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Journal articles on the topic 'Length metrology'

Author: Grafiati

Published: 14 March 2023

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1

Lee, Dong-Yeon, Dong-Min Kim, and Dae-Gab Gweon. "Atomic Force Microscope for Standard Length Metrology." Transactions of the Korean Society of Mechanical Engineers A 30, no. 12 (December 1, 2006): 1611–17. http://dx.doi.org/10.3795/ksme-a.2006.30.12.1611.

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2

Stone, Jack A. "Uncalibrated Helium-Neon Lasers in Length Metrology." NCSLI Measure 4, no. 3 (September 2009): 52–58. http://dx.doi.org/10.1080/19315775.2009.11721483.

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3

García-Asenjo, Luis, Sergio Baselga, Chris Atkins, and Pascual Garrigues. "Development of a Submillimetric GNSS-Based Distance Meter for Length Metrology." Sensors 21, no. 4 (February 6, 2021): 1145. http://dx.doi.org/10.3390/s21041145.

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Absolute distance determination in the open air with an uncertainty of a few tenths of a millimetre is increasingly required in many applications that involve high precision geodetic metrology. No matter the technique used to measure, the resulting distances must be proven consistent with the unit of length (SI-metre) as realized in the outdoor facilities traditionally used in length metrology, which are also known as calibration baselines of reference. The current calibration baselines of reference have distances in the range of 10 to 1000 m, but at present there is no solution on the market to provide distances with submillimetric precision in that range. Consequently, new techniques such as multi-wave interferometry, two-wave laser telemeters or laser trackers are being developed. A possible alternative to those sophisticated and expensive techniques is the use of widely used Global Navigation Satellite Systems (GNSS) in order to provide a GNSS-Based Distance Meter (GBDM). The use of a GBDM as a potential technique for length metrology has been thoroughly analysed in several European research projects by using the state-of-the-art geodetic software, such as Bernese 5.2, but no definite conclusions have been drawn and some metrological questions are considered still open. In this paper, we describe a dedicated approach to build up a submillimetric GBDM able to be applied in the current calibration baselines of reference, as well as possible methods to cope with the multipath error of the GNSS signals which is the major limitation for the practical uptaking of the technique in metrology. The accuracy of the proposed approach has been tested following the length metrology standards in four experiments carried out in the Universitat Politècnica de València (UPV). The results demonstrate that the proposed GBDM can provide an accuracy of a few tenths of a millimetre in the current calibration baselines of reference.

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4

Buchta, Zdeněk, Martin Šarbort, Martin Čížek, Václav Hucl, Šimon Řeřucha, Tomáš Pikálek, Štěpánka Dvořáčková, et al. "System for automatic gauge block length measurement optimized for secondary length metrology." Precision Engineering 49 (July 2017): 322–31. http://dx.doi.org/10.1016/j.precisioneng.2017.03.002.

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5

Wieczorowski, Michał, Paweł Pawlus, and Bartosz Gapiński. "Perspectives of modern metrology." Mechanik 92, no. 12 (December 9, 2019): 767–73. http://dx.doi.org/10.17814/mechanik.2019.12.106.

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The most up-to-date trends in development of length and angle metrology were presented. This development falls within a concept of Industry 4.0 and is understood as Metrology 4.0. Basic elements of these concepts and their connections were shown during years in relation to consecutive industrial revolutions. Specific issues regarding additive technologies were described with a view to functional filtration. Achievements of coordinate measuring technique in macro scale were also presented including optical scanning and computed tomography. In conclusions standardization works regarding the mentioned topics were described.

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6

TANAKA, Shinichi. "Non-Contact 3D Metrology by Multi Wave-Length Interferometer." Journal of the Japan Society for Precision Engineering 85, no. 8 (August 5, 2019): 695–98. http://dx.doi.org/10.2493/jjspe.85.695.

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7

Blumröder, Ulrike, Ronald Füßl, Thomas Fröhlich, Eberhard Manske, and Rostyslav Mastylo. "FREQUENCY COMB-COUPLED METROLOGY LASERS FOR NANOPOSITIONING AND NANO MEASURING MACHINES." Measuring Equipment and Metrology 82, no. 4 (2021): 36–42. http://dx.doi.org/10.23939/istcmtm2021.04.036.

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This article shows how a direct readout of the interferometric length measurement in nanopositioning machines can be transferred by connecting the metrology laser to a frequency comb line. The approach is based on a GPS-referenced frequency comb with which the stability of the timer (atomic clock via GPS) is transferred to the metrology laser of the nanopositioning and nano measuring machine NPMM-200. The necessary prerequisites for ensuring traceability are discussed. It is demonstrated that with this approach an improvement in the long-term stability of the metrology laser by three orders of magnitude can be achieved.

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8

Jing, Ren, and Xin Chang. "A determinate method of metrology attribute benchmark of commercial banks’ management efficiency." PLOS ONE 17, no. 8 (August 4, 2022): e0272286. http://dx.doi.org/10.1371/journal.pone.0272286.

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The evaluation or metrology of commercial bank management efficiency is the core of its effective management. The existing management efficiency of commercial banks adopts evaluation scheme rather than metrology. There are four shortcomings with the evaluation scheme, the evaluation is a ranking of advantages and/or disadvantages, all objects should participate in the evaluation, the evaluation results are valid only for the evaluated objects, and the evaluation results lack the metrology benchmark of the object domain. To address this issue, the paper presents a method to determine the benchmark of management efficiency, which is similar to the unit "meter" in the metrology of "length" and the unit "scale" in the metrology of "management efficiency". Firstly, the method of cluster analysis is used to solve the problem of attribute metrology base of management efficiency metrology. Based on the master of certain attribute data of commercial bank management efficiency metrology, cluster analysis is carried out onto the attribute data, and its characteristics and patterns are mined to determine the candidate benchmark set. Secondly, in the candidate datum set, k-means method is used to determine the metrology attribute datum to obtain the general metrology attributes. Finally, the absolute metrology of management efficiency is carried out for any commercial bank according to the benchmark, and the validity and feasibility of the benchmark are verified with an example. In such a way, the deficiencies of four aspects of evaluation are solved. Such a strategy can be adapted to different banks at any different time for their respective measurement, which extends the clustering statistical methods for attribute datum determination. The results can be applied to some other fields wherein object metrology is the basic task.

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9

Mateo, Ana Baselga, and Zeb W. Barber. "Precision and accuracy testing of FMCW ladar-based length metrology." Applied Optics 54, no. 19 (June 26, 2015): 6019. http://dx.doi.org/10.1364/ao.54.006019.

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10

Röske, Dirk. "Some problems concerning the lever arm length in torque metrology." Measurement 20, no. 1 (January 1997): 23–32. http://dx.doi.org/10.1016/s0263-2241(97)00006-7.

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11

Wieczorowski, Michał. "Digitalization of surfaces in micro, meso and macro applications." Mechanik 91, no. 11 (November 12, 2018): 944–49. http://dx.doi.org/10.17814/mechanik.2018.11.166.

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In the paper a concept of length and angle metrology in fourth industrial revolution known as Industry 4.0 was presented. Problems and conditions as well as limitations connected with measurement possibilities from devices and man point of view were shown. Scale as metrology term with its division to different ranges, i.e. macro, micro and meso were described. For each of these areas digitization and its tasks were presented.

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12

Chiffre, L. De, D. González-Madruga, G. Dalla Costa, M. R. Sonne, A. Mohammadi, J. H. Hattel, H. N. Hansen, et al. "Accurate measurements in a production environment using dynamic length metrology (DLM)." Procedia CIRP 75 (2018): 343–48. http://dx.doi.org/10.1016/j.procir.2018.04.074.

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13

Niwa, Y., K. Arai, A. Ueda, M. Sakagami, N. Gouda, Y. Kobayashi, Y. Yamada, and T. Yano. "Laser interferometric high-precision geometry (angle and length) monitor for JASMINE." Proceedings of the International Astronomical Union 3, S248 (October 2007): 280–81. http://dx.doi.org/10.1017/s1743921308019315.

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AbstractThe telescope geometry of JASMINE should be stabilized and monitored with the accuracy of about 10 to 100 pm or 10 to 100 prad of rms over about 10 hours. For this purpose, a high-precision interferometric laser metrology system is employed. Useful techniques for measuring displacements on extremely small scales are the wave-front sensing method and the heterodyne interferometrical method. Experiments for verification of measurement principles are well advanced.

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14

Centeno González, Luz María, Eduardo Castillo Castañeda, Luis Omar Becerra Santiago, and Alberto Rochín García. "A magnetic suspension system for measuring liquid density." Ingeniería e Investigación 33, no. 1 (January 1, 2013): 46–51. http://dx.doi.org/10.15446/ing.investig.v33n1.37666.

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Density is a derived quantity of mass and length; it is defined as mass per volume unit and its SI unit is kg/m3. National metrology institutes have been designing and building their own magnetic suspension systems during the last 5 decades for making fluid density measurements; this has allowed them to carry out research into liquids and gases' physical characteristics. This paper was aimed at designing and developing a magnetic suspension system for a magnetic balance used in determining liquid density to be used in CENAM's metrology density laboratories.

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15

Schamp, C. T. "High-Resolution Metrology in the TEM." Microscopy Today 20, no. 3 (May 2012): 46–49. http://dx.doi.org/10.1017/s1551929512000363.

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The transmission electron microscope (TEM) is well known as the technique of choice for visualization and measurement of features at near-atomic length scales, particularly for semiconductor devices. For example, a critical measurement of interest may be the thickness of the gate oxide in a transistor. The accuracy of these measurements is based on calibrated distances at each magnification. The term accuracy conveys the extent to which the measurement minimizes the difference between the measured value and the true value. The associated term precision is the closeness of agreement in a series of measurements locating the end-points of a measurement line. This article describes a method that increases the accuracy of metrology measurements applied to a high-resolution TEM image.

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16

Postek, Michael T., Marylyn Bennett, Nestor J. Zaluzec, Thomas Wheatley, and Samuel Jones. "National Institute of Standards and Technology - Texas Instruments Industrial Collaboratory Testbed." Microscopy and Microanalysis 4, S2 (July 1998): 22–23. http://dx.doi.org/10.1017/s1431927600020237.

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One of the missions of the NIST Manufacturing Engineering Laboratory (MEL) is to improve and advance length metrology in aid of U.S. Industry. This responsibility is found within the Precision Engineering Division (PED). The successful development of a “Collaboratory” for TelePresence Microscopy provides an important new tool to promote technology transfer in the area of length metrology and measurement technology. NIST and Texas Instruments, under the auspices of the National Advanced Manufacturing Testbed (NAMT) and in collaboration with the University of Illinois are developing a microscopy collaboratory testbed. This facility is designed to demonstrate the value of telepresence microscopy within a large distributed manufacturing facility such as Texas Instruments and between organizations such as NIST, Texas Instruments and Universities.Telepresence Microscopy is an application of the state-of-the-art Internet based technology to long-distance scientific endeavors.

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17

Zhao, Yan, Xing Hua Qu, Yong Tian, Rui Jun Lu, and Hong Guang Liu. "Investigation on the Metrology of Conical Thread Gauge." Key Engineering Materials 693 (May 2016): 150–54. http://dx.doi.org/10.4028/www.scientific.net/kem.693.150.

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This paper presents a new method for the calibration of conical thread gauges. The procedure involves scanning of conical thread profiles, extracting all the thread main parameters, reconstructing the conical thread model. The metrologies model compared to the Standard one that is established on the basis of theoretical data. Thereby, the actual state of the threads can be fully identified by means of Screwing into the threaded length, which is good for control of the thread quality

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18

Kupcevičová, Jelena. "Русская и украинская историческая метрология и её отражение в паремиях." Studia Slavica XXVI, no. 1 (2022): 55–66. http://dx.doi.org/10.15452/studiaslavica.2022.26.0004.

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The present article is devoted to the historically metrology of Russian and Ukrainian people, the emergence and use of different units for measuring length, width, area, weight and volume of bulk solids and liquids, etc. and their reflection in the proverbs of these nations.

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19

Rickgauer, John Peter, Derek N. Fuller, and Douglas E. Smith. "DNA as a Metrology Standard for Length and Force Measurements with Optical Tweezers." Biophysical Journal 91, no. 11 (December 2006): 4253–57. http://dx.doi.org/10.1529/biophysj.106.089524.

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20

MINOSHIMA, Kaoru, Thomas R. SCHIBLI, Hajime INABA, Youichi BITOU, Feng-Lei HONG, Atsushi ONAE, and Hirokazu MATSUMOTO. "Precision Length Metrology Based on the Time and Frequency Standards Using Optical Combs." Review of Laser Engineering 35, no. 10 (2007): 642–48. http://dx.doi.org/10.2184/lsj.35.642.

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21

Barwood, G. P., P. Gill, and W. R. C. Rowley. "High-accuracy length metrology using multiple-stage swept-frequency interferometry with laser diodes." Measurement Science and Technology 9, no. 7 (July 1, 1998): 1036–41. http://dx.doi.org/10.1088/0957-0233/9/7/005.

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22

Wilson, Marshall, Alexandre Savtchouk, Igor Tasarov, John D'Amico, Piotr Edelman, Nick Kochey, and Jacek Lagowski. "Digital SPV Diffusion Length Metrology (E8-Fe) for Ultra-High Purity Silicon Wafers." ECS Transactions 16, no. 6 (December 18, 2019): 285–301. http://dx.doi.org/10.1149/1.2980312.

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23

Franz, Christoph, Peter Abels, Raphael Rolser, and Michael Becker. "Energy Input per Unit Length – High Accuracy Kinematic Metrology in Laser Material Processing." Physics Procedia 12 (2011): 411–20. http://dx.doi.org/10.1016/j.phpro.2011.03.151.

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24

Naeim, Ihab H. "In-Depth Practical Study of Length Metrology With Laser Interferometers Applying Different Techniques." International Journal of Applied Physics 7, no. 2 (August 25, 2020): 36–42. http://dx.doi.org/10.14445/23500301/ijap-v7i2p106.

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25

Belfi, J., N. Beverini, D. Cuccato, A. Di Virgilio, E. Maccioni, A. Ortolan, and R. Santagata. "Interferometric length metrology for the dimensional control of ultra-stable ring laser gyroscopes." Classical and Quantum Gravity 31, no. 22 (October 28, 2014): 225003. http://dx.doi.org/10.1088/0264-9381/31/22/225003.

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26

Taylor, S., J. Mardinly, M. A. O'Keefe, and R. Gronsky. "HRTEM Image Simulations for Gate Oxide Metrology." Microscopy and Microanalysis 6, S2 (August 2000): 1080–81. http://dx.doi.org/10.1017/s1431927600037892.

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High resolution transmission electron microscopy (HRTEM) has found extensive use in the semiconductor industry for performing device metrology and characterization. However, shrinking device dimensions (gate oxides are rapidly approaching 10Å) present challenges to the use of HRTEM for many applications, including gate oxide metrology. In this study, we performed HRTEM image simulations of a MOSFET device to examine the accuracy of HRTEM in measuring gate oxide thickness. Length measurements extracted from simulated images were compared to actual dimensions in the model structure to assess TEM accuracy. The effects of specimen tilt, specimen thickness, objective lens defocus and coefficient of spherical aberration (CS) on measurement accuracy were explored for nominal 10Å and 16Å gate oxide thicknesses.The gate oxide was modeled as an amorphous silicon oxide situated between a gate electrode and substrate, both modeled as single crystal Si(100). Image simulations of the sandwich structure were performed in cross-section (with Si[110] parallel to beam direction) using the multislice approximation for a 200 kV microscope with Cs=0.5mm.

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27

Zakharenko, Y. G., N. A. Kononova, V. L. Fedorin, Z. V. Fomkina, and K. V. Chekirda. "Prospects of development of the reference base of the Russian Federation in the field of length measurements." Izmeritel`naya Tekhnika, no. 2 (2020): 3–5. http://dx.doi.org/10.32446/0368-1025it.2020-2-3-5.

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The results of the work to create a complex of high-precision hardware for the unit of length reproduction and transferring carried out at “D. I. Mendeleyev Institute for Metrology (VNIIM)” are represented. This complex will serve as the basis for the further development of the reference base of the Russian Federation in the field of length measurements and will allow reproduction of the unit of length at two wavelengths of 633 nm and 532 nm, as well as measurements of the wavelength of laser sources in vacuum in the range from 500 to 1050 nm.

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28

Medvedev, P. A., and M. V. Novgorodskaya. "Mathematical models’ analysis of rectangular coordinates’calculation in the expanded zones of Gauss Kruger conformal projection." Geodesy and Cartography 921, no. 3 (April 20, 2017): 14–19. http://dx.doi.org/10.22389/0016-7126-2017-921-3-14-19.

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This article contains analysis of mathematical models built depending on longitude difference degree, that are used for calculating planimetric rectangular coordinates in accordance with geodesic coordinates in the longitudinally expanded zones of Gauss Kruger conformal projection. Coefficients of these expansions are measured by successive differentiation or by recurrence formula. Disadvantages of performed coordinate mathematical transformations using schemes recommended by Federal Agency on Technical Regulating and Metrology and Euro-Asian Council for Standardization, Metrology and Certification GOST 32543-2013 for calculations in18 grade meridian zones with millimetric degree of accuracy are pointed out. Two optimal schemes with high convergence rate are suggested for calculating meridian arc length. Ineffectiveness of using formal power series for large grid zones is proved. Practical necessity of efficient schemes’ creation for calculating coordinates in accordance with any ellipsoid’s characteristics.

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29

Wolańczyk, Franciszek. "Gallium as a Metrology Substance for Measuring Thermal Conductivity of Metals." Applied Mechanics and Materials 831 (April 2016): 144–50. http://dx.doi.org/10.4028/www.scientific.net/amm.831.144.

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In the presented work the effective thermal conductivity of steel was received from the simple experiment in which the change of phase metrology-matter was applied [1]. As the metrology-matter gallium was used.The change of phase process plays role of the heat source. During the change of phase period the temperature is constant. A quasi-stationary temperature fields allows to use the stationary model of heat transfer calculations. The model is a cylindrical rod of finite length losing heat out one face to melting-substance and by radiation from surface, respectively. All process measurement was carried out in vacuum. Measurement of thermal conductivity quasi-stationery method is practiced at the Department of Thermodynamics at Rzeszow University of Technology. This method has application in measurement of thermal conductivity of good conductors.

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30

Chen, Jin Long, He Min Wang, Yu Wen Qin, and Xin Hua Ji. "An Experimental Study of the Displacement and Strain Fields across Interphases in Thermoplastic Composites." Key Engineering Materials 306-308 (March 2006): 959–64. http://dx.doi.org/10.4028/www.scientific.net/kem.306-308.959.

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The main purpose of this paper is to develop a set of improved micro-metrology system, which consists of a digital image-measuring device and a microscope with a long focal length, for the study of displacement fields, strain fields in the area across the interphases, and also the effect of temperature on the micro-mechanics properties of interphases in thermoplastic composites. Meanwhile, the precision of the micro-metrology system is assessed by using an extra solution within of the framework of infinitesimal strain in particular, the choice of the size of subset in the correlation technique is discussed when the displacements are not infinitesimal. Experimental results show that, under practical service conditions of thermo-mechanical coupled loads, a significant residual thermal stress mismatch due to the difference in coefficients of thermal expansion between the fiber and the matrix is balanced out.

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31

Blumröder, Ulrike, Paul Köchert, Thomas Fröhlich, Thomas Kissinger, Ingo Ortlepp, Jens Flügge, Harald Bosse, and Eberhard Manske. "A GPS-Referenced Wavelength Standard for High-Precision Displacement Interferometry at λ = 633 nm." Sensors 23, no. 3 (February 3, 2023): 1734. http://dx.doi.org/10.3390/s23031734.

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Since the turn of the millennium, the development and commercial availability of optical frequency combs has led to a steadily increase of worldwide installed frequency combs and a growing interest in using them for industrial-related metrology applications. Especially, GPS-referenced frequency combs often serve as a “self-calibrating” length standard for laser wavelength calibration in many national metrology institutes with uncertainties better than u = 1 × 10−11. In this contribution, the application of a He-Ne laser source permanently disciplined to a GPS-referenced frequency comb for the interferometric measurements in a nanopositioning machine with a measuring volume of 200 mm × 200 mm × 25 mm (NPMM-200) is discussed. For this purpose, the frequency stability of the GPS-referenced comb is characterized by heterodyning with a diode laser referenced to an ultrastable cavity. Based on this comparison, an uncertainty of u = 9.2 × 10−12 (τ = 8 s, k = 2) for the GPS-referenced comb has been obtained. By stabilizing a tunable He-Ne source to a single comb line, the long-term frequency stability of the comb is transferred onto our gas lasers increasing their long-term stability by three orders of magnitude. Second, short-term fluctuations-related length measurement errors were reduced to a value that falls below the nominal resolving capabilities of our interferometers (ΔL/L = 2.9 × 10−11). Both measures make the influence of frequency distortions on the interferometric length measurement within the NPMM-200 negligible. Furthermore, this approach establishes a permanent link of interferometric length measurements to an atomic clock.

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32

Katić, Marko, Nenad Ferdelji, and Danijel Šestan. "Investigation of Temperature-Induced Errors in XCT Metrology." International Journal of Automation Technology 14, no. 3 (May 5, 2020): 484–90. http://dx.doi.org/10.20965/ijat.2020.p0484.

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The presented research shows the time dependent temperature distribution and thermal time constant within a typical industrial X-ray computed tomography (XCT) system used for dimensional metrology. Temperature effects can significantly affect measurement results of XCT scans either by directly changing the dimensions of the measurement object, or by indirectly changing the geometry of XCT scanner. In either case, the effect is not known well enough to be used for correction of measurement results or estimation of measurement uncertainty. In order to determine these effects, traceable temperature measurements were performed with a custom measurement system designed for this application. The influence of temperature fluctuations on length errors was determined by correlation of the measured temperature fluctuations with measurement deviations of a reference standard in repeated CT scans at different X-ray power levels. After experimental determination of X-ray focal spot displacement due to thermal expansion, a simple mathematical model of X-ray source displacement as a function of its temperature was developed and validated for a selected X-ray power level.

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33

Dobosz, Marek. "Laser diode distance measuring interferometer - metrological properties." Metrology and Measurement Systems 19, no. 3 (October 1, 2012): 553–64. http://dx.doi.org/10.2478/v10178-012-0048-1.

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Abstract A novel laser diode based length measuring interferometer for scientific and industrial metrology is presented. Wavelength the stabilization system applied in the interferometer is based on the optical wedge interferometer. Main components of the interferometer such as: laser diode stabilization assembly, photodetection system, measuring software, air parameters compensator and base optical assemblies are described. Metrological properties of the device such as resolution, measuring range, repeatability and accuracy are characterized.

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34

Holá, Miroslava, Jan Hrabina, Martin Sarbort, Jindrich Oulehla, Ondrej Cíp, and Josef Lazar. "Contribution of the Refractive Index Fluctuations to the Length Noise in Displacement Interferometry." Measurement Science Review 15, no. 5 (October 1, 2015): 263–67. http://dx.doi.org/10.1515/msr-2015-0036.

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AbstractWe report on investigations of how fast changes of the refractive index influence the uncertainty of interferometric displacement measurements. Measurement of position within a limited range is typical for precise positioning of coordinate measuring systems, such as nanometrology standards combined with scanning probe microscopy (SPM). The varying refractive index of air contributes significantly to the overall uncertainty; it plays a role especially in case of longer-range systems. In our experiments we have observed that its fast variations, seen as length noise, are not linearly proportional to the measuring beam path and play a significant role only over distances longer than 50 mm. Thus, we found that over longer distances the length noise rises proportionally. The measurements were performed under conditions typical for metrology SPM systems

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35

Sanchidrián-Vaca, Carlos, and Carlos Sabín. "Parameter Estimation of Wormholes beyond the Heisenberg Limit." Universe 4, no. 11 (November 6, 2018): 115. http://dx.doi.org/10.3390/universe4110115.

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We propose to exploit the quantum properties of nonlinear media to estimate the parameters of massless wormholes. The spacetime curvature produces a change in length with respect to Minkowski spacetime that can be estimated in principle with an interferometer. We use quantum metrology techniques to show that the sensitivity is improved with nonlinear media and propose a nonlinear Mach–Zehnder interferometer to estimate the parameters of massless wormholes that scales beyond the Heisenberg limit.

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36

Miller, Tatiana, Krzysztof Gajda, and Aneta Łętocha. "Reliability of measurements performed in the IZTW accredited laboratory in the field of surface topography and product geometry." Mechanik 91, no. 4 (April 9, 2018): 307–10. http://dx.doi.org/10.17814/mechanik.2018.4.47.

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The scope and the reliability of measurements performed in the accredited laboratory in the Section of Length and Angle Measurements in Department of Geometrical Quantities Metrology of the IAMT were presented. The scope of services include the performance of tests and measurements in a very wide range related to surface texture analysis, research tests of dimensional and shape accuracy and product quality control. The capabilities of equipment and software available in the laboratory were characterized.

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37

Thywissen, J. H. "Using neutral atoms and standing light waves to form a calibration artifact for length metrology." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 16, no. 6 (November 1998): 3841. http://dx.doi.org/10.1116/1.590420.

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38

Zhang, Haijun, Dongxian Zhang, and Xiaofeng Lin. "Dual imaging-unit atomic force microscope for nanometer order length metrology based on reference scales." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 20, no. 5 (2002): 1935. http://dx.doi.org/10.1116/1.1502700.

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39

Zhang, Dongxian, Haijun Zhang, and Xiaofeng Lin. "Wide-range length metrology by dual-imaging-unit atomic force microscope based on porous alumina." Microscopy Research and Technique 64, no. 3 (2004): 223–27. http://dx.doi.org/10.1002/jemt.20060.

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40

Neyezhmakov, Pavel, Alexander Prokopov, Tatiana Panasenko, and Andrii Shloma. "Analysis of the temperature component of the combined standard uncertainty of the refractive index according to the test data of the control system for meteorological parameters developed for the Lyptsi geodetic polygon." Ukrainian Metrological Journal, no. 4 (December 30, 2021): 34–38. http://dx.doi.org/10.24027/2306-7039.4.2021.250411.

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The National Scientific Centre “Institute of Metrology” is actively involved in the implementation of a number of international projects under the EMPIR programme. One of such joint projects is the EMPIR 18SIB01 GeoMetre research project “Large-scale dimensional measurements for geodesy”. The overall goal of the project is to ensure traceability of length measurements – from the measurement standard of the unit of length to long distances typical for geodetic measurements. As a result of the project, it is necessary to provide length measurements of at least 5 km with an expanded uncertainty of no more than 1 mm. The main task of the NSC “Institute of Metrology” within this project is the development, research and practical implementation of methods and means of accounting for the influence of the earth’s atmosphere on the results of measurements of long distances in geodesy, carried out using electromagnetic waves in the optical range. When performing the section Task 1.4 of the project, new methods of highly accurate determination of the mean integral refractive index of air, used as a correction taking into account the influence of the atmosphere on the measurement results, are justified. Requirements for the accuracy of measurements of meteorological parameters at discrete points of the baseline are formulated, which are necessary to determine the mean integral refractive index. That is, the requirements for the metrological characteristics of temperature, pressure and humidity sensors are determined. The article discusses the results of the development, manufacture and testing of the sensors for temperature measurement. It is shown that the created sensors meet the requirements of the GeoMetre project.

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Kovalchuk, V. V., and M. V. Smorzh. "Metrology of the Real Nanoclusters: Structure and Optical Characteristics." Metrology and instruments, no. 1 (March 2, 2020): 54–58. http://dx.doi.org/10.33955/2307-2180(1)2020.54-58.

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In this paper, we have discussed in detail the electronic structure and optical characteristics of the silicon nanoclusters. One of the main conclusions is that the comparison between theoretical calculations and experimental results are correct. We shows the possibility of different radiative channels for the recombination in porous silicon. We now analyze the case of stronger disorder as obtained in amorphous silicon (a-Si). It raises extremely interesting problems related to the confinement-induced blue shift of the energy gap: (a) does it exist in nanoclusters of a-Si and is it comparable to what is obtained for c-Si; (b) what is the behavior of disorder-induced localized states in this regard. It has been often assumed that quantum confinement’s effects are small in a-Si nanostructures due to the short coherence length of free carriers in these materials. We will see that it is not true. We calculate the electronic structure of a-Si and a-Si:H spherical clusters using the parametrized density functional theory (PDFT) model [1]. The starting structure for the a-Si or a-Si: H nanoclusters is obtained by selecting the atoms belonging to the respective atoms unit cell. Due to the new boundary conditions the structure is no more in equilibrium and we have thus relaxed the atomic positions using a Keating potential.

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Gastaldi, B., L. Vieira, F. Huerta Yshikawa, B. Faust, and B. Eves. "Calibration of angle standards." Metrologia 60, no. 1A (January 1, 2023): 04002. http://dx.doi.org/10.1088/0026-1394/60/1a/04002.

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Main text Optical polygons and angle gauge blocks are the primary artifacts for disseminating the unit of angle to industry. The Consulative Committee for Length (CCL) has designated the calibration of such angle artifacts as a key comparison topic area in order to ensure world-wide traceability and equivalence of angle measurements at the lowest measurement uncertainties. This report describes the key comparison in the topic area of angle metrology for the SIM region. An optical polygon and six angle gauge blocks were measured by five national metrology institutes (NMI). The comparison was successful and the results of the participants are reported. One NMI reported values that were initially inconsistent with the key comparison reference value for the optical polygon. To reach the main text of this paper, click on Final Report. Note that this text is that which appears in Appendix B of the BIPM key comparison database https://www.bipm.org/kcdb/. The final report has been peer-reviewed and approved for publication by the CCL, according to the provisions of the CIPM Mutual Recognition Arrangement (CIPM MRA).

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Pratt, Jon R., Douglas T. Smith, David B. Newell, John A. Kramar, and Eric Whitenton. "Progress toward Système International d'Unités traceable force metrology for nanomechanics." Journal of Materials Research 19, no. 1 (January 2004): 366–79. http://dx.doi.org/10.1557/jmr.2004.19.1.366.

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Recent experiments with the National Institute of Standards and Technology (NIST) Electrostatic Force Balance (EFB) have achieved agreement between an electrostatic force and a gravitational force of 10−5 N to within a few hundred pN/μN. This result suggests that a force derived from measurements of length, capacitance, and voltage provides a viable small force standard consistent with the Système International d’Unités. In this paper, we have measured the force sensitivity of a piezoresistive microcantilever by directly probing the NIST EFB. These measurements were linear and repeatable at a relative standard uncertainty of 0.8%. We then used the calibrated cantilever as a secondary force standard to transfer the unit of force to an optical lever–based sensor mounted in an atomic force microscope. This experiment was perhaps the first ever force calibration of an atomic force microscope to preserve an unbroken traceability chain to appropriate national standards. We estimate the relative standard uncertainty of the force sensitivity at 5%, but caution that a simple model of the contact mechanics suggests errors may arise due to friction.

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Keck, Christian, and René Schödel. "Reference Measurement of Roundwood by Fringe Projection." Forest Products Journal 71, no. 4 (October 1, 2021): 352–61. http://dx.doi.org/10.13073/fpj-d-21-00024.

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Abstract The metrological verification of log scanners requires logs with accurately known dimensions as test objects. The measurement of the lengths and diameters must be traceable back to the SI (International System of Units) unit of length. The results have to be reported with the corresponding measurement uncertainties. The uncertainties are required to be 5 to 10 times lower than the corresponding maximum permissible errors allowed for the log scanner under test. This article presents a procedure for the reference measurement of logs using an off-the-shelf fringe projection system along with uncertainty budgets for the measured dimensions. The length and diameters are determined from the highly resolved mesh obtained by fringe projection using techniques from computational geometry and coordinate metrology. Corrections are applied to the length and diameter values to remove the systematic effect caused by scattering of projected light below the partially transparent log surface. The influence of the fringe projection system on the measured dimensions is determined by measurements of calibrated artifacts, which also provide the traceability back to the SI unit of length. The measurement is illustrated by the example of a log with a length of 2 m and a diameter of 280 mm. The corresponding uncertainty budgets, confirmed by repeat measurements, result in expanded uncertainties (confidence interval 95%) of 6 mm and 0.13 mm for length and diameter, respectively. These low values qualify the fringe projection measurement along with accompanying evaluation procedure to provide logs as reference objects for the verification of log scanners.

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Quagliotti, Danilo. "Modeling the systematic behavior at the micro and nano length scales." Surface Topography: Metrology and Properties 10, no. 1 (January 25, 2022): 015011. http://dx.doi.org/10.1088/2051-672x/ac4ba7.

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Abstract The assessment of the systematic behavior based on frequentist statistics was analyzed in the context of micro/nano metrology. The proposed method is in agreement with the well-known GUM recommendations. The investigation assessed three different case studies with definition of model equations and establishment of the traceability. The systematic behavior was modeled in Sq roughness parameters and step height measurements obtained from different types of optical microscopes, and in comparison with a calibrated contact instrument. The sequence of case studies demonstrated the applicability of the method to micrographs when their elements are averaged. Moreover, a number of influence factors, which are typical causes of inaccuracy at the micro and nano length scales, were analyzed in relation to the correction of the systematic behavior, viz. the amount of repeated measurements, the time sequence of the acquired micrographs and the instrument-operator chain. The possibility of applying the method individually to the elements of the micrographs was instead proven not convenient and too onerous for the industry. Eventually, the method was also examined against the framework of the metrological characteristics defined in ISO 25 178-600 with hints on possible future developments.

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Fang, Wenqiang, Joyce Mok, and Haneesh Kesari. "Effects of geometric nonlinearity in an adhered microbeam for measuring the work of adhesion." Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences 474, no. 2211 (March 2018): 20170594. http://dx.doi.org/10.1098/rspa.2017.0594.

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Design against adhesion in microelectromechanical devices is predicated on the ability to quantify this phenomenon in microsystems. Previous research related the work of adhesion for an adhered microbeam to the beam's unadhered length, and as such, interferometric techniques were developed to measure that length. We propose a new vibration-based technique that can be easily implemented with existing atomic force microscopy tools or similar metrology systems. To make such a technique feasible, we analysed a model of the adhered microbeam using the nonlinear beam theory put forth by Woinowsky–Krieger. We found a new relation between the work of adhesion and the unadhered length; this relation is more accurate than the one by Mastrangelo & Hsu (Mastrangelo & Hsu 1993 J. Microelectromech. S. , 2 , 44–55. ( doi:10.1109/84.232594 )) which is commonly used. Then, we derived a closed-form approximate relationship between the microbeam's natural frequency and its unadhered length. Results obtained from this analytical formulation are in good agreement with numerical results from three-dimensional nonlinear finite-element analysis.

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Siewert, F., J. Buchheim, T. Zeschke, M. Störmer, G. Falkenberg, and R. Sankari. "On the characterization of ultra-precise X-ray optical components: advances and challenges inex situmetrology." Journal of Synchrotron Radiation 21, no. 5 (August 27, 2014): 968–75. http://dx.doi.org/10.1107/s1600577514016221.

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To fully exploit the ultimate source properties of the next-generation light sources, such as free-electron lasers (FELs) and diffraction-limited storage rings (DLSRs), the quality requirements for gratings and reflective synchrotron optics, especially mirrors, have significantly increased. These coherence-preserving optical components for high-brightness sources will feature nanoscopic shape accuracies over macroscopic length scales up to 1000 mm. To enable high efficiency in terms of photon flux, such optics will be coated with application-tailored single or multilayer coatings. Advanced thin-film fabrication of today enables the synthesis of layers on the sub-nanometre precision level over a deposition length of up to 1500 mm. Specifically dedicated metrology instrumentation of comparable accuracy has been developed to characterize such optical elements. Second-generation slope-measuring profilers like the nanometre optical component measuring machine (NOM) at the BESSY-II Optics laboratory allow the inspection of up to 1500 mm-long reflective optical components with an accuracy better than 50 nrad r.m.s. Besides measuring the shape on top of the coated mirror, it is of particular interest to characterize the internal material properties of the mirror coating, which is the domain of X-rays. Layer thickness, density and interface roughness of single and multilayer coatings are investigated by means of X-ray reflectometry. In this publication recent achievements in the field of slope measuring metrology are shown and the characterization of different types of mirror coating demonstrated. Furthermore, upcoming challenges to the inspection of ultra-precise optical components designed to be used in future FEL and DLSR beamlines are discussed.

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Pakkratoke, Montree, Nitiwat Sasom, Koichiro Hattori, and Nae Hyung Tak. "APMP.M.H-S5 final report of the supplementary comparison of Brinell hardness." Metrologia 59, no. 1A (January 1, 2022): 07019. http://dx.doi.org/10.1088/0026-1394/59/1a/07019.

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Main text This report purposed the results of supplementary comparison of Brinell hardness, APMP.M.H-S5, among three National Metrology Institutes (NIMT, NMIJ/AIST and KRISS). The comparison was carried out during April 2018 to July 2019 in order to determine the capability of the primary Brinell hardness standard, including standard conditions, of each participant, to confirm the accuracy of Brinell hardness scale HBW 10/500 and HBW 10/3000 measurement declared by each participant, which includes the effect of each participant's primary indenter, and determine the degrees of equivalence of hardness scale measurement in the range 45HBW to 550HBW. The pilot institute was the National Institute of Metrology (Thailand), NIMT. There were 2 different types of artifacts for the comparison. The first set was the set of Brinell hardness comparison: hardness measurement. The second set is a set of diameter length comparison: diameter length measurement. The measurement results of each participant were used to compute the degree of equivalence in comparison reference value (CRV) and the uncertainty of this deviation at a 95% level of confidence. The En number was calculated to express the equivalence between the measurements of participants as well. To reach the main text of this paper, click on Final Report. Note that this text is that which appears in Appendix B of the BIPM key comparison database https://www.bipm.org/kcdb/. The final report has been peer-reviewed and approved for publication by the CCM, according to the provisions of the CIPM Mutual Recognition Arrangement (CIPM MRA).

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Pakkratoke, Montree, Nitiwat Sasom, Koichiro Hattori, and Nae Hyung Tak. "APMP.M.H-S6 final report of the supplementary comparison of Vickers hardness." Metrologia 59, no. 1A (January 1, 2022): 07020. http://dx.doi.org/10.1088/0026-1394/59/1a/07020.

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Main text This report purposed the results of supplementary comparison of Vickers hardness, APMP.M.H-S6, among five National Metrology Institutes (NIMT, NMIJ/AIST, KRISS, CMS/ITRI and SASO-NMCC). The comparison was carried out during November 2015 to January 2019 in order to determine the capability of the primary Vickers hardness standard, including standard conditions of each participant, to confirm the accuracy of Vickers hardness scale HV5, HV10, HV20, HV30, HV50 and HV100 measurement declared by each participant, which includes the effect of each participant's primary indenter, and determine the degrees of equivalence of hardness scale measurement in the range 100HV to 900HV. The pilot institute was the National Institute of Metrology (Thailand), NIMT. There were 2 different types of artifacts for the comparison. The first and second set were the set of Vickers hardness comparison: hardness measurement. The third set is a set of diagonal length comparison: diagonal length measurement. The measurement results of each participant were used to compute the degree of equivalence in comparison reference value (CRV) and the uncertainty of this deviation at a 95% level of confidence. The En parameter was calculated to express the equivalence between the measurements of participants as well. To reach the main text of this paper, click on Final Report. Note that this text is that which appears in Appendix B of the BIPM key comparison database https://www.bipm.org/kcdb/. The final report has been peer-reviewed and approved for publication by the CCM, according to the provisions of the CIPM Mutual Recognition Arrangement (CIPM MRA).

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Lipus, L. C., B. Acko, and J. Tompa. "Experimental determination of influences on a gauge block’s stack length." Advances in Production Engineering & Management 17, no. 3 (September 30, 2022): 339–49. http://dx.doi.org/10.14743/apem2022.3.440.

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Gauge blocks are an important basis for maintaining traceability in dimensional metrology, used for calibrating length measuring instruments and for adjustments in all branches of manufacturing. Their important feature is that they can be wrung with small dimensional uncertainty. An overview of the factors influencing the accuracy of a stack length, such as the quality of the gauge blocks (grade, wear), surface preparation (cleaning and usage of a lubricant), wringing (way and time, temperature of hands and gloves) is given in the paper. Experiments for determining these influences were performed with a highly precise gauge block comparator. Proper selection of gauge blocks, preparation of their surfaces and oiling improve the accuracy of a stack length. Application of a lubricant, wiped with a dry cloth or paper towel, helps to wring them more easily, but its contribution to the stack length in the experiment was 0.1 µm for oil and 0.2 µm for grease. Temperature changes of gauge blocks were estimated by holding them, and, during wringing in well controlled air conditions, monitoring them to yield the empirical coefficients of their warming up. The results showed that usage of gloves reduces the warming up by approximately half, but still the stack must be stabilised in well controlled conditions for at least one hour if it is used for micrometre-level precise measurements.

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