Relevant bibliographies by topics / Nanoscale characterisation

Academic literature on the topic 'Nanoscale characterisation'

Author: Grafiati
Published: 10 December 2022
Last updated: 25 May 2024

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Journal articles on the topic "Nanoscale characterisation"

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Saunders, Kate, Ben Buse, Matt R. Kilburn, Stuart Kearns, and Jon Blundy. "Nanoscale characterisation of crystal zoning." Chemical Geology 364 (January 2014): 20–32. http://dx.doi.org/10.1016/j.chemgeo.2013.11.019.

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Gao, Zirui, Mirko Holler, Michal Odstrcil, Andreas Menzel, Manuel Guizar-Sicairos, and Johannes Ihli. "Nanoscale crystal grain characterization via linear polarization X-ray ptychography." Chemical Communications 56, no. 87 (2020): 13373–76. http://dx.doi.org/10.1039/d0cc06101h.

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Mostarac, Deniz, Pedro A. Sánchez, and Sofia Kantorovich. "Correction: Characterisation of the magnetic response of nanoscale magnetic filaments in applied fields." Nanoscale 12, no. 26 (2020): 14298. http://dx.doi.org/10.1039/d0nr90128h.

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Thonke, K., I. Tischer, M. Hocker, M. Schirra, K. Fujan, M. Wiedenmann, R. Schneider, M. Frey, and M. Feneberg. "Nanoscale characterisation of semiconductors by cathodoluminescence." IOP Conference Series: Materials Science and Engineering 55 (March 5, 2014): 012018. http://dx.doi.org/10.1088/1757-899x/55/1/012018.

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Ryu, Meguya, Reo Honda, Adrian Cernescu, Arturas Vailionis, Armandas Balčytis, Jitraporn Vongsvivut, Jing-Liang Li, et al. "Nanoscale optical and structural characterisation of silk." Beilstein Journal of Nanotechnology 10 (April 23, 2019): 922–29. http://dx.doi.org/10.3762/bjnano.10.93.

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The nanoscale composition of silk defining its unique properties via a hierarchial structural anisotropy needs to be analysed at the highest spatial resolution of tens of nanometers corresponding to the size of fibrils made of β-sheets, which are the crystalline building blocks of silk. Nanoscale optical and structural properties of silk have been measured from 100 nm thick longitudinal slices of silk fibers with ca. 10 nm resolution, the highest so far. Optical sub-wavelength resolution in hyperspectral mapping of absorbance and molecular orientation were carried out for comparison at IR wavelengths of 2–10 μm using synchrotron radiation. A reliable distinction of transmission changes by only 1–2% as the anisotropy of amide bands was obtained from nanometer-thin slices of silk.
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Genoud, Sian, Michael W. M. Jones, Benjamin Guy Trist, Junjing Deng, Si Chen, Dominic James Hare, and Kay L. Double. "Simultaneous structural and elemental nano-imaging of human brain tissue." Chemical Science 11, no. 33 (2020): 8919–27. http://dx.doi.org/10.1039/d0sc02844d.

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Han, Fei, Thomas Armstrong, Ana Andres-Arroyo, Danielle Bennett, Alex Soeriyadi, Ali Alinezhad Chamazketi, Padmavathy Bakthavathsalam, Richard D. Tilley, J. Justin Gooding, and Peter J. Reece. "Optical tweezers-based characterisation of gold core–satellite plasmonic nano-assemblies incorporating thermo-responsive polymers." Nanoscale 12, no. 3 (2020): 1680–87. http://dx.doi.org/10.1039/c9nr07891f.

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Sethi, Komal, Shalini Sharma, and Indrajit Roy. "Nanoscale iron carboxylate metal organic frameworks as drug carriers for magnetically aided intracellular delivery." RSC Advances 6, no. 80 (2016): 76861–66. http://dx.doi.org/10.1039/c6ra18480d.

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Rainforth, W. M. "Opportunities and pitfalls in characterisation of nanoscale features." Materials Science and Technology 16, no. 11-12 (November 2000): 1349–55. http://dx.doi.org/10.1179/026708300101507235.

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Brocchi, Eduardo A., Daniela W. Macedo, Guillermo Solórzono, and Francisco J. Moura. "Characterisation of synthesised nickel and cobalt nanoscale oxides." Materials Characterization 63 (January 2012): 70–76. http://dx.doi.org/10.1016/j.matchar.2011.11.002.

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Dissertations / Theses on the topic "Nanoscale characterisation"

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Chang, Zhuo. "Nanoscale characterisation of arterial stiffening." Thesis, University of Liverpool, 2018. http://livrepository.liverpool.ac.uk/3025854/.

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Arterial stiffening as part of the natural ageing process is strongly linked to cardiovascular risk. Although arterial stiffening is routinely measured in vivo, little is known about how localised changes in artery structure and biomechanics contribute to in vivo arterial stiffening. This is mainly due to the limitation of the conventional mechanical testing methods. To circumvent this challenge, a novel nano-scale structural and mechanical characterisation technique, known as PeakForce Quantitative Nanomechanical Mapping (QNM) technique, was developed in a zebrafish model. Using the zebrafish vertebral column, the utility of the PeakForce QNM for probing small-scale biological samples and structures was validated, which paved the way to probe human artery and investigate the localised alterations in artery structure in vitro with arterial stiffening. Human internal mammary artery (IMA) was used as a model vessel for understanding the development of arterial stiffening in this thesis. This thesis focuses on the role of the tunica media and the outmost layer, the tunica adventitia, in arterial stiffening. Using the PeakFoce QNM, the hydrated and dehydrated arterial sections were tested that provided data on nano-scale changes in collagen fibril structure and mechanical properties in the hydrated media, dehydrated media and adventitia and showed how they related to in vivo stiffness measurements in the vascular system. The indentation depth for AFM measurement on the IMA tissues of 5 μm thickness were controlled at 20 nm and 5 nm in liquid and ambient conditions respectively and thus the indentation depth/tissue thickness ratio was 0.4% and 0.1% for the hydrated and dehydrated samples respectively. Furthermore, integrating the findings in this thesis with the proteome analysis data, the localised alterations in the collagen and ultrastructure were explained, and the in vivo arterial stiffening, nanomechanical and structural changes in artery biopsy samples were linked. This approach could be used to develop new diagnostic methods for vascular disease.
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Choi, Fung Sing. "Nanoscale electrical characterisation of nitride structures." Thesis, University of Cambridge, 2018. https://www.repository.cam.ac.uk/handle/1810/283496.

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To fully exploit the potential of gallium nitride (GaN) devices for optoelectronics and power electronic applications, the structures of device need to be investigated and optimized. In particular carrier densities, conductivities and localised charges can have a significant impact to device performances. Electrical scanning probe microscopy techniques, including scanning capacitance microscopy (SCM), conductive atomic force microscopy (C-AFM) and kelvin probe force microscopy (KPFM), were utilized to study the structures of nitride devices such as high electron mobility transistors (HEMTs), light emitting diodes (LEDs) and junction diodes. These results combine with other characterisation techniques to give an enhanced understanding about the nitride structures. Leakage currents are one of the major challenges in HEMTs, especially leakages in buffer layers which deteriorate the breakdown voltage of the devices. To achieve an insulating buffer layer, carbon doping is usually used to compensate the unintentional n-type doping of nitride materials. Here, I show that vertical leakage can originate from the formation of inverted hexagonal pyramidal defects during the low temperature growth of an AlGaN:C strain relief layer. The semi-polar facets of the defects enhanced the oxygen incorporation and led to the formation of leakage pathways which were observed using SCM. Leakage occurring at HEMT surfaces will lead to current collapses of devices. In this work, I discovered nano-cracks on a HEMT surface. C-AFM showed enhanced conductivity along these nano-cracks. A model based on stress relaxation analysis was proposed to explain the drop of surface potential along the nano-cracks. Advances in the quality of epitaxial GaN grown by MOVPE have been facilitated by understanding the formation of defects within the materials and structures. However, hillocks as a specific type of defects have not been intensively studied yet. In this work, three types of hillocks were discovered on GaN p-i-n diodes and a GaN film grown on patterned sapphire substrates. It was found that pits were always present around the centres of hillocks. Multi-microscopy results showed these pits were developed from either an inversion domain or a nano-pipe or a void under the sample surface. Formation of hillocks was usually associated with a change of growth condition, such as an increase in Mg doping or a decrease in growth temperature and gas flows, despite the formation mechanism is still unclear. GaN$_{1-x}$As$_x$ is a highly mismatched alloy semiconductor whose band-gap can be engineered across the whole visible spectrum. For this reason and the potential to achieve high p-type doping, GaN$_{1-x}$As$_x$ is a promising material for optoelectronic applications. However, the growth of GaN$_{1-x}$As$_{x}$ at intermediate As fraction while maintaining a high conductivity and uniformity of the material is still challenging. Two n-GaN/p-GaN$_{1-x}$As$_x$ diodes with different Ga flows were investigated. Both samples demonstrated that highly Mg-doped GaN$_{1-x}$As$_x$ with high As fraction is achievable. However, the samples contained both amorphous and polycrystalline regions. The electrical scanning probe microscopy results suggested the amorphous structure has a lower hole concentration and hence conductivity than the polycrystalline structure. Nevertheless, there is still a lack of understanding about the electrical properties and conduction mechanisms of the GaN$_{1-x}$As$_x$ alloy.
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Sanderson, Lisa. "Nanoscale strain characterisation of modern microelectronic devices." Thesis, University of Newcastle upon Tyne, 2012. http://hdl.handle.net/10443/1541.

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Sources of stress and strain in modern microelectronics can be either beneficial to the electrical performance or detrimental to the mechanical integrity and ultimately lifetime of the device. Strain engineering is commonplace in state-of-the-art device fabrication as a means to boost performance in the face of device scaling limitation. The strain present in the device is directly related to the improvement factor and as such precise measurements and good understanding are of utmost importance due to the many thermal processing steps that can induce or cause relaxation of the strain. Front-end-of-line (FEOL) strain characterisation is becoming increasingly challenging due to the small volumes of material and nanoscale feature sizes being analysed. In this work, an extensive survey of strain characterisation techniques was undertaken. Narrow sSOI stripes were profiled using conventional Raman spectroscopy. Unlike with previous studies, it was shown that it is possible to achieve nanoscale measurements using current techniques. This study was supported by ANSYS FE simulation. The review of the literature briefly investigates the possibility of EBSD as a strain measurement tool. It is possible to calculate not just an absolute strain value as achievable with Raman spectroscopy, but the strain tensor. However, this is a difficult and complex process and not necessary for use in industry. This study proposes the possibility of a more simple method that would provide a good calibration technique to confirm Raman measurements. SERS and TERS are explored in detail as the most promising techniques when dealing with device scaling. Currently, SERS is a destructive technique not suitable for use in a highly cost driven industry such as semiconductor manufacturing. While it theoretically gives improved surface selectivity over conventional Raman spectroscopy, there is no improvement to the xy spatial resolution. With Si and SiGe samples, this study concludes there is also often no surface selectivity with either technique and the mechanisms behind the enhancement are not understood to the point of being able to implement the techniques in a process line. However, where a non-destructive technique is desired, outlined in this study is a method of achieving the SERS effect without sacrificing the sample. Aggressive scaling has forced the dimensions of the interconnecting wires that give the devices functionality to the deep submicron range. Copper, Cu has been introduced as a replacement to the traditionally used aluminium, Al because of its superior electrical and mechanical properties and scalability. However, as these wires begin to approach the dimensions of thin foils, the microtexture of the wires becomes significantly different from their bulk counterparts. This can affect the mechanical integrity of the interconnects and this has an impact on the reliability of the device. Failure mechanisms such as blistering, cracking and peeling caused by stress and strain are not uncommon and traditional methods of characterising residual stress in the thin films is no longer applicable to these narrow wires. The mechanical properties and microtexture of thin copper films annealed at temperatures comparative to those found in device manufacturing were characterised in some detail. EBSD was used to determine the grain size and structure of the films before nanoindentation confirmed properties such as hardness and elastic modulus. These results pave the way for investigation of strain applied along deep-submicron interconnects to lead to further understanding of what causes failure mechanisms from interconnecting wires.
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Tinker-Mill, Claire. "Nanoscale imaging and characterisation of Amyloid-β." Thesis, Lancaster University, 2015. http://eprints.lancs.ac.uk/76451/.

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In this work several novel Scanning Probe Microscopy (SPM) methods have been applied to the study of the amyloid peptide implicated in the pathogenesis of Alzheimer’s disease (AD). Amyloid-β (Aβ) undergoes a hierarchy of aggregation following a structural transition making it an ideal subject of studying with SPM. The application of SPM based techniques to biological samples has become increasingly common place. However, these techniques are not always immediately suitable for imaging delicate samples of proteins and adaptions must be made before imaging can be considered successful. AD is the most common form of dementia worldwide, and a growing concern for health authorities. As a result it has attracted the attention of a wide range of disciplines. There has been much work conducted which combines the main pathogenic peptide, Aβ , with Atomic Force Microscopy (AFM) in order to elucidate more about its aggregation behaviour, however these techniques offer little more than structural comments, with only the most advanced forms of cryo-Electron Microscopy (EM) providing more details on the nanoscale. Presented here is a method for reliably and robustly producing samples of Aβ by capturing them at various stages of aggregation, as well as the results of subsequent imaging by various methods of AFM. Each of the AFM techniques studied provides additional “added value” to the data which can typically be collected by AFM; either nanomechanical, elastic, thermal or spectroscopical. By imaging samples of Aβ with Ultrasonic Force Microscopy, a detailed substructure to the morphology could be seen, which correlates well with the most advanced cryo-EM work. In addition this technique was ideal for detecting the most toxic from of Aβ, early aggregates, in a sensitive and non-destructive fashion robustly differentiating them from the underlying layer of another peptide (poly-L-Lysine) that was designed to reliably capture the Aβ aggregates. Early work investigating the potential for combining an established method of thermal AFM with a mid-IR laser system also shows promise for detecting the response of the protein. It was also the focus of this work to study the aggregation of Aβ using Dynamic Light Scattering (DLS), in order to confirm whether the technique could identify differences between populations throughout the aggregation process. This was applied in conjunction with potential therapeutics which target the early aggregates to prevent their accumulation, as well as block formation of fibrils. Ultimately this work aims to shows with care to the initial protocols used, physical techniques such as AFM and DLS can be added to the existing methods of monitoring aggregation. Synergistic use of these techniques can generate a clearer overall picture of the effect of metal ions/developing therapeutics on Aβ aggregation and provide more detail than classical biological techniques alone.
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Bunker, Matthew. "The nanoscale characterisation of particle interactions and tribology." Thesis, University of Nottingham, 2006. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.438350.

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Shaw, Joseph. "Nanopatterning and nanoscale characterisation of solution-processible electronics." Thesis, Imperial College London, 2014. http://hdl.handle.net/10044/1/24861.

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Solution-processible electronics represent an emerging technology that will revolutionise the field of inexpensive large-area/volume electronics. In this thesis two scanning probe-based methods; scanning thermal lithography (SThL) and conductive atomic force microscopy (CAFM), are used to firstly enhance the patterning resolution of organic semiconductors and secondly improve the electrical characterisation techniques used to study charge transport in solution-processed systems. By combining SThL with suitable organic precursors, on-demand patterning of semiconducting pentacene nanoribbons ~73 nm in width, is demonstrated. By using pentacene nanoribbons as the transistor semiconductor, the first fully functional nanostructured organic transistors via SThL were produced. Using finite element simulations and experimental data, the effects of simultaneously heating the substrate during SThL patterning were assessed. Substrate heating was found to be an economical and simple way to increase SThL 'writing' speed, and hence patterning throughput by ~2,000%. To demonstrate the applicability of SThL beyond direct patterning of electro-active compounds, an organic precursor was used as a positive etch mask for the patterning of various metal films. This approach enabled the patterning of metal electrodes with sub-500 nm resolution highlighting the potential of SThL as a rapid prototyping tool for nanoscale electronics. Finally, the origin of the enhanced electrical conductivity observed in solution-processed transparent electrodes composed of silver nanowires (AgNWs) and a conductive binder was studied using CAFM. Two different solution-processible binder materials; reduced graphene oxide and zinc oxide (ZnO), were employed. By analysing the lateral charge transport in these composite electrode systems, the impact of the binder material on the macroscopic conductivity was assessed. The formation of binder-composed conductive bridges between AgNWs was identified as a key feature responsible for the enhanced conductivity in the composite electrodes. The ZnO-AgNW hybrid had sheet resistance comparable to conventional indium tin oxide electrodes, with the added benefit of low temperature (~200 °C) solution-processing.
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Meli, Maria-Victoria. "The fabrication and characterisation of nanoscale patterns on surfaces /." Thesis, McGill University, 2005. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=85938.

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Nanopatterning is the fabrication of topologically and chemically patterned surfaces, with structural parameters < 100 nm. It is a topic of great interest given the demand in applying nanoscience and nanotechnology in the next generation of electronic and optical devices, and catalysts. To this end, novel bottom-up strategies hold the most promise to this end for creating a great variety of morphologies in a parallel manner.
This Thesis is centered on the development of new methodologies for creating nanopatterned surfaces, and their characterization in light of possible applications. A symmetric, amphiphilic diblock copolymer, polystyrene-b-poly(2-vinylpyridine) was self-assembled at the air-water interface to create an array of surface micelles. The Langmuir-Blodgett technique was used to transfer continuous films of ordered surface micelles to different substrates to be used as a sacrificial mask. Argon ion-milling of the block copolymer-coated substrates resulted in the high-fidelity pattern transfer of the topological features in the case of Au, Si/SiOx, and SiO2 substrates, and the generation of Au island arrays in the case of Si/SiOx, mica and quartz substrates coated with thin (10-20 nm) Au films. The wetting of water on the resulting nanopatterned surfaces was determined to be conformal (Wenzel-type) and the transition to non-conformal (Cassie-type) wetting is described. The extinction of light by the gold island arrays was measured and compared to calculations made using the quasistatic approximation to Mie theory. The response of the localized surface plasmon resonance of these arrays to alkylthiol adsorption and changes in the surrounding medium refractive index was measured and discussed with respect to creating a sensing scheme.
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Davies, A. Michael. "The nanoscale characterisation and modelling of drug particulate interactions." Thesis, University of Nottingham, 2005. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.430511.

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Roberts, Joseph. "Synthesis and characterisation of nanoscale oxides for energy applications." Thesis, University of Liverpool, 2014. http://livrepository.liverpool.ac.uk/2005979/.

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The motivation for this research is the synthesis and characterisation of nanostructured oxide materials for potential applications in renewable energy generation or storage. In particular, the research in this thesis addresses the development of nanostructured oxide materials which could be exploited as photovoltaics and transparent conductive oxides. The exploitation of anodised aluminium oxide (AAO) to fabricate nanostructured semiconductor pn-junctions as the basis photovoltaic devices is investigated. Various microstructures are modelled with the aim of identifying ones with high interface area and consequently high energy conversion efficiencies. Experiments reveal that AAO prepared using an oxalic acid electrolyte could be achieved with a growth rate of 5.7μm/h. The uniformity and size of the hexagonal cross-section pores is influenced by the first-step anodisation time. Atomic layer deposition (ALD) was used to coat commercially available AAO, to synthesise conformal nanotubes or wires. It was observed that the uniformity of the nanostructures breaks down towards the bulk of the AAO, without high exposures, due to the lack of precursor penetration. However, the proposed geometric mass-gain model to understand the process is supported by experimental mass gain measurements and how deposition occurs within the templates. A second materials system based on copper / copper oxide is also explored as a method of synthesising and controlling the formation of nanostructured oxide materials. The surface preparation of the starting copper sheet material was investigated and it was found to be pivotal in the nanoscale morphology achievable with subsequent heat treatment to grow nanowires and porous layers. Thermal growth of CuO and Cu2O on pre- treated copper foils at 500°C exhibited growth of high aspect ratio CuO nanowires. Further studies on the growth process disproved the vapour-liquid-solid and vapour-solid growth mechanisms for the nanowires and showed that tensile strain within the Cu substrate was the driving force behind the nanowire growth. The use of nanometre-scale ALD alumina barrier layers was employed to suppress spallation and preserve the nanowire surfaces. It was found that for samples with alumina layers between ~3 and 15nm the oxide spallation was significantly reduced and that for samples with ~20nm of alumina the diffusion of Cu atoms to the surface was hindered. Photovoltaic measurements were made on electrolytically synthesised Cu2O surfaces coated with ALD TiO2, ZnO and Ga-doped ZnO to form pn-junctions. The samples showed only weakly rectifying behaviour which was attributed to short-circuits between the n-type layers and the back contact. Several of the samples did show some difference in electrical response when under illumination indicating that, at least in some parts of the device, the pn-junction had formed. Lastly the growth and characterisation of ALD Ga-doped ZnO was investigated to determine the optimal doping levels for the growth of highly conductive and transparent oxides, to be used as a front contact for photovoltaic devices. It was found that Ga doping at around 1at% in ZnO produced film with the lowest resistivity. CdTe films were then grown onto substrates coated in 1at% Ga-doped ZnO and subjected to AM1.5 photovoltaic IV testing, yielding photovoltaic cells with conversion efficiencies ~10.8% and fill-factors of ~65%.
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Janko, Marek. "Structure and stability of biological materials – characterisation at the nanoscale." Diss., lmu, 2012. http://nbn-resolving.de/urn:nbn:de:bvb:19-143453.

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Books on the topic "Nanoscale characterisation"

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Alexe, Marin, and Alexei Gruverman, eds. Nanoscale Characterisation of Ferroelectric Materials. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-662-08901-9.

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Tinker-Mill, Claire Louisa. Nanoscale Imaging and Characterisation of Amyloid-β. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-39534-0.

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Alexe, Marin. Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004.

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(Editor), Horst Vehoff, and W. Maser (Editor), eds. Materials Characterisation on the Nanoscale. John Wiley & Sons, 2006.

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Tinker-Mill, Claire Louisa. Nanoscale Imaging and Characterisation of Amyloid-β. Springer International Publishing AG, 2016.

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Tinker-Mill, Claire Louisa. Nanoscale Imaging and Characterisation of Amyloid-β. Springer, 2018.

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Tinker-Mill, Claire Louisa. Nanoscale Imaging and Characterisation of Amyloid-β. Springer London, Limited, 2016.

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Mousa, Mohanad, and Yu Dong. Multiscaled PVA Bionanocomposite Films: Characterisation and Nanoscale Modelling. Springer Singapore Pte. Limited, 2022.

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(Editor), M. Alexe, and A. Gruverman (Editor), eds. Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach (NanoScience and Technology). Springer, 2004.

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Book chapters on the topic "Nanoscale characterisation"

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Alves, Eduardo, and Mark Breese. "Nanoscale Materials Defect Characterisation." In Ion Beams in Nanoscience and Technology, 185–204. Berlin, Heidelberg: Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-642-00623-4_14.

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Tiedke, S., and T. Schmitz. "Electrical Characterization of Nanoscale Ferroelectric Structures." In Nanoscale Characterisation of Ferroelectric Materials, 87–114. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-662-08901-9_3.

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Levy, J., and O. Tikhomirov. "Nanoscale Optical Probes of Ferroelectric Materials." In Nanoscale Characterisation of Ferroelectric Materials, 115–42. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-662-08901-9_4.

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Kalinin, S. V., and D. A. Bonnell. "Electric Scanning Probe Imaging and Modification of Ferroelectric Surfaces." In Nanoscale Characterisation of Ferroelectric Materials, 1–43. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-662-08901-9_1.

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Harnagea, C., and A. Pignolet. "Challenges in the Analysis of the Local Piezoelectric Response." In Nanoscale Characterisation of Ferroelectric Materials, 45–85. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-662-08901-9_2.

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Cho, Y. "Scanning Nonlinear Dielectric Microscopy for Investigation of Ferroelectric Polarization." In Nanoscale Characterisation of Ferroelectric Materials, 143–62. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-662-08901-9_5.

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Nagarajan, V., A. Roytburd, and R. Ramesh. "Nanoscale Piezoelectric Phenomena in Epitaxial PZT Thin Films." In Nanoscale Characterisation of Ferroelectric Materials, 163–91. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-662-08901-9_6.

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Abplanalp, M., M. Zgonik, and P. Günter. "Scanning Probe Microscopy of Ferroelectric Domains near Phase Transitions." In Nanoscale Characterisation of Ferroelectric Materials, 193–220. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-662-08901-9_7.

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Rosenwaks, Y., M. Molotskii, A. Agronin, P. Urenski, M. Shvebelman, and G. Rosenman. "Nanodomain Engineering in Ferroelectric Crystals Using High Voltage Atomic Force Microscopy." In Nanoscale Characterisation of Ferroelectric Materials, 221–65. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-662-08901-9_8.

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Eng, L. M., S. Grafström, C. Loppacher, X. M. Lu, F. Schlaphof, K. Franke, G. Suchaneck, and G. Gerlach. "Nanoinspection of Dielectric and Polarization Properties at Inner and Outer Interfaces in PZT Thin Films." In Nanoscale Characterisation of Ferroelectric Materials, 267–77. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-662-08901-9_9.

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Conference papers on the topic "Nanoscale characterisation"

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Watts, Benjamin. "Nanoscale Materials Characterisation with STXM." In MATSUS Spring 2024 Conference. València: FUNDACIO DE LA COMUNITAT VALENCIANA SCITO, 2023. http://dx.doi.org/10.29363/nanoge.matsus.2024.167.

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RASHID, HAROON, ANTS KOEL, TOOMAS RANG, RETO GÄHWILER, MARTIN GROSBERG, and RAUNO JÕEMAA. "NANOSCALE AND MICROSCALE SIMULATIONS OF N-N JUNCTION HETEROSTRUCTURES OF 3C-4H SILICON CARBIDE." In MATERIALS CHARACTERISATION 2017. Southampton UK: WIT Press, 2017. http://dx.doi.org/10.2495/mc170241.

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Bharthasaradhi, R., and L. C. Nehru. "Preparation and characterisation of nanoscale α-Al2O3 by precipitation method." In NANOFORUM 2014. AIP Publishing LLC, 2015. http://dx.doi.org/10.1063/1.4917782.

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Indalecio, G., N. Seoane, M. Aldegunde, K. Kalna, and A. J. Garcia-Loureiro. "Variability characterisation of nanoscale Si and InGaAs FinFETs at subthreshold." In 2014 5th European Workshop on CMOS Variability (VARI). IEEE, 2014. http://dx.doi.org/10.1109/vari.2014.6957085.

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Eiloart, Kate, David Wacey, and Martin Saunders. "NANOSCALE CHARACTERISATION OF THE 1.9 GA GUNFLINT CHERT MICROFOSSIL ASSEMBLAGE." In GSA Annual Meeting in Seattle, Washington, USA - 2017. Geological Society of America, 2017. http://dx.doi.org/10.1130/abs/2017am-302921.

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"Nanoscale characterisation of broad-spectrum polymyxin antibiotics on live bacteria." In Microscience Microscopy Congress 2023 incorporating EMAG 2023. Royal Microscopical Society, 2023. http://dx.doi.org/10.22443/rms.mmc2023.81.

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Randall, N. X. "Characterisation of the Mechanical Properties of MEMS Devices Using Nanoscale Techniques." In ASME/STLE 2007 International Joint Tribology Conference. ASMEDC, 2007. http://dx.doi.org/10.1115/ijtc2007-44018.

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Abstract:
This presentation will focus on recent developments in the localized characterization of the mechanical properties of Microsystems and MEMS devices and structures. Conventional indentation techniques provide a highly powerful method for measuring the load and depth response of bulk and coated materials, but can also be used to measure the mechanical properties of very small micro-machined silicon structures. Beam structures, such as are used for accelerometers, need to be characterized in terms of the number of cycles to failure, the spring constant or the energy required to bend the beam by a required amount. Such localized testing needs to be adapted to work at various distances from the origin of the beam with a positioning accuracy of less than a micron. Initial studies have proved to be highly repeatable. A variety of examples are presented which cover a range of application areas, including accelerometer beam structures, micro-switches and printer head components. In addition, the localized testing of friction and wear in MEMS devices will be covered with some examples of the technology available and how it may be applied to such small contact areas in an accurate and reproducible way.
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Kaimaki, Domna-Maria, Ben E. Smith, Sorin Vasile Filip, and Colm Durkan. "Characterisation of carbonaceous deposition in oil exposed surfaces at the nanoscale." In 2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO). IEEE, 2016. http://dx.doi.org/10.1109/nano.2016.7751396.

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Enderling, S., H. Lin, J. T. M. Stevenson, A. S. Bunting, and A. J. Walton. "Characterisation of a CMP nanoscale planarisation-based process for RF MEMS resonators." In Smart Materials, Nano- and Micro-Smart Systems, edited by Jung-Chih Chiao, Andrew S. Dzurak, Chennupati Jagadish, and David V. Thiel. SPIE, 2006. http://dx.doi.org/10.1117/12.699116.

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Wang, Xiao, Yiwei Ren, Mo Song, Suaad Alsawafi, and Jie Jin. "Preparation and characterisation of graphene oxide/ carbon nanotubes films." In 2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO). IEEE, 2016. http://dx.doi.org/10.1109/3m-nano.2016.7824980.

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