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Relevant bibliographies by topics / Optical surface profilometer

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Academic literature on the topic 'Optical surface profilometer'

Author: Grafiati

Published: 4 June 2021

Last updated: 15 February 2022

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Journal articles on the topic "Optical surface profilometer"

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Melikyan, S. R. "Nonlinear Optical Laser Surface Profilometer." Measurement Techniques 57, no. 12 (March 2015): 1352–55. http://dx.doi.org/10.1007/s11018-015-0633-2.

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Li, Yufeng, and F. E. Talke. "Limitations and Corrections of Optical Profilometry in Surface Characterization of Carbon Coated Magnetic Recording Disks." Journal of Tribology 112, no. 4 (October 1, 1990): 670–77. http://dx.doi.org/10.1115/1.2920314.

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The thickness of a thin absorbing carbon step on a strongly absorbing magnetic layer is measured using contact stylus and noncontact optical profilometer instrumentation, The dependence of optical profilometer measurements on carbon film thickness and optical properties of both the magnetic layer and the carbon film is investigated, and the error in the optical measurement is evaluated as a function of the phase shift of the light reflected from the sample surface. A marked improvement in the accuracy of the step height measurement is obtained if account is taken of the phase shift of the light reflected from the carbon overcoat and the magnetic substrate, respectively. The measurement of surface roughness of thin films on strongly absorbing substrates is discussed and the use of a dual wavelength technique is proposed to enhance the accuracy of optical profilometry.

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Dzierwa, Andrzej. "Importance of light intensity selection in the surface topography measurements using optical profilometer." Mechanik, no. 2 (February 2015): 125/123–125/135. http://dx.doi.org/10.17814/mechanik.2015.2.82.

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Ambrosini, Dario. "Diffractive optical element-based profilometer for surface inspection." Optical Engineering 40, no. 1 (January 1, 2001): 44. http://dx.doi.org/10.1117/1.1331270.

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Duboust, N., H. Ghadbeigi, C. Pinna, S. Ayvar-Soberanis, A. Collis, R. Scaife, and K. Kerrigan. "An optical method for measuring surface roughness of machined carbon fibre-reinforced plastic composites." Journal of Composite Materials 51, no. 3 (July 28, 2016): 289–302. http://dx.doi.org/10.1177/0021998316644849.

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Characterization of the damage induced by machining of fibre-reinforced composites is usually performed by measuring surface roughness. Contact-based surface profilometers are the most used equipment in industry; however, it has been found that there are performance limitations which may result when used to measure machined heterogeneous composite surfaces. In this research, surface roughness is characterised using a commercial non-contact optical method, and compared with a conventional stylus profilometer. Unidirectional and multidirectional carbon fibre laminates were edge trimmed and slot milled. The variation in surface roughness was compared using different tool types, fibre orientations and cutting parameters. Surface damage and cutting mechanisms were assessed by using scanning electron microscope images, and the suitability of roughness parameters were also analysed including: Sa, Skewness and Kurtosis. Using the optical system allowed accurate roughness calculation of individual plies on a multidirectional laminate with different fibre orientations. The research has also shown that the optical system, including the use of areal roughness parameters, can increase the accuracy of roughness measurement for machined fibrous composite surfaces and is less sensitive to measurement position than the stylus.

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Šařec, P., O. Šařec, V. Prosšk, and K. Cížková. "Laser profilometer testing by laboratory measurements ." Research in Agricultural Engineering 53, No. 1 (January 7, 2008): 1–7. http://dx.doi.org/10.17221/2134-rae.

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Measuring soil surface profile has many purposes in the field of agriculture and landscape management. For example, it concerns quantitative evaluation of work quality of soil cultivation implements, and related assessment of soil surface status prior sowing. For this purpose, a prototype of laser profilometer was produced whose key parts are a laser sensor Banner LT3 fixed together with a control section, a converter etc. on a carriage that travels propelled by an electromotor along an aluminum girder. In 20 mm intervals determined by an optical sensor, the laser sensor measures a distance to a soil surface. The aim of the work is to verify some laser sensor properties such as a linearity of measurement, sensitivity to surface color, and furthermore to establish appropriate window limits of laser sensor measurement.

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Gerková, Jana, and Ľuboslav Straka. "Quality Assessment of Machined Surfaces by an Optical Profilometer." Key Engineering Materials 669 (October 2015): 443–50. http://dx.doi.org/10.4028/www.scientific.net/kem.669.443.

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Technological parameters affecting the surface quality of cutting edges in production system with the AWJ technology include cutting head movement speed. The article examines and evaluates the quality of processed surface by the AWJ technology on selected materials as related to the change of cutting head movement speed. It was discovered that the movement speed for the AWJ technology has a significant effect on the surface quality

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Shahpaski, Marjan, Luis Ricardo Sapaico, and Sabine Süsstrunk. "Surface roughness estimation using structured light projection." Electronic Imaging 2021, no. 5 (January 18, 2021): 139–1. http://dx.doi.org/10.2352/issn.2470-1173.2021.5.maap-139.

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How we visually perceive non-emissive objects in our surrounding depends on the interaction of light with the optical characteristics of the materials that comprise them. The macroscopic surface roughness can also influence the appearance through shadowing and interreflections. In this work, we use a structured light scanner to estimate the surface structure of near-planar surfaces, namely of printing textiles. We compare our scans, both qualitatively and quantitatively, to those from a commercial highgrade profilometer based on the confocal principle. We achieve comparable results to the profilometer on samples with moderately complex surfaces. We discuss the possible reasons for errors in the scans of complex surfaces, thus providing guidelines for robust depth estimation. This comparison can help other researchers build more robust acquisition setups by understanding and minimizing the errors inherent to the reconstruction methods.

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Zavadil, Jaromir, Josef Strom Bartunek, and David Fojtik. "Analysis of Periodicities in Surface Topography of Cold rolled sheets Using Data Captured by Camera System." Measurement Science Review 20, no. 3 (June 1, 2020): 145–49. http://dx.doi.org/10.2478/msr-2020-0017.

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AbstractA method for surface analysis of cold rolled sheets is proposed in this paper. The approach is based on a low-cost specially built camera system followed by spectral analysis of the data captured from metal surfaces. The focus is on the changes in the surface topography caused by cold rolling with emphasis towards periodicities in the processed surface. Angular profile of the spectrum is calculated and used to display periodicities in surface topography and show their direction. The results obtained by using the proposed system were compared with results obtained from the optical profilometer MicroProf FRT. The experiments show that cold rolling creates marks on the surface of the material, which represent periodicities that can be effectively detected by the proposed method and camera system. Even though the camera system is not able to measure precise surface roughness, it is able to detect periodicities and the results of spectral analysis are comparable with the results from the optical profilometer.

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WANG Shu-zhen, 王淑珍, 谢铁邦 XIE Tie-bang, and 常素萍 CHANG Su-ping. "Combined profilometer for ultra-precision surface topography." Optics and Precision Engineering 19, no. 4 (2011): 828–35. http://dx.doi.org/10.3788/ope.20111904.0828.

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Dissertations / Theses on the topic "Optical surface profilometer"

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Matthews, H. J. "Applications of image processing in the scanning optical microscope." Thesis, University of Oxford, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.379932.

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Lemaster, Richard L. "Development of an Optical Profilometer and the Related Advanced Signal Processing Methods for Monitoring Surface Quality of Wood Machining Applications." NCSU, 2004. http://www.lib.ncsu.edu/theses/available/etd-09282004-152158/.

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The research described here provides the technology and theory to quantify surface quality for a variety of wood and wood-based products. This technology provides a means of monitoring trends in surface quality which can be used to discriminate between Agood@ products and Abad@ products (the methods described in this research are not intended to provide ?grading? of individual workpieces) as well as provide information to the machine operator as to the source of poor quality machined surfaces. The analysis can be done either on-line at industrial speeds or off-line as a periodic quality control tool. Although the surface quality can be quantifiably measured, the determination of the best feature from the surface profile (root mean square, peak amplitude, average wavelength, frequency content, Joint Time and Frequency Analysis (JTFA) and Wavelet Analysis results, etc.) for the quantification of surface Adefects@ is highly dependent on the application. This research consisted of three broad areas: (1) determination of an optimal hardware configuration for both laboratory and industrial surface scans of wood products, (2) determination of the optimal set of surface descriptors as well as the development of advanced signal processing techniques such as the wavelet transform to accurately describe the quality of a surface as well as provide information to the machine operator on the cause of the loss of surface quality, and (3) development of a software interface to distill the advanced signal processing techniques into a readily obtainable and readable format for the machine operator as well as provide assistance for process decisions.

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Deng, Fuqin, and 鄧輔秦. "Computational surface profilometry and its applications in semiconductor inspection." Thesis, The University of Hong Kong (Pokfulam, Hong Kong), 2014. http://hdl.handle.net/10722/206340.

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Non-contact surface profilometry techniques, especially the phase-measuring profilometry, have been evolved dramatically over recent years. Besides the simple triangulation configuration with a fringe pattern projection system and digital imaging system, efficient computational surface profilometry techniques have also drawn tremendous attention from both academia and a wide range of applications. In the semiconductor industry, high-precision and high-speed, automated optical inspection systems are urgently needed to ensure high quality of semiconductor devices and yield improvement on the production and assembly line. However, by assuming the measured object to be stationary, conventional approaches are not suitable for surface profilometry of moving objects. Moreover, different sources of error such as the low contrast fringe patterns on the measured object, the unevenness in the illumination and the perspective projection effect from the optics will decrease the performance of surface profilometry. To meet these challenges, we have built fringe pattern projection prototypes with projector and camera arrays for surface profilometry of moving objects along the conveyor belt. This design helps to enlarge the field of view with parallel processing. In addition, we have presented an optimization framework to investigate the sources of the error for surface profilometry and generalize various computational surface profilometry approaches under different scenarios. Under this framework, first, we investigate two important factors determining the precision of surface profilometry, namely, the condition number of the phaseshift matrix and the fringe contrast within the images of the projected fringe patterns. Then, a regularized phase-shift algorithm has been proposed to improve the reconstruction results at the low contrast regions such as on the substrate of the semiconductor devices. Second, we study the intensity fluctuation caused by the uneven illumination for surface profilometry of moving objects. After that, an illumination-reflectivity-focus model has been suggested to describe the unevenness and an illumination-invariant phase-shift algorithm has been developed to handle this uneven illumination effect. Third, the perspective projection effect from the optics also affects the accurate phase-shift estimation for a moving object. Therefore, we propose a general polynomial phase-measuring profilometry model to establish the relationship between the phase-shift and height variation for each measured point. Accordingly, a polynomial phase-shift algorithm with error compensation technique has been put forward to improve the performance of the surface profilometry for moving objects. Both simulation and real experiments from the prototype have been conducted to verify the improvement on the performance of the proposed methodologies. Furthermore, these research results have demonstrated the effectiveness and efficiency of the presented optimization framework for investigating the sources of error for surface profilometry. Moreover, the proposed computational surface profilometry techniques and the corresponding fringe pattern projection systems have been used in automated optical inspection systems for yield improvement on the production line in the semiconductor industry.
published_or_final_version
Electrical and Electronic Engineering
Doctoral
Doctor of Philosophy

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Watts, Richard Adrian. "The optical response of metallic diffraction gratings." Thesis, University of Exeter, 1997. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.361343.

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Bilmont, Marsha F. "FURTHER INVESTIGATIONS INTO SURFACE STRUCTURE AND THE BIDIRECTIONAL REFLECTANCE DISTRIBUTION FUNCTION (LIGHT-SCATTER, ROUGHNESS, PROFILOMETRY)." Thesis, The University of Arizona, 1985. http://hdl.handle.net/10150/275398.

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Taudt, Ch, T. Baselt, B. Nelsen, H. Assmann, A. Greiner, E. Koch, and P. Hartmann. "Evaluation of the thermal stability of a low-coherence interferometer for precision surface profilometry." SPIE, 2017. https://tud.qucosa.de/id/qucosa%3A34883.

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Manufacturing of precise structures in MEMS, semiconductors, optics and other fields requires high standards in manufacturing and quality control. Appropriate surface topography measurement technologies should therefore deliver nm accuracy in the axial dimension under typical industrial conditions. This work shows the characterization of a dispersion-encoded low-coherence interferometer for the purpose of fast and robust surface topography measurements. The key component of the interferometer is an element with known dispersion. This dispersive element delivers a controlled phase variation in relation to the surface height variation which can be detected in the spectral domain. A laboratory setup equipped with a broadband light source (200 - 1100 nm) was established. Experiments have been carried out on a silicon-based standard with height steps of 100 nm under different thermal conditions such as 293.15 K and 303.15 K. Additionally, the stability of the setup was studied over periods of 5 hours (with constant temperature) and 15 hours (with linear increasing temperature). The analyzed data showed that a height measurement of 97.99 ± 4:9nm for 293.15 K and of 101.43 ± 3:3nm for 303.15 K was possible. The time-resolved measurements revealed that the developed setup is highly stable against small thermal uctuations and shows a linear behaviour under increasing thermal load. Calibration data for the mathmatical corrections under different thermal conditions was obtained.

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Nakazawa, Takeshi. "THREE-DIMENSIONAL NON-CONTACT SURFACE PROFILERS FOR SEMICONDUCTOR IC PACKAGE INSPECTION." Diss., The University of Arizona, 2011. http://hdl.handle.net/10150/205472.

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The subject of this dissertation is the development of three-dimensional (3D) surface profilers for semiconductor back-end inspection. The value of this study is: 1) to provide a new phase-to-height relationship for Fourier Transform Profilometry (FTP) that is universal as it allows alternate FTP system architectures for a micrometer scale object measurement, and 2) to provide a new method for full field substrate warpage and ball grid array (BGA) coplanarity inspection using machine vision. The desire to increase electronic device performance has resulted in denser and smaller IC packaging. As the dimensions of the devices decrease, the requirements for substrate flatness and surface quality become critical in avoiding device failure. For a high yield production, there is an increasing demand in the requirement for the dimensional verification of height, which requires 3D inspection. Based on the current demands from the semiconductor industry, this dissertation addresses the development of fast in-line surface profilers for large volume IC package inspection. Specifically, this dissertation studies two noncontact surface profilers. The first profiler is based on FTP for measuring the IC package front surface, the silicon die and the epoxy underfill profile. The second profiler is based on stereovision and it is intended for inspecting the BGA coplanarity and the substrate warpage. A geometrical shape based matching algorithm is also developed for finding point correspondences between IC package images. The FTP profiler provides a 1 σRMS error of about 4 μm for an IC package sample in an area of 14 mm x 6.5 mm with a 0.13 second data acquisition time. For evaluating the performance of the stereovision system, the linearity between our system and a confocal microscope is studied by measuring a particular IC sample with an area of 38 mm x 28.5 mm. The correlation coefficient is 0.965 and the 2σdifference in the two methods is 26.9 μm for the warpage measurement. For BGA coplanarity inspection the correlation coefficient is 0.952 and the 2difference is 31.2 μm. Data acquisition takes about 0.2 seconds for full field measurements.

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Lally, Evan M. "Fourier Transform Interferometry for 3D Mapping of Rough and Discontinuous Surfaces." Diss., Virginia Tech, 2010. http://hdl.handle.net/10919/27542.

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Of the wide variety of existing optical techniques for non-contact 3D surface mapping, Fourier Transform Interferometry (FTI) is the method that most elegantly combines simplicity with high speed and high resolution. FTI generates continuous-phase surface maps from a projected optical interference pattern, which is generated with a simple double-pinhole source and collected in a single snapshot using conventional digital camera technology. For enhanced stability and reduced system size, the fringe source can be made from a fiber optic coupler. Unfortunately, many applications require mapping of surfaces that contain challenging features not ideally suited for reconstruction using FTI. Rough and discontinuous surfaces, commonly seen in applications requiring imaging of rock particles, present a unique set of obstacles that cannot be overcome using existing FTI techniques. This work is based on an original analysis of the limitations of FTI and the means in which errors are generated by the particular features encountered in the aggregate mapping application. Several innovative solutions have been developed to enable the use of FTI on rough and discontinuous surfaces. Through filter optimization and development of a novel phase unwrapping and referencing technique, the Method of Multiple References (MoMR), this work has enabled surface error correction and simultaneous imaging of multiple particles using FTI. A complete aggregate profilometry system has been constructed, including a MoMR-FTI software package and graphical user interface, to implement these concepts. The system achieves better than 22Âµm z-axis resolution, and comprehensive testing has proven it capable to handle a wide variety of particle surfaces. A range of additional features have been developed, such as error correction, particle boundary mapping, and automatic data quality windowing, to enhance the usefulness of the system in its intended application. Because of its high accuracy, high speed and ability to map varied particles, the developed system is ideally suited for large-scale aggregate characterization in highway research laboratories. Additionally, the techniques developed in this work are potentially useful in a large number of applications in which surface roughness or discontinuities pose a challenge.
Ph. D.

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MacNevin, David. "THE EFFECTS OF PHOSPHATE AND SILICATE INHIBITORS ON SURFACE ROUGHNESS AND COPPER RELEASE IN WATER DISTRIBUTION SYSTEMS." Doctoral diss., University of Central Florida, 2008. http://digital.library.ucf.edu/cdm/ref/collection/ETD/id/3713.

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The effects of corrosion inhibitors on water quality and the distribution system were studied. This dissertation investigates the effect of inhibitors on iron surface roughness, copper surface roughness, and copper release. Corrosion inhibitors included blended poly/ortho phosphate, sodium orthophosphate, zinc orthophosphate, and sodium silicate. These inhibitors were added to a blend of surface water, groundwater, and desalinated brackish water. Surface roughness of galvanized iron, unlined cast iron, lined cast iron, and polyvinyl chloride was measured using pipe coupons exposed for three months. Roughness of each pipe coupon was measured with an optical surface profiler before and after exposure to inhibitors. For most materials, inhibitor did not have a significant effect on surface roughness; instead, the most significant factor determining the final surface roughness was the initial surface roughness. Coupons with low initial surface roughness tended to have an increase in surface roughness during exposure, and vice versa, implying that surface roughness tended to regress towards an average or equilibrium value. For unlined cast iron, increased alkalinity and increased temperature tended to correspond with increases in surface roughness. Unlined cast iron coupons receiving phosphate inhibitors were more likely to have a significant change in surface roughness, suggesting that phosphate inhibitors affect stability of iron pipe scales. Similar roughness data collected with new copper coupons showed that elevated orthophosphate, alkalinity, and temperature were all factors associated with increased copper surface roughness. The greatest increases in surface roughness were observed with copper coupons receiving phosphate inhibitors. Smaller increases were observed with copper coupons receiving silicate inhibitor or no inhibitor. With phosphate inhibitors, elevated temperature and alkalinity were associated with larger increases in surface roughness and blue-green copper (II) scales.. Otherwise a compact, dull red copper (I) scale was observed. These data suggest that phosphate inhibitor addition corresponds with changes in surface morphology, and surface composition, including the oxidation state of copper solids. The effects of corrosion inhibitors on copper surface chemistry and cuprosolvency were investigated. Most copper scales had X-ray photoelectron spectroscopy binding energies consistent with a mixture of Cu2O, CuO, Cu(OH)2, and other copper (II) salts. Orthophosphate and silica were detected on copper surfaces exposed to each inhibitor. All phosphate and silicate inhibitors reduced copper release relative to the no inhibitor treatments, keeping total copper below the 1.3 mg/L MCLG for all water quality blends. All three kinds of phosphate inhibitors, when added at 1 mg/L as P, corresponded with a 60% reduction in copper release relative to the no inhibitor control. On average, this percent reduction was consistent across varying water quality conditions in all four phases. Similarly when silicate inhibitor was added at 6 mg/L as SiO2, this corresponded with a 25-40% reduction in copper release relative to the no inhibitor control. Hence, on average, for the given inhibitors and doses, phosphate inhibitors provided more predictable control of copper release across changing water quality conditions. A plot of cupric ion concentration versus orthophosphate concentration showed a decrease in copper release consistent with mechanistic control by either cupric phosphate solubility or a diffusion limiting phosphate film. Thermodynamic models were developed to identify feasible controlling solids. For the no inhibitor treatment, Cu(OH)2 provided the closest prediction of copper release. With phosphate inhibitors both Cu(OH)2 and Cu(PO4)·2H2O models provided plausible predictions. Similarly, with silicate inhibitor, the Cu(OH)2 and CuSiO3·H2O models provided plausible predictions.
Ph.D.
Department of Civil and Environmental Engineering
Engineering and Computer Science
Environmental Engineering PhD

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Gorecki, Christophe. "Classification par échantillonnage de la densité spectrale d'énergie : Application à l'étude statistique des surfaces et à l'analyse de particules." Besançon, 1989. http://www.theses.fr/1989BESA2015.

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Etude d'un profilometre optique base sur la defocalisation d'un faisceau de lumiere blanche. Etude de deux dispositifs optonumeriques d'analyse statistique utilisant les techniques de fourier optiques: un analyseur de particules et un dispositif de classement automatique des surfaces non polies

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Books on the topic "Optical surface profilometer"

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R, Severson Gary, United States. Dept. of Energy. Nevada Operations Office, and Geological Survey (U.S.), eds. Optical, noncontact, automated experimental techniqes for three-dimensional reconstruction of object surfaces using projection moire, stereo imaging, and phase-measuring profilometry. Denver, Colo: U.S. Dept. of the Interior, U.S. Geological Survey, 1996.

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Book chapters on the topic "Optical surface profilometer"

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Ennos, A. E. "Measurement of Surface Form by Laser Profilometry." In Optical Metrology, 13–19. Dordrecht: Springer Netherlands, 1987. http://dx.doi.org/10.1007/978-94-009-3609-6_2.

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Fritz, H., and K. Körner. "A New Optical Profilometer for Optical Smooth Surfaces." In Progress in Precision Engineering, 356–57. Berlin, Heidelberg: Springer Berlin Heidelberg, 1991. http://dx.doi.org/10.1007/978-3-642-84494-2_60.

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Dirksen, D., Y. Kozlov, and G. von Bally. "Cuneiform Surface Reconstruction by Optical Profilometry." In Optical Technologies in the Humanities, 257–60. Berlin, Heidelberg: Springer Berlin Heidelberg, 1997. http://dx.doi.org/10.1007/978-3-642-60872-8_38.

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Dai, Rong, Tie Bang Xie, and Su Ping Chang. "A Scanning White-Light Interferometric Profilometer for Smooth and Rough Surface." In Optics Design and Precision Manufacturing Technologies, 364–70. Stafa: Trans Tech Publications Ltd., 2007. http://dx.doi.org/10.4028/0-87849-458-8.364.

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Yang, Xu Dong, Jia Chun Li, and Tie Bang Xie. "A Large Measuring Range Profilometer for Three-Dimensional Surface Topography Measurement." In Optics Design and Precision Manufacturing Technologies, 750–55. Stafa: Trans Tech Publications Ltd., 2007. http://dx.doi.org/10.4028/0-87849-458-8.750.

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Chen, Liang Chia, and Yi Wei Chang. "High Accuracy Confocal Full-Field 3-D Surface Profilometry for Micro Lenses Using a Digital Fringe Projection Strategy." In Optics Design and Precision Manufacturing Technologies, 113–16. Stafa: Trans Tech Publications Ltd., 2007. http://dx.doi.org/10.4028/0-87849-458-8.113.

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Yoshizawa, Toru, and Toshitaka Wakayama. "Surface Profilometry." In Handbook of Optical Metrology. CRC Press, 2009. http://dx.doi.org/10.1201/9781420019513.ch19.

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Yoshizawa, Toru, and Toshitaka Wakayama. "Surface Profilometry." In Handbook of Optical Metrology, 475–515. CRC Press, 2017. http://dx.doi.org/10.1201/b18328-19.

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Kitagawa, Katsuichi. "Film Surface and Thickness Profilometry." In Handbook of Optical Metrology. CRC Press, 2009. http://dx.doi.org/10.1201/9781420019513.ch29.

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Kitagawa, Katsuichi. "Film Surface and Thickness Profilometry." In Handbook of Optical Metrology, 743–68. CRC Press, 2017. http://dx.doi.org/10.1201/b18328-29.

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Conference papers on the topic "Optical surface profilometer"

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Lyakhov, Dmitry, Ivan Kozlov, and Alexander V. Tikhonravov. "Portable Profilometer for Accurate Surface Profile Measurements." In Optical Interference Coatings. Washington, D.C.: OSA, 2016. http://dx.doi.org/10.1364/oic.2016.thb.10.

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Medicus, Kate M., Jessica D. Nelson, and Mike P. Mandina. "Highly accurate surface maps from profilometer measurements." In SPIE Optical Metrology 2013, edited by Peter H. Lehmann, Wolfgang Osten, and Armando Albertazzi. SPIE, 2013. http://dx.doi.org/10.1117/12.2020302.

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Havelková, M., and H. Hiklová. "Several examples of using contact profilometer for optical surface mapping." In 18th Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics, edited by Jan Peřina, Libor Nozka, Miroslav Hrabovský, Dagmar Senderáková, Waclaw Urbańczyk, and Ondrej Haderka. SPIE, 2012. http://dx.doi.org/10.1117/12.2010362.

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Páleníkova, Kateřina, and Miloslav Ohlídal. "Potentialities of optical profilometer MicroProf FRT for surface quality measurement." In SPIE Proceedings, edited by Anton Štrba, Dagmar Senderákova, and Miroslav Hrabovský. SPIE, 2005. http://dx.doi.org/10.1117/12.638927.

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Al-Raweshidy, Hamed S. "Optical measurement for satellite profilometer surface using spread spectrum techniques." In SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, edited by Robert E. Fischer and Warren J. Smith. SPIE, 1994. http://dx.doi.org/10.1117/12.188008.

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Enguita, Jose M., Ignacio Alvarez, Cesar Fraga, Jorge Marina, Yolanda Fernandez, and Gabriel Sirat. "A long standoff profilometer for surface inspection in adverse environments based on conoscopic holography." In Optical Metrology, edited by Wolfgang Osten, Christophe Gorecki, and Erik L. Novak. SPIE, 2005. http://dx.doi.org/10.1117/12.612259.

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Al-Jumaily, G. A., S. R. Wilson, and J. R. McNeil. "Frequency Response Characteristics Of An Optical Scatterometer And A Surface Profilometer." In 30th Annual Technical Symposium, edited by Robert P. Breault. SPIE, 1987. http://dx.doi.org/10.1117/12.939477.

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Bristow, T. C., A. Bouzid, and J. Bietry. "Surface Measurements And Applications For Manufactured Parts Using Noncontact Profilometer." In SPIE International Symposium on Optical Engineering and Industrial Sensing for Advance Manufacturing Technologies, edited by Chander P. Grover. SPIE, 1989. http://dx.doi.org/10.1117/12.947592.

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Asgharifar, Mehdi, Fanrong Kong, Blair Carlson, and Radovan Kovacevic. "Studying Effects of Arc Discharge Surface Texturing on Stress Distribution in Adhesively Bonded Joints by Using Finite Element Modeling." In ASME 2011 International Manufacturing Science and Engineering Conference. ASMEDC, 2011. http://dx.doi.org/10.1115/msec2011-50119.

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This study investigates the potentiality of using atmospheric-pressure Direct Current (DC) plasma arc discharge as a surface treatment method of aluminum alloys in adhesively bonded joints in order to enhance adhesion. The surface morphology exposed to the arc for the current of 40 A (low intensity) and the plasma torch scanning speeds between 20 and 120 mm/s, exhibits a micro-scale surface roughness appropriate for adhesive bonding. The arc textured surfaces are characterized by using an optical profilometer. Additionally, the effect of modified surface on the stress distribution throughout the single-lap adhesively bonded joint in tension is explored by 2D FEM. The geometrical model for FE analysis of adhesively bonded structure is generated by including the surface texture coordinates obtained from the optical profilometer.

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Tyagi, Pawan, Tobias Goulet, Nitt Chuenprateep, Robert Stephenson, Rudolph Knott, Antione Reddick, Devdas Shetty, Justin Schlitzer, Cordell Benton, and Francisco Garcia-Moreno. "Chemical Polishing Based Surface Finishing of 3D Printed Steel Components." In ASME 2018 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 2018. http://dx.doi.org/10.1115/imece2018-88378.

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Reducing surface roughness is critical for improving the mechanical properties of metal 3D printed components. As produced laser sintered metal 3D printed components suffer from high surface roughness. This problem is enormously big for the 3D printed components with intricate geometries involving a large internal surface area. To address this issue, we performed chemical polishing of the 3D printed 316 steel components. After 30 minutes of chemical polishing the color of 3D printed steel components’ surface became dull grey to bright lustrous. According to optical profilometer study, the surface morphology improved dramatically. The Rq roughness parameter changed from ∼8 um to ∼0.6 um. We also applied chemical polishing on cubical metal 3D printed components with internal surfaces. This surface finishing method was equally effective for the internal and external surfaces.

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Reports on the topic "Optical surface profilometer"

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Cardenas-Garcia, J. F., and G. R. Severson. Optical, noncontact, automated experimental techniques for three-dimensional reconstruction of object surfaces using projection moire, stereo imaging, and phase-measuring profilometry. Office of Scientific and Technical Information (OSTI), January 1996. http://dx.doi.org/10.2172/653991.

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