Journal articles on the topic 'Near-field microwave microscopy'
Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles
Consult the top 50 journal articles for your research on the topic 'Near-field microwave microscopy.'
Next to every source in the list of references, there is an 'Add to bibliography' button. Press on it, and we will generate automatically the bibliographic reference to the chosen work in the citation style you need: APA, MLA, Harvard, Chicago, Vancouver, etc.
You can also download the full text of the academic publication as pdf and read online its abstract whenever available in the metadata.
Browse journal articles on a wide variety of disciplines and organise your bibliography correctly.
Knoll, B., F. Keilmann, A. Kramer, and R. Guckenberger. "Contrast of microwave near-field microscopy." Applied Physics Letters 70, no. 20 (May 19, 1997): 2667–69. http://dx.doi.org/10.1063/1.119255.
Full textReznik, A. N., and M. A. Galin. "Wave effects in near-field microwave microscopy." Bulletin of the Russian Academy of Sciences: Physics 78, no. 12 (December 2014): 1367–73. http://dx.doi.org/10.3103/s1062873814120387.
Full textCortés, R., V. Coello, R. Arriaga, and N. Elizondo. "Collection mode near-field scanning microwave microscopy." Optik 125, no. 10 (May 2014): 2400–2404. http://dx.doi.org/10.1016/j.ijleo.2013.10.085.
Full textGao, C., and X. D. Xiang. "Quantitative microwave near-field microscopy of dielectric properties." Review of Scientific Instruments 69, no. 11 (November 1998): 3846–51. http://dx.doi.org/10.1063/1.1149189.
Full textFarina, Marco, Davide Mencarelli, Andrea Di Donato, Giuseppe Venanzoni, and Antonio Morini. "Calibration Protocol for Broadband Near-Field Microwave Microscopy." IEEE Transactions on Microwave Theory and Techniques 59, no. 10 (October 2011): 2769–76. http://dx.doi.org/10.1109/tmtt.2011.2161328.
Full textImtiaz, Atif, Marc Pollak, Steven M. Anlage, John D. Barry, and John Melngailis. "Near-field microwave microscopy on nanometer length scales." Journal of Applied Physics 97, no. 4 (February 15, 2005): 044302. http://dx.doi.org/10.1063/1.1844614.
Full textBelichenko, Viktor, Andrey Zapasnoy, and Aleksandr Mironchev. "Near-Field Interference Microwave Diagnostics of Cultural Plants and Wood Materials." MATEC Web of Conferences 155 (2018): 01021. http://dx.doi.org/10.1051/matecconf/201815501021.
Full textBetzig, E., M. Isaacson, H. Barshatzky, K. Lin, and A. Lewis. "Progress in near-field scanning optical microscopy (NSOM)." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 436–37. http://dx.doi.org/10.1017/s0424820100104248.
Full textGao, Chen, Tao Wei, Fred Duewer, Yalin Lu, and X. D. Xiang. "High spatial resolution quantitative microwave impedance microscopy by a scanning tip microwave near-field microscope." Applied Physics Letters 71, no. 13 (September 29, 1997): 1872–74. http://dx.doi.org/10.1063/1.120444.
Full textBakli, Hind, Kamel Haddadi, and Tuami Lasri. "Interferometric Technique for Scanning Near-Field Microwave Microscopy Applications." IEEE Transactions on Instrumentation and Measurement 63, no. 5 (May 2014): 1281–86. http://dx.doi.org/10.1109/tim.2013.2296416.
Full textZhang, Qinxin, and Paul J. McGinn. "Imaging of oxide dielectrics by near-field microwave microscopy." Journal of the European Ceramic Society 25, no. 4 (April 2005): 407–16. http://dx.doi.org/10.1016/j.jeurceramsoc.2004.02.013.
Full textKantor, R., and I. V. Shvets. "Measurement of electric-field intensities using scanning near-field microwave microscopy." IEEE Transactions on Microwave Theory and Techniques 51, no. 11 (November 2003): 2228–34. http://dx.doi.org/10.1109/tmtt.2003.818938.
Full textChen, Yi-Chun, Yeong-Der Yao, Yun-Shuo Hsieh, Hsiu-Fung Cheng, Chih-Ta Chia, and I.-Nan Lin. "Microwave Dielectric Mechanism Studied by Microwave Near-Field Microscopy and Raman Spectroscopy." Journal of Electroceramics 13, no. 1-3 (July 2004): 281–86. http://dx.doi.org/10.1007/s10832-004-5113-z.
Full textFriedman, Barry, Brian Oetiker, and Kiejin Lee. "A Finite Element Model of Near-Field Scanning Microwave Microscopy." Journal of the Korean Physical Society 52, no. 3 (March 15, 2008): 588–94. http://dx.doi.org/10.3938/jkps.52.588.
Full textRammal, Jamal, Olivier Tantot, Nicolas Delhote, and Serge Verdeyme. "Near-field microwave microscopy for the characterization of dielectric materials." International Journal of Microwave and Wireless Technologies 6, no. 6 (September 2, 2014): 549–54. http://dx.doi.org/10.1017/s175907871400110x.
Full textHaddadi, Kamel, Jaouad Marzouk, Sijia Gu, Steve Arscott, Gilles Dambrine, and Tuami Lasri. "Interferometric Near-field Microwave Microscopy Platform for Electromagnetic Micro-analysis." Procedia Engineering 87 (2014): 388–91. http://dx.doi.org/10.1016/j.proeng.2014.11.733.
Full textWeber, J. C., P. T. Blanchard, A. W. Sanders, A. Imtiaz, T. M. Wallis, K. J. Coakley, K. A. Bertness, P. Kabos, N. A. Sanford, and V. M. Bright. "Gallium nitride nanowire probe for near-field scanning microwave microscopy." Applied Physics Letters 104, no. 2 (January 13, 2014): 023113. http://dx.doi.org/10.1063/1.4861862.
Full textCoakley, K. J., S. Berweger, T. M. Wallis, and P. Kabos. "Disentangling topographic contributions to near-field scanning microwave microscopy images." Ultramicroscopy 197 (February 2019): 53–64. http://dx.doi.org/10.1016/j.ultramic.2018.11.003.
Full textTalanov, Vladimir V., Christopher Del Barga, Lee Wickey, Irakli Kalichava, Edward Gonzales, Eric A. Shaner, Aaron V. Gin, and Nikolai G. Kalugin. "Few-Layer Graphene Characterization by Near-Field Scanning Microwave Microscopy." ACS Nano 4, no. 7 (June 10, 2010): 3831–38. http://dx.doi.org/10.1021/nn100493f.
Full textTselev, Alexander. "Near-Field Microwave Microscopy: Subsurface Imaging for In Situ Characterization." IEEE Microwave Magazine 21, no. 10 (October 2020): 72–86. http://dx.doi.org/10.1109/mmm.2020.3008241.
Full textBerweger, Samuel, T. Mitch Wallis, and Pavel Kabos. "Nanoelectronic Characterization: Using Near-Field Microwave Microscopy for Nanotechnological Research." IEEE Microwave Magazine 21, no. 10 (October 2020): 36–51. http://dx.doi.org/10.1109/mmm.2020.3008305.
Full textChu, Zhaodong, Lu Zheng, and Keji Lai. "Microwave Microscopy and Its Applications." Annual Review of Materials Research 50, no. 1 (July 1, 2020): 105–30. http://dx.doi.org/10.1146/annurev-matsci-081519-011844.
Full textRosner, Björn T., Toralf Bork, Vivek Agrawal, and Daniel W. van der Weide. "Microfabricated silicon coaxial field sensors for near-field scanning optical and microwave microscopy." Sensors and Actuators A: Physical 102, no. 1-2 (December 2002): 185–94. http://dx.doi.org/10.1016/s0924-4247(02)00341-2.
Full textMachida, Tadashi, Marat B. Gaifullin, Shuuichi Ooi, Takuya Kato, Hideaki Sakata, and Kazuto Hirata. "Local Measurement of Microwave Response with Local Tunneling Spectra Using Near Field Microwave Microscopy." Applied Physics Express 2 (February 13, 2009): 025006. http://dx.doi.org/10.1143/apex.2.025006.
Full textKarbassi, A., C. A. Paulson, A. B. Kozyrev, M. Banerjee, Y. Wang, and D. W. van der Weide. "Quadraxial probe for high resolution near-field scanning rf/microwave microscopy." Applied Physics Letters 89, no. 15 (October 9, 2006): 153113. http://dx.doi.org/10.1063/1.2358945.
Full textReznik, Alexander N., and Sergey A. Korolyov. "Monopole antenna in quantitative near-field microwave microscopy of planar structures." Journal of Applied Physics 119, no. 9 (March 7, 2016): 094504. http://dx.doi.org/10.1063/1.4943068.
Full textGu, Sijia, Tianjun Lin, and Tuami Lasri. "Dielectric properties characterization of saline solutions by near-field microwave microscopy." Measurement Science and Technology 28, no. 1 (December 6, 2016): 014014. http://dx.doi.org/10.1088/1361-6501/28/1/014014.
Full textLee, Jonghee, Christian J. Long, Haitao Yang, Xiao-Dong Xiang, and Ichiro Takeuchi. "Atomic resolution imaging at 2.5 GHz using near-field microwave microscopy." Applied Physics Letters 97, no. 18 (November 2010): 183111. http://dx.doi.org/10.1063/1.3514243.
Full textBen Mbarek, Sofiane, Fethi Choubani, and Bernard Cretin. "Investigation of new micromachined coplanar probe for near-field microwave microscopy." Microsystem Technologies 24, no. 7 (February 7, 2018): 2887–93. http://dx.doi.org/10.1007/s00542-018-3766-9.
Full textTselev, Alexander, Nickolay V. Lavrik, Andrei Kolmakov, and Sergei V. Kalinin. "Scanning Near-Field Microwave Microscopy of VO2and Chemical Vapor Deposition Graphene." Advanced Functional Materials 23, no. 20 (April 2, 2013): 2635–45. http://dx.doi.org/10.1002/adfm.201203435.
Full textBerweger, Samuel, Robert Tyrell-Ead, Houchen Chang, Mingzhong Wu, Na Zhu, Hong X. Tang, Hans Nembach, et al. "Imaging of magnetic excitations in nanostructures with near-field microwave microscopy." Journal of Magnetism and Magnetic Materials 546 (March 2022): 168870. http://dx.doi.org/10.1016/j.jmmm.2021.168870.
Full textFeng, Tao, Tian Wen Pang, Wei Qiang Sun, and Sheng Yong Xu. "Microwave Near-Field Detection of the Ion Concentration in Sealed Fluidic Systems." Advanced Materials Research 699 (May 2013): 904–8. http://dx.doi.org/10.4028/www.scientific.net/amr.699.904.
Full textYamasue, Kohei, and Yasuo Cho. "Boxcar Averaging Scanning Nonlinear Dielectric Microscopy." Nanomaterials 12, no. 5 (February 26, 2022): 794. http://dx.doi.org/10.3390/nano12050794.
Full textTakeuchi, I., T. Wei, Fred Duewer, Y. K. Yoo, X. D. Xiang, V. Talyansky, S. P. Pai, G. J. Chen, and T. Venkatesan. "Low temperature scanning-tip microwave near-field microscopy of YBa2Cu3O7−x films." Applied Physics Letters 71, no. 14 (October 6, 1997): 2026–28. http://dx.doi.org/10.1063/1.119776.
Full textUsanov, D. A., A. V. Skripal’, A. V. Abramov, A. S. Bogolyubov, B. N. Korotin, V. B. Feklistov, D. V. Ponomarev, and A. P. Frolov. "Near-field microwave microscopy of nanometer-scale metal layers on dielectric substrates." Semiconductors 46, no. 13 (December 2012): 1622–26. http://dx.doi.org/10.1134/s1063782612130179.
Full textWu, Zhe, Zhiliao Du, Kun Peng, Weiwei Gan, Xianfeng Zhang, Gao Liu, Shan Yang, Jianlong Liu, Yubin Gong, and Baoqing Zeng. "Defect Detection in Graphene Preparation Based on Near-Field Scanning Microwave Microscopy." IEEE Microwave and Wireless Components Letters 30, no. 8 (August 2020): 757–60. http://dx.doi.org/10.1109/lmwc.2020.3006233.
Full textKarbassi, A., D. Ruf, A. D. Bettermann, C. A. Paulson, Daniel W. van der Weide, H. Tanbakuchi, and R. Stancliff. "Quantitative scanning near-field microwave microscopy for thin film dielectric constant measurement." Review of Scientific Instruments 79, no. 9 (2008): 094706. http://dx.doi.org/10.1063/1.2953095.
Full textImtiaz, Atif, Thomas Mitchell Wallis, and Pavel Kabos. "Near-Field Scanning Microwave Microscopy: An Emerging Research Tool for Nanoscale Metrology." IEEE Microwave Magazine 15, no. 1 (January 2014): 52–64. http://dx.doi.org/10.1109/mmm.2013.2288711.
Full textBalusek, Curtis, Barry Friedman, Darwin Luna, Brian Oetiker, Arsen Babajanyan, and Kiejin Lee. "A three-dimensional finite element model of near-field scanning microwave microscopy." Journal of Applied Physics 112, no. 8 (October 15, 2012): 084318. http://dx.doi.org/10.1063/1.4759253.
Full textGu, Sijia, Xin Zhou, Tianjun Lin, Henri Happy, and Tuami Lasri. "Broadband non-contact characterization of epitaxial graphene by near-field microwave microscopy." Nanotechnology 28, no. 33 (July 20, 2017): 335702. http://dx.doi.org/10.1088/1361-6528/aa7a36.
Full textQureshi, Naser, Oleg V. Kolokoltsev, César L. Ordoñez-Romero, and Guillermo López-Maldonado. "An active resonator based on magnetic films for near field microwave microscopy." Journal of Applied Physics 111, no. 7 (April 2012): 07A504. http://dx.doi.org/10.1063/1.3672081.
Full textKantor, R., and I. V. Shvets. "Method of increasing spatial resolution of the scanning near-field microwave microscopy." Journal of Applied Physics 93, no. 9 (May 2003): 4979–85. http://dx.doi.org/10.1063/1.1522486.
Full textHovsepyan, A. B. "Evaluation of local photoconductivity of solar cells by microwave near-field microscopy technique." Journal of Contemporary Physics (Armenian Academy of Sciences) 44, no. 4 (July 2, 2009): 174–77. http://dx.doi.org/10.3103/s1068337209040045.
Full textCoakley, K. J., A. Imtiaz, T. M. Wallis, J. C. Weber, S. Berweger, and P. Kabos. "Adaptive and robust statistical methods for processing near-field scanning microwave microscopy images." Ultramicroscopy 150 (March 2015): 1–9. http://dx.doi.org/10.1016/j.ultramic.2014.11.014.
Full textGalin, M. A., E. V. Demidov, and A. N. Reznik. "Determination of the sheet resistance of semiconductor films via near-field microwave microscopy." Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques 8, no. 3 (May 2014): 477–83. http://dx.doi.org/10.1134/s1027451014030045.
Full textChen, Yi-Chun, Yun-Shuo Hsieh, Hsiu-Fung Cheng, and I.-Nan Lin. "Study of Microwave Dielectric Properties of Perovskite Thin Films by Near-Field Microscopy." Journal of Electroceramics 13, no. 1-3 (July 2004): 261–65. http://dx.doi.org/10.1007/s10832-004-5109-8.
Full textZhang, Xianfeng, Zhe Wu, Quansong Lan, Zhiliao Du, Quanxin Zhou, Ruirui Jiang, Jianlong Liu, Yubin Gong, and Baoqing Zeng. "Improvement of spatial resolution by tilt correction in near-field scanning microwave microscopy." AIP Advances 11, no. 3 (March 1, 2021): 035114. http://dx.doi.org/10.1063/5.0045355.
Full textLann, A. F., M. Abu-Teir, M. Golosovsky, D. Davidov, A. Goldgirsch, and V. Beilin. "Magnetic-field-modulated microwave reflectivity of high- Tc superconductors studied by near-field mm-wave microscopy." Applied Physics Letters 75, no. 12 (September 20, 1999): 1766–68. http://dx.doi.org/10.1063/1.124813.
Full textWang, Yahui, Ziqian Wei, Yujie Chen, Quanxin Zhou, Yubin Gong, Baoqing Zeng, and Zhe Wu. "An approach to determine solution properties in micro pipes by near-field microwave microscopy." Journal of Physics: Condensed Matter 34, no. 5 (November 11, 2021): 054001. http://dx.doi.org/10.1088/1361-648x/ac3308.
Full textKramer, A., F. Keilmann, B. Knoll, and R. Guckenberger. "The coaxial tip as a nano-antenna for scanning near-field microwave transmission microscopy." Micron 27, no. 6 (December 1996): 413–17. http://dx.doi.org/10.1016/s0968-4328(96)00047-9.
Full text