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Journal articles on the topic 'Near-field microscopy'

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Published: 4 June 2021
Last updated: 1 August 2024

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1

Chornii, V. "New materials for luminescent scanning near-field microscopy." Functional materials 20, no. 3 (September 25, 2013): 402–6. http://dx.doi.org/10.15407/fm20.03.402.

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2

Courjon, D., and C. Bainier. "Near field microscopy and near field optics." Reports on Progress in Physics 57, no. 10 (October 1, 1994): 989–1028. http://dx.doi.org/10.1088/0034-4885/57/10/002.

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3

Vobornik, Dušan, and Slavenka Vobornik. "Scanning Near-Field Optical Microscopy." Bosnian Journal of Basic Medical Sciences 8, no. 1 (February 20, 2008): 63–71. http://dx.doi.org/10.17305/bjbms.2008.3000.

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An average human eye can see details down to 0,07 mm in size. The ability to see smaller details of the matter is correlated with the development of the science and the comprehension of the nature. Today’s science needs eyes for the nano-world. Examples are easily found in biology and medical sciences. There is a great need to determine shape, size, chemical composition, molecular structure and dynamic properties of nano-structures. To do this, microscopes with high spatial, spectral and temporal resolution are required. Scanning Near-field Optical Microscopy (SNOM) is a new step in the evolution of microscopy. The conventional, lens-based microscopes have their resolution limited by diffraction. SNOM is not subject to this limitation and can offer up to 70 times better resolution.
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4

Labardi, M., P. G. Gucciardi, and M. Allegrini. "Near-field optical microscopy." La Rivista del Nuovo Cimento 23, no. 4 (April 2000): 1–35. http://dx.doi.org/10.1007/bf03548884.

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5

Anderson, Neil, Achim Hartschuh, and Lukas Novotny. "Near-field Raman microscopy." Materials Today 8, no. 5 (May 2005): 50–54. http://dx.doi.org/10.1016/s1369-7021(05)00846-1.

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6

Gadomsky, O. N., V. S. Gorelik, and A. S. Kadochkin. "Laser near-field microscopy." Journal of Russian Laser Research 27, no. 3 (May 2006): 225–300. http://dx.doi.org/10.1007/s10946-006-0011-2.

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7

Hirsekorn, S., U. Rabe, and W. Arnold. "Near-Field Acoustic Microscopy." Europhysics News 27, no. 3 (1996): 93–96. http://dx.doi.org/10.1051/epn/19962703093.

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8

KAWATA, SATOSHI, TARO ICHIMURA, NORIHIKO HAYAZAWA, YASUSHI INOUYE, and MAMORU HASHIMOTO. "TIP-ENHANCED NEAR-FIELD CARS MICROSCOPY." Journal of Nonlinear Optical Physics & Materials 13, no. 03n04 (December 2004): 593–99. http://dx.doi.org/10.1142/s0218863504002341.

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We apply the field enhancement effect due to plasmon polariton excitation on a metallic nanostructure in order to improve the diffraction limited spatial resolution of coherent anti-Stokes Raman scattering (CARS) microscopy. A cantilever probe tip coated with a 25 nm-thick gold film is utilized as a near-field light source to locally excite the CARS polarizations near the tip. Our CARS microscope has effectively enhanced the CARS signals and realized vibrational imaging of single-wall carbon nanotubes (SWNTs) beyond the spatial resolution of far-field CARS microscopy.
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9

OKAZAKI, Satoshi, and Toshihiko NAGAMURA. "Near-field Scanning Optical Microscopy." Journal of the Japan Society for Precision Engineering 57, no. 7 (1991): 1155–58. http://dx.doi.org/10.2493/jjspe.57.1155.

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10

Vincent, Tom. "Scanning near-field infrared microscopy." Nature Reviews Physics 3, no. 8 (June 1, 2021): 537. http://dx.doi.org/10.1038/s42254-021-00337-y.

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11

Rosner, Björn T., and Daniel W. van der Weide. "High-frequency near-field microscopy." Review of Scientific Instruments 73, no. 7 (July 2002): 2505–25. http://dx.doi.org/10.1063/1.1482150.

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12

Cho, Gyu Cheon, Hou-Tong Chen, Simon Kraatz, Nicholas Karpowicz, and Roland Kersting. "Apertureless terahertz near-field microscopy." Semiconductor Science and Technology 20, no. 7 (June 8, 2005): S286—S292. http://dx.doi.org/10.1088/0268-1242/20/7/020.

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13

Pohl, Dieter, Urs Durig, and Pierre Gueret. "Resolving Near‐Field Microscopy History." Physics Today 48, no. 1 (January 1995): 74–75. http://dx.doi.org/10.1063/1.2807895.

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14

Kazantsev, Dmitry V., Evgenii V. Kuznetsov, Sergei V. Timofeev, Artem V. Shelaev, and Elena A. Kazantseva. "Apertureless near-field optical microscopy." Uspekhi Fizicheskih Nauk 187, no. 03 (May 2016): 277–95. http://dx.doi.org/10.3367/ufnr.2016.05.037817.

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15

AOKI, Hiroyuki. "Scanning Near-Field Optical Microscopy." Kobunshi 55, no. 10 (2006): 831–35. http://dx.doi.org/10.1295/kobunshi.55.831.

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16

van der Valk, N. C. J., and P. C. M. Planken. "Towards terahertz near-field microscopy." Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences 362, no. 1815 (December 17, 2003): 315–21. http://dx.doi.org/10.1098/rsta.2003.1316.

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17

Stein, Benjamin P. "Optical near-field Raman microscopy." Physics Today 56, no. 5 (May 2003): 9. http://dx.doi.org/10.1063/1.4797041.

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18

Keilmann, Fritz. "Vibrational-infrared near-field microscopy." Vibrational Spectroscopy 29, no. 1-2 (July 2002): 109–14. http://dx.doi.org/10.1016/s0924-2031(01)00195-3.

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19

Averbukh, I. Sh, B. M. Chernobrod, O. A. Sedletsky, and Y. Prior. "Coherent near field optical microscopy." Optics Communications 174, no. 1-4 (January 2000): 33–41. http://dx.doi.org/10.1016/s0030-4018(99)00696-3.

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20

Dürig, U., D. W. Pohl, and F. Rohner. "Near‐field optical‐scanning microscopy." Journal of Applied Physics 59, no. 10 (May 15, 1986): 3318–27. http://dx.doi.org/10.1063/1.336848.

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21

Troyon, Michel, David Pastré, Jean Pierre Jouart, and Jean Louis Beaudoin. "Scanning near-field cathodoluminescence microscopy." Ultramicroscopy 75, no. 1 (October 1998): 15–21. http://dx.doi.org/10.1016/s0304-3991(98)00049-7.

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22

Paule, E., and P. Reineker. "Scanning near field exciton microscopy." Journal of Luminescence 83-84 (November 1999): 121–26. http://dx.doi.org/10.1016/s0022-2313(99)00084-8.

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23

Dunn, Robert C. "Near-Field Scanning Optical Microscopy." Chemical Reviews 99, no. 10 (October 1999): 2891–928. http://dx.doi.org/10.1021/cr980130e.

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24

Betzig, E., M. Isaacson, A. Lewis, and K. Lin. "Near-Field Scanning Optical Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 184–87. http://dx.doi.org/10.1017/s0424820100125853.

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The spatial resolution of most of the imaging or microcharacterization methods presently in use are fundamentally limited by the wavelength of the exciting or the emitted radiation being used. In general, the smaller the wavelength of the exciting probe, the greater the structural damage to the sample under study. Thus, the requirements of minimal sample alteration and high spatial resolution seem to be at odds with one another.However, the reason for this wavelength resolution limit is due to the far field methods for producing or detecting the radiation of interest. If one does not use far field optics, but rather the method of near field imaging, the spatial resolution attainable can be much smaller than the wavelength of the radiation used. This method of near field imaging has a general applicability for all wave probes.
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25

Betzig, E., A. Harootunian, M. Isaacson, and A. Lewis. "Near-field scanning optical microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 642–43. http://dx.doi.org/10.1017/s0424820100144644.

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In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.
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26

Buratto, Steven K. "Near-field scanning optical microscopy." Current Opinion in Solid State and Materials Science 1, no. 4 (August 1996): 485–92. http://dx.doi.org/10.1016/s1359-0286(96)80062-3.

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27

Kirstein, Stefan. "Scanning near-field optical microscopy." Current Opinion in Colloid & Interface Science 4, no. 4 (August 1999): 256–64. http://dx.doi.org/10.1016/s1359-0294(99)90005-5.

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28

Hamann, H. F., M. Larbadi, S. Barzen, T. Brown, A. Gallagher, and D. J. Nesbitt. "Extinction near-field optical microscopy." Optics Communications 227, no. 1-3 (November 2003): 1–13. http://dx.doi.org/10.1016/j.optcom.2003.08.039.

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29

Heinzelmann, H., and D. W. Pohl. "Scanning near-field optical microscopy." Applied Physics A Solids and Surfaces 59, no. 2 (August 1994): 89–101. http://dx.doi.org/10.1007/bf00332200.

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30

Safarov, Viatcheslav I., Vladimir A. Kosobukin, Claudine Hermann, Georges Lampel, and Jacques Peretti. "Near-field magneto-optical microscopy." Microscopy Microanalysis Microstructures 5, no. 4-6 (1994): 381–88. http://dx.doi.org/10.1051/mmm:0199400504-6038100.

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31

Kazantsev, D. V., E. V. Kuznetsov, S. V. Timofeev, A. V. Shelaev, and E. A. Kazantseva. "Apertureless near-field optical microscopy." Physics-Uspekhi 60, no. 3 (March 31, 2017): 259–75. http://dx.doi.org/10.3367/ufne.2016.05.037817.

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32

Stopka, M., E. Oesterschulze, J. Schulte, and R. Kassing. "Photothermal scanning near-field microscopy." Materials Science and Engineering: B 24, no. 1-3 (May 1994): 226–28. http://dx.doi.org/10.1016/0921-5107(94)90333-6.

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33

G�nther, P., U. Ch Fischer, and K. Dransfeld. "Scanning near-field acoustic microscopy." Applied Physics B Photophysics and Laser Chemistry 48, no. 1 (January 1989): 89–92. http://dx.doi.org/10.1007/bf00694423.

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34

Palanker, Daniel V., Guido M. H. Knippels, Todd I. Smith, and H. Alan Schwettman. "IR microscopy with a transient photo-induced near-field probe (tipless near-field microscopy)." Optics Communications 148, no. 4-6 (March 1998): 215–20. http://dx.doi.org/10.1016/s0030-4018(97)00702-5.

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35

Barbara, A., T. López-Ríos, and P. Quémerais. "Near-field optical microscopy with a scanning tunneling microscope." Review of Scientific Instruments 76, no. 2 (February 2005): 023704. http://dx.doi.org/10.1063/1.1849028.

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36

Bouhelier, Alexandre. "Field-enhanced scanning near-field optical microscopy." Microscopy Research and Technique 69, no. 7 (2006): 563–79. http://dx.doi.org/10.1002/jemt.20328.

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37

Hwang, J., E. Betzig, and M. Edidin. "Near-field microscopy of membrane domains." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 778–79. http://dx.doi.org/10.1017/s0424820100140269.

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Results from several different methods for probing the lateral organization of cell surface membranes indicate that these membranes are patchy, divided into domains. The data suggest that on average these domains are 0.1-1 μm across and that they persist for 10’s to 1000’s of seconds. At least some domains in this size range, when labeled by fluorescent proteins or lipids ought to be detectable by conventional, far-field, fluorescence microscopy. However, though some images are consistent with a domain structure for membranes, most far-field images of fluorescent cell surfaces lack the detail necessary to define domains.We have used near-field scanning optical microscopy, NSOM, of fluorescent-labeled cells to visualize membrane patchiness on the nanometer scale. This method yields images with resolutions of 50 nm or less. In our near-field microscope the labeled sample is illuminated by a optical fiber probe, with an aperture of 50-80nm. The probe is scanned over the cell surface at a distance of ˜ 10 nm from the surface. Only surface fluorescence is excited by the scanned probe.
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38

Betzig, E., M. Isaacson, H. Barshatzky, K. Lin, and A. Lewis. "Progress in near-field scanning optical microscopy (NSOM)." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 436–37. http://dx.doi.org/10.1017/s0424820100104248.

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The concept of near field scanning optical microscopy was first described more than thirty years ago1 almost two decades before the validity of the technique was verified experimentally for electromagnetic radiation of 3cm wavelength.2 The extension of the method to the visible region of the spectrum took another decade since it required the development of micropositioning and aperture fabrication on a scale five orders of magnitude smaller than that used for the microwave experiments. Since initial reports on near field optical imaging8-6, there has been a growing effort by ourselves6 and other groups7 to extend the technology and develop the near field scanning optical microscope (NSOM) into a useful tool to complement conventional (i.e., far field) scanning optical microscopy (SOM), scanning electron microscopy (SEM) and scanning tunneling microscopy. In the context of this symposium on “Microscopy Without Lenses”, NSOM can be thought of as an addition to the exploding field of scanned tip microscopy although we did not originally conceive it as such.
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39

Peng, Zhaomin, Dehai Zhang, Shuqi Ge, and Jin Meng. "Quantitative Modeling of Near-Field Interactions in Terahertz Near-Field Microscopy." Applied Sciences 13, no. 6 (March 7, 2023): 3400. http://dx.doi.org/10.3390/app13063400.

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Terahertz scattering-scanning near-field optical microscopy (THz s-SNOM), combining the best features of terahertz technology and s-SNOM technology, has shown unique advantages in various applications. Consequently, building a model to characterize near-field interactions and investigate practical issues has become a popular topic in THz s-SNOM research. In this study, a finite element model (FEM) is proposed to quantify the near-field interactions, and to investigate the edge effect and antenna effect in THz s-SNOM. Our results indicate that the proposed model can give us a better understanding of the near-field interactions and direct the parameter design of the probe for THz s-SNOM.
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40

Bouhelier, A., M. R. Beversluis, and L. Novotny. "Applications of field-enhanced near-field optical microscopy." Ultramicroscopy 100, no. 3-4 (August 2004): 413–19. http://dx.doi.org/10.1016/j.ultramic.2003.10.007.

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41

Sáenz, Juan José, and Ricardo García. "Near field emission scanning tunneling microscopy." Applied Physics Letters 65, no. 23 (December 5, 1994): 3022–24. http://dx.doi.org/10.1063/1.112496.

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42

Muramatsu, Hiroshi, Norio Chiba, Katsunori Homma, Kunio Nakajima, Tatsuaki Ataka, Satoko Ohta, Akihiro Kusumi, and Masamichi Fujihira. "Near‐field optical microscopy in liquids." Applied Physics Letters 66, no. 24 (June 12, 1995): 3245–47. http://dx.doi.org/10.1063/1.113392.

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43

Barwick, Brett, David J. Flannigan, and Ahmed H. Zewail. "Photon-induced near-field electron microscopy." Nature 462, no. 7275 (December 2009): 902–6. http://dx.doi.org/10.1038/nature08662.

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44

ITO, Shinzaburo, and Hiroyuki AOKI. "Scanning Near Field Optical Microscopy : SNOM." Journal of The Adhesion Society of Japan 41, no. 5 (2005): 170–76. http://dx.doi.org/10.11618/adhesion.41.170.

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45

Mauser, Nina, and Achim Hartschuh. "Tip-enhanced near-field optical microscopy." Chem. Soc. Rev. 43, no. 4 (2014): 1248–62. http://dx.doi.org/10.1039/c3cs60258c.

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46

Bründermann, Erik, and Martina Havenith. "SNIM: Scanning near-field infrared microscopy." Annual Reports Section "C" (Physical Chemistry) 104 (2008): 235. http://dx.doi.org/10.1039/b703982b.

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47

Knoll, B., F. Keilmann, A. Kramer, and R. Guckenberger. "Contrast of microwave near-field microscopy." Applied Physics Letters 70, no. 20 (May 19, 1997): 2667–69. http://dx.doi.org/10.1063/1.119255.

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48

Keilmann, F. "Scattering-type near-field optical microscopy." Journal of Electron Microscopy 53, no. 2 (April 1, 2004): 187–92. http://dx.doi.org/10.1093/jmicro/53.2.187.

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49

Ozcan, Aydogan, Ertugrul Cubukcu, Alberto Bilenca, Kenneth B. Crozier, Brett E. Bouma, Federico Capasso, and Guillermo J. Tearney. "Differential Near-Field Scanning Optical Microscopy." Nano Letters 6, no. 11 (November 2006): 2609–16. http://dx.doi.org/10.1021/nl062110v.

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50

Fleischer, Monika. "Near-field scanning optical microscopy nanoprobes." Nanotechnology Reviews 1, no. 4 (August 1, 2012): 313–38. http://dx.doi.org/10.1515/ntrev-2012-0027.

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AbstractNear-field scanning optical microscopy (NSOM) is a powerful method for the optical imaging of surfaces with a resolution down to the nanometer scale. By focusing an external electromagnetic field to the subwavelength aperture or apex of a sharp tip, the diffraction limit is avoided and a near-field spot with a size on the order of the aperture or tip diameter can be created. This point light source is used for scanning a sample surface and recording the signal emitted from the small surface area that interacts with the near field of the probe. In tip-enhanced Raman spectroscopy, such a tip configuration can be used as well to record a full spectrum at each image point, from which chemically specific spectral images of the surface can be extracted. In either case, the contrast and resolution of the images depend critically on the properties of the NSOM probe used in the experiment. In this review, an overview of eligible tip properties and different approaches for tailoring specifically engineered NSOM probes is given from a fabrication point of view.
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