Academic literature on the topic 'Microscopy images'

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Journal articles on the topic "Microscopy images"

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Govil, Anurag, David M. Pallister, and Michael D. Morris. "Three-Dimensional Digital Confocal Raman Microscopy." Applied Spectroscopy 47, no. 1 (January 1993): 75–79. http://dx.doi.org/10.1366/0003702934048497.

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We describe an iterative image restoration technique which functions as digital confocal microscopy for Raman images. We deconvolute the lateral and axial components of the microscope point spread function from a series of optical sections, to generate a stack of well-resolved Raman images which describe the three-dimensional topology of a sample. The technique provides an alternative to confocal microscopy for three-dimensional microscopic Raman imaging.
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Mund, Markus, and Jonas Ries. "How good are my data? Reference standards in superresolution microscopy." Molecular Biology of the Cell 31, no. 19 (September 1, 2020): 2093–96. http://dx.doi.org/10.1091/mbc.e19-04-0189.

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Superresolution microscopy is becoming increasingly widespread in biological labs. While it holds enormous potential for biological discovery, it is a complex imaging technique that requires thorough optimization of various experimental parameters to yield data of the highest quality. Unfortunately, it remains challenging even for seasoned users to judge from the acquired images alone whether their superresolution microscopy pipeline is performing at its optimum, or if the image quality could be improved. Here, we describe how superresolution microscopists can objectively characterize their imaging pipeline using suitable reference standards, which are stereotypic so that the same structure can be imaged everywhere, every time, on every microscope. Quantitative analysis of reference standard images helps characterizing the performance of one’s own microscopes over time, allows objective benchmarking of newly developed microscopy and labeling techniques, and finally increases comparability of superresolution microscopy data between labs.
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Kinosita, K., H. Itoh, S. Ishiwata, K. Hirano, T. Nishizaka, and T. Hayakawa. "Dual-view microscopy with a single camera: real-time imaging of molecular orientations and calcium." Journal of Cell Biology 115, no. 1 (October 1, 1991): 67–73. http://dx.doi.org/10.1083/jcb.115.1.67.

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A new microscope technique, termed "W" (double view video) microscopy, enables simultaneous observation of two different images of an object through a single video camera or by eye. The image pair may, for example, be transmission and fluorescence, fluorescence at different wavelengths, or mutually perpendicular components of polarized fluorescence. Any video microscope can be converted into a dual imager by simple insertion of a small optical device. The continuous appearance of the dual image assures the best time resolution in existing and future video microscopes. As an application, orientations of actin protomers in individual, moving actin filaments have been imaged at the video rate. Asymmetric calcium influxes into a cell exposed to an intense electric pulse have also been visualized.
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Bell, David C. "Contrast Mechanisms and Image Formation in Helium Ion Microscopy." Microscopy and Microanalysis 15, no. 2 (March 16, 2009): 147–53. http://dx.doi.org/10.1017/s1431927609090138.

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AbstractThe helium ion microscope is a unique imaging instrument. Based on an atomic level imaging system using the principle of field ion microscopy, the helium ion source has been shown to be incredibly stable and reliable, itself a remarkable engineering feat. Here we show that the image contrast is fundamentally different to other microscopes such as the scanning electron microscope (SEM), although showing many operational similarities due to the physical ion interaction mechanisms with the sample. Secondary electron images show enhanced surface contrast due the small surface interaction volume as well as elemental contrast differences, such as for nanowires imaged on a substrate. We present images of nanowires and nanoparticles for comparison with SEM imaging. Applications of Rutherford backscattered ion imaging as a unique and novel imaging mechanism are described. The advantages of the contrast mechanisms offered by this instrument for imaging nanomaterials are clearly apparent due to the high resolution and surface sensitivity afforded in the images. Future developments of the helium ion microscope should yield yet further improvements in imaging and provide a platform for continued advances in microscope science and nanoscale research.
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Zhao, Xiaocui, Nils O. Petersen, and Zhifeng Ding. "Comparison study of live cells by atomic force microscopy, confocal microscopy, and scanning electrochemical microscopy." Canadian Journal of Chemistry 85, no. 3 (March 1, 2007): 175–83. http://dx.doi.org/10.1139/v07-007.

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In this report, three kinds of scanning probe microscopy techniques, atomic force microscopy (AFM), confocal microscopy (CM), and scanning electrochemical microscopy (SECM), were used to study live cells in the physiological environment. Two model cell lines, CV-1 and COS-7, were studied. Time-lapse images were obtained with both contact and tapping mode AFM techniques. Cells were more easily scratched or moved by contact mode AFM than by tapping mode AFM. Detailed surface structures such as filamentous structures on the cell membrane can be obtained and easily discerned with tapping mode AFM. The toxicity of ferrocenemethanol (Fc) on live cells was studied by CM in reflection mode by recording the time-lapse images of controlled live cells and live cells with different Fc concentrations. No significant change in the morphology of cells was caused by Fc. Cells were imaged by SECM with Fc as the mediator at a biased potential of 0.35 V (vs. Ag/AgCl with a saturated KCl solution). Cells did not change visibly within 1 h, which indicated that SECM was a noninvasive technique and thus has a unique advantage for the study of soft cells, since the electrode scanned above the cells instead of in contact with them. Reactive oxygen species (ROS) generated by the cells were detected and images based on these chemical species were obtained. It is demonstrated that SECM can provide not only the topographical images but also the images related to the chemical or biochemical species released by the live cells.Key words: live cells, atomic force microscopy, confocal microscopy, scanning electrochemical microscopy.
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Mansfield, John F. "Digital imaging: When should one take the plunge?" Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 602–3. http://dx.doi.org/10.1017/s0424820100165471.

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The current imaging trend in optical microscopy, scanning electron microscopy (SEM) or transmission electron microscopy (TEM) is to record all data digitally. Most manufacturers currently market digital acquisition systems with their microscope packages. The advantages of digital acquisition include: almost instant viewing of the data as a high-quaity positive image (a major benefit when compared to TEM images recorded onto film, where one must wait until after the microscope session to develop the images); the ability to readily quantify features in the images and measure intensities; and extremely compact storage (removable 5.25” storage devices which now can hold up to several gigabytes of data).The problem for many researchers, however, is that they have perfectly serviceable microscopes that they routinely use that have no digital imaging capabilities with little hope of purchasing a new instrument.
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Grudin, B. N., E. L. Kuleshov, V. S. Plotnikov, N. A. Smolyaninov, and S. V. Polischuk. "Modeling monofractal microscopy images." Bulletin of the Russian Academy of Sciences: Physics 77, no. 8 (August 2013): 999–1003. http://dx.doi.org/10.3103/s1062873813080121.

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Levi-Setti, R., J. M. Chabala, and Y. L. Wang. "Scanning ion microscopy images." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 180–81. http://dx.doi.org/10.1017/s042482010012583x.

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Finely focused beams extracted from liquid metal ion sources (LMIS) provide a wealth of secondary signals which can be exploited to create high resolution images by the scanning method. The images of scanning ion microscopy (SIM) encompass a variety of contrast mechanisms which we classify into two broad categories: a) Emission contrast and b) Analytical contrast.Emission contrast refers to those mechanisms inherent to the emission of secondaries by solids under ion bombardment. The contrast-carrying signals consist of ion-induced secondary electrons (ISE) and secondary ions (ISI). Both signals exhibit i) topographic emission contrast due to the existence of differential geometric emission and collection effects, ii) crystallographic emission contrast, due to primary ion channeling phenomena and differential oxidation of crystalline surfaces, iii) chemical emission or Z-contrast, related to the dependence of the secondary emission yields on the Z and surface chemical state of the target.
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Chen, Weiyang, Bo Liao, Weiwei Li, Xiangjun Dong, Matthew Flavel, Markandeya Jois, Guojun Li, and Bo Xian. "Segmenting Microscopy Images of Multi-Well Plates Based on Image Contrast." Microscopy and Microanalysis 23, no. 5 (July 17, 2017): 932–37. http://dx.doi.org/10.1017/s1431927617012375.

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AbstractImage segmentation is a key process in analyzing biological images. However, it is difficult to detect the differences between foreground and background when the image is unevenly illuminated. The unambiguous segmenting of multi-well plate microscopy images with various uneven illuminations is a challenging problem. Currently, no publicly available method adequately solves these various problems in bright-field multi-well plate images. Here, we propose a new method based on contrast values which removes the need for illumination correction. The presented method is effective enough to distinguish foreground and therefore a model organism (Caenorhabditis elegans) from an unevenly illuminated microscope image. In addition, the method also can solve a variety of problems caused by different uneven illumination scenarios. By applying this methodology across a wide range of multi-well plate microscopy images, we show that our approach can consistently analyze images with uneven illuminations with unparalleled accuracy and successfully solve various problems associated with uneven illumination. It can be used to process the microscopy images captured from multi-well plates and detect experimental subjects from an unevenly illuminated background.
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Jost, Anna Payne-Tobin, and Jennifer C. Waters. "Designing a rigorous microscopy experiment: Validating methods and avoiding bias." Journal of Cell Biology 218, no. 5 (March 20, 2019): 1452–66. http://dx.doi.org/10.1083/jcb.201812109.

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Images generated by a microscope are never a perfect representation of the biological specimen. Microscopes and specimen preparation methods are prone to error and can impart images with unintended attributes that might be misconstrued as belonging to the biological specimen. In addition, our brains are wired to quickly interpret what we see, and with an unconscious bias toward that which makes the most sense to us based on our current understanding. Unaddressed errors in microscopy images combined with the bias we bring to visual interpretation of images can lead to false conclusions and irreproducible imaging data. Here we review important aspects of designing a rigorous light microscopy experiment: validation of methods used to prepare samples and of imaging system performance, identification and correction of errors, and strategies for avoiding bias in the acquisition and analysis of images.
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Dissertations / Theses on the topic "Microscopy images"

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Kariani, H. "Review of Modern Frameworks for Microscopy Image Processing." Thesis, Ukraine, Kharkiv, 2021. https://openarchive.nure.ua/handle/document/16613.

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Modern research in microscopy image processing requires a deeper understanding of the influence of different factors on registration of this type of biomedical images. Analysis of this process requires smart software which should be able to obtain quantitative parameters of micro objectives with acceptable processing speed.
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Gawande, Saurabh. "Generative adversarial networks for single image super resolution in microscopy images." Thesis, KTH, Skolan för elektroteknik och datavetenskap (EECS), 2018. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-230188.

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Image Super resolution is a widely-studied problem in computer vision, where the objective is to convert a lowresolution image to a high resolution image. Conventional methods for achieving super-resolution such as image priors, interpolation, sparse coding require a lot of pre/post processing and optimization. Recently, deep learning methods such as convolutional neural networks and generative adversarial networks are being used to perform super-resolution with results competitive to the state of the art but none of them have been used on microscopy images. In this thesis, a generative adversarial network, mSRGAN, is proposed for super resolution with a perceptual loss function consisting of a adversarial loss, mean squared error and content loss. The objective of our implementation is to learn an end to end mapping between the low / high resolution images and optimize the upscaled image for quantitative metrics as well as perceptual quality. We then compare our results with the current state of the art methods in super resolution, conduct a proof of concept segmentation study to show that super resolved images can be used as a effective pre processing step before segmentation and validate the findings statistically.
Image Super-resolution är ett allmänt studerad problem i datasyn, där målet är att konvertera en lågupplösningsbild till en högupplöst bild. Konventionella metoder för att uppnå superupplösning som image priors, interpolation, sparse coding behöver mycket föroch efterbehandling och optimering.Nyligen djupa inlärningsmetoder som convolutional neurala nätverk och generativa adversariella nätverk är användas för att utföra superupplösning med resultat som är konkurrenskraftiga mot toppmoderna teknik, men ingen av dem har använts på mikroskopibilder. I denna avhandling, ett generativ kontradiktorisktsnätverk, mSRGAN, är föreslås för superupplösning med en perceptuell förlustfunktion bestående av en motsatt förlust, medelkvadratfel och innehållförlust.Mål med vår implementering är att lära oss ett slut på att slut kartläggning mellan bilder med låg / hög upplösning och optimera den uppskalade bilden för kvantitativa metriks såväl som perceptuell kvalitet. Vi jämför sedan våra resultat med de nuvarande toppmoderna metoderna i superupplösning, och uppträdande ett bevis på konceptsegmenteringsstudie för att visa att superlösa bilder kan användas som ett effektivt förbehandling steg före segmentering och validera fynden statistiskt.
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Macura, Tomasz Jakub. "Automating the quantitative analysis of microscopy images." Thesis, University of Cambridge, 2009. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.611330.

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Meng, Ting, and Yating Yu. "Deconvolution algorithms of 2D Transmission Electron Microscopy images." Thesis, KTH, Optimeringslära och systemteori, 2012. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-110096.

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The purpose of this thesis is to develop a mathematical approach and associated software implementation for deconvolution of two-dimensional Transmission Electron Microscope (TEM) images. The focus is on TEM images of weakly scattering amorphous biological specimens that mainly produce phase contrast. The deconvolution is to remove the distortions introduced by the TEM detector that are modeled by the Modulation Transfer Function (MTF). The report tests deconvolution of the TEM detector MTF by Wiener _ltering and Tikhonov regularization on a range of simulated TEM images with varying degree of noise.The performance of the two deconvolution methods are quanti_ed by means of Figure of Merits (FOMs) and comparison in-between methods is based on statistical analysis of the FOMs.
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Lashin, Nabil Aly Mohamed Aly. "Restoration methods for biomedical images in confocal microscopy." [S.l.] : [s.n.], 2005. http://deposit.ddb.de/cgi-bin/dokserv?idn=975678167.

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Tegegne, Mekuria, and Amir Etbaeitabari. "Analysis and Synthesis of object overlap in Microscopy Images." Thesis, Högskolan i Halmstad, Intelligenta system (IS-lab), 2012. http://urn.kb.se/resolve?urn=urn:nbn:se:hh:diva-19727.

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We propose a test-bed application for synthesis and analysis of multi-layeredmicroscopy data with variation in depth of focus(DOF), where we considerthe problem of detecting object overlap.For the synthesis part, the objects are elliptical in appearance with the possibilityof setting dierent parameters like noise, resolution, illumination,circularity, area and orientation.For the analysis part, the approach allows the user to set several parameters,including sensitivity for error calculation and classier type for analysis.We provide a novel algorithm that exploits the multi-layered nature of theobject overlap problem in order to improve recognition. The variation of grayvalue for each pixel in dierent depth is used as feature source for classication.The classier divides the pixels in three dierent groups: backgroundpixels, pixels in single cells and pixels in overlapping parts.We provide experimental results on the synthesized data, where we add noiseof dierent density. In non-noisy environments the performance for accuracyof overlapping positions is 93% and the performance of the missed overlapsis around 99.98% for density of 150 cells.iv
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Fernandes, Thales Fernando Damasceno. "Friction-induced artifact in atomic force microscopy topographic images." Universidade Federal de Minas Gerais, 2014. http://hdl.handle.net/1843/BUOS-9PQHRG.

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In Contact Mode Atomic Force Microscopy (CM-AFM), a cantilever with a sharp tip on its end is employed to acquire topographic information. Such acquisition is normally made by monitoring the deflection of the cantilever when it is in contact with the surface being scanned and using deflection variations as a feedback signal to the control electronics in order to keep the deflection constant (also known as constant force imaging mode in the literature). However, there is a major problem with this approach since, in most cases, a constant force scanning is not possible: frictional forces, besides normal forces, may bend the cantilever. Such additional bending (deflection) needs to be considered in the formulation of the problem. The present dissertation investigates how these forces (frictional and normal) can give rise to a topographic artifact when scanning along the cantilever axis direction. Such artifact is even more dramatic when the friction coefficient of the sample changes from region to region. This effect is studied experimentally, with a sample composed of graphene monolayer atop silicon oxide. The observed artifact, caused by frictional forces, causes the graphene to appear either thicker or thinner than it really is depending on scan direction. A theoretical examination is also made both with analytical methods (Euler-Bernoulli beam theory) and a simulation on COMSOL Multiphysics package. The theory not only predicts the artifact, but also indicates how it can be completely avoided by changing the scanning angle to the perpendicular direction of the cantilever axis.
No Modo Contato da Microscopia de Força Atômica (CM-AFM), uma alavanca com uma ponta bastante afiada em sua extremidade é usada para adquirir informação topográfica. Tal aquisição normalmente é feita monitorando a deflexão da alavanca quando em contato com a superfície a ser varrida. Usa-se a variação da deflexão como um sinal de feedback que controla a eletrônica, mantendo a deflexão constante (conhecido como modo de força constante na literatura). Porém, existe um grande problema com essa abordagem, já que, na maioria dos casos, fazer uma varredura com força constante não é possível: forças de atrito, além da força normal, podem fletir a alavanca. Tal curvatura adicional (deflexão) deve ser considerada na formulação do problema. Essa dissertação investiga como essas forças (normal e de atrito) podem dar origem a um artefato de topografia quando é feito uma varredura ao longo do eixo da alavanca. Tal artefato é ainda mais dramático quando o coeficiente de atrito da amostra muda de região para região. Esse efeito é estudado experimentalmente, com uma amostra composta de uma monocamada de grafeno em cima de oxido de silício. O artefato observado, causado pelas forças de atrito, faz o grafeno aparecer mais espesso ou mais estreito do que realmente é, dependendo da direção de varredura. Uma verificação teórica também é feita usando métodos analíticos (teoria de vigas de Euler-Bernoulli) e simulações usando o pacote COMSOL Multiplysics. A teoria não apenas prediz o artefato, mas também indica como ele pode ser completamente evitado ao trocar o ângulo de varredura para perpendicular à direção do eixo da alavanca.
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Nagane, Radhika. "Detection of flash in dermoscopy skin lesion images." Diss., Rolla, Mo. : University of Missouri-Rolla, 2007. http://scholarsmine.umr.edu/thesis/pdf/Nagane_09007dcc803ec3f9.pdf.

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Thesis (M.S.)--University of Missouri--Rolla, 2007.
Vita. The entire thesis text is included in file. Title from title screen of thesis/dissertation PDF file (viewed December 7, 2007) Includes bibliographical references (p. 89-90).
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Caltabiano, Pietro Carelli Reis de Oliveira [UNESP]. "Caracterização morfológica e microestrutural da liga AA7075 por microscopia correlativa e processamento digital de imagens." Universidade Estadual Paulista (UNESP), 2016. http://hdl.handle.net/11449/147994.

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Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
Ferramentas de processamento e análise digital de imagens foram desenvolvidas com a finalidade de avaliar a evolução da textura morfológica e cristalográfica da microestrutura da liga de alumínio 7075 sob diferentes níveis de deformação plástica por compressão uniaxial. Amostras da liga de alumínio 7075-T6 passaram por um processo de recozimento pleno seguido de um estágio de compressão uniaxial, obtendo níveis de deformações entre 25 e 65%. As microestruturas das amostras foram avaliadas em função dos parâmetros morfológicos dos precipitados, da reorientação dos planos cristalográficos dos grãos e da orientação das subestruturas formadas durante o processo de deformação. Para a caracterização foram utilizadas técnicas de difração de raios-X, microscopia eletrônica, microscopia óptica utilizando técnicas de polarização linear e circular, microscopia correlativa e processamento digital de imagens. Os resultados de difração de raios-X indicaram uma reorientação do plano cristalográficos (200) para o (220) após a deformação, e as técnicas de microscopia eletrônica identificaram precipitados de Mg2Si, Al7Cu2Fe e Al6(FeCu) na liga. A análise morfológica dos precipitados indicou uma maior fragmentação dos precipitados devido à maior ativação do plano (331) a partir de 39% de deformação. Por meio do processamento de imagens foi encontrada uma tendência de correlação entre os planos cristalográficos e a fração de área das fases, enquanto que os parâmetros morfológicos das subestruturas formadas durante o processo de deformação permitiram avaliar apenas qualitativamente o nível de encruamento das amostras.
Digital image processing and analysis tools were developed to perform the AA 7075 crystallographic and morphologic texture evaluation under different level of plastic deformation by uniaxial compression. Samples of AA 7075-T6 were submitted to full annealing process followed by uniaxial compression, thus obtaining deformations between 25 and 65% of thickness. The samples microstructure evaluation was performed considering: precipitates morphological parameters, crystallographic lattices reorientation and deformation substructure orientation. The characterization technics were: X-ray diffraction, electron microscopy, optical microscopy with polarization light, correlative microscopy and digital images processing. Xray diffraction results showed that the crystallographic plane (200) was reoriented to (220) after compression. The EDS analysis identified precipitates of Mg2Si, Al7Cu2Fe e Al6(FeCu). The precipitates morphological analysis showed an increase in fragmentation due to plane (331) at 39% of deformation. The digital image process of the samples etched with Barker reagents indicated a correlation between area fraction and the diffraction peaks, and the deformation substructures analysis made viable a qualitative characterization of the hardening process.
FAPESP: 2011/00403-2
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Cruz, Francisco (Francisco Ui). "Volumetric reconstruction of tissue structure from two-dimensional microscopy images." Thesis, Massachusetts Institute of Technology, 2005. http://hdl.handle.net/1721.1/37051.

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Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, June 2006.
Includes bibliographical references (leaf 41).
Cell morphology of tissue is naturally three-dimensional. Most current methods for tissue analysis use two dimensional histological images of the tissue samples, restricting the analysis to 2D. Existing approaches do not provide essential three-dimensional information such as cell volume, shape and structural orientation of cells within the tissue. This thesis investigates a method to extract three dimensional data using two-dimensional microscopy. We demonstrate that three dimensional cell structure can be acquired using two dimensional fluorescence microscopy and two-photon microscopy and explore the application of the analysis to studies of cardiac tissue.
by Francisco Cruz.
M.Eng.
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Books on the topic "Microscopy images"

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Russ, John C. Computer-assisted microscopy: The measurement and analysisof images. New York: Plenum Press, 1990.

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Images & [and] imagination: Faszination Forschung = la fascination de la recherche = captivating science ... Basel: Ed. Roche, 2001.

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Russ, John C. Computer-Assisted Microscopy: The Measurement and Analysis of Images. Boston, MA: Springer US, 1990.

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Russ, John C. Computer-assisted microscopy: The measurement and analysis of images. New York: Plenum Press, 1990.

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1931-, Kessel Richard G., and Tung Hai-Nan, eds. Freeze fracture images of cells and tissues. New York: Oxford University Press, 1991.

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Northwest Fisheries Science Center (U.S.), ed. Sea unseen: Scanning electron microscopy images from Puget Sound and beyond. Seattle]: U.S. Dept. of Commerce, National Oceanic and Atmospheric Administration, [Northwest Fisheries Science Center, 2010.

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Zlateva, Ganka. Microstructure of metals and alloys: An atlas of transmission electron microscopy images. Boca Raton, FL: CRC Press, 2008.

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Breger, Dee. Through the electronic looking glass: 3-D images from a scanning electron microscope. Phoenix, Ariz: Cygnus Graphic, 1995.

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Elkins, James. Six stories from the end of representation: Images in painting, photography, astronomy, microscopy, particle physics, and quantum mechanics, 1980-2000. Stanford, Calif: Stanford University Press, 2008.

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Reimer, Ludwig. Transmission electron microscopy: Physics of image formation and microanalysis. 2nd ed. Berlin: Springer-Verlag, 1989.

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Book chapters on the topic "Microscopy images"

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Russ, John C. "Acquiring Images." In Computer-Assisted Microscopy, 13–32. Boston, MA: Springer US, 1990. http://dx.doi.org/10.1007/978-1-4613-0563-7_2.

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Williams, David B., and C. Barry Carter. "Phase-Contrast Images." In Transmission Electron Microscopy, 389–405. Boston, MA: Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-76501-3_23.

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Williams, David B., and C. Barry Carter. "Phase-Contrast Images." In Transmission Electron Microscopy, 439–55. Boston, MA: Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-2519-3_27.

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Williams, David B., and C. Barry Carter. "Processing and Quantifying Images." In Transmission Electron Microscopy, 549–78. Boston, MA: Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-76501-3_31.

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Lyman, Charles E., Joseph I. Goldstein, Alton D. Romig, Patrick Echlin, David C. Joy, Dale E. Newbury, David B. Williams, et al. "X-Ray Images." In Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy, 132–36. Boston, MA: Springer US, 1990. http://dx.doi.org/10.1007/978-1-4613-0635-1_23.

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Lyman, Charles E., Joseph I. Goldstein, Alton D. Romig, Patrick Echlin, David C. Joy, Dale E. Newbury, David B. Williams, et al. "X-Ray Images." In Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy, 352–62. Boston, MA: Springer US, 1990. http://dx.doi.org/10.1007/978-1-4613-0635-1_52.

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Hibbs, Alan R. "Digital Images in Microscopy." In Confocal Microscopy for Biologists, 145–62. Boston, MA: Springer US, 2004. http://dx.doi.org/10.1007/978-0-306-48565-7_5.

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Williams, David B., and C. Barry Carter. "X-ray Spectra and Images." In Transmission Electron Microscopy, 605–23. Boston, MA: Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-76501-3_33.

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Van Dyck, Dirk, and Sandra Van Aert. "Direct Methods for Images Interpretation." In Transmission Electron Microscopy, 267–81. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-26651-0_10.

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Williams, David B., and C. Barry Carter. "Quantifying and Processing HRTEM Images." In Transmission Electron Microscopy, 499–527. Boston, MA: Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-2519-3_30.

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Conference papers on the topic "Microscopy images"

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Čapek, Martin. "Wavelet_Denoise Fiji/ImageJ plugin for filtering/denoising microscopic images." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.1443.

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Nisar, Humaira, Ho Yuen Hang, Soh Chit Siang, and Muhammad Burhan Khan. "Image segmentation of microscopic wastewater images using phase contrast microscopy." In 2016 IEEE Conference on Systems, Process and Control (ICSPC). IEEE, 2016. http://dx.doi.org/10.1109/spc.2016.7920712.

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Krekeler, Tobias. "Improving STEM image quality by processing large sets of images." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.632.

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Nebaba, Stepan, and Alexander Pak. "Patterns detection in diffraction images of transmission electron microscopy." In International Conference "Computing for Physics and Technology - CPT2020". Bryansk State Technical University, 2020. http://dx.doi.org/10.30987/conferencearticle_5fce2770518c26.23795065.

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Abstract:
Specialized software that supports existing approaches to processing images of the crystal structure of materials for analyzing transmission electron microscopy images have a lot of different digital image processing methods, but major part of it are weakly automated. In some tasks automated algorithms of image processing have been developed, e.g. in task of estimation of the width of a layer of material from a raster image. The paper considers the problem of automated processing of diffraction images obtained by transmission electron microscopy. A number of modifications, such as Watershed algorithm, binarization and Fast Fourier Transform, are proposed for existing image processing algorithms. These modifications can help automate the processing of the diffraction pattern of a material sample from an image of transmission electron microscopy. The given examples of image processing of particular cases of diffraction patterns have shown the prospects for the development of algorithm based on combination of the proposed modifications of considered algorithms. Adaptive binarization with Watershed segmentation would be useful in automated distance estimation in transmission electron microscopy images.
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Waller, Laura, Dmitry V. Dylov, and Jason W. Fleischer. "Nonlinear Restoration of Diffused Images." In Novel Techniques in Microscopy. Washington, D.C.: OSA, 2011. http://dx.doi.org/10.1364/ntm.2011.ntuc5.

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Hariri, Lida P. "Training the next generation to interpret IVM images." In Endoscopic Microscopy XIV, edited by Melissa J. Suter, Guillermo J. Tearney, and Thomas D. Wang. SPIE, 2019. http://dx.doi.org/10.1117/12.2518247.

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Roughton, Gregory, Aparna S. Varde, Stefan Robila, and Jianyu Liang. "A feature-based approach for processing nanoscale images." In Scanning Microscopy 2010, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2010. http://dx.doi.org/10.1117/12.853412.

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Lindsay, S. M., and O. F. Sankey. "Contrast and conduction in STM images of biomolecules." In Scanned probe microscopy. AIP, 1991. http://dx.doi.org/10.1063/1.41430.

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Vernetti, L. A., D. Sarid, A. J. Gandolfi, A. E. Cress, R. B. Nagle, R. McCuskey, and S. R. Hameroff. "STM Images of Cytokeratin and Binding IgG Antibody." In Scanned probe microscopy. AIP, 1991. http://dx.doi.org/10.1063/1.41436.

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Cizmar, Petr, András E. Vladár, and Michael T. Postek. "Advances in modeling of scanning charged-particle-microscopy images." In Scanning Microscopy 2010, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2010. http://dx.doi.org/10.1117/12.861064.

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Reports on the topic "Microscopy images"

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Moon, Bill. Employment of Crystallographic Image Processing Techniques to Scanning Probe Microscopy Images of Two-Dimensional Periodic Objects. Portland State University Library, January 2000. http://dx.doi.org/10.15760/etd.699.

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Heber, Ryan, Ann Cook, Julia Sheets, and Derek Sawyer. Data Report: High-Resolution Microscopy Images of Sediments from Green Canyon Block 955, Gulf of Mexico. Office of Scientific and Technical Information (OSTI), April 2020. http://dx.doi.org/10.2172/1648312.

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Dolgin, Amelia, and Jason Adolf. Scanning Electron Microscopy of Phytoplankton: Achieving High-Quality Images Through the Use of Safer Alternative Chemical Fixative. Journal of Young Investigators, July 2019. http://dx.doi.org/10.22186/jyi.37.1.1-9.

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Pennycook, S. J., and A. R. Lupini. Image Resolution in Scanning Transmission Electron Microscopy. Office of Scientific and Technical Information (OSTI), June 2008. http://dx.doi.org/10.2172/939888.

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Bajcsy, Peter, and Nathan Hotaling. Interoperability of web computational plugins for large microscopy image analyses. Gaithersburg, MD: National Institute of Standards and Technology, March 2020. http://dx.doi.org/10.6028/nist.ir.8297.

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Salapaka, Srinivasa M., and Petros G. Voulgaris. Fast Scanning and Fast Image Reconstruction in Atomic Force Microscopy. Fort Belvoir, VA: Defense Technical Information Center, March 2009. http://dx.doi.org/10.21236/ada495364.

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Wendelberger, James G. Localized Similar Image Texture in Images of Sample Laser Confocal Microscope for Area: FY15 DE07 SW C1 Zone 1 & 2 Section b. Office of Scientific and Technical Information (OSTI), February 2019. http://dx.doi.org/10.2172/1496724.

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Wendelberger, James. Template size and proper overlap detection in Laser Confocal Microscope (LCM) images. Office of Scientific and Technical Information (OSTI), August 2021. http://dx.doi.org/10.2172/1812643.

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Bolgert, Peter J. A Comparison of Image Quality Evaluation Techniques for Transmission X-Ray Microscopy. Office of Scientific and Technical Information (OSTI), August 2012. http://dx.doi.org/10.2172/1049731.

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Dabros, M. J., and P. J. Mudie. An Automated Microscope System For Image Analysis in Palynology and Micropaleontology. Natural Resources Canada/ESS/Scientific and Technical Publishing Services, 1986. http://dx.doi.org/10.4095/120356.

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