Academic literature on the topic 'Low loss plasmon electron energy loss spectrum'
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Journal articles on the topic "Low loss plasmon electron energy loss spectrum"
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Longo, Paolo, Ray D. Twesten, and Jaco Olivier. "Probing the Chemical Structure in Diamond-Based Materials Using Combined Low-Loss and Core-Loss Electron Energy-Loss spectroscopy." Microscopy and Microanalysis 20, no. 3 (March 25, 2014): 779–83. http://dx.doi.org/10.1017/s1431927614000579.
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AbstractWe report the analysis of the changes in local carbon structure and chemistry caused by the self-implantation of carbon into diamond via electron energy-loss spectroscopy (EELS) plasmon energy shifts and core-edge fine structure fingerprinting. These two very different EELS energy and intensity ranges of the spectrum can be acquired under identical experimental conditions and nearly simultaneously using specially designed deflectors and energy offset devices known as “DualEELS.” In this way, it is possible to take full advantage of the unique and complementary information that is present in the low- and core-loss regions of the EELS spectrum. We find that self-implanted carbon under the implantation conditions used for the material investigated in this paper creates an amorphous region with significant sp2 content that varies across the interface.
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Bellido, Edson P., David Rossouw, and Gianluigi A. Botton. "Toward 10 meV Electron Energy-Loss Spectroscopy Resolution for Plasmonics." Microscopy and Microanalysis 20, no. 3 (April 1, 2014): 767–78. http://dx.doi.org/10.1017/s1431927614000609.
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AbstractEnergy resolution is one of the most important parameters in electron energy-loss spectroscopy. This is especially true for measurement of surface plasmon resonances, where high-energy resolution is crucial for resolving individual resonance peaks, in particular close to the zero-loss peak. In this work, we improve the energy resolution of electron energy-loss spectra of surface plasmon resonances, acquired with a monochromated beam in a scanning transmission electron microscope, by the use of the Richardson–Lucy deconvolution algorithm. We test the performance of the algorithm in a simulated spectrum and then apply it to experimental energy-loss spectra of a lithographically patterned silver nanorod. By reduction of the point spread function of the spectrum, we are able to identify low-energy surface plasmon peaks in spectra, more localized features, and higher contrast in surface plasmon energy-filtered maps. Thanks to the combination of a monochromated beam and the Richardson–Lucy algorithm, we improve the effective resolution down to 30 meV, and evidence of success up to 10 meV resolution for losses below 1 eV. We also propose, implement, and test two methods to limit the number of iterations in the algorithm. The first method is based on noise measurement and analysis, while in the second we monitor the change of slope in the deconvolved spectrum.
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Bell, David C. "Electron Scattering In Diamond as a Function of Thickness." Microscopy and Microanalysis 4, S2 (July 1998): 338–39. http://dx.doi.org/10.1017/s1431927600021814.
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BackgroundThe electron energy-loss spectrum of a single crystal diamond wedge has been examined, with particular reference to the excitation of plasmon oscillations in the bulk of a diamond crystal. The electron energy-loss spectrum has been previously studied [1], and in particular the ‘low-lo ss’ region of the spectrum shows a number of important features, Fig. 1. The main feature in the energy-loss spectrum is a peak at ∼ 33 eV which corresponds to a plasma resonance of valence electrons. Diamond has 4 valence electrons which yields a value of Ep = 31.0 eV. The upward shift in the resonance energy to 33 eV is caused by single-electron excitation at lower energy-loss values. An important feature is the “bump” at about 23 eV, which has been shown to be an interband transition [2].
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Luo, Suichu, John R. Dunlap, and David C. Joy. "Modulation electron energy loss spectroscopy and its application of quantitative analysis." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 454–55. http://dx.doi.org/10.1017/s0424820100148101.
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Electron energy loss spectroscopy (EELS) gives an inportant insight into the variety of excitations a sample may undergo when irradiated by an electron beam. The focus of this work was to simulate electronic excitations within the energy range from a few to several hundred eV. Our recently developed modulation scheme, combines both convolution and deconvolution techniques, to provide quantitative information about elementary inelastic scattering processes without knowledge of sample parameters such as thickness or optical constants.In the low energy loss region of the spectrum the primary excitation mechanisms include interband transitions, and surface and bulk plasmons. In general these individual excitation events overlap in the spectrum. A FFT convolution procedure was developed where the basic inelastic processes may be represented by the dielectric theory . The dielectric function ε is used to describe both single excitations and collective excitations, where Here ωp2=4πNe2/m is the bulk plasmon frequency, N is number of free electrons per unit volume, e and m are the charge and mass of the electron respectively and ω0 is a constant which is finite for a bound state but zero for a free electron.
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Wang, Z. L. "Energy-filtered high-resolution Electron Microscopy of nanostructured materials." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 176–77. http://dx.doi.org/10.1017/s0424820100137252.
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The interaction between an incident electron and the atoms in condensed matter results in various inelastic scattering processes. Thermal diffuse scattering or phonon scattering is the result of atomic vibrations in crystals. This process does not introduce any significant energy-loss (< 0.1 eV) but produces large momentum transfer. Valence-loss (or plasmon for metals and semiconductors) excitation, which characterizes the transitions of electrons from the valence band to the conduction band, involves an energyloss in the range of 1 -50 e V. Atomic inner-shell ionization is excited by the energy transfer of the incident electron, resulting in an ejected electron from the deep-core states. Continuous energy-loss spectra can also be generated by an electron which penetrates into the specimen and undergoes collisions with the atoms in it, resulting in Bremsstrahlung and leading to emission of x-rays with continuous energy. The electron Compton scattering refers to the collision of the incident electron with an electron belonging to the specimen. In an electron energy-loss spectrum (EELS), the zero-loss peak is composed of elastically and thermal diffusely scattered electrons. The low-loss region is dominated by valence-excitations.
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Reimer, L. "Energy-filtering Transmission Electron Microscopy in materials and life science." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 936–37. http://dx.doi.org/10.1017/s0424820100172413.
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Energy-filtering transmission electron microscopy can be realized by an imaging filter lens in thecolumn of a TEM, a post-column electron energy-loss spectrometer or a dedicated STEM. This offers new possibilities in analytical electron microscopy by combining the operation modes of electron-spectroscopic imaging (ESI), electron-spectroscopic diffraction (ESD) and the record of an electron energy-loss spectrum (EELS).ESI can be used in the zero-loss mode to remove all inelastically scattered electrons. Thicker amorphous and crystalline specimens can be observed without chromatic aberration and with a transmissionof 10−3 up to 80(110) and 150(200) μg/cm2 at 80(120) keV, respectively. This results in a condiserable increase of scattering, phase and Bragg contrast, especially for low Z material because the ratio of inelastic-to-elastic cross section increases as 20/Z with decreasing atomic number. In future energy-filtered high-resolution crystal-lattice images will offer us a better comparison with dynamical simulations. Plasmon loss filtering can be applied for a better separation of phases (e.g. precipitates in a matrix), which differ in their plasmon loss by about 1 eV. Owing to intersections of the energy loss spectra, different parts of a specimen can change their contrast when tuning the selected energy window. Structures containing non carbon atoms will beconsiderably increased in a bright field like contrast relative to the carboneous matrix just below the carbon K edge (structure—sensitive imaging).
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Mondio, G., F. Neri, G. Curró, S. Patané, and G. Compagnini. "The dielectric constant of TCNQ single crystals as deduced by reflection electron energy loss spectroscopy." Journal of Materials Research 8, no. 10 (October 1993): 2627–33. http://dx.doi.org/10.1557/jmr.1993.2627.
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The dielectric constant of tetracyanoquinodimethane (TCNQ) single crystals has been obtained by reflection electron energy loss spectroscopy (REELS) over the 0–60 eV energy range, using primary electron energies ranging from 0.5 to 1.5 keV at an incidence angle of about 40°. A self-consistent method is discussed concerning the evaluation of the surface and bulk contributions to the loss spectra. As a result, for the first time, the Im(−1/∊) function and the dielectric constant of TCNQ have been deduced in such a wide energy range. According to the results obtained by other authors, the low-energy loss spectral profile is characterized by two main structures ascribed to the π → π∗ dipole-allowed transitions located at about 3.5 and 6.5 eV while, at higher energy loss, the π + σ plasmon, centered at about 21.5 eV, dominates the spectrum. The differences among the spectra taken at different primary energies are interpreted as due only to surface effects, more evident in the low-energy-loss spectral region. The results are in good agreement with those obtained by recent transmission-mode (TEELS) experiments.
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UGARTE, Daniel. "STEM Study of Surface Plasmon Excitation in Small Spherical Particles." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (August 12, 1990): 42–43. http://dx.doi.org/10.1017/s0424820100133801.
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Small particles exhibit chemical and physical behaviors substantially different from bulk materials. This is due to the fact that boundary conditions can induce specific constraints on the observed properties. As an example, energy loss experiments carried out in an analytical electron microscope, constitute a powerful technique to investigate the excitation of collective surface modes (plasmons), which are modified in a limited size medium. In this work a STEM VG HB501 has been used to study the low energy loss spectrum (1-40 eV) of silicon spherical particles [1], and the spatial localization of the different modes has been analyzed through digitally acquired energy filtered images. This material and its oxides have been extensively studied and are very well characterized, because of their applications in microelectronics. These particles are thus ideal objects to test the validity of theories developed up to now.Typical EELS spectra in the low loss region are shown in fig. 2 and energy filtered images for the main spectral features in fig. 3.
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Keast, V. J. "Ab initio calculations of plasmons and interband transitions in the low-loss electron energy-loss spectrum." Journal of Electron Spectroscopy and Related Phenomena 143, no. 2-3 (May 2005): 97–104. http://dx.doi.org/10.1016/j.elspec.2004.04.005.
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Wang, Z. L., and P. Rez. "Inner-shell energy loss spectroscopy under reflection-microscopy condition." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 120–21. http://dx.doi.org/10.1017/s0424820100125531.
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Electron energy loss spectroscopy(EELS) of the inner shells of atoms is now a well established technique for determination of specimen composition, especially for the light elements. In recent years there has been a revival interest in reflection electron microscopy(REM) as a method for examining surface morphology. It would be useful if the techniques of bulk microanalysis could also be applied in reflection mode. The first electron microscope reflection energy loss measurement were due to Krivanek et al. They successfully showed the enhancement of the surface plasmon in silicon but the Si L edge at 100eV could only be seen as a change in spectrum shape. This is a characteristic of multiple scattering and it is hardly surprising that it should be more important in REM. Multiple scattering in TEM limits energy loss to relatively thin regions, but even under conditions in which multiple scattering has eliminated a low energy edge (such as Si L) the edge of a deep inner shell with binding energy greater than 1 kV can still be clearly seen, though sometimes distorted in shape.
Dissertations / Theses on the topic "Low loss plasmon electron energy loss spectrum"
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Colson, Tobias A., and tobiascolson@gmail com. "Large Angle Plasmon Scattering in Metals and Ceramics." RMIT University. Applied Sciences, 2007. http://adt.lib.rmit.edu.au/adt/public/adt-VIT20090212.143048.
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This investigation is primarily concerned with the low loss, or plasmon region of an electron energy loss spectrum. Specifically, why these spectra have the shape and form that they do; what the significance of the material is in determining the shape and form of these spectra; what can be done with plasmon excited electrons; and how all of this fits in with the current theory of plasmon excitation. In particular, the concept of plasmon scattering being an energy transfer process of a coupled wave in the material is explored. This gives rise to slightly different explanations of the plasmon scattering process to the status quo. Multiple scattering is typically pictured as a combination of separate and independent, elastic and inelastic scattering events interactively contributing to a final exit wave function. However, this investigation explores the idea of the elastic and inelastic components being a coupled event, and what the consequences of this idea are from a conceptual point of view. The energy transfer process itself, does not deviate from a virtual particle exchange description that is consistent with the standard model. However, the two significant points made throughout the chapters are one: that the elastic and inelastic scattering events are coupled rather than separate, and two: that each succussive higher order scattering event in multiple scattering scenarios, are dependant and connecte d rather than independent.
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Chi, Hung-Jun, and 紀宏潤. "Calculations of electron energy loss spectrum due to plasmon excitations in spherical and cylindrical nanomaterial." Thesis, 2011. http://ndltd.ncl.edu.tw/handle/33919578641080582795.
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碩士國立臺灣大學
物理研究所
99
Since plasmons have strong near-fields, they can break the limit of optical diffraction and become an important mechanism for developments of optical instruments. In order to explore the characteristics of plasmons, in this thesis we simulate the plasmon modes in spherical and cylindrical nanomaterials excited by fast electron beams. In addition, the variations of mode eigenfrequencies as a function of incident electron speed, location, and direction were carefully studied. An exotic mode of Cherenkov radiation was also carefully investigated and cannot be tackled without the thorough relativistic consideration of the calculations. Comparison between electron-beam experiments and calculations were also briefly discussed.
Conference papers on the topic "Low loss plasmon electron energy loss spectrum"
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Fu, Lianfeng, Lifan Chen, and Haifeng Wang. "High Throughput Phase Mapping for Metrology Using Low-Loss EELS." In ISTFA 2017. ASM International, 2017. http://dx.doi.org/10.31399/asm.cp.istfa2017p0362.
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Abstract The plasmon-loss region of the low-loss electron energy loss spectroscopy (EELS) contains chemical information similar to core-loss EELS; therefore it can be utilized as finger-printing elements. A high throughput phase mapping technique based on plasmon energy (Ep) is proposed. We have successfully applied this phase mapping technique into two case studies in our magnetic head manufacturer processes. This Ep phase mapping can be applied to not only the data storage but also semiconductor industries.
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Subramanian, Swaminathan, Khiem Ly, and Tony Chrastecky. "Energy-Filtered Imaging of Polysilicon Defects, Gate Dielectric and Silicon Nanocrystals Using Plasmon Energy-Loss Electrons." In ISTFA 2012. ASM International, 2012. http://dx.doi.org/10.31399/asm.cp.istfa2012p0359.
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Abstract Transmission electron microscope based elemental analysis techniques utilize X-ray photons in EDS and inelastically scattered electrons or the energy-loss electrons in electron energy-loss spectroscopy and energy-filtered transmission electron microscopy (EFTEM). This paper discusses the applications of EFTEM to visualize polysilicon defects, gate dielectric and silicon nanocrystals using inelastically scattered low energy-loss electrons. It focuses on features that are primarily composed of silicon and silicon-oxide. Various benefits of using plasmon energy-loss electrons to image silicon nanocrystals layer in thin film storage device are also outlined. Even though this work has focused on low-loss imaging of features and defects in the front-end of the process based on silicon/silicon-oxide integrated circuits, these techniques can also be applied to technologies based on other materials by selecting appropriate plasmon peaks corresponding to those materials.
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Chaturvedi, P., and N. Fang. "Molecular Scale Imaging With a Mutlilayer Superlens." In ASME 4th Integrated Nanosystems Conference. ASMEDC, 2005. http://dx.doi.org/10.1115/nano2005-87056.
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Recent theory [1] suggested a thin negative index film should function as a “superlens”, providing image detail with resolution beyond the diffraction limit—a limitation to which all positive index optics are subject. The superlens allows the recovery of evanescent waves in the image via the excitation of surface plasmons. It has been demonstrated experimentally [2] that a silver superlens allows to resolve features well below the working wavelength. Resolution as high as 60 nanometer (λ/6) half-pitch has been achieved. This unique class of superlens will enable parallel imaging and nanofabrication in a single snapshot, a feat that are not yet available with other nanoscale imaging techniques such as atomic force microscope or scanning electron microscope. In this paper, we explore the possibility of further refining the image resolution using a multilayer superlens [3]. Using a stable transfer matrix scheme, our numerical calculations show an ultimate imaging resolution of λ/24. This is made possible using alternating stacks of alumina (Al2O3) and silver (Ag) layers to enhance a broad spectrum of evanescent waves via surface plasmon modes. Furthermore, we present the effect of alterations in number of layers and thickness to the image transfer function. With optimized design of multilayer superlens (working wavelength of 387.5nm), our study indicates the feasibility of resolving features of 16nm and below. Moreover, our tolerance analysis indicates that a 380 nm commercial light source would degrade slightly the imaging resolution to about 20nm. Preliminary experiments are ongoing to demonstrate the molecular scale imaging resolution. The development of potential low-loss and high resolution superlens opens the door to exciting applications in nanoscale optical metrology and nanomanufacturing.
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Singh, Sukhinderpal, and Jasmaninder Singh Grewal. "Effect of Varying Load on DLC/AlCrN-Based Coated AISI D2 Die Steel at Constant Sliding Velocity." In ASME 2017 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 2017. http://dx.doi.org/10.1115/imece2017-72481.
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This study has been made to limit the sliding wear by employing advanced protective nano coatings by using DC magnetron sputtering Physical Vapour Deposition technique. Three advanced nano coatings viz. Diamond-Like Carbon (DLC), composite AlCrN coating and AlCrN/TiAlN multilayered coatings were selected for present work due to their enviable wear resistant characteristics. Coatings were deposited on AISI-D2 die steel by traditional DC magnetron sputtering physical vapour deposition technique. The as deposited coatings were characterized with surface roughness, microhardness, porosity and microstructure. The X-Ray Diffraction (XRD) and field mission scanning electron microscope (FESEM with EDAX) techniques have been used to describe various phases established after coating deposited on the surface of the substrate. Subsequently, sliding wear and friction tests were conducted in accordance with ASTM standard G99-03, under scrutiny variation of load and time and at constant sliding speed. Cumulative wear volume loss and coefficient of friction were formulated for coated as well as uncoated/tempered specimen at a constant speed of 1 m/s and varying load of 25N and 50N. The results from experimentation were analysed with SEM micrographs and Energy dispersive spectrum to analyse the adaptability of coating for base materials, wear behaviour and friction behaviour of coated and uncoated/tempered substrates. The results have shown adaptability of advance nano-coatings for AISI D2 die steel. The generation of oxide layer during wear process provides wear resistance to the AlCrN-based coatings. No thermal instability has been observed in nano-coatings at low temperature generated while experimentation and that is under working range of cold forming processes. It is observed that there is relevant decrease in frictional force by the application of DLC coatings while AlCrN/TiAlN has provided much better wear resistance.