Relevant bibliographies by topics / Microscopy

Academic literature on the topic 'Microscopy'

Author: Grafiati
Published: 4 June 2021
Last updated: 29 July 2024

Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles

Select a source type:

Contents

Consult the lists of relevant articles, books, theses, conference reports, and other scholarly sources on the topic 'Microscopy.'

Next to every source in the list of references, there is an 'Add to bibliography' button. Press on it, and we will generate automatically the bibliographic reference to the chosen work in the citation style you need: APA, MLA, Harvard, Chicago, Vancouver, etc.

You can also download the full text of the academic publication as pdf and read online its abstract whenever available in the metadata.

Journal articles on the topic "Microscopy"

1

Schatten, G., J. Pawley, and H. Ris. "Integrated microscopy resource for biomedical research at the university of wisconsin at madison." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 594–97. http://dx.doi.org/10.1017/s0424820100127451.

Full text
Abstract:
The High Voltage Electron Microscopy Laboratory [HVEM] at the University of Wisconsin-Madison, a National Institutes of Health Biomedical Research Technology Resource, has recently been renamed the Integrated Microscopy Resource for Biomedical Research [IMR]. This change is designed to highlight both our increasing abilities to provide sophisticated microscopes for biomedical investigators, and the expansion of our mission beyond furnishing access to a million-volt transmission electron microscope. This abstract will describe the current status of the IMR, some preliminary results, our upcoming plans, and the current procedures for applying for microscope time.The IMR has five principal facilities: 1.High Voltage Electron Microscopy2.Computer-Based Motion Analysis3.Low Voltage High-Resolution Scanning Electron Microscopy4.Tandem Scanning Reflected Light Microscopy5.Computer-Enhanced Video MicroscopyThe IMR houses an AEI-EM7 one million-volt transmission electron microscope.
APA, Harvard, Vancouver, ISO, and other styles
2

Chen, Xiaodong, Bin Zheng, and Hong Liu. "Optical and Digital Microscopic Imaging Techniques and Applications in Pathology." Analytical Cellular Pathology 34, no. 1-2 (2011): 5–18. http://dx.doi.org/10.1155/2011/150563.

Full text
Abstract:
The conventional optical microscope has been the primary tool in assisting pathological examinations. The modern digital pathology combines the power of microscopy, electronic detection, and computerized analysis. It enables cellular-, molecular-, and genetic-imaging at high efficiency and accuracy to facilitate clinical screening and diagnosis. This paper first reviews the fundamental concepts of microscopic imaging and introduces the technical features and associated clinical applications of optical microscopes, electron microscopes, scanning tunnel microscopes, and fluorescence microscopes. The interface of microscopy with digital image acquisition methods is discussed. The recent developments and future perspectives of contemporary microscopic imaging techniques such as three-dimensional and in vivo imaging are analyzed for their clinical potentials.
APA, Harvard, Vancouver, ISO, and other styles
3

J. H., Youngblom, Wilkinson J., and Youngblom J.J. "Telepresence Confocal Microscopy." Microscopy and Microanalysis 6, S2 (August 2000): 1164–65. http://dx.doi.org/10.1017/s1431927600038319.

Full text
Abstract:
The advent of the Internet has allowed the development of remote access capabilities to a growing variety of microscopy systems. The Materials MicroCharacterization Collaboratory, for example, has developed an impressive facility that provides remote access to a number of highly sophisticated microscopy and microanalysis instruments. While certain types of microscopes, such as scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, and others have already been established for telepresence microscopy, no one has yet reported on the development of similar capabilities for the confocal laser scanning microscope.At California State University-Stanislaus, home of the CSUPERB (California State University Program for Education and Research in Biotechnology) Confocal Microscope Core Facility, we have established a remote access confocal laser scanning microscope facility that allows users with virtually any type of computer platform to connect to our system. Our Leica TCS NT confocal system, with an interchangeable upright (DMRXE) and inverted microscope (DMIRBE) set up,
APA, Harvard, Vancouver, ISO, and other styles
4

Youngblom, J. H., J. Wilkinson, and J. J. Youngblom. "Telepresence Confocal Microscopy." Microscopy Today 8, no. 10 (December 2000): 20–21. http://dx.doi.org/10.1017/s1551929500054146.

Full text
Abstract:
The advent of the Internet has allowed the development of remote access capabilities to a growing variety of microscopy systems. The Materials MicroCharacterization Collaboratory, for example, has developed an impressive facility that provides remote access to a number of highly sophisticated microscopy and microanalysis instruments, While certain types of microscopes, such as scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, and others have already been established for telepresence microscopy, no one has yet reported on the development of similar capabilities for the confocal laser scanning microscope.
APA, Harvard, Vancouver, ISO, and other styles
5

Brooks, Donald A. "The College of Microscopy — Meeting Rapidly Growing Microscopy Demands." Microscopy Today 15, no. 4 (July 2007): 51. http://dx.doi.org/10.1017/s1551929500055735.

Full text
Abstract:
The McCrone Group Inc. recently announced the completion of a 40,000 sq ft addition to house its new College of Microscopy. Since its founding in 1956, The McCrone Group has grown into a multi-faceted organization and now encompasses three main organizations, McCrone Associates - the analytical service and consulting firm; McCrone Microscopes & Accessories - the microscope and instrument sales group; and, the College of Microscopy - the microscopy learning center. The newly completed addition houses the first and only College of Microscopy and offers the largest array of basic and advanced modern microscopy courses and analytical instrumentation within any single educational facility worldwide. At The McCrone Group, we have more than $15 million worth of microscopes and analytical instrumentation and assembled one of the best scientific/administrative teams in the world.
APA, Harvard, Vancouver, ISO, and other styles
6

Graef, M. De, N. T. Nuhfer, and N. J. Cleary. "Implementation Of A Digital Microscopy Teaching Environment." Microscopy and Microanalysis 5, S2 (August 1999): 4–5. http://dx.doi.org/10.1017/s1431927600013349.

Full text
Abstract:
The steady evolution of computer controlled electron microscopes is dramatically changing the way we teach microscopy. For today’s microscopy student, an electron microscope may be just another program on the desktop of whatever computer platform he or she uses. This is reflected in the use of the term Desktop Microscopy. The SEM in particular has become a mouse and keyboard controlled machine, and running the microscope is not very different from using a drawing program or a word processor. Transmission electron microscopes are headed in the same direction.While one can debate whether or not it is wise to treat an SEM or a TEM as just another black-box computer program, it is a fact that these machines are here to stay, which means that microscopy educators must adapt their traditional didactic tools and methods. One way to bring electron microscopes into the classroom is through the use of remote control software packages, such as Timbuktu Pro or PC-Anywhere. The remote user essentially opens a window containing the desktop of the microscope control computer and has all functions available. On microscopes with specialized graphics boards, integration of the image and control display for remote operation may not be straightforward, and often requires the purchase of additional graphics boards for the remote machine.
APA, Harvard, Vancouver, ISO, and other styles
7

Martone, Maryann E. "Bridging the Resolution Gap: Correlated 3D Light and Electron Microscopic Analysis of Large Biological Structures." Microscopy and Microanalysis 5, S2 (August 1999): 526–27. http://dx.doi.org/10.1017/s1431927600015956.

Full text
Abstract:
One class of biological structures that has always presented special difficulties to scientists interested in quantitative analysis is comprised of extended structures that possess fine structural features. Examples of these structures include neuronal spiny dendrites and organelles such as the Golgi apparatus and endoplasmic reticulum. Such structures may extend 10's or even 100's of microns, a size range best visualized with the light microscope, yet possess fine structural detail on the order of nanometers that require the electron microscope to resolve. Quantitative information, such as surface area, volume and the micro-distribution of cellular constituents, is often required for the development of accurate structural models of cells and organelle systems and for assessing and characterizing changes due to experimental manipulation. Performing estimates of such quantities from light microscopic data can result in gross inaccuracies because the contribution to total morphometries of delicate features such as membrane undulations and excrescences can be quite significant. For example, in a recent study by Shoop et al, electron microscopic analysis of cultured chick ciliary ganglion neurons showed that spiny projections from the plasmalemma that were not well resolved in the light microscope effectively doubled the surface area of these neurons.While the resolution provided by the electron microscope has yet to be matched or replaced by light microscopic methods, one drawback of electron microscopic analysis has always been the relatively small sample size and limited 3D information that can be obtained from samples prepared for conventional transmission electron microscopy. Reconstruction from serial electron micrographs has provided one way to circumvent this latter problem, but remains one of the most technically demanding skills in electron microscopy. Another approach to 3D electron microscopic imaging is high voltage electron microscopy (HVEM). The greater accelerating voltages of HVEM's allows for the use of much thicker specimens than conventional transmission electron microscopes.
APA, Harvard, Vancouver, ISO, and other styles
8

Youngblom, J. H., J. Wilkinson, and J. J. Youngblom. "Confocal Laser Scanning Microscopy By Remote Access." Microscopy Today 7, no. 7 (September 1999): 32–33. http://dx.doi.org/10.1017/s1551929500064798.

Full text
Abstract:
In recent years there have been a growing number of facilities interested in developing remote access capabilities to a variety of microscopy systems. While certain types of microscopes, such as electron microscopes and scanning probe microscopes have been well established for telepresence microscopy, no one has yet reported on the development of similar capabilities for the confocal microscope.At California State University, home to the CSUPERB (California State University Program for Education and Research in Biotechnology) Confocal Microscope Core Facility, we have established a remote access confocal laser scanning microscope facility that allows users with virtually any type of computer platform to connect to our system.
APA, Harvard, Vancouver, ISO, and other styles
9

O'Keefe, Michael A., John H. Turner, John A. Musante, Crispin J. D. Hetherington, A. G. Cullis, Bridget Carragher, Ron Jenkins, et al. "Laboratory Design for High-Performance Electron Microscopy." Microscopy Today 12, no. 3 (May 2004): 8–17. http://dx.doi.org/10.1017/s1551929500052093.

Full text
Abstract:
Since publication of the classic text on the electron microscope laboratory by Anderson, the proliferation of microscopes with field emission guns, imaging filters and hardware spherical aberration correctors (giving higher spatial and energy resolution) has resulted in the need to construct special laboratories. As resolutions iinprovel transmission electron microscopes (TEMs) and scanning transmission electron microscopes (STEMs) become more sensitive to ambient conditions. State-of-the-art electron microscopes require state-of-the-art environments, and this means careful design and implementation of microscope sites, from the microscope room to the building that surrounds it. Laboratories have been constructed to house high-sensitive instruments with resolutions ranging down to sub-Angstrom levels; we present the various design philosophies used for some of these laboratories and our experiences with them. Four facilities are described: the National Center for Electron Microscopy OAM Laboratory at LBNL; the FEGTEM Facility at the University of Sheffield; the Center for Integrative Molecular Biosciences at TSRI; and the Advanced Microscopy Laboratory at ORNL.
APA, Harvard, Vancouver, ISO, and other styles
10

Möller, Lars, Gudrun Holland, and Michael Laue. "Diagnostic Electron Microscopy of Viruses With Low-voltage Electron Microscopes." Journal of Histochemistry & Cytochemistry 68, no. 6 (May 21, 2020): 389–402. http://dx.doi.org/10.1369/0022155420929438.

Full text
Abstract:
Diagnostic electron microscopy is a useful technique for the identification of viruses associated with human, animal, or plant diseases. The size of virus structures requires a high optical resolution (i.e., about 1 nm), which, for a long time, was only provided by transmission electron microscopes operated at 60 kV and above. During the last decade, low-voltage electron microscopy has been improved and potentially provides an alternative to the use of high-voltage electron microscopy for diagnostic electron microscopy of viruses. Therefore, we have compared the imaging capabilities of three low-voltage electron microscopes, a scanning electron microscope equipped with a scanning transmission detector and two low-voltage transmission electron microscopes, operated at 25 kV, with the imaging capabilities of a high-voltage transmission electron microscope using different viruses in samples prepared by negative staining and ultrathin sectioning. All of the microscopes provided sufficient optical resolution for a recognition of the viruses tested. In ultrathin sections, ultrastructural details of virus genesis could be revealed. Speed of imaging was fast enough to allow rapid screening of diagnostic samples at a reasonable throughput. In summary, the results suggest that low-voltage microscopes are a suitable alternative to high-voltage transmission electron microscopes for diagnostic electron microscopy of viruses.
APA, Harvard, Vancouver, ISO, and other styles
More sources

Dissertations / Theses on the topic "Microscopy"

1

Payton, Oliver David. "High-speed atomic force microscopy under the microscope." Thesis, University of Bristol, 2012. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.574416.

Full text
Abstract:
SINCE its invention in 1986, the atomic force microscope (AFM) has revolutionised the field of nanotechnology and nanoscience. It is a tool that has enabled research into areas of medicine, advanced materials, biology, chemistry and physics. However due to its low frame rate it is a tool that has been limited to imaging small areas using a time lapse technique. It has only been in recent years that the frame rate of the device has been increased in a tool known as high-speed AFM (HSAFM). This increased frame rate allows, for the first time, biological processes to be viewed in real time or macro sized areas to be imaged with nanoscale resolution. The research presented here concentrates on a specific type of high-speed AFM developed at the University of Bristol called contact mode HSAFM. This thesis explains how the microscope is able to function, and presents a leap in image quality due to an increased understanding of the dynamics of the system. The future of the device is also discussed. III
APA, Harvard, Vancouver, ISO, and other styles
2

Franklin, Thomas. "Scanning ionoluminescence microscopy with a helium ion microscope." Thesis, University of Southampton, 2012. https://eprints.soton.ac.uk/352281/.

Full text
Abstract:
The ORIONR PLUS scanning helium ion microscope (HIM) images at sub nanometer resolution. Images of the secondary electron emission have superior resolution and depth of field compared to a scanning electron microscope (SEM). Ionoluminescent imaging is not an area that has been extensively explored by typical ion beam systems as they have large spot sizes in the region of microns, leading to poor spatial resolution. This thesis confirms that the ORIONR PLUS can form images from the ionoluminescent signal, resolutions of 20nm can be obtained for images of bright nanoparticles. Ionoluminescence spectra can also be obtained from some samples. The position of emission peaks in samples under the ORIONR PLUS does not deviate significantly from cathodoluminescence (CL) peaks under SEM. However, the relative heights of the emission peaks in a sample can vary between ionoluminescence (IL) and CL. In addition, It is found that there exists a proportional relationship between acceleration voltage and ionoluminescent signal in the ORIONR PLUS, this relationship is also exhibited in CL. However, when normalised for current and acceleration voltage there appears to be no samples that show greater luminescence under ionoluminescence than cathodoluminescence, with ionoluminescent intensities up to an order of magnitude lower. Ionoluminescence under the ORIONR PLUS is found to be a poor candidate for the analysis of direct band gap semiconductors, this is attributed to the smaller interaction volumes and achievable beam current of the ORIONR PLUS. It is also found that some direct band gap materials are very susceptible to beam damage under the ion beam at beam doses typically used for secondary electron (SE) imaging. It is possible to obtain simultaneous IL and SE images of organic fluorospores in a biological sample. However, the luminescence of the fluorospores was only just sufficient to form images with a 200nm resolution. Rare earth based nanoparticles show brighter luminescence and greater resistance to beam damage than organic fluorospores. If such particles could be utilised for immunofluorescence it would make combined secondary electron and immunofluorescence imaging under the ORIONR PLUS a viable technique.
APA, Harvard, Vancouver, ISO, and other styles
3

Szelc, Jedrzej. "THz imaging and microscopy : a multiplexed near-field TeraHertz microscope." Thesis, University of Southampton, 2011. https://eprints.soton.ac.uk/209643/.

Full text
APA, Harvard, Vancouver, ISO, and other styles
4

Wright, Adele Hart. "Design, development, and application of an automated precision scanning microscope stage with a controlled environment." Thesis, Georgia Institute of Technology, 1997. http://hdl.handle.net/1853/16409.

Full text
APA, Harvard, Vancouver, ISO, and other styles
5

Yu, Enhua. "Crossed and uncrossed retinal fibres in normal and monocular hamsters : light and electron microscopic studies /." [Hong Kong : University of Hong Kong], 1990. http://sunzi.lib.hku.hk/hkuto/record.jsp?B13014316.

Full text
APA, Harvard, Vancouver, ISO, and other styles
6

Toledo, Acosta Bertha Mayela. "Multimodal image registration in 2D and 3D correlative microscopy." Thesis, Rennes 1, 2018. http://www.theses.fr/2018REN1S054/document.

Full text
Abstract:
Cette thèse porte sur la définition d'un schéma de recalage automatique en microscopie corrélative 2D et 3D, en particulier pour des images de microscopie optique et électronique (CLEM). Au cours des dernières années, la CLEM est devenue un outil d'investigation important et puissant dans le domaine de la bio-imagerie. En utilisant la CLEM, des informations complémentaires peuvent être collectées à partir d'un échantillon biologique. La superposition des différentes images microscopiques est généralement réalisée à l'aide de techniques impliquant une assistance manuelle à plusieurs étapes, ce qui est exigeant et prend beaucoup de temps pour les biologistes. Pour faciliter et diffuser le procédé de CLEM, notre travail de thèse est axé sur la création de méthodes de recalage automatique qui soient fiables, faciles à utiliser et qui ne nécessitent pas d'ajustement de paramètres ou de connaissances complexes. Le recalage CLEM doit faire face à de nombreux problèmes dus aux différences entre les images de microscopie électronique et optique et leur mode d'acquisition, tant en termes de résolution du pixel, de taille des images, de contenu, de champ de vision et d'apparence. Nous avons conçu des méthodes basées sur l'intensité des images pour aligner les images CLEM en 2D et 3D. Elles comprennent plusieurs étapes : représentation commune des images LM et EM à l'aide de la transformation LoG, pré-alignement exploitant des mesures de similarité à partir d'histogrammes avec une recherche exhaustive, et un recalage fin basé sur l'information mutuelle. De plus, nous avons défini une méthode de sélection robuste de modèles de mouvement, et un méthode de détection multi-échelle de spots, que nous avons exploitées dans le recalage CLEM 2D. Notre schéma de recalage automatisé pour la CLEM a été testé avec succès sur plusieurs ensembles de données CLEM réelles 2D et 3D. Les résultats ont été validés par des biologistes, offrant une excellente perspective sur l'utilité de nos développements
This thesis is concerned with the definition of an automated registration framework for 2D and 3D correlative microscopy images, in particular for correlative light and electron microscopy (CLEM) images. In recent years, CLEM has become an important and powerful tool in the bioimaging field. By using CLEM, complementary information can be collected from a biological sample. An overlay of the different microscopy images is commonly achieved using techniques involving manual assistance at several steps, which is demanding and time consuming for biologists. To facilitate and disseminate the CLEM process for biologists, the thesis work is focused on creating automatic registration methods that are reliable, easy to use and do not require parameter tuning or complex knowledge. CLEM registration has to deal with many issues due to the differences between electron microscopy and light microscopy images and their acquisition, both in terms of pixel resolution, image size, content, field of view and appearance. We have designed intensity-based methods to align CLEM images in 2D and 3D. They involved a common representation of the LM and EM images using the LoG transform, a pre-alignment step exploiting histogram-based similarities within an exhaustive search, and a fine mutual information-based registration. In addition, we have defined a robust motion model selection method, and a multiscale spot detection method which were exploited in the 2D CLEM registration. Our automated CLEM registration framework was successfully tested on several real 2D and 3D CLEM datasets and the results were validated by biologists, offering an excellent perspective in the usefulness of our methods
APA, Harvard, Vancouver, ISO, and other styles
7

Battistella, Eliana. "Towards an improved photonic force microscope: a novel technique for biological microscopy." Master's thesis, Alma Mater Studiorum - Università di Bologna, 2017. http://amslaurea.unibo.it/14864/.

Full text
Abstract:
Una delle tecniche più note nello studio topografico di campioni biologici è l’AFM. Ci sono però limitazioni dovute alla presenza del cantilever, il quale pone un limite nella forza minima applicabile su un campione per ottenere un’immagine topografica. Questa forza (ordine dei 10 pN) può essere sufficiente a danneggiare il campione e a deformare i dettagli topografici che si vorrebbero evidenziare. Per superare questo problema si può usare un Photonic Force Microscope, dove il cantilever è sostituito da Optical Tweezers. Questa tecnica permette di effettuare scansioni di campioni biologici applicando forze dell’ordine dei 100 fN. All’interno della trappola ottica viene posizionata una microparticella che agisce da sonda, attraverso la quale possono essere rilevati dettagli topografici del campione. La differenza rispetto al PFM tradizionale si trova proprio nel tipo di sonda utilizzata durante la scansione. Lo standard prevede l’utilizzo di una sonda sferica, di dimensioni dell’ordine dei 100 nm mentre l’ipotesi è che si possano utilizzare delle sonde cilindriche con alla base un dettaglio acuminato che richiama la punta dell’AFM. Questo tipo di sonda consentirebbe di raggiungere una risoluzione maggiore, rispetto al PFM tradizionale, che risente del limite dato dal diametro della sfera. Due differenti setup per la PFM sono stati costruiti e testati durante questo periodo di tesi. Sono state testate diverse microparticelle cilindriche, di dimensioni differenti in termini di aspect ratio con lo scopo di osservare la stabilità di questo tipo di sonda. Nei risultati viene proposto un metodo per controllare la stabilità e l’orientazione della microparticella cilindrica all’interno della trappola ottica. Viene inoltre fatta un’ipotesi su un metodo per stimare la lunghezza della punta che dovrà essere verificata da una misura sistematica. I risultati preliminari riguardanti la scansione di strutture note suggeriscono la validità dell’uso di questo nuovo tipo di sonda.
APA, Harvard, Vancouver, ISO, and other styles
8

Rea, Nigel P. "Interference and laser feedback optical microscopy." Thesis, University of Oxford, 1995. http://ora.ox.ac.uk/objects/uuid:989c9fca-947d-490c-9f34-38065a7c57d9.

Full text
Abstract:
This thesis concerns the development of simple, compact scanning optical microscopes which can obtain confocal and interference images. The effects of feeding the reflected signal back into the laser cavity of a confocal microscope are investigated and exploited. Monomode optical fibres are used to perform the spatial filtering required for confocal microscopy and, later, as the source of reference beams for interferometry. The theory describing the basic operation of the microscopes is developed. The optical systems are modelled using scalar diffraction theory and the effects of optical feedback into the laser cavity are described, with the practical implications emphasised. A fully reciprocal arrangement of the microscope is developed, in which a single mode optical fibre both launches the signal towards the object and then collects the reflected signal. The fibre is shown to exhibit the spatial filtering properties required for the source and detector in a confocal microscope. It is shown that a semiconductor laser can be used as a detector of the amplitude of the object signal. This is first demonstrated by directing the microscope signal back into the laser cavity and measuring the variation of the optical intensity in the cavity itself. Comparable results are obtained when the variation of the junction voltage across the cavity is measured. It is also shown that the optical fibre is redundant in this system, since the lasing mode of the cavity itself is sufficiently small to adequately spatially filter the reflected signal. When a Helium-Neon laser is used as the source of illumination the effect of the feedback on the laser is seen to be very different, resulting in interferometry. It is shown that high frequency modulation techniques can be used to obtain both confocal images and surface profiles from the same system. This is first demonstrated using an optical feedback scheme in which the modulation of the optical path length of the object beam is controlled electrooptically. In an alternative scheme the images are obtained by calculation, rather than by using a control loop system. In this case the modulation is achieved mechanically. The theoretical limits for the resolutions of the systems described are discussed. It is shown that the lateral resolution of the surface profile systems is inherently non-linear with feature height. Finally, a semiconductor laser based microscope is developed which can obtain confocal images and surface profiles independently. The dependence of the wavelength on the injection current is exploited as a convenient means of introducing a phase shift into the feedback signal by which profilometry can be achieved. All the systems are described theoretically and demonstrated experimentally.
APA, Harvard, Vancouver, ISO, and other styles
9

Romero, Leiro Freddy José. "Poly-articulated microrobotics for correlative AFM-in-SEM microscopy." Electronic Thesis or Diss., Sorbonne université, 2023. https://accesdistant.sorbonne-universite.fr/login?url=https://theses-intra.sorbonne-universite.fr/2023SORUS520.pdf.

Full text
Abstract:
La microscopie corrélative est le résultat de la combinaison de deux ou plusieurs techniques de microscopie pour fournir des informations complémentaires sur un échantillon. En utilisant un microscope électronique à balayage (MEB) et un microscope à force atomique (AFM), la microscopie corrélative AFM-in-SEM permet non seulement la caractérisation 3D d'échantillons observés à l'intérieur d'un MEB, mais aussi la manipulation de micro- et nanostructures avec une très grande précision. Cette technique peut être appliquée à divers échantillons dans les domaines de la biologie, de l'électronique et de la science des matériaux. Bien que les solutions AFM-in-SEM existantes dans l'état actuel soient puissantes, elles nécessitent des utilisateurs experts, elles ne sont pas assez polyvalentes pour être utilisées pour différents types de tâches et elles utilisent des robots AFM cartésiens qui limitent fortement la dextérité et la performance du système d'imagerie. L'objectif de cette thèse est d'étudier et d'expérimenter un concept original d'AFM basé sur la robotique poly-articulée pour la microscopie corrélative AFM-in-SEM. Un système robotique AFM à 6 ddls (3 translations et 3 rotations) est développé et intégré à l'intérieur d'un MEB. La capacité de contrôler 3 positions et 3 rotations d'une sonde AFM de taille micrométrique tout en maintenant le centre de rotation à proximité d'une micro-structure est un véritable défi. Cela est principalement dû aux incertitudes inhérentes à l'assemblage des systèmes micro-robotiques et aux jeux mécaniques dans les articulations du robot qui sont du même ordre de grandeur que la précision requise pour le positionnement de la sonde AFM. Les méthodes d'étalonnage des robots et la théorie du contrôle peuvent cependant surmonter ces limitations, comme le démontre cette thèse. Des stratégies de contrôle et une interface utilisateur sont étudiées pour faire fonctionner le système d'imagerie corrélative multi-ddl de manière polyvalente et intuitive. Plusieurs caractéristiques clés qui vont au-delà de l'état de l'art sont mises en œuvre, notamment - Le contrôle par vision électronique (MEB) permet l'atterrissage rapide et automatisé d'une sonde AFM sur un échantillon de taille micrométrique, avec une robustesse par rapport au grossissement du MEB. L'utilisateur peut sélectionner n'importe quelle région d'intérêt (ROI) sur un échantillon en cliquant simplement sur l'écran du MEB. Quel que soit le grossissement du MEB, l'algorithme de contrôle assure un atterrissage sûr de la sonde AFM sur la région d'intérêt. La surface de l'échantillon peut atteindre plusieurs centimètres carrés et le positionnement peut être réalisé avec une précision micrométrique. - Rotation dans le plan et hors du plan d'un échantillon par rapport à la sonde AFM tout en maintenant le centre de rotation autour de la pointe de l'AFM. Le centre de rotation est défini par l'utilisateur par un clic de souris sur l'écran du MEB. Cette fonction est utile pour les tâches de manipulation et de topographie, ainsi que pour les observations multi-angles d'un échantillon à l'intérieur d'un MEB. - Modes de sélection de la trajectoire et de la vitesse de la sonde AFM. Mode AFM à faible vitesse pour une imagerie topographique détaillée. Mode AFM rapide (4fps) pour des observations dynamiques à l'échelle nanométrique. Les utilisateurs ont également accès aux paramètres de contrôle. Ils peuvent être modifiés en fonction de leurs besoins. - Mode AFM mosaïque pour étendre la zone de balayage de la topographie à l'intérieur d'un MEB. Toutes ces caractéristiques s'appuient sur les travaux de recherche en robotique, mécatronique et contrôle réalisés au cours de la thèse. Ces derniers ont le potentiel d'ouvrir la porte à une nouvelle ère de microscopes à force atomique poly-articulés utilisés en microscopie corrélative
Correlative microscopy is the result of the combination of two or more microscopy techniques to provide complementary information on a sample. When using a scanning electron microscope (SEM) and an atomic force microscope (AFM), AFM-in-SEM correlative microscopy not only enables the 3D characterization of samples observed inside a SEM, but also the manipulation of micro- and nanostructures with an extremely high precision. This technique can be applied to various samples in biology, electronics and materials science. Although existing AFM-in-SEM solutions in the current state of the art are powerful, they require expert users; they are not versatile enough to be used for different types of tasks; and they use Cartesian AFM robots that severely limit the dexterity and performance of the imaging system. The aim of this thesis is to study and experiment an original concept of an AFM based on poly- articulated robotics for AFM-in-SEM correlative microscopy. A homemade 6 DoF (3 translations and 3 rotations) robotic AFM system is developed and integrated inside a SEM. The ability to control 3 positions and 3 rotations of a micrometer sized AFM probe while keeping the center of rotation at the close proximity of a micro-structure is very challenging. This is mainly due to the uncertainties inherent to the assembly of micro-robotic systems and clearances in the joints of the robot that are of the same order of magnitude as the required AFM probe positioning accuracy. Robot calibration methods and control theory can however overcome these limitations as demonstrated in the thesis. Control strategies and a user interface are studied to operate the multi DoF correlative imaging system in a versatile and intuitive way for low-level end users while keeping it enough powerful for high-level end users. Several key features that go beyond the state of the art are implemented, including - Vision based control for fast and automated landing of an AFM probe on a micrometer sized sample with robustness with respect to the SEM magnification. The user can select any region of interest (ROI) on a sample by simply performing a mouse click on the SEM screen. Whatever the SEM magnification, the control algorithm ensures a safe landing of the AFM probe on the ROI. The surface of the sample can be as high as several square centimeters and the positioning can be achieved with a micrometric precision. - In-plane and out-of-plane rotation of a sample relatively to the AFM probe while keeping the center of rotation around the tip of the AFM. The center of rotation is defined by the user with a mouse click on the SEM screen. This feature is useful for manipulation and topography tasks, as well as for multi-angle observations of a sample inside a SEM. - Trajectory/speed selection modes. Low speed AFM mode for a detailed topography imaging. Fast AFM mode (4fps) for dynamic observations at the nanoscale. The users also have access to the control parameters. They can be modified to suit their needs. - Mosaic AFM mode to extend the topography scanning area inside a SEM. All these features rely on research works in robotics, mechatronics and control made during the thesis. The latter has the potential to opens the door to a new era of poly-articulated atomic force microscopes used in correlative microscopy
APA, Harvard, Vancouver, ISO, and other styles
10

Mattocks, Philip. "Scanning tunnelling microscopy and atomic force microscopy of semiconducting materials." Thesis, University of Manchester, 2012. https://www.research.manchester.ac.uk/portal/en/theses/scanning-tunnelling-microscopy-and-atomic-force-microscopy-of-semiconducting-materials(9bc10301-2c4d-4dfb-a374-f65ee37ae23a).html.

Full text
Abstract:
Michael Faraday first documented semiconducting behaviour in 1833 whenhe observed that the resistance of silver sulphide decreased with temperature,contrary to the behaviour of normal conducting materials. Up untilthe middle of the twentieth century, semiconductors were used as photodetectors,thermisters and rectifiers. In 1947 the invention of the transistor byBardeen and Brattain lead to the integrated circuit and paved the way formodern electronics. The need to produce smaller and faster transistors hasdriven research into new semiconductors. This thesis will first introduce the physics of semiconductors, followed bya description of the experimental techniques employed; scanning tunnellingmicroscopy (STM) and atomic force microscopy (AFM). Chapter 3 is concernedwith explaining anomalous scanning tunnelling spectroscopy resultsobtained for Si(100) and GaAs(110). To this end, a one-dimensional planarmodel, in which surface states affect the charge distribution and tunnellingin the system is proposed. Graphene, a novel two-dimensional material,is introduced in Chapter 4. Scanning tunnelling microscopy measurementsof graphene suspended on a metal grid are presented in this chapter. Finally,Indium antimonide Schottky contacts are investigated using conductingatomic force microscopy in Chapter 5.
APA, Harvard, Vancouver, ISO, and other styles
More sources

Books on the topic "Microscopy"

1

Thomas, Mulvey, and Sheppard C. J. R, eds. Advances inoptical and electron microscopy. London: Academic, 1990.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
2

Goodhew, Peter J. Electron microscopy and analysis. 2nd ed. London: Taylor & Francis, 1988.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
3

Bradbury, Savile. An introduction to the optical microscope. Oxford: Bios, 1994.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
4

Bradbury, Savile. An introduction to the optical microscope. Oxford: Oxford University Press, 1988.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
5

Slayter, Elizabeth M. Light and electron microscopy. Cambridge [England]: Cambridge University Press, 1992.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
6

Burgess, Jeremy. The magnified world. Vero Beach, FL: Rourke Enterprises, 1988.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
7

Thomas, Mulvey, and Sheppard C. J. R, eds. Advances in optical and electron microscopy. London: Academic Press, 1994.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
8

R, Beanland, and Humphreys F. J, eds. Electron microscopy and analysis. 3rd ed. London: Taylor & Francis, 2001.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
9

Thomas, Mulvey, and Sheppard C. J. R, eds. Advances in optical and electron microscopy. London: Academic Press, 1994.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
10

Pluta, Maksymilian. Advanced light microscopy. Warszawa: PWN, 1988.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
More sources

Book chapters on the topic "Microscopy"

1

Maddalena, Laura, Paolo Pozzi, Nicolò G. Ceffa, Bas van der Hoeven, and Elizabeth C. Carroll. "Optogenetics and Light-Sheet Microscopy." In Neuromethods, 231–61. New York, NY: Springer US, 2023. http://dx.doi.org/10.1007/978-1-0716-2764-8_8.

Full text
Abstract:
AbstractLight-sheet microscopy is a powerful method for imaging small translucent samples in vivo, owing to its unique combination of fast imaging speeds, large field of view, and low phototoxicity. This chapter briefly reviews state-of-the-art technology for variations of light-sheet microscopy. We review recent examples of optogenetics in combination with light-sheet microscopy and discuss some current bottlenecks and horizons of light sheet in all-optical physiology. We describe how 3-dimensional optogenetics can be added to an home-built light-sheet microscope, including technical notes about choices in microscope configuration to consider depending on the time and length scales of interest.
APA, Harvard, Vancouver, ISO, and other styles
2

Nichols, Gary, Shen Luk, and Clive Roberts. "Microscopy." In Solid State Characterization of Pharmaceuticals, 287–355. Chichester, UK: John Wiley & Sons, Ltd, 2011. http://dx.doi.org/10.1002/9780470656792.ch9.

Full text
APA, Harvard, Vancouver, ISO, and other styles
3

Allen, Terence. "Microscopy." In Particle Size Measurement, 217–48. Dordrecht: Springer Netherlands, 1990. http://dx.doi.org/10.1007/978-94-009-0417-0_6.

Full text
APA, Harvard, Vancouver, ISO, and other styles
4

Buxbaum, Engelbert. "Microscopy." In Biophysical Chemistry of Proteins, 3–22. Boston, MA: Springer US, 2010. http://dx.doi.org/10.1007/978-1-4419-7251-4_1.

Full text
APA, Harvard, Vancouver, ISO, and other styles
5

Sprott, G. Dennis, and Terry J. Beveridge. "Microscopy." In Methanogenesis, 81–127. Boston, MA: Springer US, 1993. http://dx.doi.org/10.1007/978-1-4615-2391-8_3.

Full text
APA, Harvard, Vancouver, ISO, and other styles
6

Keiser, Gerd. "Microscopy." In Graduate Texts in Physics, 233–58. Singapore: Springer Singapore, 2016. http://dx.doi.org/10.1007/978-981-10-0945-7_8.

Full text
APA, Harvard, Vancouver, ISO, and other styles
7

Dehonor, Mariamne, Carlos López-Barrón, and Christopher W. Macosko. "Microscopy." In Handbook of Polymer Synthesis, Characterization, and Processing, 409–24. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2013. http://dx.doi.org/10.1002/9781118480793.ch20.

Full text
APA, Harvard, Vancouver, ISO, and other styles
8

Gooch, Jan W. "Microscopy." In Encyclopedic Dictionary of Polymers, 462. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_7487.

Full text
APA, Harvard, Vancouver, ISO, and other styles
9

Sims, Tony, and Qiuyu Wang. "Microscopy." In Biomedical Science Practice. Oxford University Press, 2022. http://dx.doi.org/10.1093/hesc/9780198831228.003.0007.

Full text
Abstract:
This chapter focuses on microscopy, which is the use of a microscope to examine and analyse objects that would normally be too small to be seen with the naked eye. Microscopes that use a single lens are called simple microscopes; those with more than one are compound microscopes. Microscopes are perhaps the most widely used instruments in biomedical science. They have contributed greatly to the knowledge and understanding of pathological processes, and are used in all branches of biomedical science. Light microscopes are used to look at cells and tissues. The electron microscope, with its vastly increased magnification and resolution, is used to visualize virus particles, explore the structures of bacteria, and observe more fully the subcellular components seen in both normal and diseased cells and tissues. The chapter describes how the various types of microscope are constructed and work, and how they can be applied to diagnostic biomedical practice.
APA, Harvard, Vancouver, ISO, and other styles
10

Furness, David N. "Electron microscopy." In Histopathology, edited by Guy Orchard and Brian Nation. Oxford University Press, 2017. http://dx.doi.org/10.1093/hesc/9780198717331.003.0015.

Full text
Abstract:
This chapter evaluates electron microscopy, which allows higher magnification than other types of microscopy and is responsible for the discovery and detailed description of most subcellular organelles. There are two kinds of electron microscopes (EMs): the transmission EM and the scanning EM. The main difference between these two types of microscope is that TEM is used to look at sections of samples, or naturally very thin/small samples, while SEM is used to image the surface and so can handle bulky samples of a size that is only limited by the microscope sample chamber size, although typically, samples are only a few millimetres across. The chapter then outlines the specific preparatory requirements for samples requiring electron microscopy. It also considers the application of transmission and scanning electron microscopy in the field of biomedical science and provides examples of their use in pathological evaluation.
APA, Harvard, Vancouver, ISO, and other styles

Conference papers on the topic "Microscopy"

1

Incardona, Nicolo, Angel Tolosa, Gabriele Scrofani, Manuel Martinez-Corral, and Genaro Saavedra. "The Lightfield Eyepiece: an Add-on for 3D Microscopy." In 3D Image Acquisition and Display: Technology, Perception and Applications. Washington, D.C.: Optica Publishing Group, 2022. http://dx.doi.org/10.1364/3d.2022.3tu5a.6.

Full text
Abstract:
Fourier lightfield microscopy is an emerging technique for real-time acquisition of three-dimensional microscopic samples. Here, we present the lightfield eyepiece, an add-on device capable of converting any conventional microscope to a Fourier lightfield microscope.
APA, Harvard, Vancouver, ISO, and other styles
2

Masters, Barry R., and Andreas A. Thaer. "Confocal Microscopy of the Human In Vivo Cornea." In Ophthalmic and Visual Optics. Washington, D.C.: Optica Publishing Group, 1993. http://dx.doi.org/10.1364/ovo.1993.osab.2.

Full text
Abstract:
The in-vivo observation of the living cornea by the technique of confocal microscopy provides en face images of high contrast and resolution1-4 . In contrast to Nipkow disk pinhole confocal microscopes,1-4 slit based confocal systems collect more light form the eye.5-6 The development of the wide-field specular microscope by Koester was limited by the low numerical aperture of the applanating cone objective7,8. Recent developments of a high numerical aperture for the wide-field specular microscope has resulted in a confocal microscope for the eye.9,10 We describe a new flying slit confocal microscope, illuminated with a halogen lamp, which has unique imaging characteristics for in vivo human confocal microscopy.
APA, Harvard, Vancouver, ISO, and other styles
3

Goodman, Douglas S. "Fiber-optic illuminators for microscopy." In OSA Annual Meeting. Washington, D.C.: Optica Publishing Group, 1987. http://dx.doi.org/10.1364/oam.1987.wg6.

Full text
Abstract:
Many illumination problems in microscopy can be solved easily and economically with fiber optics. Modes of illumination not provided by the designers of a microscope can be added. A modular illumination system involving a number of microscopes and sources can be assembled. Various types of illumination can be used simultaneously, e.g., bright field and dark field, transmitted and reflected. Realignment on changing lamps is simplified, since it is merely necessary to align the lamp relative to the fiber input end. Older microscopes with small lamps can be upgraded by using a fiber bundle terminated at the lamp filament location.
APA, Harvard, Vancouver, ISO, and other styles
4

Rastogi, Vivek, Shilpi Agarwal, Satish Dubey, Gufran Khan, and Chandra Shakher. "Microscopic urinalysis by digital holographic microscopy." In Holography, Diffractive Optics, and Applications IX, edited by Changhe Zhou, Yunlong Sheng, and Liangcai Cao. SPIE, 2019. http://dx.doi.org/10.1117/12.2537315.

Full text
APA, Harvard, Vancouver, ISO, and other styles
5

Dixon, A. E. "Confocal microscopy." In OSA Annual Meeting. Washington, D.C.: Optica Publishing Group, 1993. http://dx.doi.org/10.1364/oam.1993.tue.1.

Full text
APA, Harvard, Vancouver, ISO, and other styles
6

Wegscheider, S., A. Georgi, V. Sandoghdar, G. Krausch, and J. Mlynek. "Scanning near-field optical lithography." In The European Conference on Lasers and Electro-Optics. Washington, D.C.: Optica Publishing Group, 1996. http://dx.doi.org/10.1364/cleo_europe.1996.cfa4.

Full text
Abstract:
The resolution of various scanning probe microscopy methods can be applied to the fabrication of nanostructures. Various methods of local material modification based on different microscopic mechanisms have been proposed, examples of which are : material transfer between a scanning tunneling microscope (STM) tip and a substrate, local oxidation of silicon using atomic force microscope (AFM). Scanning near-field optical microscopy (SNOM) is also an attractive candidate for nanofabrication. Here the optical spot size in the near-field is given by the resolution of the SNOM which in turn is determined by the details of the tip geometry and is typically between 50 and 100 nanometers.
APA, Harvard, Vancouver, ISO, and other styles
7

Spector, S. J., C. J. Jacobsen, and D. M. Tennant. "Fabrication of Fresnel zone plates for x-ray microscopy: diffractive optics for soft x-rays." In Diffractive Optics and Micro-Optics. Washington, D.C.: Optica Publishing Group, 1996. http://dx.doi.org/10.1364/domo.1996.dwd.6.

Full text
Abstract:
Fresnel zone plates are diffractive optical elements which are currently being used for high resolution x-ray microscopy. Several groups fabricate zone plates for use in specific microscopes [1] and we present here a summary on the fabrication of zone plates for use in the Scanning Transmission X-ray Microscope at the National Synchrotron Light Source. X-ray microscopy has demonstrated imaging with resolution five times superior to that which can routinely be achieved by visible light microscopy. In addition, x-rays with wavelengths between the carbon (4.2 nm) and oxygen (2.3 nm) K absorption edges are absorbed nearly an order of magnitude more strongly by organics than by water. This creates a natural absorption contrast mechanism and allows the viewing of many biological specimens wet and intact (without sectioning) and at atmospheric pressure [2]. By taking advantage of the spectroscopic properties of x-rays, x-ray microscopy can be used to map chemical elements and their binding states. Fluorescent chemical labels and gold labels can also be imaged at high resolution. Furthermore, several labs including ours are developing the capability to view radiation-tough frozen hydrated specimens in x-ray microscopes.
APA, Harvard, Vancouver, ISO, and other styles
8

Chmelik, Radim. "Advances in digital holographic microscopy: coherence-controlled microscope." In SPIE Optics + Optoelectronics, edited by Miroslav Hrabovský, Miroslav Miler, and John T. Sheridan. SPIE, 2011. http://dx.doi.org/10.1117/12.888733.

Full text
APA, Harvard, Vancouver, ISO, and other styles
9

Conchello, José-Angel, and Eric W. Hansen. "Resolution and signal-to-noise trade-offs in confocal scanning microscopy." In OSA Annual Meeting. Washington, D.C.: Optica Publishing Group, 1989. http://dx.doi.org/10.1364/oam.1989.fi2.

Full text
Abstract:
The confocal scanning microscope achieves improved depth discrimination by the action of a small aperture in front of the detector. The confocal aperture rejects out- of-focus contributions and, in the case of fluorescence microscopy, results in a 3-D optical transfer function (OTF) that does not suffer from the missing-cone problem found in nonconfocal microscopes. Reducing the size of the aperture results in better depth discrimination, but it also reduces the amount of light reaching the detector and therefore reduces the image signal-to-noise ratio (SNR).
APA, Harvard, Vancouver, ISO, and other styles
10

Trovatello, C., A. Genco, C. Cruciano, B. Ardini, Q. Li, X. Zhu, G. Valentini, G. Cerullo, and C. Manzoni. "Hyperspectral microscopy of two-dimensional semiconductors." In Latin America Optics and Photonics Conference. Washington, D.C.: Optica Publishing Group, 2022. http://dx.doi.org/10.1364/laop.2022.th1d.7.

Full text
Abstract:
We present wide-field hyperspectral microscopy images of photoluminescence from two-dimensional semiconductors. The microscope exploits Fourier-transform spectroscopy and uses a common-path birefringent interferometer. Our hyperspectral microscope is a fast tool to characterize 2D materials.
APA, Harvard, Vancouver, ISO, and other styles

Reports on the topic "Microscopy"

1

Snyder, Shelly R., and Henry S. White. Scanning Tunneling Microscopy, Atomic Force Microscopy, and Related Techniques. Fort Belvoir, VA: Defense Technical Information Center, February 1992. http://dx.doi.org/10.21236/ada246852.

Full text
APA, Harvard, Vancouver, ISO, and other styles
2

Dow, John D. Scanning Tunneling Microscopy. Fort Belvoir, VA: Defense Technical Information Center, March 1992. http://dx.doi.org/10.21236/ada249262.

Full text
APA, Harvard, Vancouver, ISO, and other styles
3

Legg, Keith O., and Douglas N. Rose. Ion Acoustic Microscopy. Fort Belvoir, VA: Defense Technical Information Center, July 1985. http://dx.doi.org/10.21236/ada169492.

Full text
APA, Harvard, Vancouver, ISO, and other styles
4

Quate, C. F. Cryogenic Acoustic Microscopy. Fort Belvoir, VA: Defense Technical Information Center, July 1986. http://dx.doi.org/10.21236/ada173188.

Full text
APA, Harvard, Vancouver, ISO, and other styles
5

Hammel, P. Microscopic subsurface characterization of layered magnetic materials using magnetic resonance force microscopy. Office of Scientific and Technical Information (OSTI), December 2019. http://dx.doi.org/10.2172/1580650.

Full text
APA, Harvard, Vancouver, ISO, and other styles
6

Bentley, J. (Future of electron microscopy). Office of Scientific and Technical Information (OSTI), October 1989. http://dx.doi.org/10.2172/5651701.

Full text
APA, Harvard, Vancouver, ISO, and other styles
7

Botkin, D. A. Ultrafast scanning tunneling microscopy. Office of Scientific and Technical Information (OSTI), September 1995. http://dx.doi.org/10.2172/270266.

Full text
APA, Harvard, Vancouver, ISO, and other styles
8

Witham, Philip. Pinhole Neutral Atom Microscopy. Portland State University Library, January 2000. http://dx.doi.org/10.15760/etd.1407.

Full text
APA, Harvard, Vancouver, ISO, and other styles
9

Weber, Peter M. Time-Resolved Scanning Electron Microscopy. Fort Belvoir, VA: Defense Technical Information Center, June 2006. http://dx.doi.org/10.21236/ada455461.

Full text
APA, Harvard, Vancouver, ISO, and other styles
10

Hawley, M. E., D. W. Reagor, and Quan Xi Jia. Scanning probe microscopy competency development. Office of Scientific and Technical Information (OSTI), December 1998. http://dx.doi.org/10.2172/562576.

Full text
APA, Harvard, Vancouver, ISO, and other styles
You might also be interested in the extended bibliographies on the topic 'Microscopy' for particular source types:
Journal articles Dissertations / Theses Books
We offer discounts on all premium plans for authors whose works are included in thematic literature selections. Contact us to get a unique promo code!

To the bibliography