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Journal articles on the topic 'Metrology'

To see the other types of publications on this topic, follow the link: Metrology.

Author: Grafiati

Published: 4 June 2021

Last updated: 1 August 2024

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1

Widarta, A. "CCEM key comparison CCEM.RF-K26. Attenuation at 18 GHz, 26.5 GHz and 40 GHz using a step attenuator. Final report of the pilot laboratory." Metrologia 61, no. 1A (January 1, 2024): 01001. http://dx.doi.org/10.1088/0026-1394/61/1a/01001.

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Main text This report summarizes the results of the Key Comparison CCEM.RF-K26 Attenuation at 18 GHz, 26.5 GHz and 40 GHz using a step attenuator which has been performed from January 2015 to February 2018. Fourteen National Metrology Institutes (NMIs) participated in this key comparison, including the National Metrology Institute of Japan (NMIJ/AIST, Japan) which served as pilot laboratory, the National Institute of Metrology (NIM, China), the Physikalisch-Technische Bundesanstal (PTB, Germany), the Laboratoire national de métrologie et d'essais (LNE, France), the Swiss Federal Office for Metrology and Accreditation (METAS, Switzerland), the National Physical Laboratory of India (NPLI, India), the All-Russian Scientific Research Institute of Physico-Technical Measurements (VNIIFTRI, Russia), the Korea Research Institute of Standard and Science (KRISS, South Korea), the National Physical Laboratory (NPL, United Kingdom), the National Metrology Institute of South Africa (NMISA, South Africa), the Tubitak Ulusal Metrologi Enstitűsű (TUBITAK-UME, Turkey), the National Metrology Centre (NMC-A*STAR, Singapore), the Czech Metrology Institute (CMI, Czech Republic) and the Instituto Nacional de Tecnica Aeroespacial (INTA, Spain). The Key Comparison Reference Values (KCRVs) were determined from the measurement results of five to ten participating NMIs, depending on the attenuation and frequency. To reach the main text of this paper, click on Final Report. Note that this text is that which appears in Appendix B of the BIPM key comparison database https://www.bipm.org/kcdb/. The final report has been peer-reviewed and approved for publication by the CCEM, according to the provisions of the CIPM Mutual Recognition Arrangement (CIPM MRA).

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2

Costa-Félix, Rodrigo, Americo Bernardes, José Carlos Valente de Oliveira, José Mauro Granjeiro, Ruth Epsztejn, Waldemar Ihlenfeld, and Valnei Smarçaro da Cunha. "VII Brazilian Congress on Metrology (Metrologia 2013)." Journal of Physics: Conference Series 575 (January 6, 2015): 011001. http://dx.doi.org/10.1088/1742-6596/575/1/011001.

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3

Azzumar, Muhammad, and Agah Faisal. "DISEMINASI RESISTOR STANDAR 1 KΩ KE STANDAR KERJA." Jurnal Standardisasi 17, no. 3 (September 1, 2016): 223. http://dx.doi.org/10.31153/js.v17i3.322.

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<p>Abstrak<br />Diseminasi nilai kalibrasi resistor standar kepada standar kerja di Puslit Metrologi - LIPI telah dilakukan. Hal ini bertujuan untuk mendapatkan hasil kalibrasi dan estimasi ketidakpastiannya yang valid dan tertelusur ke SI pada standar kerja. Desiminasi dilakukan dengan cara mengimplenmentasikan nilai kalibrasi resistor standar 1 kΩ ke resistor acuan dan kemudian ke standar kerja. Nilai yang telah diturunkan kepada standar kerja, reference multimeter, telah dibandingkan dengan nilai pengukuran yang dilakukan oleh KRISS (Korea Research Institute of Standards and Science) melalui kriteria derajat ekuivalensi. Error number berdasarkan kriteria derajat ekuivalensi antara Metrologi - LIPI dan KRISS pada resistor-resistor 100Ω, 10Ω, dan 1Ω masing-masing adalah sebesar 0,51, 0,73, dan 0,87. Berdasarkan error number tersebut, hasil pengukuran Metrologi - LIPI memiliki kesesuaian nilai ukur dengan hasil ukur KRISS. Lebih daripada itu, hal tersebut telah memvalidasi hasil kalibrasi dan estimasi ketidakpastian dari resistor acuan dan standar kerja di Puslit Metrologi - LIPI.<br />Kata kunci: nilai kalibrasi, resistor standar, standar kerja, kriteria derajat kebebasan, validasi.</p><p><br />Abstract<br />Dissemination of calibration value of standard resistor to working standard in Research Center for Metrology LIPI has been done. It aims to get the calibration result and the uncertainty estimation that are valid and traceable to SI on the working standard. The desimination was performed by implementing calibration value of 1 kΩ standard resistor to reference resistor and then to working standard. The value that had been disseminated to working standard, reference multimeter, had been compared to the measurement value made by KRISS (Korea Research Institute of Standards and Science) through a degree of equivalence criteria. The error numbers based on the degree of equivalence criteria between Metrology-LIPI and KRISS for the resistors measurement of 100Ω, 10Ω, and 1Ω were 0.51, 0.73, and 0.87 respectively. Based on those error numbers, Metrology-LIPI measurement results had the measuring value agreement with KRISS measurement results. Moreover, Its had validated calibration result and the uncertainty estimation of reference resistor and working standard in Metrology LIPI<br />Keywords: calibration value, standard resistor, working standard, degree of equivalence criteria, validation.</p>

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4

Harfiah, Rismisari. "Implementasi Rancangan Pelatihan Kemetrologian bagi Juru Timbang Menggunakan Metode ADDIE." Cendekia Niaga 3, no. 1 (October 1, 2019): 9–13. http://dx.doi.org/10.52391/jcn.v3i1.457.

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Legal metrology is a very large and complex field to be implemented. In realizing orderly measurement for all of Indonesia, very large human resources are needed. A total of 1900 Metrology Human Resources currently available cannot meet the needs of the community, which includes at least 14.230 traditional markets and hundreds of modern markets spread throughout Indonesia. Adding large numbers of Metrologi personnel from ASN is very difficult, the most likely choice is to recruit personnel outside metrology such as market managers of traditional and modern market. This situation encouraging idea to recruit weighers whose task is to check the scales in traditional and modern markets. Through the ADDIE method which include analize, design, develop, implementation and evaluation a training model for weighers is designed. As a result, two days of training (20 JP) with classroom learning methods and laboratory practices is held . Furthermore, the weigher conducts trials in the market where each of them is on duty. The evaluation results with an average value of 4.43 of 5 Likert Scale indicate that the training is satisfying and meets the needs of the knowledge and skills of the weighers before duty.

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5

Kibble, Bryan. "Everyday instruments from basic metrology [Basic Metrology]." IEEE Instrumentation & Measurement Magazine 18, no. 3 (June 2015): 9–10. http://dx.doi.org/10.1109/mim.2015.7108212.

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6

Du, Mingxin, Boyong Gao, Shuaizhe Wang, Zilong Liu, Xingchuang Xiong, and Yuqi Luo. "Design and Implementation of Time Metrology Vocabulary Ontology." Electronics 13, no. 14 (July 18, 2024): 2828. http://dx.doi.org/10.3390/electronics13142828.

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The advent of the digital era has put forward an urgent need for the digitization of metrology, and the digitization of metrology vocabularies is one of the fundamental and critical steps to achieve the digital transformation of metrology. Metrology vocabulary ontology can facilitate the exchange and sharing of data and is an important way to achieve the digitization of metrology vocabulary. Time metrology vocabulary is a special and important part of the whole metrology vocabulary, and constructing its ontology can reduce the problems caused by semantic confusion, help to smooth the progress of metrological work, and promote the digital transformation of metrology. Currently, the existing ontology for metrology vocabulary is primarily the MetrOnto ontology, but it lacks a systematic description of the vocabulary of time metrology. To address this issue, improve the metrology vocabulary ontology, and lay the groundwork for realizing the digital transformation of metrology, this paper takes time metrology vocabulary as the research object; proposes a classification principle that meets the inherent requirements of time transfer in the digital world; adopts the seven-step method of ontology construction to construct an ontology specialized in time metrology vocabulary, OTMV (Ontology of Time Metrology Vocabulary); and conducts an ontology consistency check, a machine-readable validation, a machine-understandable primary validation, and information retrieval validation on it. The validation results show that OTMV has correct syntactic and logical consistency and is capable of realizing machine-readable, machine-understandable, and information retrieval. The construction of this ontology provides a systematic description of the time measurement vocabulary that can address the problem of word expression of time metrology vocabulary in the digital world and lay the foundation for the digitization of our metrology vocabulary, as well as its readability, understandability, and sharing.

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7

Krutikov, V. N., and V. V. Okrepilov. "Money Metrology." Measurement Techniques 63, no. 12 (March 2021): 993–1003. http://dx.doi.org/10.1007/s11018-021-01883-8.

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8

Krutikov, V. N., and V. V. Okrepilov. "Money metrology." Izmeritel`naya Tekhnika, no. 12 (2020): 42–50. http://dx.doi.org/10.32446/0368-1025it.2020-12-42-50.

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The influence of the provisions of legal metrology on the formation and functioning of the monetary environment in market conditions is studied. It is shown that the use of material (reference) measures for determining the value of goods in monetary units makes it possible to form a stable monetary system, equal for all market participants. This system can reasonably be attributed to information measuring systems. Systems based on the use of constant material measures that determine the value of goods and money in international trade have been formed and functioned for a long time. In the XIX-XX centuries, the monetary system, in which a fixed weight of gold served as the material measure of money, was called the “gold standard”. In the 1970s, this system was abandoned without objective reasons. Nowadays, many people believe that the main reason is the uncontrolled issuance of paper money (US dollars). As a result, the material measure of money was replaced by a monetary measure. The money of a number of selected countries turned out to be a measure of the national currencies of other countries. Then money was made a commodity – an object of market trading, the price of which is determined by supply and demand. Thus, the most important principle of metrology was violated – the invariability (constancy) of the measure of system objects. The resulting monetary system became unstable. This situation has led to an increase in the number of proposals for a return to the gold standard. The analysis carried out in the paper confirmed the relevance of these proposals. At the present stage of development of metrology, it is advisable to explore the possibility of a broader (not only at the expense of precious metals) resource provision of material monetary measures, in particular, to consider the possibility of using materials and (or) goods that are in high demand in the international market as monetary measures.

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9

Kuster, Mark. "Metrology News." NCSL International measure 13, no. 2 (June 2021): 18–22. http://dx.doi.org/10.51843/measure.13.2.3.

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10

Picotto, G. B., L. Koenders, and G. Wilkening. "Nanoscale metrology." Measurement Science and Technology 20, no. 8 (June 30, 2009): 080101. http://dx.doi.org/10.1088/0957-0233/20/8/080101.

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11

Klapetek, P., and L. Koenders. "Nanoscale metrology." Measurement Science and Technology 22, no. 9 (August 8, 2011): 090101. http://dx.doi.org/10.1088/0957-0233/22/9/090101.

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12

Currim, Sabah, Richard T. Snodgrass, Young-Kyoon Suh, and Rui Zhang. "DBMS Metrology." ACM Transactions on Database Systems 42, no. 1 (March 2, 2017): 1–42. http://dx.doi.org/10.1145/2996454.

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13

Crease, Robert P. "Chinese metrology." Physics World 24, no. 07 (July 2011): 16–17. http://dx.doi.org/10.1088/2058-7058/24/07/24.

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14

Hentschel, M., R. Kienberger, Ch Spielmann, G. A. Reider, N. Milosevic, T. Brabec, P. Corkum, U. Heinzmann, M. Drescher, and F. Krausz. "Attosecond metrology." Nature 414, no. 6863 (November 2001): 509–13. http://dx.doi.org/10.1038/35107000.

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15

Kleine-Ostmann, T., T. Schrader, M. Bieler, U. Siegner, C. Monte, B. Gutschwager, J. Hollandt, et al. "THz Metrology." Frequenz 62, no. 5-6 (June 1, 2008): 137–48. http://dx.doi.org/10.1515/freq.2008.62.5-6.137.

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16

Jiang, X., and D. J. Whitehouse. "Precision metrology." Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences 370, no. 1973 (August 28, 2012): 4154–60. http://dx.doi.org/10.1098/rsta.2012.0175.

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This article is a summary of the Satellite Meeting, which followed on from the Discussion Meeting at the Royal Society on ‘Ultra-precision engineering: from physics to manufacture’, held at the Kavli Royal Society International Centre, Chicheley Hall, Buckinghamshire, UK. The meeting was restricted to 18 invited experts in various aspects of precision metrology from academics from the UK and Sweden, Government Institutes from the UK and Germany and global aerospace industries. It examined and identified metrology problem areas that are, or may be, limiting future developments in precision engineering and, in particular, metrology. The Satellite Meeting was intended to produce a vision that will inspire academia and industry to address the solutions of those open-ended problems identified. The discussion covered three areas, namely the function of engineering parts, their measurement and their manufacture, as well as their interactions.

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17

Whitehouse, D. J. "Surface metrology." Measurement Science and Technology 8, no. 9 (September 1, 1997): 955–72. http://dx.doi.org/10.1088/0957-0233/8/9/002.

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18

Goch, G. "Gear Metrology." CIRP Annals 52, no. 2 (2003): 659–95. http://dx.doi.org/10.1016/s0007-8506(07)60209-1.

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19

Whitehouse, D. J. "Surface metrology." Computer Standards & Interfaces 21, no. 2 (June 1999): 185. http://dx.doi.org/10.1016/s0920-5489(99)92250-x.

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20

Williams, D. C. "Optical metrology." Optics & Laser Technology 20, no. 3 (June 1988): 163. http://dx.doi.org/10.1016/0030-3992(88)90048-5.

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21

Burch, J. M. "Optical metrology." Optics & Laser Technology 20, no. 2 (April 1988): 105. http://dx.doi.org/10.1016/0030-3992(88)90101-6.

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22

Ennos, A. E. "Speckle metrology." Optics & Laser Technology 26, no. 5 (January 1994): 371–72. http://dx.doi.org/10.1016/0030-3992(94)90127-9.

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23

Xiang, Guo-Yong, and Guang-Can Guo. "Quantum metrology." Chinese Physics B 22, no. 11 (November 2013): 110601. http://dx.doi.org/10.1088/1674-1056/22/11/110601.

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24

Baker, L. R. "Optical Metrology." Journal of Modern Optics 35, no. 5 (May 1988): 753–54. http://dx.doi.org/10.1080/09500348814550801.

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25

Margolis, Helen S. "Moving metrology." Nature Photonics 1, no. 5 (May 2007): 258–59. http://dx.doi.org/10.1038/nphoton.2007.55.

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26

Horiuchi, Noriaki. "Spin metrology." Nature Photonics 7, no. 6 (May 30, 2013): 423. http://dx.doi.org/10.1038/nphoton.2013.143.

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27

Thompson, R. C. "Modern metrology." Contemporary Physics 34, no. 3 (May 1993): 153–55. http://dx.doi.org/10.1080/00107519308213813.

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28

Piruzyan, L. A. "Physiological Metrology." Doklady Biological Sciences 404, no. 1-6 (September 2005): 341–44. http://dx.doi.org/10.1007/s10630-005-0130-x.

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29

KIYONO, Satoshi. "Intelligent Metrology." Journal of the Japan Society for Precision Engineering 75, no. 1 (2009): 89–90. http://dx.doi.org/10.2493/jjspe.75.89.

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30

YOSHIZAWA, Toru. "Optical metrology." Journal of the Japan Society for Precision Engineering 75, no. 1 (2009): 93–94. http://dx.doi.org/10.2493/jjspe.75.93.

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31

Fischer, J., and B. Fellmuth. "Temperature metrology." Reports on Progress in Physics 68, no. 5 (March 31, 2005): 1043–94. http://dx.doi.org/10.1088/0034-4885/68/5/r02.

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32

BIRD, H. A. "WHITHER METROLOGY?" Rheumatology 26, no. 3 (1987): 165–67. http://dx.doi.org/10.1093/rheumatology/26.3.165.

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33

Voas, Jeffrey, Rick Kuhn, and Phillip A. Laplante. "IoT Metrology." IT Professional 20, no. 3 (May 2018): 6–10. http://dx.doi.org/10.1109/mitp.2018.032501740.

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34

Gasvik, K. J., and J. M. Burch. "Optical metrology." Precision Engineering 10, no. 3 (July 1988): 164. http://dx.doi.org/10.1016/0141-6359(88)90036-0.

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35

"Preface." Journal of Physics: Conference Series 2606, no. 1 (October 1, 2023): 011001. http://dx.doi.org/10.1088/1742-6596/2606/1/011001.

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11th Brazilian Congress on Metrology (Metrologia 2021) The Metrology 2021 congress was held from October 18th to 21st, 2021. It was a remote event, with all activities done in virtual rooms. The general president of Metrology 2021 was Americo Bernardes, president of the Brazilian Society of Metrology and professor at the Federal University of Ouro Preto. Metrology 2021 Magna session was the lecture Dr. Claire M. Saundry (NIST) gave on the first day, October 18th. Dr. Saundry spoke about the main activities of the Interamerican Metrology System (or “Sistema Interamericano de Metrologia” – SIM) regarding capacity building and knowledge transfer. Following the Magna session, on the morning of October 18th, the work began with the plenary lecture given by Dr. Daniel Varela Magalhães from the Mechanical Engineering Department at USP. The speaker gave a general outline of the new edition of the International Vocabulary of Metrology (VIM). Further after, on the afternoon of October 18th, two virtual rooms were held in parallel with the sessions related to CBM (general metrology) and CBMRI (ionizing radiations). CBMRI sessions also featured four thematic discussions on specific topics of interest. The second day of the congress, October 19th, started with the lecture of Dr. Thomas Hartung from the Johns Hopkins Bloomberg School of Public Health. He spoke about assessing the health effects of drugs and chemicals, which is considered a scientific revolution and a critical application of Metrology in the Health Area. Continuing in the Health area, Dr. Cameron Miller from NIST presented his lecture on documentary standards and the development of measurement methods for UV disinfection technologies. The plenary lectures were closed by Dr. Renato Garcia from UFSC, who spoke about quality programs in medical equipment used in primary health care, specifically about post-market safety and performance trials. Later, on the afternoon of October 19th, two virtual rooms were held in parallel sessions related to CBM (general metrology) and CBMO (optical metrology). The third day of the congress started with an exciting round table about female researchers’ presence in ionizing radiations. A plenary lecture by Stephane Solve from the “Bureau International de Poids et Mesures” (BIPM) Radiometry-Photometry group followed. The main subject was an extension of the BIPM on-site primary voltage standards comparisons to AC voltages, an important topic in Electrical Metrology. Further on, the morning works ended with a round table about Metrology in Health, featuring Renata Souza from FIOCRUZ and Roberto Macoto Ichinose from the Biomedical Engineering of COPPE/UFRJ. The afternoon of the third day started with two virtual rooms that held parallel sessions related to SEMETRO (electrical metrology) and to CIMMEC (mechanical metrology). Later on, there was another round table about Metrology in Health, specifically about metrological traceability of laboratory tests, with lectures by Dr. Marcelo Medeiros from INMETRO, Debora Michele Morone D’Aiuto from FIOCRUZ, Rafael Monsores from the company CONTROLLAB and MD Luisane Maria Falci Vieira, manager of the laboratory Álvaro Apoio. The event’s last day, October 21st, started with a plenary lecture by Dr. Jim Huggett from National Measurement Laboratory (NML), talking about the role of measurement science in supporting a molecular diagnosis of SARS-COV-2, a very current and hot topic. A vivid discussion on Metrology Education followed the plenary lecture. The afternoon of the last day started with two virtual rooms that held parallel sessions related to REMEQ (chemical metrology) and CBM (general metrology). Later, round tables were held in the two parallel virtual rooms, discussing hot topics such as metrological traceability, quality control on COVID-19 diagnostics, alternative methods applied to toxicology, and a web app developed for the performance evaluation of laboratories. Metrologia 2021 disclosed about 170 articles. After the second round of revision, the editorial committee selected the best 35 to be published by IOP JPCS. Metrology 2021 had sponsors from the industrial sector (Fluke Calibration and Sartorius do Brasil (Gold sponsors) and institutional support (ARBB Consultoria em Metrologia e Qualidade, RMMG, Canal Metrologia, REDE, SBLUZ and GM Metrologia). The event’s next edition will be face-to-face in 2023, from 28th to 30th November, in Itaipava, a gorgeous area belonging to the “Imperial City” of Petrópolis, Rio de Janeiro state. You are all welcome to join us! Rio de Janeiro, RJ, Brasil, August 28th, 2023. List of Editorial committee, Organizing committee are available in this Pdf.

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36

Chrzanowski, K. "Review of night vision metrology." Opto-Electronics Review 23, no. 2 (January 1, 2015). http://dx.doi.org/10.1515/oere-2015-0024.

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AbstractA review of night vision metrology is presented in this paper. A set of reasons that create a rather chaotic metrologic situation on night vision market is presented. It is shown that there has been made a little progress in night vision metrology during last decades in spite of a big progress in night vision technology at the same period of time. It is concluded that such a big discrep- ancy between metrology development level and technology development can be an obstacle in the further development of night vision technology.

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37

Brown, Christopher A. "Surface Metrology Principles for Snow and Ice Friction Studies." Frontiers in Mechanical Engineering 7 (December 16, 2021). http://dx.doi.org/10.3389/fmech.2021.753906.

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Recent advances in surface metrology science are applied to understanding friction with snow and ice. Conventional surface metrology’s measurement, analyses, and characterizations, have inherent limitations for elucidating tribological interactions. Strong functional correlations and confident discriminations with slider surface topographies, textures, or “roughness”, have largely eluded researchers using conventional methods. Building on 4 decades of research using multiscale geometric methods, two surface metrology axioms and corollaries are proposed with good potential to provide new technological insights.

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38

"8th Brazilian Congress on Metrology (Metrologia 2015)." Journal of Physics: Conference Series 733 (July 2016): 011001. http://dx.doi.org/10.1088/1742-6596/733/1/011001.

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39

"9th Brazilian Congress on Metrology (Metrologia 2017)." Journal of Physics: Conference Series 975 (March 2018): 011001. http://dx.doi.org/10.1088/1742-6596/975/1/011001.

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40

Lewis, Andrew John, and Andrew Yacoot. "Editorial for the Metrologia Focus Issue on Length Metrology." Metrologia, January 5, 2023. http://dx.doi.org/10.1088/1681-7575/acb05b.

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Abstract This Focus Issue of Metrologia was instigated by the Consultative Committee for Length's Working Group on Strategic Planning when it met online in 2020 during the COVID-19 pandemic. Submission of articles started closely thereafter and was closed in September 2022. Covering a wide range of topics, the issue shows that despite the Coronavirus pandemic disrupting laboratory work, length metrology researchers have continued to deliver cutting edge research. The revised definition of the metre and its Mise en Pratique, both published in 2019, have stimulated further research and opened additional opportunities for developing length metrology capabilities. Articles related to the new Mise en Pratique are included in the issue, together with a range of articles demonstrating the breadth and ingenuity of current leading edge research in length metrology. A final paper indicates how metrology, with length used as an example, may be enhanced by a transition to a digital framework for realising the SI.

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41

"Metrology." Precision Engineering 15, no. 4 (October 1993): 300. http://dx.doi.org/10.1016/0141-6359(93)90162-4.

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42

Wright, Louise, and Stuart Davidson. "Digital twins for metrology; metrology for digital twins." Measurement Science and Technology, January 18, 2024. http://dx.doi.org/10.1088/1361-6501/ad2050.

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Abstract Digital twinning is a rapidly growing area of research. Digital twins combine models and data to provide up-to-date information about the state of a system. They support reliable decision-making in fields such as structural monitoring and advanced manufacturing. The use of metrology data to update models in this way offers benefits in many areas, including metrology itself. The recent activities in digitalisation of metrology offer a great opportunity to make metrology data “twin-friendly” and to incorporate digital twins into metrological processes. This paper discusses key features of digital twins that will inform their use in metrology and measurement, highlights the links between digital twins and virtual metrology, outlines what use metrology can make of digital twins and how metrology and measured data can support the use of digital twins, and suggests potential future developments that will maximise the benefits achieved.

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43

Giovannetti, Vittorio, Seth Lloyd, and Lorenzo Maccone. "Quantum Metrology." Physical Review Letters 96, no. 1 (January 3, 2006). http://dx.doi.org/10.1103/physrevlett.96.010401.

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44

"Chemical metrology." Analytical Methods 8, no. 46 (2016): 8119–22. http://dx.doi.org/10.1039/c6ay90155g.

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45

Bennett, Seton, and Joaquin Valdés. "Materials metrology." Metrologia 47, no. 2 (March 8, 2010). http://dx.doi.org/10.1088/0026-1394/47/2/e01.

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46

Thomas, David J., Ralf Nolte, and Vincent Gressier. "Neutron metrology." Metrologia 48, no. 6 (October 28, 2011). http://dx.doi.org/10.1088/0026-1394/48/6/e01.

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47

Vorburger, Theodore. "Surface Metrology." Optical Engineering 24, no. 3 (June 1, 1985). http://dx.doi.org/10.1117/12.7973491.

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Koenders, L., F. Meli, and G. Wilkening. "Nanoscale Metrology." Measurement Science and Technology 18, no. 2 (January 12, 2007). http://dx.doi.org/10.1088/0957-0233/18/2/e01.

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"Mismeasuring metrology." New Scientist 227, no. 3041 (October 2015): 5. http://dx.doi.org/10.1016/s0262-4079(15)31285-9.

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"Metrology merger." Materials Today 5, no. 9 (September 2002): 17. http://dx.doi.org/10.1016/s1369-7021(02)00922-7.

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