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Journal articles on the topic 'Piezo Force Microscopy'

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Published: 6 September 2023

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1

Xiao, Bailong. "Levering Mechanically Activated Piezo Channels for Potential Pharmacological Intervention." Annual Review of Pharmacology and Toxicology 60, no. 1 (2020): 195–218. http://dx.doi.org/10.1146/annurev-pharmtox-010919-023703.

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The mechanically activated Piezo channels, including Piezo1 and Piezo2 in mammals, function as key mechanotransducers for converting mechanical force into electrochemical signals. This review highlights key evidence for the potential of Piezo channel drug discovery. First, both mouse and human genetic studies have unequivocally demonstrated the prominent role of Piezo channels in various mammalian physiologies and pathophysiologies, validating their potential as novel therapeutic targets. Second, the cryo-electron microscopy structure of the 2,547-residue mouse Piezo1 trimer has been determine
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2

Moreland, John. "Tunneling stabilized magnetic-force microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 1034–35. http://dx.doi.org/10.1017/s0424820100151003.

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Magnetic force microscopy (MFM) can be done by making a simple change in conventional scanning tunneling microscopy (STM) where the usual rigid STM tip is replaced with a flexible magnetic tip. STM images acquired this way show both the topography and the magnetic forces acting on the flexible tip. The z-motion of the STM piezo tube scanner flexes the tip to balance the magnetic force so that the end of the tip remains a fixed tunneling distance from the sample surface. We present a review of some “tunneling-stabilized” MFM (TSMFM) images showing magnetic bit tracks on a hard disk, Bloch wall
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3

Fried, G., K. Balss, and P. W. Bohn. "Imaging Electrochemical Controlled Chemical Gradients Using Pulsed Force Mode Atomic Force Microscopy." Microscopy and Microanalysis 6, S2 (2000): 726–27. http://dx.doi.org/10.1017/s1431927600036126.

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The electrochemical formation of gradients in self assembled monolayers has been demonstrated recently [1]. The capacity to image these gradients provides useful information on the physical chemistry of electrochemical striping.Imaging chemical gradients requires the ability to sense the chemical moiety on the top of the self-assembled monolayer. This has been accomplished by derivatizing an atomic force microscope (AFM) tip with molecules selected to have specific interactions with the sample in a technique known as chemical force microscopy [2]. Typical tapping mode AFM is then used to image
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4

Wei, Yaocheng, Xuejun Zheng, Liang Chu, and Hui Dong. "Piezo-Phototronic Enhancement of Vertical Structure Photodetectors Based on 2D CsPbBr3 Nanosheets." Journal of Nanoelectronics and Optoelectronics 17, no. 5 (2022): 769–74. http://dx.doi.org/10.1166/jno.2022.3250.

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Two-dimensional (2D) CsPbBr3 have received great interest in flexible photoelectric devices due to their excellent carrier mobility and tunable optical bandgap. However, it is unknown if the piezo-phototronic effects of a vertically structured 2D CsPbBr3 photodetector affect its photoelectric performance. Herein, we fabricated a vertical structure device based on 2D CsPbBr3 by using conductive atomic force microscopy and then probed its photoelectric performances under different forces. The photocurrent and on/off ratio under 450 nm laser illumination rise by up to 2.1 and 5.3 times, respectiv
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Graça, Sergio, Rogerio Colaço, and Rui Vilar. "Using Atomic Force Microscopy to Retrieve Nanomechanical Surface Properties of Materials." Materials Science Forum 514-516 (May 2006): 1598–602. http://dx.doi.org/10.4028/www.scientific.net/msf.514-516.1598.

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When atomic force microscopy is used to retrieve nanomechanical surface properties of materials, unsuspected measurement and instrumentation errors may occur. In this work, some error sources are investigated and operating and correction procedures are proposed in order to maximize the accuracy of the measurements. Experiments were performed on sapphire, Ni, Co and Ni-30%Co samples. A triangular pyramidal diamond tip was used to perform indentation and scratch tests, as well as for surface visualization. It was found that nonlinearities of the z-piezo scanner, in particular the creep of the z-
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6

Miller, Nathaniel C., Haley M. Grimm, W. Seth Horne, and Geoffrey R. Hutchison. "Accurate electromechanical characterization of soft molecular monolayers using piezo force microscopy." Nanoscale Advances 1, no. 12 (2019): 4834–43. http://dx.doi.org/10.1039/c9na00638a.

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We report a new methodology for the electromechanical characterization of organic monolayers based on the implementation of dual AC resonance tracking piezo force microscopy (DART-PFM) combined with a sweep of an applied DC field under a fixed AC field.
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7

Calahorra, Yonatan, Michael Smith, Anuja Datta, Hadas Benisty, and Sohini Kar-Narayan. "Mapping piezoelectric response in nanomaterials using a dedicated non-destructive scanning probe technique." Nanoscale 9, no. 48 (2017): 19290–97. http://dx.doi.org/10.1039/c7nr06714c.

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8

Sasaki, Michiko, and Masahiro Goto. "Piezoelectric effect of crystal nanodomains on the friction force." Journal of Vacuum Science & Technology B 40, no. 5 (2022): 052803. http://dx.doi.org/10.1116/6.0001881.

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Reduction and control of the friction force are important from the viewpoint of energy conservation, and novel approaches for achieving this are desirable. The friction force of the boron-doped zinc oxide (B-ZnO) coating on a stainless-steel type-440C substrate was moderated by controlling the B-ZnO crystal nanodomains' piezoelectric effect. The nanoscale and macroscale friction forces, as well as the B-ZnO coating's piezoelectric effect, were measured using lateral force microscopy, friction and wear meter, and piezo response microscopy devices, respectively. The distribution of the friction
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9

Zhang, Guitao, Xi Chen, Weihe Xu, Wei-Dong Yao, and Yong Shi. "Piezoelectric property of PZT nanofibers characterized by resonant piezo-force microscopy." AIP Advances 12, no. 3 (2022): 035203. http://dx.doi.org/10.1063/5.0081109.

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Nano-piezoelectric materials have drawn tremendous research interest. However, characterization of their piezoelectric properties, especially measuring the piezoelectric strain coefficients, remains a challenge. Normally, researchers use an AFM-based method to directly measure nano-materials’ piezoelectric strain coefficients. But, the extremely small piezoelectric deformation, the influence from the parasitic electrostatic force, and the environmental noise make the measurement results questionable. In this paper, a resonant piezo-force microscopy method was used to accurately measure the pie
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10

Mangamma, G., B. Ramachandran, T. N. Sairam, M. S. R. Rao, S. Dash, and A. K. Tyagi. "Imaging of Nanometric Ferroelectric Domains in BaTiO3 Using Atomic Force Acoustic Microscopy and Piezo Force Microscopy." Journal of Advanced Microscopy Research 6, no. 1 (2011): 29–34. http://dx.doi.org/10.1166/jamr.2011.1056.

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11

Franck, Christian, Guruswami Ravichandran, and Kaushik Bhattacharya. "Characterization of domain walls in BaTiO3 using simultaneous atomic force and piezo response force microscopy." Applied Physics Letters 88, no. 10 (2006): 102907. http://dx.doi.org/10.1063/1.2185640.

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12

Calahorra, Yonatan, Xin Guan, Nripendra N. Halder, et al. "Exploring piezoelectric properties of III–V nanowires using piezo-response force microscopy." Semiconductor Science and Technology 32, no. 7 (2017): 074006. http://dx.doi.org/10.1088/1361-6641/aa6c85.

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13

Huey, B. D., R. Nath, R. E. Garcia, and J. E. Blendell. "Challenges and Results for Quantitative Piezoelectric Hysteresis Measurements by Piezo Force Microscopy." Microscopy and Microanalysis 11, S03 (2005): 6–9. http://dx.doi.org/10.1017/s1431927605050762.

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Atomic Force Microscopy (AFM) has become a ubiquitous tool for analyzing the topography of a wide variety of materials, especially as nanoscale features become more significant for both understanding as well as determining materials properties [1]. Many AFM variations have also been developed for measuring surface properties beyond straightforward cartography. In many of these cases, the contrast mechanisms are often either extremely complex, or not well understood, even though the principles are simple. For example, Piezo-Force Microscopy (PFM) is relatively easy to understand and use in a st
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14

Huey, Bryan D., Chandra Ramanujan, Musuvathi Bobji, et al. "The Importance of Distributed Loading and Cantilever Angle in Piezo-Force Microscopy." Journal of Electroceramics 13, no. 1-3 (2004): 287–91. http://dx.doi.org/10.1007/s10832-004-5114-y.

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15

Kiracofe, Daniel, and Arvind Raman. "Quantitative force and dissipation measurements in liquids using piezo-excited atomic force microscopy: a unifying theory." Nanotechnology 22, no. 48 (2011): 485502. http://dx.doi.org/10.1088/0957-4484/22/48/485502.

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16

Xu, Xin, Marisol Koslowski, and Arvind Raman. "Dynamics of surface-coupled microcantilevers in force modulation atomic force microscopy – magnetic vs. dither piezo excitation." Journal of Applied Physics 111, no. 5 (2012): 054303. http://dx.doi.org/10.1063/1.3689815.

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17

Roy, S. K., and W. K. Hiebert. "Effect of Bulk Acoustic Wave in Piezo Driven Nanomechanical Motion." Journal of Scientific Research 14, no. 1 (2022): 269–80. http://dx.doi.org/10.3329/jsr.v14i1.56046.

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Piezo actuation of mechanical resonators is widely adapted because of its simplicity and versatility. Piezo-driven atomic force microscopy cantilevers in air or liquid have a substantial drawback in that they produce spurious resonances that conceal the cantilever resonance peak. Bulk acoustic wave propagation via the piezo-shaker and device substrate causes these undesired peaks. Such restrictions of piezo actuation are rarely reported in nanomechanical resonant sensing. Because most NEMS (nanoelectromechanical systems) experiments are carried out at low pressure to achieve a higher quality f
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18

Satoh, Nobuo, Eika Tsunemi, Kei Kobayashi, Kazumi Matsushige, and Hirofumi Yamada. "Multi-Probe Atomic Force Microscopy Using Piezo-Resistive Cantilevers and Interaction between Probes." e-Journal of Surface Science and Nanotechnology 11 (2013): 13–17. http://dx.doi.org/10.1380/ejssnt.2013.13.

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19

Tsuji, Toshihiro, Hisato Ogiso, Jun Akedo, Shigeru Saito, Kenji Fukuda, and Kazushi Yamanaka. "Evaluation of Domain Boundary of Piezo/Ferroelectric Material by Ultrasonic Atomic Force Microscopy." Japanese Journal of Applied Physics 43, no. 5B (2004): 2907–13. http://dx.doi.org/10.1143/jjap.43.2907.

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20

McGilly, L., D. Byrne, C. Harnagea, A. Schilling, and J. M. Gregg. "Imaging domains in BaTiO3 single crystal nanostructures: comparing information from transmission electron microscopy and piezo-force microscopy." Journal of Materials Science 44, no. 19 (2009): 5197–204. http://dx.doi.org/10.1007/s10853-009-3626-1.

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21

Yin, Bo Hua, Dai Xie Chen, Yun Sheng Lin, Ying Ying Gao, Han Li, and Dong Han. "Large Scanning Range and Rapid AFM for Biological Cell Topography Imaging." Key Engineering Materials 562-565 (July 2013): 697–700. http://dx.doi.org/10.4028/www.scientific.net/kem.562-565.697.

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The small spatial displacement of the piezo tube scanner limits the AFM(Atomic Force Microscopy) scanning range, especially when facing up to cell topography scanning. And the low dynamic property of normal AFM tube scanner tube restricts the imaging speed. In order to achieve large scanning range and rapid scanning motion simultaneously, a special atomic force microscopy is designed. The 100um scanning range is obtained by the new scanner which is composed of the flexure guide structure instead of peizo tube. Furthermore, a new acquiring image method is used to eliminating AFM nonlinearity er
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22

Kizuka, Tokushi. "Atomistic Visualization of Mechanical Interaction in Gold Crystalline Boundaries by Time-Resolved High Resolution Transmission Electron Microscopy." Surface Review and Letters 05, no. 03n04 (1998): 739–45. http://dx.doi.org/10.1142/s0218625x98001110.

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The atomic processes in mechanical interaction were visualized by time-resolved high resolution transmission electron microscopy at a spatial resolution of 0.2 nm and a time resolution of 1/60 s. Nanometer-sized tips of gold were approached, contacted, bonded, deformed and fractured inside a 200 kV electron microscope using a piezo-driving specimen holder. The crystallographic boundary formed after the contact. A few layers near the surfaces and bonding boundaries were responsible for the approach, contact and bonding processes. Atomic scale mechanical tests, such as the friction test, compres
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23

Rafiq, Muhammad Asif, Maria Elisabete Costa, Paula Maria Vilarinho, and Ian M. Reaney. "Ferroelectric Domain Studies of KNN Single Crystals by Piezo-force and Transmission Electron Microscopy." Microscopy and Microanalysis 18, S5 (2012): 113–14. http://dx.doi.org/10.1017/s1431927612013220.

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Piezoelectric materials find important applications in micro- and nano-electromechanical systems (MEMS/NEMS). Pb(Zrx,Ti1-x)O3 (PZT) is currently the most widely used composition for such applications but due to environmental concerns over the toxicity of lead, lead free alternative materials are required. K0.5Na0.5NbO3 (KNN) is considered as a potential lead free piezoelectric but the current generation of monolithic ceramics has inferior electromechanical properties as compared to PZT. Consequently, there is great interest in improving the piezoelectric properties of KNN ceramics and various
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24

Ravi Sankar, M. S., K. Pramod, and Ramesh Babu Gangineni. "Local ferroelectric studies on interconnected PVDF nano-dot thin films using piezo force microscopy." Journal of Materials Science: Materials in Electronics 30, no. 23 (2019): 20716–24. http://dx.doi.org/10.1007/s10854-019-02464-w.

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25

Liu, Xiaochen, Lihao Wang, Yinfang Zhu, et al. "A novel scanning force microscopy probe with thermal-electrical actuation and piezo-resistive sensing." Journal of Micromechanics and Microengineering 28, no. 11 (2018): 115003. http://dx.doi.org/10.1088/1361-6439/aad927.

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26

Nebalueva, Anna S., Alexandra A. Timralieva, Roman V. Sadovnichii, et al. "Piezo-Responsive Hydrogen-Bonded Frameworks Based on Vanillin-Barbiturate Conjugates." Molecules 27, no. 17 (2022): 5659. http://dx.doi.org/10.3390/molecules27175659.

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A concept of piezo-responsive hydrogen-bonded π-π-stacked organic frameworks made from Knoevenagel-condensed vanillin–barbiturate conjugates was proposed. Replacement of the substituent at the ether oxygen atom of the vanillin moiety from methyl (compound 3a) to ethyl (compound 3b) changed the appearance of the products from rigid rods to porous structures according to optical microscopy and scanning electron microscopy (SEM), and led to a decrease in the degree of crystallinity of corresponding powders according to X-ray diffractometry (XRD). Quantum chemical calculations of possible dimer mo
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27

Ivanov M. S., Buryakov A. M., and Silibin M. V. "Investigation of Local Piezo- and Ferroelectric Properties in a Single-Ion Zn/Dy Molecular Complex." Technical Physics Letters 48, no. 10 (2022): 58. http://dx.doi.org/10.21883/tpl.2022.10.54801.19247.

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In this work, the piezoelectric and ferroelectric properties in the Zn/Dy single-ion molecular complex have been studied by local piezoresponse force microscopy and switching spectroscopy. It is demonstrated that the chosen strategy for the synthesis of integrated magnetoelectric molecular systems makes it possible to grow molecular single crystals in the polar group. Switching of the intrinsic domain structure in Zn/Dy single crystal at a bias voltage of +15 V and the possibility of changing the induced domain structure at a bias voltage of -20 V were demonstrated. The effective piezoelectric
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28

Schwenzfeier, Kai A., and Markus Valtiner. "Design and testing of drift free force probe experiments with absolute distance control." Review of Scientific Instruments 93, no. 7 (2022): 073705. http://dx.doi.org/10.1063/5.0083834.

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After almost 35 years of truly successful and transformative advancements, Atomic Force Microscopy (AFM) and, in general, scanning probe microscopy still have a fundamental limitation. This is constant drift and uncontrolled motion of probe and tested surface structures with respect to each other. This is inherently linked to the currently accepted design principle—only forces are measured, and distances are inferred from force measurements and piezo motions. Here, we demonstrate and test a new setup, which combines advantages of AFM and the surface forces apparatus, where absolute distances a
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29

Pariy, Igor O., Anna A. Ivanova, Vladimir V. Shvartsman, et al. "Piezoelectric Response in Hybrid Micropillar Arrays of Poly(Vinylidene Fluoride) and Reduced Graphene Oxide." Polymers 11, no. 6 (2019): 1065. http://dx.doi.org/10.3390/polym11061065.

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This study was dedicated to the investigation of poly(vinylidene fluoride) (PVDF) micropillar arrays obtained by soft lithography followed by phase inversion at a low temperature. Reduced graphene oxide (rGO) was incorporated into the PVDF as a nucleating filler. The piezoelectric properties of the PVDF-rGO composite micropillars were explored via piezo-response force microscopy (PFM). Fourier transform infrared spectroscopy (FTIR) and X-ray diffraction (XRD) showed that α, β, and γ phases co-existed in all studied samples, with a predominance of the γ phase. The piezoresponse force microscopy
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30

Russ, J. C., and P. J. Scott. "Quantitative Scanned Probe Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 874–75. http://dx.doi.org/10.1017/s042482010016683x.

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The great advantage of the atomic force microscope and related technologies (tunneling current, near field optical, tips that oscillate vertically or laterally, etc.) has been simplicity of design. Vertical deflection of a reference tip on a cantilevered probe is detected by light scattering and used to shift the sample in the z direction to restore tip position. The output is generally in the form of surface images rather than measurements with high dimensional accuracy. Atomic scale resolution is achievable but lower magnification imaging is more difficult.Piezo devices used for x-y and z ax
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31

Kofahl, Claudia, Friedrich Güthoff, and Götz Eckold. "Topological defects driving the growth of nanoscaled ferroelectric domains observed by piezo response force microscopy." Ferroelectrics 584, no. 1 (2021): 1–11. http://dx.doi.org/10.1080/00150193.2021.1984767.

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32

Rajeev, Sreenidhi Prabha, S. Sabarinath, CK Subash, Uvais Valiyaneerilakkal, Pattiyil Parameswaran та Soney Varghese. "α- & β-crystalline phases in polyvinylidene fluoride as tribo-piezo active layer for nanoenergy harvester". High Performance Polymers 31, № 7 (2018): 785–99. http://dx.doi.org/10.1177/0954008318796141.

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The manuscript introduces the use of non-electrically polled spin-coated thin polyvinylidene fluoride (PVDF) films as the active layers in a contact electrification-based nanoenergy harvester. The four-layered device utilizes both piezo and triboelectric effect coupled with electrostatic induction. The elucidation of potential generation during contact between crystalline phases ( α and β) of PVDF layer material is investigated in the manuscript. Fourier transform infrared–attenuated total reflectance spectroscopy is carried out to illustrate the α- and β-phases in PVDF pellet, prepared film a
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33

Shakya, Jyoti, Gayathri H N, and Arindam Ghosh. "Defects-assisted piezoelectric response in liquid exfoliated MoS2 nanosheets." Nanotechnology 33, no. 7 (2021): 075710. http://dx.doi.org/10.1088/1361-6528/ac368b.

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Abstract MoS2 is an intrinsic piezoelectric material which offers applications such as energy harvesting, sensors, actuators, flexible electronics, energy storage and more. Surprisingly, there are not any suitable, yet economical methods that can produce quality nanosheets of MoS2 in large quantities, hence limiting the possibility of commercialisation of its applications. Here, we demonstrate controlled synthesis of highly crystalline MoS2 nanosheets via liquid phase exfoliation of bulk MoS2, following which we report piezoelectric response from the exfoliated nanosheets. The method of piezo
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Serrado-Nunes, Jivago, Vitor Sencadas, Ai Ying Wu, Paula M. Vilarinho та Senentxu Lanceros-Méndez. "Electrical and Microstructural Changes of β-PVDF under Uniaxial Stress Studied by Scanning Force Microscopy". Materials Science Forum 514-516 (травень 2006): 915–19. http://dx.doi.org/10.4028/www.scientific.net/msf.514-516.915.

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Chain reorientation may be induced in polyvinylidene fluoride (PVDF) in its β-phase by applying a deformation perpendicular to the pre-oriented polymeric chains. This reorientation begins right after the yielding point and seems to be completed when the stress-strain curve stabilizes. As the deformation process plays an important role in the processing and optimisation properties of the material for practical applications, different deformation stress was applied to the PVDF lamellas and their topographic change and piezoelectric response were studied by means of scanning force microscopy in a
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Leitner, Michael, Hannah Seferovic, Sarah Stainer, et al. "Atomic Force Microscopy Imaging in Turbid Liquids: A Promising Tool in Nanomedicine." Sensors 20, no. 13 (2020): 3715. http://dx.doi.org/10.3390/s20133715.

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Tracking of biological and physiological processes on the nanoscale is a central part of the growing field of nanomedicine. Although atomic force microscopy (AFM) is one of the most appropriate techniques in this area, investigations in non-transparent fluids such as human blood are not possible with conventional AFMs due to limitations caused by the optical readout. Here, we show a promising approach based on self-sensing cantilevers (SSC) as a replacement for optical readout in biological AFM imaging. Piezo-resistors, in the form of a Wheatstone bridge, are embedded into the cantilever, wher
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Lab, Max J., Anamika Bhargava, Peter T. Wright, and Julia Gorelik. "The scanning ion conductance microscope for cellular physiology." American Journal of Physiology-Heart and Circulatory Physiology 304, no. 1 (2013): H1—H11. http://dx.doi.org/10.1152/ajpheart.00499.2012.

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The quest for nonoptical imaging methods that can surmount light diffraction limits resulted in the development of scanning probe microscopes. However, most of the existing methods are not quite suitable for studying biological samples. The scanning ion conductance microscope (SICM) bridges the gap between the resolution capabilities of atomic force microscope and scanning electron microscope and functional capabilities of conventional light microscope. A nanopipette mounted on a three-axis piezo-actuator, scans a sample of interest and ion current is measured between the pipette tip and the s
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Baykara, Mehmet Z., Omur E. Dagdeviren, Todd C. Schwendemann, Harry Mönig, Eric I. Altman, and Udo D. Schwarz. "Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction." Beilstein Journal of Nanotechnology 3 (September 11, 2012): 637–50. http://dx.doi.org/10.3762/bjnano.3.73.

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Noncontact atomic force microscopy (NC-AFM) is being increasingly used to measure the interaction force between an atomically sharp probe tip and surfaces of interest, as a function of the three spatial dimensions, with picometer and piconewton accuracy. Since the results of such measurements may be affected by piezo nonlinearities, thermal and electronic drift, tip asymmetries, and elastic deformation of the tip apex, these effects need to be considered during image interpretation. In this paper, we analyze their impact on the acquired data, compare different methods to record atomic-resoluti
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38

Hang, Qi Ming, Xin Hua Zhu, Zhen Jie Tang, Ye Song, and Zhi Guo Liu. "Self-Assembled Perovskite Epitaxial Multiferroic BiFeO3 Nanoislands." Advanced Materials Research 197-198 (February 2011): 1325–31. http://dx.doi.org/10.4028/www.scientific.net/amr.197-198.1325.

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Perovskite epitaxial multiferroic BiFeO3 nanoislands were grown on SrTiO3 (100) and Nb-doped SrTiO3 (100) single crystal substrates by chemical self-assembled method. Their phase structure and morphology were characterized by X-ray diffraction, scanning electron microscopy, and atomic force microscopy, respectively. The results showed that epitaxial multiferroic BiFeO3 nanoislands were obtained via post-annealing process in the temperature range of 650 - 800°C, and their lateral sizes were in the range of 50 - 160 nm and height of 6 -12 nm. With increasing the post-annealing temperature, the m
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39

Kofahl, Claudia, Friedrich Güthoff, and Götz Eckold. "Direct observation of polar nanodomains in the incommensurate phase of (K0.96Rb0.04)2ZnCl4 crystals using piezo force microscopy." Ferroelectrics 540, no. 1 (2019): 10–17. http://dx.doi.org/10.1080/00150193.2019.1611115.

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40

Herrera-Perez, G., O. Solis-Canto, J. Holguin-Momaca, et al. "Microstructure Patterns by Switching Spectroscopy Piezo-response Force Microscopy of Lead Free Perovskite-type Polycrystalline Thin Films." Microscopy and Microanalysis 23, S1 (2017): 1648–49. http://dx.doi.org/10.1017/s143192761700890x.

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41

Urdinola, Kaory Barrientos, Paula Andrea Marín Muñoz, Pedronel Araque Marín, and Marisol Jaramillo Grajales. "In-Silico Prediction on the MSAMS-Assisted Immobilization of Bovine Serum Albumin on 10MHz Piezoelectric Immunosensors." Journal of Molecular and Engineering Materials 07, no. 01n02 (2019): 1950001. http://dx.doi.org/10.1142/s2251237319500011.

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The biological sensing interface on the active area of a piezo transducer is responsible for the sensitivity, specificity, reusability, and reproducibility of these devices. Among the approaches used to functionalize piezo transducers, mixed self-assembled monolayers (MSAMs) are one of the most successful, given that they allow the obtaining of semi-crystalline molecular arrays and the arrangement of a bioreceptor on the surface. But, to deploy MSAMs on a substrate effectively, one must optimize and characterize the structural ratio between them and the bioreceptor. In this paper, we developed
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42

Abas, Asim, Tao Geng, Wenjie Meng, et al. "Compact Magnetic Force Microscope (MFM) System in a 12 T Cryogen-Free Superconducting Magnet." Micromachines 13, no. 11 (2022): 1922. http://dx.doi.org/10.3390/mi13111922.

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Magnetic Force Microscopy (MFM) is among the best techniques for examining and assessing local magnetic characteristics in surface structures at scales and sizes. It may be viewed as a unique way to operate atomic force microscopy with a ferromagnetic tip. The enhancement of magnetic signal resolution, the utilization of external fields during measurement, and quantitative data analysis are now the main areas of MFM development. We describe a new structure of MFM design based on a cryogen-free superconducting magnet. The piezoelectric tube (PZT) was implemented with a tip-sample coarse approac
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Tiron, Vasile, Roxana Jijie, Teodora Matei, Ioana-Laura Velicu, Silviu Gurlui, and Georgiana Bulai. "Piezo-Enhanced Photocatalytic Performance of Bismuth Ferrite-Based Thin Film for Organic Pollutants Degradation." Coatings 13, no. 8 (2023): 1416. http://dx.doi.org/10.3390/coatings13081416.

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This work addresses the global sustainable development concerns by investigating the enhancement of piezo-photocatalytic efficiency in bismuth ferrite-based thin films synthesized using reactive high-power impulse magnetron sputtering. The influence of substrate type and Cr addition on structural, optical and ferroelectric properties of bismuth ferrite (BFO) based thin films was investigated. X-ray diffraction measurements showed the formation of different phases depending on the substrate used for sample growth. Compared to the BFO film deposited on FTO (F-SnO2), the Cr-doped BFO (BFCO) sampl
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Pellegrino, Paolo, Alessandro Paolo Bramanti, Isabella Farella, et al. "Pulse-Atomic Force Lithography: A Powerful Nanofabrication Technique to Fabricate Constant and Varying-Depth Nanostructures." Nanomaterials 12, no. 6 (2022): 991. http://dx.doi.org/10.3390/nano12060991.

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The widespread use of nanotechnology in different application fields, resulting in the integration of nanostructures in a plethora of devices, has addressed the research toward novel and easy-to-setup nanofabrication techniques to realize nanostructures with high spatial resolution and reproducibility. Owing to countless applications in molecular electronics, data storage, nanoelectromechanical, and systems for the Internet of Things, in recent decades, the scientific community has focused on developing methods suitable for nanopattern polymers. To this purpose, Atomic Force Microscopy-based n
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Xia, Fangzhou, Chen Yang, Yi Wang, et al. "Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever Probes." Nanomaterials 9, no. 7 (2019): 1013. http://dx.doi.org/10.3390/nano9071013.

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Atomic force microscopy is a powerful topography imaging method used widely in nanoscale metrology and manipulation. A conventional Atomic Force Microscope (AFM) utilizes an optical lever system typically composed of a laser source, lenses and a four quadrant photodetector to amplify and measure the deflection of the cantilever probe. This optical method for deflection sensing limits the capability of AFM to obtaining images in transparent environments only. In addition, tapping mode imaging in liquid environments with transparent sample chamber can be difficult for laser-probe alignment due t
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Weng, Yuanqi, Fei Yan, Runkang Chen, et al. "PIEZO channel protein naturally expressed in human breast cancer cell MDA-MB-231 as probed by atomic force microscopy." AIP Advances 8, no. 5 (2018): 055101. http://dx.doi.org/10.1063/1.5025036.

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Dorozhkin, P., E. Kuznetsov, A. Schokin, S. Timofeev, and V. Bykov. "AFM + Raman Microscopy + SNOM + Tip-Enhanced Raman: Instrumentation and Applications." Microscopy Today 18, no. 6 (2010): 28–32. http://dx.doi.org/10.1017/s1551929510000982.

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Atomic Force Microscopy (AFM) has developed into a very powerful tool for characterization of surfaces and nanoscale objects. Many physical properties of an object can be studied by AFM with nanometer-scale resolution. Local stiffness, elasticity, conductivity, capacitance, magnetization, surface potential and work function, friction, piezo response—these and many other physical properties can be studied with over 30 AFM modes. What is typically lacking in information provided by AFM studies is the chemical composition of the sample and information about its crystal structure. To obtain this i
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Kim, Uk Su, Seung-Yub Baek, Tae-Wan Kim, and Jeong Woo Park. "Cold Tribo-Nanolithography on Metallic Thin-Film Surfaces." Journal of Nanoscience and Nanotechnology 20, no. 7 (2020): 4318–21. http://dx.doi.org/10.1166/jnn.2020.17558.

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This paper demonstrates a modified tribo-nanolithgraphy (TNL), micro- to nanometer scale mechanical machining processes, on metallic thin film surfaces which have poor machinability in micro scale under several mN normal loads. TNL is one of the promising atomic force microscopy (AFM)-based lithography processes which is more effective fabrication technology, as compared to conventional photolithography due to its relatively simple processes, high resolution, short processing time, and low cost. We propose ultra-precision machining at sub-0 °C temperatures using a lab-made micro polycrystallin
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Luiten, Willemijn M., Verena M. van der Werf, Noureen Raza, and Rebecca Saive. "Investigation of the dynamic properties of on-chip coupled piezo/photodiodes by time-resolved atomic force and Kelvin probe microscopy." AIP Advances 10, no. 10 (2020): 105121. http://dx.doi.org/10.1063/5.0028481.

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Stiubianu, George-Theodor, Adrian Bele, Alexandra Bargan, et al. "All-Polymer Piezo-Composites for Scalable Energy Harvesting and Sensing Devices." Molecules 27, no. 23 (2022): 8524. http://dx.doi.org/10.3390/molecules27238524.

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Silicone elastomer composites with piezoelectric properties, conferred by incorporated polyimide copolymers, with pressure sensors similar to human skin and kinetic energy harvester capabilities, were developed as thin film (<100 micron thick) layered architecture. They are based on polymer materials which can be produced in industrial amounts and are scalable for large areas (m2). The piezoelectric properties of the tested materials were determined using a dynamic mode of piezoelectric force microscopy. These composite materials bring together polydimethylsiloxane polymers with customized
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