Relevant bibliographies by topics / Optics. Image processing. Microscopy Electron microscopy

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  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers

Academic literature on the topic 'Optics. Image processing. Microscopy Electron microscopy'

Author: Grafiati
Published: 4 June 2021
Last updated: 16 February 2022

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Journal articles on the topic "Optics. Image processing. Microscopy Electron microscopy"

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Faruqi, A. R., and Sriram Subramaniam. "CCD detectors in high-resolution biological electron microscopy." Quarterly Reviews of Biophysics 33, no. 1 (February 2000): 1–27. http://dx.doi.org/10.1017/s0033583500003577.

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1. Introduction 11.1 The ‘band gap’ in silicon 22. Principles of CCD detector operation 32.1 Direct detection 32.2 Electron energy conversion into light 42.3 Optical coupling: lens or fibre optics? 62.4 Readout speed and comparison with film 83. Practical considerations for electron microscopic applications 93.1 Sources of noise 93.1.1 Dark current noise 93.1.2 Readout noise 93.1.3 Spurious events due to X-rays or cosmic rays 103.2 Efficiency of detection 113.3 Spatial resolution and modulation transfer function 123.4 Interface to electron microscope 143.5 Electron diffraction applications 154. Prospects for high-resolution imaging with CCD detectors 185. Alternative technologies for electronic detection 235.1 Image plates 235.2 Hybrid pixel detectors 246. References 26During the past decade charge-coupled device (CCD) detectors have increasingly become the preferred choice of medium for recording data in the electron microscope. The CCD detector itself can be likened to a new type of television camera with superior properties, which makes it an ideal detector for recording very low exposure images. The success of CCD detectors for electron microscopy, however, also relies on a number of other factors, which include its fast response, low noise electronics, the ease of interfacing them to the electron microscope, and the improvements in computing that have made possible the storage and processing of large images.CCD detectors have already begun to be routinely used in a number of important biological applications such as tomography of cellular organelles (reviewed by Baumeister, 1999), where the resolution requirements are relatively modest. However, in most high- resolution microscopic applications, especially where the goal of the microscopy is to obtain structural information at near-atomic resolution, photographic film has continued to remain the medium of choice. With the increasing interest and demand for high-throughput structure determination of important macromolecular assemblies, it is clearly important to have tools for electronic data collection that bypass the slow and tedious process of processing images recorded on photographic film.In this review, we present an analysis of the potential of CCD-based detectors to fully replace photographic film for high-resolution electron crystallographic applications.
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de Ruijter, W. J., Peter Rez, and David J. Smith. "Recent Progress and Plans in Computer-Controlled High Resolution Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 154–55. http://dx.doi.org/10.1017/s042482010017952x.

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Digital computers are becoming widely recognized as standard accessories for electron microscopy. Due to instrumental innovations the emphasis in digital processing is shifting from off-line manipulation of electron micrographs to on-line image acquisition, analysis and microscope control. An on-line computer leads to better utilization of the instrument and, moreover, the flexibility of software control creates the possibility of a wide range of novel experiments, for example, based on temporal and spatially resolved acquisition of images or microdiffraction patterns. The instrumental resolution in electron microscopy is often restricted by a combination of specimen movement, radiation damage and improper microscope adjustment (where the settings of focus, objective lens stigmatism and especially beam alignment are most critical). We are investigating the possibility of proper microscope alignment based on computer induced tilt of the electron beam. Image details corresponding to specimen spacings larger than ∼20Å are produced mainly through amplitude contrast; an analysis based on geometric optics indicates that beam tilt causes a simple image displacement. Higher resolution detail is characterized by wave propagation through the optical system of the microscope and we find that beam tilt results in a dispersive image displacement, i.e. the displacement varies with spacing. This approach is valid for weak phase objects (such as amorphous thin films), where transfer is simply described by a linear filter (phase contrast transfer function) and for crystalline materials, where imaging is described in terms of dynamical scattering and non-linear imaging theory. In both cases beam tilt introduces image artefacts.
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Lichte, Hannes. "Electron Holography at Atomic Dimensions." Microscopy and Microanalysis 3, S2 (August 1997): 1169–70. http://dx.doi.org/10.1017/s1431927600012733.

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Many of the problems of transmission electron microscopy (TEM) are due to the fact that wave optics which governs the interaction of electrons with the specimen and the imaging process definitely is brought to an end with the detection of the final electron image. Unfortunately, resolution is limited by an increasing number of aberrations. Furthermore, wave optical tools in the electron microscope which are needed for example to produce phase contrast better than that given by the phase contrast transfer function, for distinction of amplitude contrast and phase contrast, or to measure phases in Fourier space, are only poorly developed. Since subsequent image processing of electron diffraction patterns or real space images can never compensate for the loss of phase information, the phase has to be recorded also, i.e. one has to work holographically to collect and reconstruct all data of the object structure.
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Krakow, William. "Applications of real-time image processing for electron microscopy." Ultramicroscopy 18, no. 1-4 (January 1985): 197–210. http://dx.doi.org/10.1016/0304-3991(85)90138-x.

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Coene, W., A. F. de Jong, D. van Dyck, G. van Tendeloo, and J. van Landuyt. "Digital image processing for high resolution electron microscopy." Physica Status Solidi (a) 107, no. 2 (June 16, 1988): 521–30. http://dx.doi.org/10.1002/pssa.2211070207.

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Bostanjoglo, Oleg, and Jochen Kornitzky. "Nanoseconds Double-Frame and Streak Transmission Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 180–81. http://dx.doi.org/10.1017/s0424820100179658.

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Material processing and synthesis is increasingly done by lasers. In order to apply this modern tool effectively, the laser-induced physical processes must be well known. As transmission electron microscopy is a powerful method to study the structure of the treated material, it seemed worthwhile to extend this technique for fast phase transitions, as are triggered by laser radiation. High-speed TEM may be realized either by pulsing the detector /l/ or the illuminating electron beam. The latter technique is more convenient and is described here.Fig. 1 shows a high-speed TEM designed for taking either double frame images (exposure/ repetition times ≿ 10 ns/≿ 50 ns) or streak images of transitions induced by a laser in the thin film specimen. It consists of a modified commercial TEM, an attached Q-switched (FWHM 50 ns), frequency-doubled (532 nm) Nd:YAG laser for treating the specimen, and electronics for electron beam pulsing and image storage. The TEM is equipped with focusing/deflecting optics for the laser radiation, an electron beam pulser generating either the exposure times for double frame pictures or the streak, and an image shifter. The image detector is a proximity focusing double stage MicroChannel Plate (MCP)/scintillator assembly. A CCD camera transfers the image to a PC-backed digitizing and frame grabbing card. The components are synchronized by a specially designed logic unit /2/.
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Jeng, T. W., R. A. Crowther, G. Stubbs, and W. Chiu. "Alpha Helices of TMV Visualized by Cryo-Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 154–55. http://dx.doi.org/10.1017/s0424820100102857.

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Tobacco mosaic virus (TMV) is a helical particle, the structure of which has been determined by X-ray diffraction. We chose it as a test specimen to investigate whether cryo-electron microscopy and computer image processing could reveal internal structure at high resolution in a non-crystalline specimen.Low dose images of TMV embedded in a thin layer of vitreous ice were recorded at 60,000 magnification in a JEOL100CX electron microscope equipped with a cold stacje at -148°C. The best images were selected for processing on the basis of their optical diffractograms. The defocus was determined from the image of the carbon film adjacent to the hole over which TMV particles were suspended. The defocus values of processed images ranged from 5000 to -10000 Å. The initial processing steps included masking out the selected segment of a particle, interpolating the image to make the axis of a selected particle segment parallel to the transform array, straightening the particle segment by a real space correlation and re-interpolation procedure. The computed structure factors from the straightened particle segment were corrected for the effects of defocus by applying a Wiener filter function.
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Inoué, Shinya. "Digitally Enhanced, Polarization-Based Microscopy: Reality and Dreams." Microscopy and Microanalysis 7, S2 (August 2001): 2–3. http://dx.doi.org/10.1017/s1431927600026088.

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Polarized light microscopy is used to identify and image optically anisotropic regions of the specimen; to determine their optical character; and to explore the arrangement of the molecules, fine structure, or atomic lattices that are responsible for the anisotropy. These studies can be carried out non-destructively in real time, and reveal events or structures that lie far below the resolution limit of the light microscope, or indeed at times even the electron microscope.In biology, to study the dynamically changing, minute and weakly anisotropic domains within living cells, the polarizing microscope must be able to detect and measure birefringence retardances to a fraction of a nm, record the image with high microscopic resolution at nearvideo rate, and do so while the cell remains active.Over the years, the extinction property and imaging capability of the basic polarizing microscope have been substantially improved by advances in optical design. More recently, video and CCD imaging and digital electronic processing have further enhanced the quality of the polarizing microscope image and our ability to rapidly detect and measure weak anisotropy.
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Ishii, Shin, Sehyung Lee, Hidetoshi Urakubo, Hideaki Kume, and Haruo Kasai. "Generative and discriminative model-based approaches to microscopic image restoration and segmentation." Microscopy 69, no. 2 (March 26, 2020): 79–91. http://dx.doi.org/10.1093/jmicro/dfaa007.

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Abstract Image processing is one of the most important applications of recent machine learning (ML) technologies. Convolutional neural networks (CNNs), a popular deep learning-based ML architecture, have been developed for image processing applications. However, the application of ML to microscopic images is limited as microscopic images are often 3D/4D, that is, the image sizes can be very large, and the images may suffer from serious noise generated due to optics. In this review, three types of feature reconstruction applications to microscopic images are discussed, which fully utilize the recent advancements in ML technologies. First, multi-frame super-resolution is introduced, based on the formulation of statistical generative model-based techniques such as Bayesian inference. Second, data-driven image restoration is introduced, based on supervised discriminative model-based ML technique. In this application, CNNs are demonstrated to exhibit preferable restoration performance. Third, image segmentation based on data-driven CNNs is introduced. Image segmentation has become immensely popular in object segmentation based on electron microscopy (EM); therefore, we focus on EM image processing.
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Herman, Gabor T., Roberto Marabini, Jos�-Mar�a Carazo, Edgar Gardu�o, Robert M. Lewitt, and Samuel Matej. "Image processing approaches to biological three-dimensional electron microscopy." International Journal of Imaging Systems and Technology 11, no. 1 (2000): 12–29. http://dx.doi.org/10.1002/(sici)1098-1098(2000)11:1<12::aid-ima3>3.0.co;2-n.

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Dissertations / Theses on the topic "Optics. Image processing. Microscopy Electron microscopy"

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Girirajan, Thanu Prabha Kalambur. "Development of Spectral Imaging Microscope for Single Molecule Studies in Complex Biological Systems." Fogler Library, University of Maine, 2007. http://www.library.umaine.edu/theses/pdf/GirirajanTPK2007.pdf.

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Bilyeu, Taylor Thomas. "Crystallographic Image Processing with Unambiguous 2D Bravais Lattice Identification on the Basis of a Geometric Akaike Information Criterion." Thesis, Portland State University, 2013. http://pqdtopen.proquest.com/#viewpdf?dispub=1541427.

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Crystallographic image processing (CIP) is a technique first used to aid in the structure determination of periodic organic complexes imaged with a high-resolution transmission electron microscope (TEM). The technique has subsequently been utilized for TEM images of inorganic crystals, scanning TEM images, and even scanning probe microscope (SPM) images of two-dimensional periodic arrays. We have written software specialized for use on such SPM images. A key step in the CIP process requires that an experimental image be classified as one of only 17 possible mathematical plane symmetry groups. The current methods used for making this symmetry determination are not entirely objective, and there is no generally accepted method for measuring or quantifying deviations from ideal symmetry. Here, we discuss the crystallographic symmetries present in real images and the general techniques of CIP, with emphasis on the current methods for symmetry determination in an experimental 2D periodic image. The geometric Akaike information criterion (AIC) is introduced as a viable statistical criterion for both quantifying deviations from ideal symmetry and determining which 2D Bravais lattice best fits the experimental data from an image being processed with CIP. By objectively determining the statistically favored 2D Bravais lattice, the determination of plane symmetry in the CIP procedure can be greatly improved. As examples, we examine scanning tunneling microscope images of 2D molecular arrays of the following compounds: cobalt phthalocyanine on Au (111) substrate; nominal cobalt phthalocyanine on Ag (111); tetraphenoxyphthalocyanine on highly oriented pyrolitic graphite; hexaazatriphenylene-hexacarbonitrile on Ag (111). We show that the geometric AIC procedure can unambiguously determine which 2D Bravais lattice fits the experimental data for a variety of different lattice types. In some cases, the geometric AIC procedure can be used to determine which plane symmetry group best fits the experimental data, when traditional CIP methods fail to do so.

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Cuevas, Assunta Mariela. "Microstructure characterization of friction-stir processed nickel-aluminum bronze through orientation imaging microscopy." Thesis, Monterey, Calif. : Springfield, Va. : Naval Postgraduate School ; Available from National Technical Information Service, 2002. http://library.nps.navy.mil/uhtbin/hyperion-image/02sep%5FCuevas.

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Nellist, Peter David. "Image resolution improvement in scanning transmission electron microscopy." Thesis, University of Cambridge, 1995. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.361613.

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Simmonds, Richard. "Adaptive optics for microscopy and photonic engineering." Thesis, University of Oxford, 2012. https://ora.ox.ac.uk/objects/uuid:0f1ed5cc-4e21-4ff5-9444-c9be0e3646e4.

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Aberrations affect the operation of optical systems, particularly those designed to work at the diffraction limit. These systems include high-resolution microscopes, widely used for imaging in biology and other areas. Similar problems are encountered in photonic engineering, specifically in laser fabrication systems used for the manufacture of fine structures. The work presented in this thesis covers various aspects of adaptive optics developed for applications in microscopes and laser fabrication. By mathematically modelling a range of idealised fluorescent structures, the effect of different aberrations on their intensity in various microscopes is presented. The effect of random aberrations on the contrast of these different structures is then calculated and the results displayed on idealised images. Images from a two-photon microscope demonstrate the predicted results. The contrast of two structures is compared when imaged first by a conventional microscope and then by the two-photon or confocal sectioning microscopes. The different specimen structures were seen to be affected to varying extents by each aberration mode. In order to correct for aberrations in microscopy and other photonic applications, adaptive elements such as deformable mirrors are incorporated into the optical setups. An important step is to train the deformable mirror so that it produces appropriate mode shapes to apply a phase to optical wavefronts. One such mirror is modelled using the membrane equation to predict the surface shape when an actuator is applied. Each of these influence functions is combined to produce a set of orthogonal mirror modes, which are used to experimentally produce a set of empirical modes in a two-photon microscope. An alternative method of training a deformable mirror from a spatial light modulator is employed. The focal spot of an optical system is imaged to provide a feedback metric for the mirror to replicate the phase pattern on the spatial light modulator. A two-photon microscope with adaptive optics is demonstrated by imaging the brains of Drosophila deep within the bulk, correcting for both system and specimen induced aberrations using the deformable mirror with empirical mirror modes applied. A harmonic generation microscope is also used to image both biological and non-biological specimens whilst performing aberration correction with a deformable mirror. Adaptive optical methods are also applied to a laser fabrication system, by constructing a dual adaptive optics setup to correct for aberrations induced when fabricating deep in the bulk of a substrate. The efficiency and fidelity of fabrication in diamond substrate is shown to be significantly increased as a result of the dual aberration correction. An outstanding problem in microscopy is the effect of spatially variant aberrations. Using measurements from the adaptive microscopes, the extent to which they are present in a range of specimens is quantified. One potential technique to be used to correct for these aberrations is multi-conjugate adaptive optics. Different configurations of a multi-conjugate adaptive optics system are modelled and the improvement on the Strehl ratio of aberrated images quantified for both simulated images and real data. The application of this technique in experimental microscopes is considered.
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Elad, Nadav. "GroEL mediated protein folding studied by electron microscopy and image processing." Thesis, Birkbeck (University of London), 2007. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.498330.

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Kola, B. O. "Development of an image processing workstation for scanning Auger electron microscopy." Thesis, University of York, 1986. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.374183.

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Dyson, Mark Adam. "Advances in computational methods for transmission electron microscopy simulation and image processing." Thesis, University of Warwick, 2014. http://wrap.warwick.ac.uk/72953/.

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Modern electron microscopes are fitted with ever larger charge-coupled device (CCD) cameras capable of faster acquisition rates which in turn drives a concomitant increase in the bandwidth of data that is being collected and the amount of information in our datasets. At the same time, current increases in computational performance are largely being delivered through the addition of parallel execution units rather than explicit increases in the speed of single processors, this means techniques that cannot exploit their inherent parallelism are seeing little performance benefit from the generational improvements in computer processors. Many techniques used in electron microscopy to process these large datasets have not been adapted to utilise the modern methods available for parallel data processing which can lead to lengthy offline data processing techniques which could otherwise be performed in near real-time. Reimagining these methods to suit highly parallel computational architectures such as graphics processing units (GPUs) can offer improved performance orders of magnitude higher than their central processing unit (CPU) counterparts. In this thesis I have looked specifically at the case of transmission electron microscopy (TEM) image simulation via the multislice procedure, and exit wave reconstruction (EWR), which can both potentially see huge benefits by adapting these algorithms to exploit their parallelism. Software has been developed for performing multislice simulations using GPU computation where the increase in computational power also allows for modifications to be made which can increase the accuracy of the simulations at the expense of simulation time. The multislice software developed here has no minimum slice thickness limitations and the slice thickness no longer has to be coupled to the structure being simulated to ensure accuracy. The CCD detector characteristics and electron dose have also been incorporated within the simulation process. The use of GPUs has allowed these simulations to be performed in vastly less time than CPUs based equivalent simulations. Software has also been developed for performing EWR on either multicore CPUs or GPUs which lowers the time required to perform EWR sufficiently that real-time reconstruction at typical CCD frame-rates is a distinct possibility. This EWR software additionally features mutual information (MI) based image alignment which can handle accurate image alignment in cases where other methods are prone to failure. These software are used to aid in the investigation of fluorinated graphene conformation via multislice simulation and EWR, and in the study of self-assembled block co-polymer assemblies also by EWR.
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Roseman, Alan Michael. "Three dimensional structures of chaperonin complexes by electron microscopy and image processing." Thesis, Birkbeck (University of London), 1997. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.267764.

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Cannone, Giuseppe. "Structural investigation of the archaeal replicative machinery by electron microscopy and digital image processing." Thesis, University of Edinburgh, 2015. http://hdl.handle.net/1842/17070.

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Previous studies suggest a degree of homology between eukaryotic replication, transcription and translation proteins and archaeal ones. Hence, Archaea are considered a simplified model for understanding the complex molecular machinery involved in eukaryotic DNA metabolism. DNA replication in eukaryotic cells is widely studied. In recent years, DNA replication studies expanded on the archaeal DNA replication machinery. P. abyssi was the first archaeon whose genome was fully sequenced. Genome sequencing and comparative genomics have highlighted an MCM-like protein in P. abyssi. In this study, I report the biochemical and structural characterisation of PabMCM. PabMCM is explored as model for understanding more complex eukaryotic MCM proteins and unravelling the biochemical mechanism by which MCM proteins release their helicase activity. The crenarchaeon Sulfolobus solfataricus possesses a simplified toolset for DNA replication compared to Eukaryotes. In particular, S. solfataricus has a subset of the eukaryotic Okazaki fragment maturation factors, among which there are a heterotrimeric DNA sliding clamp, (the proliferating cell nuclear antigen, PCNA), the DNA polymerase B1 (PolB1), the flap endonuclease (Fen1) and the ATP-dependent DNA ligase I (LigI). PCNA functions as a scaffold with each subunit having a specific binding affinity for each of the factors involved in Okazaki fragment maturation. Here, the 3D reconstruction of PCNA in complex with the Okazaki fragment maturation proteins PolB1, LigI and Fen1 is reported.
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Books on the topic "Optics. Image processing. Microscopy Electron microscopy"

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Image formation in low-voltage scanning electron microscopy. Bellingham, Wash: SPIE Optical Engineering Press, 1993.

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Friel, John J. X-ray and image analysis in electron microscopy. Princeton, NJ: Princeton Gamma-Tech, 1995.

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Friel, John J. X-ray and image analysis in electron microscopy. 2nd ed. Rocky Hill, NJ: Princeton Gamma-Tech, 2004.

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Xing, Zhu, and Ohtsu Motoichi, eds. Near-field optics: Principles and applications : the second Asia-Pacific Workshop on Near Field Optics, Beijing, China, October 20-23, 1999. Singapore: World Scientific, 2000.

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Hawkes, P. W. Advances in imaging and electron physics. San Diego: Academic Press, 2008.

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Hawkes, P. W. Advances in imaging and electron physics. San Diego: Academic Press, 2008.

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Hawkes, Peter W. Advances in Electronics and Electron Physics: Image Mathematics and Image Processing (Advances in Imaging and Electron Physics). Academic Press, 1992.

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Hawkes, Peter W. Advances in Imaging and Electron Physics: Aberration-Corrected Microscopy. Elsevier Science & Technology Books, 2008.

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Hawkes, Peter W. Advances in Imaging and Electron Physics, Volume 145 (Advances in Imaging and Electron Physics) (Advances in Imaging and Electron Physics). Academic Press, 2007.

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Hawkes, Peter W. Advances in Imaging and Electron Physics, Volume 145 (Advances in Imaging and Electron Physics) (Advances in Imaging and Electron Physics). Academic Press, 2007.

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Book chapters on the topic "Optics. Image processing. Microscopy Electron microscopy"

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Kornfeld, Jörgen, Fabian Svara, and Adrian A. Wanner. "Image Processing for Volume Electron Microscopy." In Volume Microscopy, 245–62. New York, NY: Springer US, 2020. http://dx.doi.org/10.1007/978-1-0716-0691-9_13.

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Booth, Martin J. "Adaptive Optics in Microscopy." In Optical and Digital Image Processing, 295–322. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2011. http://dx.doi.org/10.1002/9783527635245.ch14.

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Dey, Pranab. "Electron Microscopy: Principle, Components, Optics and Specimen Processing." In Basic and Advanced Laboratory Techniques in Histopathology and Cytology, 253–62. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-8252-8_26.

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Zou, Xiaodong, Thomas E. Weirich, and Sven Hovmöller. "Electron Crystallography-Structure Determination by Combining HREM, Crystallographic Image Processing and Electron Diffraction." In Progress in Transmission Electron Microscopy 1, 191–222. Berlin, Heidelberg: Springer Berlin Heidelberg, 2001. http://dx.doi.org/10.1007/978-3-662-09518-8_6.

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de Jong, A. F. "Image Processing Applied to HRTEM Images of Interfaces." In Evaluation of Advanced Semiconductor Materials by Electron Microscopy, 19–31. Boston, MA: Springer US, 1989. http://dx.doi.org/10.1007/978-1-4613-0527-9_2.

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Miller, G., J. R. Fryer, W. Kunath, and K. Weiss. "The Structure Analysis of an Organo-Azo-Calcium Salt by High Resolution Electron Microscopy and Image Processing." In Electron Crystallography of Organic Molecules, 343–53. Dordrecht: Springer Netherlands, 1991. http://dx.doi.org/10.1007/978-94-011-3278-7_30.

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Green, Dominik J., and R. Holland Cheng. "Transmission Electron Microscopy and Computer-Aided Image Processing for 3D Structural Analysis of Macromolecules." In Biomedical Applications of Biophysics, 155–83. Totowa, NJ: Humana Press, 2010. http://dx.doi.org/10.1007/978-1-60327-233-9_7.

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Sorzano, Carlos Oscar S., Amaya Jiménez-Moreno, David Maluenda, Erney Ramírez-Aportela, Marta Martínez, Ana Cuervo, Robert Melero, et al. "Image Processing in Cryo-Electron Microscopy of Single Particles: The Power of Combining Methods." In Methods in Molecular Biology, 257–89. New York, NY: Springer US, 2021. http://dx.doi.org/10.1007/978-1-0716-1406-8_13.

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Maunsbach, Arvid B., and Björn A. Afzelius. "IMAGE PROCESSING." In Biomedical Electron Microscopy, 477–98. Elsevier, 1999. http://dx.doi.org/10.1016/b978-012480610-8/50021-4.

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SPENCE, JOHN C. H. "IMAGE PROCESSING AND SUPER-RESOLUTION SCHEMES." In High-Resolution Electron Microscopy, 207–36. Oxford University Press, 2008. http://dx.doi.org/10.1093/acprof:oso/9780199552757.003.0007.

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Conference papers on the topic "Optics. Image processing. Microscopy Electron microscopy"

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Acharya, Raj S., Jagath K. Samarabandu, and Ping C. Cheng. "Multidimensional microscopy image processing." In OE/LASE'93: Optics, Electro-Optics, & Laser Applications in Science& Engineering, edited by Gerald E. Cohn. SPIE, 1993. http://dx.doi.org/10.1117/12.146729.

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Eberle, A. L., T. Garbowski, S. Nickell, and D. Zeidler. "Speeding up Chip Layer Imaging with a Multi-Beam SEM." In ISTFA 2019. ASM International, 2019. http://dx.doi.org/10.31399/asm.cp.istfa2019p0283.

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Abstract Reverse engineering of today’s integrated circuits requires proper sample preparation, high speed imaging and data processing capabilities. The electron-optical design and the data handling architecture of our multi-beam scanning electron microscopes are scalable over a large range of beam numbers, providing sufficient imaging speed - also for the foreseeable future. A first step in data processing for reverse engineering on images acquired with a multi-beam scanning electron microscope has been successfully shown in preliminary tests.
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Carreon, Hector. "Ultrasonic Characterization of the Elastic Constants in an Aging Ti-6Al-4V ELI Alloy." In ASME 2019 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 2019. http://dx.doi.org/10.1115/imece2019-10194.

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Abstract In this paper, we report the experimental data of the elastic properties of the young and shear modulus based on the variation in the ultrasonic velocity parameter during the microstructural evolution in a Ti-6Al-4V alloy with two varying microstructures, bimodal and acicular respectively. The two different initial microstructures, were treated thermally by aging at 515°C, 545°C and 575°C at different times from 1 min to 576hr to induce a precipitation process. Ultrasonic measurements of shear and longitudinal wave velocities, scanning electron microscopy (SEM) image processing, optical microscopy (OM) and microhardness were performed, establishing a direct correlation with the measurements of the ultrasonic velocity and the elastic properties developed during the thermal treatment of the artificial aging. The results of the ultrasonic velocity show a very clear trend as the aging time progresses, which is affected by precipitation of Ti3Al particles inside the α phase. In this way, we can know, in a fast and efficient way, the elastic properties developed during the heat treatment of aging at long times, since the presence of these precipitates hardens the material microstructure affecting the final mechanical properties.
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Kumar, Deepak, Harish Bishwakarma, Mohan Kumar, Nirmal Kumar Singh, and Vivek Bajpai. "Tip Induced Growth of Zinc Oxide Nanoflakes Through Electrochemical Discharge Deposition Process and Their Optical Characterization." In ASME 2020 15th International Manufacturing Science and Engineering Conference. American Society of Mechanical Engineers, 2020. http://dx.doi.org/10.1115/msec2020-8283.

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Abstract ZnO nanoflakes with varying thickness (10–120 nm) and width (250–1600 nm) were synthesized on the tooltip (∅ ≤ 200 μm) by a novel route method called electrochemical spark deposition and growth method. The leaf-like nanostructures were found under varying pulsated DC voltage potentials (50–80V) at normal room temperature (25°C). Equimolar concentration (0.1M) of zinc nitrate hexahydrate (Zn(NO3)2.6H2O) and methenamine ((CH2)6N4) HMTA) mixture was used as a growth (precursor) solution. The anodization time (deposition and growth time) was varying from 10 seconds to 25 seconds. Further, the consequence of pulse voltage on the growth morphology was examined critically. The structural evolution and elemental composition were investigated by field emission scanning electron microscopy (FESEM) and energy-dispersive X-ray spectroscopy (EDX) respectively. The size distribution (thickness and width) of ZnO nanoflakes were estimated by image processing software (Image J). Ultimately, the ultraviolet visible infrared spectroscopy (UV-Vis) analysis was carried out to determine the excitation energy of the zinc oxide nanoflakes. The estimated bandgap energy (via. Tauc plot) of the nanoflakes was found approximately 2.63 eV.
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Tutunaru, Oana, and Razvan Pascu. "Image processing technology for scanning electron microscopy." In 2019 International Semiconductor Conference (CAS). IEEE, 2019. http://dx.doi.org/10.1109/smicnd.2019.8924031.

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Wernicke, Guenther K., Jan Hornung, and Hartmut Gruber. "Holographic interferometric microscope with conjugated reconstruction and digital image processing." In OE/LASE'93: Optics, Electro-Optics, & Laser Applications in Science& Engineering, edited by Halina Podbielska. SPIE, 1993. http://dx.doi.org/10.1117/12.155727.

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Ober, Theresa. "Image processing methods for quantitative convergent-beam electron diffraction pattern comparison." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.1089.

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Agarwal, Chirag, and Nivedita Khobragade. "Multi-class segmentation of neuronal electron microscopy images using deep learning." In Image Processing, edited by Elsa D. Angelini and Bennett A. Landman. SPIE, 2018. http://dx.doi.org/10.1117/12.2293940.

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Terui, Yuki. "Image processing for structured illumination microscopy." In 2015 14th Workshop on Information Optics (WIO). IEEE, 2015. http://dx.doi.org/10.1109/wio.2015.7206919.

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Tasdizen, T., R. Whitaker, R. Marc, and B. Jones. "Enhancement of cell boundaries in transmission electron microscopy images." In rnational Conference on Image Processing. IEEE, 2005. http://dx.doi.org/10.1109/icip.2005.1530008.

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