Books on the topic 'Quality control Optical methods Automation x'

European, Congress on Optics (1st 1988 Hamburg Germany). In-process optical measurements: Proceedings. Bellingham, Wash., USA: SPIE, 1989.

H, Spring Kenneth, European Federation for Applied Optics., European Physical Society, Society of Photo-optical Instrumentation Engineers., and Unesco, eds. In-process optical measurements: ECO1, 22-23 September 1988, Hamburg, Federal Republic of Germany. Bellingham, Wash., USA: SPIE, 1989.

A, Brook Richard, Chen Michael J. W, Sira Limited, University of Arizona. Optical Sciences Center., University of Rochester. Institute of Optics., and Society of Photo-optical Instrumentation Engineers., eds. International Conference on Automatic Inspection and Measurement: August 20-21, 1985, San Diego, California. Bellingham, Wash., USA: SPIE--International Society for Optical Engineering, 1985.

W, Chen Michael J., Thibadeau Robert, and Society of Photo-optical Instrumentation Engineers., eds. Automated inspection and measurement: 28-30 October 1986, Cambridge, Massachusetts. Bellingham, Wash., USA: SPIE--the International Society for Optical Engineering, 1987.

Machine vision: Automated visual inspection and robot vision. New York: Prentice Hall, 1991.

Clist, Roger. Automated inspection 1992-93: FRST contract C08229, objective 1. Auckland, N.Z: Industrial Research, 1993.

Vision, '89 (1989 Chicago Ill ). Vision '89, April 24-27, 1989, Chicago, Illinois. Dearborn, Mich. (1 SME Dr., Dearborn 48121): Society of Manufacturing Engineers, 1989.

Vision '90 (1990 Detroit, Mich.). Vision '90, November 12-15, 1990, Detroit, Michigan. Dearborn, Mich: Society of Manufacturing Engineers, 1990.

Tuczek, Hubertus C. Inspektion von Karosseriepressteilen auf Risse und Einschnürungen mittels Methoden der Bildverarbeitung. Berlin: Springer, 1992.

Fofi, David. Image processing: Machine vision applications IV : 25-27 January 2011, San Francisco, California, United States. Edited by SPIE (Society) and IS & T--the Society for Imaging Science and Technology. Bellingham, Wash: SPIE, 2011.

Lam, Edmund, and Philip R. Bingham. Image processing: Machine vision applications V : 25 January 2012, Burlingame, California, United States. Edited by IS & T--the Society for Imaging Science and Technology, SPIE (Society), and Electronic Imaging Science and Technology Symposium (2012 : Burlingame, Calif.). Bellingham, Wash: SPIE, 2012.

Fabrice, Mériaudeau, Niel Kurt S, IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Machine vision applications in industrial inspection XV: 29-30 January, 2007, San Jose, California, USA. Bellingham, Wash: SPIE, 2007.

1970-, Price Jeffery Ray, Mériaudeau Fabrice, IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Machine vision applications in industrial inspection XII: 21-22 January, 2004, San Jose, California, USA. Bellingham, Wash., USA: SPIE, 2004.

Fabrice, Mériaudeau, Niel Kurt S, IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Machine vision applications in industrial inspection XIV: 16-17 January, 2006, San Jose, California, USA. Bellingham, Wash: SPIE, 2006.

R, Martin R., ed. Computer vision, models, and inspection. Singapore: World Scientific, 1992.

Vectron y el gobierno de Puerto Rico. [San Juan, P.R.?]: EMS Editores, 2008.

G, Batchelor Bruce, Hill D. A, and Hodgson D. C, eds. Automated visual inspection. Kempston, Bedford, UK: IFS (Publications) Ltd., 1985.

Savage, Robert M. Automated inspection of soldered joints for surface mount technology. [Washington, D.C.]: National Aeronautics and Space Administration, Scientific and Technical Information Branch, 1993.

Leuenberger, Rolf. Automatische Gewebeinspektion mit Hilfe neuronaler Netzwerke. Zürich: Eidgenössische Technische Hochschule, 1996.

1963-, Hunt Martin A., IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Machine vision applications in industrial inspection X: 21-22 January 2002, San Jose, [California] USA. Bellingham, Washington: SPIE, 2002.

R, Baker L., Caulfield H. J. 1936-, Sira Limited, Society of Photo-optical Instrumentation Engineers., Association nationale de la recherche technique., and International Symposium on Optical and Optoelectronic Applied Sciences and Engineering (3rd : 1986 : Innsbruck, Austria), eds. Automatic optical inspection: 15-18 April 1986, Innsbruck, Austria. Bellingham, Wash., USA: SPIE, 1986.

Markus, Becker, Daniel R. W, Loffeld Otmar, Commission of the European Communities. Directorate-General for Science, Research, and Development., European Optical Society, and Society of Photo-optical Instrumentation Engineers., eds. Sensors and control for automation: [conference] 22-24 June, Frankfort, FRG. Bellington, Wash: SPIE--the International Society for Optical Engineering, 1994.

W, Chen Michael J., and Society of Photo-optical Instrumentation Engineers., eds. Automated inspection and high-speed vision architectures III: 6-7 November 1989, Philadelphia, Pennsylvania. Bellingham, Wash., USA: SPIE, 1990.

M, Dawson Benjamin, Wilson Stephen S, Wu Frederick Y, IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Machine vision applications in industrial inspection II: 8-9 February 1994, San Jose, California. Bellingham, Wash., USA: SPIE, 1994.

W, Chen Michael J., Ahlers R. -J, Society of Photo-optical Instrumentation Engineers., IEEE Industrial Electronics Society, and Keisoku Jidō Seigyo Gakkai (Japan), eds. Automated inspection and high speed vision architectures: 3-4 November, 1987, Cambridge, Massachusetts. Bellingham, Wash., USA: SPIE--the International Society for Optical Engineering, 1988.

W, Chen Michael J., Society of Photo-optical Instrumentation Engineers., and Carnegie-Mellon University. Center for Optical Data Processing., eds. Automated inspection and high speed vision architectures II: 10-11 November, 1988, Cambridge, Massachusetts. Bellingham, Wash., USA: SPIE, 1989.

Vernon, David. Machine Vision. Prentice Hall Europe (a Pearson Education company), 1991.

Y, Wu Frederick, Dawson Benjamin M, IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Machine vision applications in industrial inspection: 3-4 February 1993, San Jose, California. Bellingham, Wash., USA: SPIE, 1993.

Y, Wu Frederick, Wilson Stephen S, IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Machine vision applications in industrial inspection III: 8-9 February 1995, San Jose, California. Bellingham, Wash., USA: SPIE, 1995.

Y, Wu Frederick, Ye Shenghua 1934-, Society of Photo-optical Instrumentation Engineers., Zhongguo guang xue xue hui., and Guo jia zi ran ke xue ji jin wei yuan hui (China), eds. Automated optical inspection for industry: 6-7 November 1996, Beijing, China. Bellingham, Wash: SPIE, 1996.

1934-, Ye Shenghua, Society of Photo-optical Instrumentation Engineers., Zhongguo guang xue xue hui., and Chinese Optics & Optoelectronic Manufacturers Association., eds. Automated optical inspection for industry: theory, technology, and applications II: 16-19 September, 1998, Beijing, China. Bellingham, Washington: SPIE, 1998.

Tung-Shuen, Ho Anthony, Rao Sreenivas, Cheng Lee Ming, Society of Photo-optical Instrumentation Engineers., Society of Photo-optical Instrumentation Engineers. Singapore Chapter., and Institute of Physics Singapore, eds. Automatic inspection and novel instrumentation: 25-26 June 1997, Singapore. Bellingham, Wash., USA: SPIE, 1997.

Fofi, David, and Kurt Niel. Image Processing: Machine Vision Applications - 29-31 January 2008, San Jose, California, USA. SPIE, 2008.

G, Batchelor Bruce, Waltz Frederick M, and Society of Photo-optical Instrumentation Engineers., eds. Machine vision systems integration: Proceedings of a conference held 6-7 November 1990, Boston, Massachusetts. Bellingham, Wash., USA: SPIE Optical Engineering Press, 1991.

A, Ravishankar Rao, Chang Ning-San, IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Machine vision applications in industrial inspection IV: 31 January-1 February, 1996, San Jose, California. Bellingham, Wash., USA: SPIE, 1996.

A, Ravishankar Rao, Chang Ning-San, IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Machine vision applications in industrial inspection V: 10-11 February, 1997, San Jose, California. Bellingham, Washington: SPIE, 1997.

Machine vision applications in industrial inspection VII: 25-26 January 1999, San Jose, California. Bellingham, Wash., USA: SPIE, 1999.

Fofi, David, and Kurt Niel. Image Processing: Machine Vision Applications III. SPIE, 2010.

W, Chen Michael J., Society of Photo-optical Instrumentation Engineers., Symposium on Advances in Intelligent Systems (1990 : Boston, Mass.), and OE/Boston '90 (1990), eds. High-speed inspection architectures, barcoding, and character recognition: 5-7 November 1990, Boston, Massachusetts. Bellingham, Wash., USA: SPIE, 1991.

1963-, Hunt Martin A., Price Jeffery R, IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Machine vision applications in industrial inspection XI: 22-24 January, 2003, Santa Clara, California, USA. Bellingham, Wash: SPIE, 2003.

1963-, Hunt Martin A., IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Machine vision applications in industrial inspection IX: 22-23 January 2001, San Jose, [California] USA. Bellingham, Wash., USA: SPIE, 2001.

W, Tobin Kenneth, IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Machine vision applications in industrial inspection VIII: 24-26 January 2000, San Jose, California. Bellingham, Wash., USA: SPIE, 2000.

A, Ravishankar Rao, Chang Ning-San, IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Machine vision applications in industrial inspection VI: 27 January 1998, San Jose, California. Bellingham, Wash., USA: SPIE, 1998.