Relevant bibliographies by topics / Profilometry

Academic literature on the topic 'Profilometry'

Author: Grafiati
Published: 4 June 2021
Last updated: 29 January 2023

Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles

Select a source type:

Contents

Consult the lists of relevant articles, books, theses, conference reports, and other scholarly sources on the topic 'Profilometry.'

Next to every source in the list of references, there is an 'Add to bibliography' button. Press on it, and we will generate automatically the bibliographic reference to the chosen work in the citation style you need: APA, MLA, Harvard, Chicago, Vancouver, etc.

You can also download the full text of the academic publication as pdf and read online its abstract whenever available in the metadata.

Journal articles on the topic "Profilometry"

1

Nikanorov, Nikolai Y., and Elizabeth G. Bobyleva. "CONTROL METHODS OF OPTICAL DETAILS WITH FREE-FORM SURFACES AND KINOFORM ELEMENTS." Interexpo GEO-Siberia 8, no. 1 (July 8, 2020): 118–26. http://dx.doi.org/10.33764/2618-981x-2020-8-1-118-126.

Full text
Abstract:
Methods of control of optical parts with free-form surfaces and kinoform elements under production conditions are considered. Two of the considered methods - interferometric (using holographic compensators) and profilometric (using contact profilometers) - are widely known and used in industrial practice. The method of non-contact profilometry, based on chromatic confocal sensors to control the surface shape of optical parts in industrial conditions, was not previously applied.
APA, Harvard, Vancouver, ISO, and other styles
2

A.A., Dedkova, Kireev V. Yu., and Makhiboroda M.A. "Possibilities and limitations of the contact profilometry method for determining the height difference for monitoring topological elements and layer thickness." Nanostructures. Mathematical Physics and Modelling 20, no. 2 (2020): 23–40. http://dx.doi.org/10.31145/2224-8412-2020-20--2-23-40.

Full text
Abstract:
The work shows specific examples of the possibilities and limitations of the contact profilometry method for measuring the relief of micro and nanostructures formed on substrates during the production of microelectronic devices. The requirements to the relief parameters of microelectronic structures are formulated, which make it possible to use contact profilometers for their measurement and control. Methods of forming steps for measuring the thickness of films by contact profilometry are described, and their advantages and disadvantages are analyzed. The method of contact profilometry with optical profilometry and atomic force microscopy is compared.
APA, Harvard, Vancouver, ISO, and other styles
3

Moon, Byoung Geun, Na Young Park, Young Chan Ko, and Hyoung Jin Kim. "Characterization of paper surfaces by friction profilometry." BioResources 17, no. 4 (September 12, 2022): 6067–78. http://dx.doi.org/10.15376/biores.17.4.6067-6078.

Full text
Abstract:
Friction profilometry is a powerful technique that is suitable for the surface characterization of paper products. In this technique, a stylus-type contact method that resembles papermaking processes is used for evaluating the quality attributes of products. The surface characterization requires both surface roughness and friction measurements. At present, however, few reports have been available regarding characterization of the friction by the surface profilometric method. The objective of this study was to provide guiding principles of a stylus-type contact surface profilometry for determining the friction properties of paper. Another objective was to introduce the concept of the mean absolute deviation (MAD) from the average coefficient of friction as a new friction parameter.
APA, Harvard, Vancouver, ISO, and other styles
4

Soto-Negro, Roberto. "Anterior Eye Profilometry-guided Scleral Contact Lens Fitting in Keratoconus." International Journal of Keratoconus and Ectatic Corneal Diseases 6, no. 2 (2017): 97–100. http://dx.doi.org/10.5005/jp-journals-10025-1150.

Full text
Abstract:
ABSTRACT We report the case of a 35-year-old woman diagnosed with keratoconus since she was 18 years old and wearer of corneal rigid contact lenses (CLs). We refitted the case with the fully scleral CL ICD16.5 (Paragon Vision Sciences) for obtaining not only a successful visual restoration, but also a comfortable wear. We initiated the fitting with the spherical model of the CL, but it failed due to instability of the lens. We confirmed the presence of a clear asymmetry in the anterior scleral geometry in both eyes by using the profilometer eye surface profiler (ESP, Eaglet Eye), with a difference between nasal and temporal sagittal heights of 470 and 170 μm in right and left eyes respectively. Although this profile suggested the need for the fitting of a CL with significant peripheral toricity, we followed the manufacturer's guidelines and performed a trial with a CL of moderate peripheral toricity (125 μm of difference between steep and flat meridian). The stability of the CL failed again and finally a CL with a peripheral toricity close to that measured with the profilometer was fitted. With this lens, good visual performance, lens stability, and comfort was obtained and maintained during a 1-year follow-up. This case suggests that fully scleral CLs fitting might be optimized with the use of corneo-scleral profilometers, minimizing potentially the number of trials. This potential benefit should be investigated further in future studies. How to cite this article Piñero DP, Soto-Negro R. Anterior Eye Profilometry-guided Scleral Contact Lens Fitting in Keratoconus. Int J Kerat Ect Cor Dis 2017;6(2):97-100.
APA, Harvard, Vancouver, ISO, and other styles
5

Podbielska, Halina. "Endoscopic profilometry." Optical Engineering 30, no. 12 (1991): 1981. http://dx.doi.org/10.1117/12.56009.

Full text
APA, Harvard, Vancouver, ISO, and other styles
6

Reid, Roberto E., Eliahu Laor, Bhupendra M. Tolia, Kenneth Donner, and Selwyn Z. Freed. "Intraoperative Profilometry." Journal of Urology 133, no. 2 (February 1985): 203–4. http://dx.doi.org/10.1016/s0022-5347(17)48881-1.

Full text
APA, Harvard, Vancouver, ISO, and other styles
7

Ślusarski, Łukasz. "Measurement accuracy analysis for microgeometry nanostandards with microinterferometer and stylus profilometer." Bulletin of the Military University of Technology 67, no. 4 (December 31, 2018): 139–48. http://dx.doi.org/10.5604/01.3001.0012.8503.

Full text
Abstract:
The goal of the work, described in this paper, was to examine and analyse measurement capabilities of GUM Length and Angle Department in measurements of step height/depth standards with the values below 1 μm (nanostandards), with 2D, and 3D surface characteristics. Measurements were performed with microinterforometer and stylus profilometer. Keywords: nanometrology, depth/height standards, microinterferometry, contact profilometry.
APA, Harvard, Vancouver, ISO, and other styles
8

Marotta, Gianluca, Daniela Fontani, Franco Francini, David Jafrancesco, Maurizio De Lucia, and Paola Sansoni. "Laser Profilometry on Micro-PTC." Energies 15, no. 14 (July 21, 2022): 5293. http://dx.doi.org/10.3390/en15145293.

Full text
Abstract:
Profilometry is useful in detecting surface faults on solar concentrators, which can be imperfectly manufactured, thus affecting system performance. Profilometric analyses are performed on a micro-parabolic trough collector (m-PTC), with reduced sizes and greater mirror curvature than a usual PTC. The peculiar dimensions and shape of this micro-PTC request to develop a specific configuration of laser profilometry. It includes a laser diode with a converging lens placed in front of it, ensuring that the mirror curvature does not affect the beam reflection. A new method to calculate the spot position furnishes the reflected beam center even if it lies outside the target, giving it a virtual expansion. The profile is assessed with an iterative calculation, starting from a first point, physically measured. The results are the 3D profile reconstruction of the parabolic mirror and a map of the slope error for each mirror point. It also estimates the intercept factor, a parameter fundamental to optimize the m-PTC system, whose value is in agreement with a structured light measurement on the same object. This intercept factor was obtained averaging the local intercept factor calculated for each mirror point, which individuates the mirror portions not focusing the sunrays on the tube.
APA, Harvard, Vancouver, ISO, and other styles
9

HAYASAKI, Yoshio. "Frequency Comb Profilometry." Journal of the Japan Society for Precision Engineering 84, no. 8 (August 5, 2018): 701–5. http://dx.doi.org/10.2493/jjspe.84.701.

Full text
APA, Harvard, Vancouver, ISO, and other styles
10

Fang, Qiang, and Sunde Zheng. "Linearly coded profilometry." Applied Optics 36, no. 11 (April 10, 1997): 2401. http://dx.doi.org/10.1364/ao.36.002401.

Full text
APA, Harvard, Vancouver, ISO, and other styles
More sources

Dissertations / Theses on the topic "Profilometry"

1

Fojtík, Tomáš. "Systém pro precizní 3D snímání spojitého povrchu nožní klenby." Master's thesis, Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií, 2014. http://www.nusl.cz/ntk/nusl-220692.

Full text
Abstract:
This thesis deals with the development of the user interface for the application of the method Phase shifting profilometry. First deals with the theoretical approach of this method, and describes the process of image segmentation and data processing using morphological operations. In the practical part of the user interface is designed for acquiring and processing data received in Matlab.
APA, Harvard, Vancouver, ISO, and other styles
2

Aumond, Bernardo Dantas 1972. "High precision profilometry." Thesis, Massachusetts Institute of Technology, 1997. http://hdl.handle.net/1721.1/46102.

Full text
APA, Harvard, Vancouver, ISO, and other styles
3

Clark, Stephan Richard. "Optical reference profilometry." Diss., The University of Arizona, 2000. http://hdl.handle.net/10150/289168.

Full text
Abstract:
The Optical Reference Profilometer is a new coordinate measurement machine (CMM) configuration that utilizes a special optical referencing frame to provide a highly stable and highly accurate surface measurement. This new referencing frame provides several mechanical advantages that make it possible to use lower precision mechanical components while still maintaining a high measurement accuracy. The Optical Reference Profilometer also provides a reduced measurement sensitivity to thermal variations of the system. With the addition a Super-Invar metering rod network, this CMM system is essentially thermally insensitive to temperature changes on the order of 1°C. This special feature makes the Optical Reference Profilometer functional at a high measurement accuracy level in an open lab environment. For the current dissertation work, two profilometer designs were built: a prototype and a second-generation system. A discussion of both systems will be given where the advantages of the optical reference frame design will be shown, This dissertation will end with a discussion of the overall system performance and plans for future work that would increase the overall system accuracy. The optical reference profilometer has proven to be a viable testing device. It provides a high accuracy surface measurement, 100nm peak-to-valley and 15nm rms for surface slopes up to 20 degrees, with simple mechanical structures while maintaining the versatility to measure a variety of surface shapes.
APA, Harvard, Vancouver, ISO, and other styles
4

Yang, Ho Soon. "Developments in stylus profilometry." Thesis, University College London (University of London), 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.342210.

Full text
APA, Harvard, Vancouver, ISO, and other styles
5

Aumond, Bernardo Dantas 1972. "High precision stereo profilometry." Thesis, Massachusetts Institute of Technology, 2001. http://hdl.handle.net/1721.1/88892.

Full text
Abstract:
Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2001.
Includes bibliographical references (leaves 186-190).
Metrological data from sample surfaces can be obtained by using a variety of profilome try methods. Atomic Force Microscopy (AFM), which relies on contact inter-atomic forces to extract topographical images of a sample, is one such method that can be used on a wide range of surface types, with possible nanometer resolution (both vertical andlateral). However, AFM images are commonly distorted by convolution, which reduces metrological accuracy. This type of distortion is more significant when the sample surface containshigh aspect ratio features such as lines, steps or sharp edges or when probe and sample share similar characteristic dimensions. Therefore, as the size of engineered features arepushed into the micrometer and sub-micrometer range by the development of new high precision fabrication techniques, convolution distortions embedded in the images becomeincreasingly more significant. Aiming at mitigating these distortions and recovering metrology sound ness, we introduce a novel image deconvolution scheme based on the principle of stereo imaging. Multiple images of a sample, taken at different angles, allow for separation ofcon volution artifacts from true topographic data. As a result, accurate samplereconstruction and probe shape estimation can be achieved simultaneously. Additionally, shadow zones, which are areas of the sample that cannot be reached by the AFM probe, are greatly re duced. Most importantly, this technique does not require a priori probe characterizationor any sort of shape assumption. It also reduces the need for slender or sharper probes,which, on one hand, induce less convolution distortion but, on the other hand, are more prone to wear and damage, thus decreasing the overall inspection system reliability.
(cont.) This research project includes a survey of current high precision metrology tools and an in-depthanalysis of the state of the art deconvolution techniques for probe based metrology instruments. Next, the stereo imaging algorithm is introduced, simulation results presented and anerror analysis is conducted. Finally, experimental validations of the technique are carried outfor an industrial inspection application where the characteristic dimensions of the samplesare in the nanometer range. The technique was found to be robust and insensitive to probe or shape geometries. Furthermore, the same framework was deemed to be applicable to other probe based imaging techniques such as mechanical stylus profilometers and scanning tunneling microscopy.
by Bernardo Dantas Aumond.
Ph.D.
APA, Harvard, Vancouver, ISO, and other styles
6

Chiu, Cheng-Jung. "Data processing in nanoscale profilometry." Thesis, Massachusetts Institute of Technology, 1995. http://hdl.handle.net/1721.1/36677.

Full text
Abstract:
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 1995.
Includes bibliographical references (p. 176-177).
New developments on the nanoscale are taking place rapidly in many fields. Instrumentation used to measure and understand the geometry and property of the small scale structure is therefore essential. One of the most promising devices to head the measurement science into the nanoscale is the scanning probe microscope. A prototype of a nanoscale profilometer based on the scanning probe microscope has been built in the Laboratory for Manufacturing and Productivity at MIT. A sample is placed on a precision flip stage and different sides of the sample are scanned under the SPM to acquire its separate surface topography. To reconstruct the original three dimensional profile, many techniques like digital filtering, edge identification, and image matching are investigated and implemented in the computer programs to post process the data, and with greater emphasis placed on the nanoscale application. The important programming issues are addressed, too. Finally, this system's error sources are discussed and analyzed.
by Cheng-Jung Chiu.
M.S.
APA, Harvard, Vancouver, ISO, and other styles
7

Sun, Wenyang. "Profilometry with volume holographic imaging." Thesis, Massachusetts Institute of Technology, 2006. http://hdl.handle.net/1721.1/35631.

Full text
Abstract:
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2006.
Includes bibliographical references (p. 127-133).
High resolution, non-contact object profile measurement (profilometry) at long working distance is important in a number of application areas, such as precise parts manufacturing, optical element grounding and polishing, adversary target identification in military, terrace profiling, etc. The Volume Holographic (VH) lens is a novel optical element which process the incident light field in a 3D fashion. It has been shown with promising applications in object profile acquisition and 3D imaging areas. In this thesis, we propose, design and implemented a number of volume holographic computational imaging systems for profilometry related applications. We show that the rich functionalities of the VH lens can be exploited to process the incident optical field. Some of the unique imaging behavior can not be easily achieved by using conventional optics. We first develop the theoretical framework for investigating the VH lens optical behavior. We concentrate on a simple design: using the VH lens as the spatial spectrum plane filter in a 4F imaging system. We derived the point spread function (PSF), the depth resolution, the diffraction field distribution of the proposed imaging system. Experimental system characterization and profilometry measurements were carried out with our setups.
(cont.) We find the resolution of the volume holographic imaging (VHI) profilometry system degrades quadratically with the increase of working distance. We addressed this problem by two approaches: 1. We discuss the effect of objective optics design on the VHI resolution. We proposed and implemented the use of appropriately designed telephoto objective optics to achieve very good resolution at long working distance. 2. We developed a maximum likelihood estimation based post-processing method to improve the depth resolution by more than 5 times. An important issue on VHI profilometry is the "slit-shaped" limited field of view (FoV). This makes measurement over the entire big object is very time consuming because scanning is necessary. Otherwise hundreds or thousands of VH lenses must be multiplexed on a single crystal to concatenate the slit FoV of each VH lens to form a wide exit window. However the multiplexing method suffers the "M/#" penalty on photon efficiency. We solved this problem by utilizing the wavelength degeneracy of the VH lens and designed a rainbow illumination VHI to expand the FoV.
(cont.) We also extended the application of VHI to hyper-spectral imaging. The experimental implementation of the hyper-spectral imaging system shows it is capable of not only reconstructing the 3D spatial profile but also restoring the spectral information of the object, both at high resolution. Finally, we conclude with some directions for the future work in this emerging field.
by Wenyang Sun.
Ph.D.
APA, Harvard, Vancouver, ISO, and other styles
8

BELL, BERNARD WHITE JR. "DIGITAL HETERODYNE TOPOGRAPHY (MOIRE, CONTOURING, PROFILOMETRY)." Diss., The University of Arizona, 1985. http://hdl.handle.net/10150/187971.

Full text
Abstract:
Digital heterodyne methods are employed in conjunction with periodic fringe projection to produce a fast automated surface relief measurement technique. A method of sampling the image with a solid state detector array which produces a moire fringe image free of the noise terms normally present with moire techniques is presented along with an extension to Whittaker-Shannon sampling theory to cover the moire aliasing phenomena. The limitations imposed on the surface slopes by the requirement that the properly moire sampled image spectra must be confined to a moire interval are given. Moire sampling allows an optical processing step (removal of the reference surface tilt), while classical nonaliased sampling produces the same information with respect to a tilted surface. General additive noise is analyzed as regards both integrating bucket and phase stepping algorithms and yields a signal to noise ratio dependent error with twice the frequency of the fringes for some algorithms. A phase averaging technique which eliminates these oscillatory errors as well as those caused by reference phase shift errors in all the algorithms is demonstrated. Both parallel and divergent geometries are discussed. The feasibility is experimentally demonstrated with results for the parallel case based on a system composed of commercially obtainable components.
APA, Harvard, Vancouver, ISO, and other styles
9

Johnson, Max LeGrand Jr. "Characterization of geotechnical surfaces via stylus profilometry." Thesis, Georgia Institute of Technology, 2000. http://hdl.handle.net/1853/20705.

Full text
APA, Harvard, Vancouver, ISO, and other styles
10

Coggrave, Charles Russell. "Temporal phase unwrapping : development and application of real-time systems for surface profile and surface displacement measurement." Thesis, Loughborough University, 2001. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.251061.

Full text
APA, Harvard, Vancouver, ISO, and other styles
More sources

Books on the topic "Profilometry"

1

Rubenstein, Joshua Beckh. Measurement of inert graphite anode wear in magnesium electroysers using confocal surface profilometry. Kingston, Ont: Queen's University, Dept. of Mining Engineering, 2004.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
2

Claros, German J. Performance of the analog and the digital profilometer with wheels and with non-contact transducers. Austin, Tex: The Center, 1985.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
3

Potter, J. F. The TRRL transverse profilometer for measuring wheeltrack rutting. Crowthorne: Pavement Engineering Division, Highways Group, Transport and Road Research Laboratory, 1989.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
4

Potter, J. F. The TRRL transverse profilometer for measuring wheeltrack rutting. Crowthorne, Berks: Transport and Road Research Laboratory, Highways Group, Pavement Engineering Division, 1989.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
5

Nair, Sukumar K. Realistic pavement serviceability equations using the 690D Surface Dynamics Profilometer. [Austin, Tex.]: Center for Transportation Research, Bureau of Engineering Research, University of Texas at Austin, 1985.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
6

Shaughnessy, Derrick. Carrier-density-wave depth profilometric measurements in semiconductor Si wafers using laser infrared photothermal radiometry. Ottawa: National Library of Canada, 2002.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
7

Hoffman, Bradley R. Verification of rut depth collected with the INO Laser Rut Measurement System (LRMS). Athens: Ohio Research Institute for Transportation and the Environment, Russ College of Engineering and Technology, Ohio University, 2011.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
8

Lindstrom, Tomas. Characterization of Interfaces by Elastic Light Scattering and Profilometry. Uppsala Universitet, 1999.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
9

Nicolaides, Lena. Thermal wave inverse problems: Depth profilometry of hardened steels and diffraction tomography of sub-surface defects in metals. 2000.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
10

R, Severson Gary, United States. Dept. of Energy. Nevada Operations Office, and Geological Survey (U.S.), eds. Optical, noncontact, automated experimental techniqes for three-dimensional reconstruction of object surfaces using projection moire, stereo imaging, and phase-measuring profilometry. Denver, Colo: U.S. Dept. of the Interior, U.S. Geological Survey, 1996.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
More sources

Book chapters on the topic "Profilometry"

1

Vignoli, Giancarlo. "Urethral Profilometry." In Urodynamics, 143–54. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-33760-9_9.

Full text
APA, Harvard, Vancouver, ISO, and other styles
2

Krüger-Sehm, Rolf. "Stylus Profilometry." In Encyclopedia of Tribology, 3370–76. Boston, MA: Springer US, 2013. http://dx.doi.org/10.1007/978-0-387-92897-5_296.

Full text
APA, Harvard, Vancouver, ISO, and other styles
3

Taudt, Christopher. "Surface Profilometry." In Development and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry, 39–88. Wiesbaden: Springer Fachmedien Wiesbaden, 2021. http://dx.doi.org/10.1007/978-3-658-35926-3_3.

Full text
Abstract:
AbstractAs outlined in the previous chapter, existing technologies for surface profilometry show certain drawbacks in terms of resolution, dynamic measurement range, three-dimensional measurement capabilities and speed. The following chapter introduces a novel approach to surface profilometry which aims to provide solutions to the problems named. The basic setup for all experiments is centered around a two-beam interferometer of the Michelson type.
APA, Harvard, Vancouver, ISO, and other styles
4

Sansoni, G., F. Docchio, U. Minoni, and L. Biancardi. "Adaptive Profilometry for Industrial Applications." In Laser Applications for Mechanical Industry, 351–64. Dordrecht: Springer Netherlands, 1993. http://dx.doi.org/10.1007/978-94-011-1990-0_23.

Full text
APA, Harvard, Vancouver, ISO, and other styles
5

Chen, Liang-Chia. "Confocal Microscopy for Surface Profilometry." In Precision Manufacturing, 1–34. Singapore: Springer Singapore, 2019. http://dx.doi.org/10.1007/978-981-10-4912-5_3-1.

Full text
APA, Harvard, Vancouver, ISO, and other styles
6

Chen, Liang-Chia. "Confocal Microscopy for Surface Profilometry." In Precision Manufacturing, 59–92. Singapore: Springer Singapore, 2019. http://dx.doi.org/10.1007/978-981-10-4938-5_3.

Full text
APA, Harvard, Vancouver, ISO, and other styles
7

Doyle, J. L., M. A. Correa, and P. D. Bondurant. "Industrial Applications of Laser-Based Profilometry." In Review of Progress in Quantitative Nondestructive Evaluation, 2211–17. Boston, MA: Springer US, 1996. http://dx.doi.org/10.1007/978-1-4613-0383-1_290.

Full text
APA, Harvard, Vancouver, ISO, and other styles
8

Dirksen, D., Y. Kozlov, and G. von Bally. "Cuneiform Surface Reconstruction by Optical Profilometry." In Optical Technologies in the Humanities, 257–60. Berlin, Heidelberg: Springer Berlin Heidelberg, 1997. http://dx.doi.org/10.1007/978-3-642-60872-8_38.

Full text
APA, Harvard, Vancouver, ISO, and other styles
9

Schroeder, P., R. Roux, J. M. Favreau, M. Perriollat, and A. Bartoli. "Industrial Phase-Shifting Profilometry in Motion." In Image Analysis, 579–90. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-38886-6_54.

Full text
APA, Harvard, Vancouver, ISO, and other styles
10

Versi, E. "Relevance of Urethral Pressure Profilometry To Date." In Micturition, 81–109. London: Springer London, 1990. http://dx.doi.org/10.1007/978-1-4471-1780-3_6.

Full text
APA, Harvard, Vancouver, ISO, and other styles

Conference papers on the topic "Profilometry"

1

Li, Chongxiang, Anand K. Asundi, and Zhong P. Fang. "Multichannel 3D profilometry." In International Symposium on Photonics and Applications, edited by Anand K. Asundi, Wolfgang Osten, and Vijay K. Varadan. SPIE, 2001. http://dx.doi.org/10.1117/12.447340.

Full text
APA, Harvard, Vancouver, ISO, and other styles
2

Pavlíček, Pavel, Zhihui Duan, and Mitsuo Takeda. "Spatial coherence profilometry." In SPIE Proceedings, edited by Miroslav Miler, Dagmar Senderáková, and Miroslav Hrabovský. SPIE, 2007. http://dx.doi.org/10.1117/12.739667.

Full text
APA, Harvard, Vancouver, ISO, and other styles
3

Clark, Stephan, John E. Greivenkamp, Ralph M. Richard, and José M. Sasián. "Optical reference profilometry." In Optical Fabrication and Testing. Washington, D.C.: OSA, 2000. http://dx.doi.org/10.1364/oft.2000.otub2.

Full text
APA, Harvard, Vancouver, ISO, and other styles
4

Zhang, Song. "Comparing Hilbert transform profilometry and Fourier transform profilometry (Conference Presentation)." In Dimensional Optical Metrology and Inspection for Practical Applications VIII, edited by Song Zhang and Kevin G. Harding. SPIE, 2019. http://dx.doi.org/10.1117/12.2517870.

Full text
APA, Harvard, Vancouver, ISO, and other styles
5

Song, Yuanhe, Hong Zhao, Wenyi Chen, and Yushan Tan. "360-degree 3D profilometry." In Intelligent Systems & Advanced Manufacturing, edited by Kevin G. Harding and Donald J. Svetkoff. SPIE, 1997. http://dx.doi.org/10.1117/12.294458.

Full text
APA, Harvard, Vancouver, ISO, and other styles
6

Barbosa, E. A., M. R. Gesualdi, and M. Muramatsu. "Multi-wavelength holographic profilometry." In ICO20:Optical Information Processing, edited by Yunlong Sheng, Songlin Zhuang, and Yimo Zhang. SPIE, 2006. http://dx.doi.org/10.1117/12.668293.

Full text
APA, Harvard, Vancouver, ISO, and other styles
7

Wan, Xinjun, Shulian Zhang, and Zhou Ren. "Laser confocal feedback profilometry." In Optical Engineering + Applications, edited by Joanna Schmit, Katherine Creath, and Catherine E. Towers. SPIE, 2008. http://dx.doi.org/10.1117/12.792752.

Full text
APA, Harvard, Vancouver, ISO, and other styles
8

Woolford, Stuart, and Ian S. Burnett. "Multiview 3D profilometry using resonance-based decomposition and three-phase shift profilometry." In International Conference on Experimental Mechanics 2014, edited by Chenggen Quan, Kemao Qian, Anand Asundi, and Fook Siong Chau. SPIE, 2015. http://dx.doi.org/10.1117/12.2084949.

Full text
APA, Harvard, Vancouver, ISO, and other styles
9

Woolford, S., and I. S. Burnett. "A novel one shot object profilometry system using Direct Sequence Spread Spectrum profilometry." In 2013 11th IVMSP Workshop: 3D Image/Video Technologies and Applications. IEEE, 2013. http://dx.doi.org/10.1109/ivmspw.2013.6611896.

Full text
APA, Harvard, Vancouver, ISO, and other styles
10

Serrano-Trujillo, Alejandra, Jan L. Chaloupka, and Matthew E. Anderson. "Surface Profilometry using Vortex Beams." In Frontiers in Optics. Washington, D.C.: OSA, 2016. http://dx.doi.org/10.1364/fio.2016.jth2a.198.

Full text
APA, Harvard, Vancouver, ISO, and other styles

Reports on the topic "Profilometry"

1

Barrie, Alexander C., Bryan S. Taylor, Jared M. Ekholm, Jr Hargus, and William A. Calculating Sputter Rate Angular Dependence Using Optical Profilometry (Preprint). Fort Belvoir, VA: Defense Technical Information Center, July 2007. http://dx.doi.org/10.21236/ada473515.

Full text
APA, Harvard, Vancouver, ISO, and other styles
2

Cardenas-Garcia, J. F., and G. R. Severson. Optical, noncontact, automated experimental techniques for three-dimensional reconstruction of object surfaces using projection moire, stereo imaging, and phase-measuring profilometry. Office of Scientific and Technical Information (OSTI), January 1996. http://dx.doi.org/10.2172/653991.

Full text
APA, Harvard, Vancouver, ISO, and other styles
3

Hardy, R. D. SURFSCAN: Program to operate a LASER profilometer. Yucca Mountain Site Characterization Project. Office of Scientific and Technical Information (OSTI), September 1995. http://dx.doi.org/10.2172/111914.

Full text
APA, Harvard, Vancouver, ISO, and other styles
You might also be interested in the extended bibliographies on the topic 'Profilometry' for particular source types:
Journal articles Dissertations / Theses Books
We offer discounts on all premium plans for authors whose works are included in thematic literature selections. Contact us to get a unique promo code!

To the bibliography