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Journal articles on the topic 'Nanofocused X-Ray diffraction'

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Published: 25 May 2024

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1

Ren, Zhe, Francesca Mastropietro, Anton Davydok, Simon Langlais, Marie-Ingrid Richard, Jean-Jacques Furter, Olivier Thomas, et al. "Scanning force microscope forin situnanofocused X-ray diffraction studies." Journal of Synchrotron Radiation 21, no. 5 (August 6, 2014): 1128–33. http://dx.doi.org/10.1107/s1600577514014532.

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A compact scanning force microscope has been developed forin situcombination with nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its capabilities are demonstrated on Au nano-islands grown on a sapphire substrate. The newin situdevice allows forin situimaging the sample topography and the crystallinity by recording simultaneously an atomic force microscope (AFM) image and a scanning X-ray diffraction map of the same area. Moreover, a selected Au island can be mechanically deformed using the AFM tip while monitoring the deformation of the atomic lattice by nanofocused X-ray diffraction. Thisin situapproach gives access to the mechanical behavior of nanomaterials.
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2

Hruszkewycz, S. O., M. V. Holt, J. Maser, C. E. Murray, M. J. Highland, C. M. Folkman, and P. H. Fuoss. "Coherent Bragg nanodiffraction at the hard X-ray Nanoprobe beamline." Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences 372, no. 2010 (March 6, 2014): 20130118. http://dx.doi.org/10.1098/rsta.2013.0118.

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Bragg coherent diffraction with nanofocused hard X-ray beams provides unique opportunities for quantitative in situ studies of crystalline structure in nanoscale regions of complex materials and devices by a variety of diffraction-based techniques. In the case of coherent diffraction imaging, a major experimental challenge in using nanoscale coherent beams is maintaining a constant scattering volume such that coherent fringe visibility is maximized and maintained over the course of an exposure lasting several seconds. Here, we present coherent Bragg diffraction patterns measured from different nanostructured thin films at the Sector 26 Nanoprobe beamline at the Advanced Photon Source and demonstrate that with nanoscale positional control, coherent diffraction patterns can be measured with source-limited fringe visibilities more than 50% suitable for imaging by coherent Bragg ptychography techniques.
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3

Nicolas, Jan-David, Tobias Reusch, Markus Osterhoff, Michael Sprung, Florian J. R. Schülein, Hubert J. Krenner, Achim Wixforth, and Tim Salditt. "Time-resolved coherent X-ray diffraction imaging of surface acoustic waves." Journal of Applied Crystallography 47, no. 5 (September 4, 2014): 1596–605. http://dx.doi.org/10.1107/s1600576714016896.

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Time-resolved coherent X-ray diffraction experiments of standing surface acoustic waves, illuminated under grazing incidence by a nanofocused synchrotron beam, are reported. The data have been recorded in stroboscopic mode at controlled and varied phase between the acoustic frequency generator and the synchrotron bunch train. At each time delay (phase angle), the coherent far-field diffraction pattern in the small-angle regime is inverted by an iterative algorithm to yield the local instantaneous surface height profile along the optical axis. The results show that periodic nanoscale dynamics can be imaged at high temporal resolution in the range of 50 ps (pulse length).
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4

Chayanun, Lert, Susanna Hammarberg, Hanna Dierks, Gaute Otnes, Alexander Björling, Magnus T. Borgström, and Jesper Wallentin. "Combining Nanofocused X-Rays with Electrical Measurements at the NanoMAX Beamline." Crystals 9, no. 8 (August 20, 2019): 432. http://dx.doi.org/10.3390/cryst9080432.

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The advent of nanofocused X-ray beams has allowed the study of single nanocrystals and complete nanoscale devices in a nondestructive manner, using techniques such as scanning transmission X-ray microscopy (STXM), X-ray fluorescence (XRF) and X-ray diffraction (XRD). Further insight into semiconductor devices can be achieved by combining these techniques with simultaneous electrical measurements. Here, we present a system for electrical biasing and current measurement of single nanostructure devices, which has been developed for the NanoMAX beamline at the fourth-generation synchrotron, MAX IV, Sweden. The system was tested on single InP nanowire devices. The mechanical stability was sufficient to collect scanning XRD and XRF maps with a 50 nm diameter focus. The dark noise of the current measurement system was about 3 fA, which allowed fly scan measurements of X-ray beam induced current (XBIC) in single nanowire devices.
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5

Zaluzhnyy, Ivan, Ruslan Kurta, Marcus Scheele, Frank Schreiber, Boris Ostrovskii, and Ivan Vartanyants. "Angular X-ray Cross-Correlation Analysis (AXCCA): Basic Concepts and Recent Applications to Soft Matter and Nanomaterials." Materials 12, no. 21 (October 23, 2019): 3464. http://dx.doi.org/10.3390/ma12213464.

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Angular X-ray cross-correlation analysis (AXCCA) is a technique which allows quantitative measurement of the angular anisotropy of X-ray diffraction patterns and provides insights into the orientational order in the system under investigation. This method is based on the evaluation of the angular cross-correlation function of the scattered intensity distribution on a two-dimensional (2D) detector and further averaging over many diffraction patterns for enhancement of the anisotropic signal. Over the last decade, AXCCA was successfully used to study the anisotropy in various soft matter systems, such as solutions of anisotropic particles, liquid crystals, colloidal crystals, superlattices composed by nanoparticles, etc. This review provides an introduction to the technique and gives a survey of the recent experimental work in which AXCCA in combination with micro- or nanofocused X-ray microscopy was used to study the orientational order in various soft matter systems.
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6

Abbey, Brian, Ruben A. Dilanian, Connie Darmanin, Rebecca A. Ryan, Corey T. Putkunz, Andrew V. Martin, David Wood, et al. "X-ray laser–induced electron dynamics observed by femtosecond diffraction from nanocrystals of Buckminsterfullerene." Science Advances 2, no. 9 (September 2016): e1601186. http://dx.doi.org/10.1126/sciadv.1601186.

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X-ray free-electron lasers (XFELs) deliver x-ray pulses with a coherent flux that is approximately eight orders of magnitude greater than that available from a modern third-generation synchrotron source. The power density of an XFEL pulse may be so high that it can modify the electronic properties of a sample on a femtosecond time scale. Exploration of the interaction of intense coherent x-ray pulses and matter is both of intrinsic scientific interest and of critical importance to the interpretation of experiments that probe the structures of materials using high-brightness femtosecond XFEL pulses. We report observations of the diffraction of extremely intense 32-fs nanofocused x-ray pulses by a powder sample of crystalline C60. We find that the diffraction pattern at the highest available incident power significantly differs from the one obtained using either third-generation synchrotron sources or XFEL sources operating at low output power and does not correspond to the diffraction pattern expected from any known phase of crystalline C60. We interpret these data as evidence of a long-range, coherent dynamic electronic distortion that is driven by the interaction of the periodic array of C60 molecular targets with intense x-ray pulses of femtosecond duration.
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7

Bussone, Genziana, Rüdiger Schott, Andreas Biermanns, Anton Davydok, Dirk Reuter, Gerardina Carbone, Tobias U. Schülli, Andreas D. Wieck, and Ullrich Pietsch. "Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams." Journal of Applied Crystallography 46, no. 4 (June 7, 2013): 887–92. http://dx.doi.org/10.1107/s0021889813004226.

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Grazing-incidence X-ray diffraction measurements on single GaAs nanowires (NWs) grown on a (111)-oriented GaAs substrate by molecular beam epitaxy are reported. The positions of the NWs are intentionally determined by a direct implantation of Au with focused ion beams. This controlled arrangement in combination with a nanofocused X-ray beam allows the in-plane lattice parameter of single NWs to be probed, which is not possible for randomly grown NWs. Reciprocal space maps were collected at different heights along the NW to investigate the crystal structure. Simultaneously, substrate areas with different distances from the Au-implantation spots below the NWs were probed. Around the NWs, the data revealed a 0.4% decrease in the lattice spacing in the substrate compared with the expected unstrained value. This suggests the presence of a compressed region due to Au implantation.
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8

Li, Qian, Samuel D. Marks, Sunil Bean, Michael Fisher, Donald A. Walko, Anthony D. DiChiara, Xinzhong Chen, et al. "Simultaneous scanning near-field optical and X-ray diffraction microscopy for correlative nanoscale structure–property characterization." Journal of Synchrotron Radiation 26, no. 5 (August 15, 2019): 1790–96. http://dx.doi.org/10.1107/s1600577519008609.

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A multimodal imaging instrument has been developed that integrates scanning near-field optical microscopy with nanofocused synchrotron X-ray diffraction imaging. The instrument allows for the simultaneous nanoscale characterization of electronic/near-field optical properties of materials together with their crystallographic structure, facilitating the investigation of local structure–property relationships. The design, implementation and operating procedures of this instrument are reported. The scientific capabilities are demonstrated in a proof-of-principle study of the insulator–metal phase transition in samarium sulfide (SmS) single crystals induced by applying mechanical pressure via a scanning tip. The multimodal imaging of an in situ tip-written region shows that the near-field optical reflectivity can be correlated with the heterogeneously transformed structure of the near-surface region of the crystal.
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9

Wallentin, Jesper, Daniel Jacobsson, Markus Osterhoff, Magnus T. Borgström, and Tim Salditt. "Bending and Twisting Lattice Tilt in Strained Core–Shell Nanowires Revealed by Nanofocused X-ray Diffraction." Nano Letters 17, no. 7 (June 21, 2017): 4143–50. http://dx.doi.org/10.1021/acs.nanolett.7b00918.

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10

Marçal, Lucas A. B., Eitan Oksenberg, Dmitry Dzhigaev, Susanna Hammarberg, Amnon Rothman, Alexander Björling, Eva Unger, Anders Mikkelsen, Ernesto Joselevich, and Jesper Wallentin. "In Situ Imaging of Ferroelastic Domain Dynamics in CsPbBr3 Perovskite Nanowires by Nanofocused Scanning X-ray Diffraction." ACS Nano 14, no. 11 (October 19, 2020): 15973–82. http://dx.doi.org/10.1021/acsnano.0c07426.

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11

Wallentin, Jesper, Robin N. Wilke, Markus Osterhoff, and Tim Salditt. "Simultaneous high-resolution scanning Bragg contrast and ptychographic imaging of a single solar cell nanowire." Journal of Applied Crystallography 48, no. 6 (November 10, 2015): 1818–26. http://dx.doi.org/10.1107/s1600576715017975.

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Simultaneous scanning Bragg contrast and small-angle ptychographic imaging of a single solar cell nanowire are demonstrated, using a nanofocused hard X-ray beam and two detectors. The 2.5 µm-long nanowire consists of a single-crystal InP core of 190 nm diameter, coated with amorphous SiO2and polycrystalline indium tin oxide. The nanowire was selected and aligned in real space using the small-angle scattering of the 140 × 210 nm X-ray beam. The orientation of the nanowire, as observed in small-angle scattering, was used to find the correct rotation for the Bragg condition. After alignment in real space and rotation, high-resolution (50 nm step) raster scans were performed to simultaneously measure the distribution of small-angle scattering and Bragg diffraction in the nanowire. Ptychographic reconstruction of the coherent small-angle scattering was used to achieve sub-beam spatial resolution. The small-angle scattering images, which are sensitive to the shape and the electron density of all parts of the nanowire, showed a homogeneous profile along the nanowire axis except at the thicker head region. In contrast, the scanning Bragg diffraction microscopy, which probes only the single-crystal InP core, revealed bending and crystalline inhomogeneity. Both systematic and non-systematic real-space movement of the nanowire were observed as it was rotated, which would have been difficult to reveal only from the Bragg scattering. These results demonstrate the advantages of simultaneously collecting and analyzing the small-angle scattering in Bragg diffraction experiments.
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12

Wang, Wei, Bao Wang, Stan F. S. P. Looijmans, Enrico Carmeli, Martin Rosenthal, Guoming Liu, and Dario Cavallo. "Epitaxy in Polybutene-1 Form II-on-Form I Cross-Nucleation Revealed by Nanofocused X-ray Diffraction on Ad Hoc Morphology." Macromolecules 54, no. 20 (October 6, 2021): 9663–69. http://dx.doi.org/10.1021/acs.macromol.1c01797.

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13

Marçal, Lucas Atila Bernardes, Eitan Oksenberg, Dmitry Dzhigaev, Susanna Hammarberg, Amnon Rothman, Alexander Björling, Eva Unger, Anders Mikkelsen, Ernesto Joselevich, and Jesper Wallentin. "In situ imaging of ferroelastic domain dynamics in CsPbBr3 perovskite nanowires by nanofocused scanning X-ray diffraction." Acta Crystallographica Section A Foundations and Advances 77, a2 (August 14, 2021): C134. http://dx.doi.org/10.1107/s0108767321095477.

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14

Krywka, Christina, Henrike Neubauer, Marius Priebe, Tim Salditt, Jozef Keckes, Adeline Buffet, Stephan Volkher Roth, Ralph Doehrmann, and Martin Mueller. "A two-dimensional waveguide beam for X-ray nanodiffraction." Journal of Applied Crystallography 45, no. 1 (December 13, 2011): 85–92. http://dx.doi.org/10.1107/s0021889811049132.

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The micro- and nanofocus X-ray scattering (MINAXS) beamline of PETRA III is equipped with two consecutively arranged endstations, the last of which is the nanofocus endstation. The first in-beam commissioning of the experimental equipment was successfully performed at the end of 2010, using two-dimensionally confining hard X-ray silicon waveguides with cross sections of 50 nm × 50 µm to 50 nm × 2 µm for nanobeam generation. A full characterization of the waveguide-generated beams was performed, giving values for the beam geometries, the transmission efficiencies of the waveguides and absolute fluxes. Along with these results a detailed description of the setup is presented in this paper. A first high-resolution nanodiffraction experiment on a nanocrystalline TiN hard coating was performed to verify the resolution of the nanodiffraction setup and to reveal the local gradients across the blasted TiN coating. In conclusion, the main concern is the availability of the nanobeam, how it was generated and the fact that a beam out of a two-dimensionally confining waveguide was used for diffraction experiments for the first time.
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15

Odarchenko, Yaroslav, Martin Rosenthal, Jaime J. Hernandez, David Doblas, Emanuela Di Cola, Mikhail Soloviev, and Dimitri A. Ivanov. "Assessing Fast Structure Formation Processes in Isotactic Polypropylene with a Combination of Nanofocus X-ray Diffraction and In Situ Nanocalorimetry." Nanomaterials 11, no. 10 (October 9, 2021): 2652. http://dx.doi.org/10.3390/nano11102652.

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A combination of in situ nanocalorimetry with simultaneous nanofocus 2D Wide-Angle X-ray Scattering (WAXS) was used to study polymorphic behaviour and structure formation in a single micro-drop of isotactic polypropylene (iPP) with defined thermal history. We were able to generate, detect, and characterize a number of different iPP morphologies using our custom-built ultrafast chip-based nanocalorimetry instrument designed for use with the European Synchrotron Radiation Facility (ESRF) high intensity nanofocus X-ray beamline facility. The detected iPP morphologies included monoclinic alpha-phase crystals, mesophase, and mixed morphologies with different mesophase/crystalline compositional ratios. Monoclinic crystals formed from the mesophase became unstable at heating rates above 40 K s−1 and showed melting temperatures as low as ~30 K below those measured for iPP crystals formed by slow cooling. We also studied the real-time melt crystallization of nanogram-sized iPP samples. Our analysis revealed a mesophase nucleation time of around 1 s and the co-existence of mesophase and growing disordered crystals at high supercooling ≤328 K. The further increase of the iPP crystallization temperature to 338 K changed nucleation from homogeneous to heterogeneous. No mesophase was detected above 348 K. Low supercooling (≥378 K) led to the continuous growth of the alpha-phase crystals. In conclusion, we have, for the first time, measured the mesophase nucleation time of supercooled iPP melted under isothermal crystallization conditions using a dedicated experimental setup designed to allow simultaneous ultrafast chip-based nanocalorimetry and nanofocus X-ray diffraction analyses. We also provided experimental evidence that upon heating, the mesophase converts directly into thermodynamically stable monoclinic alpha-phase crystals via perfection and reorganization and not via partial melting. The complex phase behaviour of iPP and its dependence on both crystallization temperature and time is presented here using a time–temperature–transformation (TTT) diagram.
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16

Schaber, Clemens F., Silja Flenner, Anja Glisovic, Igor Krasnov, Martin Rosenthal, Hergen Stieglitz, Christina Krywka, Manfred Burghammer, Martin Müller, and Stanislav N. Gorb. "Hierarchical architecture of spider attachment setae reconstructed from scanning nanofocus X-ray diffraction data." Journal of The Royal Society Interface 16, no. 150 (January 2019): 20180692. http://dx.doi.org/10.1098/rsif.2018.0692.

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When sitting and walking, the feet of wandering spiders reversibly attach to many surfaces without the use of gluey secretions. Responsible for the spiders' dry adhesion are the hairy attachment pads that are built of specially shaped cuticular hairs (setae) equipped with approximately 1 µm wide and 20 nm thick plate-like contact elements (spatulae) facing the substrate. Using synchrotron-based scanning nanofocus X-ray diffraction methods, combining wide-angle X-ray diffraction/scattering and small-angle X-ray scattering, allowed substantial quantitative information to be gained about the structure and materials of these fibrous adhesive structures with 200 nm resolution. The fibre diffraction patterns showed the crystalline chitin chains oriented along the long axis of the attachment setae and increased intensity of the chitin signal dorsally within the seta shaft. The small-angle scattering signals clearly indicated an angular shift by approximately 80° of the microtrich structures that branch off the bulk hair shaft and end as the adhesive contact elements in the tip region of the seta. The results reveal the specific structural arrangement and distribution of the chitin fibres within the attachment hair's cuticle preventing material failure by tensile reinforcement and proper distribution of stresses that arise upon attachment and detachment.
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17

Анохин, Д. В., К. Н. Графская, Д. А. Иванов, Е. М. Иванькова, В. А. Марихин, Л. П. Мясникова, and С. С. Иванчев. "Локализация моноклинной фазы в насцентных частицах сверхвысокомолекулярного полиэтилена." Физика твердого тела 62, no. 8 (2020): 1326. http://dx.doi.org/10.21883/ftt.2020.08.49622.066.

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Annotation The X-ray analysis of a virgin particle taken directly from the synthesis products of an ultra-high molecular weight polyethylene (UHMWPE) and not subjected to any external stresses was carried out using nanofocus beamline ID13 European Synchrotron Radiation Facility (ESRF, Grenoble,France). In the X-ray diffraction curves obtained by scanning an arbitrarily selected portion of a particle with a size of (100 x 20) μm2 by a microbeam (0.3 x 0.3) μm2 with a step of 2 μm horizontally and 0.5 μm vertically, along with reflections from the orthorhombic phase, reflexes from the metastable monoclinic phase were observed. It is believed that the cause of its occurrence may be stresses that develop during specific structure formation in slurry synthesis and persist when cooled to room temperature and the solvent evaporates. The possibility of localization of the monoclinic phase in various morphological formations is discussed.
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18

Krause, Thilo, Michael Hanke, Zongzhe Cheng, Michael Niehle, Achim Trampert, Martin Rosenthal, Manfred Burghammer, et al. "Nanofocus x-ray diffraction and cathodoluminescence investigations into individual core–shell (In,Ga)N/GaN rod light-emitting diodes." Nanotechnology 27, no. 32 (June 29, 2016): 325707. http://dx.doi.org/10.1088/0957-4484/27/32/325707.

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19

Melniko, A., A. Rodygin, K. Grafskaya, D. Anokhin, and D. Ivanov. "High temporal resolution nanocalorimetry and its combination with micro- and nanofocus x-ray diffraction for study of functional nanostructured materials." Nanoindustry Russia 70, no. 8 (2016): 60–66. http://dx.doi.org/10.22184/1993-8578.2016.70.8.60.66.

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20

Dubslaff, M., M. Hanke, M. Burghammer, S. Schöder, R. Hoppe, C. G. Schroer, Yu I. Mazur, Zh M. Wang, J. H. Lee, and G. J. Salamo. "In(Ga)As/GaAs(001) quantum dot molecules probed by nanofocus high resolution x-ray diffraction with 100 nm resolution." Applied Physics Letters 98, no. 21 (May 23, 2011): 213105. http://dx.doi.org/10.1063/1.3593960.

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21

Melnikov, A. P., M. Rosenthal, M. Burghammer, D. V. Anokhin, and D. A. Ivanov. "Study of melting processes in semicrystalline polymers using a combination of ultrafast chip calorimetry and nanofocus synchrotron X-ray diffraction." Nanotechnologies in Russia 11, no. 5-6 (May 2016): 305–11. http://dx.doi.org/10.1134/s1995078016030113.

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22

Schroer, C. G., P. Boye, J. M. Feldkamp, J. Patommel, A. Schropp, A. Schwab, S. Stephan, M. Burghammer, S. Schöder, and C. Riekel. "Coherent X-Ray Diffraction Imaging with Nanofocused Illumination." Physical Review Letters 101, no. 9 (August 29, 2008). http://dx.doi.org/10.1103/physrevlett.101.090801.

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23

Cornelius, Thomas W., Zhe Ren, Francesca Mastropietro, Simon Langlais, Anton Davydok, Marie-Ingrid Richard, Maxime Dupraz, et al. "In situ coupling of atomic force microscopy and sub-micrometer focused X-ray techniques." MRS Proceedings 1712 (2014). http://dx.doi.org/10.1557/opl.2014.909.

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ABSTRACTA scanning force microscope for in situ nanofocused X-ray studies (SFINX) has been developed which can be installed on diffractometers at synchrotron beamlines allowing for the combination with various techniques such as coherent X-ray diffraction and fluorescence. The capabilities of this device are demonstrated on Cu nanowires and on Au islands grown on sapphire (0001). The sample topography, crystallinity, and elemental distribution of the same area are investigated by recording simultaneously an AFM image, a scanning X-ray diffraction map, and a fluorescence map. Additionally, the mechanical response of Au islands is studied by in situ indentation tests employing the AFM-tip and recording 2D X-ray diffraction patterns during mechanical loading.
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Frisch, Marvin L., Longfei Wu, Clément Atlan, Zhe Ren, Madeleine Han, Rémi Tucoulou, Liang Liang, et al. "Unraveling the synergistic effects of Cu-Ag tandem catalysts during electrochemical CO2 reduction using nanofocused X-ray probes." Nature Communications 14, no. 1 (November 29, 2023). http://dx.doi.org/10.1038/s41467-023-43693-2.

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AbstractControlling the selectivity of the electrocatalytic reduction of carbon dioxide into value-added chemicals continues to be a major challenge. Bulk and surface lattice strain in nanostructured electrocatalysts affect catalytic activity and selectivity. Here, we unravel the complex dynamics of synergistic lattice strain and stability effects of Cu-Ag tandem catalysts through a previously unexplored combination of in situ nanofocused X-ray absorption spectroscopy and Bragg coherent diffraction imaging. Three-dimensional strain maps reveal the lattice dynamics inside individual nanoparticles as a function of applied potential and product yields. Dynamic relations between strain, redox state, catalytic activity and selectivity are derived. Moderate Ag contents effectively reduce the competing evolution of H2 and, concomitantly, lead to an enhanced corrosion stability. Findings from this study evidence the power of advanced nanofocused spectroscopy techniques to provide new insights into the chemistry and structure of nanostructured catalysts.
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Bernardes Marçal, Lucas Atila, Nils Lamers, Susanna Hammarberg, Zhaojun Zhang, Huaiyu Chen, Dmitry Dzhigaev, Miguel Gomez-Gonzalez, et al. "Structural and chemical properties of anion exchanged CsPb(Br(1-x)Clx)3 heterostructured perovskite nanowires imaged by nanofocused x-rays." Nanotechnology, March 19, 2024. http://dx.doi.org/10.1088/1361-6528/ad355c.

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Abstract Over the last years metal halide perovskites have demonstrated remarkable potential for integration in light emitting devices. Heterostructures allow for tunable bandgap depending on the local anion composition, crucial for optoelectronic devices, but local structural effects of anion exchange in single crystals is not fully understood. Here, we investigate how the anion exchange of CsPbBr3 nanowires fully and locally exposed to HCl vapor affects the local crystal structure, using nanofocused x-rays. We study the nanoscale composition and crystal structure as function of HCl exposure time and demonstrate the correlation of anion exchange with changes in the lattice parameter. The local composition was measured by x-ray fluorescence and x-ray diffraction, with general agreement of both methods but with much less variation using latter. The heterostructured nanowires exhibit unintentional gradients in composition, both axially and radially. Ferroelastic domains are observed for all HCl exposure times, and the magnitude of the lattice tilt decreases for higher Cl concentrations.
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Ricci, A., N. Poccia, G. Campi, B. Joseph, G. Arrighetti, L. Barba, M. Reynolds, et al. "Nanoscale phase separation in the iron chalcogenide superconductor K0.8Fe1.6Se2as seen via scanning nanofocused x-ray diffraction." Physical Review B 84, no. 6 (August 23, 2011). http://dx.doi.org/10.1103/physrevb.84.060511.

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27

Krause, Thilo, Michael Hanke, Lars Nicolai, Zongzhe Cheng, Michael Niehle, Achim Trampert, Maik Kahnt, et al. "Structure and Composition of Isolated Core-Shell(In,Ga)N/GaNRods Based on Nanofocus X-Ray Diffraction and Scanning Transmission Electron Microscopy." Physical Review Applied 7, no. 2 (February 28, 2017). http://dx.doi.org/10.1103/physrevapplied.7.024033.

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28

Zayonchkovskiy, Vyacheslav S., Irina A. Antoshina, Kyaw Kyaw Aung, Evgenij I. Isaev, and Igor’ M. Milyaev. "Рентгенодифракционное исследование тонких металлических пленок с магнитными слоями сплава Fe-Cr-Co." Kondensirovannye sredy i mezhfaznye granitsy = Condensed Matter and Interphases 22, no. 1 (March 20, 2020). http://dx.doi.org/10.17308/kcmf.2020.22/2529.

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Цель статьи – определение фазового состава структур пленочных постоянных магнитов со слоями сплава Fe-Cr-Co микронного диапазона толщин, называемого сплавом Kaneko. Знание фазового состава необходимо для разработки физико-технологических подходов создания оптимальных структур на подложках монокристаллического кремния с пленочным постоянным магнитом на основе дисперсионно-твердеющего сплава с вектором намагниченности в плоскости кремниевой подложки.Методом магнетронного напыления на кремниевой подложке были получены трехслойные металлические пленки: слой дисперсионно-твердеющего сплава на основе системы Fe-Cr-Co (толщиной 3600 нм), компенсационный медный слой (3800 нм) и ванадиевый адгезионно-барьерный слой (110 нм). Сформированные на кремниевой подложке многослойные пленки подвергались одноминутному отжигу в высоком вакууме в диапазоне температур 600–650 °С. Методом рентгеновской дифракции выполнен качественный фазовый анализ структур, полученныхмагнетронным напылением и подвергнутых одноступенчатой термической обработке.Определено, что в слое дисперсионно-твердеющего сплава на основе системы Fe-Cr-Co, полученного магнетронным напылением, не образуются окислы основных компонентов и s-фаза, как в процессе получения, так и после высоковакуумного «быстрого» одноминутного отжига в диапазоне температур 600–650 °С. При температуре отжига 630 °С наблюдается максимальная интенсивность рентгеновской линии (110) a-фазы, что свидетельствует о формировании преимущественно a-твердого раствора и является предпосылкой для корректного проведения последующих ступеней отжига для спинодального распада этой фазы. ЛИТЕРАТУРА Kaneko H., Homma M., Nakamura K. New ductile permanent magnet of Fe-Cr-Co system. AJP Conference Proceedings. 1972;5: 1088–1092. DOI: https://doi.org/10.1063/1.2953814 Tsung-Shune Chin, Kou-Her Wang, Cheng-Hsiung Lin. 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