Books on the topic 'Optical measuring systems'

Vezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.

Vezzetti, Carol F. Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

Potzick, James E. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.

Vezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.

Vezzetti, Carol F. Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems. Gaithersburg, Md: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

Vezzetti, Carol F. Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems. Gaithersburg, Md: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

Vezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.

Vezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.

Potzick, James E. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.

Vezzetti, Carol F. Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems. Gaithersburg, Md: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

Vezzetti, Carol F. Antireflecting-Chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, Md: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.

Potzick, James E. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.

Potzick, James E. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.

Potzick, James E. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.

Vezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems: Standard reference materials. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.

Vezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems: Standard reference materials. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.

Dunagan, Stephen E. Catadioptric optics for laser Doppler velocimeter applications. Moffett Field, Calif: National Aeronautics and Space Administration, Ames Research Center, 1989.

Dunagan, Stephen E. Catadioptric optics for laser Doppler velocimeter applications. Moffett Field, Calif: National Aeronautics and Space Administration, Ames Research Center, 1989.

Larson, L. E. System for measuring optical waveguide intensity profiles. Boulder, Colo: U.S. Dept. of Commerce, National Bureau of Standards, 1988.

Cormack, Therese Mc. The potential viability of an ultrasonic measuring system to monitor milk coagulation. Dublin: University College Dublin, 1998.

Handbook of Optical Systems, Survey of Optical Instruments (Gross/Optical Systems V1-V6 special prices until 6V ST published (VCH)). Wiley-VCH, 2008.

United States. National Aeronautics and Space Administration., ed. Advanced optical measuring systems for measuring the properties of fluids and structures. [Washington, D.C.]: National Aeronautics and Space Administration, 1986.

Optical closed-loop propulsion control system development. [Cleveland, Ohio]: National Aeronautics and Space Administration, Lewis Research Center, 1998.

Center, Lewis Research, ed. Optical closed-loop propulsion control system development. [Cleveland, Ohio]: National Aeronautics and Space Administration, Lewis Research Center, 1998.

Center, Lewis Research, ed. Optical closed-loop propulsion control system development. [Cleveland, Ohio]: National Aeronautics and Space Administration, Lewis Research Center, 1998.

Center, Lewis Research, ed. Optical closed-loop propulsion control system development. [Cleveland, Ohio]: National Aeronautics and Space Administration, Lewis Research Center, 1998.

N, Varner Ruth, Potzick James E, and National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.

N, Varner Ruth, Potzick James E, and National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.

Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.

National Institute of Standards and Technology (U.S.), ed. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.

National Institute of Standards and Technology (U.S.), ed. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.

National Institute of Standards and Technology (U.S.), ed. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.

United States. National Aeronautics and Space Administration., ed. Fiber optic probes for laser light scattering: Ground based evaluation for micgrogravity flight experimentation and Integrated coherent imaging fiber optic systems for laser light scattering and other applications. Stony Brook, NY: State University of New York, Dept. of Electrical Engineering, 1994.

N, Varner Ruth, Potzick James E, and National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems: Standard reference materials. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.

N, Varner Ruth, Potzick James E, and National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems: Standard reference materials. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.

N, Varner Ruth, Potzick James E, and National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems: Standard reference materials. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.

N, Varner Ruth, Potzick James E, and National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems: Standard reference materials. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.

N, Varner Ruth, Potzick James E, and National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems: Standard reference materials. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.

N, Varner Ruth, Potzick James E, and National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems: Standard reference materials. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.

R, Severson Gary, United States. Dept. of Energy. Nevada Operations Office, and Geological Survey (U.S.), eds. Optical, noncontact, automated experimental techniqes for three-dimensional reconstruction of object surfaces using projection moire, stereo imaging, and phase-measuring profilometry. Denver, Colo: U.S. Dept. of the Interior, U.S. Geological Survey, 1996.

United States. National Aeronautics and Space Administration., ed. Optical sensors for use in propulsion control systems: Final technical report for grant NAG 3-571 (January 1, 1984 to March 16, 1995). [Washington, DC: National Aeronautics and Space Administration, 1997.

L, Tuma Margaret, and United States. National Aeronautics and Space Administration., eds. Fabry-Perot fiber-optic temperature sensor system. [Washington, D.C: National Aeronautics and Space Administration, 1997.

Two-dimensional high temperature optical strain measurement system. [Washington, D.C.]: National Aeronautics and Space Administration, 1989.

United States. National Aeronautics and Space Administration., ed. Two-dimensional high temperature optical strain measurement system. [Washington, D.C.]: National Aeronautics and Space Administration, 1989.

Steinberg, Aephraim M. Quantum measurements: a modern view for quantum optics experimentalists. Oxford University Press, 2017. http://dx.doi.org/10.1093/oso/9780198768609.003.0007.

F, Fagan William, Europtica-Services I. C, and Society of Photo-optical Instrumentation Engineers., eds. Industrial optoelectronic measurement systems using coherent light. Bellingham, Wash., USA: The Society, 1988.

Center, Lewis Research, ed. Compact simultaneous-beam optical strain measurement system: Phase V. [Cleveland, Ohio]: Lewis Research Center, National Aeronautics and Space Administration, 1994.

Center, Lewis Research, ed. Compact simultaneous-beam optical strain measurement system: Phase V. [Cleveland, Ohio]: Lewis Research Center, National Aeronautics and Space Administration, 1994.

Center, Lewis Research, ed. Compact simultaneous-beam optical strain measurement system: Phase V. [Cleveland, Ohio]: Lewis Research Center, National Aeronautics and Space Administration, 1994.

Theoretical and experimental investigations of sensor location for optimal aeroelastic system state estimation. Edwards, Calif: NASA Dryden Flight Research Center, 1985.