Books on the topic 'Random testing'

Hamdioui, Said. Testing Static Random Access Memories. Boston, MA: Springer US, 2004. http://dx.doi.org/10.1007/978-1-4757-6706-3.

Petlin, Oleg Alexandrovich. Random testing of asynchronous VLSI circuits. Manchester: University of Manchester, 1994.

Davis, Gerald J. Conducting random drug and alcohol testing. Alexandria, VA: American Trucking Associations, 1994.

René, David. Random testing of digital circuits: Theory & application. New York: Marcel Dekker, 1998.

Random testing of digital circuits: Theory and applications. New York: Marcel Dekker, 1998.

James-Burdumy, Susanne. The effectiveness of mandatory-random student drug testing. Washington, DC: U.S. Dept. of Education, National Center for Education Evaluation and Regional Assistance, Institute of Education Sciences, 2010.

Kanad, Chakraborty, ed. Testing and testable design of high-density random-access memories. Boston, Mass: Kluwer Academic, 1996.

I͡Armolik, V. N. Generation and application of pseudorandom sequences for random testing. Chichester [West Sussex]: Wiley, 1988.

IEEE International Workshop on Memory Technology, Design, and Testing (1998 San Jose, California). Memory technology, design and testing: Proceedings : International Workshop on Memory Technology, Design, and Testing. Los Alamitos, California: IEEE Computer Society Press, 1998.

Hughes, William O. Vibration testing of an operating Stirling convertor. [Cleveland, Ohio]: National Aeronautics and Space Administration, Glenn Research Center, 2000.

Moryson, Martin. Testing for random walk coefficients in regression and state space models. New York: Physica-Verlag, 1998.

Mazumder, Pinaki. Testing and Testable Design of High-Density Random-Access Memories. Boston, MA: Springer US, 1996.

K, Kokula Krishna Hari, ed. Generating and Testing a Random Stream using dynamic S-box. Pondicherry, India: Association of Scientists, Developers and Faculties, 2014.

Cashmore, Judy. The impact of random breath testing in New South Wales. Sydney: N.S.W. Bureau of Crime Statistics, Attorney General's department, 1985.

Karmakar, Debashis. Random number generators (RNG) and their testing for sequential programmes. Mumbai: Bhabha Atomic Research Centre, 2002.

Mazumder, Pinaki, and Kanad Chakraborty. Testing and Testable Design of High-Density Random-Access Memories. Boston, MA: Springer US, 1996. http://dx.doi.org/10.1007/978-1-4613-1451-6.

Webster, Barbara. Mandatory and random drug testing in the Honolulu Police Department. [Washington, D.C.]: U.S. Dept. of Justice, Office of Justice Programs, National Institute of Justice, 1989.

Hamdioui, Said. Testing static random access memories: Defects, fault models, and test patterns. Boston: Kluwer Academic, 2004.

Cerrato, Mario. Testing for random walk and structural breaks in hedge funds returns. London: London Metropolitan University, Department of Economics, 2004.

Moryson, Martin. Testing for Random Walk Coefficients in Regression and State Space Models. Heidelberg: Physica-Verlag HD, 1998. http://dx.doi.org/10.1007/978-3-642-99799-0.

Kumazawa, Yoshiki. Testing for new better than used in expectation under random censorship. Hikone, Japan: Faculty of Economics, Shiga University, 1988.

IEEE International Workshop on Memory Technology, Design, and Testing (1997 San Jose, Calif.). Proceedings: International Workshop on Memory Technology, Design, and Testing. Los Alamitos, Calif: IEEE Computer Society Press, 1997.

McNelis, Mark E. CM-2 environmental/modal testing of Spacehab racks. [Cleveland, Ohio]: National Aeronautics and Space Administration, Glenn Research Center, 2001.

New York (State). Metropolitan Transportation Authority. Office of the Inspector General. A review of Transit Authority compliance with non-random drug testing requirements. [New York, N.Y.?: The Office, 1992.

Rochit, Rajsuman, and IEEE Computer Society. Test Technology Technical Committee., eds. Records of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California. Los Alamitos, Calif: IEEE Computer Society Press, 1993.

Yervant, Zorian, IEEE Computer Society, IEEE Computer Society. Technical Committee on VLSI., IEEE Computer Society. Technical Council on Test Technology., and IEEE Solid-State Circuits Society, eds. Proceedings: 2001 IEEE International Workshop on Memory Technology, Design, and Testing : August 6-7, 2001, San Jose, California. Los Alamitos, Calif: IEEE Computer Society, 2001.

IEEE, International Workshop on Memory Technology Design and Testing (1994 San Jose Calif ). Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California. Los Alamitos, Calif: IEEE Computer Society Press, 1994.

IEEE International Workshop on Memory Technology, Design, and Testing (1999 San Jose, Calif.). Records of the 1999 IEEE International Workshop on Memory Technology, Design, and Testing, August 9-10, 1999, San Jose, California, USA. Los Alamitos, Calif: IEEE Computer Society Press, 1999.

Rochit, Rajsuman, Rajkanan K, IEEE Computer Society. Test Technology Technical Committee., IEEE Computer Society. Technical Committee on VLSI., and IEEE Solid-State Circuits Council, eds. Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California. Los Alamitos, Calif: IEEE Computer Society Press, 1995.

IEEE, International Workshop on Memory Technology Design and Testing (17th 2009 Hsinchu Taiwan). MTDT 2009: 2009 IEEE International Workshop on Memory Technology, Design, and Testing : proceedings, 31 August- 2 September 2009, Hsinchu, Taiwan. Los Alamitos, Calif: IEEE Computer Society, 2009.

B, Courtois, Wik T, Zorian Yervant, IEEE Computer Society, IEEE Computer Society. Technical Committee on VLSI., IEEE Computer Society. Technical Council on Test Technology., and IEEE Solid-State Circuits Society, eds. Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France. Los Alamitos, Calif: IEEE Computer Society, 2002.

Tom, Wit, Singh Adit, Rajsuman Rochit, IEEE Computer Society, IEEE Computer Society. Technical Committee on VLSI., IEEE Computer Society. Technical Council on Test Technology., and IEEE Solid-State Circuits Society, eds. Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing, 28-29 July, 2003, San Jose, California. Los Alamitos, Calif: IEEE Computer Society, 2003.

Mo, Moxiu. Sensitivity analysis for additive regression and its by-products /by Moxiu Mo. Toronto: University of Toronto, Dept. of Statistics, 1991.

IEEE International Workshop on Memory Technology, Design and Testing (8th 2000 San Jose, Calif.). Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing: August 7-8, 2000, San Jose, California. Los Alamitos, Calif: IEEE Computer Society, 2000.

IEEE International Workshop on Memory Technology, Design and Testing (12th 2004 San Jose, Calif.). MTDT 2004: Records of the 2004 International Workshop on Memory Technology, Design and Testing : 9-10 August, 2004, San Jose, California, USA. Los Alamitos, Calif: IEEE Computer Society, 2004.

Carver, Robert D. Investigation of random variations in stability response of stone-armored, rubble-mound breakwaters. [Vicksburg, Miss: U.S. Army Engineer Waterways Experiment Station, 1991.

Torres, Nellie V. Substance abuse and the constitution: Civil rights versus random drug testing : 1986 report of the New York State Assembly Sub-committee on Substance Abuse. [Albany, N.Y.?: The Sub-committee, 1987.

Random drug testing of schoolchildren: A shot in the arm or a shot in the foot for drug prevention? York: Joseph Rowntree Foundation, 2005.

Paliy, Irina. Probability theory and mathematical statistics. ru: INFRA-M Academic Publishing LLC., 2021. http://dx.doi.org/10.12737/1065828.

Lemeshko, Boris, and Irina Veretel'nikova. Criteria for testing hypotheses about randomness and the absence of a trend. Application Guide. ru: INFRA-M Academic Publishing LLC., 2021. http://dx.doi.org/10.12737/1587437.

Randomization tests. 2nd ed. New York: M. Dekker, 1987.

Edgington, Eugene S. Randomization tests. 3rd ed. New York: M. Dekker, 1995.

Patrick, Onghena, ed. Randomization tests. 4th ed. Boca Raton, Fla: Taylor & Francis, 2007.

Homel, Ross. Policing and punishing the drinking driver: A study of general and specific deterrence. New York: Springer-Verlag, 1988.

Homel, Ross. Policing and punishing the drinking driver: A study of general and specific deterrence. New York: Springer-Verlag, 1988.

United States. Urban Mass Transportation Administration. Office of Technical Assistance and Safety and Battelle Memorial Institute. Columbus Laboratories, eds. Random drug testing manual. [Washington, D.C.?]: U.S. Dept. of Transportation, Urban Mass Transportation Administration, Office of Technical Assistance and Safety, 1991.

Random drug testing manual. [Washington, D.C.?]: U.S. Dept. of Transportation, Urban Mass Transportation Administration, Office of Technical Assistance and Safety, 1991.

United States. Urban Mass Transportation Administration. Office of Technical Assistance and Safety. and Battelle Memorial Institute. Columbus Laboratories., eds. Random drug testing manual. [Washington, D.C.?]: U.S. Dept. of Transportation, Urban Mass Transportation Administration, Office of Technical Assistance and Safety, 1991.

United States. Dept. of Transportation. Office of the Secretary, ed. DOT's drug program: Random testing : how it works. [Washington, D.C.?]: U.S. Dept. of Transportation, Office of the Secretary of Transportation, 1989.

United States. Dept. of Transportation. Office of the Secretary, ed. DOT's drug program: Random testing : how it works. [Washington, D.C.?]: U.S. Dept. of Transportation, Office of the Secretary of Transportation, 1988.