Books on the topic 'Metrology'
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Gao, Wei, ed. Metrology. Singapore: Springer Singapore, 2019. http://dx.doi.org/10.1007/978-981-10-4912-5.
Full textNational Institute of Standards and Technology (U.S.), ed. Metrology. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1998.
Find full textScholle, Jerome V. Metrology. Reading, Mass: Addison-Wesley, 1993.
Find full textNational Institute of Standards and Technology (U.S.), ed. Metrology. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1998.
Find full textSeminário Rio Metrologia (1st 2002 Rio de Janeiro, Brazil). Seminário Rio Metrologia 2002: 07 a 08 de novembro, Hotel Pestana Rio Atlântica. Rio de Janeiro, RJ: Rede de Tecnologia do Rio de Janeiro, 2002.
Find full textRio-Metrologia. Rio-Metrologia: Rede de Laboratórios do Rio de Janeiro. Rio de Janeiro, RJ: Rio Metrologia, 2000.
Find full textAnthony, D. M. Engineering metrology. Oxford: Pergamon Press, 1986.
Find full textFerrero, Alessandro, and Veronica Scotti. Forensic Metrology. Cham: Springer International Publishing, 2022. http://dx.doi.org/10.1007/978-3-031-14619-0.
Full textSoares, Olivério D. D., ed. Optical Metrology. Dordrecht: Springer Netherlands, 1987. http://dx.doi.org/10.1007/978-94-009-3609-6.
Full textSładek, Jerzy A. Coordinate Metrology. Berlin, Heidelberg: Springer Berlin Heidelberg, 2016. http://dx.doi.org/10.1007/978-3-662-48465-4.
Full textGupta, S. V. Mass Metrology. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-12465-6.
Full textGupta, S. V. Mass Metrology. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-23412-5.
Full textSmith, Graham T. Industrial Metrology. London: Springer London, 2002. http://dx.doi.org/10.1007/978-1-4471-3814-3.
Full textGasvik, Kjell J. Optical metrology. 2nd ed. Chichester: Wiley, 1995.
Find full textLaboratory, National Physics, ed. Optical metrology. Teddington: NPL, 1991.
Find full textS, Sirohi R., ed. Speckle metrology. New York: Marcel Dekker, 1993.
Find full textGåsvik, Kjell J. Optical metrology. Chichester: Wiley, 1987.
Find full textGläser, Michael. Handbook of metrology. Weinheim: Wiley-VCH, 2010.
Find full textBellamy, Nicholas. Musculoskeletal Clinical Metrology. Dordrecht: Springer Netherlands, 1993. http://dx.doi.org/10.1007/978-94-011-2218-4.
Full textBulska, Ewa. Metrology in Chemistry. Cham: Springer International Publishing, 2018. http://dx.doi.org/10.1007/978-3-319-99206-8.
Full textFrench College of Metrology, ed. Metrology in Industry. London, UK: ISTE, 2006. http://dx.doi.org/10.1002/9780470612125.
Full textSmith, Graham T. Machine Tool Metrology. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-25109-7.
Full textGalyer, J. F. W. Metrology for engineers. 5th ed. London: Cassell, 1989.
Find full textAmerican Society for Quality. Measurement Quality Division. The metrology handbook. Edited by Bucher Jay L. 1949-. 2nd ed. Milwauke, Wis: ASQ Quality Press, 2012.
Find full textInstitution, British Standards, ed. Vocabulary of metrology. London: BSI, 1995.
Find full textKanke, Alla, Irina Kosheva, Sergey Tolkachev, and Igor' Balabin. Metrology, standardization, certification. ru: INFRA-M Academic Publishing LLC., 2023. http://dx.doi.org/10.12737/1239425.
Full textR, Shotbolt C., ed. Metrology for engineers. 5th ed. London: Cassell, 1990.
Find full textDevel, Center for Occupational Research &. Metrology. CORD Communications, 1987.
Find full textMetrology. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1998.
Find full textAnil, ed. Metrology. InTech, 2018. http://dx.doi.org/10.5772/intechopen.71144.
Full textGao, Wei. Metrology. Springer, 2019.
Find full textPetrucci, L. G. D. Metrology. L & A Press, 1994.
Find full textFrançois Lanzetta. Thermal Metrology. Wiley & Sons, Incorporated, John, 2021.
Find full textKelley, Edward. Display Metrology. Wiley & Sons, Limited, John, 2012.
Find full textVosk, Ted, and Ashley F. Emery. Forensic Metrology. CRC Press, 2014. http://dx.doi.org/10.1201/b17462.
Full textFan, Kuang-Chao, and Peter Kinnell, eds. Manufacturing Metrology. MDPI, 2022. http://dx.doi.org/10.3390/books978-3-0365-2987-5.
Full textAdvanced Metrology. Elsevier, 2020. http://dx.doi.org/10.1016/c2019-0-04832-7.
Full textTerahertz metrology. Boston: Artech House, 2015.
Find full textOptical metrology. 3rd ed. West Sussex, Eng: J. Wiley & Sons, 2002.
Find full textEngineering Metrology. Khanna Publisher, 2009.
Find full textKelley, Edward. Display Metrology. Wiley & Sons, Incorporated, John, 2030.
Find full textScotti, Veronica, and Alessandro Ferrero. Forensic Metrology. Springer International Publishing AG, 2022.
Find full textSirohi, R. S. Speckle Metrology. Taylor & Francis Group, 2020.
Find full textRaykar, Sunil. Industrial Metrology. Independently Published, 2018.
Find full textFrançois Lanzetta. Thermal Metrology. Wiley & Sons, Incorporated, John, 2021.
Find full textKelley, Edward. Display Metrology. Wiley & Sons, Incorporated, John, 2019.
Find full textErf, R. Speckle Metrology. Elsevier Science & Technology Books, 2012.
Find full textSirohi, R. S. Speckle Metrology. Taylor & Francis Group, 2020.
Find full textLanzetta, François. Thermal Metrology. Wiley & Sons, Incorporated, John, 2017.
Find full textLenzen, Donald L. Ancient Metrology. Donald L Lenzen, 1989.
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