Journal articles on the topic 'Optics. Image processing. Microscopy Electron microscopy'
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Faruqi, A. R., and Sriram Subramaniam. "CCD detectors in high-resolution biological electron microscopy." Quarterly Reviews of Biophysics 33, no. 1 (February 2000): 1–27. http://dx.doi.org/10.1017/s0033583500003577.
Full textde Ruijter, W. J., Peter Rez, and David J. Smith. "Recent Progress and Plans in Computer-Controlled High Resolution Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 154–55. http://dx.doi.org/10.1017/s042482010017952x.
Full textLichte, Hannes. "Electron Holography at Atomic Dimensions." Microscopy and Microanalysis 3, S2 (August 1997): 1169–70. http://dx.doi.org/10.1017/s1431927600012733.
Full textKrakow, William. "Applications of real-time image processing for electron microscopy." Ultramicroscopy 18, no. 1-4 (January 1985): 197–210. http://dx.doi.org/10.1016/0304-3991(85)90138-x.
Full textCoene, W., A. F. de Jong, D. van Dyck, G. van Tendeloo, and J. van Landuyt. "Digital image processing for high resolution electron microscopy." Physica Status Solidi (a) 107, no. 2 (June 16, 1988): 521–30. http://dx.doi.org/10.1002/pssa.2211070207.
Full textBostanjoglo, Oleg, and Jochen Kornitzky. "Nanoseconds Double-Frame and Streak Transmission Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 180–81. http://dx.doi.org/10.1017/s0424820100179658.
Full textJeng, T. W., R. A. Crowther, G. Stubbs, and W. Chiu. "Alpha Helices of TMV Visualized by Cryo-Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 154–55. http://dx.doi.org/10.1017/s0424820100102857.
Full textInoué, Shinya. "Digitally Enhanced, Polarization-Based Microscopy: Reality and Dreams." Microscopy and Microanalysis 7, S2 (August 2001): 2–3. http://dx.doi.org/10.1017/s1431927600026088.
Full textIshii, Shin, Sehyung Lee, Hidetoshi Urakubo, Hideaki Kume, and Haruo Kasai. "Generative and discriminative model-based approaches to microscopic image restoration and segmentation." Microscopy 69, no. 2 (March 26, 2020): 79–91. http://dx.doi.org/10.1093/jmicro/dfaa007.
Full textHerman, Gabor T., Roberto Marabini, Jos�-Mar�a Carazo, Edgar Gardu�o, Robert M. Lewitt, and Samuel Matej. "Image processing approaches to biological three-dimensional electron microscopy." International Journal of Imaging Systems and Technology 11, no. 1 (2000): 12–29. http://dx.doi.org/10.1002/(sici)1098-1098(2000)11:1<12::aid-ima3>3.0.co;2-n.
Full textRees, Eric J., Miklos Erdelyi, Gabriele S. Kaminski Schierle, Alex Knight, and Clemens F. Kaminski. "Elements of image processing in localization microscopy." Journal of Optics 15, no. 9 (September 1, 2013): 094012. http://dx.doi.org/10.1088/2040-8978/15/9/094012.
Full textWei, D. H., Y. J. Hsu, R. Klauser, I. H. Hong, G. C. Yin, and T. J. Chuang. "Photoelectron Microscopy Projects at SRRC." Surface Review and Letters 10, no. 04 (August 2003): 617–24. http://dx.doi.org/10.1142/s0218625x0300544x.
Full textMeschini, Stefania. "Correlative Microscopy in Life and Materials Sciences." European Journal of Histochemistry 61, s4 (November 2, 2017): 1. http://dx.doi.org/10.4081/ejh.2017.2864.
Full textRez, Peter, and W. J. de Ruijter. "The Electron Microscope and the Computer: Present Trends and Future Prospects." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 116–17. http://dx.doi.org/10.1017/s0424820100179336.
Full textRickard, William D. A., Jéssica Fernanda Ramos Coelho, Joshua Hollick, Susannah Soon, and Andrew Woods. "Application of Photogrammetric 3D Reconstruction to Scanning Electron Microscopy: Considerations for Volume Analysis." Electronic Imaging 2021, no. 18 (January 18, 2021): 60404–1. http://dx.doi.org/10.2352/issn.2470-1173.2021.18.3dia-102.
Full textOho, Eisaku, Kazuhiko Suzuki, and Sadao Yamazaki. "Applying Fast Scanning Method Coupled with Digital Image Processing Technology as Standard Acquisition Mode for Scanning Electron Microscopy." Scanning 2020 (March 31, 2020): 1–9. http://dx.doi.org/10.1155/2020/4979431.
Full textZuo, J. M. "Image Restoration and Characteristics of Slow_Scan CCD Camera and Imaging Plates." Microscopy and Microanalysis 3, S2 (August 1997): 1091–92. http://dx.doi.org/10.1017/s1431927600012344.
Full textTURNER, JAMES A. "Digital imaging of micro bivalves." Zoosymposia 1 (July 25, 2008): 47–61. http://dx.doi.org/10.11646/zoosymposia.1.1.7.
Full textHovmöller, Sven, Xiaodong Zou, Da Neng Wang, Jose Maria González-Calbet, and Maria Vallet-Regí. "Structure determination of Ca4Fe2Ti2O11 by electron microscopy and crystallographic image processing." Journal of Solid State Chemistry 77, no. 2 (December 1988): 316–21. http://dx.doi.org/10.1016/0022-4596(88)90254-x.
Full textCrowther, R. A. "Viruses and the development of quantitative biological electron microscopy." Notes and Records of the Royal Society of London 58, no. 1 (January 22, 2004): 65–81. http://dx.doi.org/10.1098/rsnr.2003.0225.
Full textHasegawa, S., T. Kawasaki, J. Endo, M. Futamoto, and A. Tonomura. "Digital phase analysis in interference electron microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 842–43. http://dx.doi.org/10.1017/s0424820100106272.
Full textSanta, Nestor, Cigdem Keles, J. R. Saylor, and Emily Sarver. "Demonstration of Optical Microscopy and Image Processing to Classify Respirable Coal Mine Dust Particles." Minerals 11, no. 8 (August 2, 2021): 838. http://dx.doi.org/10.3390/min11080838.
Full textLee, R. J., and J. S. Walker. "Applications of CCEM to Environmental Health Problems." Proceedings, annual meeting, Electron Microscopy Society of America 43 (August 1985): 102–3. http://dx.doi.org/10.1017/s0424820100117558.
Full textYajima, Y., and Y. Takahashi. "Lorentz And Interference Electron Microscopy On A Scanning Tem." Microscopy and Microanalysis 5, S2 (August 1999): 38–39. http://dx.doi.org/10.1017/s1431927600013519.
Full textBall, Alexander D., Tomasz Goral, and Seyit A. Kamanli. "CONFOCAL MICROSCOPY APPLIED TO PALEONTOLOGICAL SPECIMENS." Paleontological Society Papers 22 (September 2016): 39–55. http://dx.doi.org/10.1017/scs.2017.7.
Full textVulovic, M., B. Rieger, L. J. van Vliet, A. J. Koster, and R. B. G. Ravelli. "A toolkit for the characterization of CCD cameras for transmission electron microscopy." Acta Crystallographica Section D Biological Crystallography 66, no. 1 (December 21, 2009): 97–109. http://dx.doi.org/10.1107/s0907444909031205.
Full textFan, G. Y., A. J. Gubbens, O. L. Krivanek, M. L. Leber, and P. E. Mooney. "Combining slow-scan CCD images to extend image size and dynamic range." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 524–25. http://dx.doi.org/10.1017/s0424820100086933.
Full textRansick, Mark H., and Chadwick D. Barklay. "Interfacing a Personal Computer to an Analog Scanning Electron Microscope for Storing Images on Optical Disks." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (August 12, 1990): 84–85. http://dx.doi.org/10.1017/s0424820100134016.
Full textChiu, W., M. F. Schmid, and T. W. Jeng. "Computer processing of high-resolution images of periodic specimens." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 2–5. http://dx.doi.org/10.1017/s0424820100141834.
Full textPtashekas, J. "Application of video EM and image processing for evaluation of barrier tissues endocrine activity after environmental chemical exposure." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 3 (August 12, 1990): 963. http://dx.doi.org/10.1017/s0424820100162405.
Full textPeters, Klaus-Ruediger. "Collection deficiencies of scanning electron microscopy signal contrasts measured and corrected by differential hysteresis image processing." Scanning 18, no. 8 (December 18, 2006): 539–55. http://dx.doi.org/10.1002/sca.4950180803.
Full textToth, P., J. K. Farrer, A. B. Palotas, J. S. Lighty, and E. G. Eddings. "Automated analysis of heterogeneous carbon nanostructures by high-resolution electron microscopy and on-line image processing." Ultramicroscopy 129 (June 2013): 53–62. http://dx.doi.org/10.1016/j.ultramic.2013.02.017.
Full textPietroy, David, Issam Gereige, and Cécile Gourgon. "Automatic detection of NIL defects using microscopy and image processing." Microelectronic Engineering 112 (December 2013): 163–67. http://dx.doi.org/10.1016/j.mee.2013.03.126.
Full textKoster, A. J., D. Typke, and M. J. C. de Jong. "Fast and Accurate Autotuning of a TEM for High-Resolution and Low Dose Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 114–15. http://dx.doi.org/10.1017/s0424820100179324.
Full textAndrews, S. B., N. B. Pivovarova, J. Hongpaisan, and R. D. Leapman. "High-Resolution Analysis of Rapidly Frozen Biological Specimens: Capabilities and Limitations." Microscopy and Microanalysis 5, S2 (August 1999): 412–13. http://dx.doi.org/10.1017/s1431927600015385.
Full textOtt, Tobias, Diego Roldán, Claudia Redenbach, Katja Schladitz, Michael Godehardt, and Sören Höhn. "Three-dimensional structural comparison of tantalum glancing angle deposition thin films by FIB-SEM." Journal of Sensors and Sensor Systems 8, no. 2 (October 30, 2019): 305–15. http://dx.doi.org/10.5194/jsss-8-305-2019.
Full textKennedy, S. K., D. Barton, H. P. Lentz, J. Newlin, P. M. Sauter, and F. C. Schwerer. "Montages and Virtual Reality - A Paradim for Presentation of Analytical Data." Microscopy and Microanalysis 4, S2 (July 1998): 66–67. http://dx.doi.org/10.1017/s1431927600020456.
Full textCowger, Win, Andrew Gray, Silke H. Christiansen, Hannah DeFrond, Ashok D. Deshpande, Ludovic Hemabessiere, Eunah Lee, et al. "Critical Review of Processing and Classification Techniques for Images and Spectra in Microplastic Research." Applied Spectroscopy 74, no. 9 (September 2020): 989–1010. http://dx.doi.org/10.1177/0003702820929064.
Full textPope, Kenneth J., Jason L. P. Smith, and Joe G. Shapter. "Imaging molecular adsorbates using scanning tunnelling microscopy and image processing." Smart Materials and Structures 11, no. 5 (September 13, 2002): 679–85. http://dx.doi.org/10.1088/0964-1726/11/5/309.
Full textDuque, D., J. Garzón, and T. Gharbi. "A study of dispersion in chromatic confocal microscopy using digital image processing." Optics & Laser Technology 131 (November 2020): 106414. http://dx.doi.org/10.1016/j.optlastec.2020.106414.
Full textMacRae, Colin, Nick Wilson, and Mark Pownceby. "Electron Microprobe Mapping as a Tool in Ilmenite Characterisation." Microscopy and Microanalysis 7, S2 (August 2001): 710–11. http://dx.doi.org/10.1017/s1431927600029627.
Full textDyachenko, A. A., and V. P. Ryabukho. "Color models of interference images of thin stratified objects in optical microscopy." Computer Optics 43, no. 6 (December 2019): 956–67. http://dx.doi.org/10.18287/2412-6179-2019-43-6-956-967.
Full textAllais, M., and M. Gandais. "Structural study of Cd(S,Se) doped glasses. High-resolution transmission electron microscopy (HRTEM) assisted by image processing." Journal of Applied Crystallography 23, no. 5 (October 1, 1990): 418–23. http://dx.doi.org/10.1107/s0021889890006379.
Full textLakhdari, M. A., F. Krajcarz, J. D. Mithieux, H. P. Van Landeghem, and M. Veron. "Strength Enhancement of Superduplex Stainless Steel Using Thermomechanical Processing." Metals 11, no. 7 (July 9, 2021): 1094. http://dx.doi.org/10.3390/met11071094.
Full textKiely, Carol, Gary Greenberg, and Christopher J. Kiely. "A New Look at Lunar Soil Collected from the Sea of Tranquility during the Apollo 11 Mission." Microscopy and Microanalysis 17, no. 1 (November 19, 2010): 34–48. http://dx.doi.org/10.1017/s1431927610093979.
Full textNicolosi, Valeria. "Processing and characterisation of two-dimensional nanostructures." Acta Crystallographica Section A Foundations and Advances 70, a1 (August 5, 2014): C510. http://dx.doi.org/10.1107/s2053273314094893.
Full textCai, Changjie, Tomoki Nishimura, Jooyeon Hwang, Xiao-Ming Hu, and Akio Kuroda. "Asbestos Detection with Fluorescence Microscopy Images and Deep Learning." Sensors 21, no. 13 (July 4, 2021): 4582. http://dx.doi.org/10.3390/s21134582.
Full textMüller, Mark, Ivo de Sena Oliveira, Sebastian Allner, Simone Ferstl, Pidassa Bidola, Korbinian Mechlem, Andreas Fehringer, et al. "Myoanatomy of the velvet worm leg revealed by laboratory-based nanofocus X-ray source tomography." Proceedings of the National Academy of Sciences 114, no. 47 (November 6, 2017): 12378–83. http://dx.doi.org/10.1073/pnas.1710742114.
Full textGolijanin, Danilo. "An application of photoemission microscopy to failure analysis of complex silicon integrated circuits." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1686–87. http://dx.doi.org/10.1017/s0424820100133060.
Full textRuiz, J. E., S. Paciornik, L. D. Pinto, F. Ptak, M. P. Pires, and P. L. Souza. "Optimization of digital image processing to determine quantum dots’ height and density from atomic force microscopy." Ultramicroscopy 184 (January 2018): 234–41. http://dx.doi.org/10.1016/j.ultramic.2017.09.004.
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