Books on the topic 'Pattern recognition'
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Akata, Zeynep, Andreas Geiger, and Torsten Sattler, eds. Pattern Recognition. Cham: Springer International Publishing, 2021. http://dx.doi.org/10.1007/978-3-030-71278-5.
Full textRoman-Rangel, Edgar, Ángel Fernando Kuri-Morales, José Francisco Martínez-Trinidad, Jesús Ariel Carrasco-Ochoa, and José Arturo Olvera-López, eds. Pattern Recognition. Cham: Springer International Publishing, 2021. http://dx.doi.org/10.1007/978-3-030-77004-4.
Full textBauckhage, Christian, Juergen Gall, and Alexander Schwing, eds. Pattern Recognition. Cham: Springer International Publishing, 2021. http://dx.doi.org/10.1007/978-3-030-92659-5.
Full textWallraven, Christian, Qingshan Liu, and Hajime Nagahara, eds. Pattern Recognition. Cham: Springer International Publishing, 2022. http://dx.doi.org/10.1007/978-3-031-02444-3.
Full textWallraven, Christian, Qingshan Liu, and Hajime Nagahara, eds. Pattern Recognition. Cham: Springer International Publishing, 2022. http://dx.doi.org/10.1007/978-3-031-02375-0.
Full textVergara-Villegas, Osslan Osiris, Vianey Guadalupe Cruz-Sánchez, Juan Humberto Sossa-Azuela, Jesús Ariel Carrasco-Ochoa, José Francisco Martínez-Trinidad, and José Arturo Olvera-López, eds. Pattern Recognition. Cham: Springer International Publishing, 2022. http://dx.doi.org/10.1007/978-3-031-07750-0.
Full textAndres, Björn, Florian Bernard, Daniel Cremers, Simone Frintrop, Bastian Goldlücke, and Ivo Ihrke, eds. Pattern Recognition. Cham: Springer International Publishing, 2022. http://dx.doi.org/10.1007/978-3-031-16788-1.
Full textTheodoridis, S. Pattern recognition. 2nd ed. Amsterdam: Academic Press, 2003.
Find full textCarrasco-Ochoa, Jesús Ariel, José Francisco Martínez-Trinidad, Joaquín Salas Rodríguez, and Gabriella Sanniti di Baja, eds. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-38989-4.
Full textHamprecht, Fred A., Christoph Schnörr, and Bernd Jähne, eds. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2007. http://dx.doi.org/10.1007/978-3-540-74936-3.
Full textLi, Shutao, Chenglin Liu, and Yaonan Wang, eds. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-662-45643-9.
Full textLi, Shutao, Chenglin Liu, and Yaonan Wang, eds. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-662-45646-0.
Full textCarrasco-Ochoa, Jesús Ariel, José Francisco Martínez-Trinidad, and José Arturo Olvera-López, eds. Pattern Recognition. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-59226-8.
Full textPalaiahnakote, Shivakumara, Gabriella Sanniti di Baja, Liang Wang, and Wei Qi Yan, eds. Pattern Recognition. Cham: Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-030-41299-9.
Full textPalaiahnakote, Shivakumara, Gabriella Sanniti di Baja, Liang Wang, and Wei Qi Yan, eds. Pattern Recognition. Cham: Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-030-41404-7.
Full textLiu, Cheng-Lin, Changshui Zhang, and Liang Wang, eds. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-33506-8.
Full textKittler, J., ed. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 1988. http://dx.doi.org/10.1007/3-540-19036-8.
Full textFigueroa Mora, Karina Mariela, Juan Anzurez Marín, Jaime Cerda, Jesús Ariel Carrasco-Ochoa, José Francisco Martínez-Trinidad, and José Arturo Olvera-López, eds. Pattern Recognition. Cham: Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-030-49076-8.
Full textGoesele, Michael, Stefan Roth, Arjan Kuijper, Bernt Schiele, and Konrad Schindler, eds. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2010. http://dx.doi.org/10.1007/978-3-642-15986-2.
Full textCarrasco-Ochoa, Jesús Ariel, José Francisco Martínez-Trinidad, Juan Humberto Sossa-Azuela, José Arturo Olvera López, and Fazel Famili, eds. Pattern Recognition. Cham: Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-19264-2.
Full textTan, Tieniu, Xuelong Li, Xilin Chen, Jie Zhou, Jian Yang, and Hong Cheng, eds. Pattern Recognition. Singapore: Springer Singapore, 2016. http://dx.doi.org/10.1007/978-981-10-3002-4.
Full textTan, Tieniu, Xuelong Li, Xilin Chen, Jie Zhou, Jian Yang, and Hong Cheng, eds. Pattern Recognition. Singapore: Springer Singapore, 2016. http://dx.doi.org/10.1007/978-981-10-3005-5.
Full textMurty, M. Narasimha, and V. Susheela Devi. Pattern Recognition. London: Springer London, 2011. http://dx.doi.org/10.1007/978-0-85729-495-1.
Full textFink, Gernot A., Simone Frintrop, and Xiaoyi Jiang, eds. Pattern Recognition. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-33676-9.
Full textWeickert, Joachim, Matthias Hein, and Bernt Schiele, eds. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-40602-7.
Full textCree, Michael, Fay Huang, Junsong Yuan, and Wei Qi Yan, eds. Pattern Recognition. Singapore: Springer Singapore, 2020. http://dx.doi.org/10.1007/978-981-15-3651-9.
Full textRigoll, Gerhard, ed. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2008. http://dx.doi.org/10.1007/978-3-540-69321-5.
Full textKropatsch, Walter G., Robert Sablatnig, and Allan Hanbury, eds. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2005. http://dx.doi.org/10.1007/11550518.
Full textDenzler, Joachim, Gunther Notni, and Herbert Süße, eds. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-642-03798-6.
Full textVan Gool, Luc, ed. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2002. http://dx.doi.org/10.1007/3-540-45783-6.
Full textRadig, Bernd, and Stefan Florczyk, eds. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2001. http://dx.doi.org/10.1007/3-540-45404-7.
Full textMester, Rudolf, and Michael Felsberg, eds. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2011. http://dx.doi.org/10.1007/978-3-642-23123-0.
Full textRoth, Volker, and Thomas Vetter, eds. Pattern Recognition. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-66709-6.
Full textMartínez-Trinidad, José Francisco, Jesús Ariel Carrasco-Ochoa, José Arturo Olvera-Lopez, Joaquín Salas-Rodríguez, and Ching Y. Suen, eds. Pattern Recognition. Cham: Springer International Publishing, 2014. http://dx.doi.org/10.1007/978-3-319-07491-7.
Full textGall, Juergen, Peter Gehler, and Bastian Leibe, eds. Pattern Recognition. Cham: Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-24947-6.
Full textMartínez-Trinidad, José Francisco, Jesús Ariel Carrasco-Ochoa, Cherif Ben-Youssef Brants, and Edwin Robert Hancock, eds. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2011. http://dx.doi.org/10.1007/978-3-642-21587-2.
Full textJiang, Xiaoyi, Joachim Hornegger, and Reinhard Koch, eds. Pattern Recognition. Cham: Springer International Publishing, 2014. http://dx.doi.org/10.1007/978-3-319-11752-2.
Full textMarques de Sá, Joaquim P. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2001. http://dx.doi.org/10.1007/978-3-642-56651-6.
Full textMartínez-Trinidad, José Francisco, Jesús Ariel Carrasco-Ochoa, José Arturo Olvera-López, and Sudeep Sarkar, eds. Pattern Recognition. Cham: Springer International Publishing, 2018. http://dx.doi.org/10.1007/978-3-319-92198-3.
Full textPinz, Axel, Thomas Pock, Horst Bischof, and Franz Leberl, eds. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-32717-9.
Full textFranke, Katrin, Klaus-Robert Müller, Bertram Nickolay, and Ralf Schäfer, eds. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2006. http://dx.doi.org/10.1007/11861898.
Full textMartínez-Trinidad, José Francisco, Jesús Ariel Carrasco-Ochoa, Victor Ayala Ramirez, José Arturo Olvera-López, and Xiaoyi Jiang, eds. Pattern Recognition. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-39393-3.
Full textMichaelis, Bernd, and Gerald Krell, eds. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2003. http://dx.doi.org/10.1007/b12010.
Full textRasmussen, Carl Edward, Heinrich H. Bülthoff, Bernhard Schölkopf, and Martin A. Giese, eds. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/b99676.
Full textHomenda, Władysław, and Witold Pedrycz. Pattern Recognition. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2018. http://dx.doi.org/10.1002/9781119302872.
Full textBrox, Thomas, Andrés Bruhn, and Mario Fritz, eds. Pattern Recognition. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-12939-2.
Full textCarrasco-Ochoa, Jesús Ariel, José Francisco Martínez-Trinidad, José Arturo Olvera López, and Kim L. Boyer, eds. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-31149-9.
Full textRosenhahn, Bodo, and Bjoern Andres, eds. Pattern Recognition. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-45886-1.
Full textCarrasco-Ochoa, Jesús Ariel, José Francisco Martínez-Trinidad, José Arturo Olvera-López, and Joaquín Salas, eds. Pattern Recognition. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-21077-9.
Full textGibson, William. Pattern recognition. London: Viking, 2003.
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