Academic literature on the topic 'Optoelectronic measuring system'
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Journal articles on the topic "Optoelectronic measuring system"
Liu, Ji, Donge Zhao, Yangjun Li, and Hanchang Zhou. "Optoelectronic System for Measuring Warhead Fragments Velocity." Journal of Physics: Conference Series 276 (February 1, 2011): 012136. http://dx.doi.org/10.1088/1742-6596/276/1/012136.
Full textMarkina, O. M., and M. O. Tykhan. "Research of illuminating parameters halogen-filled and LED lamp for optoelectronic measuring system." Archives of Materials Science and Engineering 1, no. 94 (November 1, 2018): 18–26. http://dx.doi.org/10.5604/01.3001.0012.7804.
Full textVasilevskii, A. M., G. A. Konoplev, D. A. Svetlov, V. A. Gerasimov, D. K. Kostrin, and A. A. Ukhov. "Optoelectronic Data Measuring System for Monitoring Polyhexamethylene Guanidine-Based Decontaminants." Biomedical Engineering 48, no. 1 (May 2014): 13–16. http://dx.doi.org/10.1007/s10527-014-9405-6.
Full textMarkina, O. M. "Lighting setting features of opto-electronic measuring system for controlling adhesive joints optical components." Journal of Achievements in Materials and Manufacturing Engineering 2, no. 84 (October 1, 2017): 49–57. http://dx.doi.org/10.5604/01.3001.0010.7781.
Full textSavich, A. I., and V. V. Makarenko. "Optical tracking system containing an optoelectronic converter for measuring complicated shapes." Measurement Techniques 30, no. 11 (November 1987): 1095–98. http://dx.doi.org/10.1007/bf00865067.
Full textPulov, Dimcho, and Tsanko Karadzhov. "OPTOELECTRONIC DEVICE FOR MEASURING THE POWER OF LASER RADIATION." ENVIRONMENT. TECHNOLOGIES. RESOURCES. Proceedings of the International Scientific and Practical Conference 3 (June 16, 2021): 286–90. http://dx.doi.org/10.17770/etr2021vol3.6590.
Full textArakantsev, Konstantin G., Igor A. Konyakhin, and Alexander N. Timofeev. "Inner-Base Optoelectronic System for the Control of Linear Displacements." Key Engineering Materials 437 (May 2010): 237–41. http://dx.doi.org/10.4028/www.scientific.net/kem.437.237.
Full textParfiryev, A. V., O. V. Parfiryeva, and A. V. Dushkin. "Optimization of the algorithm of information analysis and processing in the optoelectronic system." Proceedings of Universities. Electronics 27, no. 1 (February 2022): 106–19. http://dx.doi.org/10.24151/1561-5405-2022-27-1-106-119.
Full textLiu, Qi Fang. "Measuring Coaxiality with Optoelectronic and Non-Contact Based on Helical Scanning." Advanced Materials Research 588-589 (November 2012): 1002–5. http://dx.doi.org/10.4028/www.scientific.net/amr.588-589.1002.
Full textKonyakhin, I. A., A. D. Merson, and D. Y. Zubenko. "Optoelectronic System for Roll Angles Measuring of Maneuvering Objects Based on Anamorphosis Effect." Journal of Physics: Conference Series 48 (October 1, 2006): 988–91. http://dx.doi.org/10.1088/1742-6596/48/1/184.
Full textDissertations / Theses on the topic "Optoelectronic measuring system"
Драч, Юрій Олександрович. "Підвищення точності вимірювання геометричних розмірів мікрометричного діапазону шляхом вдосконалення вузла освітлення оптико-електронної системи." Master's thesis, КПІ ім. Ігоря Сікорського, 2020. https://ela.kpi.ua/handle/123456789/38419.
Full textIn this master's dissertation an analytical study of the structure of the optoelectronic measuring system, its components and features of the setting. From the topic of the dissertation "Improving the accuracy of measuring the geometric dimensions of the micrometric range by improving the lighting unit of the optoelectronic system" it is clear that by improving the accuracy of measuring geometric dimensions in the micrometric range is improving the light source. We have identified the main known methods for determining the lighting characteristics of light sources in the second section of the dissertation. In this section we analyze the methods of "integrating sphere" and "goniophometric" to determine the luminous flux of lighting systems with different types of light distribution. Of course, we considered the methods of world experience in determining these characteristics and domestic experience, because we planned to conduct experimental studies of our own radiation source, which would correspond to the world level. In the third section, we gave examples of three light sources with lighting characteristics. We noted the spectral characteristics for each light source. In the fourth section, we presented materials on the construction of our optoelectronic measuring system. We designed our measuring system to determine the geometric dimensions of the micrometric range on the basis of an optical microscope, a television camera, which was attached to the body of the optical microscope using adapters (tubes). The radiation received from the geometric dimensions object by the CCD matrix of the television camera was sent to a personal computer with the necessary software, which allowed us to determine the dimensions of the object or the defect of the object by the radiation. We would like to note that we did not develop the software in the master's dissertation, but used the finished software product. After all, we did not face such a task. Most of our efforts have been focused on researching the light source. However, we would like to note that after the results obtained on the study of lighting characteristics of the new light source, we conducted a series of measurements of geometric dimensions in the micrometric range. To compare the accuracy of measuring micrometric geometric dimensions. To do this, we performed measurements on a reference sample of linear geometric dimensions GOST 15114-78 This set of measures uses the establishment of the resolution of telescopic systems, we did not measure the angular geometric dimensions. We would like to note that we chose an LED lamp as a new light source and compared the obtained results of lighting characteristics with a source that is standard (basic) for the optical microscope model. Therefore, we conducted a number of experimental studies of the lighting characteristics of the most popular light source - LED lamps. Analysis of the results of the study showed that before using a mass-produced lamp made by any technology in a measuring system (optoelectronic system) it is necessary after a specialized study in the centers of testing and diagnostics of superconducting light sources and lighting systems. After all, these lighting characteristics from the manufacturers do not correspond to those determined experimentally. Although the characteristics of the LED lamp were not significantly different from the halogen lamp. The impact on the measurement accuracy of the optoelectronic measuring system of these light sources, we determined using a bar measure of absolute contrast and concluded that the efficiency of LED lighting is four times higher than halogen lighting when building a measuring system as described in dissertation.
Edworthy, Robert Mark. "A vehicle-mounted television measuring system for railway structure gauging." Thesis, Brunel University, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.277415.
Full textPoizat, Jean-Philippe. "Réalisation et caractérisation de mesures quantiques non-destructives en optique." Phd thesis, Université Paris Sud - Paris XI, 1993. http://pastel.archives-ouvertes.fr/pastel-00714222.
Full textChen, Chun-Jen, and 陳俊仁. "The developments of multi-degree-of-freedom optoelectronic measuring systems by using the skew-ray tracing method." Thesis, 2007. http://ndltd.ncl.edu.tw/handle/57945347565817449526.
Full text國立成功大學
機械工程學系碩博士班
95
High-accuracy laser-based optoelectronic motion and position measuring systems typically utilize light rays that travel from one optical assembly to another to perform motion and/or position measurements. It is not a simple task to accurately determine the equations of these sensor readings in terms of positional/angular motions. This problem is addressed in this paper by application of the analytic skew-ray tracing methodology as computed by finite difference methodology. An illustrative example of a motion measurement system and comparison of the Position Sensing Detector (PSD) readings are given to validate the proposed methodology. It is shown that the proposed methodology can provide accurate expressions of PSD readings. Based on the proposed methodology, the following three optoelectronic multi-degree-of-freedom measurement systems are established: an optoelectronic inclinometer, a high angular accuracy measurement system and a six Degree-Of-Freedom (DOF) motion measurement system. The optoelectronic inclinometer which can measure inclination angles along two orthogonal directions simultaneously by using a simple pendulum, two mirrors, a 2-axis PSD, and a laser diode. To validate the proposed methodology, an actual prototype system is built, and its calibration and stability experiments are performed. The high accuracy angle measurement system performs angle measurement by use of laser-diodes, 2-axis PSDs and a series of reflections between two first-surface-mirrors. Calibration and stability experiments are performed. Experimental results show the accuracy and measurement range are, respectively, 0.05 arc sec and ±250 arc sec. The six-DOF measurement system comprises a pyramid-polygon- mirror, three laser diodes and three 2-axis PSDs. To validate the proposed methodology, a laboratory prototype system is built. System verification and stability tests are conducted to evaluate its performance. Stability test results show that measurement errors and maximum crosstalk are within ±1 μm in translation and ±1.5 arc sec in rotation.
Books on the topic "Optoelectronic measuring system"
F, Fagan William, Europtica-Services I. C, and Society of Photo-optical Instrumentation Engineers., eds. Industrial optoelectronic measurement systems using coherent light. Bellingham, Wash., USA: The Society, 1988.
Find full textBook chapters on the topic "Optoelectronic measuring system"
Yanbing, Liu, and Zhang Jinru. "An Optical Fibre Magnetic Field Sensor System for Measuring Low Frequency Fields." In Laser/Optoelektronik in der Technik / Laser/Optoelectronics in Engineering, 770–73. Berlin, Heidelberg: Springer Berlin Heidelberg, 1990. http://dx.doi.org/10.1007/978-3-642-48372-1_163.
Full textZhang, J. R., Y. J. Zhang, and B. Chen. "Improving the measuring accuracy and reliability of a binocular structured light measurement system." In Frontier Research and Innovation in Optoelectronics Technology and Industry, 57–62. London, UK : CRC Press/Balkema, an imprint of the Taylor & Francis Group, [2019]: CRC Press, 2018. http://dx.doi.org/10.1201/9780429447082-8.
Full textDvoynishnikov, Sergey Vladimirovich, and Vladimir Genrievich Meledin. "Optoelectronic Differential Cloudy Triangulation Method for Measuring Geometry of Hot Moving Objects." In Optoelectronics in Machine Vision-Based Theories and Applications, 49–78. IGI Global, 2019. http://dx.doi.org/10.4018/978-1-5225-5751-7.ch003.
Full textLindner, Lars. "Laser Scanners." In Developing and Applying Optoelectronics in Machine Vision, 108–45. IGI Global, 2017. http://dx.doi.org/10.4018/978-1-5225-0632-4.ch004.
Full textCastillo, Javier Rivera, Moises Rivas-Lopez, Wendy Flores-Fuentes, Oleg Sergiyenko, Julio Cesar Rodríguez-Quiñonez, and Daniel Hernandez-Balbuena. "Machine Vision Optical Scanners for Landslide Monitoring." In Developing and Applying Optoelectronics in Machine Vision, 206–35. IGI Global, 2017. http://dx.doi.org/10.4018/978-1-5225-0632-4.ch007.
Full textMiranda-Vega, Jesús Elias, Javier Rivera-Castillo, Moisés Rivas-López, Wendy Flores-Fuentes, Oleg Sergiyenko, Julio C. Rodríguez-Quiñonez, and Daniel Hernández-Balbuena. "Reducing the Optical Noise of Machine Vision Optical Scanners for Landslide Monitoring." In Examining Optoelectronics in Machine Vision and Applications in Industry 4.0, 103–33. IGI Global, 2021. http://dx.doi.org/10.4018/978-1-7998-6522-3.ch004.
Full textConference papers on the topic "Optoelectronic measuring system"
Galiulin, Ravil M. "Optoelectronic computer-aided measuring OPTEL system." In Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, edited by Yuri V. Chugui, Sergei N. Bagayev, Albert Weckenmann, and P. Herbert Osanna. SPIE, 2002. http://dx.doi.org/10.1117/12.484600.
Full textSzebeszczyk, Janina, and Joanna Straszecka. "Achilles tendon reflex measuring system." In Optoelectronic and Electronic Sensors, edited by Ryszard Jachowicz and Zdzislaw Jankiewicz. SPIE, 1995. http://dx.doi.org/10.1117/12.213153.
Full textLigeza, P. "Modeling of complex hot-wire measuring system." In Optoelectronic and Electronic Sensors IV, edited by Jerzy Fraczek. SPIE, 2001. http://dx.doi.org/10.1117/12.435913.
Full textHypszer, Ryszard, Jerzy Plucinski, and Pawel Wierzba. "System for measuring thickness of opaque dielectric layers." In Optoelectronic and Electronic Sensors II, edited by Zdzislaw Jankiewicz and Henryk Madura. SPIE, 1997. http://dx.doi.org/10.1117/12.266718.
Full textLi, Hegao. "Measuring system of digital-optical power spectrum." In International Conference on Optoelectronic Science and Engineering '90. SPIE, 1990. http://dx.doi.org/10.1117/12.2294710.
Full textZhang, Yuheng, Siyang Liu, Linsheng Zhong, Shenzhan Zhang, Xiaofang Wu, and Zhujun Wan. "An Optical System for Measuring the Pitch of a Fiber Array." In Optoelectronic Devices and Integration. Washington, D.C.: OSA, 2018. http://dx.doi.org/10.1364/oedi.2018.ot4a.75.
Full textZhang, Yunxiang. "Optical fibre-CCD area endoscope image measuring system." In International Conference on Optoelectronic Science and Engineering '90. SPIE, 1990. http://dx.doi.org/10.1117/12.2294877.
Full textGao, Wei, Yi Zeng, Yan Dong, Ye Gu, and Guangheng Tong. "Design of automatic image measuring system based on RTX simulation system." In International Symposium on Optoelectronic Technology and Application 2014, edited by Gaurav Sharma, Fugen Zhou, and Jennifer Liu. SPIE, 2014. http://dx.doi.org/10.1117/12.2073163.
Full textHao, Qun, Yongtian Wang, and Dingguo Sha. "Online measuring system for amorphous strip thickness." In Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, edited by Shulian Zhang and Wei Gao. SPIE, 2000. http://dx.doi.org/10.1117/12.403835.
Full textZheng, Yingjun, and Yongmei Huang. "New soft-measuring system of polarized light." In Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, edited by Shulian Zhang and Wei Gao. SPIE, 2000. http://dx.doi.org/10.1117/12.403894.
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