Academic literature on the topic 'Microscopy'
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Journal articles on the topic "Microscopy"
Schatten, G., J. Pawley, and H. Ris. "Integrated microscopy resource for biomedical research at the university of wisconsin at madison." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 594–97. http://dx.doi.org/10.1017/s0424820100127451.
Full textChen, Xiaodong, Bin Zheng, and Hong Liu. "Optical and Digital Microscopic Imaging Techniques and Applications in Pathology." Analytical Cellular Pathology 34, no. 1-2 (2011): 5–18. http://dx.doi.org/10.1155/2011/150563.
Full textJ. H., Youngblom, Wilkinson J., and Youngblom J.J. "Telepresence Confocal Microscopy." Microscopy and Microanalysis 6, S2 (August 2000): 1164–65. http://dx.doi.org/10.1017/s1431927600038319.
Full textYoungblom, J. H., J. Wilkinson, and J. J. Youngblom. "Telepresence Confocal Microscopy." Microscopy Today 8, no. 10 (December 2000): 20–21. http://dx.doi.org/10.1017/s1551929500054146.
Full textBrooks, Donald A. "The College of Microscopy — Meeting Rapidly Growing Microscopy Demands." Microscopy Today 15, no. 4 (July 2007): 51. http://dx.doi.org/10.1017/s1551929500055735.
Full textGraef, M. De, N. T. Nuhfer, and N. J. Cleary. "Implementation Of A Digital Microscopy Teaching Environment." Microscopy and Microanalysis 5, S2 (August 1999): 4–5. http://dx.doi.org/10.1017/s1431927600013349.
Full textMartone, Maryann E. "Bridging the Resolution Gap: Correlated 3D Light and Electron Microscopic Analysis of Large Biological Structures." Microscopy and Microanalysis 5, S2 (August 1999): 526–27. http://dx.doi.org/10.1017/s1431927600015956.
Full textYoungblom, J. H., J. Wilkinson, and J. J. Youngblom. "Confocal Laser Scanning Microscopy By Remote Access." Microscopy Today 7, no. 7 (September 1999): 32–33. http://dx.doi.org/10.1017/s1551929500064798.
Full textO'Keefe, Michael A., John H. Turner, John A. Musante, Crispin J. D. Hetherington, A. G. Cullis, Bridget Carragher, Ron Jenkins, et al. "Laboratory Design for High-Performance Electron Microscopy." Microscopy Today 12, no. 3 (May 2004): 8–17. http://dx.doi.org/10.1017/s1551929500052093.
Full textMöller, Lars, Gudrun Holland, and Michael Laue. "Diagnostic Electron Microscopy of Viruses With Low-voltage Electron Microscopes." Journal of Histochemistry & Cytochemistry 68, no. 6 (May 21, 2020): 389–402. http://dx.doi.org/10.1369/0022155420929438.
Full textDissertations / Theses on the topic "Microscopy"
Payton, Oliver David. "High-speed atomic force microscopy under the microscope." Thesis, University of Bristol, 2012. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.574416.
Full textFranklin, Thomas. "Scanning ionoluminescence microscopy with a helium ion microscope." Thesis, University of Southampton, 2012. https://eprints.soton.ac.uk/352281/.
Full textSzelc, Jedrzej. "THz imaging and microscopy : a multiplexed near-field TeraHertz microscope." Thesis, University of Southampton, 2011. https://eprints.soton.ac.uk/209643/.
Full textWright, Adele Hart. "Design, development, and application of an automated precision scanning microscope stage with a controlled environment." Thesis, Georgia Institute of Technology, 1997. http://hdl.handle.net/1853/16409.
Full textYu, Enhua. "Crossed and uncrossed retinal fibres in normal and monocular hamsters : light and electron microscopic studies /." [Hong Kong : University of Hong Kong], 1990. http://sunzi.lib.hku.hk/hkuto/record.jsp?B13014316.
Full textToledo, Acosta Bertha Mayela. "Multimodal image registration in 2D and 3D correlative microscopy." Thesis, Rennes 1, 2018. http://www.theses.fr/2018REN1S054/document.
Full textThis thesis is concerned with the definition of an automated registration framework for 2D and 3D correlative microscopy images, in particular for correlative light and electron microscopy (CLEM) images. In recent years, CLEM has become an important and powerful tool in the bioimaging field. By using CLEM, complementary information can be collected from a biological sample. An overlay of the different microscopy images is commonly achieved using techniques involving manual assistance at several steps, which is demanding and time consuming for biologists. To facilitate and disseminate the CLEM process for biologists, the thesis work is focused on creating automatic registration methods that are reliable, easy to use and do not require parameter tuning or complex knowledge. CLEM registration has to deal with many issues due to the differences between electron microscopy and light microscopy images and their acquisition, both in terms of pixel resolution, image size, content, field of view and appearance. We have designed intensity-based methods to align CLEM images in 2D and 3D. They involved a common representation of the LM and EM images using the LoG transform, a pre-alignment step exploiting histogram-based similarities within an exhaustive search, and a fine mutual information-based registration. In addition, we have defined a robust motion model selection method, and a multiscale spot detection method which were exploited in the 2D CLEM registration. Our automated CLEM registration framework was successfully tested on several real 2D and 3D CLEM datasets and the results were validated by biologists, offering an excellent perspective in the usefulness of our methods
Battistella, Eliana. "Towards an improved photonic force microscope: a novel technique for biological microscopy." Master's thesis, Alma Mater Studiorum - Università di Bologna, 2017. http://amslaurea.unibo.it/14864/.
Full textRea, Nigel P. "Interference and laser feedback optical microscopy." Thesis, University of Oxford, 1995. http://ora.ox.ac.uk/objects/uuid:989c9fca-947d-490c-9f34-38065a7c57d9.
Full textRomero, Leiro Freddy José. "Poly-articulated microrobotics for correlative AFM-in-SEM microscopy." Electronic Thesis or Diss., Sorbonne université, 2023. https://accesdistant.sorbonne-universite.fr/login?url=https://theses-intra.sorbonne-universite.fr/2023SORUS520.pdf.
Full textCorrelative microscopy is the result of the combination of two or more microscopy techniques to provide complementary information on a sample. When using a scanning electron microscope (SEM) and an atomic force microscope (AFM), AFM-in-SEM correlative microscopy not only enables the 3D characterization of samples observed inside a SEM, but also the manipulation of micro- and nanostructures with an extremely high precision. This technique can be applied to various samples in biology, electronics and materials science. Although existing AFM-in-SEM solutions in the current state of the art are powerful, they require expert users; they are not versatile enough to be used for different types of tasks; and they use Cartesian AFM robots that severely limit the dexterity and performance of the imaging system. The aim of this thesis is to study and experiment an original concept of an AFM based on poly- articulated robotics for AFM-in-SEM correlative microscopy. A homemade 6 DoF (3 translations and 3 rotations) robotic AFM system is developed and integrated inside a SEM. The ability to control 3 positions and 3 rotations of a micrometer sized AFM probe while keeping the center of rotation at the close proximity of a micro-structure is very challenging. This is mainly due to the uncertainties inherent to the assembly of micro-robotic systems and clearances in the joints of the robot that are of the same order of magnitude as the required AFM probe positioning accuracy. Robot calibration methods and control theory can however overcome these limitations as demonstrated in the thesis. Control strategies and a user interface are studied to operate the multi DoF correlative imaging system in a versatile and intuitive way for low-level end users while keeping it enough powerful for high-level end users. Several key features that go beyond the state of the art are implemented, including - Vision based control for fast and automated landing of an AFM probe on a micrometer sized sample with robustness with respect to the SEM magnification. The user can select any region of interest (ROI) on a sample by simply performing a mouse click on the SEM screen. Whatever the SEM magnification, the control algorithm ensures a safe landing of the AFM probe on the ROI. The surface of the sample can be as high as several square centimeters and the positioning can be achieved with a micrometric precision. - In-plane and out-of-plane rotation of a sample relatively to the AFM probe while keeping the center of rotation around the tip of the AFM. The center of rotation is defined by the user with a mouse click on the SEM screen. This feature is useful for manipulation and topography tasks, as well as for multi-angle observations of a sample inside a SEM. - Trajectory/speed selection modes. Low speed AFM mode for a detailed topography imaging. Fast AFM mode (4fps) for dynamic observations at the nanoscale. The users also have access to the control parameters. They can be modified to suit their needs. - Mosaic AFM mode to extend the topography scanning area inside a SEM. All these features rely on research works in robotics, mechatronics and control made during the thesis. The latter has the potential to opens the door to a new era of poly-articulated atomic force microscopes used in correlative microscopy
Mattocks, Philip. "Scanning tunnelling microscopy and atomic force microscopy of semiconducting materials." Thesis, University of Manchester, 2012. https://www.research.manchester.ac.uk/portal/en/theses/scanning-tunnelling-microscopy-and-atomic-force-microscopy-of-semiconducting-materials(9bc10301-2c4d-4dfb-a374-f65ee37ae23a).html.
Full textBooks on the topic "Microscopy"
Thomas, Mulvey, and Sheppard C. J. R, eds. Advances inoptical and electron microscopy. London: Academic, 1990.
Find full textGoodhew, Peter J. Electron microscopy and analysis. 2nd ed. London: Taylor & Francis, 1988.
Find full textBradbury, Savile. An introduction to the optical microscope. Oxford: Bios, 1994.
Find full textBradbury, Savile. An introduction to the optical microscope. Oxford: Oxford University Press, 1988.
Find full textSlayter, Elizabeth M. Light and electron microscopy. Cambridge [England]: Cambridge University Press, 1992.
Find full textBurgess, Jeremy. The magnified world. Vero Beach, FL: Rourke Enterprises, 1988.
Find full textThomas, Mulvey, and Sheppard C. J. R, eds. Advances in optical and electron microscopy. London: Academic Press, 1994.
Find full textR, Beanland, and Humphreys F. J, eds. Electron microscopy and analysis. 3rd ed. London: Taylor & Francis, 2001.
Find full textThomas, Mulvey, and Sheppard C. J. R, eds. Advances in optical and electron microscopy. London: Academic Press, 1994.
Find full textPluta, Maksymilian. Advanced light microscopy. Warszawa: PWN, 1988.
Find full textBook chapters on the topic "Microscopy"
Maddalena, Laura, Paolo Pozzi, Nicolò G. Ceffa, Bas van der Hoeven, and Elizabeth C. Carroll. "Optogenetics and Light-Sheet Microscopy." In Neuromethods, 231–61. New York, NY: Springer US, 2023. http://dx.doi.org/10.1007/978-1-0716-2764-8_8.
Full textNichols, Gary, Shen Luk, and Clive Roberts. "Microscopy." In Solid State Characterization of Pharmaceuticals, 287–355. Chichester, UK: John Wiley & Sons, Ltd, 2011. http://dx.doi.org/10.1002/9780470656792.ch9.
Full textAllen, Terence. "Microscopy." In Particle Size Measurement, 217–48. Dordrecht: Springer Netherlands, 1990. http://dx.doi.org/10.1007/978-94-009-0417-0_6.
Full textBuxbaum, Engelbert. "Microscopy." In Biophysical Chemistry of Proteins, 3–22. Boston, MA: Springer US, 2010. http://dx.doi.org/10.1007/978-1-4419-7251-4_1.
Full textSprott, G. Dennis, and Terry J. Beveridge. "Microscopy." In Methanogenesis, 81–127. Boston, MA: Springer US, 1993. http://dx.doi.org/10.1007/978-1-4615-2391-8_3.
Full textKeiser, Gerd. "Microscopy." In Graduate Texts in Physics, 233–58. Singapore: Springer Singapore, 2016. http://dx.doi.org/10.1007/978-981-10-0945-7_8.
Full textDehonor, Mariamne, Carlos López-Barrón, and Christopher W. Macosko. "Microscopy." In Handbook of Polymer Synthesis, Characterization, and Processing, 409–24. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2013. http://dx.doi.org/10.1002/9781118480793.ch20.
Full textGooch, Jan W. "Microscopy." In Encyclopedic Dictionary of Polymers, 462. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_7487.
Full textSims, Tony, and Qiuyu Wang. "Microscopy." In Biomedical Science Practice. Oxford University Press, 2022. http://dx.doi.org/10.1093/hesc/9780198831228.003.0007.
Full textFurness, David N. "Electron microscopy." In Histopathology, edited by Guy Orchard and Brian Nation. Oxford University Press, 2017. http://dx.doi.org/10.1093/hesc/9780198717331.003.0015.
Full textConference papers on the topic "Microscopy"
Incardona, Nicolo, Angel Tolosa, Gabriele Scrofani, Manuel Martinez-Corral, and Genaro Saavedra. "The Lightfield Eyepiece: an Add-on for 3D Microscopy." In 3D Image Acquisition and Display: Technology, Perception and Applications. Washington, D.C.: Optica Publishing Group, 2022. http://dx.doi.org/10.1364/3d.2022.3tu5a.6.
Full textMasters, Barry R., and Andreas A. Thaer. "Confocal Microscopy of the Human In Vivo Cornea." In Ophthalmic and Visual Optics. Washington, D.C.: Optica Publishing Group, 1993. http://dx.doi.org/10.1364/ovo.1993.osab.2.
Full textGoodman, Douglas S. "Fiber-optic illuminators for microscopy." In OSA Annual Meeting. Washington, D.C.: Optica Publishing Group, 1987. http://dx.doi.org/10.1364/oam.1987.wg6.
Full textRastogi, Vivek, Shilpi Agarwal, Satish Dubey, Gufran Khan, and Chandra Shakher. "Microscopic urinalysis by digital holographic microscopy." In Holography, Diffractive Optics, and Applications IX, edited by Changhe Zhou, Yunlong Sheng, and Liangcai Cao. SPIE, 2019. http://dx.doi.org/10.1117/12.2537315.
Full textDixon, A. E. "Confocal microscopy." In OSA Annual Meeting. Washington, D.C.: Optica Publishing Group, 1993. http://dx.doi.org/10.1364/oam.1993.tue.1.
Full textWegscheider, S., A. Georgi, V. Sandoghdar, G. Krausch, and J. Mlynek. "Scanning near-field optical lithography." In The European Conference on Lasers and Electro-Optics. Washington, D.C.: Optica Publishing Group, 1996. http://dx.doi.org/10.1364/cleo_europe.1996.cfa4.
Full textSpector, S. J., C. J. Jacobsen, and D. M. Tennant. "Fabrication of Fresnel zone plates for x-ray microscopy: diffractive optics for soft x-rays." In Diffractive Optics and Micro-Optics. Washington, D.C.: Optica Publishing Group, 1996. http://dx.doi.org/10.1364/domo.1996.dwd.6.
Full textChmelik, Radim. "Advances in digital holographic microscopy: coherence-controlled microscope." In SPIE Optics + Optoelectronics, edited by Miroslav Hrabovský, Miroslav Miler, and John T. Sheridan. SPIE, 2011. http://dx.doi.org/10.1117/12.888733.
Full textConchello, José-Angel, and Eric W. Hansen. "Resolution and signal-to-noise trade-offs in confocal scanning microscopy." In OSA Annual Meeting. Washington, D.C.: Optica Publishing Group, 1989. http://dx.doi.org/10.1364/oam.1989.fi2.
Full textTrovatello, C., A. Genco, C. Cruciano, B. Ardini, Q. Li, X. Zhu, G. Valentini, G. Cerullo, and C. Manzoni. "Hyperspectral microscopy of two-dimensional semiconductors." In Latin America Optics and Photonics Conference. Washington, D.C.: Optica Publishing Group, 2022. http://dx.doi.org/10.1364/laop.2022.th1d.7.
Full textReports on the topic "Microscopy"
Snyder, Shelly R., and Henry S. White. Scanning Tunneling Microscopy, Atomic Force Microscopy, and Related Techniques. Fort Belvoir, VA: Defense Technical Information Center, February 1992. http://dx.doi.org/10.21236/ada246852.
Full textDow, John D. Scanning Tunneling Microscopy. Fort Belvoir, VA: Defense Technical Information Center, March 1992. http://dx.doi.org/10.21236/ada249262.
Full textLegg, Keith O., and Douglas N. Rose. Ion Acoustic Microscopy. Fort Belvoir, VA: Defense Technical Information Center, July 1985. http://dx.doi.org/10.21236/ada169492.
Full textQuate, C. F. Cryogenic Acoustic Microscopy. Fort Belvoir, VA: Defense Technical Information Center, July 1986. http://dx.doi.org/10.21236/ada173188.
Full textHammel, P. Microscopic subsurface characterization of layered magnetic materials using magnetic resonance force microscopy. Office of Scientific and Technical Information (OSTI), December 2019. http://dx.doi.org/10.2172/1580650.
Full textBentley, J. (Future of electron microscopy). Office of Scientific and Technical Information (OSTI), October 1989. http://dx.doi.org/10.2172/5651701.
Full textBotkin, D. A. Ultrafast scanning tunneling microscopy. Office of Scientific and Technical Information (OSTI), September 1995. http://dx.doi.org/10.2172/270266.
Full textWitham, Philip. Pinhole Neutral Atom Microscopy. Portland State University Library, January 2000. http://dx.doi.org/10.15760/etd.1407.
Full textWeber, Peter M. Time-Resolved Scanning Electron Microscopy. Fort Belvoir, VA: Defense Technical Information Center, June 2006. http://dx.doi.org/10.21236/ada455461.
Full textHawley, M. E., D. W. Reagor, and Quan Xi Jia. Scanning probe microscopy competency development. Office of Scientific and Technical Information (OSTI), December 1998. http://dx.doi.org/10.2172/562576.
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