Symposium (ATS). IEEE, 2017. http://dx.doi.org/10.1109/ats.2017.34.
Full textLylina, Natalia, Chih-Hao Wang, and Hans-Joachim Wunderlich. "Online Periodic Test of Reconfigurable Scan Networks." In 2022 IEEE 31st Asian Test Symposium (ATS). IEEE, 2022. http://dx.doi.org/10.1109/ats56056.2022.00026.
Full textBrandhofer, Sebastian, Michael A. Kochte, and Hans-Joachim Wunderlich. "Synthesis of Fault-Tolerant Reconfigurable Scan Networks." In 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE). IEEE, 2020. http://dx.doi.org/10.23919/date48585.2020.9116525.
Full textLylina, Natalia, Chih-Hao Wang, and Hans-Joachim Wunderlich. "Testability-Enhancing Resynthesis of Reconfigurable Scan Networks." In 2021 IEEE International Test Conference (ITC). IEEE, 2021. http://dx.doi.org/10.1109/itc50571.2021.00009.
Full textThiemann, Benjamin, Linus Feiten, Pascal Raiola, Bernd Becker, and Matthias Sauer. "On Integrating Lightweight Encryption in Reconfigurable Scan Networks." In 2019 IEEE European Test Symposium (ETS). IEEE, 2019. http://dx.doi.org/10.1109/ets.2019.8791543.
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