Academic literature on the topic 'Metrology'
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Journal articles on the topic "Metrology"
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Widarta, A. "CCEM key comparison CCEM.RF-K26. Attenuation at 18 GHz, 26.5 GHz and 40 GHz using a step attenuator. Final report of the pilot laboratory." Metrologia 61, no. 1A (January 1, 2024): 01001. http://dx.doi.org/10.1088/0026-1394/61/1a/01001.
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Main text This report summarizes the results of the Key Comparison CCEM.RF-K26 Attenuation at 18 GHz, 26.5 GHz and 40 GHz using a step attenuator which has been performed from January 2015 to February 2018. Fourteen National Metrology Institutes (NMIs) participated in this key comparison, including the National Metrology Institute of Japan (NMIJ/AIST, Japan) which served as pilot laboratory, the National Institute of Metrology (NIM, China), the Physikalisch-Technische Bundesanstal (PTB, Germany), the Laboratoire national de métrologie et d'essais (LNE, France), the Swiss Federal Office for Metrology and Accreditation (METAS, Switzerland), the National Physical Laboratory of India (NPLI, India), the All-Russian Scientific Research Institute of Physico-Technical Measurements (VNIIFTRI, Russia), the Korea Research Institute of Standard and Science (KRISS, South Korea), the National Physical Laboratory (NPL, United Kingdom), the National Metrology Institute of South Africa (NMISA, South Africa), the Tubitak Ulusal Metrologi Enstitűsű (TUBITAK-UME, Turkey), the National Metrology Centre (NMC-A*STAR, Singapore), the Czech Metrology Institute (CMI, Czech Republic) and the Instituto Nacional de Tecnica Aeroespacial (INTA, Spain). The Key Comparison Reference Values (KCRVs) were determined from the measurement results of five to ten participating NMIs, depending on the attenuation and frequency. To reach the main text of this paper, click on Final Report. Note that this text is that which appears in Appendix B of the BIPM key comparison database https://www.bipm.org/kcdb/. The final report has been peer-reviewed and approved for publication by the CCEM, according to the provisions of the CIPM Mutual Recognition Arrangement (CIPM MRA).
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Costa-Félix, Rodrigo, Americo Bernardes, José Carlos Valente de Oliveira, José Mauro Granjeiro, Ruth Epsztejn, Waldemar Ihlenfeld, and Valnei Smarçaro da Cunha. "VII Brazilian Congress on Metrology (Metrologia 2013)." Journal of Physics: Conference Series 575 (January 6, 2015): 011001. http://dx.doi.org/10.1088/1742-6596/575/1/011001.
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Azzumar, Muhammad, and Agah Faisal. "DISEMINASI RESISTOR STANDAR 1 KΩ KE STANDAR KERJA." Jurnal Standardisasi 17, no. 3 (September 1, 2016): 223. http://dx.doi.org/10.31153/js.v17i3.322.
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<p>Abstrak<br />Diseminasi nilai kalibrasi resistor standar kepada standar kerja di Puslit Metrologi - LIPI telah dilakukan. Hal ini bertujuan untuk mendapatkan hasil kalibrasi dan estimasi ketidakpastiannya yang valid dan tertelusur ke SI pada standar kerja. Desiminasi dilakukan dengan cara mengimplenmentasikan nilai kalibrasi resistor standar 1 kΩ ke resistor acuan dan kemudian ke standar kerja. Nilai yang telah diturunkan kepada standar kerja, reference multimeter, telah dibandingkan dengan nilai pengukuran yang dilakukan oleh KRISS (Korea Research Institute of Standards and Science) melalui kriteria derajat ekuivalensi. Error number berdasarkan kriteria derajat ekuivalensi antara Metrologi - LIPI dan KRISS pada resistor-resistor 100Ω, 10Ω, dan 1Ω masing-masing adalah sebesar 0,51, 0,73, dan 0,87. Berdasarkan error number tersebut, hasil pengukuran Metrologi - LIPI memiliki kesesuaian nilai ukur dengan hasil ukur KRISS. Lebih daripada itu, hal tersebut telah memvalidasi hasil kalibrasi dan estimasi ketidakpastian dari resistor acuan dan standar kerja di Puslit Metrologi - LIPI.<br />Kata kunci: nilai kalibrasi, resistor standar, standar kerja, kriteria derajat kebebasan, validasi.</p><p><br />Abstract<br />Dissemination of calibration value of standard resistor to working standard in Research Center for Metrology LIPI has been done. It aims to get the calibration result and the uncertainty estimation that are valid and traceable to SI on the working standard. The desimination was performed by implementing calibration value of 1 kΩ standard resistor to reference resistor and then to working standard. The value that had been disseminated to working standard, reference multimeter, had been compared to the measurement value made by KRISS (Korea Research Institute of Standards and Science) through a degree of equivalence criteria. The error numbers based on the degree of equivalence criteria between Metrology-LIPI and KRISS for the resistors measurement of 100Ω, 10Ω, and 1Ω were 0.51, 0.73, and 0.87 respectively. Based on those error numbers, Metrology-LIPI measurement results had the measuring value agreement with KRISS measurement results. Moreover, Its had validated calibration result and the uncertainty estimation of reference resistor and working standard in Metrology LIPI<br />Keywords: calibration value, standard resistor, working standard, degree of equivalence criteria, validation.</p>
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Harfiah, Rismisari. "Implementasi Rancangan Pelatihan Kemetrologian bagi Juru Timbang Menggunakan Metode ADDIE." Cendekia Niaga 3, no. 1 (October 1, 2019): 9–13. http://dx.doi.org/10.52391/jcn.v3i1.457.
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Legal metrology is a very large and complex field to be implemented. In realizing orderly measurement for all of Indonesia, very large human resources are needed. A total of 1900 Metrology Human Resources currently available cannot meet the needs of the community, which includes at least 14.230 traditional markets and hundreds of modern markets spread throughout Indonesia. Adding large numbers of Metrologi personnel from ASN is very difficult, the most likely choice is to recruit personnel outside metrology such as market managers of traditional and modern market. This situation encouraging idea to recruit weighers whose task is to check the scales in traditional and modern markets. Through the ADDIE method which include analize, design, develop, implementation and evaluation a training model for weighers is designed. As a result, two days of training (20 JP) with classroom learning methods and laboratory practices is held . Furthermore, the weigher conducts trials in the market where each of them is on duty. The evaluation results with an average value of 4.43 of 5 Likert Scale indicate that the training is satisfying and meets the needs of the knowledge and skills of the weighers before duty.
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Kibble, Bryan. "Everyday instruments from basic metrology [Basic Metrology]." IEEE Instrumentation & Measurement Magazine 18, no. 3 (June 2015): 9–10. http://dx.doi.org/10.1109/mim.2015.7108212.
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Du, Mingxin, Boyong Gao, Shuaizhe Wang, Zilong Liu, Xingchuang Xiong, and Yuqi Luo. "Design and Implementation of Time Metrology Vocabulary Ontology." Electronics 13, no. 14 (July 18, 2024): 2828. http://dx.doi.org/10.3390/electronics13142828.
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The advent of the digital era has put forward an urgent need for the digitization of metrology, and the digitization of metrology vocabularies is one of the fundamental and critical steps to achieve the digital transformation of metrology. Metrology vocabulary ontology can facilitate the exchange and sharing of data and is an important way to achieve the digitization of metrology vocabulary. Time metrology vocabulary is a special and important part of the whole metrology vocabulary, and constructing its ontology can reduce the problems caused by semantic confusion, help to smooth the progress of metrological work, and promote the digital transformation of metrology. Currently, the existing ontology for metrology vocabulary is primarily the MetrOnto ontology, but it lacks a systematic description of the vocabulary of time metrology. To address this issue, improve the metrology vocabulary ontology, and lay the groundwork for realizing the digital transformation of metrology, this paper takes time metrology vocabulary as the research object; proposes a classification principle that meets the inherent requirements of time transfer in the digital world; adopts the seven-step method of ontology construction to construct an ontology specialized in time metrology vocabulary, OTMV (Ontology of Time Metrology Vocabulary); and conducts an ontology consistency check, a machine-readable validation, a machine-understandable primary validation, and information retrieval validation on it. The validation results show that OTMV has correct syntactic and logical consistency and is capable of realizing machine-readable, machine-understandable, and information retrieval. The construction of this ontology provides a systematic description of the time measurement vocabulary that can address the problem of word expression of time metrology vocabulary in the digital world and lay the foundation for the digitization of our metrology vocabulary, as well as its readability, understandability, and sharing.
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Krutikov, V. N., and V. V. Okrepilov. "Money Metrology." Measurement Techniques 63, no. 12 (March 2021): 993–1003. http://dx.doi.org/10.1007/s11018-021-01883-8.
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Krutikov, V. N., and V. V. Okrepilov. "Money metrology." Izmeritel`naya Tekhnika, no. 12 (2020): 42–50. http://dx.doi.org/10.32446/0368-1025it.2020-12-42-50.
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The influence of the provisions of legal metrology on the formation and functioning of the monetary environment in market conditions is studied. It is shown that the use of material (reference) measures for determining the value of goods in monetary units makes it possible to form a stable monetary system, equal for all market participants. This system can reasonably be attributed to information measuring systems. Systems based on the use of constant material measures that determine the value of goods and money in international trade have been formed and functioned for a long time. In the XIX-XX centuries, the monetary system, in which a fixed weight of gold served as the material measure of money, was called the “gold standard”. In the 1970s, this system was abandoned without objective reasons. Nowadays, many people believe that the main reason is the uncontrolled issuance of paper money (US dollars). As a result, the material measure of money was replaced by a monetary measure. The money of a number of selected countries turned out to be a measure of the national currencies of other countries. Then money was made a commodity – an object of market trading, the price of which is determined by supply and demand. Thus, the most important principle of metrology was violated – the invariability (constancy) of the measure of system objects. The resulting monetary system became unstable. This situation has led to an increase in the number of proposals for a return to the gold standard. The analysis carried out in the paper confirmed the relevance of these proposals. At the present stage of development of metrology, it is advisable to explore the possibility of a broader (not only at the expense of precious metals) resource provision of material monetary measures, in particular, to consider the possibility of using materials and (or) goods that are in high demand in the international market as monetary measures.
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Kuster, Mark. "Metrology News." NCSL International measure 13, no. 2 (June 2021): 18–22. http://dx.doi.org/10.51843/measure.13.2.3.
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Picotto, G. B., L. Koenders, and G. Wilkening. "Nanoscale metrology." Measurement Science and Technology 20, no. 8 (June 30, 2009): 080101. http://dx.doi.org/10.1088/0957-0233/20/8/080101.
Full textDissertations / Theses on the topic "Metrology"
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SILVA, PEDRO PAULO ALMEIDA. "METROLOGY IN STANDARDS, STANDARDS IN METROLOGY." PONTIFÍCIA UNIVERSIDADE CATÓLICA DO RIO DE JANEIRO, 2003. http://www.maxwell.vrac.puc-rio.br/Busca_etds.php?strSecao=resultado&nrSeq=4049@1.
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COORDENAÇÃO DE APERFEIÇOAMENTO DO PESSOAL DE ENSINO SUPERIORA presente dissertação de mestrado intitulada Metrologia nas normas, normas na metrologia foi motivada por recomendações explícitas contidas no Plano Nacional de Metrologia (PNM) - transformado em instrumento da política metrológica brasileira, por força de Resolução Interministerial do CONMETRO, que propôs ações de fortalecimento do sistema brasileiro de normalização, priorizando a implementação de um comitê brasileiro para normalização em metrologia na estrutra orgânica da ABNT. Entendidas como funções complementares da tecnologia industrial, metrologia e normalização são tratadas não apenas como insumos essenciais para desenvolvimento da competitividade industrial e melhoria da qualidade de vida, mas, também, como elementos indissociáveis no equacionamento de vulnerabilidades que restringem o acesso de produtos brasileiros a mercados competitivos em decorrência de barreiras técnicas ao comércio internacional. Assim, no contexto das recomendações apontadas pelo PNM, a pesquisa de mestrado contemplou: (i) estudo do modus operandi dos organismos internacionais de normalização, para se perceber a forma pela qual o insumo metrológico é agregado às normas internacionais; (ii) análise das práticas vivenciadas por organismos nacionais de normalização de países mais industrializados, objetivando apreender suas experiências no desenvolvimento de normas em metrologia; (iii) entrevista junto a especialistas atuantes em metrologia e em normalização, objetivando definir um padrão de atuação para se equacionar a normalização técnica setorial no Brasil; (iv) caracterização dos principais fatos marcantes que impactaram o alavancamento da normalização técnica no País, provendo subsídio para equacionamento dos óbices ainda existentes e (v) análise das carências e vulnerabilidades do sistema brasileiro de normalização, assim consolidando conhecimento e uma visão crítica para planejamento da pesquisa de mestrado que se constituiu na concepção e formulação das bases conceituais de um comitê técnico para normalização em metrologia, proposto para ser implementado na estrutura orgânica da ABNT, entendido como estratégia de fortalecimento do sistema brasileiro de normalização e (vi) pesquisa de demanda por normalização em metrologia. Objetivando diferenciar as demandas por normalização em metrologia das demandas por metrologia na normalização, a pesquisa foi desenvolvida no contexto de três ambientes: (a) junto aos comitês brasileiros de normalização (ABNT/CB) e organismos de normalização setorial (ONS) que integram a estrutura orgânica da Associação Brasileira de Normas Técnicas (ABNT), com o propósito de conhecer necessidades específicas de metrologia na atividade de normalização bem como as dificuldades relacionadas ao uso e aplicação de fundamentos da metrologia como insumo ao processo de normalização técnica; (b) junto a especialistas de metrologia e normalização, para subsidiar o desenvolvimento de uma interface técnica de cooperação e (c) junto a fóruns especialistas de metrologia, para se identificar demandas por normalização, identificadas ao longo das respectivas cadeias hierárquicas de disseminação das unidades de base e derivadas do Sistema Internacional de Unidades (SI). Adicionalmente às bases de dados (caracterização de demandas por normalização em metrologia) que foram consolidadas pelo presente trabalho e que levaram à ampla reflexão sobre a correlação existente entre metrologia nas normas e normas na metrologia, destacam-se os seguintes resultados que também emergiram da presente dissertação de mestrado: (i) desenvolvimento de uma nova área de concentração em normalização técnica, criada no Programa de Pós- Graduação em Metrologia da PUC-Rio; (ii) indução de um processo para geração de conhecimento e formação de recursos humanos em normalização; (iii) a recente cri
The present master s degree dissertation entitled Metrology in standards, standards in metrology was motivated by explicit recommendations included in the National Metrology Plan (PNM) - which became an instrument of the Brazilian metrology policy, by force of a Interministerial Decision from CONMETRO, that had proposed specific actions to strenghten the Brazilian system of standardization, prioritizing the implementation of a technical committe for standardization in metrology within the ABNT structure. As complementary functions of industrial technology, metrology and standardization are treated not only as essential inputs necessary for the development of industrial competitiveness and quality of life enhancement, but also as intrinsic elements in equating vulnerabilities which restrict access of Brazilian products to competitive markets because of technical barriers to international trade. Thus, within the context of recommendations made by PNM, this master s degree research considered: (i) a study of the modus operandi of international standardization organizations, so as to perceive the way through which metrology inputs are added to international standards; (ii) an analysis of practices by national standardization organizations in industrialized countries so as to capture their experience in developing metrology standards; (iii) interviews with active experts in metrology and standardization with the purpose of defining a performance pattern in order to equate technical standards of industry in Brazil; (iv) a description of the most outstanding facts which had an impact on leveraging technical standardization in the country, providing subsidies to equate existingobstacles; (v) an analysis of the shortages and vulnerabilities of the Brazilian standardization system, thus consolidating knowledge and a critical vision in order to plan this master s dissertation which consisted of conceiving and formulating the conceptual fundamentals of a technical committee for standardization in metrology, to be implemented in ABNT s organic structure, as a strategy to enhance the Brazilian standardization system, and (vi) standardization demand research in metrology. With the aim of distinguishing the demand for standardization in metrology from the demand for metrology in standardization, this research was developed along three different lines: (a) at Brazilian standardization committees (ABNT/CB) and industry standardization organizations (ONS) which make up the organic structure of the Brazilian Association for Technical Standards (ABNT), so as to know the specific needs for metrology in standardization activities, as well as, the difficulties related to the use and application of metrology fundamentals as inputs to the technical standardization process; (b) with metrology and standardization experts in order to subsidize the development of the interface of a new cooperation rationale, and (c) research in forum specialized in metrology so as to identify standardization demands, pointed out throughout respective dissemination hierarchical chains of base units and derived from the International System of Units (SI). In addition tothe data bank which was consolidated by study and research developed and which led to a broad reflection on the existing correlation between metrology in standards and standards in metrology, the following results, which also came out of this master s degree dissertation, can be highlighted: (i) development of a new concentration area in technical standardization, created for the Post Graduate Program in Metrology at the Catholic University (PUC-Rio) in Rio de Janeiro; (ii) introduction of a process to build knowledge and development of human resources in standardization; (iii) the recent creation of ABNT/CB-53, the Brazilian Committee for Standardization in Metrology, whose genesis, conception, framework and implementation came out of the current master s degree work in metrology and which, officially , supplies Brazilian society with a technical forum for standardization in metrology. This d
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TONA, ANDREA. "Thermoelectric Metrology." Doctoral thesis, Politecnico di Torino, 2014. http://hdl.handle.net/11583/2546136.
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Metrology, the science of measure, is in constant evolution and development in every field. Recently, due to the energy problem, some physical effect and related device are receiving new attention, in particular: piezoelectricity and thermoelectricity.
We think that the time is ripe to expand the science of measure in a new may:Thermoelectric Metrology.
This work represent a new beginning in this field: we study and build a new method and instrument to measure the figure of merit zT and
Resistance R, also we describe a new way to use thermoelectric device (in particular Peltier cells), to apply linear system theory and frequency analysis to measure thermo-physical property such as thermal effusivity and thermal diffusivity.
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Tell, Eric, and Alexander Ökvist. "SMART MANUFACTURING AND METROLOGY : How can metrology enable smart manufacturing?" Thesis, KTH, Industriell produktion, 2017. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-244837.
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To create the possibilities needed for more precise simulations and calculations regarding manufacturing changes in the equipment and new technology has to be implemented. This work investigates possible solutions for the gathering of information in manufacturing companies. To get a wider understanding of the current situation in manufacturing we have also researched some possible solutions and applications that can be applied in manufacturing. The work consists of a literature study regarding the possible solutions and technologies of smart manufacturing complemented by a survey and a follow-up interview with scientist and employees’ at large corporations to get their view of the business today and possibilities for the future. The benefits from a successful implementation of metrology can help companies toward success in the transformation toward smart manufacturing. This report also investigates what is needed for implementing smart manufacturing and the transformation in manufacturing companies to get economic advantages with a technological adaption. It also covers the possible difficulties and problems that may occur when this implementation is performed.Vid skapandet av grunder för att möjliggöra beräkningar och simulering för produktion så finns det krav på att nya verktyg och ny teknik implementeras. Detta arbete undersöker möjliga lösningar för att samla in information i industriella företag samt hur dessa företag ska gå tillväga för att möjliggöra denna omställning. För att få en bättre förståelse för området har vi även undersökt några möjliga applikationer som kan implementeras inom industrin. Arbetet består av en litteraturstudie där vi undersökte området smart manufacturing samt möjliga lösningar och tekniker som krävs för att uppnå detta. Som komplement till detta skapades även en enkät som baserades på området, svaren från enkäten följdes upp av intervjuer med deltagarna. Deltagarna var särskilt utvalda personer på större industriföretag eller institutioner vilka hade erfarenheter inom området metrologi. Detta användes som utökad grund för att få både en uppfattning av dagsläget samt idéer inför framtiden. Fördelarna med en lyckad implementering av metrologi kan hjälpa företag att ta steget mot att applicera smart manufacturing i deras produktion. Detta kan möjliggöra enklare produktion för operatörer men även ekonomiska fördelar för företaget i helhet. Arbetet tar även upp möjliga problem eller svårigheter som kan ske under denna implementation
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Gendra, Casalí Bernat. "Probabilistic quantum metrology." Doctoral thesis, Universitat Autònoma de Barcelona, 2015. http://hdl.handle.net/10803/371132.
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La Metrologia és el camp d’investigació sobre les eines estadístiques i el disseny tecnològic dels aparells de mesura necessaris per inferir informació precisa sobre paràmetres físics. En un sistema físic el soroll és inherent en última instància amb el de les seves parts, i per tant en un nivell microscòpic està governat per les lleis de la física quàntica. Les mesures quàntiques són intrínsecament sorolloses i per tant limiten la precisió amb la qual es pot obtenir en qualsevol escenari de metrologia. El camp de la metrologia quàntica està dedicat a l’estudi d’aquests límits i al desenvolupament de noves eines per ajudar a superar-los, sovint fent ús de les característiques exclusivament quàntiques com la superposició o l'entrellaçament.En el procés de disseny d’un protocol d’estimació és necessari utilitzar una figura de mèrit per optimitzar el rendiment d’aquests protocols. Fins ara la majoria de plantejaments de metrologia quàntica i els límits que en deriven han estat deterministes, és a dir, que estan optimitzats per tal de proporcionar una estimació vàlida per a cadascun dels possibles resultats de la mesura i minimitzar-ne l’error promig entre el valor estimat i el real del paràmetre. Aquesta avaluació dels protocols mitjançant el seu error promig és molt natural i convenient, però pot haver-hi algunes situacions en què això no sigui suficient per a expressar l’ús concret que se li donarà al valor obtingut.Un punt central d’aquesta tesi és observar que resultats concrets d’una mesura poden proporcionar una estimació amb una millor precisió que la mitjana. Perquè això succeeixi hi ha d’haver altres resultats imprecisos que compensin la mitjana perquè aquesta no violi els límits deterministes. En aquesta tesi hem escollit una figura de merit que reflecteix la màxima precisió que es pot obtenir. Optimitzem la precisió d’un subconjunt de resultats senyalats, i quantifiquem la probabilitat d’obtenir-ne algun d’ells, o en altres paraules, la probabilitat que el protocol proporcioni una estimació. Això pot ser entès com proposar una opció addicional que està sempre disponible per la mesura, a saber, la possibilitat de post-seleccionar els resultats i donar amb només certa probabilitat una resposta concloent. Aquests protocols probabilístics garanteixen una precisió mínima pels resultats senyalats. En la mecànica quàntica hi ha moltes maneres de poder llegir les dades d’un sistema quàntic. Per tant, l’optimització dels esquemes probabilístics no es pot reduir a la reinterpretació de resultats a partir dels esquemes (determinsitic) de metrologia quàntica canòniques, sinó que implica la recerca de mesures quàntiques completament diferents. Concretament, hem dissenyat protocols probabilístics per a l’estimació de fases, direccions i de sistemes de referència. Hem vist que la post-selecció té dos efectes possibles: compensar una mala elecció de l’estat inicial o contrarestar els efectes negatius del soroll presents en l’estat del sistema o en el procés de mesurament. En particular, trobem que afegir la possibilitat d’abstenció en l’estimació de fases en presència de soroll pot produir una millora en la precisió que supera la cota trobada per protocols deterministes. Trobem una cota que correspon a la millor precisió que es pot obtenir.Metrology is the field of research on statistical tools and technological design of measurement devices to infer accurate information about physical parameters. The noise in a physical setup is ultimately related to that of its constituents, and at a microscopic level this is in turn dictated by the rules of quantum physics. Quantum measurements are inherently noisy and hence limit the precision that can be reached by any metrology scheme. The field of quantum metrology is devoted to the study of such limits and to the development of new tools that help to surmount them, often make use unique quantum features such as superposition or entanglement. In the process of designing an estimation protocol, the experimentalist uses a figure of merit to optimise the performance of such protocols. Up until now most quantum metrology schemes and known bounds have been deterministic, that is, they are optimized in order to provide a valid estimate for each possible measurement outcome and minimize the average error between the estimated and true value of the parameter. This benchmarking of a protocol by its average performance is very natural and convenient, but there can be some scenarios in which this is not enough to express the concrete use that will be given to the obtained value. A central point in this thesis is that particular measurement outcomes can provide an estimate with a better precision than the average one. Notice that for this to happen there must be other imprecise outcomes so that the average does not violate the deterministic bounds. In this thesis we choose a figure of merit that reflects the maximum precision one can obtain. We optimise the precision of a set of heralded outcomes, and quantify the chance of such outcomes to occur, or in other words the probability that the protocol fails to provide an estimate. This can be understood as putting forward an extra feature that is always available to the experimentalist, namely the possibility of post-selecting the outcomes of their measurements and giving with some probability an inconclusive answer. These probabilistic protocols guarantee a minimal precision upon a heralded outcome. In quantum mechanics there are many ways in which data can be read-off from a quantum system. Hence, the optimization of probabilistic schemes cannot be reduced to reinterpreting results from the canonical (determinsitic) quantum metrology schemes, but rather it entails the search of completly different quantum generalized measurements. Specifically, we design probabilistic protocols for phase, direction and reference frame estimation. We show that post-selection has two possible effects: to compensate a bad choice of probe state or to counterbal¬ance the negative effects of noise present in the state system or in the measurement process. In particular, we show that adding the possibility of abstaining in phase estimation in presence of noise can produce an enhancement in precision that overtake the ultimate bound of deterministic protocols. The bound derived is the best precision that can be obtained, and in this sense one can speak of ultimate bound in precision.
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Fieß, Markus. "Advancing attosecond metrology." Diss., lmu, 2010. http://nbn-resolving.de/urn:nbn:de:bvb:19-119134.
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O'Mara, David Thomas John. "Automated facial metrology." University of Western Australia. School of Computer Science and Software Engineering, 2002. http://theses.library.uwa.edu.au/adt-WU2003.0015.
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Automated facial metrology is the science of objective and automatic measurement of the human face. There are many reasons for measuring the human face. Psychologists are interested in determining how humans perceive beauty, and how this is related to facial symmetry [158]. Biologists are interested in the relationship between symmetry and biological fitness [124]. Anthropologists, surgeons, forensic experts, and security professionals can also benefit from automated facial metrology [32, 101, 114]. This thesis investigates the concept of automated facial metrology, presenting original techniques for segmenting 3D range and colour images of the human head, measuring the bilateral symmetry of n-dimensional point data (with particular emphasis on measuring the human head), and extracting the 2D profile of the face from 3D data representing the head. Two facial profile analysis techniques are also presented that are incremental improvements over existing techniques. Extensive literature reviews of skin colour modelling, symmetry detection, symmetry measurement, and facial profile analysis are also included in this thesis. It was discovered during this research that bilateral symmetry detection using principal axes is not appropriate for detecting the mid-line of the human face. An original mid-line detection technique that does not use symmetry, and is superior to the symmetry-based technique, was developed as a direct result of this discovery. There is disagreement among researchers about the effect of ethnicity on skin colour. Some researchers claim that people from different ethnic groups have the same skin chromaticity (hue, saturation) [87, 129, 206], while other researchers claim that different ethnic groups have different skin colours [208, 209]. It is shown in this thesis that people from apparently different ethnic groups can have skin chromaticity that is within the same Gaussian distribution. The chromaticity-based skin colour model used in this thesis has been chosen from the many models previously used by other researchers, and its applicability to skin colour modelling has been justified. It is proven in this thesis that the Mahalanobis distance to the skin colour distribution is Gaussian in both the chromatic and normalised rg colour spaces. Most facial profile analysis techniques use either tangency or curvature to locate anthropometric features along the profile. Techniques based on both approaches have been implemented and compared. Neither approach is clearly superior to the other, but the results indicate that a hybrid technique, combining both approaches, could provide significant improvements. The areas of research most relevant to facial metrology are reviewed in this thesis and original contributions are made to the body of knowledge in each area. The techniques, results, literature reviews, and suggestions presented in this thesis provide a solid foundation for further research and hopefully bring the goal of automated facial metrology a little closer to being achieved.
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ALMEIDA, LUCIANA ALVES DE. "METROLOGY: CITIZENSHIP INSTRUMENT." PONTIFÍCIA UNIVERSIDADE CATÓLICA DO RIO DE JANEIRO, 2002. http://www.maxwell.vrac.puc-rio.br/Busca_etds.php?strSecao=resultado&nrSeq=4004@1.
Full textAbstract:
COORDENAÇÃO DE APERFEIÇOAMENTO DO PESSOAL DE ENSINO SUPERIORMetrologia: instrumento de cidadania configura um traçado crítico do estágio atual (1) da legislação brasileira vigente em metrologia e suas áreas correlatas e (2) do sistema educacional brasileiro em metrologia, ambas as temáticas entendidas como efetivos instrumentos orientados para o desenvolvimento da competitividade industrial e a consolidação da cidadania. O trabalho tem sua fundamentação no ideário filosófico contemporâneo, que volta a eleger o Homem e a qualidade de vida parâmetros e diferenciais competitivos nos processos de desenvolvimento lato sensu, quer econômico, quer social, político ou industrial. Na primeira vertente do trabalho, que trata da legislação em metrologia,determinou-se um corpus analítico que engloba (i) a Constituição Federal da República - a - Constituição cidadã -; (ii) o Código de Proteção e Defesa do Consumidor e (iii) o acervo da regulamentação técnica em metrologia, correlacionando-a com fatos marcantes da vida política e econômica do País. No que concerne a vertente da pesquisa que analisa a evolução do sistema educacional, são considerados aspectos críticos da pioneira experiência brasileira voltada à capacitação e à formação de profissionais em metrologia no País, em destaqu e: (i) programas e projetos de indução e consolidação da metrologia como instrumento assegurador da cidadania; (ii) o percurso evolutivo da educação formal em metrologia no contexto do sistema educacional brasileiro na conjuntura da consolidação da pósgraduação no País e (iii) de suas políticas industrial e de ciência e tecnologia.No contexto dessa ampla análise, focalizam-se os principais marcos de desenvolvimento industrial, impactos na competitividade e na construção da cidadania.Como conclusão, encaminham-se reflexões e proposições para a institucionalização das competências vigentes, para a congregação dos espaços congêneres e para o planejamento de metas de médio e longo prazo que assegurem o processo continuado de desenvolvimento da metrologia como agente desse processo global de transformação e de formação de cidadania.
Metrology: an instrument for citizenship aims at reviewing the present stage (1) of the Brazilian legislation on metrology and its correlated areas and (2) of the Brazilian education system in metrology, both matters understood as effective instruments that addresses the development of the industrial competitiveness and the consolidation of citizenship in the country. The work is based on contemporary philosophical concepts that have once more elected Man and the quality of life as a parameter and a competitive differential in the developmental processes as a whole, whether they are of economic, social, political or industrial nature. Regarding the legislative content of the work, the corpus of the analysis proposes to encompass (i) the Federal Constitution of the Republic - the - Citizen Constitution -; (ii)the Consumer, Protection and Defense Code; (iii) the body of technical Metrology regulations, inter-correlating this specific legislation with remarkable political and economic al facts of the Brazilian History. With respect to the evolution of the Brazilian education system, critical aspects of the pioneer Brazilian experience devoted to the development of human resources in metrology and metrology-related areas are considered. The analysis also focus on (i)programs and projects for the induction and consolidation of metrology as an instrument that ensures citizenship; (ii) the course along which formal education in metrology has evolved in the context of the Brazilian educational system in view of the consolidation of the postgraduate courses in the Country and (iii) of its industrial and science and technology policies. Within this broad analysis, the major landmarks of industrial development and their impact on industrial competitiveness and on the construction of citizenship have been focused. In the conclusion, a few reflections have been put forward along with proposals to institutionalize the powers and responsibilities that are currently in force, to congregate correlated spaces, and to plan medium and long-term goals for the purpose of ensuring a continuous process for the development of metrology as an agent of this ongoing process of global change.
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Knott, Paul Alexander. "Robust quantum metrology." Thesis, University of Leeds, 2015. http://etheses.whiterose.ac.uk/8931/.
Full textAbstract:
In optical interferometry path-entangled states such as NOON states have shown to give quantum-enhanced precision measurements, but these states are notoriously fragile to particle losses, which typically collapse the quantum state and destroy the phase information. A class of inherently robust states that show the potential for great improvements over the alternatives are the entangled coherent states (ECSs). We show that these states allow substantial improvements over unentangled `classical' states and highly-entangled NOON states for a wide range of loss values. We then describe a measurement scheme that can be used to measure these states with a precision close to the theoretical bound given by the quantum Fisher information. We then look at the quantum mechanisms that lead to precise measurements. In optical interferometry multi-mode entanglement is often assumed to be the driving force behind quantum enhanced measurements. Recent work has shown this assumption to be false, and here we show that when photon losses occur multi-mode entanglement is actually detrimental to obtaining quantum enhanced measurements. We specifically apply this idea to a superposition of coherent states, demonstrating that these states show a robustness to loss that allows them to significantly outperform their competitors in realistic systems. A practically viable measurement scheme is then presented that allows measurements close to the theoretical bound, even with loss. In this thesis we also consider superpositions of spin coherent states and their application to quantum metrology. Compared to optical states, spin systems have a distinctly different process of decoherence known as non-Markovian dephasing, which has shown to give greatly improved robustness to loss. We see that spin cat states give an enhanced scaling over the shot noise limit, even with dephasing, whilst being realisable with current technology.
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Mehboudi, Mohammad. "Quantum metrology and thermometry in open systems." Doctoral thesis, Universitat Autònoma de Barcelona, 2017. http://hdl.handle.net/10803/405328.
Full textAbstract:
En mi tesis exploro la metrología cuántica en sistemas abiertos, con especial enfoque en la estimaci
ón de temperatura cuántica o termometría. Para este objetivo, voy a clasificar mi estudio
en dos regímenes diferentes de equilibrio térmico y más allá del equilibrio térmico. En ambos
casos, mis colaboradores y yo planteamos cuestiones de interés fundamental y tecnológico.
Entre estas preguntas, señalo lo siguiente: ¿Cuáles son los límites de precisión máximos en
la termometría con sondas individuales? ¿Es posible mejorar estos límites utilizando recursos
cuánticos tales como las correlaciones cuánticas y la criticalidad cuántica?
No sólo encontramos la máxima precisión ligada a la termometría, planteada por las leyes físicas
de la naturaleza, sino también muestramos cómo explotar los recursos cuánticos para superar
los límites clásicos en la precisión, incluso a temperatura finita. Además, identificamos medidas
experimentalmente viables que pueden alcanzar estos límites. Específicamente, nuestros resultados
muestran que en una muestra de muchos cuerpos, las correlaciones cuánticas colectivas
pueden convertirse en observables óptimos para estimar con precisión la temperatura. A su vez,
las correlaciones de spin colectivo se pueden observar con espectroscopia cuántica de Faraday
no destructiva. Por lo tanto, nuestro método ofrece la posibilidad de inferir la máxima informaci
ón sobre la temperatura, dejando la muestra sin perturbar.
Fuera del equilibrio térmico, abordamos sistemas estáticos y dinámicos. En el primer caso,
encontramos limitaciones/oportunidades para la estimación a baja temperatura, y bajo gradiente
de temperatura en una muestra. Particularmente, identificamos que la precisión termom
étrica a baja temperatura puede ser significativamente mejorada mediante el fortalecimiento
del acoplamiento sonda-muestra. Nuestras observaciones pueden encontrar aplicaciones
prácticas en termometría a nanoescala y baja temperatura—un régimen que es particularmente
relevante para tecnologías cuánticas.
Con un punto de vista más aplicado, tales protocolos de no equilibrio dan lugar a bombas de
calor cuánticas autónomas. Por lo tanto, también pensamos en explorar la calidad de tales bombas
de calor con las sondas más pequeñas, es decir, un solo spin. Aunque a primera vista un
spin parece ser una sonda muy pequeña, confirmamos su eficiencia explorando bombas de calor
cuánticas. Nuestras técnicas pueden encontrar aplicaciones en el campo emergente de la ingenier
ía térmica cuántica, ya que facilitan el diagnóstico y la optimización del diseño de ciclos
termodinámicos complejos.
Cuando se trata de sistemas dinámicos, hemos formulado una teoría (fluctuación-disipación) con
la ayuda de la cual se puede identificar la mínima perturbación externa que afecta a un sistema
cuántico. Nuestra propuesta puede ser útil en la detección de la fuerzas cuánticas, como por
ejemplo, la detección interferométrica de ondas gravitatorias.In my thesis I explore quantum metrology in open systems, with a special focus on quantum temperature estimation, or thermometry. For this aim, I categorize my study in two different regimes of thermal equilibrium and beyond thermal equilibrium. In both cases, my collaborators and I, raise questions of fundamental and technological interest. Among such questions, I point out the followings: What are the ultimate precision bounds on thermometry with individual (single) probes? Is it possible to improve these bounds by using quantum resources such as quantum correlations and quantum criticality? We not only find the ultimate precision bound on thermometry, posed by physical laws of nature, but also show how to exploit quantum resources to surpass the classical bounds on precision, even at finite temperature. Furthermore, we identify experimentally feasible measurements which can achieve these bounds. Specifically, our results show that in a many-body sample, the collective quantum correlations can become optimal observables to accurately estimate the temperature. In turn, the collective spin correlations can be read out with the non-demolishing quantum Faraday spectroscopy. Hence, our method others inferring maximum information about the temperature, yet leaving the sample unperturbed. Out of thermal equilibrium, we address both static and dynamic systems. In the former case, we find the limitations/opportunities for estimation of low temperature, and small temperature gradient in a sample. Particularly, we identify that the thermometric precision at low temperature can be significantly enhanced by strengthening the probe-sample coupling. Our observations may find applications in practical nanoscale thermometry at low temperature—a regime which is particularly relevant to quantum technologies. With a more applied point of view, such non equilibrium protocols give rise to autonomous quantum heat pumps. Hence, we also give thought to probing the quality of such heat pumps with the tiniest probes, i.e., a single spin. Although at the first glance a spin seems to be a very small probe, we confirm its effciency in probing quantum heat pumps. Our techniques may find applications in the emerging field of quantum thermal engineering, as they facilitate the diagnosis and design optimization of complex thermodynamic cycles. When it comes to dynamic systems, we have formulate a (fluctuation-dissipation) theory with the help of which one can identify the smallest external perturbation which affects a quantum system. Our proposal might be found useful in quantum force detection, for instance, interferometric detection of gravitational waves.
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Idowu, Ade. "Dynamic metrology of error motions in precision spindles using optical metrology." Thesis, Cranfield University, 1998. http://dspace.lib.cranfield.ac.uk/handle/1826/3688.
Full textAbstract:
Knowledge of the accuracies of air bearing spindles in the sub-micrometre to nanometre range is required for the design, commissioning and operation of ultra-precise machine tools, measurement systems and other machines employing high precision rotational motion. In order to verify the dynamic performance of a spindle, measurement is required of its error motions in the unwanted five degrees of freedom (one axial, two tilts and two radial motions). Presentation of these error motions (eg in the form of polar charts) can then be used to provide critical spindle metrology data including total, asynchronous and average error motion rosette profiles and their average and peak values. This thesis describes a metrology system based on optical interferometry for measuring such unwanted error motions in three degrees of freedom involving motion along the spindle axis (axial rectilinear displacement and tilts about orthogonal axes), incurred with rotation of a precision air spindle over its specified speed-range. The system is not sensitive to orthoaxial translations which may be measured using alternative methods. Possible alternative techniques for measuring any of the degrees of freedom include an array of proximity sensors, (one for each translational degree of freedom and a further one for each of the other rotational degrees of freedom), to measure the run-out of an artefact. Proximity sensors based upon capacitive or optical fibre back-scatter techniques each offer the required single degree-of-freedom non-contacting capability and bandwidth. In the current work, a Fizeau interferometer is used to monitor the motion of the spindle of a vertical axis ultra-precision facing machine using a test-artefact. This is a mirror with less than one fringe departure from planarity from which interferogram. fringe-patterns are captured, digitised and analysed synchronously as the spindle rotates. The issue of the prediction of the dynamic form and motions of the observed interferograrn arises and the earlier theory is extended to optimise the set-up, including provision of automatic servo- alignment of the optical axis with the axis of the spindle. Measurement interferograrn data is sampled at selected angular incremental positions of spindle-rotation and image processing techniques used to filter the fringe pattern, enabling measurement of spindle tilt and axial displacement. Issues of sampling with respect to the anticipated spatial angular frequency of the spindle run-out are considered with respect to the speed/frequency capability of data-acquisition and processing arrangements. Essentially, with a spindle rotating at typical machining speeds of 300- 3000 rev/min, for consistent error motions, the resolution of an error plot is principally a function of observational time. It is foreseen that the system will be applicable in research and production-support in ultra-precision machining production processes and in rotational metrology.
Books on the topic "Metrology"
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Gao, Wei, ed. Metrology. Singapore: Springer Singapore, 2019. http://dx.doi.org/10.1007/978-981-10-4912-5.
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National Institute of Standards and Technology (U.S.), ed. Metrology. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1998.
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Scholle, Jerome V. Metrology. Reading, Mass: Addison-Wesley, 1993.
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National Institute of Standards and Technology (U.S.), ed. Metrology. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1998.
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Seminário Rio Metrologia (1st 2002 Rio de Janeiro, Brazil). Seminário Rio Metrologia 2002: 07 a 08 de novembro, Hotel Pestana Rio Atlântica. Rio de Janeiro, RJ: Rede de Tecnologia do Rio de Janeiro, 2002.
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Rio-Metrologia. Rio-Metrologia: Rede de Laboratórios do Rio de Janeiro. Rio de Janeiro, RJ: Rio Metrologia, 2000.
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Anthony, D. M. Engineering metrology. Oxford: Pergamon Press, 1986.
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Ferrero, Alessandro, and Veronica Scotti. Forensic Metrology. Cham: Springer International Publishing, 2022. http://dx.doi.org/10.1007/978-3-031-14619-0.
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Soares, Olivério D. D., ed. Optical Metrology. Dordrecht: Springer Netherlands, 1987. http://dx.doi.org/10.1007/978-94-009-3609-6.
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Sładek, Jerzy A. Coordinate Metrology. Berlin, Heidelberg: Springer Berlin Heidelberg, 2016. http://dx.doi.org/10.1007/978-3-662-48465-4.
Full textBook chapters on the topic "Metrology"
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Karaböce, Baki. "Metrology Versus Medical Metrology." In IFMBE Proceedings, 104–11. Cham: Springer Nature Switzerland, 2024. http://dx.doi.org/10.1007/978-3-031-49068-2_12.
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Yagüe-Fabra, José A. "Metrology." In CIRP Encyclopedia of Production Engineering, 1–4. Berlin, Heidelberg: Springer Berlin Heidelberg, 2016. http://dx.doi.org/10.1007/978-3-642-35950-7_6587-4.
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Hinduja, Srichand, and Lin Li. "Metrology." In Proceedings of the 37th International MATADOR Conference, 267–88. London: Springer London, 2012. http://dx.doi.org/10.1007/978-1-4471-4480-9_7.
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Yagüe-Fabra, José A. "Metrology." In CIRP Encyclopedia of Production Engineering, 1189–92. Berlin, Heidelberg: Springer Berlin Heidelberg, 2019. http://dx.doi.org/10.1007/978-3-662-53120-4_6587.
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Yagüe-Fabra, José A. "Metrology." In CIRP Encyclopedia of Production Engineering, 869–73. Berlin, Heidelberg: Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-20617-7_6587.
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Soffel, Michael H., and Wen-Biao Han. "Metrology." In Astronomy and Astrophysics Library, 431–96. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-19673-8_12.
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Gooch, Jan W. "Metrology." In Encyclopedic Dictionary of Polymers, 460. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_7450.
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Miller, Jimmie. "Metrology." In Basics of Precision Engineering, 25–49. Boca Raton : Taylor & Francis, a CRC title, part of the Taylor & Francis imprint, a member of the Taylor & Francis Group, the academic division of T&F Informa, plc, [2018]: CRC Press, 2018. http://dx.doi.org/10.1201/9781351204118-2.
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Singh, D. K. "Metrology." In Fundamentals of Manufacturing Engineering, 499–532. Singapore: Springer Nature Singapore, 2024. http://dx.doi.org/10.1007/978-981-99-8767-2_22.
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Arghode, Vaibhav K., and Yogendra Joshi. "Metrology Tools." In Air Flow Management in Raised Floor Data Centers, 11–26. Cham: Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-25892-8_2.
Full textConference papers on the topic "Metrology"
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"Metrology and Metrology Assurance 2023." In 2023 XXXIII International Scientific Symposium Metrology and Metrology Assurance (MMA). IEEE, 2023. http://dx.doi.org/10.1109/mma59144.2023.10317912.
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Bunday, Benjamin, and George Orji. "Metrology." In 2021 IEEE International Roadmap for Devices and Systems Outbriefs. IEEE, 2021. http://dx.doi.org/10.1109/irds54852.2021.00019.
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Jachowicz, Ryszard S. "MEMS in metrology, metrology in MEMS." In 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007. IEEE, 2007. http://dx.doi.org/10.1109/imtc.2007.379268.
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Pou, Jean-Michel, and Laurent Leblond. "Smart Metrology: From the metrology of instrumentation to the metrology of decisions." In 18th International Congress of Metrology, edited by Cosimi Corletto. Les Ulis, France: EDP Sciences, 2017. http://dx.doi.org/10.1051/metrology/201701007.
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Kuhnert, Andreas C., Stuart B. Shaklan, Yekta Gursel, Steven L. Azevedo, and Yao Lin. "Metrology for the Micro-Arcsecond Metrology testbed." In Astronomical Telescopes & Instrumentation, edited by Robert D. Reasenberg. SPIE, 1998. http://dx.doi.org/10.1117/12.317185.
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Marchman, Herschel M. "Dimensional metrology." In Single Frequency Semiconductor Lasers, edited by Jens Buus. SPIE, 2017. http://dx.doi.org/10.1117/12.2284083.
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Currim, Sabah, Richard T. Snodgrass, Young-Kyoon Suh, Rui Zhang, Matthew Wong Johnson, and Cheng Yi. "DBMS metrology." In the 2013 international conference. New York, New York, USA: ACM Press, 2013. http://dx.doi.org/10.1145/2463676.2465331.
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Gillessen, Stefan, Magdalena Lippa, Frank Eisenhauer, Oliver Pfuhl, Marcus Haug, Stefan Kellner, Thomas Ott, et al. "GRAVITY: metrology." In SPIE Astronomical Telescopes + Instrumentation, edited by Françoise Delplancke, Jayadev K. Rajagopal, and Fabien Malbet. SPIE, 2012. http://dx.doi.org/10.1117/12.926813.
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Walmsley, I. A. "Attosecond metrology." In Quantum Electronics and Laser Science (QELS). Postconference Digest. IEEE, 2003. http://dx.doi.org/10.1109/qels.2003.238325.
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"Electromagnetic metrology." In 2004 Second International Workshop Ultrawideband and Ultrashort Impulse Signals. IEEE, 2004. http://dx.doi.org/10.1109/uwbus.2004.1388077.
Full textReports on the topic "Metrology"
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Shroyer, K. Metrology measurement capabilities. Office of Scientific and Technical Information (OSTI), February 1997. http://dx.doi.org/10.2172/481595.
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Dr. Glen E. Gronniger. Metrology Measurement Capabilities. Office of Scientific and Technical Information (OSTI), October 2007. http://dx.doi.org/10.2172/920999.
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Barnes, L. M. Metrology measurement capabilities. Office of Scientific and Technical Information (OSTI), June 1997. http://dx.doi.org/10.2172/587991.
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Barnes, L. M. Metrology Measurement Capabilities. Office of Scientific and Technical Information (OSTI), November 2003. http://dx.doi.org/10.2172/818330.
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Shroyer, K. Metrology measurement capability. Office of Scientific and Technical Information (OSTI), January 1995. http://dx.doi.org/10.2172/10116062.
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Barnes, L. M. Metrology Measurement Capabilities. Office of Scientific and Technical Information (OSTI), March 2000. http://dx.doi.org/10.2172/753923.
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Gilmore, I. S. Metrology Research Roadmap. National Physical Laboratory, November 2023. http://dx.doi.org/10.47120/npl.9510.
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Morris, C. L., J. M. Anaya, and V. Armijo. Neutron metrology for SBSS. Office of Scientific and Technical Information (OSTI), December 1998. http://dx.doi.org/10.2172/348912.
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Barsic, Anthony, Rafael Piestun, and Robert R. Boye. Metrology of 3D nanostructures. Office of Scientific and Technical Information (OSTI), October 2012. http://dx.doi.org/10.2172/1144015.
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DeWeese, Mary E. Metrology for electromagnetic technology :. Gaithersburg, MD: National Institute of Standards and Technology, 1989. http://dx.doi.org/10.6028/nist.ir.89-3921.
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