Academic literature on the topic 'Near-field microwave microscopy'
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Journal articles on the topic "Near-field microwave microscopy"
Knoll, B., F. Keilmann, A. Kramer, and R. Guckenberger. "Contrast of microwave near-field microscopy." Applied Physics Letters 70, no. 20 (May 19, 1997): 2667–69. http://dx.doi.org/10.1063/1.119255.
Full textReznik, A. N., and M. A. Galin. "Wave effects in near-field microwave microscopy." Bulletin of the Russian Academy of Sciences: Physics 78, no. 12 (December 2014): 1367–73. http://dx.doi.org/10.3103/s1062873814120387.
Full textCortés, R., V. Coello, R. Arriaga, and N. Elizondo. "Collection mode near-field scanning microwave microscopy." Optik 125, no. 10 (May 2014): 2400–2404. http://dx.doi.org/10.1016/j.ijleo.2013.10.085.
Full textGao, C., and X. D. Xiang. "Quantitative microwave near-field microscopy of dielectric properties." Review of Scientific Instruments 69, no. 11 (November 1998): 3846–51. http://dx.doi.org/10.1063/1.1149189.
Full textFarina, Marco, Davide Mencarelli, Andrea Di Donato, Giuseppe Venanzoni, and Antonio Morini. "Calibration Protocol for Broadband Near-Field Microwave Microscopy." IEEE Transactions on Microwave Theory and Techniques 59, no. 10 (October 2011): 2769–76. http://dx.doi.org/10.1109/tmtt.2011.2161328.
Full textImtiaz, Atif, Marc Pollak, Steven M. Anlage, John D. Barry, and John Melngailis. "Near-field microwave microscopy on nanometer length scales." Journal of Applied Physics 97, no. 4 (February 15, 2005): 044302. http://dx.doi.org/10.1063/1.1844614.
Full textBelichenko, Viktor, Andrey Zapasnoy, and Aleksandr Mironchev. "Near-Field Interference Microwave Diagnostics of Cultural Plants and Wood Materials." MATEC Web of Conferences 155 (2018): 01021. http://dx.doi.org/10.1051/matecconf/201815501021.
Full textBetzig, E., M. Isaacson, H. Barshatzky, K. Lin, and A. Lewis. "Progress in near-field scanning optical microscopy (NSOM)." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 436–37. http://dx.doi.org/10.1017/s0424820100104248.
Full textGao, Chen, Tao Wei, Fred Duewer, Yalin Lu, and X. D. Xiang. "High spatial resolution quantitative microwave impedance microscopy by a scanning tip microwave near-field microscope." Applied Physics Letters 71, no. 13 (September 29, 1997): 1872–74. http://dx.doi.org/10.1063/1.120444.
Full textBakli, Hind, Kamel Haddadi, and Tuami Lasri. "Interferometric Technique for Scanning Near-Field Microwave Microscopy Applications." IEEE Transactions on Instrumentation and Measurement 63, no. 5 (May 2014): 1281–86. http://dx.doi.org/10.1109/tim.2013.2296416.
Full textDissertations / Theses on the topic "Near-field microwave microscopy"
Cordoba, Erazo Maria Fernanda. "Near-field Microwave Microscopy for Surface and Subsurface Characterization of Materials." Scholar Commons, 2015. http://scholarcommons.usf.edu/etd/5930.
Full textGu, Sijia. "Contribution to broadband local characterization of materials by near-field microwave microscopy." Thesis, Lille 1, 2016. http://www.theses.fr/2016LIL10175/document.
Full textNear-field microwave microscopes are emerging instruments for materials characterization. In this work, a home-made near-field microwave microscope is first described and analyzed in terms of resolution performance and frequency band of operation. Then, it is applied to the characterization of a large variety of materials such as metals, semiconductors, dielectrics, liquids and 2D nanomaterials. The system is based on an interferometric technique to improve the measurement sensitivity in the entire frequency range of operation spanning from 2 to 18 GHz. The sensitivity and the different operating modes available (contact, non-contact, liquid environment) allow addressing a large variety of application fields. The instrument allows a sub-wavelength lateral resolution which is more than two orders of magnitude smaller than the operating wavelength, opening the way to a local characterization. The cavity perturbation and transmission line approaches have been used to extract the electromagnetic properties of materials. In particular dielectric properties of saline aqueous solutions and complex impedance of graphene have been investigated in a broad frequency band. It provides a quantitative analysis of material properties in a non-destructive manner to address numerous applications in many scientific fields. Finally, all the results together show that the interferometer-based near-field microwave microscope has the potential to become an important metrology tool for characterizations in micro- and nano-electronics
Schlegel, Jennifer Lynn. "Imaging the spatial variation of dielectric constant in materials using microwave near field microscopy." Available to US Hopkins community, 2003. http://wwwlib.umi.com/dissertations/dlnow/3080759.
Full textRoss, Anthony J. III. "Laser Machining and Near Field Microwave Microscopy of Silver Inks for 3D Printable RF Devices." Scholar Commons, 2017. http://scholarcommons.usf.edu/etd/6944.
Full textHaenssler, Olaf Christian. "Multimodal sensing and imaging technology by integrated scanning electron, force, and near-field microwave microscopy and its application to submicrometer studies." Thesis, Lille, 2018. http://www.theses.fr/2018LIL1I006.
Full textVarious disciplines of micro- and nanotechnology requires combinatorial tools for the investigation, manipulation and transport of materials in the submicrometer range. The coupling of multiple sensing and imaging techniques allows for obtaining complementary and often unique datasets of samples under test. By means of an integrated microscopy technique with different modalities, it is possible to gain multiple information about nanoscale samples by recording at the same time. The expansion with nanorobotics and an open-source software framework, leads to a technology approach for semiconductor research and material science. This work shows the potential of such a multimodal technology approach by focusing on a demonstrator setup. It operates under high-vacuum conditions inside the chamber of a Scanning Electron Microscope and serves as a technology platform by fusing various microscopy modalities, techniques and processes. An Atomic Force Microscope based on a compact, optical interferometer performs imaging of surface topography, and a Scanning Microwave Microscope records electromagnetic properties in the microwave frequency domain, both operating inside an SEM. A software framework controls the instrument. The setup allows for observing with SEM, while imaging and characterizing with interacting evanescent microwaves and intermolecular forces simultaneously. In addition, a multimodal test standard is introduced and subsequently confirms the functionality of the demonstrator. Within this context, the work also includes an electrical analysis of micro-scale MOS capacitors, including an approximation for use in the calibration
Ben, Mbarek Sofiane. "Etude et réalisation d’antennes à concentration de champ pour la génération et la détection locale de champs électromagnétiques." Thesis, Besançon, 2011. http://www.theses.fr/2011BESA2018.
Full textThe objective of this thesis is the development of detectors for near-field microscopy fortwo electromagnetic frequency domains. For microwave domain we present unconventionalmicro-antennas based on coplanar line and point effect. We present the different stages ofthe design and implementation with micro-fabrication technique. The evaluation of theirperformance was obtained with a comparison of measurement results and mapping ofpassive elements and those of a model of finite integration. For the THz domain, we performedroom temperature micro-bolometers. In order to improve the absorption of thesedetectors, their design was based on the theoretical study of the absorption of an electromagneticwave normally incident on a stack of metal and dielectric layers. Two versionswere prepared and characterized using electronic sources that can reach continuous 1,1THz. The performance of these detectors in terms of noise, sensitivity and time responseare highlighted
Imtiaz, Atif. "Quantitative materials contrast at high spatial resolution with a novel near-field scanning microwave microscope." College Park, Md. : University of Maryland, 2005. http://hdl.handle.net/1903/2469.
Full textThesis research directed by: Physics. Title from t.p. of PDF. Includes bibliographical references. Published by UMI Dissertation Services, Ann Arbor, Mich. Also available in paper.
Lin, Tianjun. "Investigation of microwave imaging and local dielectric characterization of materials by using a homemade interferometer-based near-field microwave microscope." Thesis, Lille 1, 2018. http://www.theses.fr/2018LIL1I016/document.
Full textNear-field microwave microscopes, which belong to the local scanning probe microscopes family, are considered today as advanced characterization tools in many applications areas including physics, biology and micro and nanotechnologies. The near-field microwave microscope that is used in the work and described in this manuscript is an instrument developed at IEMN owning a great sensitivity in a wide operating frequency band [2-18 GHz]. The potential of the microscope in terms of applications is demonstrated through the characterization of liquids with different modalities of characterization (probe in contact, non-contact and immersed in a liquid). In particular, this instrument is investigated for dielectric spectroscopy of aqueous glucose solutions.This characterization tool that offers sub-wavelength imaging capability is also tested in different situations (surface and subsurface imaging). Imaging resolution and measurement accuracy are evaluated and easily implementable processing methods are proposed to improve the quality of imaging. Finally, a solution towards a larger compactness of the instrument is investigated through the replacement of the network analyzer by a more compact device (six-port reflectometer type)
Zhang, Qinxin. "Near-field scanning microwave microscopy and its applications in characterization of dielectric materials." 2006. http://etd.nd.edu/ETD-db/theses/available/etd-06272006-163137/.
Full textThesis directed by Paul J. McGinn for the Department of Chemical and Biomolecular Engineering. "June 2006." Includes bibliographical references (leaves 126-138).
Гордиенко, Ю. Е., И. Н. Бондаренко, and Н. И. Слипченко. "Biological objects parameters meter based on microwave microscope with coaxial resonant sensor." Thesis, 2010. http://openarchive.nure.ua/handle/document/6764.
Full textBook chapters on the topic "Near-field microwave microscopy"
Anlage, Steven M., D. E. Steinhauer, B. J. Feenstra, C. P. Vlahacos, and F. C. Wellstood. "Near-Field Microwave Microscopy of Materials Properties." In Microwave Superconductivity, 239–69. Dordrecht: Springer Netherlands, 2001. http://dx.doi.org/10.1007/978-94-010-0450-3_10.
Full textLee, Kiejin, Harutyun Melikyan, Arsen Babajanyan, and Barry Friedman. "Near-Field Microwave Microscopy for Nanoscience and Nanotechnology." In Scanning Probe Microscopy in Nanoscience and Nanotechnology 2, 135–71. Berlin, Heidelberg: Springer Berlin Heidelberg, 2010. http://dx.doi.org/10.1007/978-3-642-10497-8_5.
Full textAnlage, Steven M., A. S. Thanawalla, A. P. Zhuravel’, W. Hu, C. P. Vlahacos, D. E. Steinhauer, S. K. Dutta, and F. C. Wellstood. "Near-Field Scanning Microwave Microscopy of Superconducting Materials and Devices." In Advances in Superconductivity XI, 1079–84. Tokyo: Springer Japan, 1999. http://dx.doi.org/10.1007/978-4-431-66874-9_253.
Full textThomas, Michael E. "Optical Propagation in Water." In Optical Propagation in Linear Media. Oxford University Press, 2006. http://dx.doi.org/10.1093/oso/9780195091618.003.0014.
Full textConference papers on the topic "Near-field microwave microscopy"
Leidenberger, Patrick, and Christian Hafner. "Dielectric slot tip for scanning near-field microwave microscope." In Scanning Microscopy 2010, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2010. http://dx.doi.org/10.1117/12.853727.
Full textGu, Sijia, Kamel Haddadi, and Tuami Lasri. "Near-field microwave microscopy for liquid characterization." In 2014 44th European Microwave Conference (EuMC). IEEE, 2014. http://dx.doi.org/10.1109/eumc.2014.6986512.
Full textUsanov, D. A., and A. V. Skripal. "Near-field microwave microscopy. Capabilities. Application areas." In 2012 19th International Conference on Microwaves, Radar & Wireless Communications (MIKON 2012). IEEE, 2012. http://dx.doi.org/10.1109/mikon.2012.6233532.
Full textTang, Bo, Yang Baoguo, Nian Fushun, and Hu Peijun. "Review of Near-Field Microwave Microscopy Technology." In 2021 IEEE 6th International Conference on Computer and Communication Systems (ICCCS). IEEE, 2021. http://dx.doi.org/10.1109/icccs52626.2021.9449267.
Full textBerweger, Samuel, Paul T. Blanchard, Rebecca C. Quardokus, Frank W. DelRio, T. Mitch Wallis, Pavel Kabos, Sergiy Krylyuk, and Albert V. Davydov. "Near-field microwave microscopy of one-dimensional nanostructures." In 2016 IEEE/MTT-S International Microwave Symposium (IMS). IEEE, 2016. http://dx.doi.org/10.1109/mwsym.2016.7540184.
Full textGu, Sijia, Tianjun Lin, and Tuami Lasri. "Materials characterization by near-field scanning microwave microscopy." In 2016 Progress in Electromagnetic Research Symposium (PIERS). IEEE, 2016. http://dx.doi.org/10.1109/piers.2016.7734685.
Full textBen Mbarek, Sofiane, Fethi Choubani, and Bernard Cretin. "Near-field microwave CPW antenna for scanning microscopy." In 2017 11th European Conference on Antennas and Propagation (EUCAP). IEEE, 2017. http://dx.doi.org/10.23919/eucap.2017.7928768.
Full textFarina, Marco, Andrea Di Donato, Davide Mencarelli, Giuseppe Venanzoni, Antonio Morini, and Tiziana Pietrangelo. "Imaging of biological structures by Near-Field Microwave Microscopy." In 2015 European Microwave Conference (EuMC 2015). IEEE, 2015. http://dx.doi.org/10.1109/eumc.2015.7345851.
Full textBakli, H., K. Haddadi, and T. Lasri. "Interferometric technique for scanning near-field microwave microscopy applications." In 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC). IEEE, 2013. http://dx.doi.org/10.1109/i2mtc.2013.6555703.
Full textHaddadi, Kamel, Petr Polovodov, Didier Theron, and Gilles Dambrine. "Quantitative Error Analysis in Near-Field Scanning Microwave Microscopy." In 2018 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS). IEEE, 2018. http://dx.doi.org/10.1109/marss.2018.8481160.
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