Dissertations / Theses on the topic 'Metrology'
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SILVA, PEDRO PAULO ALMEIDA. "METROLOGY IN STANDARDS, STANDARDS IN METROLOGY." PONTIFÍCIA UNIVERSIDADE CATÓLICA DO RIO DE JANEIRO, 2003. http://www.maxwell.vrac.puc-rio.br/Busca_etds.php?strSecao=resultado&nrSeq=4049@1.
Full textA presente dissertação de mestrado intitulada Metrologia nas normas, normas na metrologia foi motivada por recomendações explícitas contidas no Plano Nacional de Metrologia (PNM) - transformado em instrumento da política metrológica brasileira, por força de Resolução Interministerial do CONMETRO, que propôs ações de fortalecimento do sistema brasileiro de normalização, priorizando a implementação de um comitê brasileiro para normalização em metrologia na estrutra orgânica da ABNT. Entendidas como funções complementares da tecnologia industrial, metrologia e normalização são tratadas não apenas como insumos essenciais para desenvolvimento da competitividade industrial e melhoria da qualidade de vida, mas, também, como elementos indissociáveis no equacionamento de vulnerabilidades que restringem o acesso de produtos brasileiros a mercados competitivos em decorrência de barreiras técnicas ao comércio internacional. Assim, no contexto das recomendações apontadas pelo PNM, a pesquisa de mestrado contemplou: (i) estudo do modus operandi dos organismos internacionais de normalização, para se perceber a forma pela qual o insumo metrológico é agregado às normas internacionais; (ii) análise das práticas vivenciadas por organismos nacionais de normalização de países mais industrializados, objetivando apreender suas experiências no desenvolvimento de normas em metrologia; (iii) entrevista junto a especialistas atuantes em metrologia e em normalização, objetivando definir um padrão de atuação para se equacionar a normalização técnica setorial no Brasil; (iv) caracterização dos principais fatos marcantes que impactaram o alavancamento da normalização técnica no País, provendo subsídio para equacionamento dos óbices ainda existentes e (v) análise das carências e vulnerabilidades do sistema brasileiro de normalização, assim consolidando conhecimento e uma visão crítica para planejamento da pesquisa de mestrado que se constituiu na concepção e formulação das bases conceituais de um comitê técnico para normalização em metrologia, proposto para ser implementado na estrutura orgânica da ABNT, entendido como estratégia de fortalecimento do sistema brasileiro de normalização e (vi) pesquisa de demanda por normalização em metrologia. Objetivando diferenciar as demandas por normalização em metrologia das demandas por metrologia na normalização, a pesquisa foi desenvolvida no contexto de três ambientes: (a) junto aos comitês brasileiros de normalização (ABNT/CB) e organismos de normalização setorial (ONS) que integram a estrutura orgânica da Associação Brasileira de Normas Técnicas (ABNT), com o propósito de conhecer necessidades específicas de metrologia na atividade de normalização bem como as dificuldades relacionadas ao uso e aplicação de fundamentos da metrologia como insumo ao processo de normalização técnica; (b) junto a especialistas de metrologia e normalização, para subsidiar o desenvolvimento de uma interface técnica de cooperação e (c) junto a fóruns especialistas de metrologia, para se identificar demandas por normalização, identificadas ao longo das respectivas cadeias hierárquicas de disseminação das unidades de base e derivadas do Sistema Internacional de Unidades (SI). Adicionalmente às bases de dados (caracterização de demandas por normalização em metrologia) que foram consolidadas pelo presente trabalho e que levaram à ampla reflexão sobre a correlação existente entre metrologia nas normas e normas na metrologia, destacam-se os seguintes resultados que também emergiram da presente dissertação de mestrado: (i) desenvolvimento de uma nova área de concentração em normalização técnica, criada no Programa de Pós- Graduação em Metrologia da PUC-Rio; (ii) indução de um processo para geração de conhecimento e formação de recursos humanos em normalização; (iii) a recente cri
The present master s degree dissertation entitled Metrology in standards, standards in metrology was motivated by explicit recommendations included in the National Metrology Plan (PNM) - which became an instrument of the Brazilian metrology policy, by force of a Interministerial Decision from CONMETRO, that had proposed specific actions to strenghten the Brazilian system of standardization, prioritizing the implementation of a technical committe for standardization in metrology within the ABNT structure. As complementary functions of industrial technology, metrology and standardization are treated not only as essential inputs necessary for the development of industrial competitiveness and quality of life enhancement, but also as intrinsic elements in equating vulnerabilities which restrict access of Brazilian products to competitive markets because of technical barriers to international trade. Thus, within the context of recommendations made by PNM, this master s degree research considered: (i) a study of the modus operandi of international standardization organizations, so as to perceive the way through which metrology inputs are added to international standards; (ii) an analysis of practices by national standardization organizations in industrialized countries so as to capture their experience in developing metrology standards; (iii) interviews with active experts in metrology and standardization with the purpose of defining a performance pattern in order to equate technical standards of industry in Brazil; (iv) a description of the most outstanding facts which had an impact on leveraging technical standardization in the country, providing subsidies to equate existingobstacles; (v) an analysis of the shortages and vulnerabilities of the Brazilian standardization system, thus consolidating knowledge and a critical vision in order to plan this master s dissertation which consisted of conceiving and formulating the conceptual fundamentals of a technical committee for standardization in metrology, to be implemented in ABNT s organic structure, as a strategy to enhance the Brazilian standardization system, and (vi) standardization demand research in metrology. With the aim of distinguishing the demand for standardization in metrology from the demand for metrology in standardization, this research was developed along three different lines: (a) at Brazilian standardization committees (ABNT/CB) and industry standardization organizations (ONS) which make up the organic structure of the Brazilian Association for Technical Standards (ABNT), so as to know the specific needs for metrology in standardization activities, as well as, the difficulties related to the use and application of metrology fundamentals as inputs to the technical standardization process; (b) with metrology and standardization experts in order to subsidize the development of the interface of a new cooperation rationale, and (c) research in forum specialized in metrology so as to identify standardization demands, pointed out throughout respective dissemination hierarchical chains of base units and derived from the International System of Units (SI). In addition tothe data bank which was consolidated by study and research developed and which led to a broad reflection on the existing correlation between metrology in standards and standards in metrology, the following results, which also came out of this master s degree dissertation, can be highlighted: (i) development of a new concentration area in technical standardization, created for the Post Graduate Program in Metrology at the Catholic University (PUC-Rio) in Rio de Janeiro; (ii) introduction of a process to build knowledge and development of human resources in standardization; (iii) the recent creation of ABNT/CB-53, the Brazilian Committee for Standardization in Metrology, whose genesis, conception, framework and implementation came out of the current master s degree work in metrology and which, officially , supplies Brazilian society with a technical forum for standardization in metrology. This d
TONA, ANDREA. "Thermoelectric Metrology." Doctoral thesis, Politecnico di Torino, 2014. http://hdl.handle.net/11583/2546136.
Full textTell, Eric, and Alexander Ökvist. "SMART MANUFACTURING AND METROLOGY : How can metrology enable smart manufacturing?" Thesis, KTH, Industriell produktion, 2017. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-244837.
Full textVid skapandet av grunder för att möjliggöra beräkningar och simulering för produktion så finns det krav på att nya verktyg och ny teknik implementeras. Detta arbete undersöker möjliga lösningar för att samla in information i industriella företag samt hur dessa företag ska gå tillväga för att möjliggöra denna omställning. För att få en bättre förståelse för området har vi även undersökt några möjliga applikationer som kan implementeras inom industrin. Arbetet består av en litteraturstudie där vi undersökte området smart manufacturing samt möjliga lösningar och tekniker som krävs för att uppnå detta. Som komplement till detta skapades även en enkät som baserades på området, svaren från enkäten följdes upp av intervjuer med deltagarna. Deltagarna var särskilt utvalda personer på större industriföretag eller institutioner vilka hade erfarenheter inom området metrologi. Detta användes som utökad grund för att få både en uppfattning av dagsläget samt idéer inför framtiden. Fördelarna med en lyckad implementering av metrologi kan hjälpa företag att ta steget mot att applicera smart manufacturing i deras produktion. Detta kan möjliggöra enklare produktion för operatörer men även ekonomiska fördelar för företaget i helhet. Arbetet tar även upp möjliga problem eller svårigheter som kan ske under denna implementation
Gendra, Casalí Bernat. "Probabilistic quantum metrology." Doctoral thesis, Universitat Autònoma de Barcelona, 2015. http://hdl.handle.net/10803/371132.
Full textMetrology is the field of research on statistical tools and technological design of measurement devices to infer accurate information about physical parameters. The noise in a physical setup is ultimately related to that of its constituents, and at a microscopic level this is in turn dictated by the rules of quantum physics. Quantum measurements are inherently noisy and hence limit the precision that can be reached by any metrology scheme. The field of quantum metrology is devoted to the study of such limits and to the development of new tools that help to surmount them, often make use unique quantum features such as superposition or entanglement. In the process of designing an estimation protocol, the experimentalist uses a figure of merit to optimise the performance of such protocols. Up until now most quantum metrology schemes and known bounds have been deterministic, that is, they are optimized in order to provide a valid estimate for each possible measurement outcome and minimize the average error between the estimated and true value of the parameter. This benchmarking of a protocol by its average performance is very natural and convenient, but there can be some scenarios in which this is not enough to express the concrete use that will be given to the obtained value. A central point in this thesis is that particular measurement outcomes can provide an estimate with a better precision than the average one. Notice that for this to happen there must be other imprecise outcomes so that the average does not violate the deterministic bounds. In this thesis we choose a figure of merit that reflects the maximum precision one can obtain. We optimise the precision of a set of heralded outcomes, and quantify the chance of such outcomes to occur, or in other words the probability that the protocol fails to provide an estimate. This can be understood as putting forward an extra feature that is always available to the experimentalist, namely the possibility of post-selecting the outcomes of their measurements and giving with some probability an inconclusive answer. These probabilistic protocols guarantee a minimal precision upon a heralded outcome. In quantum mechanics there are many ways in which data can be read-off from a quantum system. Hence, the optimization of probabilistic schemes cannot be reduced to reinterpreting results from the canonical (determinsitic) quantum metrology schemes, but rather it entails the search of completly different quantum generalized measurements. Specifically, we design probabilistic protocols for phase, direction and reference frame estimation. We show that post-selection has two possible effects: to compensate a bad choice of probe state or to counterbal¬ance the negative effects of noise present in the state system or in the measurement process. In particular, we show that adding the possibility of abstaining in phase estimation in presence of noise can produce an enhancement in precision that overtake the ultimate bound of deterministic protocols. The bound derived is the best precision that can be obtained, and in this sense one can speak of ultimate bound in precision.
Fieß, Markus. "Advancing attosecond metrology." Diss., lmu, 2010. http://nbn-resolving.de/urn:nbn:de:bvb:19-119134.
Full textO'Mara, David Thomas John. "Automated facial metrology." University of Western Australia. School of Computer Science and Software Engineering, 2002. http://theses.library.uwa.edu.au/adt-WU2003.0015.
Full textALMEIDA, LUCIANA ALVES DE. "METROLOGY: CITIZENSHIP INSTRUMENT." PONTIFÍCIA UNIVERSIDADE CATÓLICA DO RIO DE JANEIRO, 2002. http://www.maxwell.vrac.puc-rio.br/Busca_etds.php?strSecao=resultado&nrSeq=4004@1.
Full textMetrologia: instrumento de cidadania configura um traçado crítico do estágio atual (1) da legislação brasileira vigente em metrologia e suas áreas correlatas e (2) do sistema educacional brasileiro em metrologia, ambas as temáticas entendidas como efetivos instrumentos orientados para o desenvolvimento da competitividade industrial e a consolidação da cidadania. O trabalho tem sua fundamentação no ideário filosófico contemporâneo, que volta a eleger o Homem e a qualidade de vida parâmetros e diferenciais competitivos nos processos de desenvolvimento lato sensu, quer econômico, quer social, político ou industrial. Na primeira vertente do trabalho, que trata da legislação em metrologia,determinou-se um corpus analítico que engloba (i) a Constituição Federal da República - a - Constituição cidadã -; (ii) o Código de Proteção e Defesa do Consumidor e (iii) o acervo da regulamentação técnica em metrologia, correlacionando-a com fatos marcantes da vida política e econômica do País. No que concerne a vertente da pesquisa que analisa a evolução do sistema educacional, são considerados aspectos críticos da pioneira experiência brasileira voltada à capacitação e à formação de profissionais em metrologia no País, em destaqu e: (i) programas e projetos de indução e consolidação da metrologia como instrumento assegurador da cidadania; (ii) o percurso evolutivo da educação formal em metrologia no contexto do sistema educacional brasileiro na conjuntura da consolidação da pósgraduação no País e (iii) de suas políticas industrial e de ciência e tecnologia.No contexto dessa ampla análise, focalizam-se os principais marcos de desenvolvimento industrial, impactos na competitividade e na construção da cidadania.Como conclusão, encaminham-se reflexões e proposições para a institucionalização das competências vigentes, para a congregação dos espaços congêneres e para o planejamento de metas de médio e longo prazo que assegurem o processo continuado de desenvolvimento da metrologia como agente desse processo global de transformação e de formação de cidadania.
Metrology: an instrument for citizenship aims at reviewing the present stage (1) of the Brazilian legislation on metrology and its correlated areas and (2) of the Brazilian education system in metrology, both matters understood as effective instruments that addresses the development of the industrial competitiveness and the consolidation of citizenship in the country. The work is based on contemporary philosophical concepts that have once more elected Man and the quality of life as a parameter and a competitive differential in the developmental processes as a whole, whether they are of economic, social, political or industrial nature. Regarding the legislative content of the work, the corpus of the analysis proposes to encompass (i) the Federal Constitution of the Republic - the - Citizen Constitution -; (ii)the Consumer, Protection and Defense Code; (iii) the body of technical Metrology regulations, inter-correlating this specific legislation with remarkable political and economic al facts of the Brazilian History. With respect to the evolution of the Brazilian education system, critical aspects of the pioneer Brazilian experience devoted to the development of human resources in metrology and metrology-related areas are considered. The analysis also focus on (i)programs and projects for the induction and consolidation of metrology as an instrument that ensures citizenship; (ii) the course along which formal education in metrology has evolved in the context of the Brazilian educational system in view of the consolidation of the postgraduate courses in the Country and (iii) of its industrial and science and technology policies. Within this broad analysis, the major landmarks of industrial development and their impact on industrial competitiveness and on the construction of citizenship have been focused. In the conclusion, a few reflections have been put forward along with proposals to institutionalize the powers and responsibilities that are currently in force, to congregate correlated spaces, and to plan medium and long-term goals for the purpose of ensuring a continuous process for the development of metrology as an agent of this ongoing process of global change.
Knott, Paul Alexander. "Robust quantum metrology." Thesis, University of Leeds, 2015. http://etheses.whiterose.ac.uk/8931/.
Full textMehboudi, Mohammad. "Quantum metrology and thermometry in open systems." Doctoral thesis, Universitat Autònoma de Barcelona, 2017. http://hdl.handle.net/10803/405328.
Full textIn my thesis I explore quantum metrology in open systems, with a special focus on quantum temperature estimation, or thermometry. For this aim, I categorize my study in two different regimes of thermal equilibrium and beyond thermal equilibrium. In both cases, my collaborators and I, raise questions of fundamental and technological interest. Among such questions, I point out the followings: What are the ultimate precision bounds on thermometry with individual (single) probes? Is it possible to improve these bounds by using quantum resources such as quantum correlations and quantum criticality? We not only find the ultimate precision bound on thermometry, posed by physical laws of nature, but also show how to exploit quantum resources to surpass the classical bounds on precision, even at finite temperature. Furthermore, we identify experimentally feasible measurements which can achieve these bounds. Specifically, our results show that in a many-body sample, the collective quantum correlations can become optimal observables to accurately estimate the temperature. In turn, the collective spin correlations can be read out with the non-demolishing quantum Faraday spectroscopy. Hence, our method others inferring maximum information about the temperature, yet leaving the sample unperturbed. Out of thermal equilibrium, we address both static and dynamic systems. In the former case, we find the limitations/opportunities for estimation of low temperature, and small temperature gradient in a sample. Particularly, we identify that the thermometric precision at low temperature can be significantly enhanced by strengthening the probe-sample coupling. Our observations may find applications in practical nanoscale thermometry at low temperature—a regime which is particularly relevant to quantum technologies. With a more applied point of view, such non equilibrium protocols give rise to autonomous quantum heat pumps. Hence, we also give thought to probing the quality of such heat pumps with the tiniest probes, i.e., a single spin. Although at the first glance a spin seems to be a very small probe, we confirm its effciency in probing quantum heat pumps. Our techniques may find applications in the emerging field of quantum thermal engineering, as they facilitate the diagnosis and design optimization of complex thermodynamic cycles. When it comes to dynamic systems, we have formulate a (fluctuation-dissipation) theory with the help of which one can identify the smallest external perturbation which affects a quantum system. Our proposal might be found useful in quantum force detection, for instance, interferometric detection of gravitational waves.
Idowu, Ade. "Dynamic metrology of error motions in precision spindles using optical metrology." Thesis, Cranfield University, 1998. http://dspace.lib.cranfield.ac.uk/handle/1826/3688.
Full textBukulmez, Evren. "Technological Change And Metrology Services Medical Metrology And Its Effects On Society." Master's thesis, METU, 2005. http://etd.lib.metu.edu.tr/upload/2/12606121/index.pdf.
Full textboth of which are required for use especially after open-heart surgeries, has been developed and a cost-benefit analysis has been performed. The Benefit-to-Cost ratios of the calibration activity on patient bedside monitors, ventilators and pacemakers were calculated as 36.74, 2.22 and 1.79, respectively. Calibration services seem to have a very favorable Benefit-to-Cost ratio even based on the lower-bound estimations.
Farner, William Robert. "On-chip probe metrology /." Online version of thesis, 2008. http://hdl.handle.net/1850/6207.
Full textRossouw, Daniel Johannes. "Probes in HF metrology." Thesis, Stellenbosch : University of Stellenbosch, 2010. http://hdl.handle.net/10019.1/5425.
Full textENGLISH ABSTRACT: Flanged coaxial probes are widely used to conduct accurate, broadband permittivity measurements of various dielectric materials. A metrology study, discussed in [1], revealed that small perturbations in measured permittivity data, are due to escaping common-mode (CM) current that propagates onto exposed VNA feed cabling. This is not considered in published permittivity extraction algorithms, like the National Institute of Standards and Technology (NIST) full-wave code that assumes an infinite flange radius. To characterise this effect we validate a finite volume time domain (FVTD) CST simulation model of an SMA coaxial probe, by probing sensitive E-fields in a metallic shielding cylinder, placed around it. For this process, electro-optic (EO) E-field sensors are considered and a Mach-Zehnder type sensor is designed. Manufacturing difficulties discontinues this approach, but the revisited extended centre conductor E-field probing technique proves successful. The technique entails a high dynamic range, two-port VNA measurement. Through CST we gain knowledge of the physics behind the CM-problem and the behaviour of fields around the coaxial probe. Different shielding environments are simulated to establish their ability to impede CM-current coupling onto measurement cabling. To study the CM-effect on extracted permittivity results, the investigation is extended to Short-Open-Load (SOL) calibrated face-plane measurements of dielectric solids. A CST model, which considers escaping CM-energy, is used to generate open circuit (OC) calibration coefficients and to serve as an independent extraction method. We inspect the effect of different shielding environments and through CST, extract accurate permittivity results for e00, to a degree not previously achieved for such systems. This allows comment on the infinite-flange-radius assumption of the NIST method and proves the significance of the CM-effect.
AFRIKAANSE OPSOMMING: Geflensde koaksiale probes word algemeen in die praktyk gebruik om akkurate, wyeband permitiwiteitmetings van diëlektriese materiale te verrig. ’n Studie wat in [1] bespreek word, dui aan dat klein verskynsels in gemete resultate, verband hou met gemene-modus (GM) stroom, wat ontsnap en teenwoording is aan die buitekant van onbeskermde voerkabels. Hierdie verkynsel word nie deur huidige volgolf ekstraksie-algoaritmes, soos die van NIST wat ’n onëindige flensradius aanvaar, in ag geneem nie. Om die GM-effek te karakteriseer, verifieer ons ’n eindige-volume tyd-gebied CST simulasiemodel, deur sensitiewe metings binne ’n silidriese metaalskerm, wat om so ’n probe geplaas word. Vir hierdie meting word elektro-optiese E-veld probes eers oorweeg. In gevolg word ’n Mach-Zehnder-tipe probe ontwerp, maar vervaardigingsprobleme en tyd-oorwegings kniehalter hierdie benadering. Heroorweging van die verlengde koaksiale sentraalgeleier, E-veld-probe tegniek, wat hoë dinamiese bereik twee-poort netwerkanaliseerder metings behels, slaag uiteindelik in hierdie doel. CST maak dit nou moontlik om die GM stroomprobleem te simuleer en spesefieke veldgedrag te kan waarneem. Verskillende afskermingsmetodes se vermoë om GM-koppeling na kabels te beperk word ondersoek. Die GM studie word uitgebrei na SOL-gekalibreerde, flensvlakverwysde permitwiteitmetings van diëlektriese vastestowwe. ’n CST model, wat GM stroom in ag neem, word gebruik om oopgeslote kalibrasiekofisiënte te genereer en dien ook as ‘n alternatiewe permitiwiteit ekstraksiemetode. Die effek van die verskillende afskermingstegnieke word ondersoek en deur die CST metode te gebruik, word ’n aansienlike verbetering in akkuraatheid van e00 waardes verkry. Dit regverdig kommentaar oor die aannames wat in die NIST metode gemaak word en beklemtoon die belangrikheid om GM stroom in ag te neem.
Szmuk, Ramon. "Atom chips for metrology." Thesis, Paris 6, 2015. http://www.theses.fr/2015PA066089/document.
Full textThis thesis covers two main subjects: the evaluation of the stability of a Trapped Atom Clock on a Chip (TACC) and the expansion of this technology towards creating an atom interferometer on the same chip. The combination of a clock and an interferometer on the same chip constitutes the basis for the realization of atom-based integrated inertial navigation units. Previous work installed the clock operation and discovered, among others, very long coherence times, which allow Ramsey interrogations of up to 5 s, a prerequisite for high stability operation. I present the first thorough evaluation of the clock stability. Together with my predecessor we have demonstrated relative frequency fluctuations of 5.8 10-13 at 1 s integrating down to 6 10-15 at 30,000 s. The second part of this thesis aims to expand the versatility of our atom chip to create an atom interferometer. I have studied various interferometer schemes using microwave dressed potentials and implemented these to the set-up. The first scheme, following work by P. Treutlein et al., involves displacing one of the clock states vertically during a Ramsey clock sequence thereby allowing the measurement of potential gradients by exploiting the differential frequency shift accumulated between the two states. Ramsey fringes where recorded for different durations of the splitting, resulting in a clear signal of the wavepacket separation. The second scheme uses microwave dressing to generate a double well potential in one of the clock states and a single well in the other. Starting in the single well, a π-pulse on the clock transition constitutes the beam splitter and leads to a spatial separation for the same internal state
Lyons, Ashley. "Two photon quantum metrology." Thesis, Heriot-Watt University, 2017. http://hdl.handle.net/10399/3272.
Full textBerndtros, Ida, and Olivia Berggren. "Can metrology be value-based? : A case study of SKF's metrology service Mätcentrum." Thesis, Linnéuniversitetet, Ekonomihögskolan, ELNU, 2012. http://urn.kb.se/resolve?urn=urn:nbn:se:lnu:diva-19480.
Full textFrazer, Robert Charles. "Measurement uncertainty in gear metrology." Thesis, University of Newcastle Upon Tyne, 2007. http://hdl.handle.net/10443/852.
Full textSawyer, Nicolas B. E. "Novel optical surface metrology methods." Thesis, University of Nottingham, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.287239.
Full textLogan, Randy. "Optical metrology of thin films." Thesis, Massachusetts Institute of Technology, 1997. http://hdl.handle.net/1721.1/46094.
Full textSmith, Stuart T. "Mechanical systems in nanometre metrology." Thesis, University of Warwick, 1987. http://wrap.warwick.ac.uk/35981/.
Full textDeMiglio, Andrew Scott. "FUNDAMENTAL METROLOGY OF EWRITER DISPLAYS." Kent State University / OhioLINK, 2013. http://rave.ohiolink.edu/etdc/view?acc_num=kent1374653071.
Full textSalter, Tara La Roche. "Metrology for ambient mass spectrometry." Thesis, University of Nottingham, 2015. http://eprints.nottingham.ac.uk/28748/.
Full textHuang, Zixin. "Protocols for optical quantum metrology." Thesis, The University of Sydney, 2018. http://hdl.handle.net/2123/18067.
Full textCongedo, Giuseppe. "Spacetime metrology with LISA Pathfinder." Doctoral thesis, Università degli studi di Trento, 2012. https://hdl.handle.net/11572/368702.
Full textCongedo, Giuseppe. "Spacetime metrology with LISA Pathfinder." Doctoral thesis, University of Trento, 2012. http://eprints-phd.biblio.unitn.it/708/1/thesis_GCongedo.pdf.
Full textNichols, James Franklin. "Metrology of High Aspect Ratio MEMS." Diss., Georgia Institute of Technology, 2004. http://hdl.handle.net/1853/5187.
Full textWolf, Peter. "Relativity and the metrology of time." Thesis, Queen Mary, University of London, 1997. http://qmro.qmul.ac.uk/xmlui/handle/123456789/1870.
Full textMaung, Tinaung Daniel. "Statistical metrology of interlevel dieletric thickness." Thesis, Massachusetts Institute of Technology, 1995. http://hdl.handle.net/1721.1/37776.
Full textIncludes bibliographical references (leaves 60-62).
by Tinaung Daniel Maung.
M.Eng.
Ortiz, Julio Enrique. "New millennium interferometer laser metrology testbed." Thesis, Massachusetts Institute of Technology, 1997. http://hdl.handle.net/1721.1/42639.
Full textHines, Braden E. (Braden Eric). "Laser metrology system for stellar interferometry." Thesis, Massachusetts Institute of Technology, 1988. http://hdl.handle.net/1721.1/14769.
Full textCashmore, Matthew Thomas Dolphin. "Interferometric metrology using reprogrammable binary holograms." Thesis, Durham University, 2013. http://etheses.dur.ac.uk/7769/.
Full textMatthysen, Nardus. "Time domain metrology for MeerKAT systems." Thesis, Stellenbosch : Stellenbosch University, 2014. http://hdl.handle.net/10019.1/95963.
Full textENGLISH ABSTRACT: This work in this study covers a powerful technique to derive propagation and scattering information in an expedient fashion. Expedient because time-domain (TD) data gathers a broad spectrum in a single transmitted pulse. TD has been criticised because of a lack of dynamic range, which has now been overcome by the direct sampling system, RATTY and RTA. This study focuses on the investigation of a TD metrology system, to assist with the characterisation of MeerKAT systems. The elementary components of the system include a fast-rising impulse generator that was coupled with an impulse radiating antenna (IRA). The system was calibrated and tested before practical measurements and preliminary testing in the Karoo were done. For TDmetrology a larger bandwidth accelerates measurements without the loss of accuracy. The pulse generator’s (PG’s) fundamental components are an avalanche transistor and a step recovery diode (SRD), to sharpen the leading edge of the pulse. Improving the rise-time of a pulse increases its bandwidth in the spectrum. The external circuitry around these components is pivotal and it determines the shape, amplitude and rise-time of the pulse. In the course of the investigation, the general circuitry around the PG was improved to obtain the best possible pulse for measurements inside a reverberation chamber (RC) and for measurements in the Karoo. In light of this, a second and third PG source were obtained. For measurements in the Karoo, a larger amplitude pulse was required to increase the spectral content and this is essential for propagation measurements over distance and the shielding effectiveness (SE) of structures. Stacking avalanche transistors allow larger amplitude pulses and it improves the dynamic range of the spectrum. A PG incorporating stacked avalanche transistors, was designed, built and measured to assist with RC and small-scale field measurements in the Karoo. The third PG was bought for the practical measurements in the Karoo. The PG produces kilovolt pulses with pico-second rise-times that extend the spectral range of the current PGs at our disposal. With these PGs, an antenna is required for the radiation of impulse-like transients. The IRA is a high-gain large-bandwidth antenna. The IRA consists of a parabolic reflector, conical-plate transmission lines that are terminated through resistors onto the dish, and a feeding balun. The IRA design was thoroughly discussed and a first model for metrology was designed, measured and optimised. The IRA was also simulated with computation software code, FEKO. Before deployment of theTDsystem, calibration and characterisation measurements are required. The measuring devices used within this study were sampling oscilloscopes and direct sampling systems. The limitations of each device were explored and are discussed. The final measurements that were conducted contribute to work related to the SKA. This incorporated antenna pattern calibration, propagation over distance and the SE of a berm built from Karoo soil. The system investigated the propagation attenuation over the Karoo soil and vegetation, with great promise. A broad spectrum was measured over a few kilometres and compared to free-space loss. The SE of the berm covered the same spectral bandwidth. In this measurement, scattering effects and knife-edge diffraction were observed.
AFRIKAANSE OPSOMMING: Die werk in hierdie studie dek ’n kragtige tegniek wat gebruik kan word om die voortplanting en die verstrooiingsinligting van elektromagnetiese golwe op ’n voordelige manier af te lei. Dit is voordelig, want tydgebieddata versamel ’n wye spektrum in ’n enkele oordraagbare puls. Tydgebied is in die verlede baie gekritiseer omdat dit ’n dinamiese reikwydte kortkom en dit is nou oorwin deur die direkte steekproefnemingstelsel, RATTY en RTA. Hierdie studie fokus op die ondersoek van ’n tydgebiedmetingssisteem en dit help met die karakterisering van MeerKAT sisteme. Die elementêre komponente van die sisteem bestaan uit ’n vinnig-stygende impulsgenerator wat gekoppel is aan ’n impulsuitstralende-antenna (IRA). Die sisteem is gekalibreer en getoets voordat praktiese metings en toetse in die Karoo uitgevoer kon word. Vir tydgebiedmetings versnel ’n groter bandwydte die metings sonder om die akkuraatheid daarvan te beïnvloed. Die pulsgenerator se fundamentele komponente is ’n stortvloedtransistor en ’n stap-herstel diode (SRD) wat die voorpunt van die puls verskerp. Die eskterne stroombaan rondom hierdie komponente is noodsaaklik en dit bepaal die vorm, amplitude en die stygtyd van die puls. Deur die loop van hierdie ondersoek is die algemene stroombaan rondom die puls verbeter, om die beste moontlike puls vir metings binne in die weerkaatsingskamer en vir metings in die Karoo, te verkry. Na aanleiding van dit is ’n tweede en derde pulsgenerator bron verkry. Vir die metings in die Karoo is ’n puls met ’n groter amplitude vereis om die spektrale inhoud te vermeerder. Dit is noodsaaklik vir elektromagnetiese golf voortplantingsmetings oor afstand asook die beskermings effektiwiteit (SE) van die strukture. Stapel-stortvloed transistors skep pulse met groter amplitudes en dit verbeter die dinamiese reikwydte van die spektrum. ’n Pulsgenerator wat gestapelde stortvloedtransistors insluit is ontwerp, gebou en gemeet om te help met metings in die weerkaatsingskamer en kleinskaal veldmetings in die Karoo. Die derde pulsgenerator is gekoop vir praktiese metings in die Karoo. Die pulsgenerator vervaardig kilovolt pulse met pikosekond stygtye, wat die reikwydte van die spektrum van ons huidige puls uitbrei. Hierdie pulsgenerators vereis ’n antenna vir die uistraling van impulsagtige seine. Die IRA is ’n hoë-wins, groot-bandwydte antenna. Die IRA bestaan uit ’n paraboliese weerkaatser, konieseplaat transmissielyne wat deur weerstande op die skottel getermineer word, asook ’n voedings "balun". Die IRA ontwerp is deeglik bespreek en ’n model is ontwerp, gemeet en verbeter. Die IRA is ook gesimuleer met behulp van ’n rekenaarsagtewareprogram, FEKO. Voordat die tydgebiedsisteem benut kan word, moet dit gekalibreer word en karakteriseringsmetings moet ook daarmee uitgevoer word. Die meetinstrumente wat in hierdie studie gebruik is, is steekproefneming-ossilloskope en direkte steekproefneming-sisteme. Die tekortkominge van elke instrument is ondersoek en bespreek. Die finale meting wat uitgevoer is, dra by tot die werk wat geassosieer word met die SKA. Dit behels antennapatroonkalibrasie, voortplanting van elektromagnetiese golwe oor afstand en die SE van ’n "berm"wat gebou is uit Karoo-grond. Hierdie sisteem is gebruik om die voortplantings-verswakking oor die Karoo-grond en plantegroei te ondersoek en dit lyk baie belowend. ’nWye spektrumis oor ’n paar kilometer gemeet en dit is met wrywinglose ruimte vergelyk. Die SE van die "berm"het dieselfde spektrale bandwydte gedek. In hierdie meting is verstrooiingseffekte en mespunt-diffraksie waargeneem.
Tsatourian, Veronika. "Femtosecond combs for optical frequency metrology." Thesis, Heriot-Watt University, 2014. http://hdl.handle.net/10399/2747.
Full textDietlein, Charles Robert. "Components and metrology for terahertz imaging." Connect to online resource, 2008. http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqdiss&rft_dat=xri:pqdiss:3315848.
Full textCooper, Jessica Jane. "Quantum metrology with Bose-Einstein condensates." Thesis, University of Leeds, 2011. http://etheses.whiterose.ac.uk/1690/.
Full textSeong, Kibyung. "Optical Metrology for Transmission Interferometric Testing." Diss., The University of Arizona, 2008. http://hdl.handle.net/10150/194698.
Full textTRAN, NGOC THANH MAI. "Novel techniques for electrical impedance metrology." Doctoral thesis, Politecnico di Torino, 2021. http://hdl.handle.net/11583/2910078.
Full textShettell, Nathan. "Quantum Information Techniques for Quantum Metrology." Electronic Thesis or Diss., Sorbonne université, 2021. http://www.theses.fr/2021SORUS504.
Full textQuantum metrology is an auspicious discipline of quantum information which is currently witnessing a surge of experimental breakthroughs and theoretical developments. The main goal of quantum metrology is to estimate unknown parameters as accurately as possible. By using quantum resources as probes, it is possible to attain a measurement precision that would be otherwise impossible using the best classical strategies. For example, with respect to the task of phase estimation, the maximum precision (the Heisenberg limit) is a quadratic gain in precision with respect to the best classical strategies. Of course, quantum metrology is not the sole quantum technology currently undergoing advances. The theme of this thesis is exploring how quantum metrology can be enhanced with other quantum techniques when appropriate, namely: graph states, error correction and cryptography. Graph states are an incredibly useful and versatile resource in quantum information. We aid in determining the full extent of the applicability of graph states by quantifying their practicality for the quantum metrology task of phase estimation. In particular, the utility of a graph state can be characterised in terms of the shape of the corresponding graph. From this, we devise a method to transform any graph state into a larger graph state (named a bundled graph state) which approximately saturates the Heisenberg limit. Additionally, we show that graph states are a robust resource against the effects of noise, namely dephasing and a small number of erasures, and that the quantum Cramér-Rao bound can be saturated with a simple measurement strategy. Noise is one of the biggest obstacles for quantum metrology that limits its achievable precision and sensitivity. It has been showed that if the environmental noise is distinguishable from the dynamics of the quantum metrology task, then frequent applications of error correction can be used to combat the effects of noise. In practise however, the required frequency of error correction to maintain Heisenberg-like precision is unobtainable for current quantum technologies. We explore the limitations of error correction enhanced quantum metrology by taking into consideration technological constraints and impediments, from which, we establish the regime in which the Heisenberg limit can be maintained in the presence of noise. Fully implementing a quantum metrology problem is technologically demanding: entangled quantum states must be generated and measured with high fidelity. One solution, in the instance where one lacks all of the necessary quantum hardware, is to delegate a task to a third party. In doing so, several security issues naturally arise because of the possibility of interference of a malicious adversary. We address these issues by developing the notion of a cryptographic framework for quantum metrology. We show that the precision of the quantum metrology problem can be directly related to the soundness of an employed cryptographic protocol. Additionally, we develop cryptographic protocols for a variety of cryptographically motivated settings, namely: quantum metrology over an unsecured quantum channel and quantum metrology with a task delegated to an untrusted party. Quantum sensing networks have been gaining interest in the quantum metrology community over the past few years. They are a natural choice for spatially distributed problems and multiparameter problems. The three proposed techniques, graph states, error correction and cryptography, are a natural fit to be immersed in quantum sensing network. Graph states are an well-known candidate for the description of a quantum network, error correction can be used to mitigate the effects of a noisy quantum channel, and the cryptographic framework of quantum metrology can be used to add a sense of security. Combining these works formally is a future perspective
Teke, Onur Ahmet. "Investigation of Modularization of Measurement Programs for CMMs." Thesis, KTH, Industriell produktion, 2013. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-118639.
Full textKoordinatmätmaskiner (CMMs) används för att kontrollera om produkterna möter kundernas behov eller inte. Att skapa mätprogram för CMMs tar lång tid och företagen försöker hitta sätt att minska tiden för förberedelseprocesser. Syftet med detta examensarbete är att undersöka mätprocesser av produkterna inom Sandvik Coromant AB i Gimo, Sverige och att fokusera på förberedelserna av modulariserade mätprogram. Det huvudsakliga målet var att studera mätprocessen i företaget, samt att ta reda på och rekommendera olika alternativ för modularisering av mätprogram för produkter för att på så sätt kunna spara tid och energi. För att förstå de aktuella mätprocesserna i företaget med brister och risker och även att kunna ta reda på ytterligare möjliga förbättringar, har många intervjuer, möten och ett frågeformulär gjorts. Medarbetarnas åsikter och idéer om modularisering av mätprogrammen har samlats in. Tre olika fall om modularisering av mätprogram presenteras i examensarbetet. Det första fallet handlar om den nuvarande situationen i företaget. De brister och risker som har observerats och samlats in presenteras. Det andra fallet fokuserar på modularisering av dagens skärläge in i två delar som skärlägesmodul och förspänningsmodul. Det tredje fallet fokuserar på möjligheten att dela upp skärlägen i mycket mindre moduler. I slutsatsen sammanfattas alla tre fallen och allt arbete som har gjorts varvid resultat och slutsatser presenteras. Sist men inte minst, visas på några ytterligare forskningsfrågor i rekommendationsdelen.
Atashkhooei, Reza. "Adaptive self-mixing interferometry for metrology applications." Doctoral thesis, Universitat Politècnica de Catalunya, 2013. http://hdl.handle.net/10803/134357.
Full textLee, Woei Ming. "Optical trapping : optical interferometric metrology and nanophotonics." Thesis, St Andrews, 2010. http://hdl.handle.net/10023/882.
Full textJohanssson, Stefan. "Precision Amplifier for Applications in Electrical Metrology." Thesis, Linköping University, Linköping University, Electronics System, 2009. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-16896.
Full textThis master's thesis addresses two main problems. The first is how to suppress a common mode voltage that appears for current shunts, and the second how to let a voltage divider work under an unloaded condition to prevent loading errors and thereby a decreased measurement accuracy. Both these problems occurs during calibration of power meters, and verification of current shunts and voltage dividers. To the first problem three alternative solutions are presented; prototype a proposed instrumentation amplifier circuit, evaluate the commercial available instrumentation amplifier Analog Devices AD8130 or let the voltage measuring device suppress the common mode voltage. It is up to the researchers at SP to choose a solution. To address the second problem, a prototype buffer amplifier is built and verified. Measurements of the buffer amplifier show that it performs very well. At 100 kHz, the amplitude error is less than 20 μV/V, the phase error is less than 20 μrad, and the input Rp is over 10 MΩ. This is performance in line with the required to make accurate measurements possible at 100 kHz and over that.
Sand, Åsmund. "Applying the Internet to Instrumentation and Metrology." Doctoral thesis, Norwegian University of Science and Technology, Department of Electronics and Telecommunications, 2007. http://urn.kb.se/resolve?urn=urn:nbn:no:ntnu:diva-1236.
Full textThe work describes useful approaches to applying the Internet in electrical metrology and calibration.
The work comprises several approaches to Internet-enabled metrology, including running remote measurements and remotely operating instruments. The author proposes new ways of developing Internetenabled instrumentation systems, focusing on increasing the availability while preserving the security.
Brujic, Djordje. "A framework for CAD based shape metrology." Thesis, Imperial College London, 2002. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.271757.
Full textClaus, David. "High accuracy metrology using low-resolution cameras." Thesis, University of Oxford, 2007. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.442843.
Full textWarden, Matthew Stuard. "Absolute distance metrology using frequency swept lasers." Thesis, University of Oxford, 2011. http://ora.ox.ac.uk/objects/uuid:a20e9c69-e580-48d8-bbce-51d8f4186450.
Full textBledowski, Ian A. "Frequency-division-multiplexing technique for imaging metrology." Thesis, Cranfield University, 2014. http://dspace.lib.cranfield.ac.uk/handle/1826/9286.
Full textShields, Brendan John. "Diamond platforms for nanoscale photonics and metrology." Thesis, Harvard University, 2014. http://dissertations.umi.com/gsas.harvard:11638.
Full textPhysics
Holmes, R. D. "Coherent optical detection techniques in surface metrology." Thesis, University of Nottingham, 1995. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.294698.
Full textSamaan, Noel D. "Mathematical modelling of instruments for pressure metrology." Thesis, City University London, 1990. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.256742.
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