Journal articles: 'Microscope'

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J. H., Youngblom, Wilkinson J., and Youngblom J.J. "Telepresence Confocal Microscopy." Microscopy and Microanalysis 6, S2 (August 2000): 1164–65. http://dx.doi.org/10.1017/s1431927600038319.

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The advent of the Internet has allowed the development of remote access capabilities to a growing variety of microscopy systems. The Materials MicroCharacterization Collaboratory, for example, has developed an impressive facility that provides remote access to a number of highly sophisticated microscopy and microanalysis instruments. While certain types of microscopes, such as scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, and others have already been established for telepresence microscopy, no one has yet reported on the development of similar capabilities for the confocal laser scanning microscope.At California State University-Stanislaus, home of the CSUPERB (California State University Program for Education and Research in Biotechnology) Confocal Microscope Core Facility, we have established a remote access confocal laser scanning microscope facility that allows users with virtually any type of computer platform to connect to our system. Our Leica TCS NT confocal system, with an interchangeable upright (DMRXE) and inverted microscope (DMIRBE) set up,

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O'Keefe, Michael A., John H. Turner, John A. Musante, Crispin J. D. Hetherington, A. G. Cullis, Bridget Carragher, Ron Jenkins, et al. "Laboratory Design for High-Performance Electron Microscopy." Microscopy Today 12, no. 3 (May 2004): 8–17. http://dx.doi.org/10.1017/s1551929500052093.

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Since publication of the classic text on the electron microscope laboratory by Anderson, the proliferation of microscopes with field emission guns, imaging filters and hardware spherical aberration correctors (giving higher spatial and energy resolution) has resulted in the need to construct special laboratories. As resolutions iinprovel transmission electron microscopes (TEMs) and scanning transmission electron microscopes (STEMs) become more sensitive to ambient conditions. State-of-the-art electron microscopes require state-of-the-art environments, and this means careful design and implementation of microscope sites, from the microscope room to the building that surrounds it. Laboratories have been constructed to house high-sensitive instruments with resolutions ranging down to sub-Angstrom levels; we present the various design philosophies used for some of these laboratories and our experiences with them. Four facilities are described: the National Center for Electron Microscopy OAM Laboratory at LBNL; the FEGTEM Facility at the University of Sheffield; the Center for Integrative Molecular Biosciences at TSRI; and the Advanced Microscopy Laboratory at ORNL.

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Sutriyono, Widodo, and Retno Suryandari. "Addition of Illuminator Fiber Optic to Produce 3 Dimension Effects in Micrographic Observation Using Upright Microscope." Proceeding International Conference on Science and Engineering 3 (April 30, 2020): 493–96. http://dx.doi.org/10.14421/icse.v3.551.

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Microscope is one of the tools used in practicums with high intensity. The use of a microscope adjusts to the object to be observed in order to obtain optimal micrographic results. Stereo microscopes are used to observe three-dimensional objects. Upright microscopes are used to observe two-dimensional objects. This study aims to combine the two advantages of stereo microscopy that can produce three-dimensional micrography with the advantages of an upright microscope that has a high total magnification. The method used in this study is an experimental method by adding an optical fiber illuminator in the use of an upright microscope and then applying it in various observations. The conclusion of this research is the addition of an optical fiber illuminator in observations using an upright microscope can replace the function of a stereo microscope; can produce three-dimensional effects and increase magnification in Daphnia magna micrographic observations.

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Davidson, Michael W. "50 Most Frequently Asked Questions About Optical Microscopy." Microscopy Today 8, no. 6 (August 2000): 12–19. http://dx.doi.org/10.1017/s1551929500052780.

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A significant percentage of technical experts who employ optical microscopes have had little or no formal training in optical microscope basics. Some, typically, were required to use microscopes during their technical education but, in general, microscope terminology and technology was a sideline to their major training. As a result, many useful basic microscope technical details were not learned because they were not necessary to accomplish what was needed in order to survive their major class work. At Florida State University, we try to make the [earning of microscope technology an inherent part of the students training. An important part of this training is this compendium of 50 of the most frequently asked questions about Optical Microscopy.

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Johnson, W. Travis. "Advantages of Simultaneous Imaging Using an Atomic Force Microscope Integrated with an Inverted Light Microscope." Microscopy Today 19, no. 6 (October 28, 2011): 22–29. http://dx.doi.org/10.1017/s1551929511001222.

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Atomic Force Microscopy (AFM) permits measurements on biological samples below the limits of light microscopy resolution under physiological environments and other controlled conditions. Consequently, AFM has become an increasingly valuable technique in cell biology. One of the most exciting advances in AFM instrumentation has been its integration with the light microscope. This permits investigators to take advantage of the power and utility of light microscopy and scanning probe microscopy simultaneously. In combining a light microscope with an AFM, scanner components must be specifically designed so that they do not adversely impact the light microscope's optical imaging capabilities. For example, an AFM-ILM (inverted light microscope) hybrid system should be fully compatible with the highest quality, off-the-shelf 0.50–0.55 NA numerical aperture (NA) OEM objectives and condensers.

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Youngblom, J. H., J. Wilkinson, and J. J. Youngblom. "Confocal Laser Scanning Microscopy By Remote Access." Microscopy Today 7, no. 7 (September 1999): 32–33. http://dx.doi.org/10.1017/s1551929500064798.

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In recent years there have been a growing number of facilities interested in developing remote access capabilities to a variety of microscopy systems. While certain types of microscopes, such as electron microscopes and scanning probe microscopes have been well established for telepresence microscopy, no one has yet reported on the development of similar capabilities for the confocal microscope.At California State University, home to the CSUPERB (California State University Program for Education and Research in Biotechnology) Confocal Microscope Core Facility, we have established a remote access confocal laser scanning microscope facility that allows users with virtually any type of computer platform to connect to our system.

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Graef, M. De, N. T. Nuhfer, and N. J. Cleary. "Implementation Of A Digital Microscopy Teaching Environment." Microscopy and Microanalysis 5, S2 (August 1999): 4–5. http://dx.doi.org/10.1017/s1431927600013349.

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The steady evolution of computer controlled electron microscopes is dramatically changing the way we teach microscopy. For today’s microscopy student, an electron microscope may be just another program on the desktop of whatever computer platform he or she uses. This is reflected in the use of the term Desktop Microscopy. The SEM in particular has become a mouse and keyboard controlled machine, and running the microscope is not very different from using a drawing program or a word processor. Transmission electron microscopes are headed in the same direction.While one can debate whether or not it is wise to treat an SEM or a TEM as just another black-box computer program, it is a fact that these machines are here to stay, which means that microscopy educators must adapt their traditional didactic tools and methods. One way to bring electron microscopes into the classroom is through the use of remote control software packages, such as Timbuktu Pro or PC-Anywhere. The remote user essentially opens a window containing the desktop of the microscope control computer and has all functions available. On microscopes with specialized graphics boards, integration of the image and control display for remote operation may not be straightforward, and often requires the purchase of additional graphics boards for the remote machine.

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Mao, Hong, Robin Diekmann, Hai Po H. Liang, Victoria C. Cogger, David G. Le Couteur, Glen P. Lockwood, Nicholas J. Hunt, et al. "Cost-efficient nanoscopy reveals nanoscale architecture of liver cells and platelets." Nanophotonics 8, no. 7 (July 9, 2019): 1299–313. http://dx.doi.org/10.1515/nanoph-2019-0066.

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AbstractSingle-molecule localization microscopy (SMLM) provides a powerful toolkit to specifically resolve intracellular structures on the nanometer scale, even approaching resolution classically reserved for electron microscopy (EM). Although instruments for SMLM are technically simple to implement, researchers tend to stick to commercial microscopes for SMLM implementations. Here we report the construction and use of a “custom-built” multi-color channel SMLM system to study liver sinusoidal endothelial cells (LSECs) and platelets, which costs significantly less than a commercial system. This microscope allows the introduction of highly affordable and low-maintenance SMLM hardware and methods to laboratories that, for example, lack access to core facilities housing high-end commercial microscopes for SMLM and EM. Using our custom-built microscope and freely available software from image acquisition to analysis, we image LSECs and platelets with lateral resolution down to about 50 nm. Furthermore, we use this microscope to examine the effect of drugs and toxins on cellular morphology.

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Madrid-Wolff, Jorge, and Manu Forero-Shelton. "Protocol for the Design and Assembly of a Light Sheet Light Field Microscope." Methods and Protocols 2, no. 3 (July 4, 2019): 56. http://dx.doi.org/10.3390/mps2030056.

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Light field microscopy is a recent development that makes it possible to obtain images of volumes with a single camera exposure, enabling studies of fast processes such as neural activity in zebrafish brains at high temporal resolution, at the expense of spatial resolution. Light sheet microscopy is also a recent method that reduces illumination intensity while increasing the signal-to-noise ratio with respect to confocal microscopes. While faster and gentler to samples than confocals for a similar resolution, light sheet microscopy is still slower than light field microscopy since it must collect volume slices sequentially. Nonetheless, the combination of the two methods, i.e., light field microscopes that have light sheet illumination, can help to improve the signal-to-noise ratio of light field microscopes and potentially improve their resolution. Building these microscopes requires much expertise, and the resources for doing so are limited. Here, we present a protocol to build a light field microscope with light sheet illumination. This protocol is also useful to build a light sheet microscope.

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Kersker, M., C. Nielsen, H. Otsuji, T. Miyokawa, and S. Nakagawa. "The JSM-890 ultra high resolution Scanning Electron Microscope." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 88–89. http://dx.doi.org/10.1017/s0424820100152410.

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Historically, ultra high spatial resolution electron microscopy has belonged to the transmission electron microscope. Today, however, ultra high resolution scanning electron microscopes are beginning to challenge the transmission microscope for the highest resolution.To accomplish high resolution surface imaging, not only is high resolution required. It is also necessary that the integrity of the specimen be preserved, i.e., that morphological changes to the specimen during observation are prevented. The two major artifacts introduced during observation are contamination and beam damage, both created by the small, high current-density probes necessary for high signal generation in the scanning instrument. The JSM-890 Ultra High Resolution Scanning Microscope provides the highest resolution probe attainable in a dedicated scanning electron microscope and its design also accounts for the problematical artifacts described above.Extensive experience with scanning transmission electron microscopes lead to the design considerations of the ultra high resolution JSM- 890.

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Storey, Malcolm. "Mycological Microscopy – choosing a stereo microscope." Field Mycology 20, no. 2 (April 2019): 48–50. http://dx.doi.org/10.1016/j.fldmyc.2019.03.006.

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Marti, O., B. Drake, S. Gould, and P. K. Hansma. "Atomic force microscopy and scanning tunneling microscopy with a combination atomic force microscope/scanning tunneling microscope." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 6, no. 3 (May 1988): 2089–92. http://dx.doi.org/10.1116/1.575191.

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Möller, Lars, Gudrun Holland, and Michael Laue. "Diagnostic Electron Microscopy of Viruses With Low-voltage Electron Microscopes." Journal of Histochemistry & Cytochemistry 68, no. 6 (May 21, 2020): 389–402. http://dx.doi.org/10.1369/0022155420929438.

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Diagnostic electron microscopy is a useful technique for the identification of viruses associated with human, animal, or plant diseases. The size of virus structures requires a high optical resolution (i.e., about 1 nm), which, for a long time, was only provided by transmission electron microscopes operated at 60 kV and above. During the last decade, low-voltage electron microscopy has been improved and potentially provides an alternative to the use of high-voltage electron microscopy for diagnostic electron microscopy of viruses. Therefore, we have compared the imaging capabilities of three low-voltage electron microscopes, a scanning electron microscope equipped with a scanning transmission detector and two low-voltage transmission electron microscopes, operated at 25 kV, with the imaging capabilities of a high-voltage transmission electron microscope using different viruses in samples prepared by negative staining and ultrathin sectioning. All of the microscopes provided sufficient optical resolution for a recognition of the viruses tested. In ultrathin sections, ultrastructural details of virus genesis could be revealed. Speed of imaging was fast enough to allow rapid screening of diagnostic samples at a reasonable throughput. In summary, the results suggest that low-voltage microscopes are a suitable alternative to high-voltage transmission electron microscopes for diagnostic electron microscopy of viruses.

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Schatten, G., J. Pawley, and H. Ris. "Integrated microscopy resource for biomedical research at the university of wisconsin at madison." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 594–97. http://dx.doi.org/10.1017/s0424820100127451.

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The High Voltage Electron Microscopy Laboratory [HVEM] at the University of Wisconsin-Madison, a National Institutes of Health Biomedical Research Technology Resource, has recently been renamed the Integrated Microscopy Resource for Biomedical Research [IMR]. This change is designed to highlight both our increasing abilities to provide sophisticated microscopes for biomedical investigators, and the expansion of our mission beyond furnishing access to a million-volt transmission electron microscope. This abstract will describe the current status of the IMR, some preliminary results, our upcoming plans, and the current procedures for applying for microscope time.The IMR has five principal facilities: 1.High Voltage Electron Microscopy2.Computer-Based Motion Analysis3.Low Voltage High-Resolution Scanning Electron Microscopy4.Tandem Scanning Reflected Light Microscopy5.Computer-Enhanced Video MicroscopyThe IMR houses an AEI-EM7 one million-volt transmission electron microscope.

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Williams, Nicola. "Do Microscopes Have Politics? Gendering the Electron Microscope in Laboratory Biological Research." Technology and Culture 64, no. 4 (October 2023): 1159–83. http://dx.doi.org/10.1353/tech.2023.a910999.

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abstract: Objects like microscopes are gendered depending on their context. The introduction of the electron microscope at Leeds University in early 1940s Britain was under the control of high-status physicists, most of whom were men, who regulated its access over and against biologists. Moreover, the microscope required physical strength more associated with men than women, combined with a sound knowledge of physics. This article explores the challenges women encountered including access to scientific instruments when entering post–World War II electron microscopy through Irene Manton's career. It combines techno-political and gendered perspectives on the history of women in science. In particular, the study invites gendered understanding of early biological electron microscopy, at a university world-renowned on the subject, through the lens of one capital intensive microscope.

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Youngblom, J. H., J. Wilkinson, and J. J. Youngblom. "Telepresence Confocal Microscopy." Microscopy Today 8, no. 10 (December 2000): 20–21. http://dx.doi.org/10.1017/s1551929500054146.

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The advent of the Internet has allowed the development of remote access capabilities to a growing variety of microscopy systems. The Materials MicroCharacterization Collaboratory, for example, has developed an impressive facility that provides remote access to a number of highly sophisticated microscopy and microanalysis instruments, While certain types of microscopes, such as scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, and others have already been established for telepresence microscopy, no one has yet reported on the development of similar capabilities for the confocal laser scanning microscope.

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Beacher, James. "Microscope Illumination: LEDs are the Future." Microscopy Today 19, no. 4 (July 2011): 18–21. http://dx.doi.org/10.1017/s1551929511000411.

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Light microscopes in laboratories and hospitals are used for examining many different types of samples—from industrial research to life-science research and clinical screening. These procedures use conventional bright-field, differential phase contrast (DIC), and fluorescence microscopy among other techniques. In all cases, the light source on the microscope has a crucial influence on the quality of images viewed and the conclusions reached.

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Ai, R. "A Microscope-Compatible Auger Electron Spectrometer." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 992–93. http://dx.doi.org/10.1017/s0424820100089275.

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With the recent development of ultra-high vacuum high resolution electron microscopes (UHV-HREM), electron microscopes have become valuable tools for surface studies. Techniques such as surface profile image, surface sensitive plane view, and reflection electron microscopy have been developed to take full advantage of the atomic resolution of HREM to study surface structures. However a complete surface study requires information on both the surface structure and surface chemistry. Therefore in order to turn an electron microscope into a real surface analytical tool, the challenge is to develop a microscopecompatible, surface sensitive tool for in-situ surface chemical analysis.

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Ross, Frances M. "Materials Science in the Electron Microscope." MRS Bulletin 19, no. 6 (June 1994): 17–21. http://dx.doi.org/10.1557/s0883769400036691.

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This issue of the MRS Bulletin aims to highlight the innovative and exciting materials science research now being done using in situ electron microscopy. Techniques which combine real-time image acquisition with high spatial resolution have contributed to our understanding of a remarkably diverse range of physical phenomena. The articles in this issue present recent advances in materials science which have been made using the techniques of transmission electron microscopy (TEM), including holography, scanning electron microscopy (SEM), low-energy electron microscopy (LEEM), and high-voltage electron microscopy (HVEM).The idea of carrying out dynamic experiments involving real-time observation of microscopic phenomena has always had an attraction for materials scientists. Ever since the first static images were obtained in the electron microscope, materials scientists have been interested in observing processes in real time: we feel that we obtain a true understanding of a microscopic phenomenon if we can actually watch it taking place. The idea behind “materials science in the electron microscope” is therefore to use the electron microscope—with its unique ability to image subtle changes in a material at or near the atomic level—as a laboratory in which a remarkable variety of experiments can be carried out. In this issue you will read about dynamic experiments in areas such as phase transformations, thin-film growth, and electromigration, which make use of innovative designs for the specimen, the specimen holder, or the microscope itself. These articles speak for themselves in demonstrating the power of real-time analysis in the quantitative exploration of reaction mechanisms.The first transmission electron microscopes operated at low accelerating voltages, up to about 100 kV. This placed a severe limitation on the thickness of foils that could be examined: Heavy elements, for example, had to be made into foils thinner than 0.1 μm. It was felt that any phenomenon whose “mean free path” was comparable to the foil thickness would be significantly affected by the foil surfaces, and therefore would be unsuitable for study in situ. However, technology quickly generated ever higher accelerating voltages, culminating in the giant 3 MeV electron microscopes. At these voltages, electrons can penetrate materials as thick as 6–9 μm for light elements such as Si and Al, and 1 μm for very heavy ones such as Au and U.

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BULAT, TANJA, OTILIJA KETA, LELA KORIĆANAC, JELENA ŽAKULA, IVAN PETROVIĆ, ALEKSANDRA RISTIĆ-FIRA, and DANIJELA TODOROVIĆ. "Radiation dose determines the method for quantification of DNA double strand breaks." Anais da Academia Brasileira de Ciências 88, no. 1 (March 4, 2016): 127–36. http://dx.doi.org/10.1590/0001-3765201620140553.

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ABSTRACT Ionizing radiation induces DNA double strand breaks (DSBs) that trigger phosphorylation of the histone protein H2AX (γH2AX). Immunofluorescent staining visualizes formation of γH2AX foci, allowing their quantification. This method, as opposed to Western blot assay and Flow cytometry, provides more accurate analysis, by showing exact position and intensity of fluorescent signal in each single cell. In practice there are problems in quantification of γH2AX. This paper is based on two issues: the determination of which technique should be applied concerning the radiation dose, and how to analyze fluorescent microscopy images obtained by different microscopes. HTB140 melanoma cells were exposed to γ-rays, in the dose range from 1 to 16 Gy. Radiation effects on the DNA level were analyzed at different time intervals after irradiation by Western blot analysis and immunofluorescence microscopy. Immunochemically stained cells were visualized with two types of microscopes: AxioVision (Zeiss, Germany) microscope, comprising an ApoTome software, and AxioImagerA1 microscope (Zeiss, Germany). Obtained results show that the level of γH2AX is time and dose dependent. Immunofluorescence microscopy provided better detection of DSBs for lower irradiation doses, while Western blot analysis was more reliable for higher irradiation doses. AxioVision microscope containing ApoTome software was more suitable for the detection of γH2AX foci.

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Incardona, Nicolò, Ángel Tolosa, Gabriele Scrofani, Manuel Martinez-Corral, and Genaro Saavedra. "The Lightfield Microscope Eyepiece." Sensors 21, no. 19 (October 5, 2021): 6619. http://dx.doi.org/10.3390/s21196619.

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Lightfield microscopy has raised growing interest in the last few years. Its ability to get three-dimensional information about the sample in a single shot makes it suitable for many applications in which time resolution is fundamental. In this paper we present a novel device, which is capable of converting any conventional microscope into a lightfield microscope. Based on the Fourier integral microscope concept, we designed the lightfield microscope eyepiece. This is coupled to the eyepiece port, to let the user exploit all the host microscope’s components (objective turret, illumination systems, translation stage, etc.) and get a 3D reconstruction of the sample. After the optical design, a proof-of-concept device was built with off-the-shelf optomechanical components. Here, its optical performances are demonstrated, which show good matching with the theoretical ones. Then, the pictures of different samples taken with the lightfield eyepiece are shown, along with the corresponding reconstructions. We demonstrated the functioning of the lightfield eyepiece and lay the foundation for the development of a commercial device that works with any microscope.

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Vilà, Anna, Sergio Moreno, Joan Canals, and Angel Diéguez. "A Compact Raster Lensless Microscope Based on a Microdisplay." Sensors 21, no. 17 (September 3, 2021): 5941. http://dx.doi.org/10.3390/s21175941.

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Lensless microscopy requires the simplest possible configuration, as it uses only a light source, the sample and an image sensor. The smallest practical microscope is demonstrated here. In contrast to standard lensless microscopy, the object is located near the lighting source. Raster optical microscopy is applied by using a single-pixel detector and a microdisplay. Maximum resolution relies on reduced LED size and the position of the sample respect the microdisplay. Contrarily to other sort of digital lensless holographic microscopes, light backpropagation is not required to reconstruct the images of the sample. In a mm-high microscope, resolutions down to 800 nm have been demonstrated even when measuring with detectors as large as 138 μm × 138 μm, with field of view given by the display size. Dedicated technology would shorten measuring time.

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Phillips, Mick A., David Miguel Susano Pinto, Nicholas Hall, Julio Mateos-Langerak, Richard M. Parton, Josh Titlow, Danail V. Stoychev, et al. "Microscope-Cockpit: Python-based bespoke microscopy for bio-medical science." Wellcome Open Research 6 (April 8, 2021): 76. http://dx.doi.org/10.12688/wellcomeopenres.16610.1.

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We have developed “Microscope-Cockpit” (Cockpit), a highly adaptable open source user-friendly Python-based Graphical User Interface (GUI) environment for precision control of both simple and elaborate bespoke microscope systems. The user environment allows next-generation near instantaneous navigation of the entire slide landscape for efficient selection of specimens of interest and automated acquisition without the use of eyepieces. Cockpit uses “Python-Microscope” (Microscope) for high-performance coordinated control of a wide range of hardware devices using open source software. Microscope also controls complex hardware devices such as deformable mirrors for aberration correction and spatial light modulators for structured illumination via abstracted device models. We demonstrate the advantages of the Cockpit platform using several bespoke microscopes, including a simple widefield system and a complex system with adaptive optics and structured illumination. A key strength of Cockpit is its use of Python, which means that any microscope built with Cockpit is ready for future customisation by simply adding new libraries, for example machine learning algorithms to enable automated microscopy decision making while imaging.

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Phillips, Mick A., David Miguel Susano Pinto, Nicholas Hall, Julio Mateos-Langerak, Richard M. Parton, Josh Titlow, Danail V. Stoychev, et al. "Microscope-Cockpit: Python-based bespoke microscopy for bio-medical science." Wellcome Open Research 6 (January 17, 2022): 76. http://dx.doi.org/10.12688/wellcomeopenres.16610.2.

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We have developed “Microscope-Cockpit” (Cockpit), a highly adaptable open source user-friendly Python-based Graphical User Interface (GUI) environment for precision control of both simple and elaborate bespoke microscope systems. The user environment allows next-generation near instantaneous navigation of the entire slide landscape for efficient selection of specimens of interest and automated acquisition without the use of eyepieces. Cockpit uses “Python-Microscope” (Microscope) for high-performance coordinated control of a wide range of hardware devices using open source software. Microscope also controls complex hardware devices such as deformable mirrors for aberration correction and spatial light modulators for structured illumination via abstracted device models. We demonstrate the advantages of the Cockpit platform using several bespoke microscopes, including a simple widefield system and a complex system with adaptive optics and structured illumination. A key strength of Cockpit is its use of Python, which means that any microscope built with Cockpit is ready for future customisation by simply adding new libraries, for example machine learning algorithms to enable automated microscopy decision making while imaging.

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Brama, Elisabeth, Christopher J. Peddie, Gary Wilkes, Yan Gu, Lucy M. Collinson, and Martin L. Jones. "ultraLM and miniLM: Locator tools for smart tracking of fluorescent cells in correlative light and electron microscopy." Wellcome Open Research 1 (December 13, 2016): 26. http://dx.doi.org/10.12688/wellcomeopenres.10299.1.

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In-resin fluorescence (IRF) protocols preserve fluorescent proteins in resin-embedded cells and tissues for correlative light and electron microscopy, aiding interpretation of macromolecular function within the complex cellular landscape. Dual-contrast IRF samples can be imaged in separate fluorescence and electron microscopes, or in dual-modality integrated microscopes for high resolution correlation of fluorophore to organelle. IRF samples also offer a unique opportunity to automate correlative imaging workflows. Here we present two new locator tools for finding and following fluorescent cells in IRF blocks, enabling future automation of correlative imaging. The ultraLM is a fluorescence microscope that integrates with an ultramicrotome, which enables ‘smart collection’ of ultrathin sections containing fluorescent cells or tissues for subsequent transmission electron microscopy or array tomography. The miniLM is a fluorescence microscope that integrates with serial block face scanning electron microscopes, which enables ‘smart tracking’ of fluorescent structures during automated serial electron image acquisition from large cell and tissue volumes.

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Gibbs, Dalton, Anisa Kaur, Anoja Megalathan, Kumar Sapkota, and Soma Dhakal. "Build Your Own Microscope: Step-By-Step Guide for Building a Prism-Based TIRF Microscope." Methods and Protocols 1, no. 4 (November 3, 2018): 40. http://dx.doi.org/10.3390/mps1040040.

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Prism-based total internal reflection fluorescence (pTIRF) microscopy is one of the most widely used techniques for the single molecule analysis of a vast range of samples including biomolecules, nanostructures, and cells, to name a few. It allows for excitation of surface bound molecules/particles/quantum dots via evanescent field of a confined region of space, which is beneficial not only for single molecule detection but also for analysis of single molecule dynamics and for acquiring kinetics data. However, there is neither a commercial microscope available for purchase nor a detailed guide dedicated for building this microscope. Thus far, pTIRF microscopes are custom-built with the use of a commercially available inverted microscope, which requires high level of expertise in selecting and handling sophisticated instrument-parts. To directly address this technology gap, here we describe a step-by-step guide on how to build and characterize a pTIRF microscope for in vitro single-molecule imaging, nanostructure analysis and other life sciences research.

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Zeineh, Jack A. "Integrated Live and Stored Internet Based Digital Microscopy for Education." Microscopy and Microanalysis 6, S2 (August 2000): 1168–69. http://dx.doi.org/10.1017/s1431927600038332.

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Few educational institutions have well maintained microscopes that facilitate the experience intended by the creators of their teaching texts. The cost of putting a high quality selection of the different types of microscopes at every educational institution for access by all students is prohibitive. The advent of the Internet and the rapid proliferation of computers at educational institutions offer the prospect for dramatic improvements in microscopy education.We present an Internet based digital microscopy system with unique features for education. We have developed a unified architecture for management and transmission of live and stored microscope data over the Internet. The system consists of a combination of software and hardware. The hardware includes a microscope with a motorized stage, focus, and optionally a motorized nosepiece. Standard off the shelf components for each of the items can be used so that the user is afforded great flexibility in utilizing available hardware. Image acquisition is done by attaching a video camera to the microscope. Both analog and digital video cameras are supported, although it should be noted that users have experienced outstanding results with relatively inexpensive analog cameras.

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Kuokkala, V. T., and T. K. Lepistö. "TEMTUTOR - a Teaching Multimedia Program for TEM." Microscopy and Microanalysis 3, S2 (August 1997): 1161–62. http://dx.doi.org/10.1017/s1431927600012691.

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Teaching of transmission electron microscopy usually includes both lectures on the contrast theories, electron diffraction, etc., and practical hands-on operation of the microscope. The number of students attending the lectures is normally unlimited, but at the microscope, only a few persons can work at the same time. Since the microscopes are expensive, it would be of a great help if cheaper 'training' microscopes with basic imaging and diffraction capabilities were available. These functions, in fact, can quite easily be realized with fast personal computers and work stations, where the simulation of transmission electron micrographs and related diffraction patterns can help the student better understand the image formation processes. Adding text, audio and video help capabilities to the program, it can be made an efficient supplemental teaching tool.TemTutor for Windows is based on microScope for Windows, which is a BF/DF TEM micrograph simulation program for dislocations and stacking faults.

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Daberkow, I., and M. Schierjott. "Possibilities And Examples For Remote Microscopy Including Digital Image Acquisition, Transfer, and Archiving." Microscopy and Microanalysis 4, S2 (July 1998): 2–3. http://dx.doi.org/10.1017/s1431927600020134.

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Recent developments promise the possibility to externally control every aspect of microscopes through a computer interface. In combination with high-resolution cameras and feedback to the microscope, this can be leveraged to create highly automatic routines, e.g., to remotely correct astigmatism. Together with the development of fast computer networks this creates a new branch of microscopy, the so-called “telemicroscopy”. The goal of telemicroscopy is the control of a microscope over a large distance including the transfer of images with an acceptable repetition rate. A big advantage for electron microscopy in particular is the possibility of having access to expensive and well-equipped microscopes. In the field of light microscopy the branch “telemedicine” was created, meaning the “virtual” presence of a colleague or specialist for discussion or diagnosis.Using transmission electron microscopy as an example, the history and special requirements for automation and telemicroscopy will be discussed. In the late 80's the first TEM with a remote control was revealed. Shortly thereafter, first automatic functions for defocus control and astigmatism correction were developed using a video camera as electronic image converter.

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Schäfer, Max B., Sophie Weiland, Kent W. Stewart, and Peter P. Pott. "Compact Microscope Module for High- Throughput Microscopy." Current Directions in Biomedical Engineering 6, no. 3 (September 1, 2020): 530–33. http://dx.doi.org/10.1515/cdbme-2020-3136.

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AbstractMicroscopy is an essential tool in research and science. However, it is relatively resource consuming regarding cost, time of usage, and consumable supplies. Current low-cost approaches provide good imaging quality but struggle in terms of versatility or applicability to varying setups. In this paper, a Compact Microscope Module for versatile application in custom-made setups or research projects is presented. As a first application and proof of concept, the use of the module in a High-Throughput Microscope for screening of samples in microtiter plates is shown. The Compact Microscope Module allows for simple and resource-efficient microscopy in various applications while still enabling relatively good imaging qualities.

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Collins, Joel T., Joe Knapper, Julian Stirling, Joram Mduda, Catherine Mkindi, Valeriana Mayagaya, Grace A. Mwakajinga, et al. "Robotic microscopy for everyone: the OpenFlexure microscope." Biomedical Optics Express 11, no. 5 (April 8, 2020): 2447. http://dx.doi.org/10.1364/boe.385729.

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Mehta, PK, DH Campbell, and JS Galehouse. "Quantitative Clinker Microscopy with the Light Microscope." Cement, Concrete and Aggregates 13, no. 2 (1991): 94. http://dx.doi.org/10.1520/cca10123j.

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You, Sungyong, Jerry Chao, Edward A. K. Cohen, E. Sally Ward, and Raimund J. Ober. "Microscope calibration protocol for single-molecule microscopy." Optics Express 29, no. 1 (December 22, 2020): 182. http://dx.doi.org/10.1364/oe.408361.

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Wilke, V. "Optical scanning microscopy-The laser scan microscope." Scanning 7, no. 2 (1985): 88–96. http://dx.doi.org/10.1002/sca.4950070204.

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O’Keefe, M. A., J. Taylor, D. Owen, B. Crowley, K. H. Westmacott, W. Johnston, and U. Dahmen. "Remote On-Line Control of a High-Voltage in situ Transmission Electron Microscope with A Rational User Interface." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 384–85. http://dx.doi.org/10.1017/s0424820100164386.

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Remote on-line electron microscopy is rapidly becoming more available as improvements continue to be developed in the software and hardware of interfaces and networks. Scanning electron microscopes have been driven remotely across both wide and local area networks. Initial implementations with transmission electron microscopes have targeted unique facilities like an advanced analytical electron microscope, a biological 3-D IVEM and a HVEM capable of in situ materials science applications. As implementations of on-line transmission electron microscopy become more widespread, it is essential that suitable standards be developed and followed. Two such standards have been proposed for a high-level protocol language for on-line access, and we have proposed a rational graphical user interface. The user interface we present here is based on experience gained with a full-function materials science application providing users of the National Center for Electron Microscopy with remote on-line access to a 1.5MeV Kratos EM-1500 in situ high-voltage transmission electron microscope via existing wide area networks. We have developed and implemented, and are continuing to refine, a set of tools, protocols, and interfaces to run the Kratos EM-1500 on-line for collaborative research. Computer tools for capturing and manipulating real-time video signals are integrated into a standardized user interface that may be used for remote access to any transmission electron microscope equipped with a suitable control computer.

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Rangelow, Ivo W., Marcus Kaestner, Tzvetan Ivanov, Ahmad Ahmad, Steve Lenk, Claudia Lenk, Elshad Guliyev, et al. "Atomic force microscope integrated with a scanning electron microscope for correlative nanofabrication and microscopy." Journal of Vacuum Science & Technology B 36, no. 6 (November 2018): 06J102. http://dx.doi.org/10.1116/1.5048524.

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Katoh, Kazuo. "Software-Based Three-Dimensional Deconvolution Microscopy of Cytoskeletal Proteins in Cultured Fibroblast Using Open-Source Software and Open Hardware." Journal of Imaging 5, no. 12 (November 23, 2019): 88. http://dx.doi.org/10.3390/jimaging5120088.

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As conventional fluorescence microscopy and confocal laser scanning microscopy generally produce images with blurring at the upper and lower planes along the z-axis due to non-focal plane image information, the observation of biological images requires “deconvolution.” Therefore, a microscope system’s individual blur function (point spread function) is determined theoretically or by actual measurement of microbeads and processed mathematically to reduce noise and eliminate blurring as much as possible. Here the author describes the use of open-source software and open hardware design to build a deconvolution microscope at low cost, using readily available software and hardware. The advantage of this method is its cost-effectiveness and ability to construct a microscope system using commercially available optical components and open-source software. Although this system does not utilize expensive equipment, such as confocal and total internal reflection fluorescence microscopes, decent images can be obtained even without previous experience in electronics and optics.

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Bornhorst, Julia, Eike Nustede, and Sebastian Fudickar. "Mass Surveilance of C. elegans—Smartphone-Based DIY Microscope and Machine-Learning-Based Approach for Worm Detection." Sensors 19, no. 6 (March 26, 2019): 1468. http://dx.doi.org/10.3390/s19061468.

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The nematode Caenorhabditis elegans (C. elegans) is often used as an alternative animal model due to several advantages such as morphological changes that can be seen directly under a microscope. Limitations of the model include the usage of expensive and cumbersome microscopes, and restrictions of the comprehensive use of C. elegans for toxicological trials. With the general applicability of the detection of C. elegans from microscope images via machine learning, as well as of smartphone-based microscopes, this article investigates the suitability of smartphone-based microscopy to detect C. elegans in a complete Petri dish. Thereby, the article introduces a smartphone-based microscope (including optics, lighting, and housing) for monitoring C. elegans and the corresponding classification via a trained Histogram of Oriented Gradients (HOG) feature-based Support Vector Machine for the automatic detection of C. elegans. Evaluation showed classification sensitivity of 0.90 and specificity of 0.85, and thereby confirms the general practicability of the chosen approach.

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Kenik, Edward A., and Karren L. More. "SHaRE: Collaborative materials science research." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 804–5. http://dx.doi.org/10.1017/s0424820100106089.

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The Shared Research Equipment (SHaRE) Program provides access to the wide range of advanced equipment and techniques available in the Metals and Ceramics Division of ORNL to researchers from universities, industry, and other national laboratories. All SHaRE projects are collaborative in nature and address materials science problems in areas of mutual interest to the internal and external collaborators. While all facilities in the Metals and Ceramics Division are available under SHaRE, there is a strong emphasis on analytical electron microscopy (AEM), based on state-of-the-art facilities, techniques, and recognized expertise in the Division. The microscopy facilities include four analytical electron microscopes (one 300 kV, one 200 kV, and two 120 kV instruments), a conventional transmission electron microscope with a low field polepiece for examination of ferromagnetic materials, a high voltage (1 MV) electron microscope with a number of in situ capabilities, and a variety of EM support facilities. An atom probe field-ion microscope provides microstructural and elemental characterization at atomic resolution.

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Kordesch, Martin E. "Introduction to emission electron microscopy for the in situ study of surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 506–7. http://dx.doi.org/10.1017/s0424820100148368.

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The Photoelectron Emission Microscope (PEEM) and Low Energy Electron Microscope (LEEM) are parallel-imaging electron microscopes with highly surface-sensitive image contrast mechanisms. In PEEM, the electron yield at the illumination wavelength determines image contrast, in LEEM, the intensity of low energy (< 100 eV) electrons back-diffracted from the surface, as well as interference effects, are responsible for image contrast. Mirror Electron Microscopy is also possible with the LEEM apparatus. In MEM, no electron penetration into the solid occurs, and an image of surface electronic potentials is obtained.While the emission microscope techniques named above are not high resolution methods, the unique contrast mechanisms, the ability to use thick single crystal samples, their compatibility with uhv surface science methods and new material-growth methods, coupled with real-time imaging capability, make them very useful.These microscopes do not depend on scanning probes, and some are compatible with pressures up to 10-3 Torr and specimen temperatures above 1300K.

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Schümmer, Andreas, H. Ch Mertins, Claus Michael Schneider, Roman Adam, Stefan Trellenkamp, Rene Borowski, Daniel Emil Bürgler, Larissa Juschkin, and Ulf Berges. "A scanning reflection X-ray microscope for magnetic imaging in the EUV range." Journal of Synchrotron Radiation 26, no. 6 (November 1, 2019): 2040–49. http://dx.doi.org/10.1107/s1600577519012219.

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The mechanical setup of a novel scanning reflection X-ray microscope is presented. It is based on zone plate optics optimized for reflection mode in the EUV spectral range. The microscope can operate at synchrotron radiation beamlines as well as at laboratory-based plasma light sources. In contrast to established X-ray transmission microscopes that use thin foil samples, the new microscope design presented here allows the investigation of any type of bulk materials. Importantly, this permits the investigation of magnetic materials by employing experimental techniques based on X-ray magnetic circular dichroism, X-ray linear magnetic dichroism or the transversal magneto-optical Kerr effect (T-MOKE). The reliable functionality of the new microscope design has been demonstrated by T-MOKE microscopy spectra of Fe/Cr-wedge/Fe trilayer samples. The spectra were recorded at various photon energies across the Fe 3p edge revealing the orientation of magnetic domains in the sample.

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Liu, J., and J. R. Ebner. "Nano-Characterization of Industrial Heterogeneous Catalysts." Microscopy and Microanalysis 4, S2 (July 1998): 740–41. http://dx.doi.org/10.1017/s1431927600023825.

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Catalyst characterization plays a vital role in new catalyst development and in troubleshooting of commercially catalyzed processes. The ultimate goal of catalyst characterization is to understand the structure-property relationships associated with the active components and supports. Among many characterization techniques, only electron microscopy and associated analytical techniques can provide local information about the structure, chemistry, morphology, and electronic properties of industrial heterogeneous catalysts. Three types of electron microscopes are usually used for characterizing industrial supported catalysts: 1) scanning electron microscope (SEM), 2) scanning transmission electron microscope (STEM), and 3) transmission electron microscope (TEM). Each type of microscope has its unique capabilities. However, the integration of all electron microscopic techniques has proved invaluable for extracting useful information about the structure and the performance of industrial catalysts.Commercial catalysts usually have a high surface area with complex geometric structures to enable reacting gases or fluids to access as much of the active surface of the catalyst as possible.

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Becker, John H. "Virtual Microscopes in Podiatric Medical Education." Journal of the American Podiatric Medical Association 96, no. 6 (November 1, 2006): 518–24. http://dx.doi.org/10.7547/0960518.

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In many medical schools, microscopes are being replaced as teaching tools by computers with software that emulates the use of a light microscope. This article chronicles the adoption of “virtual microscopes” by a podiatric medical school and presents the results of educational research on the effectiveness of this adoption in a histology course. If the trend toward virtual microscopy in education continues, many 21st-century physicians will not be trained to operate a light microscope. The replacement of old technologies by new is discussed. The fundamental question is whether all podiatric physicians should be trained in the use of a particular tool or only those who are likely to use it in their own practice. (J Am Podiatr Med Assoc 96(6): 518–524, 2006)

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Eminizer, Margaret, Melinda Nagy, Elizabeth L. Engle, Sigfredo Soto-Diaz, Andrew Jorquera, Jeffrey S. Roskes, Benjamin F. Green, Richard Wilton, Janis M. Taube, and Alexander S. Szalay. "Comparing and Correcting Spectral Sensitivities between Multispectral Microscopes: A Prerequisite to Clinical Implementation." Cancers 15, no. 12 (June 8, 2023): 3109. http://dx.doi.org/10.3390/cancers15123109.

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Multispectral, multiplex immunofluorescence (mIF) microscopy has been used to great effect in research to identify cellular co-expression profiles and spatial relationships within tissue, providing a myriad of diagnostic advantages. As these technologies mature, it is essential that image data from mIF microscopes is reproducible and standardizable across devices. We sought to characterize and correct differences in illumination intensity and spectral sensitivity between three multispectral microscopes. We scanned eight melanoma tissue samples twice on each microscope and calculated their average tissue region flux intensities. We found a baseline average standard deviation of 29.9% across all microscopes, scans, and samples, which was reduced to 13.9% after applying sample-specific corrections accounting for differences in the tissue shown on each slide. We used a basic calibration model to correct sample- and microscope-specific effects on overall brightness and relative brightness as a function of the image layer. We tested the generalizability of the calibration procedure and found that applying corrections to independent validation subsets of the samples reduced the variation to 2.9 ± 0.03%. Variations in the unmixed marker expressions were reduced from 15.8% to 4.4% by correcting the raw images to a single reference microscope. Our findings show that mIF microscopes can be standardized for use in clinical pathology laboratories using a relatively simple correction model.

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Mansfield, John F. "Digital imaging: When should one take the plunge?" Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 602–3. http://dx.doi.org/10.1017/s0424820100165471.

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The current imaging trend in optical microscopy, scanning electron microscopy (SEM) or transmission electron microscopy (TEM) is to record all data digitally. Most manufacturers currently market digital acquisition systems with their microscope packages. The advantages of digital acquisition include: almost instant viewing of the data as a high-quaity positive image (a major benefit when compared to TEM images recorded onto film, where one must wait until after the microscope session to develop the images); the ability to readily quantify features in the images and measure intensities; and extremely compact storage (removable 5.25” storage devices which now can hold up to several gigabytes of data).The problem for many researchers, however, is that they have perfectly serviceable microscopes that they routinely use that have no digital imaging capabilities with little hope of purchasing a new instrument.

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Blom, Douglas A., Lawrence F. Allard, Satoshi Mishina, and Michael A. O'Keefe. "Early Results from an Aberration-Corrected JEOL 2200FS STEM/TEM at Oak Ridge National Laboratory." Microscopy and Microanalysis 12, no. 6 (October 11, 2006): 483–91. http://dx.doi.org/10.1017/s1431927606060570.

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The resolution-limiting aberrations of round electromagnetic lenses can now be successfully overcome via the use of multipole element “aberration correctors.” The installation and performance of a hexapole-based corrector (CEOS GmbH) integrated on the probe-forming side of a JEOL 2200FS FEG STEM/TEM is described. For the resolution of the microscope not to be severely compromised by its environment, a new, specially designed building at Oak Ridge National Laboratory has been built. The Advanced Microscopy Laboratory was designed with the goal of providing a suitable location for aberration-corrected electron microscopes. Construction methods and performance of the building are discussed in the context of the performance of the microscope. Initial performance of the microscope on relevant specimens and modifications made to eliminate resolution-limiting conditions are also discussed.

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Beverloo, H. B., A. van Schadewijk, H. J. Zijlmans, N. P. Verwoerd, J. Bonnett, H. Vrolijk, and H. J. Tanke. "A comparison of the detection sensitivity of lymphocyte membrane antigens using fluorescein and phosphor immunoconjugates." Journal of Histochemistry & Cytochemistry 41, no. 5 (May 1993): 719–25. http://dx.doi.org/10.1177/41.5.8468453.

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In this study we compared the sensitivity of immunocytochemical procedures, using conventional and time-resolved fluorescent dyes, in a model system consisting of paraformaldehyde-fixed human lymphocytes. The lymphocytes were stained for the presence of the CD4 epitope by indirect immunofluorescence using FITC as label or by using time-resolved luminescent immunophosphors. These immunophosphors were primarily developed for use under time-resolved fluorescence conditions, but they are also very well suited for use in conventional fluorescence microscopes. The differently labeled cells were first examined visually with a conventional fluorescence microscope in a double-blind study. The fluorescence was also measured with a CCD camera mounted on a specially constructed time-resolved fluorescence microscope which allows the suppression of the fast decaying fluorescence, thereby permitting visualization of the specific, slowing decaying luminescence of the phosphor label. With this microscope FITC and immunophosphor labeled lymphocytes were compared under normal conditions (i.e., continuous excitation) and under conditions of time-resolved registration. Conventional fluorescence microscopy revealed a better sensitivity in favor of the phosphor conjugates. This difference became more prominent when the preparations were quantitatively assessed with the CCD-time-resolved microscope. Time-resolved microscopy permitted a suppression of fast decaying fluorescence better than 1 to 10(6).

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van der Krift, Theo, Ulrike Ziese, Willie Geerts, and Bram Koster. "Computer-Controlled Transmission Electron Microscopy: Automated Tomography." Microscopy and Microanalysis 7, S2 (August 2001): 968–69. http://dx.doi.org/10.1017/s1431927600030919.

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The integration of computers and transmission electron microscopes (TEM) in combination with the availability of computer networks evolves in various fields of computer-controlled electron microscopy. Three layers can be discriminated: control of electron-optical elements in the column, automation of specific microscope operation procedures and display of user interfaces. The first layer of development concerns the computer-control of the optical elements of the transmission electron microscope (TEM). Most of the TEM manufacturers have transformed their optical instruments into computer-controlled image capturing devices. Nowadays, the required controls for the currents through lenses and coils of the optical column can be accessed by computer software. The second layer of development is aimed toward further automation of instrument operation. For specific microscope applications, dedicated automated microscope-control procedures are carried out. in this paper, we will discuss our ongoing efforts on this second level towards fully automated electron tomography. The third layer of development concerns virtual- or telemicroscopy. Most telemicroscopy applications duplicate the computer-screen (with accessory controls) at the microscope-site to a computer-screen at another site. This approach allows sharing of equipment, monitoring of instruments by supervisors, as well as collaboration between experts at remote locations.Electron tomography is a three-dimensional (3D) imaging method with transmission electron microscopy (TEM) that provides high-resolution 3D images of structural arrangements. with electron tomography a series of images is acquired of a sample that is tilted over a large angular range (±70°) with small angular tilt increments.

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Kim, Lee, Hyun, Je, Park, Bae, Kim, and Kim. "Development of a Reflective 193-nm DUV Microscope System for Defect Inspection of Large Optical Surfaces." Applied Sciences 9, no. 23 (November 29, 2019): 5205. http://dx.doi.org/10.3390/app9235205.

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We developed a 193-nm deep ultraviolet (DUV) microscope system based on the reflection mode for a precise inspection of various types of defects/cracks on large optical surfaces of the order of one meter in size. Without preprocessing the sample at room temperature and atmospheric pressure, which is commonly necessary for electron microscopy, the reflective 193-nm DUV microscope was used to directly observe optical surface defects in a manner similar to conventional optical microscopes. In addition, the limitations on the selection of materials and thickness of optical samples of transmittive DUV microscopes were overcome. DUV microscope imaging and the analysis on the spatial resolution were verified using a 1D grating structure with a 225-nm line width. This system could be widely applied as an inspection tool because it provides high resolution at the 200-nm scale that is close to the diffraction limit of a 193-nm DUV beam. In the near future, it is expected that our system would be extended to nano/bio imaging as well as the inspection of large optical surfaces.

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Smith, N. R., R. E. Tullis, N. Fegan, and C. L. Morgan. "Remote Operation of a Scanning Electron Microscope (SEM) from Distant Classrooms." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 414–15. http://dx.doi.org/10.1017/s0424820100164532.

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California State University, Hayward (CSUH) has successfully demonstrated remote operation of a scanning electron microscope (SEM) using several networking interfaces. One of these methods is the use of highbandwidth asynchronous transfer mode (ATM). The different networking schemes have made it possible for instructors and researchers to access and control the Cal State Hayward SEM from classrooms located within the same building housing the microscope. In addition, the microscope has been remotely operated from across campus, from the local community college, and from San Jose State University.The development of digital imaging technology provides opportunities of developing networking schemes for access and control of scientific instrumentation. The ability to network microscopes offers the capability of teaching microscopy methods to a large number of students at the same time. The traditional microscopy class includes the instructor training one student at a time while other students observe the operator of the instrument. Remote shared access to scientific instrumentation provides the advantages of a wider variety of resources and pooling of knowledge by a larger community.

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Journal articles on the topic 'Microscope'

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