Academic literature on the topic 'Metrology – Computer programs'
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Journal articles on the topic "Metrology – Computer programs"
Ivanova, Tatjana, and Janis Rudzitis. "High Precision Mass Measurement in Automation." Solid State Phenomena 164 (June 2010): 19–24. http://dx.doi.org/10.4028/www.scientific.net/ssp.164.19.
Full textDissertations / Theses on the topic "Metrology – Computer programs"
O'Mara, David Thomas John. "Automated facial metrology." University of Western Australia. School of Computer Science and Software Engineering, 2002. http://theses.library.uwa.edu.au/adt-WU2003.0015.
Full textGedela, Naga Venkata Praveen babu. "MEASUREMENT AND ITS HISTORICAL CONTEXT." Kent State University / OhioLINK, 2008. http://rave.ohiolink.edu/etdc/view?acc_num=kent1226037175.
Full textBooks on the topic "Metrology – Computer programs"
Polyakov, Anatoliy, Maksim Ivanov, Elena Ryzhkova, and Ekaterina Filimonova. Electrical engineering and electronics: laboratory workshop. ru: INFRA-M Academic Publishing LLC., 2021. http://dx.doi.org/10.12737/1214583.
Full text1942-, Evans John M., Manufacturing Engineering Laboratory (U.S.), and National Institute of Standards and Technology (U.S.), eds. Analysis of dimensional metrology standards. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, Manufacturing Engineering Laboratory, National Institute of Standards and Technology, 2001.
Find full textAlbert, Horst John, and National Institute of Standards and Technology (U.S.), eds. A comparison of the CMM-driver specification release #1.9 with the I++ DME-interface release 0.9. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, Intelligent Systems Division, National Institute of Standards and Technology, 2002.
Find full textA comparison of the CMM-driver specification release #1.9 with the I++ DME-interface release 0.9. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, Intelligent Systems Division, National Institute of Standards and Technology, 2002.
Find full textAlbert, Horst John, and National Institute of Standards and Technology (U.S.), eds. A comparison of the CMM-driver specification release #1.9 with the I++ DME-interface release 0.9. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, Intelligent Systems Division, National Institute of Standards and Technology, 2002.
Find full textA comparison of the CMM-driver specification release #1.9 with the I++ DME-interface release 0.9. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, Intelligent Systems Division, National Institute of Standards and Technology, 2002.
Find full textJohn, Horst, and National Institute of Standards and Technology (U.S.), eds. A comparison of the CMM-driver specification release #1.9 with the I++ DME-interface release 0.9. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, Intelligent Systems Division, National Institute of Standards and Technology, 2002.
Find full textAlbert, Horst John, and National Institute of Standards and Technology (U.S.), eds. A comparison of the CMM-driver specification release #1.9 with the I++ DME-interface release 0.9. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, Intelligent Systems Division, National Institute of Standards and Technology, 2002.
Find full textEgon, Marx, and National Institute of Standards and Technology (U.S.), eds. User's manual for the program MONSEL-1: Monte Carlo simulation of SEM signals for linewidth metrology. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1994.
Find full textEgon, Marx, and National Institute of Standards and Technology (U.S.), eds. User's manual for the program MONSEL-1: Monte Carlo simulation of SEM signals for linewidth metrology. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1994.
Find full textBook chapters on the topic "Metrology – Computer programs"
Tiwari, Shailendra, and Rajeev Srivastava. "Research and Developments in Medical Image Reconstruction Methods and its Applications." In Research Developments in Computer Vision and Image Processing, 274–312. IGI Global, 2014. http://dx.doi.org/10.4018/978-1-4666-4558-5.ch014.
Full textTiwari, Shailendra, and Rajeev Srivastava. "Research and Developments in Medical Image Reconstruction Methods and Its Applications." In Medical Imaging, 491–535. IGI Global, 2017. http://dx.doi.org/10.4018/978-1-5225-0571-6.ch019.
Full textGuarnierI, F., S. Olampi, and A. Napoli. "Toward a "Virtual Laboratory" to Support Forest Fire Behaviour Modelling and Metrology." In Environmental Information Systems in Industry and Public Administration, 271–81. IGI Global, 2001. http://dx.doi.org/10.4018/978-1-930708-02-0.ch018.
Full textConference papers on the topic "Metrology – Computer programs"
Yang, Zixuan, Huaiyuan Teng, Jeremy Goldhawk, Ilya Kovalenko, Efe C. Balta, Felipe Lopez, Dawn Tilbury, and Kira Barton. "A Vision-Based Framework for Enhanced Quality Control in a Smart Manufacturing System." In ASME 2019 14th International Manufacturing Science and Engineering Conference. American Society of Mechanical Engineers, 2019. http://dx.doi.org/10.1115/msec2019-2966.
Full textLEFORT, Romain, Arnaud DECATOIRE, Malek ABDI, Patrick LACOUTURE, and Raymond BUISSON. "Development of a new “6-axis” force connected sensor." In 19th International Congress of Metrology (CIM2019), edited by Sandrine Gazal. Les Ulis, France: EDP Sciences, 2019. http://dx.doi.org/10.1051/metrology/201919005.
Full textChoi, Jin, S. V. Sreenivasan, and Doug Resnick. "UV Nano-Imprint Lithography for Manufacturing Applications." In ASME 2007 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2007. http://dx.doi.org/10.1115/detc2007-35527.
Full textXie, Jun, Zhiyuan Ren, Yi Liu, Peng Fang, Guanglin Li, and Mengwei Zhang. "A Novel Synchronous Hybrid Steady-State Brain-Computer Interface Based on Visual and Auditory Integration **This work was supported by the National Key Research & Development Program of China (2017YFA0701103), the Open Funding Project of National Key Laboratory of Human Factors Engineering (SYFD061903K and SYFD160051806), the National Natural Science Foundation of China (U1913601, 61773364 & 81927804), the Foundation of the Key Laboratory for Equipment Advanced Research (6142222200209 and 6142222180204), the Foundation Project in the field of Equipment Advanced Research (61400020402), the CAS Youth Innovation Promotion Association (2018395), the Shenzhen Basic Research Program (JCYJ20170818163724754 & JCYJ20200109114805984), and the Shenzhen Engineering Laboratory of Neural Rehabilitation Technology." In 2021 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT). IEEE, 2021. http://dx.doi.org/10.1109/metroind4.0iot51437.2021.9488530.
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