Books on the topic 'Microscopy – Data processing'
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Cheng, P. C. Multidimensional Microscopy. New York, NY: Springer New York, 1994.
Find full textRuss, John C. Computer-assisted microscopy: The measurement and analysisof images. New York: Plenum Press, 1990.
Find full textComputer operation for microscope photometry. Boca Raton, Fla: CRC Press, 1998.
Find full textRuss, John C. Computer-assisted microscopy: The measurement and analysis of images. New York: Plenum Press, 1990.
Find full textSarid, Dror. Exploring scanning probe microscopy with mathematica. 2nd ed. Weinheim: Wiley-VCH, 2007.
Find full textKoehler, James K. Advanced Techniques in Biological Electron Microscopy III. Berlin, Heidelberg: Springer Berlin Heidelberg, 1986.
Find full textInternational Metallographic Society. Technical Meeting. Computer-aided microscopy and metallography: Proceedings of the Twenty-Second Annual Technical Meeting of the International Metallographic Society. Columbus, Ohio USA: The Society, 1990.
Find full textGao fen zi yan jiu fang fa. Beijing Shi: Zhongguo shi hua chu ban she, 2011.
Find full textSarid, Dror. Exploring scanning probe microscopy with mathematica. 2nd ed. Weinheim: Wiley-VCH, 2007.
Find full textSarid, Dror. Exploring scanning probe microscopy with Mathematica. New York: Wiley, 1997.
Find full textXing, Zhu, and Ohtsu Motoichi, eds. Near-field optics: Principles and applications : the second Asia-Pacific Workshop on Near Field Optics, Beijing, China, October 20-23, 1999. Singapore: World Scientific, 2000.
Find full textFriel, John J. X-ray microanalysis and computer-aided imaging. Princeton, NJ (1200 State Rd., Princeton 08540): PGT, 1990.
Find full textArock, Michel. Autoformation et aide au diagnostic en hématologie avec le logiciel ADH. Paris: Springer-Verlag France, Paris, 2008.
Find full textNational Research Council (U.S.). Committee on Applied and Theoretical Statistics, ed. Steps toward large-scale data integration in the sciences: Summary of a workshop. Washington, D.C: National Academies Press, 2010.
Find full textDr, Gutiérrez Rafael, ed. Co-existence and co-release of classical neurotransmitters: Ex uno plures. New York, NY: Springer, 2009.
Find full textEarnshaw, Rae A. An introductory guide to scientific visualization. Berlin: Springer-Verlag, 1992.
Find full textMichel, Mareschal, Holian Brad Lee, and North Atlantic Treaty Organization. Scientific Affairs Division., eds. Microscopic simulations of complex hydrodynamic phenomena. New York: Plenum Press, 1992.
Find full textJ, Broughton, Krakow William, Pantelides Sokrates T, and Materials Research Society, eds. Computer-based microscopic description of the structure and properties of materials: Symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A. Pittsburgh, Pa: Materials Research Society, 1986.
Find full textJeffrey, Williams, and Johnson David, eds. NT Server 4 in the enterprise: Microscoft certified systems engineer. Scottsdale, Ariz: Certification Insider Press, 1998.
Find full textHawkes, Peter W. Advances in Imaging and Electron Physics, Volume 144. Burlington: Elsevier, 2006.
Find full textQuantitative Data Processing in Scanning Probe Microscopy. Elsevier, 2013. http://dx.doi.org/10.1016/c2011-0-09615-1.
Full textQuantitative Data Processing in Scanning Probe Microscopy. Elsevier, 2018. http://dx.doi.org/10.1016/c2016-0-04404-2.
Full textGoldstein, D. J. Understanding the Light Microscope: A Computer-Aided Introduction (With CD-ROM). Academic Press, 1999.
Find full textUnderstanding the Light Microscope: A Computer-Aided Introduction (With CD-ROM). Academic Press, 1999.
Find full textGoldstein, D. J. Understanding the Light Microscope: A Computer-Aided Introduction. Elsevier Science & Technology Books, 1999.
Find full text(Editor), Jiang Gu, and Robert W. Ogilvie (Editor), eds. Virtual Microscopy and Virtual Slides in Teaching, Diagnosis, and Research (Advances in Pathology, Microscopy, and Molecular Morphology). CRC, 2005.
Find full textKlapetek, Petr. Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology. William Andrew, 2012.
Find full textKlapetek, Petr. Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology. Elsevier, 2018.
Find full textKlapetek, Petr. Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology. Elsevier Science & Technology Books, 2018.
Find full textKlapetek, Petr. Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology. Elsevier Science & Technology Books, 2012.
Find full textRuss, John C. Computer Assisted Microscopy: The Measurement and Analysis of Images. North Carolina State Univ, 1988.
Find full textDr, Gutiérrez Rafael, ed. Co-existence and co-release of classical neurotransmitters: Ex uno plures. New York, NY: Springer, 2009.
Find full textMotoichi, Ohtsu, Jutamulia Suganda, Asakura Toshimitsu 1934-, and Society of Photo-optical Instrumentation Engineers., eds. Near-field optics: Physics, devices, and information processing : 22-23 July, 1999, Denver, Colorado. Bellingham, Wash: SPIE, 1999.
Find full textHawkes, Peter W. Advances in Imaging and Electron Physics: Advances in Electron Microscopy and Diffraction. Elsevier Science & Technology Books, 2002.
Find full textSuganda, Jutamulia, Asakura Toshimitsu 1934-, and Society of Photo-optical Instrumentation Engineers., eds. Far- and near-field optics: Physics and information processing : 23-24 July 1998, San Diego, California. Bellingham, Wash., USA: SPIE, 1998.
Find full textBertero, Mario, Patrizia Boccacci, and Valeria Ruggiero. Inverse Imaging with Poisson Data: From Cells to Galaxies. Iop Publishing Ltd, 2019.
Find full textHawkes, Peter W., and Martin Hÿtch. Advances in Imaging and Electron Physics: Computer Techniques for Image Processing in Electron Microscopy. Elsevier Science & Technology Books, 2020.
Find full textHead, A. K. Computed Electron Micrographs and Defect Identification. Elsevier Science & Technology Books, 2012.
Find full textHawkes, Peter W. Advances in Imaging and Electron Physics: Aberration-Corrected Microscopy. Elsevier Science & Technology Books, 2008.
Find full textSarid, Dror. Exploring Scanning Probe Microscopy with MATHEMATICA. 2nd ed. Wiley-VCH, 2007.
Find full textR, Wootton, Springall D. R, and Polak Julia M, eds. Image analysis in histology: Conventional and confocal microscopy. Cambridge: Published in association with the Royal Postgraduage Medical School, University of London by Cambridge University Press, 1995.
Find full text(Editor), Xing Zhu, and Motoichi Ohtsu (Editor), eds. 2AP NFO Near-Field Optics: Principes and Applications: The Second Asia Pacific Workshop on Near Field Optics. World Scientific Publishing Company, 2000.
Find full textHawkes, Peter W., Dmitry Greenfield, and Mikhael Monastyrskii. Advances in Imaging and Electron Physics: Selected Problems of Computational Charged Particle Optics. Elsevier Science & Technology Books, 2008.
Find full textAdvances in Imaging and Electron Physics. Elsevier Science & Technology Books, 2010.
Find full textAdvances in imaging and electron physics: Optics of charged particle analyzers. London: Academic, 2010.
Find full textNano-optics and Nano-structures (SPIE Proceedings). SPIE Society of Photo-Optical Instrumentation Engi, 2002.
Find full textXing, Zhu, Chou Stephen Y, Arakawa Yasuhiko, Society of Photo-optical Instrumentation Engineers., Zhongguo guang xue xue hui., Shanghai jiao tong da xue., and Guo jia zi ran ke xue ji jin wei yuan hui (China), eds. Nano-optics and nano-structures: 15-16 October, 2002, Shanghai, China. Bellingham, Washington: SPIE, 2003.
Find full textGraham, Jim, and Richard Baldock. Image Processing and Analysis. Oxford University Press, 2000.
Find full textHawkes, Peter W. Advances in Imaging and Electron Physics: Aberration-Corrected Electron Microscopy. Elsevier Science & Technology Books, 2009.
Find full textJim, Graham, and Baldock Richard, eds. Image processing and analysis: A practical approach. Oxford: Oxford University Press, 2000.
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